Test device and circuit board production line

Abstract

The application belongs to the field of circuit board testing, and particularly relates to a testing device and a circuit board production line. The testing device is provided with a feeding station and a testing station located above the feeding station. The testing device comprises a conveying structure for conveying materials, a driving structure for driving the conveying structure to reciprocate between the feeding station and the testing station, and a testing structure provided in the testing station. The testing structure comprises a box body with a containing cavity, a carrier slidingly connected to the box body and used for carrying materials, and a testing assembly provided in the containing cavity. The box body is provided with an opening communicating with the containing cavity, and the carrier enters and exits the containing cavity through the opening. The conveying structure receives materials at the feeding station and moves the materials to the testing station. The carrier receives the materials from the conveying structure and transfers the materials into the containing cavity, and the testing assembly detects the materials. The application can improve the accuracy of testing and reduce the occupied space of the testing device.

Description

Technical Field

[0001] This invention belongs to the field of circuit board testing, and particularly relates to testing equipment and circuit board production lines. Background Technology

[0002] In the electronics manufacturing industry, circuit boards are a core component, and their performance and reliability directly determine the quality of the final product. Therefore, multiple performance tests must be performed on circuit boards during the production process. When testing circuit boards, the testing line typically adopts a multi-station parallel operation mode to improve testing efficiency.

[0003] Common circuit board testing methods include bed-of-needle testing, flying probe testing, and functional testing. These methods typically require fixing the circuit board in a test fixture and connecting it to the test equipment via probes or connectors. However, existing test equipment often has the following limitations in the loading and testing processes: insufficient control of the testing environment; circuit board testing is sensitive to temperature, humidity, and electromagnetic interference, but existing open test stations lack effective environmental isolation measures; existing loading and testing processes all use multiple single-function mechanisms arranged sequentially along a long, narrow production line to perform a series of operations such as loading, testing, and unloading circuit boards, resulting in a large number of mechanisms, difficult installation and maintenance, and a significant space requirement, which is not conducive to the optimized layout of the production line and has low automation and integration. Summary of the Invention

[0004] The purpose of this application is to provide a testing device and a circuit board production line, which aims to solve the problems of how to improve the accuracy of testing and how to reduce the space occupied by the testing device.

[0005] To achieve the above objectives, the technical solution adopted in this application is as follows:

[0006] In a first aspect, a testing apparatus is provided, comprising a loading station and a testing station located above the loading station. The testing apparatus includes a conveying structure for conveying materials, a driving structure for driving the conveying structure, and a testing structure located at the testing station. The driving structure drives the conveying structure to reciprocate between the loading station and the testing station. The testing structure includes a housing with a cavity, a carrier slidably connected to the housing and used to carry the materials, and a testing component located within the cavity. The housing has an opening communicating with the cavity, and the carrier enters and exits the cavity through the opening. The conveying structure receives the materials at the loading station and moves the materials to the testing station. The carrier receives the materials on the conveying structure and conveys the materials into the cavity. The testing component detects the materials.

[0007] In some embodiments, the conveying structure has a transfer zone, and the carrier has a clearance groove for the conveying structure to pass through. When the carrier slides to the outside of the housing, the transfer zone corresponds to the carrier. The drive structure drives the conveying structure to rise and at least partially pass through the carrier, so that the conveying surface of the transfer zone is above the carrier. The material on the conveying structure is conveyed to the transfer zone. The drive structure drives the conveying structure to descend, so that the material in the transfer zone is released from the carrier.

[0008] In some embodiments, the conveying structure includes a first conveying line and a second conveying line arranged sequentially along a first direction, the material transfer area is located on the second conveying line, the first conveying line is used to receive the material from the loading station, the second conveying line is used to receive the material from the first conveying line, and the first conveying line and the carrier are offset from each other in the vertical direction.

[0009] In some embodiments, the conveying structure further includes a third conveying line disposed on the side of the second conveying line opposite to the first conveying line, the third conveying line being vertically offset from the carrier; the carrier drives the material that has completed the test to move to the outside of the box, the driving structure drives the conveying structure to rise, so that the second conveying line passes through the clearance groove and lifts the material to detach from the carrier, the second conveying line conveys the material to the third conveying line, the third conveying line being used to unload the material.

[0010] In some embodiments, the testing device further includes a frame, the conveying structure is slidably disposed on the frame in a vertical direction, the testing device further includes a material unloading station, the material unloading station and the material loading station are disposed on opposite sides of the frame along the first direction; the driving structure is further used to drive the conveying structure to move to the material unloading station, and the third conveyor line unloads the material at the material unloading station.

