A multi-dimensional verification method, device and medium of a DPS board card

Abstract

The application discloses a multi-dimension verification method and device of a DPS board card and a medium, and is applied to the field of integrated circuit verification. The method comprises the following steps: acquiring multi-dimension parameters output by a DPS board card under different programs and / or different configuration parameters; judging whether each dimension parameter in the multi-dimension parameters meets a corresponding setting standard, and generating a comprehensive report according to a judgment result; acquiring each dimension parameter corresponding to the setting standard which is not met in the comprehensive report, and determining a corresponding verification result level according to the dimension parameter corresponding to the setting standard which is not met; determining a DPS board card design optimization suggestion corresponding to the verification result level based on an optimization standard, so as to construct the DPS board card according to the optimized DPS board card design requirement. In the method, the multi-dimension parameters are acquired, so that comprehensive verification of the DPS board card is realized, and the performance and stability of the board card are evaluated; and the optimization suggestion is further provided, thereby providing strong support for design optimization and quality assurance of the DPS board card.

Description

Technical Field

[0001] This application relates to the field of integrated circuit verification, and in particular to a multi-dimensional verification method, device and medium for DPS boards. Background Technology

[0002] With the continuous expansion of integrated circuit design scale and the increasing complexity of devices, the role of testing systems in product development and mass production is becoming increasingly critical. As one of the core functional modules of automated test equipment, the DPS (Device Power Supply / System) board is responsible for providing stable and controllable power and measurement functions to the device under test (DUT) during the testing process, and its performance directly affects the accuracy and reliability of the test results.

[0003] However, due to the diversity of test objects and the complexity of application scenarios, single-dimensional verification methods are often insufficient to comprehensively evaluate the performance and stability of DPS boards. Traditional DPS verification methods mostly focus on basic measurement indicators such as voltage and current, lacking a systematic examination of dynamic response characteristics, long-term stability, and boundary operating conditions. This may not only lead to potential software and hardware vulnerabilities being exposed during mass production, but also reduce the overall efficiency of the testing platform.

[0004] Given the aforementioned technologies, finding a systematic verification method for DPS that covers multiple dimensions and scenarios is an urgent problem for those skilled in the art to solve. Summary of the Invention

[0005] The purpose of this application is to provide a multi-dimensional verification method, device, and medium for DPS boards. This addresses the problem that existing single-dimensional verification methods are often insufficient to comprehensively evaluate the performance and stability of DPS boards, leading to potential software and hardware vulnerabilities being exposed during mass production and reducing the overall efficiency of the testing platform.

[0006] To address the aforementioned technical problems, this application provides a multi-dimensional verification method for DPS boards, including:

[0007] Obtain multi-dimensional parameters output by the DPS board under different programs and / or different configuration parameters. These multi-dimensional parameters include current and voltage parameters, resolution parameters, output capability parameters, scanning parameters, and API interface capability parameters.

[0008] Determine whether each dimension parameter in the multi-dimensional parameters meets the corresponding setting criteria, and generate a comprehensive report based on the determination results;

[0009] Obtain the parameters of each dimension that do not meet the set criteria from the comprehensive report, and determine the corresponding verification result level based on the parameters of each dimension that do not meet the set criteria.

[0010] Based on the optimization criteria, we determine the DPS board design optimization suggestions corresponding to the verification result level, so as to build DPS boards according to the optimized DPS board design requirements.

[0011] Preferably, the current and voltage parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0012] Obtain the forced voltage output by the DPS board under the current and voltage detection program corresponding to the current and voltage dimension parameters sent by the host computer;

[0013] In the current and voltage detection program and under forced voltage, multiple sets of initial forced currents output by the DPS board are obtained by single-point current sampling and multi-point current sampling methods, so as to construct the forced current based on the multiple sets of initial forced currents; among them, forced voltage and forced current both constitute current and voltage dimension parameters.

[0014] Preferably, determining whether the current and voltage dimension parameters meet the corresponding setting standards includes:

[0015] When the current and voltage dimension parameters are set to forced voltage, it is determined whether the forced voltage is within the voltage accuracy range. If the forced voltage is within the voltage accuracy range, the forced voltage in the current and voltage dimension parameters meets the corresponding setting standard. If the forced voltage is outside the voltage accuracy range, the forced voltage in the current and voltage dimension parameters does not meet the corresponding setting standard.

