High temperature material performance testing

Abstract

An apparatus for performing a material performance test on a sample, the apparatus comprising: at least one high temperature furnace comprising a furnace housing and a base enclosed by the furnace housing, the base adapted to receive a sample held in a test unit therein; and a heat source comprising a substantially horizontally oriented heating coil defining an internal opening, the heat source operative to heat the base while the base is substantially horizontally disposed in the internal opening and thereby heat the sample in the base, the test unit operative to perform a material performance test on the sample while the sample is heated.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] Reference is made here to U.S. patent application No. 63 / 622,216, entitled “HIGH TEMPERATURE MATERIALPROPERTY TESTING,” filed on January 18, 2024, the disclosure of which is incorporated herein by reference, and priority is hereby claimed to that U.S. patent application under 37 CFR 1.78(a)(4) and (5)(i). Technical Field

[0003] The present invention relates generally to material property testing and, more particularly, to systems and methods for high temperature, rapid throughput material property testing. Background Art

[0004] Various types of systems and methods for high temperature material property testing are known in the art. Summary of the Invention

[0005] The present invention seeks to provide novel systems and methods for performing highly accurate material property testing, particularly on non-conductive materials, at high temperatures and fast throughput rates in a variety of testing environments.

[0006] Therefore, according to a preferred embodiment of the present invention, a method for performing a material property test on a sample is provided, the method comprising: inserting a first sample into a first high-temperature furnace; heating the first high-temperature furnace by an induction heat source, thereby heating the first sample in the first high-temperature furnace; performing a material property test on the first sample while the first sample is heated; inserting a second sample into a second high-temperature furnace; upon completion of the material property test on the first sample, heating the second high-temperature furnace by the induction heat source, thereby heating the second sample in the second high-temperature furnace; and performing a material property test on the second sample while the second sample is heated.

[0007] Preferably, the method further includes: inserting a third sample into a third high-temperature furnace; heating the third high-temperature furnace by an induction heat source upon completion of the material property test on the second sample, thereby heating the third sample in the third high-temperature furnace; and performing the material property test on the third sample while the third sample is being heated.

[0008] Preferably, the method further includes: inserting a fourth sample into a fourth high-temperature furnace; heating the fourth high-temperature furnace by an induction heat source upon completion of the material property test on the third sample, thereby heating the fourth sample in the fourth high-temperature furnace; and performing a material property test on the fourth sample while the fourth sample is being heated.

[0009] According to a preferred embodiment of the present invention, the third high temperature furnace includes the first high temperature furnace, and the method further includes cooling the first high temperature furnace before inserting the third sample into the first high temperature furnace; and the fourth high temperature furnace includes the second high temperature furnace, and the method further includes cooling the second high temperature furnace before inserting the fourth sample into the second high temperature furnace.

[0010] Preferably, before completing the material property test on the first sample, the second sample is inserted into the second high-temperature furnace; before completing the material property test on the second sample, the third sample is inserted into the third high-temperature furnace; and before completing the material property test on the third sample, the fourth sample is inserted into the fourth high-temperature furnace.

[0011] Preferably, the method further comprises inserting, heating, and performing material property testing on additional samples.

[0012] Preferably, material property testing is performed at a throughput rate of at least about one material property test per hour.

[0013] Preferably, the induction heat source is capable of heating each sample to a temperature in the range of between about 1500°C and 2800°C.

[0014] Preferably, each high temperature furnace includes a unitary base having a cavity configured to receive a sample assembled in a test unit therein.

[0015] Preferably, the longest dimension of the cavity is smaller than the longest dimension of the base.

[0016] Preferably, each high-temperature furnace further comprises a non-metal furnace shell wrapped around the outer surface of the base, wherein the non-metal furnace shell is at least used to provide thermal insulation between the base and the induction heat source.

[0017] Preferably, the induction heat source comprises an induction heating coil defining an interior opening, and the method further comprises removably positioning each furnace in the interior opening while each furnace is heated by the induction heating coil.

[0018] Preferably, the longitudinal axis of the induction heating coil is oriented substantially horizontally, and each high-temperature furnace is disposed substantially horizontally in the interior opening when heated by the induction heating coil.

[0019] Preferably, the method further comprises: applying a load to each sample via a load application system during performance of the material property test; and measuring a displacement of each sample in response to the application of the load.

[0020] Preferably, the method further comprises measuring the displacement of each sample by a deflectometer.

[0021] Preferably, the load application system and deflectometer extend into each high temperature furnace through the spaces between turns of the coil when each high temperature furnace is heated by the induction heat source.

[0022] According to a preferred embodiment of the present invention, at least one of the load application system and the deflectometer comprises a mixing rod including a first refractory portion proximate the sample and a second insulating portion distal to the sample.

[0023] Preferably, the method further comprises controlling the environment within the modular environmental chamber in which the material performance testing is performed.

[0024] Preferably, the modular environmental chamber comprises an upper sub-chamber housing the electronics of the load application system, a middle sub-chamber housing at least a portion of the induction heat source, and a lower sub-chamber housing the electronics of the deflectometer.

[0025] Preferably, the middle sub-chamber of the modular environmental chamber includes thermal insulation to prevent heating of the load application system and the deflectometer by the induction heat source.

[0026] According to another preferred embodiment of the present invention, an apparatus for performing material property testing on a sample is additionally provided, the apparatus comprising: a first high-temperature furnace configured to receive a first sample held in a first testing unit in the first high-temperature furnace; an induction heat source operative to heat the first high-temperature furnace and thereby heat the first sample in the first high-temperature furnace, the first testing unit operative to perform a material property test on the first sample while the first sample is heated; and at least one second high-temperature furnace configured to receive a second sample held in a second testing unit in the second high-temperature furnace, the induction heat source operative to heat the second high-temperature furnace upon completion of the material property testing on the first sample and thereby heat the second sample in the second high-temperature furnace, the second testing unit operative to perform a material property test on the second sample while the second sample is heated.

[0027] Preferably, the apparatus further comprises a third high temperature furnace configured to receive a third sample held in the third testing unit in the third high temperature furnace; the induction heat source is operated to heat the third high temperature furnace upon completion of the material property test on the second sample, and thereby heat the third sample in the third high temperature furnace; and the third testing unit is operated to perform the material property test on the third sample while the third sample is being heated.

[0028] Preferably, the apparatus further comprises a fourth high temperature furnace configured to receive a fourth sample held in a fourth testing unit in the fourth high temperature furnace; the induction heat source is operated to heat the fourth high temperature furnace upon completion of the material property test on the third sample, and thereby heat the fourth sample in the fourth high temperature furnace; and the fourth testing unit is operated to perform the material property test on the fourth sample while the fourth sample is being heated.

[0029] According to a preferred embodiment of the present invention, the third high temperature furnace includes a first high temperature furnace that is cooled before the third sample is received in the first high temperature furnace; and the fourth high temperature furnace includes a second high temperature furnace that is cooled before the fourth sample is received in the second high temperature furnace.

[0030] Preferably, before the material property test on the first sample is completed, the second sample is received by the second high-temperature furnace; before the material property test on the second sample is completed, the third sample is received by the third high-temperature furnace; and before the material property test on the third sample is completed, the fourth sample is received by the fourth high-temperature furnace.

[0031] Preferably, the apparatus further comprises additional high temperature furnaces adapted to respectively receive additional samples.

[0032] Preferably, the apparatus is configured to perform material property tests at a throughput rate of at least about one material property test per hour.

[0033] Preferably, the induction heat source is configured to heat each sample to a temperature in the range of between about 1500°C and 2800°C.

[0034] Preferably, each high temperature furnace includes a unitary base having a cavity configured to receive a sample therein.

[0035] Preferably, the longest dimension of the cavity is smaller than the longest dimension of the base.

[0036] Preferably, each high-temperature furnace further comprises a non-metal furnace shell wrapped around the outer surface of the base, wherein the non-metal furnace shell is at least used to provide thermal insulation between the base and the induction heat source.

[0037] Preferably, the induction heat source includes an induction heating coil defining an internal opening, and each high-temperature furnace is removably disposed in the internal opening when heated by the induction heating coil.

[0038] Preferably, the longitudinal axis of the induction heating coil is oriented substantially horizontally, and each high-temperature furnace is disposed substantially horizontally in the interior opening when heated by the induction heating coil.

[0039] Preferably, the apparatus further comprises a load applying unit operative to apply a load to each sample during performance of the material property test.

[0040] Preferably, the apparatus further comprises a deflectometer operative to measure the displacement of each sample in response to an applied load.

[0041] Preferably, when each high temperature furnace is heated by the induction heat source, the load applying unit and the deflection gauge extend into each high temperature furnace through the space between turns of the coil.

[0042] Preferably, at least one of the load application system and the deflectometer comprises a mixing rod including a first refractory portion proximate the sample and a second insulating portion distal to the sample.

[0043] Preferably, a system for performing material property testing on a sample includes a modular environmental chamber housing the apparatus of the preferred embodiment of the present invention.

[0044] Preferably, the modular environmental chamber comprises an upper sub-chamber housing the electronic circuitry of the load application unit, a middle sub-chamber housing at least a portion of the inductive heat source, and a lower sub-chamber housing the electronic circuitry of the deflectometer.

[0045] Preferably, the middle sub-chamber of the modular environmental chamber includes thermal insulation to prevent heating of the load application unit and the deflectometer by the induction heat source.

[0046] According to another preferred embodiment of the present invention, there is provided an apparatus for performing material property testing on a sample, the apparatus comprising: at least one high-temperature furnace, the at least one high-temperature furnace comprising a furnace shell and a base, the base being enclosed by the furnace shell, the base being suitable for receiving a sample held in a testing unit in the base; and a heat source, the heat source comprising a substantially horizontally oriented heating coil defining an internal opening, the heat source being operative to heat the base while the base is substantially horizontally disposed in the internal opening, and thereby heating the sample in the base, the testing unit being operative to perform material property testing on the sample while the sample is heated.

[0047] Preferably, the heat source is configured to heat the sample to a temperature in a range between about 1500°C and 2800°C, and the apparatus is operative to perform material property tests at a throughput rate of at least about one material property test per hour.

[0048] Preferably, the base comprises a cavity adapted to receive a sample held in the test unit therein.

[0049] Preferably, the cavity is a longitudinal cavity, the length of the longitudinal cavity being less than the length of the base.

[0050] Preferably, the furnace shell comprises a replaceable non-metallic furnace shell.

[0051] Preferably, the apparatus further comprises a load applying unit operative to apply a force to the sample during material property testing.

[0052] Preferably, the apparatus further comprises a deflectometer operative to measure displacement of the sample during material property testing.

[0053] Preferably, at least one of the load application unit and the deflectometer comprises a mixing rod including a first refractory portion positioned proximate the sample during testing and a second insulating portion positioned distal to the sample during testing.

[0054] Preferably, the at least one high temperature furnace comprises a plurality of high temperature furnaces, and at least another one of the plurality of high temperature furnaces is heated by the heat source at least partially simultaneously with inserting the sample held in the test unit into at least one of the plurality of high temperature furnaces.

[0055] Preferably, a system for performing material property testing on a sample includes a modular environmental chamber housing the apparatus of the preferred embodiment of the present invention.

[0056] According to another preferred embodiment of the present invention, a method for performing a material property test on a sample is also provided, the method comprising: providing a heat source, the heat source comprising a substantially horizontally oriented heating coil defining an internal opening; arranging at least one high-temperature furnace in a substantially horizontal orientation in the internal opening, the at least one high-temperature furnace comprising a furnace shell and a base, the base being enclosed by the furnace shell, the base being suitable for receiving a sample held in a test unit in the base; while the base is arranged in the internal opening, heating the base by the heat source, thereby heating the sample in the base; and performing a material property test on the sample using the test unit while the sample is heated.

[0057] Preferably, the base comprises a cavity for receiving a sample held in the test unit therein.

[0058] Preferably, the entire sample is received within the cavity of the base.

[0059] Preferably, the cavity is a longitudinal cavity, the length of the longitudinal cavity being less than the length of the base.

[0060] Preferably, heating the sample includes heating the sample to a temperature in a range between about 1500°C and 2800°C, and performing the material property test includes performing the material property test at a throughput rate of at least about one test per hour.

[0061] Preferably, the furnace housing is non-metallic, and the method further comprises replacing the non-metallic furnace housing after material property testing of the sample and before performing additional material property testing on additional samples.

[0062] Preferably, the method further comprises: applying a force to the sample during the material property test; and measuring the displacement of the sample during the material property test.

[0063] Preferably, the method further comprises applying a force to the sample by a load application system and measuring a displacement of the sample by a deflectometer, wherein at least one of the load application system and the deflectometer comprises a mixing rod comprising a first refractory portion positioned proximate the sample during testing and a second insulating portion positioned distal to the sample during testing.

[0064] Preferably, the at least one high temperature furnace comprises a plurality of high temperature furnaces, and the method comprises heating at least one other high temperature furnace of the plurality of high temperature furnaces by a heat source at least partially simultaneously with inserting the sample held in the test unit into at least one of the plurality of high temperature furnaces.

[0065] Preferably, the method further comprises housing the heating coil in a modular environmental chamber.

[0066] According to another preferred embodiment of the present invention, an apparatus (AMPT) for performing material property testing on a sample is additionally provided, the apparatus comprising: a high-temperature furnace comprising a non-metallic furnace shell and a base, the non-metallic furnace shell being formed by at least two sections, the at least two sections in combination defining a space, the base being at least partially disposed in the space, the base being operated to heat the sample; a heat source being operated to heat the base while the base is at least partially disposed in the space; and a test unit being at least partially enclosed within the base, the test unit being used to perform material property testing on the sample.

[0067] According to another preferred embodiment of the present invention, there is provided an apparatus (AMPT) for performing material property testing on a sample, the apparatus comprising: a high-temperature furnace comprising a non-metallic furnace shell and a base, the furnace shell being formed by at least two sections, the at least two sections in combination defining a space, the base being at least partially disposed in the space, the base being operated to heat the sample; a heat source being operated to heat the base while the base is at least partially disposed in the space; and a testing unit being at least partially enclosed within the base, the testing unit being used to perform material property testing on the sample, the AMPT being capable of heating the sample to a temperature in a range between approximately 1500°C and 2800°C, and being capable of performing tests at a throughput rate of at least approximately one test per hour.

[0068] Preferably, at least one of the at least two sections of the furnace shell comprises a plurality of layers.

[0069] Preferably, the plurality of layers comprises at least one layer formed from at least one of zirconium oxide, hafnium dioxide, at least one high temperature carbide, and thoria, interleaved with at least one additional layer formed from at least one of graphite paper, alumina felt, and a ceramic material.

[0070] Preferably, at least one of the furnace housing and the base is readily replaceable between subsequent ones of the at least one test.

[0071] Preferably, the heat source is an induction heat source.

[0072] Preferably, the base comprises at least two parts which in combination form an enclosure adapted to enclose the test unit therein.

[0073] Preferably, the susceptor comprises one of graphite and silicon carbide.

[0074] Preferably, the test unit includes one of a three-point bending test unit, a four-point bending test unit and a fracture toughness test unit.

[0075] Preferably, the apparatus further comprises a low torque load cell operative to control the application of a test load to the sample.

[0076] According to an additional preferred embodiment of the present invention, there is also provided an apparatus (AMPT) for performing material property testing on a sample, which is used to perform material property testing on a sample, and the apparatus comprises: a high-temperature furnace comprising a non-metallic furnace shell and a base, the non-metallic furnace shell being formed by at least two sections, the at least two sections being combined to define a space, the base being at least partially disposed in the space, the base being operated to heat the sample, and the base comprising at least two parts, the at least two parts being combined to form an enclosure suitable for holding a test unit therein, the test unit being operated to perform material property testing on the sample when the sample is heated by the base; and a heat source being operated to heat the base while the base is at least partially disposed in the space.

[0077] According to another preferred embodiment of the present invention, there is further provided an apparatus (AMPT) for performing material property testing on a sample, the apparatus for performing material property testing on a sample, the apparatus comprising: a high-temperature furnace comprising a furnace shell and a base, the furnace shell defining a space, the base being at least partially disposed in the space, the base being operated to heat the sample, and the base comprising at least two parts, the at least two parts being combined to form an enclosure suitable for holding a test unit therein, the test unit being operated to perform material property testing on the sample while the sample is heated by the base; and a heat source being operated to heat the base while the base is at least partially disposed in the space, the AMPT being capable of heating the sample to a temperature in a range between approximately 1500°C and 2800°C, and being capable of performing tests at a throughput rate of at least approximately one test per hour.

[0078] Preferably, the furnace housing is formed by at least two sections which in combination delimit a space.

[0079] Preferably, at least one of the at least two sections of the furnace shell comprises a plurality of layers.

[0080] Preferably, the plurality of layers comprises at least one layer formed from at least one of zirconium oxide, hafnium dioxide, at least one high temperature carbide, and thoria, interleaved with at least one additional layer formed from at least one of graphite paper, alumina felt, and a ceramic material.

[0081] Preferably, at least one of the furnace housing and the base is readily replaceable between subsequent ones of the at least one test.

[0082] Preferably, the heat source is an induction heat source.

[0083] Preferably, the susceptor comprises one of graphite and silicon carbide.

[0084] Preferably, the test unit includes one of a three-point bending test unit, a four-point bending test unit and a fracture toughness test unit.

[0085] Preferably, the apparatus further comprises a low torque load cell operative to control the application of a test load to the sample.

[0086] According to another preferred embodiment of the present invention, a method for performing material property testing on a sample is also provided, the method comprising: at least partially enclosing the sample and a test unit within a base of a high-temperature furnace; disposing the base at least partially within a space defined by at least two sections of a non-metallic furnace shell of the high-temperature furnace; placing the high-temperature furnace at least partially within a heat source; thereafter, heating the base using the heat source, thereby heating the sample; and thereafter, performing material property testing on the sample using the test unit.

[0087] Preferably, positioning the susceptor at least partially within the space defined by the at least two sections of the non-metallic furnace housing precedes positioning the high temperature furnace at least partially within the heat source.

[0088] Preferably, positioning the high temperature furnace at least partially within the heat source precedes positioning the susceptor at least partially within the space defined by the at least two sections of the non-metallic furnace housing.

[0089] Preferably, at least two sections of the non-metallic furnace shell comprise a plurality of layers.

[0090] Preferably, heating the susceptor comprises heating the susceptor using induction.

[0091] Preferably, heating the sample comprises heating the sample to a temperature in the range of between about 1500°C and 2800°C.

[0092] Preferably, the material property test performed on the sample includes any one of the following: a three-point bending test; a four-point bending test; a three-point fracture toughness test; and a four-point fracture toughness test.

[0093] Preferably, performing material property testing on the sample includes applying a test load to the sample using a low torque load cell.

[0094] Preferably, at least one of the furnace housing and the base is readily replaceable between subsequent ones of the at least one test.

[0095] Preferably, material property testing of the sample is performed within the environmental chamber; and at least partially enclosing the sample and the test unit within the base occurs outside the environmental chamber.

[0096] Preferably, arranging the susceptor at least partially within a space defined by at least two sections of the non-metallic furnace housing of the high-temperature furnace occurs outside the environmental chamber.

[0097] Preferably, the method is characterized by a throughput rate of at least about one test per hour. BRIEF DESCRIPTION OF THE DRAWINGS

[0098] The present invention will be more fully understood and appreciated based on the following detailed description taken in conjunction with the accompanying drawings, in which:

[0099] Figure 1A 、 Figure 1B 、 Figure 1C and Figure 1D are simplified schematic assembled cutaway isometric, front plan, cross-sectional, and exploded view illustrations, respectively, of a system constructed and operative in accordance with a preferred embodiment of the present invention, the system including an apparatus for performing material property testing (AMPT) on a sample and an environmental chamber, Figure 1C It is along Figure 1B intercepted by line 1C-1C;

[0100] Figure 2A 、 Figure 2B 、 Figure 2C and Figure 2D They are Figures 1A to 1D Simplified schematic assembly isometric, side plan, cross-sectional, and exploded views of the AMPT, Figure 2C It is along Figure 2B The line 2C-2C is intercepted;

[0101] Figure 3A 、 Figure 3B 、 Figure 3C and Figure 3D They are Figures 1A to 2D Simplified schematic assembled isometric illustration, front plan illustration, side plan illustration, and exploded view illustration of a portion of the AMPT;

[0102] Figure 4A 、 Figure 4B 、 Figure 4C 、 Figure 4D and Figure 4E They are formed Figures 1A to 3D Simplified schematic assembly isometric illustrations, side plan illustrations, partially exploded illustrations, top-facing fully exploded illustrations, and bottom-facing fully exploded illustrations of a first embodiment of a high temperature furnace (HTF) and a first embodiment of a test cell of a portion of an AMPT;

[0103] Figure 5 is formed Figures 1A to 3D Part of the AMPT Figures 4A to 4E Simplified exploded view illustrations of additional embodiments of the HTF and test unit;

[0104] Figure 6A 、 Figure 6B and Figure 6C They are formed Figure 1A a simplified schematic assembly view illustration, a first partially exploded view illustration, and a second partially exploded view illustration of an additional embodiment of a HTF that is a portion of an AMPT to either of FIG. 3E ;

[0105] Figure 7A 、 Figure 7B 、 Figure 7C and Figure 7D They are formed Figures 1A to 6C Simplified schematic assembled isometric, side plan, cross-sectional, and exploded view illustrations of a load application system that is a portion of an AMPT of any one of the embodiments of the present invention, Figure 7C It is along Figure 7B The line 7C-7C is intercepted;

[0106] Figure 8A 、 Figure 8B 、 Figure 8C and Figure 8D They are formed Figures 1A to 7D Simplified schematic assembled isometric, front plan, cross-sectional, and exploded view illustrations of a first embodiment of a deflectometer that is a portion of any of the AMPTs, Figure 8C It is along Figure 8B The line FF is intercepted;

[0107] Figure 9A is formed Figures 1A to 7D Simplified schematic assembly isometric illustrations of additional embodiments of a deflectometer that is part of any of the AMPTs;

[0108] Figure 9B 、 Figure 9C and Figure 9D They are Figure 9A Simplified schematic front-of-assembly plan view, side sectional view, and exploded view of a portion of a deflectometer of Figure 9C It is along Figure 9B The line 9C-9C is intercepted;

[0109] Figure 10A 、 Figure 10B 、 Figure 10C 、 Figure 10D 、 Figure 10E 、 Figure 10F 、 Figure 10G 、 Figure 10H 、 Figure 10I 、 Figure 10J 、 Figure 10K 、 Figure 10L and Figure 10M It shows a preferred embodiment of the present invention. Figures 1A to 9D A simplified schematic diagram of successive steps in the preparation of a system for performing material property testing of the type shown in any of the preceding claims, Figures 10K to 10M Each shows a single step, and Figure 10M It is along Figure 10L The line 10M-10M is intercepted;

[0110] Figure 11A 、 Figure 11B 、 Figure 11C and Figure 11D It shows a preferred embodiment of the present invention. Figures 1A to 10M A simplified schematic diagram of the use of a system for performing material property testing of the type shown in any of the foregoing, Figure 11A and Figure 11B A single step is shown, and Figure 11C and Figure 11D An additional single step is shown, Figure 11B It is along Figure 11A The line 11B-11B is intercepted, and Figure 11D It is along Figure 11C The line 11D-11D is intercepted;

[0111] Figure 12 is a simplified flow chart illustrating the steps of a method of performing material property testing on a sample according to a preferred embodiment of the present invention.

[0112] Figure 13A 、 Figure 13B 、 Figure 13C and Figure 13Dare simplified schematic assembled isometric, side plan, cross-sectional, and exploded view illustrations, respectively, of a system constructed and operative in accordance with another preferred embodiment of the present invention, the system including an apparatus for performing material property testing (AMPT) on a sample and an environmental chamber, Figure 13C It is along Figure 13B The line 13C-13C is intercepted;

[0113] Figure 14A 、 Figure 14B 、 Figure 14C 、 Figure 14D They are 13A to 13D Simplified schematic assembled isometric, side plan, cross-sectional, and exploded view illustrations of an environmental chamber, Figure 14C It is along Figure 14B The line 14C-14C is intercepted;

[0114] Figure 14E is constructed and operated according to a preferred embodiment of the present invention 14A to 14D a simplified schematic partially exploded view illustration of a subchamber of a portion of an environmental chamber;

[0115] Figure 14F 、 Figure 14G 、 Figure 14H and Figure 14I They are Figure 14E a simplified schematic first isometric illustration, a first cross-sectional isometric illustration, a second isometric illustration, and a second cross-sectional isometric illustration of a portion of a subchamber of;

[0116] Figure 14J and Figure 14K They are formed 14A to 14D Simplified schematic top isometric and bottom isometric illustrations of a first component of another subchamber of another portion of the environmental chamber; and

[0117] Figure 14L and Figure 14M They are Figure 14J and Figure 14K Simplified schematic top and bottom isometric illustrations of a second component of the subchamber shown in FIG;

[0118] Figure 15A 、 Figure 15B 、 Figure 15C and Figure 15D They are 13A to 13D Simplified schematic assembly isometric, side plan, cross-sectional, and exploded view illustrations of the AMPT, Figure 15C It is along Figure 15B The line 15C-15C is intercepted;

[0119] Figure 15E yes 15A to 15D A detailed exploded view illustration of a portion of the AMPT;

[0120] Figure 16A 、 Figure 16B 、 Figure 16C 、 Figure 16D 、 Figure 16E and Figure 16F They are 13A to 13D Simplified schematic assembled isometric illustration, front plan illustration, first side plan illustration, exploded illustration, second side plan illustration, and cross-sectional illustration of a portion of the AMPT, Figure 16F It is along Figure 16E The line 16F-16F is intercepted;

[0121] Figure 17A 、 Figure 17B 、 Figure 17C 、 Figure 17D 、 Figure 17E 、 Figure 17F 、 Figure 17G and Figure 17H They are formed 13A to 13D Simplified schematic assembly isometric illustration, side plan illustration, top-facing exploded view illustration, bottom-facing exploded view illustration, exploded view illustration, top-facing partially exploded view illustration, bottom-facing partially exploded view illustration, and detailed exploded view illustration of a first embodiment of a high temperature furnace (HTF) and test cell of a portion of the AMPT;

[0122] Figure 18 is formed 13A to 13D Part of the AMPT 17A to 17H Simplified exploded view illustrations of additional embodiments of the HTF and test unit;

[0123] Figure 19A 、 Figure 19B 、 Figure 19C and Figure 19D They are formed Figures 13A to 17H Simplified schematic assembled isometric, side plan, cross-sectional, and exploded view illustrations of a first embodiment of a load application system that is a portion of an AMPT of any one of the embodiments of the present invention, Figure 19C It is along Figure 19B The line 19C-19C is intercepted;

[0124] Figure 20A and Figure 20B They are formed Figures 13A to 14M Simplified schematic side plan view illustrations and front plan view illustrations of additional embodiments of a load application system that is a portion of an AMPT of any of the foregoing;

[0125] Figure 21A 、 Figure 21B 、 Figure 21C and Figure 21D They are formed Figures 13A to 20B Simplified schematic assembled isometric, side plan, cross-sectional, and exploded view illustrations of an embodiment of a deflectometer that is a portion of any of the AMPTs, Figure 21C It is along Figure 21B intercepted by line 21C-21C;

[0126] Figure 21E 、 Figure 21F 、 Figure 21G and Figure 21H They are 21A to 21D Simplified schematic assembled isometric, side plan, cross-sectional, and exploded views of a portion of a deflectometer, Figure 21G It is along Figure 21F The line 21G-21G is intercepted;

[0127] Figure 22A 、 Figure 22B 、 Figure 22C 、 Figure 22D 、 Figure 22E 、 Figure 22F 、 Figure 22G 、 Figure 22H 、 Figure 22I 、 Figure 22J 、 Figure 22K 、 Figure 22L 、 Figure 22M 、 Figure 22N 、 Figure 22O and Figure 22P It shows a preferred embodiment of the present invention. Figures 13A to 21H A simplified schematic diagram of successive steps in the preparation of a system for performing material property testing of the type shown in any of the preceding claims, Figures 22N to 22P Each shows a single step, and Figure 22P It is along Figure 22O The line 22P-22P is intercepted;

[0128] Figure 23A 、 Figure 23B 、 Figure 23C 、 Figure 23D 、 Figure 23E 、 Figure 23F 、 Figure 23G 、 Figure 23H 、 Figure 23I 、 Figure 23J and Figure 23K It shows a preferred embodiment of the present invention. Figures 13A to 22P A simplified schematic diagram of the use of a system for performing material property testing of the type shown in any of the foregoing, Figures 23A to 23C A single step is shown, and Figures 23D to 23EAn additional single step is shown, Figure 23B It is along Figure 23A The line 23B-23B is intercepted, and Figure 23E It is along Figure 23D The line 23E-23E is intercepted;

[0129] Figure 24 It shows another preferred embodiment according to the present invention. Figures 13A to 22P A simplified schematic diagram of the use of a system of the type shown in any of the for performing material property testing; and

[0130] Figure 25A and Figure 25B Together they form a simplified flow chart illustrating the steps of a method for performing material property testing on a sample according to another preferred embodiment of the present invention. DETAILED DESCRIPTION

[0131] Materials property tests, such as tests to determine how a sample responds to a force, are often performed under non-ambient conditions, such as at elevated temperatures and / or in an environment containing a non-atmospheric gas mixture. In such materials property tests, it is desirable to quickly and reliably go from ambient conditions to test conditions and back again from test conditions to ambient conditions. Conventional systems for performing materials property tests, such as systems for testing any or all of a sample's flexural modulus, flexural stress, flexural strain, flexural stress-strain relationship, and fracture toughness, suffer from relatively long test cycles, resulting in relatively low throughput, and often requiring a day or more to insert, test, and remove a sample, primarily due to slow heating and cooling rates. It is therefore an object of the present invention to provide improved systems and methods for performing materials property tests, particularly at elevated temperatures and in the presence of a non-atmospheric gas mixture, characterized by relatively high heating and cooling rates and, therefore, relatively short test cycles and high throughput.

