Electronic device
By introducing a combination of electrostatic discharge protection circuitry and scanning transistors into the flat panel device, the problem of electronic component damage caused by electrostatic discharge at the junction point is solved, and the effectiveness of electrostatic protection is achieved.
Patent Information
- Application Number
- CN202411335098.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2024-04-19
- Filing Date
- 2024-09-24
- Publication Date
- 2025-10-24
AI Technical Summary
During the manufacturing process of flat panel devices, the exposed joints are prone to electrostatic discharge, which can cause electrostatic current to damage other electronic components.
A combination of electrostatic discharge (ESD) protection circuit and scanning transistor is used to release electrostatic current at the junction through the ESD protection circuit, thus protecting other electronic components.
It effectively protects other electronic components at the junction from damage by electrostatic current, achieving excellent electrostatic protection.
Smart Images
Figure CN120835520A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present disclosure relates to an apparatus, and more particularly to an electronic apparatus with electrostatic protection function. BACKGROUND
[0002] Generally, after the manufacturing process of a flat panel apparatus (e.g. a display panel or an antenna apparatus), a tunable element (e.g. a liquid crystal cell or a varactor) is connected to the junction of each unit in the flat panel. However, during the manufacturing process, the junction of each unit in the flat panel is exposed, and thus electrostatic discharge (ESD) easily occurs at the junction, which generates a large electrostatic current and thus damages other electronic elements electrically connected to the junction. SUMMARY
[0003] The present disclosure is directed to an electronic apparatus with electrostatic protection architecture and good electrostatic protection function.
[0004] According to an embodiment of the present disclosure, an electronic apparatus includes a junction, an electrostatic protection circuit, and a scan transistor. The electrostatic protection circuit is electrically connected to the junction. The scan transistor has a first end, a second end, and a control end. The second end of the scan transistor is electrically connected to the junction and the electrostatic protection circuit.
[0005] Based on the above, the electronic apparatus of the present disclosure can release the electrostatic current occurring at the junction through the electrostatic protection circuit, so as to effectively protect other electronic elements electrically connected to the junction.
[0006] In order to make the foregoing clearer, several embodiments with accompanying drawings are described in detail as follows. BRIEF DESCRIPTION OF DRAWINGS
[0007] Figure 1 is a schematic diagram of an electronic apparatus of an embodiment of the present disclosure;
[0008] Figure 2 is a circuit schematic diagram of an electronic apparatus of an embodiment of the present disclosure;
[0009] Figure 3 is a circuit schematic diagram of an electronic apparatus of an embodiment of the present disclosure;
[0010] Figure 4 is a circuit schematic diagram of an electronic apparatus of an embodiment of the present disclosure;
[0011] Figure 5 is a circuit schematic diagram of an electronic apparatus of an embodiment of the present disclosure;
[0012] Figure 6 is a circuit schematic diagram of an electronic apparatus of an embodiment of the present disclosure;
[0013] Figure 7 FIG. 1 is a circuit schematic diagram of an electronic device according to an embodiment of the present disclosure.
[0014] Reference Sign List
[0015] 100, 200, 300, 400, 500, 600, 700: electronic device
[0016] 110, 210, 310, 410, 510, 610, 710: tunable element
[0017] 120, 220, 320, 420, 520, 620, 720: electrostatic protection circuit
[0018] 130, 230, 330, 430, 530, 630, 730: scan transistor
[0019] 140, 240, 340, 440, 540, 621, 640, 740: storage capacitor
[0020] 211, 311, 411, 511, 611, 711: varactor diode
[0021] 221, 321, 421: first diode
[0022] 222, 322, 422: second diode
[0023] 521: switch transistor
[0024] 721: resistor
[0025] P1: junction
[0026] P2: circuit node
[0027] Vss: operating voltage DETAILED DESCRIPTION
[0028] Reference will now be made in detail to the exemplary embodiments of the present disclosure, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used in the drawings and the description to refer to the same or like parts.