[0016] When the current-voltage dimension parameter is a forced current, it is determined whether the forced current difference corresponding to each initial forced current in the forced current is within the current accuracy range. If each forced current difference is within the current accuracy range, then the forced current in the current-voltage dimension parameter meets the corresponding setting standard. If any forced current difference is outside the current accuracy range, then the forced current in the current-voltage dimension parameter does not meet the corresponding setting standard.

[0017] Preferably, the resolution dimension parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0018] Obtain the resolution detection program corresponding to the resolution dimension parameters sent by the host computer to the DPS board, as well as the two voltage resolutions output under two forced voltages with different values;

[0019] In the DPS board receiving resolution detection program, multiple initial current resolutions output by the DPS board are obtained using single-point current sampling and multi-point current sampling methods, so as to construct the current resolution based on the multiple initial current resolutions; among them, voltage resolution and current resolution constitute the resolution dimension parameters.

[0020] Preferably, determining whether the resolution dimension parameter meets the corresponding setting standard includes:

[0021] When the resolution dimension parameter is voltage resolution, the voltage resolution difference between two voltage resolutions is obtained. If the voltage resolution difference is within the voltage resolution accuracy range, then the voltage resolution in the resolution dimension parameter meets the corresponding setting standard.

[0022] When the resolution dimension parameter is current resolution, the average current resolution of each initial current resolution sampled under single-point current sampling mode and multi-point current sampling mode is obtained respectively. If the difference between the average current resolution corresponding to the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is within the current resolution accuracy range, then the current resolution in the resolution dimension parameter meets the corresponding setting standard. If the difference between the average current resolution corresponding to any single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is outside the current resolution accuracy range, then the current resolution in the resolution dimension parameter does not meet the corresponding setting standard.

[0023] Preferably, the output capability dimension parameters of the DPS board under different programs and / or different configuration parameters are obtained, including:

[0024] The output voltage and current parameter sets of the DPS board are obtained under the output capability detection program corresponding to the output capability dimension parameters sent by the host computer. The voltage and current parameter sets constitute the output capability dimension parameters.

[0025] Accordingly, it is determined whether the output capability dimension parameters meet the corresponding setting standards, including:

[0026] Determine the current parameters corresponding to each voltage parameter in the current parameter group and the voltage parameter group respectively;

[0027] Determine whether each set of voltage parameters and corresponding current parameters are within the range of capability fluctuation accuracy;

[0028] If all voltage parameters and corresponding current parameters are within the capability fluctuation accuracy range, then the output capability dimension parameters meet the corresponding setting standards.

[0029] If any set of voltage parameters and corresponding current parameters are outside the capability fluctuation accuracy range, then the output capability dimension parameters do not meet the corresponding setting standards.

[0030] Preferably, the scanning dimension parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0031] The scanning detection program corresponding to the scanning dimension parameters sent by the host computer to the DPS board is obtained, as well as the measurement current corresponding to each scanning point output through a preset resistor under different scanning point voltages; where each measurement current constitutes the scanning dimension parameters.

[0032] Accordingly, it is determined whether the scan dimension parameters meet the corresponding setting standards, including:

[0033] Determine whether the measured current corresponding to each scanning point is within the accuracy range of the scanning current;

[0034] If all measured currents are within the accuracy range of the scanning current, then the scanning dimension parameters meet the corresponding setting standards.

[0035] If any of the measured currents is outside the accuracy range of the scanning current, then the scanning dimension parameter does not meet the corresponding setting standard.

[0036] Preferably, the API interface capability dimension parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0037] The API interface capability detection program corresponding to the API interface capability dimension parameters sent by the host computer to the DPS board is obtained, as well as the continuous sending time of each API interface under different sampling periods; where the continuous sending time of each API interface constitutes the API interface capability dimension parameters.

[0038] Accordingly, it is necessary to determine whether the API interface capability parameters meet the corresponding setting standards, including:

[0039] Determine whether each continuous delivery time is less than the delivery threshold;

[0040] If all continuous delivery times are less than the delivery threshold, then the API interface capability dimension parameters meet the corresponding setting standards.

[0041] If any continuous delivery time is not less than the delivery threshold, then the API interface capability dimension parameter does not meet the corresponding setting standard.