[0011] In some embodiments, the second conveyor line has a plurality of material transfer zones arranged at intervals along the first direction, the second conveyor line being used to drive the material to move to any of the material transfer zones, and a plurality of test structures arranged at intervals along the first direction, each of the material transfer zones corresponding one-to-one with each of the test structures in the vertical direction.

[0012] In some embodiments, multiple test stations are arranged at intervals along the vertical direction, multiple test structures are provided, each test structure is respectively located at each of the test stations, and the driving structure is used to drive the conveying structure to move to any of the test stations.

[0013] In some embodiments, the conveying structure includes a support plate slidably disposed in a vertical direction, a first line body disposed on the support plate, and a second line body disposed on the support plate and spaced apart from the first line body in a second direction. The first line body and the second line body both extend in a first direction, and the first line body and the second line body are respectively used to support the opposite ends of the material. The second direction is at an angle to the first direction.

[0014] In some embodiments, the conveying structure further includes a first frame connected to the support plate and a second frame connected to the support plate and spaced apart from the first frame along the second direction. The first frame and the second frame are respectively used to support the first line and the second line. The second frame is slidably disposed relative to the first frame along the second direction to adjust the distance between the first line and the second line.

[0015] Secondly, a circuit board production line is provided, which includes the testing apparatus described above.

[0016] The beneficial effects of this application are as follows: When the testing device of this application is in use, the drive structure drives the conveying structure to move to the feeding station to receive the material, and after the conveying structure receives the material, it drives the conveying structure to move to the testing station. The carrier slides to the outside of the accommodating cavity and receives the material at the conveying structure, and then conveys the material into the accommodating cavity. The testing components in the accommodating cavity test the material. The accommodating cavity provides a stable and isolated testing environment for the material, effectively shielding external electromagnetic interference, reducing the impact of temperature and humidity fluctuations on the test results, and improving the accuracy of the test. Furthermore, by arranging the feeding station and the testing station in the vertical space, the testing device is compactly installed in the vertical space, reducing the space occupied by the feeding device. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or exemplary technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of a testing device provided in one embodiment of this application;

[0019] Figure 2 This is a schematic diagram of the test structure provided in one embodiment of this application;

[0020] Figure 3 This is a partial structural schematic diagram of the testing device provided in the embodiments of this application;

[0021] Figure 4 This is a schematic diagram of the conveying structure provided in the embodiments of this application;

[0022] Figure 5 This is a schematic diagram of the structure of a testing device provided in another embodiment of this application;

[0023] Figure 6 This is a schematic diagram of the test structure provided in another embodiment of this application.

[0024] The following are the labeling elements in the figure:

[0025] 10. Frame; 11. Base plate; 12. Guide structure; 121. Guide column; 122. Bearing; 20. Drive structure; 21. Lifting drive component; 22. Drive wheel; 23. Driven wheel; 24. Synchronous belt; 25. Drive shaft; 26. Coupling; 30. Conveying structure; 310. First conveyor line; 320. Second conveyor line; 321. Transfer area; 330. Third conveyor line; 31. First conveyor line; 32. Second conveyor line; 33. Support plate; 34. First frame; 35. Second frame; 361, driver; 362, lead screw; 363, nut seat; 37, slide rail; 38, mounting bracket; 40, test structure; 41, housing; 411, accommodating cavity; 412, opening; 42, carrier; 421, clearance groove; 422, sliding frame; 423, carrier plate; 43, test assembly; 431, probe plate; 432, lifting mechanism; 50, barcode scanning structure; 200, material; 300, loading station; 400, unloading station; 500, test station. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to represent selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0027] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0028] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0029] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0030] Please see Figures 1 to 6 This application provides a testing device, which includes a loading station 300 and a testing station 500 located above the loading station 300. The testing device includes a conveying structure 30 for conveying material 200, a driving structure 20 for driving the conveying structure 30, and a testing structure 40 located at the testing station 500. The driving structure 20 drives the conveying structure 30 to reciprocate between the loading station 300 and the testing station 500. The testing structure 40 includes a housing 41 with a receiving cavity 411 and a slidably connected to... The housing 41 is used to carry the material 200, the carrier 42 and the test component 43 are located in the accommodating cavity 411. The housing 41 has an opening 412 that communicates with the accommodating cavity 411. The carrier 42 enters and exits the accommodating cavity 411 through the opening 412. The conveying structure 30 receives the material 200 at the loading station 300 and moves the material 200 to the testing station 500. The carrier 42 receives the material 200 at the conveying structure 30 and conveys the material 200 into the accommodating cavity 411. The test component 43 tests the material 200.