[0132] Now refer to Figure 1A 、 Figure 1B 、 Figure 1C and Figure 1D , which are simplified schematic assembled cutaway isometric, front plan, cross-sectional, and exploded view illustrations, respectively, of a system 100 constructed and operative in accordance with a preferred embodiment of the present invention, the system 100 including an apparatus for performing material property testing (AMPT) 102 on a sample, an environmental chamber 104, and an integrated computer system 106, Figure 1C It is along Figure 1B AMPT 102 is preferably housed within environmental chamber 104 and is constructed and operated in accordance with a preferred embodiment of the present invention.

[0133] In a preferred embodiment of the present invention, the integrated computer system 106 of the system 100 includes an automated control system 108 and a data acquisition system 110. The integrated computer system 106 is operative to preferably store, and more preferably create and store, a test curve comprising some or all of the environmental test parameters, including, inter alia, a temperature curve, a gas mixture curve, a load curve, and a sample deflection curve. The integrated computer system 106 preferably also uses the collected data to automatically calculate material properties, such as any or all of flexural modulus, flexural stress, flexural strain, flexural stress-strain relationship, Young's modulus, ultimate strength, and fracture toughness. Thus, the system 100 preferably employs the computer system 106 to execute a preprogrammed test program that sequences through each stage of the test, including heating, gas introduction and removal, temperature maintenance, sample testing, and cooling.

[0134] The environmental chamber 104 is preferably a vacuum chamber having a base plate 112 and an interior space 114. The environmental chamber 104 is preferably formed with a force application port 116, a heat source port 122, a plurality of wiring ports 123, a plurality of gas ports 124, and at least one vacuum port 125. The environmental chamber further includes a door 126, which typically includes a viewing port 128. In an embodiment of the present invention, the environmental chamber 104 is formed from an aluminum body having internal passageways (not shown) to enable continuous cooling of the environmental chamber body during extreme high temperature testing.

[0135] The gas port 124 and the vacuum port 125 preferably receive corresponding gas and vacuum lines (not shown), respectively, so that the interior space 114 of the environmental chamber 104 can be characterized by any of a wide range of gas environments, including, among others, vacuum, inert gas, ambient air, an environment containing one of a variety of controlled gas mixtures such as a predetermined percentage of oxygen, a reducing gas mixture, and an oxidizing gas mixture. In a preferred embodiment of the present invention, the vacuum port 125 is preferably in fluid communication with a vacuum pump (not shown), such as a roughing pump or an oil diffusion pump, to supply approximately 10 -2 Support up to 10 -5 Alternatively, the vacuum port 125 may be in fluid communication with a turbomolecular pump (not shown) or an ion getter pump (not shown) to supply a vacuum at a pressure of less than 10°C within the interior space 114 of the environmental chamber 104. -5 A vacuum environment characterized by a pressure of Torr.

[0136] Now refer to Figure 2A 、 Figure 2B 、 Figure 2C and Figure 2D, which are simplified schematic assembled isometric, side plan, cross-sectional, and exploded views of the AMPT 102, respectively. Figure 2C It is along Figure 2B It should be understood that the AMPT 102 operates to perform material property testing on the sample 130, as in Figure 2C Specifically seen in.

[0137] AMPT 102 includes: Figures 3A to 3D The heat source 140 described; the high temperature furnace (HTF) 150, such as specifically referred to below Figures 4A to 5 HTF 152 as described, or specifically referred to hereinafter Figures 6A to 6C The HTF 154 described; the test unit 160, such as specifically referred to below Figures 4D to 4E The four-point bending (4PB) test unit 162 and the 4PB fracture test unit described herein are specifically referred to below. Figure 5 The three-point bending (3PB) test unit 166 or 3PB fracture test unit described; specifically referred to below 7A to 7D Described load application system 170; deflectometer 180, such as specifically referred to below Figures 8A to 8D Deflectometer 182 as described, or specifically referred to hereinafter 9A to 9D Depicted are deflectometer 184; mounting base 190; and insulating pad 192.

[0138] AMPT 102 also includes a left support wall 210, a right support wall 220, a first support rod 232, and a second support rod 234. First support rod 232 includes a left end 262 and a right end 264. Similarly, second support rod 234 includes a left end 266 and a right end 268. A plurality of fasteners, such as a plurality of screws 272, attach the left ends 262 and 266 of first support rod 232 and second support rod 234, respectively, to left support wall 210. Similarly, a plurality of fasteners, such as a plurality of screws 274, attach the right ends 264 and 268 of first support rod 232 and second support rod 234, respectively, to right support wall 220.

[0139] The left support wall 210 includes an upper surface 276 formed with a furnace recess 278 operative to receive the HTF 150. Figure 2C , the furnace recess 278 preferably includes a pin recess 282 operative to receive a guide pin 284. The left support wall 210 also includes a lower portion 286 formed with a plurality of recesses 288 operative to receive a corresponding plurality of mounting pins 290 for removably mounting the left support wall 210 to the mounting base 190.

[0140] Similarly, the right support wall 220 includes an upper surface 292 formed with a furnace recess 294 operative to receive the HTF 150. Figure 2C As particularly seen in the figure, the furnace recess 294 preferably includes a pin recess 296 that is operative to receive a guide pin 298. Similar to the left support wall 210, the right support wall 220 also includes a lower portion 302 formed with a plurality of recesses (not shown) that are operative to receive a corresponding plurality of mounting pins 306 for removably mounting the right support wall 220 to the mounting base 190. The mounting pins 290 and 306 are preferably fixedly mounted in corresponding plurality of recesses or apertures (not shown) formed in the mounting base 190.

[0141] As in Figure 2C As particularly seen in FIG, furnace recesses 278 and 294 are shaped and positioned such that the longitudinal axis A of HTF 150 is preferably oriented generally horizontally, generally parallel to mounting base 192, and generally perpendicular to gravity. A particular feature of the present invention is that HTF 150 is oriented generally horizontally, rather than vertically, which yields several advantages during operation of AMPT 102, as described in detail below. In a preferred embodiment of the present invention, HTF 150 is oriented horizontally. Alternatively, HTF 150 may be oriented approximately horizontally, for example, within a range of ±30° from horizontal.

[0142] Now refer to Figure 3A 、 Figure 3B 、 Figure 3C and Figure 3D , which are simplified schematic assembly isometric, front plan, side plan, and exploded views of heat source 140 and HTF 150, respectively. HTF 150 includes a non-metallic furnace housing (NMFH) 310 and a base 320. The non-metallic furnace housing, such as that specifically referred to hereinafter, Figures 4A to 5 NMFH312 as described, or specifically referred to hereinafter Figures 6A to 6C The NMFH 314 is described. The susceptor 320 is preferably inductively heated by the heat source 140.

[0143] The heat source 140 is preferably an induction heat source, and more preferably an ultra-high frequency induction heat source, and includes a heater body 322 and a coil 324 having a plurality of turns 326. The coil 324 is preferably metallic, and more preferably formed of copper. An exemplary heat source suitable for use as the heat source 140 is an EKOHEAT 15KW commercially available from Ambrell Induction Heating Solutions of Rochester, NY, USA. It should be understood that other types of heat sources 140 of various powers are also possible and are within the scope of the present invention.

[0144] As in Figure 3D As particularly seen in FIG, the turns 326 of the coil 324 define a space or internal opening 328 that operates to receive the HTF 150. In a preferred embodiment of the present invention, as in FIG. Figure 3B As particularly seen in FIG, the longitudinal axis A of the coil 326 is oriented generally horizontally, and the HTF 150 is disposed generally horizontally within the interior opening 328 when heated by the coil 326. In a preferred embodiment of the present invention, the coil 326 is oriented horizontally. Alternatively, the coil 326 may be oriented approximately horizontally, for example, within a range of ±30° from the horizontal. The HTF 150 is preferably disposed generally horizontally along the axis A when inserted into the interior opening 328. It should be appreciated that the generally horizontal, rather than vertical, orientation of the coil 326 provides several advantages in the operation of the AMPT 100.

[0145] Due to the generally horizontal orientation of the HTF 150 and coil 324, the turns 326 of the coil 324 serve to help support the base 320, eliminating the need for additional mechanical supports for the base 320. Furthermore, at the high temperatures at which the AMPT 102 operates, a vertical base would create a strong "chimney effect," wherein convection carries heat away from the base, thereby limiting the maximum base temperature, creating vertical thermal gradients, and placing additional thermal loads on the sensitive load application system 170 and deflectometer 180. The generally horizontal orientation of the base 320 avoids this problem.

[0146] Additionally, the horizontal orientation of the space 328 defined by the coil 324 facilitates easy insertion and removal of the horizontally oriented HTF 150 without interfering with the adjacent vertically oriented load application system 170 and deflectometer 180 , thus allowing for rapid throughput of the system 100 .

[0147] As in Figures 1A to 1D, the heat source orifice 122 in the environmental chamber 104 preferably houses the heat source 140 such that the heater body 322 is entirely or mostly contained outside of the environmental chamber 104, while the coil 324 is preferably entirely contained within the interior space 114 of the environmental chamber 104. Preferably, a plurality of sealing components (not shown) form a substantially vacuum tight seal between the heat source orifice 122 and the environment surrounding the environmental chamber 104.

[0148] The coil 324 preferably has one or more turns 326. In an exemplary embodiment of the present invention, the size of the coil 324 is about 200 cm. 3 Up to 2,000cm 3 , and between 2 turns 326 and 10 turns 326. It will be appreciated that forming the coil 324 with multiple turns 326 provides for more uniform heating of the HTF 150 by the coil 324.

[0149] As in Figure 3C The enlarged image B and Figure 3D , in a fully assembled operating state, both the sample 130 and the test cell 160 are enclosed within the HTF 150, which in turn is enclosed within the coil 324 of the heat source 140. The heat source 140 preferably uses induction heating to heat the susceptor 320. In turn, the susceptor 320 preferably uses conductive heating, radiant heating, or a combination of conductive and radiant heating to heat the sample 130 and the test cell 160.

[0150] A particular feature of the present invention is that only a relatively small portion of the system 100 is heated to the test temperature. More specifically, preferably only the base 320, the test unit 160, and the sample 130 are heated to the test temperature at which the material properties of the sample 130 are tested. The base 320 is specifically designed to have dimensions similar to those of the sample 130, thereby reducing the amount of material that needs to be heated before testing the sample 130 and the amount of material that needs to be cooled after testing the sample 130. In an exemplary embodiment of the present invention, the base 320 has a 40 cm 3 Up to 400cm 3 The relatively small amount of material being heated and cooled preferably facilitates the relatively high heating and cooling rates of system 100 compared to conventional systems for material property testing.

[0151] It should be understood that the heating and cooling rates of a component, as well as the amount of time required to heat and / or cool the component, are directly proportional to the amount of material in the component, i.e., the mass of the component. Thus, each of the heating rate, cooling rate, heating time, and cooling time of a component formed from a given material is directly proportional to the volume of the component. Preferably, system 100 heats and cools only a relatively small mass and volume of test specimen 130 compared to conventional material property testing systems. Consequently, the heating rate, cooling rate, heating time, and cooling time of system 100 are lower, and preferably significantly lower, than those of conventional systems.

[0152] Now refer to Figure 4A 、 Figure 4B 、 Figure 4C 、 Figure 4D and Figure 4E , which are simplified schematic assembly isometric illustrations, side plan illustrations, partially exploded illustrations, top-facing fully exploded illustrations, and bottom-facing fully exploded illustrations of HTF 152, which is an embodiment of HTF 150, and 4PB test unit 162, which is an embodiment of test unit 160, respectively. Figure 5 , Figure 5 is a simplified schematic exploded view illustration of HTF 152, which is an embodiment of HTF 150, and 3PB test unit 166, which is an embodiment of test unit 160. Figure 6A 、 Figure 6B and Figure 6C , which are simplified schematic assembly view illustrations, first partially exploded view illustrations, and second partially exploded view illustrations, respectively, of an HTF 154 , which is an alternative embodiment of the HTF 150 .

[0153] As described above, the HTF 150 includes the NMFH 310 and the base 320. The NMFH 310 includes a plurality of shells 330, each of which is preferably cylindrical. However, it should be understood that the shells 330 can have any suitable shape that can accommodate the base 320. When in the assembled operational orientation, the shells 330 preferably define a loading rod aperture, a displaceable rod aperture, and at least one temperature reader aperture. A particular feature of the present invention is that the shells 330 are formed from any suitable number of shell segments.

[0154] As in Figures 4A to 5As can be seen in detail in FIG, in the NMFH 312, the plurality of shells 330 are implemented as a plurality of shells 332, which are preferably semi-cylindrical. The shells 332 preferably include a first upper shell section 342, a first lower shell section 344, a second upper shell section 346, and a second lower shell section 348.

[0155] As in Figure 4D 、 Figure 4E and Figure 5 , first upper shell section 342 is formed with a loading rod aperture 352, a pair of temperature reader cutouts 354, an inner surface 356, and an outer surface 358. Second upper shell section 346 is similarly formed with a loading rod aperture 362, a pair of temperature reader cutouts 364, an inner surface 366, and an outer surface 368.

[0156] As in Figure 4C , when in the assembled, operative state, the first upper shell segment 342 is nested within the second upper shell segment 346 such that the outer surface 358 of the first upper shell segment 342 is substantially completely in contact with the inner surface 366 of the second upper shell segment 346. Additionally, in the assembled, operative state, the loading rod aperture 362 preferably overlies the loading rod aperture 352, and each of the temperature reader cutouts 364 is aligned with a corresponding one of the temperature reader cutouts 354.

[0157] As in Figure 4D 、 Figure 4E and Figure 5 , the first lower shell section 344 is formed with a displaceable rod aperture 372, a pair of temperature reader cutouts 374, an inner surface 376, and an outer surface 378. The second lower shell section 348 is similarly formed with a displaceable rod aperture 382, ​​a pair of temperature reader cutouts 384, an inner surface 386, and an outer surface 388.

[0158] As in Figure 4C , when in the assembled, operative state, the first lower shell segment 344 is nested within the second lower shell segment 348 such that the outer surface 378 of the first lower shell segment 344 is substantially completely in contact with the inner surface 386 of the second lower shell segment 348. Additionally, in the assembled, operative state, the displaceable rod aperture 372 preferably overlies the displaceable rod aperture 382, ​​and each of the temperature reader cutouts 374 is aligned with a corresponding one of the temperature reader cutouts 384. In a preferred embodiment of the present invention, in the assembled, operative orientation, the loading rod apertures 352 and 362 and the displaceable rod apertures 372 and 382 are all substantially coaxial with one another along axis 390.

[0159] As in Figure 4C, the inner surfaces 356 and 376 of the respective first upper shell segment 342 and first lower shell segment 344 together define a space 392 operative to receive the base 320. Thus, the NMFH 312 is formed from at least two segments, such as the first upper shell segment 342 and the first lower shell segment 344, and the at least two segments in combination define a space, such as the space 392, and the base 320 is disposed within the space 392.

[0160] In another embodiment of the present invention, as in Figures 6A to 6C As specifically seen in FIG, in the NMFH 314, the plurality of shells 330 are implemented as a plurality of shells 393 and include a plurality of shell segments, which are preferably quarter-cylinder shaped. The shells 393 preferably include a set of first shell segments 394 and a set of second shell segments 396.

[0161] As in Figure 6C As can be seen in detail in FIG, each of the first shell segments 394 has a pair of elongated edges 398, each of which has a semicircular cutout 400 formed in its central portion. In addition, each of the first shell segments 394 includes an inner surface 401 and an outer surface 402.

[0162] Similarly, each of the second shell segments 396 has a pair of elongated edges 403, each of which has a semicircular cutout 404 formed in its central portion. In addition, each of the second shell segments 396 includes an inner surface 405 and an outer surface 406.

[0163] When in the assembled orientation, each elongated edge 398 of each first shell segment 394 is in substantially complete contact with the elongated edge 398 of another one of the first shell segments 394, and the semicircular cutouts 400 of adjacent first shell segments 394 are aligned to define a circular aperture. Similarly, in the assembled orientation, each elongated edge 403 of each second shell segment 396 is in substantially complete contact with the elongated edge 403 of another one of the second shell segments 396, and the semicircular cutouts 404 of adjacent second shell segments 396 are aligned to define a circular aperture.

[0164] Additionally, when in the assembled, operational orientation, the first shell segment 394 is nested within the second shell segment 396 such that the outer surface 402 of the first shell segment 394 is substantially completely in contact with the inner surface 405 of the second shell segment 396 .

[0165] In addition, in the assembled operating state, each of the circular orifices defined by the semicircular cutout 404 is superimposed on the corresponding circular orifice defined by the semicircular cutout 400, thereby defining a plurality of circular orifices similar to the loading rod orifices 362 and 352, the shiftable rod orifices 372 and 382, ​​and the orifices formed by the temperature reader cutouts 364 and 354.

[0166] The inner surfaces 401 of the first shell segments 394 together define a space 407 that is operative to receive the base 320. Thus, the NMFH 310 is formed from at least two segments, such as four shell segments 394, and the at least two segments in combination define a space, such as space 407, and the base 320 is disposed within space 407.

[0167] Each of the shells 330 is preferably entirely or predominantly composed of a rigid ceramic material, such as, in particular, zirconium oxide, hafnium dioxide, high-temperature carbide, or thoria, or a flexible ceramic material, such as, in particular, graphite paper or aluminum oxide felt. In a preferred embodiment of the invention, the different layers of the shell are at least partially composed of mutually different materials.

[0168] For example, in an embodiment of the present invention, the shell 330 of the NMFH 310 includes three layers of shell segments. In this exemplary embodiment, the first set of shell segments is composed of zirconium oxide, hafnium dioxide, high-temperature carbide, or thoria, the second set of shell segments is composed of graphite paper or alumina felt, and the third set of shell segments is composed of the same material as the first set of shell segments. Thus, in this exemplary embodiment, the NMFH 310 includes a multilayer shell 330 comprising two layers of at least one of zirconium oxide, hafnium dioxide, and thoria, interleaved with at least one layer of at least one of graphite paper, alumina felt, and a ceramic material.

[0169] As described above, shell 330 includes separate segments, such as shell segments 342 and 344 or shell segment 394, and separate layers, such as first shell segments 342 and 344 and second shell segments 346 and 348, or shell segment 394 and shell segment 396. The separate segments and layers of shell 330 preferably reduce the risk of mechanical damage to shell 330 due to thermal stresses relative to a non-segmented and non-layered continuous shell. Furthermore, if one segment or layer of shell 330 does suffer mechanical damage, such as cracking, the other segments and layers of shell 330 can remain undamaged and still be usable for use in NMFH 310.

[0170] Furthermore, because the multi-layer shells 330 are available for use in the NMFH 310, the user or supplier is preferably able to select customized multi-layer shells 330 to form the NMFH 310 with a customized material mixture and a customized thickness. The number and composition of the shells 330 included in the NMFH 310 are preferably determined at least in part by the amount of thermal insulation required to provide a relatively small amount of heat loss from the base 320, thereby improving its heating efficiency. Additionally, the number and composition of the shells 330 included in the NMFH 310 are preferably determined at least in part by the amount of thermal insulation required to provide sufficient thermal shielding between the base 320 and other components of the system 100, most particularly the coil 324, thereby preventing thermal damage to the other components of the system 100, most particularly the coil 324.

[0171] Furthermore, the number and composition of the shells 330 included in the NMFH 310 can be determined, at least in part, by the difference in respective dimensions, particularly the difference in respective cross-sectional areas, between the space 328 and the base 320. In other words, the number and composition of the shells 330 included in the NMFH 310 can be selected to ensure that the HTF 150 conveniently fits within the space 328 defined by the coil 324.

[0172] Preferably, in addition to providing thermal insulation, some of the shells 330 of the NMFH 310 form a diffusion barrier, thereby reducing undesirable particle migration between different components of the system 100. For example, the system may include a component formed of solid graphite in physical contact with or in proximity to a component formed of solid zirconia. At high temperatures, graphite atoms from the solid graphite tend to diffuse into the solid zirconia.

[0173] Thus, if the susceptor 320 is formed of graphite and the first shell segments 342 and 344 or the first shell segment 394 is formed of zirconia, the NMFH 310 preferably includes an optional shell formed of graphite paper (not shown) between the susceptor 320 and the first shell segments 342 and 344 or the first shell segment 394. The optional graphite paper shell acts as a diffusion barrier, fully or partially preventing the undesirable migration of graphite particles from the susceptor 320 into the first shell segments 342 and 344 or the first shell segment 394. The optional graphite paper shell preferably extends the life of the susceptor 320 by reducing the migration of graphite atoms out of the susceptor 320. In addition, the optional graphite paper shell preferably extends the life of the first shell segments 342 and 344 or the first shell segment 394 by reducing the migration of graphite atoms into the first shell segments 342 and 344 or the first shell segment 394.

[0174] As described above, the insulation provided by the NMFH 310 results in a relatively low amount of heat loss from the susceptor 320. It will be appreciated that the relatively low amount of heat loss from the susceptor 320 results in relatively efficient heating of the susceptor 320, the test cell 160, and the sample 130, as characterized by a relatively short amount of time required to heat the susceptor 320, the test cell 160, and the sample 130 and a relatively high heating rate of the susceptor 320, the test cell 160, and the sample 130.

[0175] Additionally, the relatively low amount of heat loss from pedestal 320 results in relatively low undesired heating of components other than pedestal 320, test cell 160, and sample 130. The relatively low undesired heating, in turn, results in a relatively shorter amount of time required to cool down system 100 after testing of sample 130, compared to conventional material properties testing systems, because system 100 includes a low level of undesired heat that must be removed as part of the cooling process, relative to conventional material properties testing systems.

[0176] The base 320 may have any suitable shape. Figures 1A to 11D In the embodiment shown in , the base 320 is cylindrical and is formed of a conductive material such as, among others, graphite or silicon carbide. In a preferred embodiment of the present invention, the base 320 comprises an upper semi-cylindrical portion 408 and a lower semi-cylindrical portion 410. Figures 1A to 11D In the embodiment shown in , the upper semi-cylindrical portion 408 and the lower semi-cylindrical portion 410 are identical to each other. In another embodiment of the present invention, the upper semi-cylindrical portion 408 and the lower semi-cylindrical portion 410 are different from each other.

[0177] As in Figure 4D 、 Figure 4E and Figure 5 , upper semi-cylindrical portion 408 includes a generally flat surface 412, a curved surface 414 forming a pair of slots 415, a loading rod hole 416, a pair of pin recesses 418, and a test unit recess 420. In the assembled, operative orientation, loading rod hole 416 is preferably coaxial with loading rod apertures 352 and 362 along axis 390.

[0178] The lower semi-cylindrical portion 410 similarly includes a generally flat surface 422, a curved surface 424, a displaceable rod hole 426, a pair of pin recesses 428, and a test unit recess 430. In the assembled, operative orientation, the displaceable rod hole 426 is preferably coaxial with the displaceable rod apertures 372 and 382 along the axis 390. Each of the pin recesses 418 and 428 is operative to receive a pin 432. The lower semi-cylindrical portion 410 further includes a left end 436 formed with a pin receiving slot 438 and a right end 442 formed with a pin receiving slot 444.

[0179] As in Figure 4B As particularly seen at enlarged detail C in FIG, the test unit recesses 420 and 430 of the respective upper and lower semi-cylindrical portions 408, 410 together define an enclosure 450. The enclosure 450 is operative to receive the test unit 160. Thus, the base 320 includes at least two portions, such as the upper semi-cylindrical portion 408 and the lower semi-cylindrical portion 410, which combine to form an enclosure, such as the enclosure 450 defined by the test unit recesses 420 and 430, adapted to enclose the test unit 160 therein.

[0180] In a preferred embodiment of the present invention, the recess 450 can enclose various types of test units 160, such as those specifically referred to herein. Figure 4D and Figure 4E The 4PB test unit 162, 4PB fracture test unit, and the like are specifically referred to below. Figure 5 The test cell 160 is operative to perform material property testing of the sample 130. The components of the test cell 160 are preferably formed from temperature resistant materials such as graphite or silicon carbide, among others.

[0181] As in Figure 4D and Figure 4E Specifically seen in Figure 4D The enlarged image D and Figure 4E As seen more particularly at enlarged view E in FIG, in an embodiment of the present invention, the test cell 160 is implemented as a 4PB test cell 162 and includes an upper loading pin carrier (ULPC) 522, a lower support pin carrier (LSPC) 524, and four preferably cylindrical pins, including a pair of upper loading pins 526 and a pair of lower support pins 528. The upper loading pins 526 and the lower support pins 528 preferably allow for load balancing across the sample 130 during material property testing, as required according to test standards set forth, for example, by the American Society for Testing and Materials International (ASTM International) and the International Organization for Standardization (ISO).

[0182] exist Figures 1A to 11D In the embodiment shown in FIG, all of the guide pins 284 and 298, the pin 432, the upper loading pin 526, and the lower support pin 528 are identical to one another. In another embodiment of the present invention, at least some of the guide pins 284 and 298, the pin 432, the upper loading pin 526, and the lower support pin 528 are different from one another.

[0183] The ULPC 522 includes an inner surface 530 formed with a pair of pin recesses 532, each of which is operative to receive one of the upper loading pins 526. The ULPC 522 is preferably further formed with a pair of deformation notches 534, which are operative to receive portions of the sample 130 that may deform during testing. The ULPC 522 also includes an outer surface 536, which is further preferably formed with a loading rod recess 538. In the assembled operational orientation, the loading rod recess 538 is preferably coaxial with the loading rod apertures 352 and 362 and the loading rod hole 416 along the axis 390. In another preferred embodiment of the present invention, the loading rod recess 538 is omitted.

[0184] Similar to the ULPC 522, the LSPC 524 includes an inner surface 540 formed with a pair of pin recesses 542, each of which is operative to receive one of the lower support pins 528. The inner surface 540 of the LSPC 524 is preferably further formed with a deformation recess 546, which is operative to receive a portion of the sample 130 that may deform during testing. The LSPC 524 is further formed with a displaceable rod aperture 548. In the assembled operational orientation, the displaceable rod aperture 548 is preferably coaxial with the displaceable rod apertures 372 and 382 and the displaceable rod hole 426 along the axis 390.

[0185] It should be understood that the 4PB fracture test cell is generally identical to the 4PB test cell 162. Unlike the 4PB test cell 162, which accepts a sample 130 without a notch, the 4PB fracture test cell accepts a sample with a notch, preferably in the lower center portion of the sample, as is known in the art.

[0186] As in Figure 5 Specifically seen in Figure 5 As seen more particularly at enlarged view F in FIG, in an additional embodiment of the present invention, the test cell 160 is implemented as a 3PB test cell 166 and includes an LSPC 524 and two lower support pins 528. The lower support pins 528 preferably allow for load balancing across the sample 130 during material property testing, as required according to test standards set forth, for example, by the American Society for Testing and Materials International (ASTM International) and the International Organization for Standardization (ISO). Each of the lower support pins 528 is preferably received by one of the pin recesses 542 formed in the inner surface 540 of the LSPC 524. In the assembled, operative orientation, the displaceable rod aperture 548 of the LSPC 524 is preferably coaxial with the displaceable rod apertures 372 and 382 and the displaceable rod hole 426 along the axis 390.

[0187] It should be understood that the 3PB fracture test cell is generally identical to the 3PB test cell 166. Unlike the 3PB test cell 166, which accepts a sample 130 without a notch, the 3PB fracture test cell accepts a sample with a notch, preferably in the lower center portion of the sample, as is known in the art.

[0188] Now refer to Figure 7A 、 Figure 7B 、 Figure 7C and Figure 7D , which are respectively simplified schematic assembled isometric, side plan, front cross-sectional, and exploded views of the load application system 170 , Figure 7C It is along Figure 7B The load application system 170 operates to control the application of the test load to the sample 130. It should be understood that the present invention is referred to as 7A to 7D The specific embodiments of the load application systems described are provided by way of example only, and other types of load application systems may be used with the present invention.

[0189] The load application system 170 generally includes a linear actuator 602 and a loading rod 610, the linear actuator 602 including a drive shaft 604. The linear actuator 602 is preferably a low-torque load cell that operates to control the application of a test load to the sample 130. More specifically, the linear actuator 602 is preferably operated to drive the loading rod 610, which in turn applies a force constituting the test load to the sample 130 during testing of the sample 130. The linear actuator 602 is preferably a low-torque precision linear actuator that drives and positions the loading rod 610 at a controlled rate and can be any suitable linear actuator, such as, in particular, a stepper motor or a DC gearbox. Exemplary stepper motors suitable for use as the linear actuator 602 include the 8K2105AF4-100SMSN-001 and the 4K4105AA4-150SUSEK112-DSI-001, both of which are commercially available from Dings' Motion of Changzhou, Jiangsu Province, China.