[0042] On the other hand, this application also provides an electronic device, including a memory for storing computer programs;

[0043] The processor is used to implement the steps of the multi-dimensional verification method for the DPS board described above when executing computer programs.

[0044] On the other hand, this application also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the multi-dimensional verification method for the DPS board described above.

[0045] This application provides a multi-dimensional verification method for DPS boards. This method acquires multi-dimensional parameters output by the DPS board under different programs and / or different configuration parameters, thereby achieving comprehensive multi-dimensional verification of the DPS board to fully evaluate its performance and stability. Furthermore, the multi-dimensional verification method provided in this application also offers optimization suggestions for parameters that do not meet the setting standards, realizing a closed loop of multi-dimensional verification-analysis-feedback optimization, thus providing strong support for the design optimization and quality assurance of DPS boards. Attached Figure Description

[0046] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 A flowchart illustrating a multi-dimensional verification method for a DPS board provided in this application embodiment;

[0048] Figure 2 The interactive function diagram corresponding to the system architecture provided in the embodiments of this application;

[0049] Figure 3 A structural diagram of an electronic device provided in another embodiment of this application. Detailed Implementation

[0050] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0051] The core of this application is to provide a multi-dimensional verification method, device, and medium for DPS boards.

[0052] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0053] Figure 1A flowchart illustrating a multi-dimensional verification method for a DPS board provided in this application embodiment is shown below. Figure 1 As shown, the process includes the following:

[0054] S10: Obtain multi-dimensional parameters output by the DPS board under different programs and / or different configuration parameters, including current and voltage dimension parameters, resolution dimension parameters, output capability dimension parameters, scan dimension parameters, and API interface capability dimension parameters.

[0055] S11: Determine whether each dimension parameter in the multi-dimensional parameters meets the corresponding setting criteria, and generate a comprehensive report based on the judgment result.

[0056] S12: Obtain the parameters of each dimension that do not meet the set criteria in the comprehensive report, and determine the corresponding verification result level based on the parameters of each dimension that do not meet the set criteria.

[0057] S13: Determine the DPS board design optimization suggestions corresponding to the verification result level based on the optimization criteria, so as to build the DPS board according to the optimized DPS board design requirements.

[0058] In a specific embodiment, the multi-dimensional verification method for DPS boards provided in this application is specifically applied to a hardware-software collaborative system architecture. This architecture consists of a hardware layer and a software layer, forming a closed-loop verification system covering "test execution—result acquisition—data analysis—feedback optimization". The connection relationships between each layer are as follows: Software layer: responsible for strategy and scheduling (process / data management); DSP (Device Power Supply): responsible for high-speed real-time calculation and control; Load module: serves as the interface and environment simulator for the object under test; Automatic Test Equipment (ATE): acts as a platform to unify the various parts, ensuring timing, communication, and synchronization. The DPS board and ATE interface serve as the object under test. The DPS connects to the ATE system through a standardized interface, supporting the input and output of multi-channel signals such as voltage, current, and protection mechanisms. Load module: used to simulate the power load characteristics under different operating conditions, verifying the performance of the DPS under dynamic and extreme conditions. Software layer test management module: responsible for the configuration and scheduling of test plans, including the selection of multi-dimensional test cases, control of execution order, and handling of abnormal situations. Its specific interactive functions are as follows: Figure 2 As shown, the PC side refers to the software part of ATE, which includes multiple CMD (command line) commands; the DPS side refers to the DPS board, which includes multiple DUTs (Device Under Test). The two sides interact and transmit data through command strings and return strings.

[0059] In the specific implementation method, the preliminary preparations are as follows:

[0060] 1. First obtain the safe range of DPS board output for various types of books.

[0061] 2. DPS Board Information and Function Analysis. Multi-channel parallel: synchronous triggering, time alignment, cross-card synchronization (external trigger / backplane clock); automatic range switching (Auto Range) and integral sampling (NPLC / average); four-wire Kelvin measurement (optional Relay Matrix); DUT protection: soft start (Slew limit), soft shutdown, surge / surge suppression; readback: actual output voltage and current readback (closed-loop diagnostics).