[0031] It should be noted that the material 200 provided in this embodiment is a circuit board, and the conveying structure 30 is slidably arranged in the vertical direction. The carrier 42 is slidably connected to the housing 41. Optionally, the sliding direction of the carrier 42 is horizontal, that is, the sliding direction of the carrier 42 is perpendicular to the moving direction of the conveying structure 30. It can be understood that the linear movements in the two directions are independent of each other. The vertical movement is responsible for the height switching of different workstations, and the horizontal sliding is responsible for the carrier 42 entering and exiting the test housing 41. The two directions are orthogonal, making full use of three-dimensional space, reducing mechanical interference, and making the overall structure of the equipment more compact and occupying less space, which is especially suitable for deployment in production lines with limited space.

[0032] In this embodiment of the application, the loading station 300 is used to load the material 200 to be tested onto the conveying structure 30. The loading station 300 can be connected to a transfer trolley or a robot, etc. After the material 200 is loaded onto the conveying structure 30, it can move along the conveying direction of the conveying structure 30 and can move to any position on the conveying structure 30.

[0033] In use, the testing device of this application drives the conveying structure 30 to move to the loading station 300 to receive the material 200. After receiving the material, the conveying structure 30 is driven to move to the testing station 500. The carrier 42 slides to the outside of the accommodating cavity 411 and receives the material 200 at the conveying structure 30, and then conveys the material 200 into the accommodating cavity 411. The testing component 43 in the accommodating cavity 411 tests the material 200. The accommodating cavity 411 provides a stable and isolated testing environment for the material 200, effectively shielding external electromagnetic interference, reducing the impact of temperature and humidity fluctuations on the test results, and improving the accuracy of the test. Furthermore, by arranging the loading station 300 and the testing station 500 in the vertical space, the testing device is compactly installed in the vertical space, reducing the space occupied by the feeding device.

[0034] Understandably, the embodiments of this application also include a control system (not shown in the figure). The conveying structure 30, the driving structure 20 and the testing structure 40 are all communicatively connected to the control system. The control system can control the automatic coordination and operation of the conveying structure 30, the driving structure 20 and the testing structure 40. The entire process is greatly automated through the automatic coordination and operation of the conveying structure 30, the driving structure 20 and the testing structure 40, etc., reducing manual operation and greatly improving the efficiency of feeding and testing.

[0035] In some embodiments, such as Figure 2 and Figure 6As shown, the test assembly 43 includes a probe plate 431 and a lifting mechanism 432. The probe plate 431 is always located above the carrier 42. The carrier 42 includes a sliding frame 422 slidably connected to the housing 41 and a carrier plate 423 placed on the top surface of the sliding frame 422. The sliding frame 422 supports the carrier plate 423, which is used to carry the material 200. The lifting mechanism 432 is located below the probe plate 431. The probe plate 431 has test probes on the side facing the lifting mechanism 432. The sliding frame 422 can drive the carrier plate 423 to slide between the probe plate 431 and the lifting mechanism 432. The sliding frame 422 has a hollow structure in the middle. The lifting mechanism 432 can pass through the hollow structure to contact the carrier plate 423 and lift the carrier plate 423, so that the material 200 can move toward the probe plate 431 and connect with the test probes on the probe plate 431, thereby detecting the material 200. Optionally, the lifting mechanism 432 is a lifting cylinder.

[0036] In this embodiment, the integrated conveying structure 30, driving structure 20, and testing structure 40 achieve full automation of the circuit board process from loading, conveying, to testing. The driving structure 20 precisely controls the lifting and lowering of the conveying structure 30, enabling the circuit board to quickly move back and forth between the loading station 300 and the testing station 500 without manual intervention. This shortens the single testing cycle and is particularly suitable for high-volume continuous production scenarios.

[0037] In some embodiments, such as Figures 1 to 3 As shown, the conveying structure 30 has a transfer area 321, and the carrier 42 has a clearance groove 421 for the conveying structure 30 to pass through. When the carrier 42 slides to the outside of the housing 41, the transfer area 321 corresponds to the carrier 42. The drive structure 20 drives the conveying structure 30 to rise and at least partially pass through the carrier 42, so that the conveying surface of the transfer area 321 is above the carrier 42. The material 200 on the conveying structure 30 is conveyed to the transfer area 321. The drive structure 20 drives the conveying structure 30 to fall, so that the material 200 in the transfer area 321 is released into the carrier 42.