[0029] Throughout the specification and the appended claims, certain terms should be construed in a broad, liberal sense, and not in a limited, restrictive sense. For example, the terms "comprises," "comprising," "includes," "including," "has," "having," "contains," "containing," or variations thereof, are intended to be open-ended terms that specifically permit the inclusion of more than one component, integer, step, or the like. Additionally, the terms "a" and "an" are defined as one or more pluralities. Furthermore, to the extent that the terms "includes," "including," "has," "having," "contains," "containing," or variations thereof are used in either the detailed description or the claims, such terms are considered as disclosing "consisting of," "consisting essentially of," and the like.
[0030] While the terms "first," "second," "third," etc. may be used to describe various components, these terms are not intended to be limiting. These terms are used solely to distinguish a single component from other components within the specification. Claims may not use the same terms, but may be replaced with "first," "second," "third," etc., according to the order in which the components are declared in the claims. Thus, in the following description, the first component may be referred to as the second component in a claim.
[0031] In some embodiments of the present disclosure, terms such as "joined" and "connected," unless otherwise specified, may refer to two structures being in direct contact, or may refer to two structures not being in direct contact, with another structure disposed between the two structures. Furthermore, such terms may include situations where both structures are movable or both structures are fixed.
[0032] In some embodiments of the present disclosure, the electronic device may include a display device, an antenna device, a sensing device or a splicing device, but is not limited thereto. The electronic device may be a bendable or flexible electronic device. The electronic device may, for example, include a liquid crystal light emitting diode; the light emitting diode may, for example, include an organic light emitting diode (OLED), a sub-millimeter light emitting diode (mini LED), a micro LED or a quantum dot light emitting diode (QD, which may be, for example, QLED, QDLED), fluorescence, phosphor or other suitable materials and their materials may be arranged and combined in any manner, but is not limited thereto. The antenna device may, for example, be a liquid crystal antenna, but is not limited thereto. The splicing device may, for example, be a display splicing device or an antenna splicing device, but is not limited thereto. It should be noted that the electronic device may be any arrangement or combination of the aforementioned, but is not limited thereto. The following will use a display device as an electronic device or a splicing device to illustrate the contents of the present disclosure, but the present disclosure is not limited thereto.
[0033] It should be noted that the following embodiments may replace, reorganize, or mix the technical features of several different embodiments to implement other embodiments without departing from the spirit of the present disclosure.
[0034] Figure 1 is a schematic diagram of an electronic device according to an embodiment of the present disclosure. Figure 1, the electronic device 100 includes a junction point P1 (or a circuit node), a tunable unit 110, an electrostatic protection circuit 120, a scan transistor 130, and a storage capacitor 140. The scan transistor 130 can be a thin-film transistor (TFT) of N-type or P-type. The scan transistor 130 has a first end, a second end, and a control end. In the embodiment, the first end of the scan transistor 130 is electrically connected to a circuit node P2. The circuit node P2 can also be electrically connected to other functional circuits of the electronic device 100, such as a driving circuit, but the present disclosure is not limited thereto. The second end of the scan transistor 130 is electrically connected to the junction point P1, the tunable unit 110, the electrostatic protection circuit 120, and the storage capacitor 140. In the embodiment, the tunable unit 110 is electrically connected between the junction point P1 and a working voltage VSS. The working voltage VSS can have a low voltage level or be a ground voltage. The electrostatic protection circuit 120 is electrically connected between the junction point P1 and the working voltage VSS. The storage capacitor 140 is electrically connected between the junction point P1 and the tunable unit 110.