[0062] 3. Software and Interface Status Monitoring. Host Computer API: Programming language (C / C++ & Python) bindings; provides command sequences (e.g., SET_V, MEAS_I, SWEEP_V, RANGE_AUTO, CAL*); Pattern Integration: provides TPAT / PatternHook (Hook Method in Template Method Pattern) and hardware triggering (TRIG-IN / OUT); Data Channel: DMA (Direct Memory Access) / PCIe (High-Speed ​​Peripheral Component Interconnect Standard) or Gigabit Ethernet to the host controller.

[0063] In practical applications, the C++ programming language is suitable for developing such test and verification programs due to its high performance, low footprint, and extensive support libraries.

[0064] 4. The system supports users configuring codes and sending test commands via the application. The server then performs parameter settings and task allocation on the DPS board based on these commands. The application also has a task invocation function, which, based on the code definition and resistor allocation, invokes scanning resistance tests at different ranges, measures the relevant results, and schedules relevant APIs (Application Programming Interfaces) according to test requirements and board status to verify the required test tasks.

[0065] 5. The system log database stores board information and test data, ensuring data integrity and consistency. The system also provides data backup and recovery functions, periodically backing up data from the log database to designated storage media to prevent data loss or corruption.

[0066] In summary, it can be broadly understood as two parts: system deployment and output management. For system deployment, before deployment, the corresponding hardware and software environments need to be prepared. The hardware environment includes the test machine DPS board, network devices, source Measure Unit (SMU), and multimeter; the software environment includes the Ubuntu operating system and necessary development libraries. During deployment, each component needs to be installed in the designated location according to the system architecture and configuration requirements, and necessary configuration and optimization should be performed. Simultaneously, it is necessary to ensure the system's network connectivity and security, avoiding potential security vulnerabilities. The DPS board runs UDPServer (a server program / object based on the UDP protocol (User Datagram Protocol)) software, connects to the PC using a network port and cable, ensuring the DPS and PC are on the same network segment and can ping (essentially network echolocation) the relevant gateway address to test communication success. When the DPS board recognizes a specific signal, it will send its own board information to the PC.

[0067] For output management, it is necessary to analyze and compare the measurement results of the DPS board. The DPS board measurement result output includes: DUT information, Measure_points (referring to the definition of each measurement point), interval_time (us) (referring to the minimum idle time that must be left between two consecutive measurements), Expect_Measure_Current (mA) (referring to the current value we expect to read at this measurement point), Actual_Measure_Current (mA) (referring to the current value actually sampled back by the instrument at this measurement point), Diff (uA) (referring to the difference between Actual_Measure_Current and Expect_Measure_Current), Measure_result (referring to the final "conclusion record" given after completing "send command - read back actual measurement - calculate Diff - determine limit" for a measurement point), etc. By outputting the data into an Excel spreadsheet in a specified directory, further processing can be performed, including result analysis, problem tracking, system optimization, and code implementation, to improve the accuracy of the DPS board verification method.

[0068] The specific steps for multi-dimensional analysis and verification of the DPS board's output parameters are as follows: First, obtain the multi-dimensional parameters output by the DPS board under different programs and / or different configuration parameters. These multi-dimensional parameters include current / voltage, resolution, output capability, scanning, and API interface capability parameters. It should be noted that the parameters provided in this application are the minimum; additional parameters can be added as needed. Then, determine whether each dimension parameter meets the corresponding setting standard, and generate a comprehensive report based on the results. It's important to note that multi-dimensional verification of the DPS board does not ultimately result in a "good" or "bad" standard, but rather a comprehensive report describing the specific values ​​of each dimension parameter. Based on the setting standards (which can also be understood as safety usage standards) for each dimension parameter, it can be determined which dimension parameters meet the standards and which do not. A comprehensive analysis of the dimension parameters that do not meet the standards yields the corresponding verification result level. For example, if three dimension parameters do not meet the corresponding setting standards, the current verification result is Level 1; if five dimension parameters do not meet the corresponding setting standards, the current verification result is Level 2, and so on. Once the verification result level is obtained, the DPS board design optimization suggestions corresponding to the verification result level are determined based on the optimization criteria. This way, the optimization suggestions can be referenced in the subsequent DPS board design process to obtain the final DPS board.