[0190] The force sensor 616 connects the linear actuator 602 to the loading rod 610 and preferably measures the load applied to the sample 130 by the load application system 170. The force sensor 616 is typically implemented as a load cell, preferably a bidirectional load cell. Exemplary load cells suitable for use as the force sensor 616 include the LSP-1 and LSP-10, both of which are commercially available from Transducer Techniques of Temecula, CA, USA.

[0191] As in Figure 7C and Figure 7DAs particularly seen in FIG, the load application system 170 also includes an actuator connector assembly 622 and a load rod connector assembly 624. The actuator connector assembly 622 includes an upper load sensor connector 626 and an actuator connector rod 630. The upper load sensor connector 626 is preferably formed with a pair of fastener apertures 632 and a connector rod aperture 634. A pair of fasteners 636 are preferably installed in the fastener apertures 632 and secure the actuator connector assembly 622 to the force sensor 616.

[0192] The load rod connector assembly 624 includes a lower load sensor connector 646 that is preferably formed with a pair of fastener apertures 648, a load rod aperture 652, and a load rod fastener aperture 654. A plurality of fasteners 656 are preferably installed in the fastener apertures 648 and secure the load rod connector assembly 624 to the force sensor 616. Fasteners 658 are preferably installed in the load rod fastener apertures 654 and secure the load rod connector assembly 624 to the load rod 610. The load rod 610 is preferably formed of a temperature resistant material such as, among others, graphite or silicon carbide.

[0193] The load application system 170 also includes a sealing connector 662, an actuator mount 664, and a mounting plate 670. The linear actuator 602 is fixedly mounted in the actuator mount 664, which is in turn mounted on the sealing connector 662. The mounting plate 670 is preferably formed with a sealing housing aperture 672 operative to receive the sealing connector 662 and a plurality of fastener apertures 676 operative to receive a plurality of fasteners for fixedly attaching the mounting plate 670 to the upper surface of the environmental chamber 104. The mounting plate 670 preferably forms a substantially vacuum-tight seal between the aperture 116 and the environment surrounding the environmental chamber 104.

[0194] As in Figure 7C , a lower end 682 of the actuator connector rod 630 is received within the sealing connector 662 and is surrounded by an o-ring 684. Preferably, the sealing connector 662 and the o-ring 684 together form a substantially vacuum tight seal between the apertures 116 and 672 and the environment surrounding the environmental chamber 104. The lower end 682 of the actuator connector rod 630 is preferably mounted in the connector rod aperture 634 of the upper load sensor connector 626. The upper end 688 of the actuator connector rod is preferably received within the actuator mount 664 and attached to the drive shaft 604 of the linear actuator 602.

[0195] Now refer to Figure 8A 、 Figure 8B 、 Figure 8C and Figure 8D, which are simplified schematic assembled isometric, front plan, side cross-sectional, and exploded views, respectively, of a deflectometer 182 , which is an embodiment of the deflectometer 180 , Figure 8C It is along Figure 8B Now refer to the line 8C-8C in Figure 9A , Figure 9A is a simplified schematic assembled isometric illustration of a deflectometer 184, which is an alternative embodiment of the deflectometer 180; and now referring to Figure 9B 、 Figure 9C 、 Figure 9D and FIG. 9E , which are simplified schematic illustrations of an enlarged assembled detail view, a front plan view, a side sectional view, and an exploded view, respectively, of a portion of the deflectometer 184 , Figure 9D It is along Figure 9C The line 9D-9D is intercepted.

[0196] It should be understood that this article refers to Figure 8A The specific embodiment of the deflectometer 180 described and illustrated in FIG9E is provided by way of example only, and other types of deflectometers may alternatively be used within the present invention. For example, non-contact systems may be employed within the present invention to sense the deflection of a sample, such as, by way of non-limiting example only, systems based on laser interferometry, ultrasonic distance sensing, and confocal distance measurement.

[0197] Deflectometer 180 is a position sensor, preferably a high temperature linear variable differential transformer (LVDT) sensor, that operates to measure the deflection of sample 130 during testing of sample 130 .

[0198] The deflectometer 180 includes a displaceable rod 710 having a working end 712 and a mounting end 714. The working end 712 of the displaceable rod 710 is generally tapered and includes a generally flat top surface 716 that preferably maintains mechanical contact with the sample 130 during testing of the sample 130. Preferably, the top surface 716 does not readily cut or notch the sample 130. The displaceable rod 710 is preferably formed of a temperature-resistant material such as, among others, graphite or silicon carbide.

[0199] As in Figure 8DAs particularly seen in FIG. 1 , the deflectometer 180 further includes a movable mounting platform 720 formed with a displaceable rod aperture 722 in which the mounting end 714 of the displaceable rod 710 is fixedly mounted. The movable mounting platform 720 preferably also includes a support rod aperture 724 that slidably receives a support rod 730 of the deflectometer 180. The support rod 730 includes a mounting end 734 that is preferably received within a hollow cylindrical support member 736 and fixedly mounted within a suitable recess formed in the mounting plate 190 of the AMPT 102. The movable mounting platform 720 preferably also includes a core rod slot 742 and a fastener aperture 744.

[0200] The deflectometer 180 preferably further includes a position transducer 750, which is preferably a high temperature LVDT transducer. An exemplary LVDT transducer suitable for use as the position transducer 750 is the LVDT MHR 250ASSY commercially available from TE Connectivity of Schaffhausen, Switzerland. The position transducer 750 preferably includes a core rod 752 having a working end 754 and a mounting end 756. The mounting end 756 of the core rod 752 is preferably fixedly mounted to a rod 760. The rod 760 includes an upper end 762 to which the core rod 752 is mounted and a lower end 764 that is mounted within the core rod slot 742 using a fastener 766 received by a fastener aperture 744.

[0201] As in Figure 8C , working end 754 of core rod 752 is slidably mounted within transducer body 768 of position transducer 750. Rod 760 and core rod 752 are fixedly mounted to one another, for example, by complementary threads (not shown) on mounting end 756 of core rod 752 and upper end 762 of rod 760.

[0202] The position transducer 750 is in turn at least partially fixedly housed within the transducer housing 770 by a plurality of fasteners 771. At least one of the fasteners 771 is preferably resilient, preferably formed of neoprene, which allows for relatively strong frictional engagement between the transducer housing 770 and the position transducer 750 without damaging or deforming the position transducer 750.

[0203] A side wall 772 of the transducer housing 770 is formed with a plurality, preferably two, air apertures 774 operative to receive a plurality of air fittings 775 for cooling at least a portion of the deflectometer 180, preferably including the position transducer 750. The air fittings 775 are preferably connected to an air supply (not shown) for cooling at least a portion of the deflectometer 180.

[0204] A top wall 776 and a bottom wall 778 of the transducer housing 770 are each preferably formed with a support rod aperture 780 operable to fixedly receive the support rod 730, a displaceable rod aperture 782 operable to slidably receive the displaceable rod 710, and a transducer aperture 784 operable to receive a portion of the transducer 750, such as the transducer body 768 or the core rod 752. A plurality of fasteners 786 preferably fixedly attach the transducer housing 770 to the support rod 730.

[0205] It should be understood that during preferred use of the system 100, the support rod 730, the body 768 of the position transducer 750, and the transducer housing 770 each remain stationary. Additionally, during preferred use of the system 100, each of the displaceable rod 710 and the rod 760 is fixedly mounted on the movable mounting platform 720. The movable mounting platform 720 is preferably operative to move up and down in the direction indicated by arrow 788. It should be understood that the displaceable rod 710 and the rod 760 are each fixedly mounted on the movable mounting platform 720, and the core rod 752 is fixedly mounted to the rod 760. Thus, when the movable mounting platform 720 moves in the direction indicated by arrow 788, the displaceable rod 710, the rod 760, and the core rod 752 also move with the movable mounting platform 720. However, even during movement of the movable mounting platform 720 in the direction indicated by arrow 788 , each of the body 768 and the transducer housing 770 of the position transducer 750 remains stationary relative to the HTF 150 and the mounting platform 190 .

[0206] In an embodiment of the present invention, as in Figures 8A to 8D , the deflectometer 182 further includes a spring 790 having an upper end 792 and a lower end 794. The upper end 792 of the spring 790 preferably receives the mounting end 714 of the displaceable rod 710, and the lower end 794 of the spring 790 is preferably fixedly mounted within a suitable recess formed in the mounting plate 190 of the AMPT 102. The spring 790 preferably urges the movable mounting platform 720 upward against gravity, preferably ensuring that the upper surface 716 of the displaceable rod 710 remains in contact with the sample 130 during testing of the sample 130.

[0207] In another embodiment of the present invention, as in 9A to 9D Specifically seen in and Figure 9A As can be seen in detail in the enlarged view G of FIG, the deflectometer 184 does not include a spring, but rather includes a counterweight mechanism 810. The counterweight mechanism 810 includes a weighted rod 812 partially mounted within a counterweight support 814. Figure 9C and Figure 9D , the counterweight support 814 preferably includes a pair of pivot apertures 822, a mounting rod hole 824, a fastener hole 826, and a weight rod slot 828. A fastener 832 received by the fastener hole 826 preferably attaches the mounting rod 834 within the mounting rod hole 824 of the counterweight support 814. Thus, the counterweight support 814 is preferably fixedly mounted on the mounting rod 834, which in turn is fixedly mounted within a suitable recess formed in the mounting plate 190 of the AMPT 102.

[0208] The weighted bar 812 has a first side 842 and a second side 844. The first side 842 of the weighted bar 812 is preferably formed with a weight-bearing aperture 846. The weighted bar 812 is further formed with a pivot aperture 848. The weight-bearing aperture 846 is preferably used to fixedly mount a counterweight 850 on the weighted bar 812. The movable mounting platform 720 preferably rests on an upper surface 851 of the second side 844 of the weighted bar 812.

[0209] The counterweight 850 preferably has a mass sufficient to counteract the force of gravity exerted on the movable mounting platform 720, thereby pushing the movable mounting platform upward, and preferably ensuring that the upper surface 716 of the displaceable rod 710 remains in contact with the sample 130 during testing of the sample 130. Figures 8A to 8D In the embodiment shown in FIG, the counterweight 850 includes a bolt 852 on which a plurality of weighting elements 854, such as a plurality of nuts and nuts with covers, are mounted.

[0210] The counterweight mechanism 810 preferably also includes a pivot pin 860 about which a cylindrical support 862 is mounted. The pivot pin 860 is preferably received by the pivot aperture 822 of the counterweight support 814 and the pivot aperture 848 of the weight rod 812. The cylindrical support 862 is preferably received by the pivot aperture 848 of the weight rod 812. The pivot pin 860 and the cylindrical support 862 together pivotally attach the weight rod 812 to the counterweight support 814, enabling the weight rod 812 to rotate within the weight rod slot 828.

[0211] It should be understood that the downward force of gravity on the first side 842 of the weighted bar 812 pushes the weighted bar 812 to rotate about the pivot pin 860 in the direction indicated by arrow 874, which in turn pushes the second side 844 of the weighted bar 812 upward against the force of gravity. Conversely, the downward force of gravity acting on the movable mounting platform 720 exerts a downward force on the second side 844 of the weighted bar 812, thereby pushing the weighted bar 812 to rotate about the pivot pin 860 in the direction indicated by arrow 876.

[0212] In yet another embodiment of the present invention, deflectometer 180 is omitted. In embodiments where system 100 does not include deflectometer 180, the deflection of sample 130 is preferably measured by a portion of system 100 other than deflectometer 180, such as by load application system 170, as described below.

[0213] It should be understood that the system 100 includes suitable cooling systems, thermal shielding, and electromagnetic shielding. For example, an insulating mat 192, preferably formed of fiberglass, is preferably positioned between the mounting plate 190 and the floor 112 of the environmental chamber 104 to provide a degree of thermal insulation between the AMPT 102 and other parts of the system 100. The system 100 typically includes additional insulating components (not shown) in addition to the insulating mat 192.

[0214] Now refer to 10A to 11D , which are simplified schematic diagrams showing sequential steps in the preparation and use of a system 100 for performing material property testing according to a preferred embodiment of the present invention, and reference is now made to Figure 12 , Figure 12 is a simplified flow chart illustrating steps in the preparation and use of a system 100 for performing material property testing according to a preferred embodiment of the present invention. Figures 10K to 10M Each shows a single step, and Figure 10M It is along Figure 10L The line 10M-10M is intercepted. Figure 11B It is along Figure 11A The line 11B-11B is intercepted, and Figure 11D It is along Figure 11C The line 11D-11D is intercepted.

[0215] A particular feature of the present invention is that system 100 allows for staging of samples 130 and complete or partial pre-assembly of HTF 150 outside of environmental chamber 104, thereby facilitating rapid changeover between some of the sample tests and resulting in relatively high throughput.

[0216] Steering Figure 10A and Figure 12In a first step 1102, the user prepares the base 320 of the HTF 150 to receive the sample 130 and the test unit 160. As part of step 1102, the user places the pin 432 in the pin recess 428 of the lower semi-cylindrical portion 410 of the base 320. The user preferably also prepares the lower semi-cylindrical portion 410 of the base 320 and some of the shell segments of the NMFH 310, such as the first lower shell segment 344 and the second lower shell segment 348, in their respective operating orientations.

[0217] As in Figure 10B As specifically seen in FIG, also at step 1102, the user prepares at least a portion of the test unit 160 for insertion into the test unit recess 430. Preferably, Figure 10B In the portion of step 1102 shown in FIG. 1 , the user prepares the LSPC 524 and lower support pin 528 for insertion into the test unit recess 430 .

[0218] The user then preferably assembles the lower semi-cylindrical portion 410 of the base 320 and some of the shell segments of the NMFH 310, such as the first lower shell segment 344 and the second lower shell segment 348, into their partially assembled operating states. In the partially assembled operating state, the curved surface 424 of the lower semi-cylindrical portion 410 is substantially completely in contact with the inner surface 376 of the first lower shell segment 344, and the outer surface 378 of the first lower shell segment 344 is substantially completely in contact with the inner surface 386 of the second lower shell segment 348.

[0219] As in Figure 10B 、 Figure 10C and Figure 12 As seen in particular in FIG, at the next step 1104, the user then places the test unit 160 and at least a portion of the sample 130 into the test unit recess 430. Figure 10B and Figure 10C In the embodiment shown in FIG, the user inserts the LSPC 524 into the test unit recess 430 so that the inner surface 540 having the pin recess 542 faces upward. The user also places each of the lower support pins 528 into the pin recess 542 and places the sample 130 on the lower support pins 528.

[0220] If the 4PB test unit 162 or 4PB fracture test unit is to be used, then at step 1104, as in Figure 10D, the user also preferably orients the upper semi-cylindrical portion 408 of the base 320 so that the test cell recess 420 faces upward, and prepares the ULPC 522 and loading pins 526 to be positioned in the test cell recess 420. The user then inserts the ULPC 522 into the test cell recess 420 so that the inner surface 530 having the pin recesses 532 faces upward. The user then positions each of the upper loading pins 526 into the pin recess 532 of the ULPC 522. The user may use a positioning tool, such as tweezers or pliers, to help position any or all of the components, such as the LSPC 524, support pins 528, sample 130, loading pins 526, and ULPC 522, in their operational orientation. Thereafter, the user preferably covers the test cell recess 420, ULPC 522, and loading pin 526 with a thin, flexible, flat object, such as a piece of card stock 1110, and rotates the upper cylindrical portion 408 so that the test cell recess 420 faces downward. If a 3PB test cell 166 or a 3PB fracture test cell is to be used, omit the test cell recess 420. Figure 10D Follow the steps shown in .

[0221] As in Figure 10E 、 Figure 10F and Figure 12 As seen in particular in FIG, still at steps 1102 and 1104, the user preferably places the upper semi-cylindrical portion 408 onto the lower semi-cylindrical portion 410 such that each of the pin recesses 418 receives one of the pins 432. As shown in FIG. Figure 10G , the user then preferably removes the card stock 1110 from between the upper semi-cylindrical portion 408 and the lower semi-cylindrical portion 410 of the base 320, preferably by sliding the card stock 1110 in a direction generally parallel to the flat surfaces 412 and 422 until the card stock 1110 is no longer in contact with the base 320 and the generally flat surface 412 of the upper semi-cylindrical portion 408 is substantially completely in contact with the generally flat surface 422 of the lower semi-cylindrical portion 410. The pin 432 preferably prevents undesirable relative longitudinal movement between the upper semi-cylindrical portion 408 and the lower semi-cylindrical portion 410 of the base 320. Thus, the pin 432 preferably helps to maintain the base 320 in its operative orientation.

[0222] It should be understood that at step 1104, the user at least partially encloses the sample 130 and the test unit 160 within the base 320, and more specifically, within the enclosure 450 defined by the test unit recesses 420 and 430 of the base 320. Figures 10A to 10G As specifically shown in FIG, fractionation of the sample 130 occurs outside of the environmental chamber 104.

[0223] As in Figure 10H and Figure 12 As specifically seen in FIG, at the next step 1112, the user places some of the shell segments of the NMFH 310, such as the first upper shell segment 342 and the second upper shell segment 346, into their partially assembled operating state. In the partially assembled operating state, the curved surface 414 of the upper semi-cylindrical portion 408 of the base 320 is substantially completely in contact with the inner surface 356 of the first upper shell segment 342, and the outer surface 358 of the first upper shell segment 342 is substantially completely in contact with the inner surface 366 of the second upper shell segment 346.

[0224] Thus, at step 1112, the user positions the base 320 at least partially within the space defined by at least two sections of the NMFH 310 of the HTF 150. Figures 10A to 10M In the embodiment shown in FIG, at step 1112, the user at least partially positions the base 320 within the space 392 defined by the first upper shell section 342 and the first lower shell section 344 of the NMFH 312 of the HTF 150. Alternatively, at step 1112, the user at least partially positions the base 320 within the space 407 defined by the first shell section 394 of the NMFH 314 of the HTF 150.

[0225] In embodiments where a shell 330 other than the first upper shell segment 342, the second upper shell segment 346, the first lower shell segment 344, and the second lower shell segment 348 is used in the NMFH 310, the shell 330 used in the NMFH 310 may be similar to the shell 330 described above with reference to FIG. Figures 10A to 10H The described arrangements of the first upper shell segment 342 , the second upper shell segment 346 , the first lower shell segment 344 , and the second lower shell segment 348 are similarly arranged in their respective operational orientations.

[0226] Therefore, in Figures 10A to 10H In the embodiment shown in FIG, the test cell 160 and the sample 130 are enclosed within a base 320, and the base 320 is partially enclosed within the NMFH 310 outside the environmental chamber 104. Figures 10A to 10H In the embodiment shown in , complete pre-assembly of the HTF 150 occurs outside of the environmental chamber 104 .

[0227] At the next step 1114, Figure 10I 、 Figure 10J and Figure 12 As specifically seen in FIG, a user typically positions the HTF 150 containing the test unit 160 and the sample 130 within its enclosure 450 within the space 328 of the coil 324 of the heat source 140 by sliding the HFT 150 through the interior of the space 328 of the coil 324 of the heat source 140. Preferably, Figure 10I Prior to the steps shown in , the left support wall 210 has been installed on the mounting base 190. Figure 10I Before the step shown in , preferably, the first support rod 232 and the second support rod 234 have been installed on the left support wall 210, and the guide pin 284 has also been installed in the pin recess 282 of the left support wall 210. Figure 10I and Figure 10J , the user positions the left end portion 436 of the lower semi-cylindrical portion 410 of the base 320 within the furnace recess 278 of the left support wall 210. To help maintain the proper rotational orientation of the HTF 150, the pin receiving slot 438 of the left end portion 436 of the base 320 slides along the guide pin 284 of the left support wall 210 as the user completes sliding the HTF 150 through the space 328 of the coil 324.

[0228] As in Figure 10J and Figure 10K , the user installs the guide pin 298 within the pin recess 296 of the right support wall 220 and mounts the right support wall 220 on the mounting base 190 such that the right end 442 of the lower semi-cylindrical portion 410 of the base 320 rests within the furnace recess 294 of the right support wall 220. Typically, the user installs the right support wall 220 by sliding the right support wall 220 between the HTF 150 and the mounting plate 190. To help maintain the proper rotational orientation of the HTF 150, the guide pin 298 mounted on the right support wall 220 slides along the pin receiving slot 444 of the right end 442 of the base 320 as the user slides the right support wall 220 between the HTF 150 and the mounting plate 190.

[0229] It should be understood that as Figures 10I to 10K As an alternative to the use case illustrated in FIG, the user may install the right support wall 220 on the mounting base 190 before the step shown in step 10I, and install the left support wall 210 on the mounting base 190 after the step shown in step 10I. In this use case, as in Figures 10I to 10K In the usage scenario illustrated in the figure, the left end portion 436 of the lower semi-cylindrical portion 410 of the base 320 is placed in the furnace recess 278 of the left support wall 210, wherein the guide pin 284 of the left support wall 210 is received by the pin receiving groove 438 of the left end portion 436 of the base 320, and the right end portion 442 of the lower semi-cylindrical portion 410 of the base 320 is placed in the furnace recess 294 of the right support wall 220, wherein the guide pin 298 of the right support wall 220 is received by the pin receiving groove 444 of the right end portion 442 of the base 320.

[0230] exist Figures 10A to 12In the embodiment of the method illustrated in FIG, step 1112 precedes step 1114. In another embodiment of the present invention, step 1114 precedes step 1112. Therefore, in another embodiment of the present invention, 10A to 10I , the user assembles the upper and lower semi-cylindrical portions 408, 410 of the base 320, the test unit 160, and the sample 130 in a manner similar to that described with reference to steps 1102 and 1104. However, in another embodiment, the user does not position the shell 330 around the base 320 until after the base 320 has been positioned within the space 328 of the coil 324 of the heat source 140.

[0231] In other words, in another embodiment, the order of steps 1114 and 1112 is reversed, and the user preferably first places the base 320 containing the test unit 160 and the sample 130 within its enclosure 450 within the space 328 of the coil 324 of the heat source 140. Thereafter, the user inserts the shell 330 of the NMFH 310 between the base 320 and the coil 324, thereby bringing the HTF 150 into its fully assembled operational orientation, arriving at Figure 10J Follow the steps shown in .

[0232] Thus, in another embodiment, in which step 1114 precedes step 1112, the user encloses the test unit 160 and sample 130 within the base 320 while the base 320 is located outside the environmental chamber 104. However, in another embodiment, the user partially encloses the base 320 within the NMFH 310 only after positioning the base 320 within the coil 324, which occurs inside the environmental chamber 104. Thus, in another embodiment, in which step 1114 precedes step 1112, partial pre-assembly of the HTF 150 occurs outside the environmental chamber 104.

[0233] As in Figure 10J and Figure 10K , the turns 326 of the coil 324 prevent disassembly of the HTF 150. When the HTF 150 is inside the space 328, the turns 326 of the coil 324 prevent the shell 330 and the upper and lower semi-cylindrical portions 408, 410 of the base 320 from shifting along the axis 390, thereby ensuring that the HTF 150 remains in the assembled operational orientation during testing of the sample 130. Figure 10M As particularly seen in FIG, pin receiving slots 438 and 444 and guide pins 284 and 298 help maintain the proper rotational operational orientation of HTF 150.

[0234] exist Figures 10K to 10M At step , AMPT 102 is almost in its fully assembled operational orientation. Figures 10K to 10M At the steps, such as Figure 10M Neutralization Figure 10M As can be seen in detail at the enlarged view H of FIG, the test unit 160 and the sample 130 are enclosed in the HTF 150, which is located in the space 328 defined by the coil 324. Additionally, the left support wall 210 and the right support wall 220 are mounted on the mounting base 190. However, as shown in FIG. Figure 10M Specifically seen in the enlarged detail H, Figures 10K to 10M At step , neither the loading rod 610 nor the displaceable rod 710 has yet come into contact with the test unit 160 or the sample 130 .

[0235] exist Figures 10K to 10M After the steps, as in Figures 11A to 11B and Figure 12 As specifically seen in FIG, at the next step 1116, the user prepares the load application system 170 and the position measurement system for use during testing. At step 1116, the loading rod 610 is preferably brought into contact with the test cell 160 or sample 130. If a 4PB test cell 162 or a 4PB fracture test cell is to be used, the loading rod 610 is passed through the loading rod apertures 352 and 362 and the loading rod hole 416 so that the loading rod 610 contacts the outer surface 536 of the ULPC 522. In embodiments where the outer surface 536 of the ULPC 522 is formed with a loading rod recess 538, the loading rod 610 preferably contacts the loading rod recess 538 at step 1116.

[0236] Alternatively, if the 3PB test cell 166 or 3PB fracture test cell is to be used, the loading rod 610 is passed through the loading rod apertures 352 and 362 and the loading rod hole 416 so that the loading rod 610 contacts the sample 130 .

[0237] In an embodiment of the present invention, the load application system 170 is used both to apply force to the sample 130 and to measure the position of the sample 130. In this embodiment, the loading rod 610 is positioned at step 1116 to prepare both the load application system 170 and the position measurement system, which is also implemented as the load application system 170.

[0238] In alternative embodiments of the present invention, the deflectometer 180 is additionally or alternatively used as a position measurement system. Figure 11B , in this embodiment, at step 1116, the user brings the displaceable rod 710 into contact with the sample 130. More specifically, the displaceable rod 710 is passed through the displaceable rod apertures 372, 382, ​​and 548 and the hole 426 such that the top surface 716 of the displaceable rod 710 contacts the sample 130.

[0239] It should be appreciated that, in addition to receiving the loading rod 610 for applying force during testing of the sample 130, the loading rod apertures 352 and 362 and the loading rod hole 416, together with the loading rod 610, facilitate maintaining a proper rotational operational orientation of the HTF 150 during both sample preparation and sample testing. Similarly, in addition to receiving the displaceable rod 710 for measuring deflection during testing of the sample 130, the displaceable rod apertures 372, 382, ​​and 548 and the displaceable rod hole 426, together with the displaceable rod 710, facilitate maintaining a proper rotational operational orientation of the HTF 150 during both sample preparation and sample testing.

[0240] Preferably, the proper rotational operational orientation of the HTF 150 is further maintained by corresponding features on the respective left and right ends 436, 442 of the lower semi-cylindrical portion 410 of the base 320 and the left and right support walls 210, 220, such as pin receiving slots 438 and 444 and guide pins 284 and 298. In addition to or as an alternative to the pin receiving slots 438 and 444 and the guide pins 284 and 298, the corresponding features may include mechanical orientation indicators, such as matching protrusions and recesses, and / or visual orientation indicators, such as visible arrows or other shapes for indicating the correct orientation of the HTF 150. Additionally or alternatively, appropriate portions of the NMFH 310 are formed with features (not shown) that assist in maintaining the proper rotational operational orientation of the HTF 150.

[0241] Likewise, in Figures 10K to 10M After the step 1116, the user preferably positions one or more temperature probes (not shown), such as, in particular, one or more optical pyrometers and thermocouples, at or partially within at least one of the temperature reader cutouts 354, 364, 374, and 384 for temperature measurement of the susceptor 320. An exemplary optical pyrometer suitable for use as an optical pyrometer is the METIS M3 commercially available from Process Sensors of Milford, MA, USA. An exemplary thermocouple suitable for use as a thermocouple is any of the R-type, C-type, K-type, or S-type thermocouples commercially available from Dynamic Systems Inc. of Poestenkill, NY, USA.

[0242] Typically, after step 1116 and prior to testing of the sample 130, a full or partial calibration of the system 100 is performed. The partial calibration may be embodied as a "tare" of the system 100, wherein the position of each of the loading rod 610 and the displaceable rod 710 is recorded and used to determine a zero position for each of the loading rod 610 and the displaceable rod 710. Additionally, during the full or partial calibration of the system 100, the resistance of components of the deflectometer 180 to movement of the sample 130 in the direction indicated by arrow 1140 may be measured and stored by the integrated computer system 106 for use as a calibration factor.

[0243] exist Figures 11A to 11B Following the steps shown in FIG. 1 , at the next step 1142, sample 130 is brought to test conditions, including, inter alia, the desired temperature and gas environment, and system 100 can be calibrated. Heat source 140, and in particular coil 324 of heat source 140, preferably heats susceptor 320 when susceptor 320 is at least partially disposed within volume 392 or 407 defined by NMFH 310. Susceptor 320, in turn, heats sample 130 and test cell 160. More specifically, a voltage is supplied to heat source 140, causing coil 324 of heat source 140 to generate an electromagnetic field. The electromagnetic field generated by coil 324 of heat source 140 is preferably an ultra-high frequency electromagnetic field, preferably having a frequency between 50,000 Hz and 300,000 Hz. As is known in the art, the electromagnetic field generated by coil 324 is particularly strong within volume 328 defined by coil 324.

[0244] When in the operational orientation, the pedestal 320 is partially disposed within the space 328 defined by the turns 326 of the coil 324, and thus the pedestal 320 is preferably approximately centered about the electromagnetic field generated by the coil 324. As described above, the heat source 140 preferably uses induction heating to heat the pedestal 320, which is preferably formed of a conductive material. More specifically, the electromagnetic field generated by the coil 324 induces a current within the pedestal 320, and resistive heating converts the induced current in the pedestal 320 into heat, thereby heating the pedestal 320. The pedestal 320 then transfers the heat to the test cell 160 and the sample 130 through conductive heating and / or radiant heating.

[0245] The integrated computer system 106 preferably controls and monitors the temperature of the susceptor 320. In various embodiments of the present invention, the system 100 is operable to achieve a wide range of heating rates, ranging from 1°C / second to greater than 100°C / second. The system 100 is also preferably operable to maintain the susceptor 320 at a preselected temperature before, during, and after testing of the sample 130, thereby allowing either or both of the sample 130 and the components of the system 100 to achieve isothermal conditions and / or reach a state of thermal equilibrium.