[0038] Understandably, the conveyor structure 30 can be a belt conveyor or a roller conveyor, having both a transfer area 321 and other areas separate from the transfer area 321. These other areas can be used by an external structure to load material 200 onto the conveyor structure 30, or to unload material 200 onto an external structure. These other areas of the conveyor structure 30 do not correspond to the carrier 42. When the carrier 42 is located outside the housing 41, since the transfer area 321 corresponds to the carrier 42 in the vertical direction, when the drive structure 20 drives the conveyor structure 30 upward, the conveyor structure 30 at least partially passes through the carrier 42, thereby placing the conveying surface of the transfer area 321 above the carrier 42. In other words, the conveying surface of the transfer area 321 is above the bearing surface of the carrier 42. At this time, the conveying of material 200 on the conveying structure 30 can proceed normally. Material 200 in other areas of the conveying structure 30 can be transferred to the transfer area 321. The conveying surface of the transfer area 321 is located above the carrier 42. Therefore, when the driving structure 20 drives the conveying structure 30 to descend, the conveying structure 30 passes through the clearance groove 421 again. However, the material 200 will not pass through the clearance groove 421 due to its own size limitation. Instead, it will be supported by the bearing surface of the carrier 42, thereby releasing the material 200 onto the carrier 42.

[0039] In this embodiment, the material transfer area 321 of the conveying structure 30 and the clearance groove 421 on the carrier 42 cooperate to realize the automated transfer process of material 200 from the conveying structure 30 to the carrier 42 without direct contact. Finally, it is smoothly released onto the carrier 42. There is no risk of mechanical arm grabbing, pushing or dropping during the whole process, which effectively prevents scratches on the surface of the precision circuit board or collision damage to the components. In addition, the clearance groove 421 provides a precise guiding space for the rise of the conveying structure 30, ensuring that the conveying surface of the material transfer area 321 can accurately pass through the carrier 42 and rise to the predetermined height, so that the relative position of material 200 and carrier 42 remains consistent, eliminating secondary positioning errors. The high-precision release position ensures that the circuit board is placed in the same position on the carrier 42 every time. This is crucial for the accurate docking of test probes or interfaces, and directly improves the reliability and repeatability of the test. In addition, the embodiments of this application do not require additional transfer mechanisms or manual intervention, which significantly shortens the single loading time. The material 200 is transferred using vertical space, avoiding the need to add transfer mechanisms in the horizontal direction, making the equipment layout more compact and reducing the footprint of the entire testing device.

[0040] In some embodiments, the conveying structure 30 includes a first conveyor line 310 and a second conveyor line 320 arranged sequentially along a first direction. A material transfer area 321 is disposed on the second conveyor line 320. The first conveyor line 310 is used to receive material 200 from the loading station 300, and the second conveyor line 320 is used to receive material 200 from the first conveyor line 310. The first conveyor line 310 and the carrier 42 are vertically offset from each other. Understandably, the first conveyor line 310 and the second conveyor line 320 are connected, but there is a clearance space between the first conveyor line 310 and the second conveyor line 320. This clearance space allows the carrier 42 to be avoided when the second conveyor line 320 passes through the clearance groove 421, thereby avoiding interference with the carrier 42, such as collision with the carrier 42, and improving the reliability and safety of equipment operation.

[0041] By setting up a first conveyor line 310 and a second conveyor line 320, a more refined division of functions and space utilization are achieved. The first conveyor line 310 is responsible for continuously receiving materials 200 from the loading station 300, while the second conveyor line 320 is responsible for precise handover at the testing station 500, which facilitates local maintenance and quick replacement, reduces downtime of the whole machine, and improves the maintainability and availability of the equipment.

[0042] In some embodiments, such as Figures 1 to 3 As shown, the conveying structure 30 also includes a third conveying line 330 located on the side of the second conveying line 320 opposite to the first conveying line 310. The third conveying line 330 and the carrier 42 are vertically offset from each other. The carrier 42 drives the tested material 200 to move to the outside of the housing 41. The driving structure 20 drives the conveying structure 30 to rise, so that the second conveying line 320 passes through the clearance groove 421 and lifts the material 200 to detach from the carrier 42. The second conveying line 320 conveys the material 200 to the third conveying line 330, which is used to unload the material 200. It can be understood that the first conveying line 310, the second conveying line 320, and the third conveying line 330 are connected sequentially. However, there is also a clearance space between the third conveying line 330 and the second conveying line 320. This clearance space allows the carrier 42 to pass through the clearance groove 421, improving the reliability and safety of the equipment operation.

[0043] In this embodiment, material 200 is fed from the first conveyor line 310, transferred and tested via the second conveyor line 320, and finally unloaded via the third conveyor line 330. The entire process requires no manual intervention, achieving fully automated operation, greatly reducing labor costs and avoiding human error. Furthermore, the presence of the third conveyor line 330 ensures the unidirectional and continuous flow of material 200. Tested material 200 is immediately removed, freeing up space for the carrier 42 to quickly return to the housing 41 for the next test, ensuring a tight and smooth production rhythm and avoiding production interruptions caused by material unloading blockages.