[0035] It should be noted that, in the manufacturing process of the electronic device 100, the electrostatic protection circuit 120 is formed in the electronic device 100 before the tunable unit 110 is disposed, to serve as (or form) a discharge path of the junction point P1 and / or the scan transistor 130. In other words, in some embodiments of the present disclosure, the electronic device 100 can not include the tunable unit 110. In addition, in some embodiments of the present disclosure, when the electronic device 100 is operated, the control end of the scan transistor 130 can be used to receive a scan signal, for example, and the first end of the scan transistor 130 can receive a driving signal (e.g., having a data voltage). The scan transistor 130 can write the driving signal into the storage capacitor 140 according to the scan signal, to drive the tunable unit 110. The voltage value of the driving signal (i.e., the data voltage) can be higher than the voltage value of the working voltage VSS.
[0036] In addition, in some embodiments of the present disclosure, the electronic device 100 can include a substrate, and a plurality of pixel units can be formed on the substrate, wherein each of the plurality of pixel units can respectively include the junction point P1, the tunable unit 110, the electrostatic protection circuit 120, the scan transistor 130, and the storage capacitor 140 as shown in Figure 1
[0037] Figure 2 is a circuit schematic diagram of an electronic device of an embodiment of the present disclosure. Referring to Figure 2 The electronic device 200 includes a junction P1, a tunable element 210, an ESD protection circuit 220, a scan transistor 230, and a storage capacitor 240. The scan transistor 230 has a first terminal, a second terminal, and a control terminal. In this embodiment, the first terminal of the scan transistor 230 is electrically connected to the circuit node P2. The second terminal of the scan transistor 230 is electrically connected to the junction P1, the tunable element 210, the ESD protection circuit 220, and the storage capacitor 240. In this embodiment, the tunable element 210 includes a varactor 211. The first terminal of the varactor 211 is electrically connected to the junction P1. The second terminal of the varactor 211 is electrically connected to the operating voltage Vss. The ESD protection circuit 220 includes a first diode 221 and a second diode 222. The first diode 221 is electrically connected to the junction P1 and the second terminal of the scan transistor 230. The second diode 222 is electrically connected to the first diode 221. The first diode 221 and the second diode 222 are connected in series. The cathode of the first diode 221 is connected to the junction point P1 and the second terminal of the scan transistor 230. The cathode of the second diode 222 is electrically connected to the anode of the first diode 221. The anode of the second diode 222 is electrically connected to the operating voltage Vss. The first terminal of the storage capacitor 240 is electrically connected to the junction point P1 and the second terminal of the scan transistor 230. The second terminal of the storage capacitor 240 is electrically connected to the operating voltage Vss.
[0038] During the manufacturing process of electronic device 200, first diode 221 and second diode 222 may be formed in electronic device 200 before tunable element 210 or varactor diode 211 is provided. These diodes serve as (or form) a discharge path for electrostatic current (if electrostatic discharge occurs) at junction P1 (and / or the second terminal of scan transistor 230). In other words, in some embodiments of the present disclosure, electronic device 200 may not include tunable element 210 or varactor diode 211. Furthermore, in other embodiments of the present disclosure, during the operation of electronic device 200 (i.e., during device operation), first diode 221 and second diode 222 may also provide electrostatic protection.
[0039] In this embodiment, for the junction P1, the first diode 221 and the second diode 222 form a series reverse diode. In normal operation, the first diode 221 and the second diode 222 can not be turned on due to insufficient reverse bias. When the junction P1 occurs electrostatic discharge to generate electrostatic current, and the first diode 221 and the second diode 222 are turned on due to sufficient reverse bias, the first diode 221 and the second diode 222 can form a discharge path for the electrostatic current to avoid damage to the scan transistor 230 or its back-end circuit caused by the electrostatic current. The first diode 221 and the second diode 222 can release the electrostatic current to the operating voltage Vss. The first diode 221 and the second diode 222 can provide a higher reverse bias voltage effect.