[0246] The integrated computer system 106 preferably further at least partially controls and monitors the gas environment of the interior space 114 of the environmental chamber 104 to ensure that the interior space 114 complies with predetermined gas conditions, the predetermined gas conditions including, among others, a vacuum, an inert gas, ambient air, an environment containing one of a plurality of controlled gas mixtures such as a predetermined percentage of oxygen, a reducing environment, and an oxidizing environment.

[0247] During preparation of the environmental chamber 104 and base 320 prior to testing of the sample 130, the system 100 is preferably operated to precisely control the force applied by the load application system 170 to the sample 130 in the direction of force application indicated by arrow 1140. For example, the integrated computer system 106 is preferably operated to control the load application system 170 so as to maintain a predetermined force on the sample 130 as the system 100 brings the sample 130 to a predetermined test temperature. The predetermined force can be any suitable force, such as a user-specified force, and can have a value ranging between zero and the maximum load capacity of the system 100, inclusive. In an exemplary embodiment of the invention, the system 100 is operated to apply a force on the sample 130 between 0 N and 100 N. Preferably, the actual force applied by the system 100 to the sample 130 deviates by no more than + / - 0.5% from the predetermined force applied by the system 100 to the sample 130.

[0248] It should be understood that as used herein, “downward movement,” “downward force,” “downward direction,” and “downward displacement” refer to the respective movements, forces, directions, and displacements in the direction indicated by arrow 1140 .

[0249] At the next step 1150, one or more material properties of the sample 130 are tested using the test unit 160. During the testing of the sample 130, predetermined environmental conditions are preferably maintained, particularly those related to the gas environment and temperature of the sample 130. At the beginning of the testing of the sample 130 by the system 100, the loading rod 610 of the load application system 170 is generally in contact with the ULPC 522 or the sample 130 while applying a net zero force on the ULPC 522 or the sample 130, as in Figures 11A to 11B Specifically seen in Figure 11B This can be seen more specifically in the enlarged view I.

[0250] Thereafter, as part of step 1150, the integrated computer system 106 preferably controls the load application system 170 to drive the load rod 610 to apply a series of predetermined forces to the sample 130 in the direction indicated by arrow 1140. It should be understood that when the load application system 170 applies a relatively small force on the sample 130, the sample 130 experiences little or no visible deformation, as in Figure 11B This can be seen specifically in the enlarged view I in FIG.

[0251] To apply a range of predetermined forces to the sample 130, the integrated computer system 106 preferably provides a range of voltages to the linear actuator 602, thereby causing downward movement of the drive shaft 604 of the linear actuator 602. The movement of the drive shaft 604, in turn, causes downward movement of the actuator connector rod 630 connected to the drive shaft 604. The downward movement of the actuator connector rod 630 causes corresponding downward movement of the upper load sensor connector 626, the force sensor 616, and the lower load sensor connector 646, which, in turn, drives the load rod 610 in a downward direction.

[0252] If a 4PB test cell 162 or a 4PB fracture test cell is used, the integrated computer system 106 provides a series of voltages to the linear actuator 602, causing the loading rod 610 to exert a series of predetermined downward forces on the outer surface 536 of the ULPC 522. In embodiments where the outer surface 536 of the ULPC 522 is formed with a loading rod recess 538, the loading rod 610 preferably exerts a series of predetermined downward forces on the loading rod recess 538. The ULPC 522 transmits each downward force from the loading rod 610 to other components of the test cell 160, namely, the upper loading pin 526, the lower support pin 528, and the LSPC 524, as well as the sample 130.

[0253] Alternatively, if a 3PB test cell 166 or a 3PB fracture test cell is used, the integrated computer system 106 provides a series of voltages to the linear actuator 602, causing the load rod 610 to exert a series of predetermined downward forces on the specimen 130. The specimen 130 transmits each downward force from the load rod 610 to components of the test cell 160, namely, the lower support pin 528 and the LSPC 524.

[0254] It should be understood that when the load application system 170 applies a relatively large force on the sample 130, such as in Figure 11C and Figure 11D In the example 130, the sample 130 undergoes visible deformation, as shown in Figure 11D If a 4PB test cell 162 or a 4PB fracture test cell is used, and sample 130 undergoes unusually large visible deformation (not shown), at least some of the deformation notches 534 of ULPC 522 and the deformation recesses 546 of LSPC 524 preferably receive the deformed portion of sample 130.

[0255] As is known in the art, the response of sample 130 to the forces applied to sample 130 by test unit 160, particularly the deformation of sample 130, and more particularly the downward displacement of the center of sample 130, provides data useful in calculating material properties of sample 130, such as flexural modulus, flexural stress, flexural strain, flexural stress-strain relationship, Young's modulus, ultimate strength, and fracture toughness.

[0256] Preferably, as part of step 1150, the integrated computer system 106, and more preferably the data acquisition system 110 of the integrated computer system 106, monitors and records most, and more preferably all, of the useful data associated with the system 100 during use of the system 100. More specifically, the integrated computer system 106 preferably monitors and records, among other things, the temperature of the base 320, the voltage applied to the heat source 140, the gas pressure of the interior space 114 of the environmental chamber 104, the force applied to the sample 130 by the load application system 170, the deflection of the sample 130, the temperature of the force sensor 616, and the temperature of the displaceable rod 710. In a preferred embodiment of the present invention, the force applied to the sample 130 by the load application system 170 is indicated by data associated with the load application system 170, including, among other things, data associated with any or all of the position of the linear actuator 602, the loading rod 610, and the force indicated by the force sensor 616.

[0257] Although not the primary intended use case for system 100, the force applied to sample 130 by load application system 170 may additionally or alternatively be indicated by data associated with deflectometer 180, including, among other things, data associated with any or all of the components of deflectometer 180, such as the voltage output by position transducer 750, the position of displaceable rod 710, and the position of core rod 752. Using data associated with deflectometer 180 to determine the force applied to sample 130 may be of particular interest in calibration procedures or academic research and typically relies on sample 130 having known material properties.

[0258] Typically, readings from the deflectometer 180—including, inter alia, data relating to any or all of the components of the deflectometer 180, such as the voltage output by the position transducer 750, the position of the displaceable rod 710, and the position of the core rod 752—are preferably used to determine the deflection of the sample 130 when determining the material properties of the sample 130.

[0259] Preferably, the monitoring and recording of useful data by the integrated computer system 106 is effectively continuous throughout the period of use of the system 100, and the data is preferably fully available for both control of the system 100 and analysis of the samples 130. In a preferred embodiment of the present invention, the integrated computer system 106 monitors and records some or all of the useful data at an effectively continuous sampling rate, such as, in particular, a sampling rate of 50 Hz to 10,000 Hz, and most typically, a sampling rate of 100 Hz to 500 Hz, throughout the use of the system 100.

[0260] Preferably, the integrated computer system 106, and more preferably the automated control system 108 of the integrated computer system 106, utilizes feedback control in the operation of the system 100. Thus, the integrated computer system 106 preferably controls the components of the system 100, such as, in particular, the heat source 140, the load application system 170, and the deflection gauge 180, based at least in part on data monitored and recorded from some or all of the temperature of the base 320, the voltage applied to the heat source 140, the gas pressure of the interior space 114 of the environmental chamber 104, the force applied to the sample 130 by the load application system 170, and the deflection of the sample 130.

[0261] The feedback control of the system 100 allows for a variety of options for test protocol programming and alarm options. For example, the integrated computer system 106 can receive data from the system 100 indicating that one or more components of the system 100, such as, in particular, one or more of the force sensor 616, the coil 324, the linear actuator 602, and the position transducer 750, are approaching one or more limits of their recommended operating parameters, such as temperature limits, position limits, force limits, or voltage limits. In such cases, the integrated computer system 106 preferably provides a signal, such as a warning, alarm, or command, to the user and / or the components of the system 100 to maintain the components of the system 100 within their recommended operating parameters. For example, the integrated computer system 106 can issue an alarm and reduce the voltage supplied to the heat source 140, reduce the voltage supplied to the linear actuator 602, and / or change the gas composition of the interior space 114 of the environmental chamber 104.

[0262] The integrated computer system 106 is preferably operative to provide appropriate warnings and changes before initiating testing of the sample 130, during testing of the sample 130, and / or after testing of the sample 130. In a preferred embodiment of the present invention, a user can establish, on a test-by-test basis, an operating envelope for the system 100, including one or more thresholds or limits for any or all operating parameters of the components of the system 100. Thus, the system 100 preferably includes fully customizable feedback controls and alerts.

[0263] Preferably, system 100 is operable to be controlled based on any of a variety of control modes, including, in particular, control modes that are based partially or completely on any or all of the data collected by integrated computer system 106. Thus, for example, load application system 170 is operable to be controlled by integrated computer system 106 based on any or all of the data associated with load application system 170, including, in particular, data associated with any or all of the components of linear actuator 602, such as the position of loading rod 610 and the force indicated by force sensor 616, and data associated with deflectometer 180, including, in particular, data associated with any or all of the components of position transducer 750, such as the voltage output by position transducer 750, the position of displaceable rod 710, and the position of core rod 752. Preferably, the control mode is selected for use based on user preference.

[0264] As in 11A to 11D As specifically seen in FIG, in an embodiment of the present invention, the deflectometer 180 is operative to measure the linear deformation of the lower center portion of the sample 130. As described above, prior to testing of the sample 130, the displaceable rod 710 is positioned so that its top surface 716 is in contact with the sample 130. Thus, deformation of the sample 130 preferably results in a corresponding downward displacement of the displaceable rod 710. The downward displacement of the displaceable rod 710, in turn, results in a downward displacement of the movable mounting platform 720, and thus of the rod 760 and the core rod 752, resisting the upward urging of the spring 790 or the counterweight mechanism 810. The downward displacement of the rod 760 changes the position of the core rod 752 within the body 768 of the position transducer 750, and in particular, the position of the working end 754 of the core rod 752 within the body 768 of the position transducer 750, which results in a predictable change in the voltage output by the position transducer 750 to the integrated computer system 106.

[0265] Therefore, in an embodiment of the present invention, the integrated computer system 106 of the system 100 preferably uses the voltage output by the position transducer 750 of the deflectometer 180 to determine a downward displacement of the sample 130 corresponding to a specific value of force applied directly or indirectly to the sample 130 by the load application system 170.

[0266] In addition to or as an alternative to measuring deformation via the deflectometer 180, the load application system 170 is preferably operative to measure linear deformation of the upper portion of the sample 130. As described above, prior to testing of the sample 130, the loading rod 610 of the load application system 170 is preferably positioned in contact with the ULPC 522 or sample 130 while applying a net zero force on the ULPC 522 or sample 130. Thereafter, the integrated computer system 106 preferably controls the load application system 170 to drive the loading rod 610 to apply a series of predetermined forces directly or indirectly to the sample 130 in the direction indicated by arrow 1140.

[0267] As the load application system 170 applies each force to the sample 130, the integrated computer system 106 preferably monitors the position of the loading rod 610. Figure 11D As seen specifically in FIG, the position of the loading rod 610 is directly related to the deformation of the sample 130. As the central portion of the sample 130 deforms in a downward direction, the position of the loading rod 610 also moves downward in a predictable manner.

[0268] In a preferred embodiment of the present invention, the linear actuator 602 is operative to displace the actuator connector rod 630, and thus the loading rod 610, in countable increments of known uniform length. The linear actuator 602 preferably includes an encoder that operates to provide data indicating whether the linear actuator 602 has displaced the actuator connector rod 630 by an increment. A controller in either or both the linear actuator 602 or the integrated computer system 106 counts the increments reported by the encoder of the linear actuator 602 to calculate the position of the loading rod 610. Compression of the loading rod 610 is optionally taken into account by the system 100 in calculating the position of the loading rod 610.

[0269] Therefore, in additional embodiments of the present invention, the integrated computer system 106 of the system 100 preferably uses the position of the loading rod 610 to determine the downward displacement of the sample 130 caused by a specific value of force applied directly or indirectly to the sample 130 by the load application system 170.

[0270] The integrated computer system 106 of the system 100 preferably calculates and outputs to a user one or more material properties of the sample 130 based on the testing of the sample 130 by the system 100. More specifically, the integrated computer system 106 of the system 100 determines the material properties of the sample 130, such as flexural modulus, flexural stress, flexural strain, flexural stress-strain relationship, Young's modulus, ultimate strength, and fracture toughness, based at least in part on the response of the sample 130 to the force applied to the sample 130 by the testing unit 160 as a result of a specific value of force applied directly or indirectly to the sample 130 by the load application system 170. Typically, the integrated computer system 106 of the system 100 determines the material properties of the sample 130 based, in particular, on the deformation of the sample 130, and more particularly, on the downward displacement of the central portion of the sample 130, during the testing of the sample 130 by the system 100.

[0271] After testing, the integrated computer system 106 preferably controls the system 100 to return the environmental chamber 104 and the AMPT 102 to ambient temperature and gas mixture conditions, or conditions close to ambient temperature and gas mixture conditions. The integrated computer system 106 preferably continues to control the conditions of the system 100 and monitors and records most, and more preferably all, of the useful data related to the system 100 during the period during which the environmental chamber 104 and the AMPT 102 are returned to ambient temperature and gas mixture conditions, or conditions close to ambient temperature and gas mixture conditions.

[0272] Returning the environmental chamber 104 and the AMPT 102 to ambient or near ambient conditions includes using natural cooling without a dedicated cooling system or using forced cooling, using a dedicated system to cool the susceptor 320, the test cell 160, and the sample 130. An exemplary cooling system provides a flow of gas, such as helium or argon, in particular, through at least some of the gas orifices 124 to accelerate the cooling of the AMPT 102, the test cell 160, and the sample 130. The temperature of the susceptor 320 during its cooling is preferably monitored and recorded by the integrated computer system 106 using a temperature probe (not shown), such as one or more of the optical pyrometers and thermocouples described above, in particular.

[0273] Preferably, the return of the environmental chamber 104 and the AMPT 102 to ambient conditions occurs relatively quickly, allowing for timely unloading of the sample 130 and a quick transition to another test, thereby increasing the throughput of the system 100 relative to the throughput of conventional systems. For example, in a preferred embodiment of the present invention, the amount of time from the completion of the test of a first sample 130 to the insertion of a different sample 130 is less than an hour, and more preferably less than 20 minutes. In other words, the system 100 is preferably operated to perform at least one sample test per hour, and more preferably at least one sample test every 20 minutes, including inserting the sample 130 into the system 100, heating the sample 130, testing the sample 130, and cooling the sample 130.

[0274] The system 100 is operable to achieve a wide range of preferred relatively rapid cooling rates ranging from 3° C. / second to greater than 300° C. / second, and to heat the susceptor 320, the test cell 160, and the sample 130 to a temperature of 1,000° C., more preferably to a temperature of 2,000° C., still more preferably to a temperature of 2,500° C., and even more preferably to a temperature of 4,000° C. As an example, the system 100 may be operable to heat the susceptor 320, the test cell 160, and the sample 130 to a temperature in the range of approximately room temperature to 2800° C., or to a temperature in the range of approximately 1500° C. to 2800° C.

[0275] As described above, the relatively rapid heating and cooling rates of system 100 are a result of technical features of system 100, such as, in particular, the relatively small size of the heated portion of system 100, and more specifically, the dimensional similarity between base 320 and sample 130; and the presence of customizable insulation around the heated portion of system 100, and more specifically, the at least partial arrangement of base 320 within space 392 of shell 330.

[0276] Furthermore, the components of system 100, particularly any or all of base 320 and housing 330 of NMFH 310, loading rod 610, displaceable rod 710, and any or all of the components of test unit 160, are generally less expensive than components used in conventional material properties testing systems and have relatively simple removal and installation procedures compared to components used in conventional material properties testing systems.

[0277] Thus, in preferred embodiments of the present invention, the base 320 and some or all of the housing 330 of the NMFH 310, the loading rod 610, the displaceable rod 710, and any or all of the components of the test unit 160 are easily replaceable, i.e., consumable, between some of the subsequent sample tests. In preferred embodiments of the present invention, the base 320 and some or all of the housing 330 of the NMFH 310, the loading rod 610, the displaceable rod 710, and any or all of the components of the test unit 160 are disposable and are intended to be replaced between some of the subsequent sample tests.

[0278] Additionally, components of system 100, particularly any or all of base 320 and housing 330 of NMFH 310, loading rod 610, displaceable rod 710, and any or all components of test unit 160, are generally more durable than components used in conventional material property testing systems.

[0279] Furthermore, the system 100 preferably includes interchangeable parts, which reduces breakage concerns and increases setup speed. For example, at least some of the shells 330 are identical to other shells 330; the upper semi-cylindrical portion 408 and the lower semi-cylindrical portion 410 of the base 320 are preferably identical to each other; and at least some of the guide pins 284 and 298, the pin 432, the upper loading pin 526, and the lower support pin 528 are identical to each other.

[0280] The relatively low cost, simple removal and installation process, and high durability of the components of system 100 allow system 100 to undergo relatively rapid heating and cooling rates compared to components of conventional material property testing systems.

[0281] The relatively rapid heating and cooling rates each result in relatively high thermal stresses on the components of system 100. However, the cost and likelihood of a broken component resulting from high thermal stresses are each lower in system 100 than in conventional material property testing systems. Thus, system 100 can be subjected to relatively rapid heating and cooling rates with relatively low concern about breaking components of system 100 compared to components of conventional material property testing systems.

[0282] Reference Figures 1A to 12The above-described embodiment of system 100 shown and described may suffer from certain disadvantages. For example, shell 330 may be prone to cracking during operation of AMPT 102. Additionally, heat transfer between components of AMPT 102 may tend to cause overheating of load application system 170 and / or deflectometer 180. Accordingly, an alternative embodiment of system 1300 and corresponding method for performing material property testing, particularly at elevated temperatures and in the presence of non-atmospheric gas mixtures, characterized by relatively high heating and cooling rates, and therefore, relatively short test cycles and high throughput, is provided and described below, wherein certain disadvantages of system 100 are eliminated.

[0283] It should be understood that although systems 100 and 1300 are described herein as separate embodiments of the invention, any or all of the components of systems 100 and 1300 may be interchangeable with one another and / or may be combined with one another within system 100 or system 1300.

[0284] Now refer to Figure 13A 、 Figure 13B 、 Figure 13C and Figure 13D , which are simplified schematic assembled isometric, side plan, cross-sectional, and exploded view illustrations, respectively, of a system 1300 constructed and operative in accordance with another preferred embodiment of the present invention, the system 1300 including an apparatus for performing material property testing (AMPT) 1302 on a sample, an environmental chamber 1304, and an integrated computer system 1306, Figure 13C It is along Figure 13B The AMPT 1302 is preferably housed within an environmental chamber 1304.

[0285] In a preferred embodiment of the present invention, the integrated computer system 1306 of the system 1300 includes an automated control system 1308 and a data acquisition system 1309. The integrated computer system 1306 is operative to preferably store, and more preferably create and store, a test curve comprising some or all of the environmental test parameters, including, inter alia, a temperature curve, a gas mixture curve, a load curve, and a sample deflection curve. The integrated computer system 1306 preferably also uses the collected data to automatically calculate material properties such as any or all of flexural modulus, flexural stress, flexural strain, flexural stress-strain relationship, Young's modulus, ultimate strength, and fracture toughness. Thus, the system 1300 preferably employs the computer system 1306 to execute a preprogrammed test program that sequences through each stage of the test, including heating, gas introduction and removal, temperature maintenance, sample testing, and cooling.

[0286] The environmental chamber 1304 preferably provides the desired gas environment in which the AMPT 1302 operates. The environmental chamber 1304 is preferably formed as a modular vacuum chamber comprising three interconnected subchambers: a main or intermediate subchamber 1310, an upper subchamber 1312 mounted on an upper surface 1314 of the main subchamber 1310, and a lower subchamber 1316 attached to a lower surface 1318 of the main subchamber 1310. Figure 13C As particularly seen in FIG, AMPT 1302 preferably extends through subchambers 1310, 1312, and 1316. Environmental chamber 1304 is preferably supported by an external frame (not shown). Figures 14A to 14M Environmental chamber 1304 is described.

[0287] It should be understood that although modular environmental chamber 1304 is shown and described herein in the context of system 1300, environmental chamber 104 of system 100 may be adapted to be a modular environmental chamber of a type similar to environmental chamber 1304. Alternatively, modular environmental chamber 1304 of system 1300 may be replaced by a monolithic environmental chamber of the type of environmental chamber 104 of system 100.

[0288] Now refer to Figure 14A 、 Figure 14B 、 Figure 14C 、 Figure 14D , which are 13A to 13D Simplified schematic assembled isometric, side plan, cross-sectional, and exploded view illustrations of an environmental chamber 1304, Figure 14C It is along Figure 14B Now refer to the line 14C-14C of Figure 14E , Figure 14E is constructed and operated according to a preferred embodiment of the present invention 14A to 14D A simplified schematic partially exploded view of a portion of the main sub-chamber 1310 of the environmental chamber 1304 is shown; now referring to Figure 14F 、 Figure 14G 、 Figure 14H and Figure 14I , which are Figure 14E Referring now to the simplified schematic first isometric illustration, first cross-sectional isometric illustration, second isometric illustration, and second cross-sectional isometric illustration of a portion of the main subchamber 1310; Figure 14J and Figure 14K , which are formed respectively 14A to 14D and now referring to the simplified schematic top side isometric view and bottom side isometric view of a first component of the upper subchamber 1312 of another portion of the environmental chamber 1304; Figure 14L and Figure 14M , which are simplified schematic top and bottom isometric illustrations, respectively, of the second component of the upper subchamber 1312.

[0289] The modular construction of environmental chamber 1304 is preferably used to reduce heat transfer between subchambers 1310 , 1312 , and 1316 , thereby preventing sensitive mechanical and electrical components of AMPT 1302 from overheating.

[0290] As in Figure 14A and 14D to 14I As can be seen in detail in FIG, the main sub-chamber 1310 is preferably formed with a force application orifice 1402, a deflection measurement orifice 1404, a heat source orifice 1406, at least one tool orifice 1408, a pressure measurement orifice 1410, and at least one vacuum orifice 1412. The main sub-chamber may further include one or more gas orifices (not shown) and Figure 14G Specifically seen are the multiple AMPT mounting apertures 1414 .

[0291] The main subchamber 1312 preferably further includes a first door 1420 and a second door 1422. The first door 1420 typically includes a viewing port 1424 for viewing the AMPT 1302. A pyrometer 1426 may be mounted on the main subchamber 1310 and may measure the internal temperature of the AMPT 1302 via a pyrometer window 1428. An exemplary optical pyrometer suitable for use as the pyrometer 1426 is the METIS M311 or M322 commercially available from Process Sensors of Milford, MA, USA. However, it should be understood that any suitable pyrometer may be incorporated into the environmental chamber 1304 at any suitable location for measuring the temperature of the AMPT 1302.

[0292] In an embodiment of the present invention, the main sub-chamber 1310 is formed of an aluminum body having an inner surface 1430 defining an interior space 1432 and having internal passages 1434 to enable continuous cooling of the chamber body during extreme high temperature testing, such as in Figures 14F to 14I Specifically seen in.

[0293] Heating by the AMPT 1302 is performed in the main subchamber 1310 via a heat source orifice 1406. The heat source orifice 1406 is preferably sealed at its perimeter 1436. The main subchamber 1310 is preferably thermally insulated by thermal insulation 1440 to reduce heat transfer from the main subchamber 1310 to the adjacent subchambers 1312 and 1316 and thereby prevent thermal damage to the components of the AMPT 1302 housed therein. An exemplary type of thermal insulation suitable for use as the insulating material 1440 is a graphite insulating sheet commercially available from Ceramaterials of Dingmans Ferry, PA, USA.

[0294] It should be understood that system 1300 may include additional or alternative cooling systems, thermal shields, and electromagnetic shields in addition to or in place of the cooling systems, thermal shields, and electromagnetic shields described herein.

[0295] As in Figure 14E As specifically seen in FIG, thermal insulation 1440 may include a first insulating plate 1442 attached to first door 1420, a second insulating plate 1444 attached to second door 1422, and a plurality of additional insulating plates 1446 attached to and lining inner surface 1430. First insulating plate 1442 may be formed with a viewing port receiving aperture 1448. Plate 1446 may be formed with a force application aperture receiving cutout 1450, a deflection measurement aperture receiving cutout 1452, a plurality of heat source aperture receiving cutouts 1454, a pyrometer window receiving cutout 1456, at least one tool aperture receiving cutout 1457, a pressure measurement aperture receiving cutout 1458, and at least one vacuum aperture receiving cutout 1459.

[0296] Thermal insulation 1440 is preferably attached to the inner surface 1430 of the main subchamber 1310 by a plurality of insulation mounting assemblies 1460 received by a plurality of insulation mounting apertures, only some of which are exemplified by Figure 14G and Figure 14I 1461 in the figure. Each insulator mounting assembly 1460 preferably includes an insulator mounting screw 1462 and an insulator mounting washer 1464. Insulator 1440 is preferably screwed into inner surface 1430 by screw 1462 and secured to inner surface 1430 by washer 1464. It should be understood that washer 1464 has a relatively large surface area to reduce the pressure exerted thereby on insulator 1440 and prevent puncture and deformation of insulator 1440.

[0297] As in Figures 14F to 14I As specifically seen in FIG, the main sub-chamber 1310 is preferably formed by first to fourth plates 1470, 1472, 1474, and 1476 that define an inner surface 1430 and bound an interior space 1432. The first plate 1470 preferably has an upper surface 1314. The force application orifice 1402 is preferably formed in the first plate 1470. The deflection measurement orifice 1404 is preferably formed in the second plate 1472. The heat source orifice is preferably formed in the third plate 1474. The pyrometer window 1428 is preferably formed in the fourth plate 1476. It should be understood that Figure 14G Corresponding to Figure 14F , among which, in Figure 14G , the first plate 1470 and the fourth plate 1476 are cut away. It should also be understood that Figure 14I Corresponding to Figure 14H , among which, in Figure 14I , the second plate 1472 and the third plate 1474 are cut away.

[0298] The upper sub-chamber 1312 is preferably mounted on the main sub-chamber 1310 and is in atmospheric communication with the main sub-chamber 1310 via the force application orifice 1402. The upper sub-chamber 1312 preferably has Figure 14J and Figure 14K Specifically seen in the body portion 1480 and in Figure 14L and Figure 14M The body portion 1480 is preferably formed with a lower cavity 1484 surrounded by a sealing groove 1486 that is positioned proximal to the surface 1314 when the upper subchamber 1312 is assembled with the main subchamber 1310.

[0299] Body portion 1480 also preferably includes an upper cavity 1488 opposite lower cavity 1484 and surrounded by a sealing groove 1490. A central load application unit support rod 1492 preferably extends across and divides upper cavity 1488. Support rod 1492 preferably has a load application unit mounting hole 1494 formed therein.

[0300] The body portion 1480 is preferably further formed with a plurality of slots 1496. Each slot 1496 is adapted to receive a mounting screw 1498 therein for screwing the body portion 1480 to the surface 1314 of the first plate 1470 of the main subchamber 1310, as shown in FIG. Figure 14D 14. The slot 1496 is formed with a widened end portion 14100 to allow some freedom of movement of the body portion 1480 when mounted on the surface 1314 for alignment purposes. The body portion 1480 is also preferably formed with a plurality of cap screw receiving holes 14102. The body portion 1480 preferably defines an interior space 14104. The interior space 14104 of the body portion 1480 is preferably in atmospheric communication with the interior space 1432 of the main subchamber 1310 via an atmospheric passage formed by the force application orifice 1402 and the lower cavity 1484.

[0301] The body portion 1480 preferably includes a port 14110 that operates to hold Figure 14D 14112. The removable panel 14112 can be removed to conveniently perform maintenance activities on the upper subchamber 1312 without removing the cover portion 1482. The removable panel 14112 is preferably sealed to the body portion 1480 by a seal 14114 and screwed to the body portion 1480 by a plurality of screws 14116.

[0302] The cover portion 1482 is preferably formed with a lower cavity 14120 adjacent the body portion 1480 and a plurality of grooves 14122 that provide access to the screws 1498. A plurality of screw holes 14124 are preferably formed in the cover portion 1482. Each screw hole 14124 is preferably operative to receive a screw 14126 for screwing the cover portion 1482 to the body portion 1480, as shown in FIG. Figure 14D The cover portion 1482 preferably defines an interior space 14128. The interior space 14128 of the cover portion 1482 is preferably in atmospheric communication with the interior space 14104 of the body portion 1480 via an atmospheric passage formed by the lower cavity 14120 of the cover portion 1482 and the upper cavity 1488 of the body portion 1480.

[0303] The lower subchamber 1316 is preferably attached to the main subchamber 1310 and is in atmospheric communication with the main subchamber 1310 via the deflection measurement orifice 1404. The lower subchamber 1316 is preferably formed of a plurality of plates 14130 defining an interior space 14132 and sealed to a cubic frame 14134, all components of which are commercially available from Ideal Vacuum Products of New Mexico, USA. The lower subchamber 1316 is preferably formed with a threaded subchamber attachment orifice 14138 that is operable to receive a subchamber attachment assembly 14140. The subchamber attachment assembly 14140 preferably includes a vacuum flange 14142, a swing clamp 14144, a vacuum fitting 14146, a diaphragm clamp 14148, a pair of centering rings 14150, and a plurality of fasteners 14152. It should be appreciated that the subchamber attachment assembly 14140 preferably defines an internal hollow passageway that provides atmospheric communication between the lower subchamber 1316 and the main subchamber 1310 .