[0044] In this embodiment, after the material 200 has been tested, the carrier 42 moves to the outside of the receiving cavity 411 through the opening 412. At this time, the carrier 42 carries the tested material 200, and the material 200 is directly above the second conveyor line 320. Then, the drive structure 20 drives the conveyor structure 30 to rise, and the second conveyor line 320 passes through the clearance groove 421, and lifts the material 200, causing the material 200 to detach from the bearing surface of the carrier 42, thereby transferring the material 200 from the carrier 42 to the second conveyor line 320. By lifting the material 200 off the carrier 42 through the rising second conveyor line 320, and then conveying it to the third conveyor line 330, this non-contact, gripping-free transfer method provides optimal protection for the finished circuit boards that have completed testing, especially qualified products, completely avoiding scratches, drops, or stress damage that may be caused by the robotic gripping or pushing mechanism.

[0045] In addition, the third conveyor line 330 and the first conveyor line 310 are located on both sides of the second conveyor line 320, and are vertically offset from the carrier 42, forming a symmetrical and compact layout. The material 200 enters from one side and exits from the other side, with a clear and direct flow path, avoiding complex turning or reversing mechanisms, reducing the equipment footprint, and making the overall motion logic simpler and more reliable.

[0046] It should be noted that when material 200 is being tested, the conveying structure 30 can first move to the loading station 300, and the first conveyor line 310 loads the material, that is, the first conveyor line 310 has the material 200 to be tested on it. After the material 200 is tested, the carrier 42 moves to the outside of the receiving cavity 411 through the opening 412. When the second conveyor line 320 passes through the clearance groove 421 and lifts the material 200 off the bearing surface of the carrier 42, the first conveyor line 310 and the third conveyor line 330 are also above the carrier 42. After the second conveyor line 320 transfers the tested material 200 to the third conveyor line 330, the first conveyor line 310 can immediately transfer another material 200 to be tested above it to the second conveyor line 320. Then the drive structure 20 drives the first conveyor line 310, the second conveyor line 320 and the third conveyor line 330 to descend, so that the material 200 on the second conveyor line 320 falls onto the carrier 42. Therefore, in one lifting stroke of the conveying structure 30, the unloading of the tested material 200 is completed, and the loading of the next material 200 to be tested is also completed, further improving the testing efficiency.

[0047] Specifically, the first conveyor line 310, the second conveyor line 320, and the third conveyor line 330 in the embodiments of this application can all be belt transmission structures. The belt transmission structure consists of a driving pulley structure, a driven pulley structure, and an annular belt tensioned on the two pulleys. Due to the tension, a clamping force is generated at the contact part between the belt and the pulley. When the driving pulley structure is running, it drives the belt by friction, and the belt drives the driven pulley structure to run. Because the belt drive works by friction, it can effectively mitigate the impact of the load, and the operation is smooth and noiseless.

[0048] In some embodiments, such as Figure 3 and Figure 4 As shown, the feeding device also includes a barcode scanning structure 50 located on the first conveyor line 310. The barcode scanning structure 50 is used to scan the material 200 located on the first conveyor line 310 to read the information of the material 200. Understandably, the material 200 may have identification codes such as one-dimensional codes, barcodes, and serial numbers to reflect relevant information about the material 200. The barcode scanning structure 50 is used to scan and identify these identification codes to obtain information about the material 200, facilitating subsequent testing of the material 200. Optionally, a mounting bracket 38 is provided on the support plate 33, and the barcode scanning structure 50 is mounted on the mounting bracket 38, thereby stabilizing the state of the barcode scanning structure 50. Optionally, the barcode scanning structure 50 is a barcode scanner.

[0049] In some embodiments, the testing device further includes a frame 10, a conveying structure 30 is slidably disposed on the frame 10 in a vertical direction, and the testing device further includes a feeding station 400, which is disposed on opposite sides of the frame 10 in a first direction; the driving structure 20 is also used to drive the conveying structure 30 to move to the feeding station 400, and the third conveying line 330 feeds material 200 at the feeding station 400. The frame 10 is provided with a loading station 300 and a unloading station 400 on opposite sides along the first direction. During the vertical sliding process, the conveying structure 30 is always located between the loading station 300 and the unloading station 400. The material 200 enters from one side of the frame 10 and leaves from the opposite side, forming a continuous, unidirectional, and non-intersecting linear flow of material 200. This streamlined design avoids the material 200 from turning around, changing direction, or waiting in the equipment, which greatly optimizes the production cycle and eliminates process bottlenecks. Furthermore, when the third conveyor line 330 performs unloading operation at the unloading station 400, the first conveyor line 310 can simultaneously perform loading operation at the loading station 300. This parallel mode makes the loading and unloading time highly overlap with the testing time, further reducing the production cycle.

