Test tool

Abstract

The invention discloses a test tool, and the tool comprises a first placement station which is used for placing a drive board; the second placing station is used for placing a lamp panel; the first probe group comprises a first input end and a first output end, and the first input end and the first output end are both used for being electrically connected with the driving board; the second probe group comprises a second input end and a second output end, and the second input end and the second output end are both used for being electrically connected with the lamp panel; wherein the first probe group is electrically connected with the second probe group, so that the driving plate can control the lamp panel. According to the testing tool, the driving board and the lamp panel can be tested at the same time, and therefore the testing efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of board card testing, in particular to a testing tool. BACKGROUND

[0002] In the related art, after production, a board card needs to be tested to verify whether the function of the board card can be normally used. The board card may be a driving board or a lamp board. Further, in testing the driving board, a driving board testing tool is specially set to test it, and in testing the lamp board, a lamp board testing tool is specially set to test it. However, such a mode can result in low testing efficiency. SUMMARY

[0003] The present application aims to at least solve one of the problems in the prior art. To this end, the present application provides a testing tool capable of testing a driving board and a lamp board at the same time, thereby improving testing efficiency.

[0004] The testing tool according to an embodiment of the present application comprises: a first placement station for placing a driving board; a second placement station for placing a lamp board; a first probe group comprising a first input end and a first output end, both of which are used for electrically connecting the driving board; a second probe group comprising a second input end and a second output end, both of which are used for electrically connecting the lamp board; wherein the first probe group and the second probe group are electrically connected to enable the driving board to control the lamp board.

[0005] The testing tool according to an embodiment of the present application has at least the following beneficial effects: the driving board can be placed on the first placement station, the lamp board can be placed on the second placement station, the first input end and the first output end of the first probe group are both electrically connected to the driving board, the second input end and the second output end of the second probe group are both electrically connected to the lamp board, the first probe group and the second probe group are electrically connected, and thus, when testing the driving board and the lamp board, the driving board and the lamp board can form a loop, which can facilitate simultaneous testing of the driving board and the lamp board and improve testing efficiency. Specifically, the testing tool can test the driving board and the lamp board at the same time, thereby improving testing efficiency.

[0006] The testing tool according to some embodiments of the present application comprises a first assembly comprising a first placement piece provided with a first placement groove, which is configured as the first placement station.

[0007] According to the test tool of some embodiments of the application, the first placement slot is provided with a plurality of first placement slots which are arranged at intervals along the length direction of the first placement member.

[0008] According to the test tool of some embodiments of the application, the test tool comprises a second assembly which comprises a second placement member provided with a second placement slot arranged as the second placement station.

[0009] According to the test tool of some embodiments of the application, the second placement slot is provided with a plurality of second placement slots which are arranged at intervals along the length direction of the second placement member.

[0010] According to the test tool of some embodiments of the application, the first assembly comprises a first moving member connected to the first probe group, and the first moving member is movable to drive the first probe group to approach or move away from the first placement station.

[0011] According to the test tool of some embodiments of the application, the first assembly further comprises a first operating member, a first fixing member and a first rotating member, the first fixing member is provided with a first through hole, the first moving member is arranged in the first through hole, the first operating member comprises a first operating part and a first connecting part which are connected to each other, two ends of the first rotating member are rotatably connected to one end of the first moving member and one end of the first connecting part respectively, and the other end of the first connecting part is rotatably connected to the first fixing member, and the first operating member can drive the first rotating member to rotate to make the first moving member slide in the first through hole by operating the first operating part.

[0012] According to the test tool of some embodiments of the application, the second assembly comprises a second moving member connected to the second probe group, and the second moving member is movable to drive the second probe group to approach or move away from the second placement station.

[0013] According to the test tool of some embodiments of the application, the second assembly further comprises a second operating member, a second fixing member and a second rotating member, the second fixing member is provided with a second through hole, the second moving member is arranged in the second through hole, the second operating member comprises a second operating part and a second connecting part which are connected to each other, two ends of the second rotating member are rotatably connected to one end of the second moving member and one end of the second connecting part respectively, and the other end of the second connecting part is rotatably connected to the second fixing member, and the second operating member can drive the second rotating member to rotate to make the second moving member slide in the second through hole by operating the second operating part.

[0014] According to the test tool of some embodiments of the present application, the second assembly comprises a first plate and a second plate, the first plate is connected to the second probe group, the second plate is connected to the second moving member, and the first plate and the second plate are detachably connected.