[0040] Figure 3 is a circuit schematic diagram of an electronic device of an embodiment of the present disclosure. Referring to Figure 3 , the electronic device 300 includes a junction P1, a tunable element 310, an electrostatic protection circuit 320, a scan transistor 330, and a storage capacitor 340. The scan transistor 330 has a first end, a second end, and a control end. In this embodiment, the first end of the scan transistor 330 is electrically connected to the circuit node P2. The second end of the scan transistor 330 is electrically connected to the junction P1, the tunable element 310, the electrostatic protection circuit 320, and the storage capacitor 340. In this embodiment, the tunable element 310 includes a varactor 311. The first end of the varactor 311 is electrically connected to the junction P1. The second end of the varactor 311 is electrically connected to the operating voltage Vss. The electrostatic protection circuit 320 includes a first diode 321 and a second diode 322. The first diode 321 is electrically connected to the junction P1 and the second end of the scan transistor 330. The second diode 322 is electrically connected to the first diode 321. The first diode 321 and the second diode 322 are connected in series. The anode of the first diode 321 is electrically connected to the junction P1. The cathode of the second diode 322 is electrically connected to the cathode of the first diode 321 and the second end of the scan transistor 330. The anode of the second diode 322 is electrically connected to the operating voltage Vss. The first end of the storage capacitor 340 is electrically connected to the junction P1 and the second end of the scan transistor 330. The second end of the storage capacitor 340 is electrically connected to the operating voltage Vss.
[0041] In the manufacturing process of the electronic device 300, the first diode 321 and the second diode 322 can be formed in the electronic device 300 before the tunable element 310 or the varactor 311 is disposed, to serve as (or form) a discharge path for electrostatic current (if electrostatic discharge occurs) of the junction P1 (and / or the second end of the scan transistor 330). In other words, in some embodiments of the present disclosure, the electronic device 300 can not include the tunable element 310 or the varactor 311. Also, in other embodiments of the present disclosure, the first diode 321 and the second diode 322 can also provide an electrostatic protection function during the operation of the electronic device 300.
[0042] In the present embodiment, for the junction P1, the first diode 321 can form a forward diode, and the second diode 322 can form a reverse diode. Under normal operation, the second diode 322 can not be turned on due to insufficient reverse bias. When electrostatic discharge occurs at the junction P1 to generate electrostatic current, and the reverse bias of the second diode 322 is sufficient to turn it on, the first diode 321 and the second diode 322 can form a discharge path for the electrostatic current to avoid damage to the scan transistor 330 or its back-end circuit caused by the electrostatic current. The first diode 321 and the second diode 322 can discharge the electrostatic current to the operating voltage Vss. In another aspect, when electrostatic discharge occurs at one end of the operating voltage Vss, the first diode 321 and the second diode 322 can also provide a discharge path to similarly avoid damage to the scan transistor 330 or its back-end circuit.
[0043] Figure 4 is a circuit schematic diagram of an electronic device according to an embodiment of the present disclosure. Refer to Figure 4The electronic device 400 includes a junction point P1, a tunable element 410, an electrostatic protection circuit 420, a scan transistor 430, and a storage capacitor 440. The scan transistor 430 has a first end, a second end, and a control end. In this embodiment, the first end of the scan transistor 430 is electrically connected to a circuit node P2. The second end of the scan transistor 430 is electrically connected to the junction point P1, the tunable element 410, the electrostatic protection circuit 420, and the storage capacitor 440. In this embodiment, the tunable element 410 includes a varicap diode 411. The first end of the varicap diode 411 is electrically connected to the junction point P1. The second end of the varicap diode 411 is electrically connected to an operating voltage Vss. The electrostatic protection circuit 420 includes a first diode 421 and a second diode 422. The first diode 421 is electrically connected to the junction point P1 and the second end of the scan transistor 430. The second diode 422 is electrically connected to the junction point P1 and the second end of the scan transistor 430. The first diode 421 and the second diode 422 are connected in parallel. The anode of the first diode 421 is electrically connected to the junction point P1 and the second end of the scan transistor 430. The cathode of the first diode 421 is electrically connected to the operating voltage Vss. The cathode of the second diode 422 is electrically connected to the junction point P1 and the second end of the scan transistor 430. The anode of the second diode 422 is electrically connected to the operating voltage Vss. The first end of the storage capacitor 440 is electrically connected to the junction point P1 and the second end of the scan transistor 430. The second end of the storage capacitor 440 is electrically connected to the operating voltage Vss.