[0050] In some embodiments, such as Figure 3 and Figure 5 As shown, the second conveyor line 320 has multiple transfer zones 321 spaced apart along a first direction. The second conveyor line 320 is used to drive the material 200 to move to any transfer zone 321. Multiple test structures 40 are spaced apart along the first direction, and each transfer zone 321 corresponds one-to-one with each test structure 40 in the vertical direction. By setting multiple test structures 40, the spatial layout inside the test station 500 can be optimized, the test density can be increased, and integration in the production line can be facilitated. Furthermore, each test structure 40 has a corresponding transfer zone 321, which can effectively reduce positioning errors and improve test accuracy.

[0051] In some embodiments, such as Figure 5 As shown, multiple test stations 500 are arranged at intervals along the vertical direction, and multiple test structures 40 are set up. Each test structure 40 is located at each test station 500. The drive structure 20 is used to drive the conveyor structure 30 to move to any test station 500. By using the conveyor structure 30 that slides along the vertical direction, the conveyor structure 30 can dock with each test station 500 arranged along the vertical direction. While increasing the test density, it eliminates the need to configure a separate horizontal conveyor mechanism for each layer of test stations 500, which greatly simplifies the structure of the test device and reduces the space occupied by the test device.

[0052] Understandably, in this embodiment of the application, multiple test structures 40 are arranged at intervals along the vertical direction, and multiple test structures 40 are also arranged at intervals along the first direction, that is, multiple test structures 40 form an array, which further improves the test density and facilitates integration in the production line.

[0053] In some embodiments, such as Figure 4 As shown, the conveying structure 30 includes a support plate 33 that is slidably disposed in the vertical direction, a first line body 31 disposed on the support plate 33, and a second line body 32 disposed on the support plate 33 and spaced apart from the first line body 31 in the second direction. The first line body 31 and the second line body 32 both extend in the first direction. The first line body 31 and the second line body 32 are respectively used to support the opposite ends of the material 200. The second direction is set at an angle to the first direction.

[0054] The first line 31 and the second line 32 are spaced apart along the second direction and respectively support the opposite ends of the circuit board. Therefore, the first line 31 and the second line 32 form a stable two-point support structure. This design ensures that long or thin circuit boards are always under uniform force during horizontal transport and vertical lifting, effectively avoiding bending, warping, or even breakage of the circuit board caused by single-point support or central suspension. Optionally, the second direction is perpendicular to the first direction.

[0055] In some embodiments, the conveying structure 30 further includes a first frame 34 connected to the support plate 33 and a second frame 35 connected to the support plate 33 and spaced apart from the first frame 34 in a second direction. The first frame 34 and the second frame 35 are respectively used to support the first line 31 and the second line 32. The second frame 35 is slidably disposed relative to the first frame 34 in the second direction to adjust the distance between the first line 31 and the second line 32.

[0056] By sliding the second frame 35 relative to the first frame in the second direction, the distance between the first frame 34 and the second frame 35 can be adjusted, thereby adjusting the spacing between the first conveyor 31 and the second conveyor 32. Since both the first conveyor 31 and the second conveyor 32 are used to support the material 200, adjusting the spacing between the first conveyor 31 and the second conveyor 32 allows the conveying structure 30 to adapt to materials 200 of different sizes. It can be adjusted according to different types or sizes of materials 200. Therefore, the same feeding device can quickly adapt to materials 200 of various specifications by replacing the support plate 33 of different widths or adjusting the installation position of the first conveyor 31 and the second conveyor 32, greatly enhancing the flexibility and application range of the equipment and reducing the cost of additional equipment investment due to product changes.

[0057] Optionally, a slide rail 37 is provided on the support plate 33, and the second frame 35 can be slidably connected to the slide rail 37, thereby enabling the second frame 35 to slide relative to the first frame 34 in the second direction, thereby improving the sliding efficiency and the smoothness of the sliding.

[0058] In some embodiments, such as Figure 4 As shown, the conveying structure 30 also includes a sliding drive for driving the second frame 35 to slide. The sliding drive includes a driver 361 connected to the first frame 34, a lead screw 362 connected to the rotation output end of the driver 361, and a nut seat 363 sleeved on the lead screw 362 and threadedly connected to the lead screw 362. The second frame 35 is connected to the nut seat 363. The lead screw 362 extends along the second direction. The driver 361 drives the lead screw 362 to rotate, so as to drive the nut seat 363 and the second frame 35 to slide along the second direction.