[0015] Additional aspects and advantages of the present application will be made apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0016] The present application is further described below with reference to the accompanying drawings and examples, wherein: Figure 1 A schematic view of a test tool of some embodiments of the present application; Figure 2 A schematic view of a first placing member in a test tool of some embodiments of the present application; Figure 3 A schematic view of a second placing member in a test tool of some embodiments of the present application; Figure 4 A schematic view of a first assembly in a test tool of some embodiments of the present application; Figure 5 A schematic view of a second assembly in a test tool of some embodiments of the present application.

[0017] REFERENCE NUMERALS Test tool 10, first placing station 100, second placing station 200, first assembly 300, first placing member 310, first moving member 320, first operating member 330, first operating part 331, first connecting part 332, first fixing member 340, first rotating member 350, second assembly 400, second placing member 410, second moving member 420, second operating member 430, second operating part 431, second connecting part 432, second fixing member 440, second rotating member 450, first plate 460, second plate 470. DETAILED DESCRIPTION

[0018] Embodiments of the present application are described in detail below with reference to the accompanying drawings, in which examples of the embodiments are shown, wherein the same or similar numerals represent the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be understood as a limitation of the present application.

[0019] In the description of the present application, it should be understood that the orientation description, such as the orientation or position relationship indicated by the upper, lower, front, rear, left, right and the like, is based on the orientation or position relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation of the present application.

[0020] In the description of the present application, if the meaning of several is more than one, the meaning of multiple is more than two, greater than, less than, more than and the like are understood as not including the number, above, below, within and the like are understood as including the number. If it is described as first, second, it is only for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated or the order of technical features indicated.

[0021] In the description of the present application, unless otherwise explicitly limited, the words such as setting, installing, connecting and the like should be broadly understood, and the person skilled in the art can reasonably determine the specific meaning of the above words in the present application in combination with the specific content of the technical solution.

[0022] In the description of the present application, the description of the reference terms "one embodiment", "some embodiments", "illustrative embodiment", "example", "specific example" or "some examples" means that the specific features, structures, materials or characteristics described in combination with the embodiment or example are included in at least one embodiment or example of the present application. In the present specification, the illustrative description of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0023] In the related art, after the production of the board card, the board card needs to be tested to verify whether the function of the board card can be normally used. The board card may, for example, be a driving board or a lamp board. Further, when testing the driving board, the existing test tool 10 will specially set up a driving board test tool to test it, and when testing the lamp board, a lamp board test tool will be specially set up to test it. However, such a way will result in low test efficiency. Therefore, the present application proposes a test tool 10.

[0024] Please refer to Figures 1 to 5In some embodiments, the test tool 10 comprises a first placement station 100, a second placement station 200, a first probe set and a second probe set. The first placement station 100 is used to place a driver board. For example, the first placement station 100 can be a recess, and the driver board can be placed in the recess. The bottom wall of the recess can be hollowed out, which can facilitate the taking and placing of the driver board. The second placement station 200 is used to place a light board. For example, the second placement station 200 can be a recess, and the light board can be placed in the recess. The bottom wall of the recess can be hollowed out, which can facilitate the taking and placing of the light board. The first probe set comprises a first input end and a first output end, and both the first input end and the first output end are used to electrically connect the driver board. The second probe set comprises a second input end and a second output end, and both the second input end and the second output end are used to electrically connect the light board. The first probe set and the second probe set are electrically connected to enable the driver board to control the light board. Specifically, the driver board can be placed on the first placement station 100, the light board can be placed on the second placement station 200, the first input end and the first output end of the first probe set are electrically connected to the driver board, the second input end and the second output end of the second probe set are electrically connected to the light board, and the first probe set and the second probe set are electrically connected. In this way, when the driver board and the light board are tested, the driver board and the light board can form a loop, which can facilitate the simultaneous testing of the driver board and the light board and improve the testing efficiency. Specifically, the test tool 10 can simultaneously test the driver board and the light board, thereby improving the testing efficiency.