[0069] This application provides a multi-dimensional verification method for DPS boards, comprising: acquiring multi-dimensional parameters output by the DPS board under different programs and / or different configuration parameters, wherein the multi-dimensional parameters include current and voltage dimension parameters, resolution dimension parameters, output capability dimension parameters, scanning dimension parameters, and API interface capability dimension parameters; determining whether each dimension parameter in the multi-dimensional parameters meets the corresponding setting standard, and generating a comprehensive report based on the judgment result; acquiring the dimension parameters in the comprehensive report that do not meet the setting standard, and determining the corresponding verification result level based on the dimension parameters that do not meet the setting standard; determining DPS board design optimization suggestions corresponding to the verification result level based on optimization standards, so as to construct the DPS board according to the optimized DPS board design requirements. This method achieves comprehensive multi-dimensional verification of the DPS board by acquiring the multi-dimensional parameters output by the DPS board under different programs and / or different configuration parameters, thereby comprehensively evaluating the performance and stability of the DPS board. Furthermore, the multi-dimensional verification method provided in this application also provides optimization suggestions for the dimension parameters that do not meet the setting standard, realizing a closed loop of multi-dimensional verification-analysis-feedback optimization, thus providing strong support for the design optimization and quality assurance of the DPS board.

[0070] In the above embodiments, if the multi-dimensional parameters are current and voltage dimension parameters, then the current and voltage dimension parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0071] Obtain the forced voltage output by the DPS board under the current and voltage detection program corresponding to the current and voltage dimension parameters sent by the host computer;

[0072] In the current and voltage detection program and under forced voltage, multiple sets of initial forced currents output by the DPS board are obtained by single-point current sampling and multi-point current sampling methods, so as to construct the forced current based on the multiple sets of initial forced currents; among them, forced voltage and forced current both constitute current and voltage dimension parameters.

[0073] Accordingly, it is necessary to determine whether the current and voltage parameters meet the corresponding setting standards, including:

[0074] When the current and voltage dimension parameters are set to forced voltage, it is determined whether the forced voltage is within the voltage accuracy range. If the forced voltage is within the voltage accuracy range, the forced voltage in the current and voltage dimension parameters meets the corresponding setting standard. If the forced voltage is outside the voltage accuracy range, the forced voltage in the current and voltage dimension parameters does not meet the corresponding setting standard.

[0075] When the current-voltage dimension parameter is a forced current, it is determined whether the forced current difference corresponding to each initial forced current in the forced current is within the current accuracy range. If each forced current difference is within the current accuracy range, then the forced current in the current-voltage dimension parameter meets the corresponding setting standard. If any forced current difference is outside the current accuracy range, then the forced current in the current-voltage dimension parameter does not meet the corresponding setting standard.

[0076] In a specific embodiment, for the forced voltage, a DPS board is used as the hardware interface. After the corresponding program is issued, it outputs a forced voltage range. An SMU (Source Measure Unit) is used to measure whether the forced voltage issued by the DPS is within the specified accuracy range (0V~4V±(1%)), and the client compares the result to determine whether it conforms or not. For example, the DPS outputs a ForceVoltage range of 4V, but the SMU measurement result is 3.865V, which is within the 0V~4V±(1%) range, so it is considered to conform.

[0077] In a specific embodiment, for the forced current (Current measure range), the DUT on the DPS board to be tested is selected. Based on the Force Voltage Range output by the DPS board, the SMU is used to measure the current. Two APIs (Application Programming Interfaces) are used for measurement: one sampling interval of 0µs using the instruction (SML_MEAS_DPS2) and one sampling interval of 15µs using the instruction (SML_MEAS_DPS2). The measured current results need to be run 10 times, and each measurement result is compared with the expected result to analyze whether it is within the specified accuracy range. When the Current measure range is ±1mA, the current accuracy range is ±(0.2%+1.5µA); when the Current measure range is ±400mA, the current accuracy range is ±(2%+2mA). Judgments are made based on different ranges.

[0078] In the above embodiments, if the multi-dimensional parameter is a resolution dimension parameter, then obtaining the resolution dimension parameter output by the DPS board under different programs and / or different configuration parameters includes:

[0079] Obtain the resolution detection program corresponding to the resolution dimension parameters sent by the host computer to the DPS board, as well as the two voltage resolutions output under two forced voltages with different values;

[0080] Under the DPS board receiving resolution detection program, multiple initial current resolutions output by the DPS board are obtained by single-point current sampling and multi-point current sampling methods, so as to construct the current resolution based on the multiple initial current resolutions; among them, voltage resolution and current resolution constitute the resolution dimension parameters.