[0304] When the lower subchamber 1316 is attached to the main subchamber 1310, the vacuum flange 14142 is preferably threaded into the subchamber attachment aperture 14138 and sealed and clamped to the vacuum fitting 14146 by swing clamps 14144 and centering ring 14150, respectively. The vacuum fitting 14146 is in turn sealed and clamped to the deflection measurement aperture 1404 by diaphragm clamps 14148 and centering ring 14150, respectively, and secured to the lower surface 1318 with fasteners 14152. The interior space 14132 of the lower subchamber 1316 is preferably in atmospheric communication with the interior space 1432 of the main subchamber 1310 via an atmospheric passage formed by the deflection measurement aperture 1404, the subchamber attachment aperture 14138, and the subchamber attachment assembly 14140.

[0305] As explained above, and as in Figure 14CAs specifically seen in the figure, the lower sub-chamber 1316, the main sub-chamber 1310 and the upper sub-chamber 1312 are preferably connected to the atmosphere via a continuous passage formed between the internal space 1432 of the main sub-chamber 1310, the internal spaces 14104 and 14128 of the upper sub-chamber 1312 and the internal space 14132 of the lower sub-chamber 1316.

[0306] The vacuum port 1412 of the main sub-chamber 1310 preferably receives a corresponding vacuum line (not shown) that may also have a gas supply established therein, thereby enabling the interior space of the modular vacuum chamber 1304—including the interior space 1432 of the main sub-chamber 1310, the interior spaces 14104 and 14128 of the upper sub-chamber 1312, and the interior space 14132 of the lower sub-chamber 1316—to be characterized by any of a wide range of gas environments. Alternatively, the environmental chamber 1304 may include a dedicated gas port, separate from the vacuum port 1412, for supplying gas to the environmental chamber 1304.

[0307] By way of non-limiting example only, the gas environment characterizing the environmental chamber 1304 may include a vacuum, an inert gas, ambient air, or other environment containing one of a variety of controlled gas mixtures, such as a predetermined percentage of oxygen, a reducing gas mixture, and an oxidizing gas mixture. In a preferred embodiment of the present invention, the vacuum port 1412 is preferably in fluid communication with a vacuum pump (not shown), such as a roughing pump or an oil diffusion pump, to supply approximately 10 -2 Support up to 10 -5 Alternatively, the vacuum port 1412 may be in fluid communication with a turbomolecular pump (not shown) or an ion getter pump (not shown) to supply a vacuum in the environmental chamber 1304 at a pressure of less than 10 -5 A vacuum environment characterized by a pressure of Torr.

[0308] It should be understood that in some embodiments of the present invention, it may be desirable for various subchambers of environmental chamber 1304, such as any or all of subchambers 1310, 1312, and 1316, to have mutually distinct gaseous environments, rather than sharing a common gaseous environment as described above. In such cases, each of subchambers 1310, 1312, and 1316 can be sealed relative to one another and, therefore, provide independent gaseous environments. It should be understood that the modular nature of environmental chamber 1304 advantageously allows environmental chamber 1304 to be readily adapted to allow different gaseous environments to be provided for each of the subchambers comprising environmental chamber 1304.

[0309] Now refer to Figure 15A 、 Figure 15B 、 Figure 15C and Figure 15D, which are respectively simplified schematic assembled isometric, side plan, cross-sectional, and exploded views of the AMPT 1302, Figure 15C It is along Figure 15B and now referring to Figure 15E , Figure 15E yes 15A to 15D A simplified schematic exploded view of a portion of the AMPT 1302 is shown. It should be understood that the AMPT 1302 operates in pairs. Figure 15C The material property test performed on sample 1500 is specifically seen in the enlarged view K.

[0310] AMPT 1302 includes: 16A to 16F The heat source 1510 described; hereinafter specifically referenced Figures 17A to 18 High Temperature Furnace (HTF) 1520; Test Unit 1530, such as specifically referred to below Figures 17F to 17H The four-point bending (4PB) test unit 1532 described herein or specifically referred to herein below Figure 18 The three-point bending (3PB) test unit 1534 described; the load application system 1540, such as specifically referred to below 19A to 19D The load application system 1542 described herein, or specifically referred to hereinafter Figure 20A and Figure 20B The load application system 1544 described herein; and specifically referred to below Figures 21A to 21H Deflectometer 1550 is described.

[0311] It should be understood that although HTF 1520, test units 1530 such as test units 1532 and 1534, load application systems 1540 such as load application system 1542 and load application system 1544, and deflectometer 1550 are described and illustrated herein in the context of system 1300, any or all of HTF 1520, test units 1530 such as test units 1532 and 1534, load application systems 1540 such as load application system 1542 and load application system 1544, and deflectometer 1550 may be interchanged with corresponding components of system 100, namely, HTF 150, test units 160 such as test units 162 and 166, load application system 170, and deflectometer 180, respectively, with appropriate modifications as would be appreciated by one skilled in the art.

[0312] AMPT 1302 also includes a mounting base 1560, a left support wall 1562 including a first lower portion 1564 and a first upper portion 1566, and a right support wall 1568 including a second lower portion 1570 and a second upper portion 1572. AMPT 1302 further includes a first support rod 1574 and a second support rod 1576. First support rod 1574 includes a left end 1578 and a right end 1580. Similarly, second support rod 1576 includes a left end 1582 and a right end 1584. A plurality of fasteners, such as a plurality of screws 1586, attach the respective left ends 1578 and 1582 of first support rod 1574 and second support rod 1576 to first lower portion 1564 of left support wall 1562. Similarly, a plurality of fasteners, such as a plurality of screws 1588 , attach respective right end portions 1580 and 1584 of the first and second support rods 1574 and 1576 to the second lower portion 1570 of the right support wall 1568 .

[0313] The first upper portion 1566 of the left support wall 1562 includes an upper surface 1590 formed with a furnace recess 1592 operative to receive the HTF 1520. Figure 15C As particularly seen in the figure, the furnace recess 1592 preferably includes a pin recess 1594 that is operable to receive a guide pin 1596 for securing the HTF 1520 in the correct orientation. The first lower portion 1564 of the left support wall 1562 is preferably formed with a plurality of recesses 1598 that are operable to receive a corresponding plurality of mounting posts 15100 for removably mounting the first lower portion 1564 of the left support wall 1562 to the mounting base 1560. It should be understood that, herein, three recesses 1598 are shown by way of example, although preferably only two of these recesses 1598 receive a corresponding two mounting posts 15100. Alternative numbers and arrangements of the recesses 1598 and mounting posts 15100 are also possible.

[0314] Similarly, the second upper portion 1572 of the right support wall 1568 includes an upper surface 15102 formed with a furnace recess 15104 operative to receive the HTF 1520. Preferably, a single guide pin 1596 on the left-hand side of the AMPT 1302 is sufficient to secure the HTF 1520 in the correct orientation, such that there is no need to include an additional guide pin similar to the guide pin 1596 in the right furnace recess 15104. However, it should be understood that in some embodiments of the present invention, the furnace recess 15104 may be formed with a pin recess adapted to receive a guide pin.

[0315] Similar to the first lower portion 1564 of the left support wall 1562, the second lower portion 1570 of the right support wall 1568 is also formed with a plurality of recesses (not shown) that operate to receive a corresponding plurality of mounting pins 15110 for removably mounting the second lower portion 1570 of the right support wall 1568 to the mounting base 1560. The mounting pins 15100 and 15110 are preferably fixedly mounted in a corresponding plurality of recesses or apertures 15112 formed in the mounting base 1560, as particularly seen in FIG15F.

[0316] As in Figure 15C As particularly seen in FIG, furnace recesses 1592 and 15104 are preferably shaped and positioned such that the longitudinal axis A of HTF 1520 is preferably oriented generally horizontally, generally parallel to mounting base 1560, and generally perpendicular to gravity. A particular feature of preferred embodiments of the present invention is that HTF 1520 is oriented generally horizontally, rather than vertically, which yields several advantages during operation of AMPT 1302, as described in detail below. In preferred embodiments of the present invention, HTF 1520 is oriented horizontally. Alternatively, HTF 1520 may be oriented approximately horizontally, for example, within a range of ±30° from horizontal.

[0317] The first lower portion 1564 of the left support wall 1562 is preferably formed with a pair of v-shaped grooves 15120 that operate to seat a pair of quartz rods 15122 therein. The first upper portion 1566 of the left support wall 1562 is also preferably formed with a corresponding pair of v-shaped grooves 15124 for seating the quartz rods 15122 therein. A first pair of apertures 15126 and a second pair of apertures 15128 are preferably formed in the first lower portion 1564 and the first upper portion 1566 of the left support wall 1562, respectively. Apertures 15126 and 15128 are preferably adapted to receive alignment posts 15130 that operate to align the first lower portion 1564 and the first upper portion 1566 with each other. Alignment posts 15130 are preferably ceramic.

[0318] Similarly, the second lower portion 1570 of the right support wall 1568 is preferably formed with a pair of v-shaped grooves 15132 that are operable to seat another pair of quartz rods 15134 therein. The second upper portion 1572 of the right support wall 1568 is also preferably formed with a corresponding pair of v-shaped grooves 15136 for seating the quartz rods 15134 therein. A third pair of apertures 15138 and a fourth pair of apertures 15140 are preferably formed in the second lower portion 1570 and the second upper portion 1572 of the right support wall 1568, respectively. Apertures 15138 and 15140 are adapted to receive alignment posts 15142 that are operable to align the second lower portion 1570 and the second upper portion 1572 with each other. Alignment posts 15142 are preferably ceramic.

[0319] Quartz rod 15122 is used to create a thermal break between portion 1564 and portion 1566 of left support wall 1562. Similarly, quartz rod 15134 is used to create a thermal break between portion 1570 and portion 1572 of right support wall 1568. This reduces heat transfer from HTF 1520 to load application system 1540 and deflectometer 1550, thereby preventing load application system 1540 and deflectometer 1550 from overheating during operation of AMPT 1302.

[0320] Mounting base 1560 is preferably further formed with a tubular deflectometer aperture 15150, a left support wall guide 15152, and a right support wall guide 15154. Mounting base 1560 preferably further includes a plurality of mounting holes 15160 for receiving fasteners (not shown) used to mount AMPT 1302 to subchamber 1310.

[0321] It should be understood that the specific configuration of AMPT 1302, including the specific configuration of support walls 1562 and 1568, is merely exemplary and that other configurations of AMPT 1302 are possible. As an example, support walls 1562 and 1568 can be formed as unitary walls similar to support walls 210 and 220 of AMPT 102.

[0322] Now refer to Figure 16A 、 Figure 16B 、 Figure 16C 、 Figure 16D 、 Figure 16E and Figure 16F , which are simplified schematic assembly isometric, front plan, first side plan, exploded, second side plan, and cross-sectional illustrations of heat source 1510 and HTF 1520, respectively. HTF 1520 is included in the following with particular reference to Figures 17A to 18A non-metallic furnace shell (NMFH) 1600 and a base 1610 are depicted. The base 1610 is preferably induction heated by the heat source 1510.

[0323] The heat source 1510 is preferably an induction heat source, and more preferably an ultra-high frequency induction heat source, and preferably includes a heater body 1620 and a coil 1622 having a plurality of turns 1624. The coil 1622 is preferably metallic, and more preferably formed of copper. An exemplary heat source suitable for use as the heat source 1510 is an EKOHEAT 15kW commercially available from Ambrell Induction Heating Solutions of Rochester, NY, USA. It should be understood that other types of heat sources and / or heat sources of varying power may also be used.

[0324] As in Figure 16D As particularly seen in FIG, turns 1624 of coil 1622 define an interior space 1626 operative to receive HTF 1520. Turns 1624 are preferably distributed to define a central opening 1630 to allow entry of a load application system 1540 and a deflectometer 1550, as shown in FIG. Figure 16C This can be seen specifically at the enlarged view L in FIG.

[0325] The coil 1622 is preferably oriented approximately horizontally and preferably has a longitudinal axis A that is approximately horizontal. In a preferred embodiment of the present invention, the coil 1622 is oriented horizontally. Alternatively, the coil 1622 can be oriented approximately horizontally, for example within a range of ±30° from the horizontal plane. The HTF 1520 is preferably oriented approximately horizontally when disposed in the coil 1622. When the HTF 1520 is disposed (inserted) in the coil 1622, the HTF 1520 can be positioned along the longitudinal axis A, such as in FIG. Figure 16B 1520 and coil 1622 are oriented generally horizontally. Due to the generally horizontal orientation of HTF 1520 and coil 1622, turns 1624 of coil 1622 serve to help support base 1610, eliminating the need for additional mechanical supports for base 1610. Furthermore, at the high temperatures at which AMPT 1302 may operate, a vertical base would create a strong "chimney effect," where convection draws heat away from the base, thereby limiting the maximum base temperature, creating vertical thermal gradients, and placing additional thermal loads on the sensitive load application system 1540 and deflectometer 1550. The generally horizontal orientation of base 1610 avoids this problem.

[0326] Additionally, the horizontal orientation of the space 1626 defined by the coil 1622 facilitates easy insertion and removal of the horizontally oriented HTF 1520 without interfering with the adjacent vertically oriented load application system 1540 and deflectometer 1550 , thus allowing for rapid throughput of the system 1300 .

[0327] According to certain standardized requirements for material property testing, such as those set forth by the American Society for Testing and Materials (ASTM International) and the International Organization for Standardization (ISO), sample 1500 is oriented horizontally during material property testing. Thus, using a substantially horizontally oriented pedestal 1610 to hold a horizontally oriented sample 1500 allows for the use of a smaller pedestal than would be possible if the horizontally oriented sample 1500 were held in a non-horizontally oriented pedestal, such as a vertically oriented pedestal. This allows for the use of a relatively small pedestal 1610 having a relatively low mass, thereby facilitating relatively rapid heating and cooling rates and reducing the cost of replacing the pedestal 1610.

[0328] As in 13A to 13D , the heat source orifice 1406 in the environmental chamber 1304 preferably houses the heat source 1510 such that the heater body 1620 is completely or mostly contained outside of the environmental chamber 1304, while the coil 1622 is preferably completely contained within the interior space 1432 of the main sub-chamber 1310. Preferably, a plurality of sealing members (not shown), such as sealing members at the periphery 1436 of the heat source orifice 1406, form a substantially vacuum tight seal between the heat source orifice 1406 and the environment surrounding the environmental chamber 1304.

[0329] The coil 1622 preferably has one or more turns 1624. In an exemplary embodiment of the present invention, the size of the coil 1622 is about 200 cm. 3 Up to 2,000cm 3 , and between 2 turns 1624 and 10 turns 1624. It will be appreciated that forming the coil 1622 with multiple turns 1624 provides for more uniform heating of the HTF 1520 by the coil 1624.

[0330] As in Figure 16F As particularly seen in the enlarged view 24 in FIG, the coil 1622 is preferably coated with an electrically insulating layer 1630. Water cooling (not shown) may be provided through an interior 1632 of the coil 1622. The coil 1622 may be formed of copper 1634, although other suitable conductive materials are also possible.

[0331] As in Figure 16C, in a fully assembled operating state, the sample 1500 and the test unit 1530 are inserted into the HTF 1520, which in turn is enclosed within the coil 1622 of the heat source 1510. The heat source 1510 preferably uses induction heating to heat the susceptor 1610. In turn, the susceptor 1610 preferably uses conductive heating, radiant heating, or a combination of conductive and radiant heating to heat the sample 1500 and the test unit 1530.

[0332] A particular feature of preferred embodiments of the present invention is that only a relatively small portion of the system 1300 is heated to the test temperature. More specifically, preferably only the base 1610, the test unit 1530, and the sample 1500 are heated to the test temperature at which the material properties of the sample 1500 are tested. The base 1610 is specifically designed to have dimensions similar to those of the sample 1500, thereby reducing the amount of material that needs to be heated before testing the sample 1500 and the amount of material that needs to be cooled after testing the sample 1500. In a typical embodiment of the present invention, the base 1610 has a 40 cm 3 Up to 400cm 3 The relatively small amount of material being heated and cooled preferably facilitates the relatively high heating and cooling rates of system 1300 compared to conventional systems for material property testing.

[0333] It should be understood that the heating and cooling rates of a component, as well as the amount of time required to heat and / or cool the component, are directly proportional to the amount of material in the component, i.e., the mass of the component. Thus, each of the heating rate, cooling rate, heating time, and cooling time of a component formed from a given material is directly proportional to the volume of the component. Preferably, system 1300 heats and cools only relatively small masses and volumes compared to conventional material property testing systems. Thus, the heating rate, cooling rate, heating time, and cooling time of system 1300 are lower, and preferably significantly lower, than those of conventional systems.

[0334] Now refer to Figure 17A 、 Figure 17B 、 Figure 17C 、 Figure 17D 、 Figure 17E 、 Figure 17F 、 Figure 17G and Figure 17H, which are respectively simplified schematic assembly isometric illustrations, side plan illustrations, cross-sectional illustrations, top-facing exploded illustrations, bottom-facing exploded illustrations, top-facing partially exploded illustrations, bottom-facing partially exploded illustrations, and enlarged detailed exploded illustrations of a high temperature furnace HTF 1520 and a 4PB test unit 1532, which is an embodiment of the test unit 1530. Also refer to Figure 18 , Figure 18 is a simplified schematic exploded view illustration of HTF 1520 and 3PB test unit 1534 , which is an alternative embodiment of test unit 1530 .

[0335] As described above, HTF 1520 includes NMFH 1600 and base 1610. NMFH 1600 preferably includes a graphite foil layer 1700 wrapped around base 1610 and having a first end 1702 and a second end 1704. Graphite foil 1700 is preferably used to protect base 1610 from degradation during operation of AMPT 1302. Graphite foil layer 1700 is preferably formed of flexible graphite (Grafoil), which is commercially available from NeoGraf Solutions of Lakewood, Ohio, USA. Flexible graphite 1700 is preferably adhered to the surface of base 1610 by an adhesive.

[0336] NMFH 1600 preferably further includes a thermal insulation portion 1710, which preferably includes a first thermal insulation felt layer 1712 wrapped around a first end 1702 of graphite foil 1700 and a second thermal insulation felt layer 1714 wrapped around a second end 1704 of graphite foil 1700. First insulation felt layer 1712 and second insulation felt layer 1714 are preferably formed from rayon graphite felt commercially available from Ceramaterials of Dingmans Ferry, PA, USA. Felt layers 1712 and 1714 are preferably adhered to the surface of graphite foil 1700 by an adhesive. As an example, first insulation felt layer 1712 and second insulation felt layer 1714 can each be wrapped around base 1610 twice, but it should be understood that more or fewer turns are possible depending on design requirements.

[0337] The insulation provided by thermal insulation portion 1710 results in a relatively low amount of heat loss from susceptor 1610. It will be appreciated that the relatively low amount of heat loss from susceptor 1610 results in relatively efficient heating of susceptor 1610, test cell 1530, and sample 1500, as characterized by a relatively short amount of time required to heat susceptor 1610, test cell 1530, and sample 1500 and a relatively high rate of heating of susceptor 1610, test cell 1530, and sample 1500.

[0338] Additionally, the relatively low amount of heat loss from susceptor 1610 results in relatively low undesired heating of components other than susceptor 1610, test unit 1530, and sample 1500. The relatively low undesired heating, in turn, results in a relatively shorter amount of time required to cool down system 1300 after testing of sample 1500, compared to conventional material properties testing systems, because system 1300 includes a low level of undesired heat that must be removed as part of the cooling process, relative to conventional material properties testing systems.

[0339] As in Figure 17D and Figure 17E As seen specifically in FIG, the graphite foil 1700 is preferably formed with a sample aperture 1720, a displaceable rod aperture 1722, and at least one temperature reader aperture 1724.

[0340] The base 1610 may have any suitable shape. Figures 13A to 24 In the embodiment shown in FIG, the susceptor 1610 is cylindrical and formed of a conductive material such as, in particular, graphite or silicon carbide. In a particularly preferred embodiment of the present invention, the susceptor 1610 is formed of the same material as the NMFH 1600, such as graphite, thereby preventing material interaction between the NMFH 1600 and the susceptor 1610.

[0341] The base 1610 is preferably formed as a unitary component having a sample receiving cavity 1730, a displaceable rod aperture 1732, at least one temperature reader aperture 1734, and a pair of pin recesses 1736. In the assembled, operative state, the sample receiving recess 1730 is aligned with the sample orifice 1720, the displaceable rod aperture 1732 is aligned with the displaceable rod orifice 1722, and the temperature reader aperture 1734 is aligned with the temperature reader orifice 1724.

[0342] If especially from Figure 17C and Figure 17FAs will be appreciated from the considerations herein, the length of the sample receiving chamber 1730 is preferably less than the entire length of the base 1610. The length of the sample receiving chamber 1730 can be significantly less than the entire length of the base 1610. As an example, the length of the sample receiving chamber can range from about one quarter of the length of the base 1610 to about half the length of the base 1610. It should be understood that the dimensions of the base 1610 and / or the sample receiving chamber 1730 can vary based on the size of the sample 1500. By way of example only, in one preferred embodiment of the present invention, the sample receiving chamber 1730 can have a length of 28.58 mm and the entire length of the base 1610 can be 125 mm. The relatively small length of the sample receiving chamber 1730 relative to the base 1610 promotes relatively rapid and uniform heating of the sample 1500 when inserted into the sample receiving chamber 1730.

[0343] Preferably, the entire sample 1500 is contained (enclosed) within the sample receiving cavity 1730. This prevents the formation of thermal gradients across the sample 1500. If portions of the sample 1500 extend outside the sample receiving cavity 1730, thermal gradients will form across the sample 1500.

[0344] In a preferred embodiment of the present invention, the cavity 1730 may enclose various types of test cells 1530, such as those specifically referenced herein by way of non-limiting example only. Figures 17F to 17H The 4PB test unit 1532 is described and specifically referred to below Figure 18 3PB test cell 1534 is depicted. Test cell 1530 operates to perform material property testing of sample 1500. Components of test cell 1530 are preferably formed from temperature resistant materials such as graphite or silicon carbide, among others.

[0345] As in Figure 17F In the enlarged figure N, Figure 17G The enlarged image O and Figure 17H As specifically seen in FIG, in an embodiment of the present invention, the test cell 1530 is implemented as a 4PB test cell 1532 and includes an upper portion 1740 and a lower portion 1742. The upper portion 1740 preferably includes an upper load pin carrier (ULPC) 1750, and the lower portion 1742 preferably includes a lower support pin carrier (LSPC) 1752. The upper portion 1740 and the lower portion 1742 preferably also include five pins, preferably cylindrical, including a load application contact pin 1754, a pair of upper load pins 1756, and a pair of lower support pins 1758. During testing of the sample 1500, the load application contact pin 1754 is preferably contacted by the load application system 1540.

[0346] Upper loading pin 1756 and lower support pin 1758 preferably allow for load balancing across sample 1500 during material property testing, as required according to testing standards set forth, for example, by the American Society for Testing and Materials International (ASTM International) and the International Organization for Standardization (ISO).

[0347] exist Figures 13A to 24 In the embodiment shown in FIG, all of the guide pins 1596, the load applying contact pins 1754, the upper loading pins 1756, and the lower support pins 1758 are identical to one another. In another embodiment of the present invention, at least some of the guide pins 1596, the load applying contact pins 1754, the upper loading pins 1756, and the lower support pins 1758 are different from one another.

[0348] The ULPC 1750 preferably includes an inner surface 1760 formed with a pair of pin recesses 1762, each of which is operative to receive one of the upper loading pins 1756. The ULPC 1750 is preferably further formed with a pair of deformation notches 1764, which are operative to receive portions of the sample 1500 that may deform during testing. The ULPC 1750 also includes an outer surface 1770, which is further preferably formed with a notch 1772, which is operative to receive the load applying contact pin 1754.

[0349] LSPC 1752 preferably includes an inner surface 1776 having first and second protrusions 1778, 1780 formed thereon. Each of the first and second protrusions 1778, 1780 is operative to abut one of the lower support pins 1758 in the assembled orientation. Each of the first and second protrusions 1778, 1780 is formed with a generally rectangular recess 1782 operative to receive the specimen 1500. The inner surface 1776 of LSPC 1752 is preferably further formed with a deforming recess 1786 operative to receive a portion of the specimen 1500 that may deform during testing. LSPC 1752 is further formed with a displaceable rod aperture 1788. In the assembled, operational orientation, displaceable rod aperture 1788 is preferably coaxial with displaceable rod aperture 1722 and displaceable rod hole 1732 along axis 1790.

[0350] It should be understood that the 4PB fracture test cell is generally identical to the 4PB test cell 1532. Unlike the 4PB test cell 1532, which accepts a sample 1500 without a notch, the 4PB fracture test cell accepts a sample with a notch, preferably in the lower center portion of the sample, as is known in the art.

[0351] As in Figure 18As particularly seen in FIG, in an additional embodiment of the present invention, the test cell 1530 is implemented as a 3PB test cell 1534 and includes a lower portion 1742, which preferably, in turn, includes an LSPC 1752 and two lower support pins 1758. The lower support pins 1758 preferably allow for load balancing across the sample 1500 during material property testing, as required by test standards set forth, for example, by the American Society for Testing and Materials International (ASTM International) and the International Organization for Standardization (ISO). Each of the lower support pins 1758 is preferably positioned to abut a first protrusion 1778 and a second protrusion 1780, respectively, formed on an inner surface 1776 of the LSPC 1752. In the assembled, operative orientation, the displaceable rod aperture 1788 of the LSPC 1752 is preferably coaxial with the displaceable rod aperture 1722 and the displaceable rod hole 1732 along an axis 1790.

[0352] It should be understood that the 3PB fracture test cell is generally identical to the 3PB test cell 1534. Unlike the 3PB test cell 1534, which accepts a sample 1500 without a notch, the 3PB fracture test cell accepts a sample with a notch, preferably in the lower center portion of the sample, as is known in the art.

[0353] Now refer to Figure 19A 、 Figure 19B 、 Figure 19C and Figure 19D , which are respectively simplified schematic assembled isometric, side plan, front cross-sectional, and exploded view illustrations of a load application system 1542, which is a first embodiment of load application system 1540, Figure 19C It is along Figure 19B Now refer to the line 19C-19C in Figure 20A and Figure 20B , Figure 20A and Figure 20B 1540 are simplified schematic side plan view and front plan view illustrations, respectively, of a load application system 1544, which is an alternative embodiment of load application system 1540. It should be understood that load application systems 1542 and 1544 are merely exemplary load application systems, and other load application systems may alternatively be used in the present invention. Load application system 1540 may also be referred to as a load application unit. Load application system (unit) 1540 operates to control the application of a test load to sample 1500.

[0354] The load application system 1540 preferably includes a linear actuator 1902 including a drive shaft 1904 and a hybrid loading rod 1910. The linear actuator 1902 is preferably a low-torque load cell that operates to control the application of a test load to the sample 1500. More specifically, the linear actuator 1902 is preferably operated to drive the loading rod 1910, which in turn applies a force that constitutes the test load to the sample 1500 during testing of the sample 1500. The linear actuator 1902 is preferably a low-torque precision linear actuator that drives and positions the loading rod 1910 at a controlled rate and can be any suitable linear actuator, such as, among others, a stepper motor or a DC gearbox. Exemplary stepper motors suitable for use as linear actuator 1902 include hybrid stepper motor linear actuators commercially available from Dings Motion USA of Morgan Hill, California, USA, such as model number 14K4105AA4-150SUSEK112.

[0355] The force sensor 1916 preferably connects the linear actuator 1902 to the loading rod 1910 and preferably measures the load applied to the sample 1500 by the load application system 1540. The force sensor 1916 is typically implemented as a load cell, preferably a bidirectional load cell. Exemplary load cells suitable for use as the force sensor 1916 include economical single-point bending beam force sensors, such as the model ESP-25, commercially available from Transducer Techniques of Temecula, California, USA.

[0356] As in Figure 19C and Figure 19D As particularly seen in FIG, load application system 1540 also includes an actuator connector assembly 1922 and a load rod connector assembly 1924. Actuator connector assembly 1922 preferably includes an upper load sensor connector 1926 and an actuator connector rod 1930. Upper load sensor connector 1926 is preferably formed with a pair of fastener apertures 1932, a connector rod aperture 1934, a connector rod reinforcement opening 1936, and a wire guide aperture 1938. A pair of fasteners 1942 are preferably installed in fastener apertures 1932 and secure actuator connector assembly 1922 to force sensor 1916. Additional fasteners 1944 are installed in wire guide apertures 1938 to secure wire guide 1946 to upper load sensor connector 1926. Another additional fastener 1950 is installed in connector rod reinforcement aperture 1936 and secures actuator connector rod 1930 to upper load sensor connector 1926.

[0357] The load rod connector assembly 1924 preferably includes a lower load sensor connector 1954, which is preferably formed with a pair of fastener apertures 1956 and a load rod fastener aperture 1958. A plurality of fasteners 1960 are preferably installed in the fastener apertures 1956 and secure the load rod connector assembly 1924 to the force sensor 1916.