[0025] Further, it should be noted that the test tool 10 can be communicatively connected to a computer. After the communication connection, the effect of controlling the driver board can be achieved by controlling the computer. For example, instructions can be input to the driver board, and then the driver board controls the light board to control the brightness, light intensity or color of the light. When the driver board and the light board are tested, there are various cases. One case is that the driver board is damaged, one case is that the light board is damaged, and one case is that both the driver board and the light board are damaged. Therefore, when the driver board and the light board are tested, the electrical connection of the first probe set and the second probe set can be used to test whether the driver board and the light board are damaged. For example, the light of the light board can be observed to determine whether the driver board and the light board are damaged. If both the driver board and the light board have a response, it means that both the driver board and the light board are tested qualified. If the light is not bright or has no response, the first probe set can be electrically connected to an ammeter and a voltmeter to test whether the parameters of the driver board are normal. Similarly, the second probe set can be electrically connected to a power supply to test whether the light of the light board is normal.

[0026] Further, please refer to Figure 2In some embodiments, the test tool 10 comprises a first assembly 300, which comprises a first placing member 310. The first placing member 310 is provided with a first placing groove, which is arranged as the first placing station 100. Specifically, the shape of the first placing groove can be adapted to the driving board, for example, the driving board is a cuboid, and the first placing groove is designed as a corresponding cuboid groove, and the groove wall is provided with a slight guide slope, which facilitates the driving board to be quickly and smoothly placed. The first placing member 310 can be made by milling, grinding and other processes, which can ensure the flatness and dimensional accuracy of the first placing groove, and ensure that the driving board can be stably and accurately placed. The groove bottom of the first placing groove can also be provided with a layer of silica gel pad to avoid hard contact between the driving board and the placing groove, which can cause surface scratches or damage.

[0027] Further, in some embodiments, the first placing groove has a plurality of first placing grooves. The plurality of first placing grooves are arranged at intervals along the length direction of the first placing member 310. Specifically, the first placing groove can have two, three, four, five, eight or ten, etc. After the plurality of first placing grooves are arranged at intervals, it is convenient to place a plurality of driving boards, so as to realize the simultaneous testing of a plurality of driving boards and improve the testing efficiency.

[0028] Further, please refer to Figure 3 In some embodiments, the test tool 10 comprises a second assembly 400, which comprises a second placing member 410, and the second placing member 410 is provided with a second placing groove, which is arranged as the second placing station 200. Specifically, the shape of the second placing groove can be adapted to the lamp board, for example, the lamp board is a cuboid, and the second placing groove is designed as a corresponding cuboid groove, and the groove wall is provided with a slight guide slope, which facilitates the lamp board to be quickly and smoothly placed. The second placing member 410 can be made by milling, grinding and other processes, which can ensure the flatness and dimensional accuracy of the second placing groove, and ensure that the lamp board can be stably and accurately placed. The groove bottom of the second placing groove can also be provided with a layer of silica gel pad to avoid hard contact between the lamp board and the groove bottom, which can cause surface scratches or damage.

[0029] Further, in some embodiments, the second placing groove has a plurality of second placing grooves, and the plurality of second placing grooves are arranged at intervals along the length direction of the second placing member 410. Specifically, the second placing groove can have two, three, four, five, eight or ten, etc. After the plurality of second placing grooves are arranged at intervals, it is convenient to place a plurality of lamp boards, so as to realize the simultaneous testing of a plurality of lamp boards and improve the testing efficiency.

[0030] Further, please refer to Figure 1 and Figure 4In some embodiments, the first assembly 300 comprises a first moving member 320. The first moving member 320 is connected to the first probe set, and the first moving member 320 is capable of moving to drive the first probe set to approach or move away from the first placement station 100. Specifically, the first moving member 320 moves to drive the first probe set to steadily approach the driving board on the first placement station 100 until the probes are in close contact with the test points of the driving board. After the test is completed, the first moving member 320 can move reversely to drive the first probe set to move away from the first placement station 100, which facilitates the operator to take out the driving board. The first moving member 320 can be firmly connected to the first probe set, such as by bolt connection or welding, to ensure that no relative displacement occurs between the two during the movement. The first moving member 320 can be driven by a motor or a pneumatic cylinder, and the first moving member 320 can also be manually driven.