[0059] Understandably, by driving the lead screw 362 to rotate, the rotational motion of the lead screw can be converted into the linear motion of the nut seat 363, and the second frame 35 and the second linear body 32 move synchronously with the nut seat 363. Driving through the cooperation of the lead screw 362 and the nut seat 363 achieves very high precision and reduces energy loss during force transmission, thus achieving higher transmission efficiency. Furthermore, the lead screw 362 and nut structure are compact, the transmission is smooth, and it has good stability. Stable transmission performance is maintained regardless of whether the operation is at high or low speeds. Optionally, the driver 361 is a stepper motor.

[0060] Of course, in other possible implementations, the sliding drive can also be an electric slide table or an electric guide rail, etc. Optionally, two sliding drives are arranged at intervals along the first direction, and the two sliding drives are respectively connected to both ends of the second frame 35.

[0061] In some embodiments, such as Figure 3 As shown, the drive structure 20 includes a synchronous belt 24, a drive wheel 22 rotatably connected to the frame 10, a driven wheel 23 rotatably connected to the frame 10, and a lifting drive component 21 for driving the drive wheel 22 to rotate. The drive wheel 22 and the driven wheel 23 are arranged vertically, located at opposite ends of the synchronous belt 24. A support plate 33 is connected to the synchronous belt 24. By precisely controlling the rotation angle of the drive wheel 22 through the lifting drive component 21, the rotation can be directly and linearly converted into precise vertical displacement of the synchronous belt 24 and the connected conveyor structure 30. This driving method has high positioning accuracy and small repeatability error, ensuring that the conveyor structure 30 can achieve rapid and accurate alignment with each test station 500. Optionally, the lifting drive component 21 is a servo motor.

[0062] Optionally, two synchronous belts 24, driving pulleys 22, and driven pulleys 23 are arranged at intervals along the first direction, and the two ends of the support plate 33 are respectively connected to the two synchronous belts 24. Further, each of the two driving pulleys 22 is connected to a drive shaft 25, and both drive shafts 25 extend along the first direction. The two drive shafts 25 are connected by a coupling 26. The lifting drive component 21 can drive one of the drive shafts 25 to rotate, thereby enabling the simultaneous rotation of both driving pulleys 22.

[0063] In some embodiments, the frame 10 includes a base plate 11 and a guide structure 12 connected to the base plate 11. The guide structure 12 is used to guide the support plate 33 to move in a vertical direction. Multiple guide structures 12 are arranged at intervals along the circumference of the base plate 11. The guide structure 12 includes a guide post 121 connected to the base plate 11 and extending in a vertical direction, and a bearing 122 slidably connected to the guide post 121. The support plate 33 is connected to each bearing 122.

[0064] By setting guide columns 121 and bearings 122 in cooperation, a high-precision guiding path is provided for the lifting and lowering movement of the support plate 33, ensuring that the conveying structure 30 can only move in a strictly vertical direction. Furthermore, multiple guide structures 12 are arranged at intervals along the circumference of the base plate 11, ensuring that the conveying structure 30 and the material 200 it carries are subjected to uniform force during lifting and lowering, effectively reducing the swaying or rotation phenomena that may occur due to a single guide point, and guaranteeing stable operation.

[0065] The present invention also proposes a circuit board production line, which includes a testing device. The specific structure of the testing device is as described in the above embodiments. Since this circuit board production line adopts all the technical solutions of all the above embodiments, it also has all the beneficial effects brought about by the technical solutions of the above embodiments, which will not be described in detail here.

[0066] In summary, when the testing device of this application is in use, the drive structure 20 drives the conveying structure 30 to move to the loading station 300 to receive the material 200, and after receiving the material, the drive structure 30 moves to the testing station 500. The carrier 42 slides to the outside of the accommodating cavity 411 and receives the material 200 at the conveying structure 30, and then conveys the material 200 into the accommodating cavity 411. The testing component 43 in the accommodating cavity 411 tests the material 200. The accommodating cavity 411 provides a stable and isolated testing environment for the material 200, effectively shielding external electromagnetic interference, reducing the impact of temperature and humidity fluctuations on the test results, and improving the accuracy of the test. Furthermore, by arranging the loading station 300 and the testing station 500 in the vertical space, the testing device is compactly installed in the vertical space, reducing the space occupied by the feeding device.