[0044] In the manufacturing process of the electronic device 400, the first diode 421 and the second diode 422 can be formed in the electronic device 400 before the tunable element 410 or the varicap diode 411 is disposed, to serve as (or form) a discharge path for electrostatic current (if electrostatic discharge occurs) of the junction point P1 (and / or the second end of the scan transistor 430). In other words, in some embodiments of the present disclosure, the electronic device 400 can not include the tunable element 410 or the varicap diode 411. Also, in other embodiments of the present disclosure, the first diode 421 and the second diode 422 can also provide an electrostatic protection function during the operation of the electronic device 400.
[0045] In the present embodiment, for the junction point P1, the first diode 421 can form a forward diode, and the second diode 422 can form a reverse diode. When electrostatic discharge occurs at the junction point P1 to generate electrostatic current, the first diode 421 can form a discharge path for the electrostatic current to avoid damage to the scan transistor 430 or its back-end circuit caused by the electrostatic current. The first diode 421 can release the electrostatic current to the working voltage Vss. From another perspective, when electrostatic discharge occurs at one end of the working voltage Vss, the second diode 422 can provide a discharge path to likewise avoid damage to the scan transistor 430 or its back-end circuit.
[0046] Figure 5 is a circuit schematic diagram of an electronic device of an embodiment of the present disclosure. Referring to Figure 5 , the electronic device 500 includes a junction point P1, a tunable element 510, an electrostatic protection circuit 520, a scan transistor 530, and a storage capacitor 540. The scan transistor 530 has a first end, a second end, and a control end. In the present embodiment, the first end of the scan transistor 530 is electrically connected to a circuit node P2. The second end of the scan transistor 530 is electrically connected to the junction point P1, the tunable element 510, the electrostatic protection circuit 520, and the storage capacitor 540. In the present embodiment, the tunable element 510 includes a varactor 511. The first end of the varactor 511 is electrically connected to the junction point P1. The second end of the varactor 511 is electrically connected to a working voltage Vss. The electrostatic protection circuit 520 includes a switch transistor 521. The first end of the switch transistor 521 is electrically connected to the junction point P1 and the second end of the scan transistor 530. The second end of the switch transistor 521 is electrically connected to the working voltage Vss. The control end of the switch transistor 521 is floating. The first end of the storage capacitor 540 is electrically connected to the junction point P1 and the second end of the scan transistor 530. The second end of the storage capacitor 540 is electrically connected to the working voltage Vss.
[0047] In the manufacturing process of the electronic device 500, the switch transistor 521 can be formed in the electronic device 500 before the tunable element 510 or the varactor 511 is disposed, to serve as (or form) a discharge path for electrostatic current (if electrostatic discharge occurs) at the junction point P1 (and / or the second end of the scan transistor 530). In other words, in some embodiments of the present disclosure, the electronic device 500 can not include the tunable element 510 or the varactor 511. Also, in other embodiments of the present disclosure, the switch transistor 521 can also provide an electrostatic protection function during the operation of the electronic device 500.
[0048] In this embodiment, for the junction P1, under normal operation, the switch transistor 521 is not turned on. When an electrostatic discharge occurs at the junction P1, due to the coupling effect between the first end (i.e., the drain end or the source end) and the control end (i.e., the gate end) of the switch transistor 521, the high voltage generated by the electrostatic discharge can cause the switch transistor 521 to switch to the on state, thus forming a discharge path for the electrostatic current to avoid damage to the scan transistor 530 or the back-end circuit thereof due to the electrostatic current. The switch transistor 521 can release the electrostatic current to the operating voltage Vss. In another aspect, when an electrostatic discharge occurs at one end of the operating voltage Vss, the switch transistor 521 can also provide a discharge path to similarly avoid damage to the scan transistor 530 or the back-end circuit thereof.