[0031] Further, how the first moving member 320 moves is introduced below. Please refer to Figure 1 and Figure 4In particular, in some embodiments, the first assembly 300 further comprises a first operating member 330, a first fixing member 340 and a first rotating member 350. The first fixing member 340 serves as a mounting base of the whole first assembly 300, and is usually fixed on a rack of the test fixture 10. The first fixing member 340 can be made of metal material, such as aluminum alloy or stainless steel, to ensure sufficient structural strength and stability. The first fixing member 340 is provided with a first through hole. The first through hole formed on the first fixing member 340 provides a smooth guide surface for the sliding of the first moving member 320. The hole wall of the first through hole extends in the vertical direction. The first moving member 320 is tightly fitted in the first through hole, which can ensure smooth sliding of the first moving member 320 and avoid excessive radial shaking. The first moving member 320 is arranged in the first through hole. The first operating member 330 comprises a first operating part 331 and a first connecting part 332 connected to each other. The first operating part 331 and the first connecting part 332 can be flexibly connected. The first operating part 331 is designed as a structure convenient for an operator to hold, such as a circular handle or a rod-shaped structure with anti-skid lines, to facilitate the application of force. The first connecting part 332 is made of a metal rod with strong rigidity to ensure that it will not deform when transmitting power. The two ends of the first rotating member 350 are respectively rotatably connected to one end of the first moving member 320 and one end of the first connecting part 332. The other end of the first connecting part 332 is rotatably connected to the first fixing member 340. The first operating member 330 can drive the first rotating member 350 to rotate to make the first moving member 320 slide in the first through hole by operating the first operating part 331. Specifically, when the operator operates the first operating part 331, such as pressing the first operating part 331 downward or lifting the first operating part 331 upward, the first connecting part 332 will be rotated around the connecting point between the first connecting part 332 and the first fixing member 340, and then the first moving member 320 will be pushed or pulled by the first rotating member 350 to make the first moving member 320 smoothly slide along the axial direction in the first through hole, so as to finally realize the action of the first probe group approaching or moving away from the first placement station 100. In this way, this can facilitate the user to make the first probe group approach or move away from the driving plate.

[0032] Further, please refer to Figure 1 and Figure 5In some embodiments, the second assembly 400 comprises a second moving member 420. The second moving member 420 is connected to the second probe group, and the second moving member 420 is capable of moving to drive the second probe group to approach or move away from the second placement station 200. Specifically, the second moving member 420 moves to drive the second probe group to steadily approach the lamp panel on the second placement station 200 until the probes are in close contact with the test points of the lamp panel. After the test is completed, the second moving member 420 can move reversely to drive the second probe group to move away from the second placement station 200, so as to facilitate the operator to take out the lamp panel. The second moving member 420 can be firmly connected with the second probe group, such as by bolt connection or welding, to ensure that no relative displacement occurs between the two during the movement. The second moving member 420 can be driven by a motor or a pneumatic cylinder, and the second moving member 420 can also be manually driven.

[0033] Further, how the second moving member 420 moves is introduced below. Please refer to Figure 1 and Figure 5In particular, in some embodiments, the second assembly 400 further comprises a second operating member 430, a second fixing member 440 and a second rotating member 450. The second fixing member 440 is usually fixed on the rack of the test tool 10 as the installation base of the whole second assembly 400, and can be made of metal material such as aluminum alloy or stainless steel to ensure sufficient structural strength and stability. The second fixing member 440 is provided with a second through hole, and the second through hole formed on the second fixing member 440 provides a smooth guide surface for the sliding of the second moving member 420. The hole wall of the second through hole extends in the vertical direction. The second moving member 420 is tightly fitted in the second through hole, which can ensure smooth sliding of the second moving member 420 and avoid excessive radial shaking. The second moving member 420 is arranged in the second through hole. The second operating member 430 comprises a second operating part 431 and a second connecting part 432 connected to each other, and the second operating part 431 and the second connecting part 432 can be flexibly connected. The second operating part 431 is designed as a structure convenient for an operator to hold, such as a circular handle or a rod-shaped structure with anti-skid lines, to facilitate the application of force. The second connecting part 432 is made of a metal rod with strong rigidity to ensure that it will not deform when transmitting power. The two ends of the second rotating member 450 are respectively rotatably connected to one end of the second moving member 420 and one end of the second connecting part 432, and the other end of the second connecting part 432 is rotatably connected to the second fixing member 440. The second operating member 430 can drive the second rotating member 450 to rotate to make the second moving member 420 slide in the second through hole by operating the second operating part 431. Specifically, when the operator operates the second operating part 431, such as pressing the second operating part 431 downward or lifting the second operating part 431 upward, it will drive the second connecting part 432 to rotate around the connecting point of the second connecting part 432 and the second fixing member 440, and then push or pull the second moving member 420 through the second rotating member 450, so that the second moving member 420 smoothly slides in the second through hole along the axial direction, and finally realizes the action of the second probe group approaching or moving away from the second placement station 200. In this way, this can facilitate the user to make the second probe group approach or move away from the lamp panel.