[0358] The loading rod connector assembly 1924 further preferably includes a clamping member 1962 that is operative to clamp the loading rod 1910 to the lower load sensor connector 1954. The clamping member 1962 preferably includes a clamping base 1964 formed with a groove 1966 and a pair of clamping blocks 1968 each formed with a notch 1970. The clamping base 1964 and the clamping blocks 1968 are preferably further formed with a plurality of fastener apertures 1972 that are operative to receive a corresponding plurality of fasteners 1974 to secure the loading rod 1910 to the clamping member 1962 when the loading rod 1910 is clamped in the notches 1966 and 1970. The clamping base 1966 is preferably further formed with a through fastener aperture 1976 that is operative to receive a fastener 1978. Additional fasteners 1980 are preferably installed in fastener apertures 1958 to attach the lower load sensor connector 1954 to the clamp base 1964 .

[0359] Loading rod 1910 is preferably implemented as a hybrid or composite rod comprising a non-conductive portion 1990 and a refractory portion 1992. Non-conductive portion 1990 is preferably formed from a thermally and electrically insulating material, such as quartz glass. Refractory portion 1992 is preferably formed from a material that is highly resistant to the high temperatures at which AMPT 1302 may operate and has high stiffness at these temperatures. By way of example, refractory portion 1992 may be formed from graphite or silicon carbide. According to a particularly preferred embodiment of the present invention, refractory portion 1992 is formed from graphite. It should be understood that refractory portion 1992 is preferably in contact with test cell 1530 or sample 1500 during operation of AMPT 1302, while non-conductive portion 1990 is preferably positioned away from test cell 1530 and sample 1500 and closer to force sensor 1916 during operation of AMPT 1302, so that heat and current conduction from heat source 1510 to linear actuator 1902 and force sensor 1916 is minimized, thereby preventing damage to these components. The circumference of the non-conductive portion 1990 may be larger than the circumference of the refractory portion 1992 to prevent bending or breaking of the non-conductive portion 1990. Preferably, the non-conductive portion 1990 additionally advantageously provides both thermal and electrical insulation to the linear actuator 1902 and the force sensor 1916.

[0360] The non-conductive portion 1990 is preferably fixedly mounted to the refractory portion 1992 by a rod clamp assembly 1996. The rod clamp assembly 1996 preferably includes a clamp base 1998, a clamp connector 19100, a first pair of rod clamp blocks 19102, and a second pair of rod clamp blocks 19104. The clamp base 1998 is preferably formed with a recess 19108 in an upper section 19110 thereof sized to receive the non-conductive portion 1990 of the loading rod 1910, a first plurality of fastener apertures 19114 in the upper section 19110, and a second plurality of fastener apertures 19116 in the lower section 19118. The clamp connector 19100 is preferably formed with a recess 19120 sized to receive the refractory portion 1992 of the loading rod 1910, a first plurality of exterior fastener apertures 19122, and a second plurality of interior fastener apertures 19124. The fastener apertures 19116 and 19122 are preferably operative to receive a plurality of fasteners 19128 therein for mounting the clamp connector 19100 to the clamp base 1998.

[0361] Each rod clamping block in the first pair of rod clamping blocks 19102 is preferably formed with a recess 19130 sized to receive the non-conductive portion 1990 of the loading rod 1910 and a plurality of fastener apertures 19132 operative to receive a plurality of fasteners 19134. Similarly, each rod clamping block in the second pair of rod clamping blocks 19104 is preferably formed with a recess 19138 sized to receive the refractory portion 1992 of the loading rod 1910 and a plurality of fastener apertures 19140 operative to receive a plurality of fasteners 19142.

[0362] When assembled, the lower end 19150 of the upper non-conductive portion 1990 is clamped within the recesses 19108 and 19130, and the upper end 19152 of the lower refractory portion 1992 is clamped within the recesses 19120 and 19140. Thus, the lower end 19150 of the non-conductive portion 1990 is rigidly held in clamping contact with the upper end 19152 of the refractory portion 1992, thereby forming the composite rod 1910, as shown in FIG. Figure 19C Specifically seen in.

[0363] The working end 19154 of the refractory portion 1992 is preferably configured to apply a force to the sample 1500 via the load application system 1540 during material property testing of the sample 1500. In one embodiment of the load application system 1540, 19A to 19D The load application system 1542 shown in FIG can be used to perform a 4PB test on the sample 1500. In order to perform a 4PB test, the working end 19154 of the refractory portion 1992 of the loading rod 1910 is preferably formed with a flat force application surface 19156, as shown in FIG. Figure 19B and Figure 19C Specifically seen in.

[0364] In additional embodiments of the load application system 1540, Figure 20A and Figure 20B The load application system 1544 shown in FIG can be used to perform a 3PB test on the sample 1500. Figure 20A The enlarged image Q and Figure 20B As seen specifically at enlarged view R in FIG, in this embodiment, the working end 19154 of the refractory portion 1992 can be formed with a rounded force application surface 19157 having a rounded edge 19158.

[0365] As described above, a hybrid, partially non-conductive loading rod 1910 is provided to prevent overheating of the linear actuator 1902 and the force sensor 1916 and conduction of electrical current to the linear actuator 1902 and the force sensor 1916. In addition, overheating of the linear actuator 1902 is further preferably prevented by providing a heat pipe 19160 that operates to transfer heat away from the linear actuator 1902. The heat pipe 19160 can be any suitable type of heat pipe. For example, the heat pipe 1960 can be a 6 mm diameter and 250 mm long heat pipe commercially available from McMaster-Carr in Chicago, IL, USA.

[0366] The heat pipe 19160 is preferably mounted to the linear actuator 1902 at a first end 19162 of the heat pipe 19160 by a first bracket 19166 including a first clamping portion 19168 and a second clamping portion 19169, each of which is formed with a groove 19170 for receiving therein the first end 19162 of the heat pipe 19160. Each of the clamping portions 19168 and 19169 further preferably includes a set of fastener apertures 19172 and 19173, respectively, operative to receive a set of fasteners 19174 therein. The heat pipe 19160 is preferably mounted to the inner wall of the upper subchamber 1312 at the second end 19176 of the heat pipe 19160 by a second bracket 19178, which includes a first clamping portion 19180 and a second clamping portion 19181, each of which is formed with a groove 19182 for receiving the second end 19176 of the heat pipe 19160 therein. Each of the clamping portions 19180 and 19181 further preferably includes a set of fastener apertures 19184 and 19185, respectively, operative to receive a set of fasteners 19186 therein.

[0367] The load application system 1540 also preferably includes an actuator mount 19190, an actuator grip 19192, and an actuator mounting cover 19194. The linear actuator 1902 is fixedly mounted in the actuator grip 19192, which in turn is mounted in the actuator mount 19190 and secured to the actuator mount 19190 via the mounting cover 19194. Figure 19C , the lower end 19198 of the actuator connector rod 1930 is preferably mounted in the connector rod aperture 1934 of the upper load sensor connector 1926. The upper end 19200 of the actuator connector rod 1930 is preferably received within the actuator mount 19190 and attached to the drive shaft 1904 of the linear actuator 1902.

[0368] Now refer to Figure 21A 、 Figure 21B 、 Figure 21C and Figure 21D , which are respectively simplified schematic assembled isometric, side plan, cross-sectional, and exploded views of the deflectometer 1550 , Figure 21C It is along Figure 21B 21C-21C of the interception, and now refer to Figure 21E 、 Figure 21F 、 Figure 21G and Figure 21H , which are 21A to 21D Simplified schematic isometric, side plan, cross-sectional, and exploded views of a portion of a deflectometer 1550 , Figure 21G It is along Figure 21F The line 21G-21G is intercepted.

[0369] It should be understood that this article refers to Figures 21A to 21G The specific embodiment of the deflectometer 1550 described and shown is by way of example only, and other types of deflectometers may alternatively be used within the present invention. For example, non-contact systems may be employed within the present invention to sense the deflection of a sample, such as, by way of non-limiting example only, systems based on laser interferometry, ultrasonic distance sensing, and confocal distance measurement.

[0370] Deflectometer 1550 is preferably implemented as a position sensor, and particularly preferably implemented as a high temperature linear variable differential transformer (LVDT) sensor, which operates to measure the deflection of sample 1500 during testing of sample 1500 .

[0371] The deflectometer 1550 preferably includes a hybrid displaceable rod 2110 fixedly coupled to a position transducer 2112, which is preferably a high temperature LVDT transducer. An exemplary LVDT transducer suitable for use as the position transducer 2112 is the LVDT MHR 250ASSY commercially available from TE Connectivity of Schaffhausen, Switzerland.

[0372] The hybrid displaceable rod 2110 is preferably connected to Figures 19A to 20B The hybrid loading rod 1910 of the load application system 1540 shown in FIG is similar to, but not identical to, the hybrid loading rod 1910 of the load application system 1540 shown in FIG. The displaceable rod 2110 is preferably implemented as a hybrid or composite rod that includes a non-conductive portion 2116 and a refractory portion 2118. The non-conductive portion 2116 is preferably formed of a thermally and electrically insulating material, such as quartz glass. The refractory portion 2118 is preferably formed of a material that is resistant to the high temperatures at which the AMPT 1302 may operate and has high stiffness at these temperatures. By way of example, the refractory portion 2118 may be formed of graphite or silicon carbide. According to a particularly preferred embodiment of the present invention, the refractory portion 2118 is formed of graphite. It should be understood that the refractory portion 2118 is preferably in contact with the sample 1500 during operation of the AMPT 1302, while the non-conductive portion 2116 is preferably located away from the sample 1500 and closer to the position transducer 2112 during operation of the AMPT 1302, so that thermal and electrical conduction from the heat source 1510 to the position transducer 2112 is minimized.

[0373] The circumference of the non-conductive portion 2116 can be larger than the circumference of the refractory portion 2118 to prevent bending or breaking of the non-conductive portion 2116. The non-conductive portion 2116 preferably provides both thermal and electrical insulation to the position transducer 2112.

[0374] The refractory portion 2118 is preferably fixedly mounted to the non-conductive portion 2116 by the clamp assembly 1996. The refractory portion 2118 preferably has a working end 2120, and the non-conductive portion 2116 preferably has a mounting end 2122. The working end 2120 is generally tapered and preferably includes a generally flat top surface 2124 that preferably maintains mechanical contact with the sample 1500 during testing of the sample 1500. Preferably, the top surface 2124 does not readily cut or score the sample 1500.

[0375] The deflectometer 1550 preferably includes a deflectometer transducer assembly 2130. The deflectometer transducer assembly 2130 preferably includes a rod clamp 2132, a linear slide 2134, and a position transducer 2112. The deflectometer transducer assembly 2130 also preferably includes a transducer body 2138 that houses the position transducer 2112, a deflectometer transducer mounting plate 2140, and a deflectometer transducer assembly mounting bracket 2142.

[0376] As in Figure 21C and Figure 21D As particularly seen in the figure, the rod clamp 2132 preferably includes a rod clamp base 2144 and a pair of rod clamp blocks 2146. Each of the rod clamp base 2144 and the rod clamp blocks 2146 is preferably formed with a recess 2148 configured to receive the mounting end 2122 of the displaceable rod 2110. In an assembled state, the mounting end 2122 of the displaceable rod 2110 is preferably clamped in the recess 2148 between the rod clamp block 2146 and the rod clamp base 2144, and the rod clamp block 2146 is fixedly attached to the rod clamp base 2144 by a plurality of fasteners 2150. The rod clamp 2132 is preferably fixedly mounted to the linear slide 2134 by a plurality of fasteners 2154. Thus, the displaceable rod 2110 is fixedly mounted to the linear slide 2134 via the rod clamp 2132.

[0377] The position transducer 2112 preferably includes a core rod 2160 having a working end 2162 and a mounting end 2164, as shown in FIG. Figure 21C Mounting end 2164 of core rod 2160 is preferably fixedly mounted to attachment rod 2170. Rod 2170 includes a lower end 2172 to which core rod 2160 is mounted and an upper end 2174 that is mounted within an opening 2180 formed in transducer body 2138 and extends through a slot 2182 in rod clamp base 2144.

[0378] As in Figure 21C , a working end 2162 of the core rod 2160 is slidably mounted within the transducer body 2138, which houses the position transducer 2112. The rod 2170 and the core rod 2160 are fixedly mounted to each other, for example, by complementary threads (not shown) on the mounting end 2164 of the core rod 2160 and the lower end 2172 of the rod 2170.

[0379] The position transducer 2112 is preferably at least partially fixedly housed within the transducer body 2138 by a plurality of fasteners 2184. At least one of the fasteners 2184 is preferably resilient, preferably formed of neoprene, which allows for relatively strong frictional engagement between the transducer body 2138 and the position transducer 2112 without damaging or deforming the position transducer 2112.

[0380] The transducer body 2138 is preferably, in turn, mounted to the linear slide 2134 by a plurality of fasteners 2188. The transducer body 2138 is preferably, in turn, mounted to the deflectometer transducer assembly mounting bracket 2142 by another plurality of fasteners 2190. The deflectometer transducer assembly mounting bracket 2142 is, in turn, mounted to the deflectometer assembly mounting plate 2140 by a plurality of fasteners 2192.

[0381] It should be understood that during preferred use of the system 1300, the displaceable rod 2110 is fixedly mounted to the linear slide 2134. Deflection of the sample 1500 against the displaceable rod 2110 causes the linear slide to move up and down in the direction indicated by arrow 2196. In addition, the rod 2170 is fixedly mounted to the linear slide 2134, and the core rod 2160 is fixedly mounted to the rod 2170. Therefore, when the linear slide 2134 moves in the direction indicated by arrow 2196, the rod 2170 and the core rod 2160 also move with the linear slide 2134.

[0382] The deflectometer assembly mounting plate 2140 is preferably mounted to the plate 14130 via a plurality of fasteners 21100 having a corresponding plurality of springs 21102 and washers 21104 threaded along the fasteners 21100. It should be understood that the plate 14130 is preferably the base plate of the subchamber 1316. The springs 21102 are used to allow adjustment of the deflectometer assembly mounting plate 2140 to level the deflectometer 1550.

[0383] Deflectometer 1550 preferably further includes Figures 21E to 21H 1. The counterweight mechanism 21120 is specifically seen in FIG. The counterweight mechanism 21120 preferably includes a weight rod 21122 partially mounted within a counterweight support 21124. The counterweight support 21124 preferably includes a weight rod slot 21126 and a pair of pivot apertures 21130, and is preferably fixedly mounted to the deflectometer transducer mounting plate 2140 by a plurality of fasteners 21131.

[0384] The weight rod 21122 has a first side portion 21132 and a second side portion 21134. The first side portion 21132 of the weight rod 21122 is preferably formed with a weight bearing aperture 21136. The weight rod 21122 is also preferably formed with a pivot aperture 21138. The weight bearing aperture 21136 is preferably used to securely mount the counterweight 21140 on the weight rod 21122. Figure 21C As seen specifically in FIG, the deflectometer transducer assembly 2130 preferably rests on an upper surface 21142 of the second side 21134 of the weighted rod 21122.

[0385] The counterweight 21140 preferably has a mass sufficient to counteract the force of gravity exerted on the deflectometer transducer assembly 2130, thereby urging the deflectometer transducer assembly 2130 upward, and preferably ensure that the top surface 2124 of the displaceable rod 2110 remains in contact with the sample 1500 during testing of the sample 1500. The counterweight 21140 preferably includes a bolt 21146 having a plurality of weighting elements 21148, such as a plurality of nuts and a cap nut 21149, mounted thereon.

[0386] The counterweight mechanism 21120 preferably also includes a pivot pin 21150 about which a cylindrical support 21152 is mounted. The pivot pin 21150 is preferably received by the pivot aperture 21130 of the counterweight support 21124 and the pivot aperture 21138 of the weight rod 21122. The cylindrical support 21152 is preferably received by the pivot aperture 21138 of the weight rod 21122. The pivot pin 21150 and the cylindrical support 21152 together pivotally attach the weight rod 21122 to the counterweight support 21124, enabling the weight rod 21122 to rotate within the weight rod slot 21126.

[0387] It should be understood that the downward gravitational force on the first side 21132 of the weighted bar 21122 urges the weighted bar 21122 to rotate about the pivot pin 21150 in the direction indicated by arrow 21160, which in turn urges the second side 21134 of the weighted bar 21122 upward against the force of gravity. Conversely, the downward gravitational force acting on the deflectometer transducer assembly 2130 exerts a downward force on the second side 21134 of the weighted bar 21122, thereby urging the weighted bar 21122 to rotate about the pivot pin 21150 in the direction indicated by arrow 21162.

[0388] Now refer to Figures 22A to 23K , which are simplified schematic diagrams showing sequential steps in the preparation and use of a system 1300 for performing material property testing according to a preferred embodiment of the present invention; now referring to Figure 24 , Figure 24is a simplified schematic diagram illustrating the use of a system 1300 for performing material property testing according to another preferred embodiment of the present invention; and now referring to Figure 25A and Figure 25B , Figure 25A and Figure 25B Together they form a simplified flow chart 2500 illustrating the steps in the preparation and use of the system 1300 for performing material property testing in accordance with a preferred embodiment of the present invention.

[0389] Figures 22N to 22P Each shows a single step, Figure 22P It is along Figure 22O The line 22P-22P is intercepted. Figures 23A to 23C Each shows a single step, and Figures 23D to 23E An additional single step is shown, Figure 23B It is along Figure 23A The line 23B-23B is intercepted, and Figure 23E It is along Figure 23D The line 23E-23E is intercepted.

[0390] A particular feature of preferred embodiments of the present invention is that at any given time during operation of the system 1300, at least two HTFs 1520 are preferably used in an alternating manner. Preferably, during operation of the system 1300, a first sample 1500, such as the first sample 1500A, is inserted into a first HTF 1520, such as the first HTF 1520A. The first HTF 1520A is heated by the heat source 1510, thereby heating the first sample 1500A. Preferably, while the first sample 1500A is being heated, material property testing is performed on the first sample 1500A using a testing unit 1530, such as the first testing unit 1530A.

[0391] The second sample 1500, such as the second sample 1500B, is preferably inserted into the second HTF 1520, such as the second HTF 1520B. The second sample 1520B may be inserted into the second HTF 1520B before the material property test on the first sample 1500A is completed. The second sample 1500B may be inserted into the second HTF 1520B before the start of heating the first sample 1500A and / or the material property test on the first sample 1500A, simultaneously with, or partially simultaneously with, the heating of the first sample 1500A and / or the material property test on the first sample 1500A. Alternatively, the second sample 1500B may be inserted into the second HTF 1520B after the material property test on the first sample 1500A is completed.

[0392] After the material property test on the first sample 1500A is completed, the second HTF 1520B is heated by the heat source 1510, thereby heating the second sample 1500B. Then, preferably while the second sample 1500B is being heated, the material property test on the second sample 1500B is performed using the second test unit 1530, such as the second test unit 1530B.

[0393] The third sample 1500, such as the third sample 1500C, is preferably inserted into the third HTF 1520, such as the third HTF 1520C. The third sample 1500C may be inserted into the third HTF 1520C before the material property testing of the second sample 1500B is completed. The third sample 1500C may be inserted into the third HTF 1520C before the material property testing of the second sample 1500B is started. Additionally or alternatively, the third sample 1500C may be inserted into the third HTF 1520C even earlier in the process 2500, i.e., before the material property testing of the first sample 1500A is started and / or completed. Additionally or alternatively, the third sample 1500C may be inserted into the third HTF 1520C simultaneously or partially simultaneously with heating the second sample 1500B and / or performing material property testing on the second sample 1500B. Alternatively, the third sample 1500C may be inserted into the third HTF 1520C after the material property testing on the second sample 1500B is completed.

[0394] After the material property test on the second sample 1500B is completed, the third HTF 1520C is heated by the heat source 1510, thereby heating the third sample 1500C. Preferably, while the third sample 1500C is being heated, the material property test is performed on the third sample 1500C using the third test unit 1530, such as the third test unit 1530C.

[0395] The fourth sample 1500, such as the fourth sample 1500D, is preferably inserted into the fourth HTF 1520, such as the fourth HTF 1520D. The fourth sample 1500D may be inserted into the fourth HTF 1520D before the material property testing of the third sample 1500C is completed. The fourth sample 1500D may be inserted into the fourth HTF 1520D before the material property testing of the third sample 1500C begins. Additionally or alternatively, the fourth sample 1500D may be inserted into the fourth HTF 1520D even earlier in the process 2500, i.e., before the material property testing of the second sample 1500B and / or the first sample 1500A is completed. Additionally or alternatively, the fourth sample 1500D may be inserted into the fourth HTF 1520D simultaneously or partially simultaneously with the material property testing of the third sample 1500C. Alternatively, the fourth sample 1500D may be inserted into the fourth HTF 1520D after the material property testing of the third sample 1500C is completed.

[0396] After the material property test on third sample 1500C is completed, fourth HTF 1520D is heated by heat source 1510, thereby heating fourth sample 1500D. Preferably, while fourth sample 1500D is being heated, a material property test is performed on fourth sample 1500D using fourth testing unit 1530, such as fourth testing unit 1530D.

[0397] It should be understood that the above process may be continued to test a desired number of samples 1500 in a corresponding number of HTFs 1520 using a corresponding number of test units 1530 .

[0398] In a preferred embodiment of the present invention, Figures 23A to 23K , two HTFs 1520, such as first HTF 1520A and second HTF 1520B, are alternately used during operation of system 1300. In this embodiment, first HTF 1520A and second HTF 1520B can be cycled between any desired number of sample tests, wherein a sample 1500 held in one HTF, such as one of HTFs 1520A and 1520B, is subjected to heating in AMPT 1302 and material property testing by testing unit 1530, while another HTF, such as the other of HTF 1520A and HTF 1520B, is cooled and then receives a new sample 1500.

[0399] Therefore, it should be understood that at least the second sample 1500B is preferably prepared for testing by pre-filling the second HTF 1520B simultaneously with testing the first sample 1500A in the first HTF 1520A in the AMPT 1302, partially simultaneously with testing the first sample 1500A in the first HTF 1520A in the AMPT 1302, before completing testing of the first sample 1500A in the first HTF 1520A in the AMPT 1302, or immediately after completing testing of the first sample 1500A in the first HTF 1520A in the AMPT 1302. Upon completion of testing of the first sample 1500A, the second HTF 1520B with the second sample 1500B inserted therein is preferably positioned relatively quickly in the AMPT 1302, and heating and subsequent testing of the second sample 1500B are initiated relatively quickly. During testing of the second sample 1500B in the second HTF 1520B, the first HTF 1520A may be allowed to cool, and then an additional third sample 1500C may be inserted into the first HTF 1520A in preparation for testing, and so on.

[0400] It should be appreciated that alternating use of at least two HTFs 1520 allows testing of samples 1500 in one HTF 1520 to be performed while at least another HTF 1520 is cooling down after use. This allows for significantly higher testing rates than would be possible using a single HTF for continuous testing, as there is no need to wait for a given HTF 1520 to completely cool down after use before preparing for and starting the next test, nor is there a need to first remove samples and test units from a given HTF 1520 before preparing for and inserting new samples and test units. Thus, this feature of preferred embodiments of the present invention facilitates rapid transitions between sample tests, thereby enabling relatively high testing throughput for the system 1300.

[0401] It should be understood that, according to this embodiment, the first HTF 1520A constitutes the same HTF as the third HTF 1520C. In other words, the first HTF 1520A is cyclically reused as the third HTF 1520C and is cooled and recharged with a new sample between uses. Similarly, in this embodiment, the second HTF 1520B constitutes the same HTF as the fourth HTF 1520D. In other words, the third HTF 1520C is cyclically reused as the fourth HTF 1520D and is cooled and recharged with a new sample between uses.

[0402] It should also be understood that although a sequence of four sample tests is described and illustrated herein, a greater or lesser number of sample tests are possible. In the event that a greater number of sample tests are performed using the system 1300, in this embodiment of the present invention, the first HTF 1520A and the second HTF 1520B can continue to be alternately used (heated and tests performed on the samples therein) and prepared (cooled and new samples to be tested are inserted therein).

[0403] exist Figure 24 In another preferred embodiment of the present invention shown in , instead of repeatedly, cyclically, and alternately using (heating, testing samples therein) and preparing (cooling and inserting new samples to be tested therein) a pair of first HTF 1520A and second HTF 1520B, a plurality of HTFs 1520, such as first HTF 1520A to fourth HTF 1520B, may be prepared before the start of a test sequence, and each HTF 1520 is pre-filled with a sample, such as first sample 1500A to fourth sample 1500D, respectively. The sample 1500 in a corresponding one of the HTFs 1520 may be continuously heated and tested by the system 1300. In this embodiment, each of the first HTF 1520A to fourth HTF 1520D constitutes a single HTF 1520 of the plurality of HTFs 1520 and is not reused during the test sequence. It should be understood that although in Figure 24 Four HTFs 1520A to 1520D are shown in FIG, but a greater or lesser number of HTFs 1520 , each pre-filled with a corresponding number of samples 1500 , is also possible.

[0404] It should be understood that Figure 24 The implementation method may be more Figures 23A to 23K The implementation of is cost inefficient because a greater number of HTFs 1520 are required. Figure 24 Implementations of can be advantageous because samples for an entire test sequence can be pre-prepared in each HTF 1520, thereby allowing for smoother, less labor-intensive operation of the system 1300 during the execution of material property testing.

[0405] It should be understood that combinations of these approaches are also possible, wherein during operation of the system 1300 , some of the HTFs 1520 are reused for multiple tests while some of the HTFs 1520 are not reused for multiple tests.

[0406] It should also be understood that although the use of multiple HTFs 1520, each pre-filled with a corresponding sample 1500, is described and shown herein in the context of the system 1300, the system 100 may be used with reference to any of the systems herein. Figures 22A to 25B The described approach employs a plurality of HTFs 150, each pre-filled with a corresponding sample 130, operating in a manner similar to that described with reference to system 1300. The use of a plurality of pre-filled HTFs 150 can be used to increase the testing rate and throughput of system 100 in a manner similar to that described herein with reference to system 1300.

[0407] Now turn Figures 22A to 22P and Figure 25A In the first preparation step 2502, the user inserts the sample 1500 and the test unit 1530 into the HTF 1520. The sample 1500 may be any one of the first sample 1500A to the fourth sample 1500D, the test unit 1530 may be any one of the first test unit 1530A to the fourth test unit 1530D, and the HTF 1520 may be any one of the first HTF 1520A to the fourth HTF 1520D. It should also be understood that Figures 22A to 22P The steps shown in can additionally or alternatively be performed for other samples 1500 , other test units 1530 , and other HTFs 1520 .

[0408] As part of step 2502, the user may need to initially prepare the HTF 1520 to receive the sample 1500 and the test unit 1530. Figures 22A to 22C As specifically seen in FIG, to prepare HTF 1520 to receive sample 1500 and test unit 1530, a user wraps a layer of graphite foil 1700 around the outer surface of base 1610. As an example, a user may wrap the layer of graphite foil 1700 twice around the outer surface of base 1610. The layer of graphite foil 1700 is preferably glued to base 1610 by an adhesive (not shown).

[0409] As in Figure 22D and Figure 22E , also as part of step 2502, the user then forms a sample orifice 1720, a displaceable rod orifice 1722, and at least one temperature reader orifice 1724 in the graphite foil layer 1700 that are aligned with the sample receiving cavity 1730, the displaceable rod orifice 1732, and the at least one temperature reader orifice 1734 of the base 1610, respectively. The sample orifice 1720, the displaceable rod orifice 1722, and the at least one temperature reader orifice 1724 may be formed by any suitable tool, such as, by way of example only, a suitable blade.

[0410] It should be understood that during repeated uses of the HTF 1520, the graphite foil layer 1700 can remain on the base 1610 and be reused during subsequent test cycles, such that the graphite foil layer 1700 is not necessarily performed during each use of the HTF 1520. Figures 22A to 22E Alternatively, the graphite foil layer 1700 may be replaced before each use of the HTF 1520, or may be replaced after several test cycles of the HTF 1520, as may be necessary due to degradation of the graphite foil layer 1700 during testing.

[0411] As in Figure 22F and Figure 22G As particularly seen in FIG, also as part of step 2502, the user preferably prepares the test unit 1530 for insertion into the sample receiving cavity 1730 of the base 1610. Preferably, Figure 22F and Figure 22G 25, the user prepares the lower portion 1742 of the test cell 1530 by adhering the lower support pin 1758 to the LSPC 1752 near the protrusions 1778 and 1780, and inserts and adheres the sample 1500 into the recess 1782 of the LSPC 1752. The user also prepares the upper portion 1740 of the test cell 1530 by adhering the load applying contact pin 1754 into the recess 1772 of the ULPC 1750 and adhering the upper loading pin 1756 into the pin recess 1762. The user preferably adheres the upper portion 1740 to the lower portion 1742 and places the test cell 1530, now including the sample 1500, into the sample receiving cavity 1730 of the base 1610. The user may use positioning tools, such as tweezers or pliers, to help position any or all of the components, such as the LSPC 1752, support pins 1758, load applying contact pins 1754, sample 1500, loading pins 1756, and ULPC 1750, in their operational orientation.

[0412] It should be understood that the test unit 1530 can be reused to perform multiple tests, can be replaced by a new one of the test units 1530 for each test, or can be replaced after several uses, as may be necessary due to degradation of the test unit 1530. In the event that the test unit 1530 is used for more than one test, each of the upper portion 1740 and the lower portion 1742 can remain assembled between tests. A new sample 1500, such as the second sample 1500B, the third sample 1500C, the fourth sample 1500D, etc., is provided by the user for testing and is adhered between the upper portion 1740 and the lower portion 1742. Alternatively, the test unit 1530 can be completely reassembled before each use thereof.