[0049] Figure 6 is a circuit schematic diagram of an electronic device of an embodiment of the present disclosure. Referring to Figure 6 , the electronic device 600 includes a junction P1, a tunable element 610, an electrostatic protection circuit 620, a scan transistor 630, and a storage capacitor 640. The scan transistor 630 has a first end, a second end, and a control end. In this embodiment, the first end of the scan transistor 630 is electrically connected to a circuit node P2. The second end of the scan transistor 630 is electrically connected to the junction P1, the tunable element 610, the electrostatic protection circuit 620, and the storage capacitor 640. In this embodiment, the tunable element 610 includes a varactor 611. The first end of the varactor 611 is electrically connected to the junction P1. The second end of the varactor 611 is electrically connected to an operating voltage Vss. The electrostatic protection circuit 620 includes another storage capacitor 621. The first end of the storage capacitor 621 is electrically connected to the junction P1 and the second end of the scan transistor 630. The second end of the storage capacitor 621 is electrically connected to the operating voltage Vss. The first end of the storage capacitor 640 is electrically connected to the junction P1 and the second end of the scan transistor 630. The second end of the storage capacitor 640 is electrically connected to the operating voltage Vss.
[0050] In the manufacturing process of the electronic device 600, the storage capacitor 621 can be formed in the electronic device 600 before the tunable element 610 or the varactor 611 is disposed, to serve as (or form) a discharge path for the electrostatic current (if an electrostatic discharge occurs) at the junction P1 (and / or the second end of the scan transistor 630). In other words, in some embodiments of the present disclosure, the electronic device 600 can not include the tunable element 610 or the varactor 611. Also, in other embodiments of the present disclosure, the storage capacitor 621 can also provide an electrostatic protection function during the operation of the electronic device 600.
[0051] In this embodiment, the storage capacitor 621 can have a higher capacitance value. For the junction P1, when the junction P1 experiences an electrostatic discharge and generates an electrostatic current, the storage capacitor 621 can store the charge generated by the electrostatic discharge to reduce the amount of the electrostatic current generated by the electrostatic discharge to avoid damage to the scan transistor 630 or the back-end circuitry thereof due to the electrostatic current. In another aspect, when one end of the operating voltage Vss experiences an electrostatic discharge, the storage capacitor 621 can also store the charge generated by the electrostatic discharge to reduce the amount of the electrostatic current generated by the electrostatic discharge to avoid damage to the scan transistor 630 or the back-end circuitry thereof due to the electrostatic current.
[0052] Figure 7 is a circuit schematic diagram of an electronic device of an embodiment of the present disclosure. Referring to Figure 7 , the electronic device 700 includes a junction P1, a tunable element 710, an electrostatic protection circuit 720, a scan transistor 730, and a storage capacitor 740. The scan transistor 730 has a first end, a second end, and a control end. In this embodiment, the first end of the scan transistor 730 is electrically connected to a circuit node P2. The second end of the scan transistor 730 is electrically connected to the junction P1, the tunable element 710, the electrostatic protection circuit 720, and the storage capacitor 740. In this embodiment, the tunable element 710 includes a varactor 711. The first end of the varactor 711 is electrically connected to the junction P1. The second end of the varactor 711 is electrically connected to an operating voltage Vss. The electrostatic protection circuit 720 includes a resistor 721. The first end of the resistor 721 is electrically connected to the junction P1 and the second end of the scan transistor 730. The second end of the resistor 721 is electrically connected to the operating voltage Vss. The first end of the storage capacitor 740 is electrically connected to the junction P1 and the second end of the scan transistor 730. The second end of the storage capacitor 740 is electrically connected to the operating voltage Vss.