[0034] Further, please refer to Figure 5In some embodiments, the second assembly 400 comprises a first plate 460 and a second plate 470. The first plate 460 is connected to the second probe group, and the second plate 470 is connected to the second moving part 420. The first plate 460 and the second plate 470 are detachably connected. Specifically, the first plate 460 is directly connected to the second probe group, and the connection mode can be slot connection or bolt connection, facilitating the installation, disassembly and replacement of the second probe group. The second plate 470 can be fixedly connected to the second moving part 420, and the connection mode is usually bolt connection, ensuring the connection strength and stability between the two. The first plate 460 and the second plate 470 are detachably connected, such as through buckle connection, bolt connection or positioning pin and bolt connection. With this detachable connection structure, when the second probe group needs to be replaced, the first plate 460 only needs to be detached from the second plate 470, and the first plate 460 with the corresponding second probe group can be replaced, without the need to adjust or disassemble other components such as the second moving part 420, greatly shortening the replacement time of the second probe group and improving the universality and testing efficiency of the testing tool 10. In addition, when the first plate 460 or the second plate 470 is damaged, the damaged part can also be replaced alone, reducing the maintenance cost. In addition, it should be noted that the same setting mode as described above can also be adopted in the first assembly 300.

[0035] The embodiments of the present application are described in detail above with reference to the drawings, but the present application is not limited to the above-described embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the purpose of the present application. In addition, the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

Claims

1. A testing fixture, characterized in that, include: The first placement station is used to place the driver board; The second placement station is used to place the light panel; The first probe group includes a first input terminal and a first output terminal, both of which are used to electrically connect to the driver board. The second probe group includes a second input terminal and a second output terminal, both of which are used to electrically connect to the lamp board. The first probe group and the second probe group are electrically connected so that the driver board can control the lamp board.

2. The test fixture according to claim 1, characterized in that, The test fixture includes a first component, the first component includes a first placement part, the first placement part is provided with a first placement slot, and the first placement slot is set as the first placement station.

3. The testing fixture according to claim 2, characterized in that, The first placement slot has multiple slots, which are spaced apart along the length of the first placement member.

4. The testing fixture according to claim 2, characterized in that, The test fixture includes a second component, which includes a second placement component. The second placement component is provided with a second placement slot, which is configured as a second placement station.

5. The testing fixture according to claim 4, characterized in that, The second placement slot has multiple slots, which are spaced apart along the length of the second placement member.

6. The test fixture according to claim 2, characterized in that, The first component includes a first moving part, which is connected to the first probe group. The first moving part is capable of movement to move the first probe group closer to or away from the first placement station.

7. The test fixture according to claim 6, characterized in that, The first component further includes a first operating member, a first fixing member, and a first rotating member. The first fixing member is provided with a first through hole, and the first moving member is disposed in the first through hole. The first operating member includes a first operating part and a first connecting part that are connected to each other. The two ends of the first rotating member are respectively rotatably connected to one end of the first moving member and one end of the first connecting part. The other end of the first connecting part is rotatably connected to the first fixing member. By operating the first operating part, the first operating member can drive the first rotating member to rotate, so that the first moving member slides in the first through hole.

8. The test fixture according to claim 4, characterized in that, The second component includes a second moving part connected to the second probe group. The second moving part is capable of movement to move the second probe group closer to or away from the second placement station.

9. The test fixture according to claim 8, characterized in that, The second component further includes a second operating member, a second fixing member, and a second rotating member. The second fixing member is provided with a second through hole, and the second moving member is disposed in the second through hole. The second operating member includes a second operating part and a second connecting part that are connected to each other. The two ends of the second rotating member are respectively rotatably connected to one end of the second moving member and one end of the second connecting part. The other end of the second connecting part is rotatably connected to the second fixing member. By operating the second operating part, the second operating member can drive the second rotating member to rotate, so that the second moving member slides in the second through hole.

10. The test fixture according to claim 8, characterized in that, The second component includes a first plate and a second plate, the first plate being connected to the second probe group and the second plate being connected to the second moving part, and the first plate and the second plate being detachably connected.

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