[0413] It should be understood that, as Figure 22F and Figure 22GAs seen in FIG, the user places the sample 1500 and the test unit 1520 within the base 1610. Thus, as shown in FIG. Figures 22A to 22G As specifically shown in FIG, fractionation of sample 1500 occurs outside of environmental chamber 1304.

[0414] To complete the preparation of HTF 1520, also as part of step 2502 and as Figures 22H to 22K , the user preferably wraps the thermally insulating portion 1710 of the HTF 1520 around the base 1610. Preferably, the user wraps a first thermally insulating felt layer 1712 around the first end 1702 of the graphite foil 1700 and a second thermally insulating felt layer 1714 around the second end 1704 of the graphite foil 1700. Each of the first thermally insulating felt layer 1712 and the second thermally insulating felt layer 1714 is preferably wrapped at least twice around the graphite foil layer 1700 on the base 1610 and adhered to the graphite foil layer 1700 by an adhesive. Each of the first thermally insulating felt layer 1712 and the second thermally insulating felt layer 1714 preferably partially overlaps the sample receiving cavity 1730 without obstructing the displaceable rod aperture 1732 and the at least one temperature reader aperture 1734 of the base 1610.

[0415] It should be understood that during repeated use of the HTF 1520, the first thermal insulation felt layer 1712 and the second thermal insulation felt layer 1714 may be reused for multiple tests, may be replaced before each use of the HTF 1520, or may be replaced after several testing cycles of the HTF 1520, as may be necessary due to degradation thereof during testing.

[0416] It should be understood that once the user has executed Figures 22H to 22K By the steps shown in FIG, the NMFH 1600 including the graphite foil layer 1700 and the thermal insulation layer 1710 has been assembled. Figures 22A to 22K In the embodiment shown in FIG, NMFH 1600 is prepared and the test unit 1530 and the sample 1500 are placed in the base 1610 of the HTF 1520 outside the environmental chamber 1304. Figures 22A to 22K In the embodiment shown in , complete pre-assembly of the HTF 1520 occurs outside of the environmental chamber 1304 .

[0417] As in Figure 22L and Figure 22MAs specifically seen in FIG, to prepare the HTF 1520 for heating, the user typically positions the HTF 1520 containing the test unit 1530 and the sample 1500 in the base 1610 of the HTF 1520 within the space 1626 of the coil 1622 of the heat source 1510 by sliding the HTF 1520 through the interior of the space 1626 of the coil 1622 of the heat source 1510. Figure 22L Prior to the steps shown in , the left support wall 1562 has been mounted on the mounting base 1560, the left support wall 1562 including an upper portion 1566 mounted on the lower portion 1564 by a quartz rod 15122 and aligned with the lower portion 1564 by an alignment post 15130. Figure 22L Prior to the step shown in , preferably, the first support rod 1574 and the second support rod 1576 have been installed on the lower portion 1564 of the left support wall 1562, and the guide pin 1596 has also been installed in the pin recess 1594 of the upper portion 1566 of the left support wall 1562. Figure 22L and Figure 22M , the user positions the left end of the base 1610 within the furnace recess 1592 of the left support wall 1562. To help maintain the proper rotational orientation of the HTF 1520, the pin recess 1736 of the left end of the base 1610 slides along the guide pin 1596 of the left support wall 1562 as the user completes sliding the HTF 1520 through the space 1626 of the coil 1622.

[0418] As in Figure 22M and Figure 22N , the user installs the right support wall 1568 on the mounting base 1560 such that the right end of the base 1610 rests within the furnace recess 15104 of the upper portion 1572 of the right support wall 1568. Typically, the user installs the right support wall 1568 by sliding the right support wall 1568 between the HTF 1520 and the mounting base 1560. When installing the right support wall 1568 on the mounting base 1560, the user preferably installs the lower portion 1570 of the right support wall 1568 on the mounting base 1560 by inserting the mounting post 15100 into the recess 1598 in the lower portion 1570 of the right support wall 1568, installs the upper portion 1572 on the lower portion 1570 via the quartz rod 15134, and aligns the upper portion 1572 with the lower portion 1570 using the alignment post 15142. The right support wall 1568 is preferably attached to the left support wall 1562 by securing a first support rod 1574 and a second support rod 1576 to the right support wall 1568 .

[0419] As in Figure 22M and Figure 22NAs particularly seen in FIG, when the HTF 1520 is inserted into the coil 1622, the turns 1624 of the coil 1622 support the base 1610, so that a separate lower support for the base 1610 is not required. The HTF 1520 is preferably oriented generally horizontally within the generally horizontally oriented coil 1622. Additionally, the sample 1500 is preferably oriented horizontally within the HTF 1520, as shown in FIG. Figure 22P Pin recess 1736 and guide pin 1596 help maintain the proper rotational operational orientation of HTF 1520.

[0420] exist Figures 22N to 22P At step , the AMPT 1302 is almost in its fully assembled operational orientation. Figures 22N to 22P At the steps, such as Figure 22P As particularly seen in the enlarged view S of FIG, the test unit 1530 and the sample 1500 are held in a base 1610 within the HTF 1520, which is located in a space 1626 defined by the coil 1622. Additionally, a left support wall 1562 and a right support wall 1568 are mounted on the mounting base 1560. However, as shown in FIG. Figure 22P Specifically, as can be seen in the enlarged view S, Figures 22N to 22P At step , neither the loading rod 1910 nor the displaceable rod 2110 has yet come into contact with the test unit 1530 or the sample 1500 .

[0421] exist Figures 22N to 22P After the steps, as in FIG. 23A to FIG. 23B specifically seen in and even in Figure 23B As more particularly seen in the enlarged view T in FIG, the user prepares the load application system 1540 and the position measurement system for use during testing. The refractory portion 1992 of the loading rod 1910 is preferably in contact with the test cell 1530 or sample 1500. If a 4PB test cell 1532 is to be used, the refractory portion 1992 of the loading rod 1910 is passed through the sample orifice 1720 into the sample receiving cavity 1732 such that the refractory portion 1992 contacts the load application contact pin 1754.

[0422] Alternatively, if the 3PB test cell 1534 is to be used, the refractory portion 1992 of the loading rod 1910 is passed through the sample orifice 1720 into the sample receiving cavity 1732 such that the refractory portion 1992 contacts the sample 1500 .

[0423] In an embodiment of the present invention, load application system 1540 is used both to apply force to sample 1500 and to measure the position of sample 1500. In this embodiment, placement of loading rod 1910 is used to prepare both load application system 1540 and a position measurement system, which is also implemented as load application system 1540.

[0424] In alternative embodiments of the present invention, the deflectometer 1550 is additionally or alternatively used as a position measurement system. Figure 23B , in this embodiment, the user brings the refractory portion 2118 of the displaceable rod 2110 into contact with the sample 1500. More specifically, the refractory portion 2118 of the displaceable rod 2110 is passed through the displaceable rod orifice 1722 and the displaceable rod hole 1732 such that the top surface 2124 of the conductive portion 2218 of the displaceable rod 2110 contacts the sample 1500.

[0425] It should be appreciated that, in addition to receiving the loading rod 1910 for applying force during testing of the sample 1500, the sample orifice 1720 and the sample receiving cavity 1732, together with the loading rod 1910, facilitate maintaining the proper rotational operational orientation of the HTF 1520 during both sample preparation and sample testing. Similarly, in addition to receiving the displaceable rod 2110 for measuring deflection during testing of the sample 1500, the displaceable rod orifice 1722 and the displaceable rod hole 1732, together with the displaceable rod 2110, facilitate maintaining the proper rotational operational orientation of the HTF 1520 during both sample preparation and sample testing.

[0426] Preferably, the proper rotational operational orientation of the HTF 1520 is further maintained by corresponding features on the respective left and right end portions of the base 1610 and the left and right support walls 1562, 1568, such as the pin recesses 1736 and the guide pins 1596. In addition to or as an alternative to the pin recesses 1736 and the guide pins 1596, the corresponding features may include mechanical orientation indicators, such as matching protrusions and recesses, and / or visual orientation indicators, such as visible arrows or other shapes for indicating the proper orientation of the HTF 1520. Additionally or alternatively, appropriate portions of the NMFH 1600 are formed with features (not shown) that assist in maintaining the proper rotational operational orientation of the HTF 1520.

[0427] Likewise, in Figures 22N to 22PFollowing the step of , the user preferably positions one or more temperature probes, such as, in particular, one or more of the optical pyrometer 1426 and a thermocouple, at or partially within at least one of the temperature reader openings 1724 and 1734 for temperature measurement of the susceptor 1610. An exemplary thermocouple suitable for use as a thermocouple is any of the R-type, C-type, K-type, or S-type thermocouples commercially available from Dynamic Systems Inc. of Poestenkill, NY, USA.

[0428] Usually, in Figures 22N to 22P After the steps of and prior to testing of sample 1500, a full or partial calibration of system 1300 is performed. Partial calibration may manifest as a "tare" of system 1300, wherein the position of each of loading rod 1910 and displaceable rod 2110 is recorded and used to determine a zero position for each of loading rod 1910 and displaceable rod 2110. Additionally, during full or partial calibration of system 1300, the resistance offered by components of deflectometer 1550 to movement of sample 1500 in the direction indicated by arrow 2504 may be measured and stored by integrated computer system 1306 for use as a calibration factor.

[0429] exist Figures 23A to 23C Following the steps shown in , at the next step 2506, sample 1500 is brought to test conditions, including, among other things, the desired temperature and gas environment. Heat source 1510, and in particular coil 1622 of heat source 1510, preferably heats HTF 1520. More specifically, coil 1622 heats base 1610 of HTF 1520 when base 1610 is positioned within space 1626, which in turn heats sample 1500 and test unit 1530. More specifically, a voltage is supplied to heat source 1510, causing coil 1622 of heat source 1510 to generate an electromagnetic field. The electromagnetic field generated by coil 1622 of heat source 1510 is preferably an ultra-high frequency electromagnetic field, preferably having a frequency between 50,000 Hz and 300,000 Hz. As is known in the art, the electromagnetic field generated by coil 1622 is particularly strong within space 1626 defined by coil 1622.

[0430] When in the operational orientation, pedestal 1610 is partially disposed within space 1626 defined by turns 1624 of coil 1622, and thus pedestal 1610 is preferably approximately centered about the electromagnetic field generated by coil 1622. As described above, heat source 1510 preferably uses induction heating to heat pedestal 1610, which is preferably formed of a conductive material. More specifically, the electromagnetic field generated by coil 1622 induces an electric current within pedestal 1610, and resistive heating converts the induced current in pedestal 1610 into heat, thereby heating pedestal 1610. Pedestal 1610, in turn, transfers the heat to test cell 1530 and sample 1500 through conductive heating and / or radiant heating.

[0431] The integrated computer system 1306 preferably controls and monitors the temperature of the susceptor 1610. In various embodiments of the present invention, the system 1300 is operable to achieve a wide range of heating rates, ranging from about 1°C / second to greater than about 100°C / second. The system 1300 is also preferably operable to maintain the susceptor 1610 at a preselected temperature before, during, and after testing of the sample 1500, thereby allowing either or both of the sample 1500 and the components of the system 1300 to achieve isothermal conditions and / or reach a state of thermal equilibrium.

[0432] Preferably, adhesive present at various locations in HTF 1520, such as adhesive adhering sample 1500 to test unit 1530, is preferably burned off during heating of HTF 1520 by system 1300 and before material property testing of sample 1500 begins.

[0433] The integrated computer system 1306 preferably further at least partially controls and monitors the gas environment of the interior space of the modular environmental chamber 1304 to ensure that the interior space conforms to predetermined gas conditions, the predetermined gas conditions including, among others, vacuum, inert gas, ambient air, an environment containing one of a plurality of controlled gas mixtures such as a predetermined percentage of oxygen, a reducing environment, and an oxidizing environment.

[0434] During preparation of environmental chamber 1304 and base 1610 prior to testing of sample 1500, system 1300 is preferably operated to precisely control the force applied to sample 1500 by load application system 1540 in the direction of force application indicated by arrow 2504. For example, integrated computer system 1306 is preferably operated to control load application system 1540 so as to maintain a predetermined force on sample 1500 while system 1300 brings sample 1500 to a predetermined test temperature. The predetermined force can be any suitable force, such as a user-specified force, and can have a value ranging between zero and the maximum load capacity of system 1300, inclusive. In an exemplary embodiment of the invention, system 1300 is operated to apply a force on sample 1500 between 0 N and 100 N. Preferably, the actual force applied to sample 1500 by system 1300 deviates by no more than + / - 0.5% from the predetermined force applied by system 1300.

[0435] It should be understood that, as used herein, “downward motion,” “downward force,” “downward direction,” and “downward displacement” refer to the respective motion, force, direction, and displacement in the direction indicated by arrow 2504 .

[0436] At the next step 2508, one or more material properties of the sample 1500 are tested using the test cell 1530. Predetermined environmental conditions, particularly those related to the gas environment and temperature of the sample 1500, are preferably maintained during the testing of the sample 1500. At the start of the testing of the sample 1500 by the system 1300, the refractory portion 1992 of the loading rod 1910 of the load application system 1540 is generally in contact with the test cell 1530 or the sample 1500 while applying a net zero force on the test cell 1530 or the sample 1500, as in FIG. Figures 23A to 23C Specifically seen in.

[0437] Thereafter, as part of step 2508, the integrated computer system 1306 preferably controls the load application system 1540 to drive the loading rod 1910 to apply a series of predetermined forces to the sample 1500 in the direction indicated by arrow 2504. It should be understood that when the load application system 1540 applies a relatively small force on the sample 1500, the sample 1500 experiences little to no visible deformation, as in Figure 23B This can be seen specifically at T in the enlarged view.

[0438] To apply a range of predetermined forces to the sample 1500, the integrated computer system 1306 preferably provides a range of voltages to the linear actuator 1902, thereby causing downward movement of the drive shaft 1904 of the linear actuator 1902. The movement of the drive shaft 1904, in turn, causes downward movement of the actuator connector rod 1930 connected to the drive shaft 1904. The downward movement of the actuator connector rod 1930 causes corresponding downward movement of the upper load sensor connector 1926, the force sensor 1916, and the lower load sensor connector 1954, which, in turn, drives the load rod 1910 in a downward direction.

[0439] If a 4PB test cell 1532 is used, the integrated computer system 1306 provides a series of voltages to the linear actuator 1902, causing the load rod 1910 to apply a series of predetermined downward forces on the load application contact pin 1754. The load application contact pin 1754 preferably transmits each downward force from the load rod 1910 to the other components of the test cell 1530, namely, the ULPC 1750, the upper load pin 1756, the lower support pin 1758, and the LSPC 1778, as well as the specimen 1500.

[0440] Alternatively, if a 3PB test cell 1534 is used, the integrated computer system 1306 provides a series of voltages to the linear actuator 1902, causing the load rod 1910 to exert a series of predetermined downward forces on the specimen 1500. The specimen 1500 transmits each downward force from the load rod 1510 to components of the test cell 1530, namely, the lower support pin 1758 and the LSPC 1778.

[0441] It should be understood that when the load application system 1540 applies a relatively large force on the sample 1500, such as in Figures 23D to 23E In the example 1500, the sample undergoes visible deformation, as shown in Figure 23E If a 4PB test cell 1532 is used and sample 1500 experiences an unusually large visible deformation (not shown), at least some of the deformation notches 1764 of ULPC 1750 and the deformation recesses 1786 of LSPC 1778 preferably receive the deformed portion of sample 1500.

[0442] As is known in the art, the response of sample 1500 to the forces applied to sample 1500 by test unit 1530, particularly the deformation of sample 1500, and more particularly the downward displacement of the center of sample 1500, provides data useful in calculating the material properties of sample 1500, such as flexural modulus, flexural stress, flexural strain, flexural stress-strain relationship, Young's modulus, ultimate strength, and fracture toughness.

[0443] Preferably, as part of step 2508, integrated computer system 1306, and more preferably data acquisition system 1309 of integrated computer system 1306, monitors and records most, and more preferably all, of the useful data associated with system 1300 during use of system 1300. More specifically, integrated computer system 1306 preferably monitors and records, among other things, the temperature of base 1610, the voltage applied to heat source 1510, the gas pressure within the interior of environmental chamber 1304, the force applied to sample 1500 by load application system 1540, the deflection of sample 1500, the temperature of force sensor 1916, and the temperature of displaceable rod 2110. In a preferred embodiment of the present invention, the force applied to sample 1500 by load application system 1540 is indicated by data associated with load application system 1540, including, among other things, data associated with any or all of linear actuator 1902, the position of loading rod 1910, and the force indicated by force sensor 1916.

[0444] Although not the primary intended use case for system 1300, the force applied to sample 1500 by load application system 1540 may additionally or alternatively be indicated by data associated with deflectometer 1550, including, among other things, data associated with any or all of the components of deflectometer 1550, such as the voltage output by position transducer 2112, the position of displaceable rod 2110, and the position of core rod 2160. Using data associated with deflectometer 1550 to determine the force applied to sample 1500 may be of particular interest in calibration procedures or academic research and typically relies on sample 1500 having known material properties.

[0445] Typically, readings from the deflectometer 1550 - particularly including data relating to any or all of the components of the deflectometer 1550, such as the voltage output by the position transducer 2112, the position of the displaceable rod 2110, and the position of the core rod 2160 - are preferably used to determine the deflection of the sample 1500 when determining the material properties of the sample 1500.

[0446] Preferably, the monitoring and recording of useful data by the integrated computer system 1306 is effectively continuous throughout the period of use of the system 1300, and the data is preferably fully available for both control of the system 1300 and analysis of the samples 1500. In a preferred embodiment of the present invention, the integrated computer system 1306 monitors and records some or all of the useful data at an effectively continuous sampling rate, such as, in particular, a sampling rate of 50 Hz to 10,000 Hz, and most typically, a sampling rate of 100 Hz to 500 Hz, throughout the use of the system 1300.

[0447] Preferably, the integrated computer system 1306, and more preferably the automated control system 1308 of the integrated computer system 1306, utilizes feedback control in the operation of the system 1300. Thus, the integrated computer system 1306 preferably controls the components of the system 1300, such as, in particular, the heat source 1510, the load application system 1540, and the deflection gauge 1550, based at least in part on data monitored and recorded from some or all of the temperature of the base 1610, the voltage applied to the heat source 1510, the gas pressure of the interior space of the environmental chamber 1304, the force applied to the sample 1500 by the load application system 1540, and the deflection of the sample 1500.

[0448] The feedback control of the system 1300 allows for a variety of options for test protocol programming and alarm options. For example, the integrated computer system 1306 can receive data from the system 1300 indicating that one or more components of the system 1300, such as, in particular, one or more of the force sensor 1916, the coil 1622, the linear actuator 1902, and the position transducer 2112, are approaching one or more limits of their recommended operating parameters, such as temperature limits, position limits, force limits, or voltage limits. In such cases, the integrated computer system 1306 preferably provides a signal, such as a warning, alarm, or command, to the user and / or the components of the system 1300 to maintain the components of the system 1300 within their recommended operating parameters. For example, the integrated computer system 1306 can issue an alarm and reduce the voltage supplied to the heat source 1510, reduce the voltage supplied to the linear actuator 1902, and / or change the gas composition of the environmental chamber 1304.

[0449] The integrated computer system 1306 is preferably operative to provide appropriate warnings and changes before initiating testing of the sample 1500, during testing of the sample 1500, and / or after testing of the sample 1500. In a preferred embodiment of the present invention, a user can establish, on a test-by-test basis, an operating envelope for the system 1300, including one or more thresholds or limits for any or all operating parameters of the components of the system 1300. Thus, the system 1300 preferably includes fully customizable feedback controls and alerts.

[0450] Preferably, system 1300 is operable to be controlled based on any of a variety of control modes, including, in particular, control modes that are based partially or completely on any or all of the data collected by integrated computer system 1306. Thus, for example, load application system 1540 is operable to be controlled by integrated computer system 1306 based on any or all of the data associated with load application system 1540, including, in particular, data associated with any or all of the components of linear actuator 1902, such as the position of loading rod 1910 and the force indicated by force sensor 1916, and data associated with deflectometer 1550, including, in particular, data associated with any or all of the components of position transducer 2112, such as the voltage output by position transducer 2112, the position of displaceable rod 2110, and the position of core rod 2160. Preferably, the control mode is selected for use based on user preference.

[0451] like Figures 23A to 23E As particularly seen in FIG, in an embodiment of the present invention, the deflectometer 1550 operates to measure the linear deformation of the lower central portion of the sample 1500. As described above, prior to testing of the sample 1500, the displaceable rod 2110 is positioned such that the top surface 2124 of the conductive portion 2118 of the displaceable rod 2110 is in contact with the sample 1500. Thus, deformation of the sample 1500 preferably results in a corresponding downward displacement of the displaceable rod 2110. The downward displacement of the displaceable rod 2110, in turn, results in a downward displacement of the deflectometer transducer assembly 2130, and thus of the rod 2170 and the core rod 2160, resisting the upward push of the counterweight mechanism 21120. The downward displacement of rod 2170 changes the position of core rod 2160 within transducer body 2138, and in particular the position of working end 2162 of core rod 2160 within transducer body 2138, which results in a predictable change in the voltage output by position transducer 2112 to integrated computer system 1306.

[0452] Therefore, in an embodiment of the present invention, the integrated computer system 1306 of the system 1300 preferably uses the voltage output by the position transducer 2112 of the deflectometer 1550 to determine a downward displacement of the sample 1500 corresponding to a force of a specific value applied directly or indirectly to the sample 1500 by the load application system 1540.

[0453] In addition to or as an alternative to measuring deformation via the deflectometer 1550, the load application system 1540 is preferably operative to measure linear deformation of the upper portion of the sample 1500. As described above, prior to testing of the sample 1500, the loading rod 1910 of the load application system 1540 is preferably positioned in contact with the load application contact pin 1754 or with the sample 1500 while applying a net zero force on the load application contact pin 1754 or the sample 1500. Thereafter, the integrated computer system 1306 preferably controls the load application system 15400 to drive the loading rod 1910 to apply a series of predetermined forces directly or indirectly to the sample 1500 in the direction indicated by the arrow 2504.

[0454] As the load application system 1540 applies each force to the sample 1500, the integrated computer system 1306 preferably monitors the position of the loading rod 1910. Figure 23E As seen specifically in FIG, the position of the loading rod 1910 is directly related to the deformation of the sample 1500. As the central portion of the sample 1500 deforms in a downward direction, the position of the loading rod 1910 also moves downward in a predictable manner.

[0455] In a preferred embodiment of the present invention, the linear actuator 1902 is operative to displace the actuator connector rod 1930, and thus the loading rod 1910, in countable increments of known uniform length. The linear actuator 1902 preferably includes an encoder that operates to provide data indicating whether the linear actuator 1902 has displaced the actuator connector rod 1930 by an increment. A controller in either or both the linear actuator 1902 or the integrated computer system 1306 counts the increments reported by the encoder of the linear actuator 1902 to calculate the position of the loading rod 1910. Compression of the loading rod 1910 is optionally taken into account by the system 1300 in calculating the position of the loading rod 1910.

[0456] Therefore, in additional embodiments of the present invention, the integrated computer system 1306 of the system 1300 preferably uses the position of the loading rod 1910 to determine the downward displacement of the sample 1500 caused by a specific value of force applied directly or indirectly to the sample 1500 by the load application system 1540.

[0457] The integrated computer system 1306 of the system 1300 preferably calculates one or more material properties of the sample 1500 based on the testing of the sample 1500 by the system 1300 and outputs the one or more material properties of the sample 1500 to a user. More specifically, the integrated computer system 1306 of the system 1300 determines the material properties of the sample 1500, such as flexural modulus, flexural stress, flexural strain, flexural stress-strain relationship, Young's modulus, ultimate strength, and fracture toughness, based at least in part on the response of the sample 1500 to the force applied to the sample 1500 by the testing unit 1530 as a result of a specific value of force applied directly or indirectly to the sample 1500 by the load application system 1540. Typically, the integrated computer system 1306 of the system 1300 determines the material properties of the sample 1500 based on the deformation of the sample 1500, and more particularly, based on the downward displacement of the central portion of the sample 1500, during the testing of the sample 1500 by the system 1300.

[0458] exist Figures 23A to 23E In the steps shown in , the HTF 1520 inserted into the coil 1622 is shown as being implemented as a first HTF 1520A, and the sample 1500 undergoing the material property test is implemented as the first sample 1500A undergoing the material property test using the first test unit 1530A.

[0459] As in Figure 23A and Figure 23C in and Figure 25A As can be seen specifically at step 2510 in FIG. 25, the second sample 1500B held in the second test unit 1530B may be inserted into the second HTF 1520B before the material property test on the first sample 1500A is completed. The second sample 1500B may be inserted into the second HTF 1520B simultaneously or partially simultaneously with the heating of the first sample 1500A and / or the performance of the material property test on the first sample 1500A. Alternatively, the second sample 1500B may be inserted into the second HTF 1520B after the material property test on the first sample 1500A is completed. Therefore, it should be understood that although step 2510 is performed in FIG. Figure 25A 1500A, heating the first sample 1500A, and testing the first sample 1500A by the first testing unit 1530A, respectively, but step 2510 may be performed before, simultaneously with, or after steps 2502, 2506, and 2508.

[0460] It should be understood that inserting the second sample 1500B and the second test unit 1530B into the second HTF 1520B may involve Figures 22I to 22K Some or all of the steps shown in .

[0461] After testing the first sample 1500A, the integrated computer system 1306 preferably controls the system 1300 to return the environmental chamber 1304 and the AMPT 1302 to ambient temperature and gas mixture conditions, or conditions close to ambient temperature and gas mixture conditions. The integrated computer system 1306 preferably continues to control the conditions of the system 1300 and monitors and records most, and more preferably all, of the useful data related to the system 1300 during the period in which the environmental chamber 1304 and the AMPT 1302 return to ambient temperature and gas mixture conditions, or conditions close to ambient temperature and gas mixture conditions.

[0462] Returning the environmental chamber 1304 and the AMPT 1302 to ambient or near ambient conditions includes using natural cooling without a dedicated cooling system or using forced cooling, using a dedicated system to cool the susceptor 1610, the first test cell 1530A, and the first sample 1500A. The exemplary cooling system provides a flow of gas, such as helium or argon, to accelerate the cooling of the AMPT 1302, the first test cell 1530A, and the first sample 1500A. The temperature of the susceptor 1610 during its cooling is preferably monitored and recorded by the integrated computer system 1306 using a temperature probe (not shown), such as one or more of the optical pyrometer 1426 and thermocouples described above.

[0463] As in Figure 23F As specifically seen in FIG, upon completion of testing of the first sample 1500A and after the environmental chamber 1304 and the AMPT 1302 have returned to ambient conditions, the user preferably removes the first HTF 1520A from the AMPT 1302 and places the second HTF 1520B having the second test unit 1530B and the second sample 1500B inserted therein in the coil 1622, as shown in FIG. Figure 23C Returning the environmental chamber 1304 and the AMPT 1302 to ambient conditions preferably occurs relatively quickly, thereby allowing for timely unloading of the first sample 1500A and a quick transition to additional testing of the second sample 1500B in the second HTF 1520B, thereby increasing the throughput of the system 1300 relative to that of conventional systems.

[0464] For example, in a preferred embodiment of the present invention, the amount of time from the completion of the test of the first sample 1500A to the insertion of the second sample 1500B is less than one hour, and more preferably less than 20 minutes. In other words, the system 1300 is preferably operated to perform at least about one sample test per hour, and more preferably at least one sample test every 20 minutes, the sample test including inserting the sample 1500 into the system 1300, heating the sample 1500, testing the sample 1500, and cooling the sample 1500.

[0465] In one embodiment of the present invention, to remove the first HTF 1520A from the AMPT 1302, the user can remove the right support wall 1568 from the mounting base 1560 and can slide the first HTF 1520A away from the coil 1622. Before replacing the right support wall 1568, the user can then slide the second HTF 1520B into the coil 1622. To insert the second HTF 1520B into the coil 1622, the user can perform the steps described above with respect to Figures 22L to 22N Describe the steps.

[0466] In another embodiment of the present invention, to remove the first HTF 1520A from the AMPT 1302, the user may not need to remove the right support wall 1568 and may simply slide the first HTF 1520A off the coil 1622. This is possible because the glue adhering the thermal insulation portion 1710 to the base 1610 is burned off during the heating of the first HTF 1520A, so that after testing, the user can simply remove the thermal insulation portion 1710 and slide the base 1610 off the coil 1622. Alternatively, the user may remove only the upper portion 1572 of the right support wall 1568, while leaving the rest of the right support wall 1568 intact.

[0467] In the next step, as in Figure 23G Chuhe Figure 25A As seen at steps 2512 and 2514 in FIG. 1 , upon completion of testing of the first sample 1520A, the second HTF 1520B is preferably heated by the coil 1622 of the heat source 1510, thereby heating the second sample 1500B, and while the second sample 1500B is heated, material property testing of one or more material properties of the second sample 1500B is performed.

[0468] The various steps involved in heating and material property testing of the second sample 1500B are preferably as described above with reference to Figures 23A to 23E As shown and described.