[0067] The above are merely optional embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A testing device, provided with a loading station (300) and a testing station (500) located above the loading station (300), characterized in that: The test device comprises a conveying structure (30) for conveying materials (200), a driving structure (20) for driving the conveying structure (30), and a test structure (40) arranged at the test station (500), the driving structure (20) is used for driving the conveying structure (30) to reciprocate between the feeding station (300) and the test station (500), the test structure (40) comprises a box (41) with a containing cavity (411), a carrier (42) slidingly connected to the box (41) and used for carrying the materials (200), and a test assembly (43) arranged in the containing cavity (411), the box (41) is provided with an opening (412) communicating with the containing cavity (411), and the carrier (42) enters and exits the containing cavity (411) through the opening (412); the conveying structure (30) receives the materials (200) at the feeding station (300) and moves the materials (200) to the test station (500); the carrier (42) receives the materials (200) from the conveying structure (30) and conveys the materials (200) into the containing cavity (411), and the test assembly (43) detects the materials (200); the conveying structure (30) has a material moving area (321), the carrier (42) has an avoiding groove (421) for the conveying structure (30) to pass through, when the carrier (42) slides to the outside of the box (41), the material moving area (321) corresponds to the carrier (42) in the vertical direction, the driving structure (20) drives the conveying structure (30) to rise and at least partially pass through the carrier (42), so that the conveying surface of the material moving area (321) is located above the carrier (42), the materials (200) on the conveying structure (30) are conveyed to the material moving area (321), and the driving structure (20) drives the conveying structure (30) to descend, so that the materials (200) in the material moving area (321) are released on the carrier (42).

2. The test device of claim 1, wherein: The conveying structure (30) comprises a first conveying line (310) and a second conveying line (320) arranged in sequence along a first direction, the material moving area (321) is arranged at the second conveying line (320), the first conveying line (310) is used for receiving the materials (200) from the feeding station (300), and the second conveying line (320) is used for receiving the materials (200) from the first conveying line (310), and the first conveying line (310) and the carrier (42) are vertically staggered with each other.

3. The test device of claim 2, wherein: The conveying structure (30) further comprises a third conveying line (330) arranged on the side of the second conveying line (320) away from the first conveying line (310), the third conveying line (330) being vertically staggered with the carriers (42); the carriers (42) drive the tested material (200) to move outside the box (41), the driving structure (20) drives the conveying structure (30) to ascend, so that the second conveying line (320) passes through the avoiding slot (421) and lifts the material (200) to be separated from the carriers (42), the second conveying line (320) conveys the material (200) to the third conveying line (330), and the third conveying line (330) is used for discharging the material (200).

4. The test device of claim 3, wherein: The testing device further comprises a rack (10), the conveying structure (30) being vertically slidably arranged on the rack (10), and the testing device further comprises a discharging station (400), the discharging station (400) and the feeding station (300) being arranged on opposite sides of the rack (10) along the first direction; the driving structure (20) is further used for driving the conveying structure (30) to move to the discharging station (400), and the third conveying line (330) discharges the material (200) at the discharging station (400).

5. The test device of claim 2, wherein: The second conveying line (320) has a plurality of material moving areas (321) arranged at intervals along the first direction, the second conveying line (320) is used for driving the material (200) to move to any material moving area (321), and a plurality of the testing structures (40) are arranged at intervals along the first direction, each material moving area (321) corresponding to each testing structure (40) in the vertical direction.

6. The test device of any one of claims 1 to 5, wherein: A plurality of the testing stations (500) are arranged at intervals in the vertical direction, a plurality of the testing structures (40) are arranged, each testing structure (40) being arranged at each testing station (500), and the driving structure (20) is used for driving the conveying structure (30) to move to any testing station (500).

7. The test device of any one of claims 1 to 5, wherein: The conveying structure (30) comprises a support plate (33) slidably arranged in the vertical direction, a first line body (31) arranged on the support plate (33), and a second line body (32) arranged on the support plate (33) and spaced apart from the first line body (31) along a second direction, the first line body (31) and the second line body (32) both extending along a first direction, the first line body (31) and the second line body (32) being respectively used for supporting opposite ends of the material (200), and the second direction is arranged at an angle to the first direction.

8. The test device of claim 7, wherein: The conveying structure (30) further comprises a first frame (34) connected to the support plate (33) and a second frame (35) connected to the support plate (33) and spaced apart from the first frame (34) along the second direction, the first frame (34) and the second frame (35) being used for supporting the first wire body (31) and the second wire body (32) respectively, the second frame (35) being slidingly arranged relative to the first frame (34) along the second direction to adjust the distance between the first wire body (31) and the second wire body (32).

9. A circuit board production line, characterized by: A test device as claimed in any one of claims 1 to 8.

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