A high-precision wavelength calibration method for a spectrometer based on filter hardware interception

By introducing long-pass and short-pass filters into the optical path to capture the interference spectral signal, calculating the phase gradient and wavenumber function, and establishing a mapping between pixel coordinates and wavelength, the problem of insufficient accuracy and system complexity of existing spectrometer calibration methods is solved, and high-precision spectrometer wavelength calibration is achieved.

CN121026344BActive Publication Date: 2026-01-20WESTLAKE UNIV
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Patent Information

Application Number
CN202511543628.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-10-28
Publication Date
2026-01-20
Estimated Expiration
2045-10-28

AI Technical Summary

Technical Problem

Existing methods for wavelength calibration of spectrometers rely on expensive light sources or complex equipment, resulting in insufficient calibration accuracy and high system complexity, making it difficult to achieve high-precision calibration in spectral domain optical coherence tomography systems.

Method used

Long-pass and short-pass filters are introduced into the interference optical path. The interference spectrum signal is intercepted by hardware, the local half-period and phase gradient are calculated, the mapping relationship between pixel coordinates and wavelength is established, and interpolation resampling is performed to achieve high-precision wavelength calibration.

Benefits of technology

It eliminates the need for expensive light sources, improves calibration accuracy and system simplicity, enhances signal quality and imaging performance, and is suitable for spectral domain optical coherence tomography systems and other spectral analysis systems.

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Abstract

The application discloses a kind of high-precision wavelength calibration methods of spectrometer based on optical filter hardware intercepting, comprising: placing optical filter in interference light path, limiting spectral range in hardware mode, so that camera directly collects sharp interference spectrum signal of boundary;Extract the wave peak, wave trough position of interference spectrum signal, calculate local half cycle and obtain half cycle change curve by fitting;Calculate phase gradient, and obtain wave number gradient from it;The relative function of wave number is obtained by integral accumulation mode;Combined with the cut-off wavelength information of optical filter, the mapping relationship between pixel coordinates and wavelength is established, and the wavelength calibration of spectrometer is completed;Based on the calibration result, the interference spectrum signal is interpolated and resampled;Fourier transform is carried out on the interference spectrum signal after resampling, and depth information is obtained.Using the application, the problem that the existing calibration method relies on expensive light source, insufficient precision or high complexity can be solved.
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Citation Information

Patent Citations

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  • Spectrum calibration system based on interference spectrum phase information

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