[0469] As in Figure 23G The enlarged view V and Figure 25BAs can be seen specifically at step 2516 in FIG. 25, the third sample 1500C held in the third test unit 1530C can be inserted into the third HTF 1520, which is preferably implemented as the first HTF 1520A. The third sample 1500C can be inserted into the first HTF 1520A simultaneously or partially simultaneously with the heating of the second sample 1500B and / or the execution of the material property test on the second sample 1500B. The third sample 1500C can be inserted into the first HTF 1520A before the completion of the material property test on the second sample 1500B. Alternatively, the third sample 1500C can be inserted into the first HTF 1520A after the completion of the material property test on the second sample 1500B. Therefore, it should be understood that although step 2516 is performed in FIG. Figure 25B is shown as in Figure 25A 2512 and 2514, but step 2516 can be performed at least partially simultaneously with steps 2512 and 2514 or after steps 2512 and 2514.

[0470] Before inserting the third sample 1500C into the first HTF 1520A, the first HTF 1520A is preferably completely cooled, and the first sample 1500A and the first test unit 1530A are removed from the first HTF 1520A. The user can remove the first sample 1500A and the first test unit 1530A from the base 1610 of the first HTF 1520A by inverting the base 1610 so that the first test unit 1530A and the first sample 1500A fall out of the sample-receiving cavity 1730, or the user can use a tool to remove the first test unit 1530A and the first sample 1500A from the first HTF 1520A.

[0471] It should be understood that inserting the third sample 1500C and the third test unit 1530C into the first HTF 1520A may involve Figures 22I to 22K Some or all of the steps shown in .

[0472] As in Figure 23H As seen in FIG, upon completion of the testing of the second sample 1500B and after the environmental chamber 1304 and the AMPT 1302 have returned to ambient conditions, the user preferably removes the second HTF 1520B from the AMPT 1302 and places the first HTF 1520A, now with the third test cell 1530C and the third sample 1500C inserted therein, in the coil 1622. The steps involved in removing the second HTF 1520B from the AMPT 1302 and replacing the first HTF 1520A in the AMPT 1302 are generally the same as described above with respect to FIG. Figure 23F As stated.

[0473] In the next step, as in Figure 23I Chuhe Figure 25B As seen at steps 2518 and 2520 in FIG. 2 , upon completion of the testing of the second sample 1520B, the third HTF 1520, preferably implemented herein as the first HTF 1520A, is preferably heated by the coil 1622 of the heat source 1510, thereby heating the third sample 1500C, and while the third sample 1500C is being heated, material property testing of one or more material properties of the third sample 1500C is performed.

[0474] The various steps involved in the heating and material property testing of the third sample 1500C are preferably as described above with reference to Figures 23A to 23E As shown and described.

[0475] As in Figure 23I The enlarged image W and Figure 25B As can be seen specifically at step 2522 in FIG. 2 , the fourth sample 1500D held in the fourth test unit 1530D can be inserted into the fourth HTF 1520, which is preferably implemented as the second HTF 1520B. The fourth sample 1500D can be inserted into the second HTF 1520B simultaneously or partially simultaneously with the heating of the third sample 1500C and / or the execution of the material property test on the third sample 1500C. The fourth sample 1500D can be inserted into the second HTF 1520B before the completion of the material property test on the third sample 1500C. Alternatively, the fourth sample 1500D can be inserted into the second HTF 1520B after the completion of the material property test on the third sample 1500C. Therefore, it should be understood that although step 2522 is performed in FIG. 2 , the fourth sample 1500D can be inserted into the second HTF 1520B after the completion of the material property test on the third sample 1500C. Figure 25B 2518 and 2520 , but step 2522 may be performed at least partially concurrently with or after steps 2518 and 2520 .

[0476] Before inserting the fourth sample 1500D into the second HTF 1520B, the second HTF 1520B is preferably completely cooled, and the second sample 1500B and the second test unit 1530B are removed from the second HTF 1520B, as described above with reference to FIG. Figure 23I As stated.

[0477] It should be understood that inserting the fourth sample 1500D and the fourth test unit 1530D into the second HTF 1520B may involve Figures 22I to 22K Some or all of the steps shown in .

[0478] As in Figure 23JAs particularly seen in FIG, upon completion of the testing of the third sample 1500C and after the environmental chamber 1304 and the AMPT 1302 have returned to ambient conditions, the user preferably removes the first HTF 1520A from the AMPT 1302 and places the second HTF 1520B, now with the fourth test cell 1530D and the fourth sample 1500D inserted therein, in the coil 1622. The steps involved in removing the first HTF 1520A from the AMPT 1302 and replacing the second HTF 1520B in the AMPT 1302 are generally the same as described above with respect to FIG. Figure 23F As stated.

[0479] In the next step, as in Figure 23K Chuhe Figure 25B As seen at steps 2524 and 2526 in FIG. 2 , upon completion of the testing of the third sample 1520C, the fourth HTF 1520, preferably implemented herein as the second HTF 1520B, is preferably heated by the coil 1622 of the heat source 1510, thereby heating the fourth sample 1500D. While the fourth sample 1500D is being heated, material property testing of one or more material properties of the fourth sample 1500D is performed.

[0480] The various steps involved in the heating and material property testing of the fourth sample 1500D are preferably as described above with reference to Figures 23A to 23E As shown and described.

[0481] It should be understood that Figures 23A to 23J The above sample testing sequence shown in FIG can be continued for any desired number of samples, wherein one of the first HTF 1520A and the second HTF 1520B is used in the AMPT 1302 to heat and test the sample 1500 therein while the other of the first HTF 1520A and the second HTF 1520B is cooled and pre-filled with additional samples for subsequent testing. Figure 23K As seen at the enlarged view X in FIG. 1 , the first HTF 1520A can receive yet another additional sample, here implemented as a fifth sample 1500E in a fifth test unit 1530E, for subsequent testing, and so on.

[0482] Now turn Figure 24In an alternative embodiment of the present invention, method 2500, including steps 2502 to 2526, may be performed using first to fourth HTFs 1520A to 1520D, which are pre-filled with first to fourth samples 1500A to 1500D, respectively, held in first to fourth test cells 1530A to 1530D, respectively, outside of environmental chamber 1304. According to this embodiment of the present invention, rather than alternately employing first to second HTFs 1520A and 1520B in system 1300, a plurality of individual HTFs 1520, such as HTFs 1520A to 1520D, may be pre-filled and employed consecutively in system 1300 during a test sequence, as described above.

[0483] System 1300 is preferably operated to achieve a wide range of preferably relatively rapid cooling rates ranging from 3°C / second to greater than 300°C / second, and is operated to heat susceptor 1610, test cell 1530 and sample 1500 to a temperature of 1,000°C, more preferably to a temperature of 2,000°C, still more preferably to a temperature of 2,500°C, and even more preferably to a temperature of 4,000°C.

[0484] As described above, the relatively rapid heating and cooling rates of system 1300 are a result of the technical features of system 1300, such as, in particular, the relatively small size of the heated portion of system 1300, and more specifically, the dimensional similarity between base 1610 and sample 1500; and the presence of insulation around the heated portion of system 1300.

[0485] In addition, the components of system 1300, particularly any or all of base 1610, NMFH 1600, loading rod 1910, displaceable rod 2110, and any or all of the components of test unit 1530, are generally less expensive than components used in conventional material properties testing systems and have relatively simple removal and installation processes compared to components used in conventional material properties testing systems.

[0486] Therefore, in a preferred embodiment of the present invention, some or all of the base 1610, NMFH 1600, loading rod 1910, shiftable rod 2110 and any or all of the components of the test unit 1530 are easily replaceable, i.e., consumable and replaceable, between subsequent sample tests or several subsequent sample tests in a sample test.

[0487] Additionally, the components of system 1300, particularly any or all of base 1610, NMFH 1600, loading rod 1910, displaceable rod 2110, and any or all components of testing unit 1530, are generally more durable than components used in conventional material properties testing systems.

[0488] Additionally, the system 1300 preferably includes interchangeable parts, which reduces breakage concerns and increases setup speed.

[0489] The relatively low cost, simple removal and installation process, and high durability of the system 1300 components allow the system 1300 to undergo relatively rapid heating and cooling rates compared to components of conventional material properties testing systems.

[0490] The relatively rapid heating and cooling rates each result in relatively high thermal stresses on the components of system 1300. However, the cost and likelihood of component breakage due to high thermal stresses are each lower in system 1300 than in conventional material property testing systems. Thus, system 1300 can be subjected to relatively rapid heating and cooling rates with relatively low concern about component breakage in system 1300, compared to components of conventional material property testing systems.

[0491] A particular feature of the present invention is that the systems 100 and 1300, including all of their subcomponents, preferably comply with standards set forth by relevant organizations, such as ASTM International and ISO. Additionally, the systems 100 and 1300 preferably include applications that comply with standards set forth by relevant organizations, such as ASTM International and ISO.

[0492] Exemplary standards that the present invention preferably complies with can be found, among others, in: ASTM C1211-18R23, Standard Test Methods for Flexural Strength of Advanced Ceramics at Elevated Temperatures, February 15, 2023; ASTM C1161-18R23, Standard Test Methods for Flexural Strength of Advanced Ceramics at Ambient Temperatures, February 23, 2023; ASTM C1421-18, Standard Test Methods for Determination of Fracture Toughness of Advanced Ceramics at Ambient Temperature, January 18, 2018; ASTM B406-96R21, Standard Test Method for Transverse Rupture Strength of Cemented Carbides (Standard test method for transverse rupture strength of cemented carbides), May 10, 2021; ISO 14704:2016, Test method for flexural strength of monolithic ceramics at room temperature, April 2016; ISO 17565:2003, Test method for flexural strength of monolithic ceramics atelevated temperature, December 2003; ISO 3327:2009, Determination of transverse rupture strength of hardmetals, May 2009, the entire contents of these exemplary standards are incorporated herein by reference.

[0493] It will be understood by those skilled in the art that the present invention is not limited by the contents specifically claimed below. On the contrary, the scope of the present invention includes various combinations and sub-combinations of the features described above, as well as modifications and variations of the present invention that occur to those skilled in the art upon reading the foregoing description with reference to the accompanying drawings and that are not in the prior art.

Claims

1. A method for performing material property testing on a sample, comprising: inserting a first sample into a first high temperature furnace; heating the first high-temperature furnace by an induction heat source, thereby heating the first sample in the first high-temperature furnace; performing a material property test on the first sample while the first sample is heated; inserting the second sample into a second high temperature furnace; When the material property test on the first sample is completed, heating the second high-temperature furnace by the induction heat source, thereby heating the second sample in the second high-temperature furnace; as well as While the second sample is being heated, a material property test is performed on the second sample.

2. The method according to claim 1, further comprising: inserting the third sample into a third high-temperature furnace; When the material property test on the second sample is completed, heating the third high-temperature furnace by the induction heat source, thereby heating the third sample in the third high-temperature furnace; as well as The material property test is performed on the third sample while the third sample is heated.

3. The method according to claim 2, further comprising: inserting the fourth sample into a fourth high-temperature furnace; When the material property test on the third sample is completed, heating the fourth high-temperature furnace by the induction heat source, thereby heating the fourth sample in the fourth high-temperature furnace; as well as While the fourth sample is being heated, a material property test is performed on the fourth sample.

4. The method according to claim 3, wherein: The third high-temperature furnace includes the first high-temperature furnace, and the method further includes cooling the first high-temperature furnace before inserting the third sample into the first high-temperature furnace; and The fourth high-temperature furnace includes the second high-temperature furnace, and the method further includes cooling the second high-temperature furnace before inserting the fourth sample into the second high-temperature furnace.

5. The method according to claim 3 or claim 4, wherein: Before completing the material property test on the first sample, inserting the second sample into the second high-temperature furnace; Before completing the material property test on the second sample, inserting the third sample into the third high-temperature furnace; as well as Before completing the material property test on the third sample, inserting the fourth sample into the fourth high-temperature furnace is performed.

6. The method of any of the preceding claims, further comprising performing said inserting, said heating, and said performing material property testing on additional samples.

7. The method according to any one of the preceding claims, wherein The material property tests are performed at a throughput rate of at least about one material property test per hour.

8. A method according to any one of the preceding claims, wherein The induction heat source is capable of heating each of the samples to a temperature in a range between approximately 1500°C and 2800°C.

9. The method according to any one of the preceding claims, wherein Each of the high temperature furnaces includes a unitary base having a cavity configured to receive the sample assembled in the test unit therein.

10. The method according to claim 9, wherein: The longest dimension of the cavity is smaller than the longest dimension of the base.

11. The method according to claim 9 or claim 10, wherein: Each of the high-temperature furnaces further includes a non-metal furnace shell wrapped around an outer surface of the base, wherein the non-metal furnace shell is at least used to provide thermal insulation between the base and the induction heat source.

12. The method according to any one of the preceding claims, wherein The induction heat source includes an induction heating coil defining an interior opening, and the method further includes removably positioning each of the high-temperature furnaces in the interior opening while each of the high-temperature furnaces is heated by the induction heating coil.

13. The method according to claim 12, wherein: The longitudinal axis of the induction heating coil is oriented substantially horizontally, and each of the high-temperature furnaces is disposed substantially horizontally in the interior opening when heated by the induction heating coil.

14. The method according to claim 12 or claim 13, further comprising: applying a load to each of the samples via a load application system during the performance of the material property test; as well as The displacement of each of the samples in response to the application of the load is measured.

15. The method of claim 14, further comprising measuring the displacement of each of the samples by a deflectometer.

16. The method according to claim 15, wherein When each of the high-temperature furnaces is heated by the induction heat source, the load application system and the deflectometer extend into each of the high-temperature furnaces through the spaces between the turns of the coil.

17. The method according to claim 15 or claim 16, wherein: At least one of the load application system and the deflectometer includes a mixing rod including a first refractory portion proximate the sample and a second insulating portion distal from the sample.

18. The method of any one of claims 15 to 17, further comprising controlling the environment within the modular environmental chamber in which the material property testing is performed.

19. The method according to claim 18, wherein The modular environmental chamber includes an upper sub-chamber housing electronic circuitry for the load application system, a middle sub-chamber housing at least a portion of the inductive heat source, and a lower sub-chamber housing electronic circuitry for the deflectometer.

20. The method according to claim 18 or claim 19, wherein The middle subchamber of the modular environmental chamber includes thermal insulation to prevent heating of the load application system and the deflectometer by the induction heat source.

21. An apparatus for performing material property testing on a sample, comprising: a first high temperature furnace configured to receive a first sample held in a first test cell therein; an induction heat source operative to heat the first high temperature furnace and thereby heat the first sample in the first high temperature furnace, the first testing unit operative to perform a material property test on the first sample while the first sample is heated; as well as at least one second high temperature furnace configured to receive a second sample held in a second test cell therein, the induction heat source being operative to heat the second high temperature furnace upon completion of performing the material property test on the first sample, and thereby heating the second sample in the second high temperature furnace, The second testing unit operates to perform a material property test on the second sample while the second sample is heated.

22. The apparatus of claim 21 , further comprising: a third high temperature furnace configured to receive a third sample held in a third test cell therein; the induction heat source being operative to heat the third high temperature furnace upon completion of performing the material property test on the second sample, and thereby heating the third sample in the third high temperature furnace; The third testing unit operates to perform a material property test on the third sample while the third sample is heated.

23. The apparatus of claim 22, further comprising: a fourth high temperature furnace configured to receive a fourth sample held in a fourth test cell therein; the induction heat source being operative to heat the fourth high temperature furnace upon completion of performing the material property test on the third sample, and thereby heating the fourth sample in the fourth high temperature furnace; The fourth testing unit operates to perform a material property test on the fourth sample while the fourth sample is heated.

24. The apparatus of claim 23, wherein: The third high temperature furnace includes the first high temperature furnace, the first high temperature furnace being cooled before the third sample is received in the first high temperature furnace; and The fourth high temperature furnace includes the second high temperature furnace, and the second high temperature furnace is cooled before the fourth sample is received in the second high temperature furnace.

25. Apparatus according to claim 23 or claim 24, wherein: Before completing the material property test on the first sample, the second sample is received by the second high-temperature furnace; Before completing the material property test on the second sample, the third sample is received by the third high-temperature furnace; as well as Before completing the material property test on the third sample, the fourth sample is received by the fourth high-temperature furnace.

26. Apparatus according to any one of claims 21 to 25, further comprising additional high temperature furnaces adapted to respectively receive additional samples.

27. Apparatus according to any one of claims 21 to 26, wherein The apparatus is configured to perform the material property test at a throughput rate of at least about one material property test per hour.

28. Apparatus according to any one of claims 21 to 27, wherein The induction heat source is configured to heat each of the samples to a temperature within a range between approximately 1500°C and 2800°C.

29. The apparatus according to any one of claims 21 to 28, wherein Each of the high temperature furnaces includes a unitary base having a cavity configured to receive the sample therein.

30. The apparatus of claim 29, wherein: The longest dimension of the cavity is smaller than the longest dimension of the base.

31. Apparatus according to claim 29 or claim 30, wherein Each of the high-temperature furnaces further includes a non-metal furnace shell wrapped around an outer surface of the base, wherein the non-metal furnace shell is at least used to provide thermal insulation between the base and the induction heat source.

32. Apparatus according to any one of claims 21 to 31, wherein The induction heat source includes an induction heating coil defining an inner opening, and each of the high-temperature furnaces is removably disposed in the inner opening when heated by the induction heating coil.

33. The apparatus of claim 32, wherein: The longitudinal axis of the induction heating coil is oriented substantially horizontally, and each of the high-temperature furnaces is disposed substantially horizontally in the interior opening when heated by the induction heating coil.

34. The apparatus of claim 32 or claim 33, further comprising: A load applying unit is operative to apply a load to each of the samples during performance of the material property test.

35. The apparatus of claim 34, further comprising a deflectometer operative to measure the displacement of each of the samples in response to the applied load.

36. The apparatus of claim 35, wherein When each of the high-temperature furnaces is heated by the induction heat source, the load applying unit and the deflectometer extend into each of the high-temperature furnaces through spaces between turns of the coil.

37. Apparatus according to claim 35 or claim 36, wherein At least one of the load application system and the deflectometer includes a mixing rod including a first refractory portion proximate the sample and a second insulating portion distal from the sample.

38. A system for performing material property testing on a sample, comprising a modular environmental chamber housing an apparatus according to any one of claims 35 to 37.

39. The system of claim 38, wherein: The modular environmental chamber includes an upper sub-chamber housing electronic circuitry of the load application unit, a middle sub-chamber housing at least a portion of the inductive heat source, and a lower sub-chamber housing electronic circuitry of the deflectometer.

40. A system according to claim 38 or claim 39, wherein The middle subchamber of the modular environmental chamber includes thermal insulation to prevent heating of the load application unit and the deflectometer by the induction heat source.

41. An apparatus for performing material property testing on a sample, comprising: At least one high temperature furnace, the at least one high temperature furnace comprising: a furnace shell; and a base enclosed by the furnace housing, the base adapted to receive a sample held in a test cell therein; and a heat source comprising a generally horizontally oriented heating coil defining an interior opening, the heat source operative to heat the susceptor, and thereby heat the sample in the susceptor, while the susceptor is disposed generally horizontally in the interior opening, The testing unit operates to perform a material property test on the sample while the sample is heated.

42. The apparatus of claim 41, wherein The heat source is configured to heat the sample to a temperature in a range between about 1500° C. and 2800° C., and the apparatus is operative to perform the material property test at a throughput rate of at least about one material property test per hour.

43. Apparatus according to claim 41 or claim 42, wherein The base includes a cavity adapted to receive the sample held in the test unit therein.

44. The apparatus of claim 43, wherein The cavity is a longitudinal cavity, and the length of the longitudinal cavity is smaller than the length of the base.

45. Apparatus according to any one of claims 41 to 44, wherein The furnace shell includes a replaceable non-metallic furnace shell.

46. ​​The apparatus of any one of claims 41 to 45, further comprising: A load applying unit is operative to apply a force to the sample during the material property testing.

47. The apparatus of claim 46, further comprising a deflectometer operative to measure displacement of the sample during the material property testing.

48. The apparatus of claim 47, wherein At least one of the load application unit and the deflectometer includes a mixing rod including a first refractory portion positioned proximate the sample during the testing and a second insulating portion positioned distal from the sample during the testing.

49. Apparatus according to any one of claims 41 to 48, wherein The at least one high temperature furnace includes a plurality of the high temperature furnaces, and at least another one of the plurality of the high temperature furnaces is heated by the heat source at least partially simultaneously with inserting the sample held in the test unit into at least one of the plurality of high temperature furnaces.

50. A system for performing material property testing on a sample, comprising a modular environmental chamber housing an apparatus according to any one of claims 41 to 49.

51. A method for performing material property testing on a sample, comprising: providing a heat source comprising a generally horizontally oriented heating coil defining an interior opening; At least one high temperature furnace is disposed in the interior opening in a generally horizontal orientation, the at least one high temperature furnace comprising: a furnace shell; and a base enclosed by the furnace housing, the base adapted to receive a sample held in a test cell therein; heating the susceptor by the heat source while the susceptor is disposed in the interior opening, thereby heating the sample in the susceptor; and While the sample is being heated, a material property test is performed on the sample using the testing unit.

52. The method of claim 51, wherein The base includes a cavity for receiving the sample held in the test unit therein.

53. The method of claim 51 or claim 52, wherein: The entire sample is received within the cavity of the base.

54. The method according to any one of claims 51 to 53, wherein The cavity is a longitudinal cavity, and the length of the longitudinal cavity is smaller than the length of the base.

55. The method according to any one of claims 51 to 54, wherein Heating the sample includes heating the sample to a temperature within a range between approximately 1500° C. and 2800° C., and performing the material property test includes performing the material property test at a throughput rate of at least approximately one test per hour.

56. The method according to any one of claims 51 to 55, wherein The furnace shell is non-metallic, and the method further includes replacing the non-metallic furnace shell after the material property testing of the sample and before performing additional material property testing on additional samples.

57. The method according to any one of claims 51 to 56, further comprising: applying a force to the sample during the material property test; as well as The displacement of the sample during the material property testing is measured.

58. The method of claim 57, further comprising applying the force to the sample by a load application system and measuring the displacement of the sample by a deflectometer, wherein At least one of the load application system and the deflectometer includes a mixing rod including a first refractory portion positioned proximate the sample during the testing and a second insulating portion positioned distal from the sample during the testing.

59. The method according to any one of claims 51 to 58, wherein The at least one high temperature furnace includes a plurality of the high temperature furnaces, and the method includes heating at least another high temperature furnace of the plurality of the high temperature furnaces by the heat source at least partially simultaneously with inserting the sample held in the test unit into at least one of the plurality of high temperature furnaces.

60. The method of any one of claims 51 to 59, further comprising housing the heating coil in a modular environmental chamber.

61. An apparatus for performing material properties testing (AMPT) on a sample, comprising: A high-temperature furnace, comprising: a non-metallic furnace housing formed from at least two sections that in combination define a space; and a susceptor disposed at least partially in the space, the susceptor operative to heat the sample; a heat source operative to heat the susceptor while the susceptor is at least partially disposed in the space; and A testing unit is at least partially enclosed in the base, and is used to perform the material property test on the sample.

62. An apparatus for performing material properties testing (AMPT) on a sample, comprising: A high-temperature furnace, comprising: a non-metallic furnace shell formed from at least two sections that in combination define a space; and a susceptor disposed at least partially in the space, the susceptor operative to heat the sample; a heat source operative to heat the susceptor while the susceptor is at least partially disposed in the space; and a testing unit, the testing unit being at least partially enclosed within the base, the testing unit being configured to perform the material property test on the sample, The apparatus for performing material property testing on a sample is capable of heating the sample to a temperature in a range between approximately 1500° C. and 2800° C. and performing the testing at a throughput rate of at least approximately one test per hour.

63. Apparatus for performing material property testing on a sample according to claim 61 or claim 62, wherein: At least one of the at least two sections of the furnace shell includes a plurality of layers.

64. The apparatus for performing material property testing on a sample according to claim 63, wherein: The multiple layers include: at least one layer formed from at least one of zirconium oxide, hafnium dioxide, at least one high temperature carbide, and thoria; The at least one layer is interleaved with at least one additional layer formed from at least one of graphite paper, alumina felt, and a ceramic material.

65. The apparatus for performing material property testing on a sample according to claim 62, wherein: At least one of the furnace housing and the base is readily replaceable between subsequent ones of the at least one test.

66. Apparatus for performing material property testing on a sample according to any one of claims 61 to 65, wherein: The heat source is an induction heat source.

67. Apparatus for performing material property testing on a sample according to any one of claims 61 to 66, wherein: The base comprises at least two parts which in combination form an enclosure adapted to enclose the test unit therein.

68. Apparatus for performing material property testing on a sample according to any one of claims 61 to 67, wherein: The susceptor includes one of graphite and silicon carbide.

69. Apparatus for performing material property testing on a sample according to any one of claims 61 to 68, wherein: The test unit includes one of a three-point bending test unit, a four-point bending test unit, and a fracture toughness test unit.

70. Apparatus for performing material property testing on a sample according to any one of claims 61 to 69, further comprising a low torque load cell operative to control application of a test load to the sample.

71. An apparatus for performing material property testing on a sample (AMPT), the apparatus for performing material property testing on a sample comprising: A high-temperature furnace, comprising: a non-metallic furnace housing formed from at least two sections that in combination define a space; and a base at least partially disposed in the space, the base operative to heat the sample and comprising at least two portions that, in combination, form an enclosure adapted to retain a test unit therein, the test unit operative to perform the material property test on the sample while the sample is heated by the base; and A heat source is operative to heat the susceptor while the susceptor is at least partially disposed in the space.

72. An apparatus for performing material property testing on a sample (AMPT), the apparatus for performing material property testing on a sample comprising: A high-temperature furnace, comprising: a furnace shell defining a space; and a base at least partially disposed in the space, the base operative to heat the sample and comprising at least two portions that, in combination, form an enclosure adapted to retain a test unit therein, the test unit operative to perform the material property test on the sample while the sample is heated by the base; and a heat source operative to heat the susceptor while the susceptor is at least partially disposed in the space, The apparatus for performing material property testing on a sample is capable of heating the sample to a temperature in a range between approximately 1500° C. and 2800° C. and performing the testing at a throughput rate of at least approximately one test per hour.

73. Apparatus for performing material property testing on a sample according to claim 71 or claim 72, wherein: The furnace shell is formed of at least two sections that in combination define the space.

74. The apparatus for performing material property testing on a sample according to claim 73, wherein: At least one of the at least two sections of the furnace shell includes a plurality of layers.

75. The apparatus for performing material property testing on a sample according to claim 74, wherein: The multiple layers include: at least one layer formed from at least one of zirconium oxide, hafnium dioxide, at least one high temperature carbide, and thoria; The at least one layer is interleaved with at least one additional layer formed from at least one of graphite paper, alumina felt, and a ceramic material.

76. The apparatus for performing material property testing on a sample according to claim 72, wherein: At least one of the furnace housing and the base is readily replaceable between subsequent ones of the at least one test.

77. Apparatus for performing material property testing on a sample according to any one of claims 71 to 76, wherein: The heat source is an induction heat source.

78. Apparatus for performing material property testing on a sample according to any one of claims 71 to 77, wherein: The susceptor includes one of graphite and silicon carbide.

79. Apparatus for performing material property testing on a sample according to any one of claims 71 to 78, wherein: The test unit includes one of a three-point bending test unit, a four-point bending test unit, and a fracture toughness test unit.

80. Apparatus for performing material property testing on a sample according to any one of claims 71 to 79, further comprising a low torque load cell operative to control application of a test load to the sample.

81. A method for performing material property testing on a sample, comprising: at least partially enclosing the sample and test unit within a base of a high temperature furnace; disposing the base at least partially within a space defined by at least two sections of a non-metallic furnace shell of the high-temperature furnace; placing the high temperature furnace at least partially within a heat source; Thereafter, heating the susceptor using the heat source, thereby heating the sample; as well as Thereafter, material property testing is performed on the sample using the testing unit.

82. The method of claim 81 , wherein: The at least partially positioning the base within the space defined by the at least two sections of the non-metallic furnace shell precedes the at least partially positioning the high temperature furnace within the heat source.

83. The method of claim 81 , wherein: Positioning the high temperature furnace at least partially within the heat source precedes positioning the base at least partially within the space defined by the at least two sections of the non-metallic furnace shell.

84. The method according to any one of claims 81 to 83, wherein The at least two sections of the non-metallic furnace shell include a plurality of layers.

85. The method according to any one of claims 81 to 84, wherein The heating the susceptor includes heating the susceptor using induction.

86. The method of any one of claims 81 to 85, wherein The heating the sample includes heating the sample to a temperature in a range between approximately 1500°C and 2800°C.

87. The method according to any one of claims 81 to 86, wherein The performing of material property tests on the sample includes any one of the following: Three-point bending test; Four-point bending test; Three-point fracture toughness testing; and Four-point fracture toughness test.

88. The method according to any one of claims 81 to 87, wherein The performing a material property test on the sample includes applying a test load to the sample using a low torque load cell.

89. The method according to any one of claims 81 to 88, wherein At least one of the furnace housing and the base is readily replaceable between subsequent ones of the at least one test.

90. The method of any one of claims 81 to 89, wherein: The material property testing of the sample is performed in an environmental chamber; and The at least partially enclosing the sample and the test unit within the base occurs outside of the environmental chamber.

91. The method of claim 90, wherein Disposing the susceptor at least partially within a space defined by at least two sections of the non-metallic furnace shell of the high temperature furnace occurs outside of the environmental chamber.

92. The method of any one of claims 81 to 91, wherein: The method is characterized by a throughput rate of at least about one test per hour.

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