[0053] In the manufacturing process of the electronic device 700, the resistor 721 can be formed in the electronic device 700 before the tunable element 710 or the varactor 711 is disposed, to serve as (or form) a discharge path for the electrostatic current (if an electrostatic discharge occurs) of the junction P1 (and / or the second end of the scan transistor 730). In other words, in some embodiments of the present disclosure, the electronic device 700 can not include the tunable element 710 or the varactor 711. Also, in some other embodiments of the present disclosure, the resistor 721 can also provide an electrostatic protection function during the operation of the electronic device 700.
[0054] In the present embodiment, for the junction point P1, under normal operation, the resistance 721 can only allow a trace amount of current to pass through or no current to pass through. When the junction point P1 occurs electrostatic discharge to generate electrostatic current, the high current (or high voltage) generated by the electrostatic discharge can be discharged to the working voltage Vss through the resistance 721, thus forming a discharge path for the electrostatic current to avoid the case that the scan transistor 730 or the back-end circuit thereof is damaged by the electrostatic current. In another aspect, when one end of the working voltage Vss occurs electrostatic discharge, the resistance 721 can also provide a discharge path to also avoid the case that the scan transistor 730 or the back-end circuit thereof is damaged.
[0055] In summary, the electronic device of the present disclosure can release the electrostatic current occurring at the junction point through the electrostatic protection circuit to effectively protect the scan transistor or the back-end circuit thereof electrically connected to the junction point from being damaged.
[0056] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present disclosure, but not to limit them; although the present disclosure has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for part or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present disclosure.
Claims
1. An electronic device, characterized by comprising: Comprising: a junction point; an electrostatic protection circuit electrically connected to the junction point; and a scan transistor having a first terminal, a second terminal, and a control terminal, wherein the second terminal of the scan transistor is electrically connected to the junction point and the electrostatic protection circuit. Further comprising: 2.The electronic device of claim 1, wherein, a tunable element electrically connected to the junction point and comprising a varactor diode, wherein the electrostatic protection circuit is formed in the electronic device before the tunable element is set, to serve as a discharge path for the junction point. Further comprising: 3.The electronic device of claim 2, wherein, a storage capacitor electrically connected between the junction point and the tunable element. The electrostatic protection circuit comprises: 4.The electronic device of claim 1, wherein, a first diode electrically connected to the junction point; and a second diode electrically connected to the first diode. The cathode of the first diode is electrically connected to the junction point, the cathode of the second diode is electrically connected to the anode of the first diode, and the anode of the second diode is electrically connected to a working voltage. 5.The electronic device of claim 4, wherein, The anode of the first diode is electrically connected to the junction point, the cathode of the second diode is electrically connected to the cathode of the first diode, and the anode of the second diode is electrically connected to a working voltage. 6.The electronic device of claim 4, wherein, The anode of the first diode is electrically connected to the junction point, the cathode of the first diode is electrically connected to a working voltage, the cathode of the second diode is electrically connected to the junction point, and the anode of the second diode is electrically connected to the working voltage. 7.The electronic device of claim 4, wherein, The electrostatic protection circuit comprises: 8.The electronic device of claim 1, wherein, a switch transistor, wherein the first terminal of the switch transistor is electrically connected to the junction point, the second terminal of the switch transistor is electrically connected to a working voltage, and the control terminal of the switch transistor is floating. The electrostatic protection circuit comprises: 9.The electronic device of claim 1, wherein, another storage capacitor, wherein the first terminal of the another storage capacitor is electrically connected to the junction point, and the second terminal of the another storage capacitor is electrically connected to a working voltage. The electrostatic protection circuit comprises: 10.The electronic device of claim 1, wherein, a resistor, wherein the first terminal of the resistor is electrically connected to the junction point, and the second terminal of the resistor is electrically connected to a working voltage.