[0081] Accordingly, it is determined whether the resolution dimension parameters meet the corresponding setting standards, including:

[0082] When the resolution dimension parameter is voltage resolution, the voltage resolution difference between two voltage resolutions is obtained. If the voltage resolution difference is within the voltage resolution accuracy range, then the voltage resolution in the resolution dimension parameter meets the corresponding setting standard.

[0083] When the resolution dimension parameter is current resolution, the average current resolution of each initial current resolution sampled under single-point current sampling mode and multi-point current sampling mode is obtained respectively. If the difference between the average current resolution corresponding to the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is within the current resolution accuracy range, then the current resolution in the resolution dimension parameter meets the corresponding setting standard. If the difference between the average current resolution corresponding to any single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is outside the current resolution accuracy range, then the current resolution in the resolution dimension parameter does not meet the corresponding setting standard.

[0084] In a specific embodiment, for the Force Voltage resolution, a DPS board is used as the hardware interface. Based on the resolution detection program, when the Force Voltage range of the DPS board is 0V~4V±(1%), the Force Voltage Resolution is 2.44mV. Under the condition of DPS Force 0 DAC Voltage, the SMU is used to measure the first measurement result and record it. Under the condition of DPS Force 1 DAC Voltage, the SMU is used to measure the second measurement result and record it. The difference between the two results is then calculated. This result is equal to the voltage resolution difference. It is determined whether it is around 2.44MV. If the result differs by more than two times, it is determined that it does not meet the set standard.

[0085] For current resolution, the SMU acts as the current output, emitting current from different DACs. The DPS board measures the current. The program issues commands to perform measurements using two APIs: one with a sampling interval of 0µs (SML_MEAS_DPS2) and the other with 1000 samplings at 15µs intervals (SML_MEAS_DPS2). The final result is averaged over 100 measurements. Then, with current resolutions of 91.6nA for 1mA and 36.6µA for 400mA, and with SMU Forced 0 for DAC Current, the first measurement using DPS is recorded. With DPS Forced 1 for DAC Current, the second measurement is recorded. The difference between the two results is calculated, representing a current resolution difference. This difference is used to determine if the current at the 1mA range is around 91.6nA (current resolution accuracy range). A difference of more than two times indicates a non-compliance with the set standard. Similarly, it is used to determine if the current at the 400mA range is around 36.6nA. A difference of more than two times also indicates a non-compliance with the set standard.

[0086] In the above embodiments, if the multi-dimensional parameter is an output capability dimension parameter, then the output capability dimension parameter output by the DPS board under different programs and / or different configuration parameters is obtained, including:

[0087] The output voltage and current parameter sets of the DPS board are obtained under the output capability detection program corresponding to the output capability dimension parameters sent by the host computer. The voltage and current parameter sets constitute the output capability dimension parameters.

[0088] Accordingly, it is determined whether the output capability dimension parameters meet the corresponding setting standards, including:

[0089] Determine the current parameters corresponding to each voltage parameter in the current parameter group and the voltage parameter group respectively;

[0090] Determine whether each set of voltage parameters and corresponding current parameters are within the range of capability fluctuation accuracy;

[0091] If all voltage parameters and corresponding current parameters are within the capability fluctuation accuracy range, then the output capability dimension parameters meet the corresponding setting standards.

[0092] If any set of voltage parameters and corresponding current parameters are outside the capability fluctuation accuracy range, then the output capability dimension parameters do not meet the corresponding setting standards.

[0093] In a specific embodiment, the corresponding pins of the DPS board, a 7.5-ohm resistor, and the SMU are connected in series. A voltage is applied, the current is measured using the SMU, and the voltage output by the DPS is measured using the DMM. Output capability parameters: OutputCurrent: 3.8V-4V, 340mA / ch; 0V-3.8V, 400mA / ch. When the voltage parameter DPS Force is between 3V and 3.8V, the maximum current measured by the SMU is 400mA / ch; when the voltage parameter DPS Force is between 3.8V and 4V, the maximum current measured by the SMU is 340mA / ch.

[0094] In the above embodiments, if the multi-dimensional parameters are scan dimension parameters, then the scan dimension parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0095] The scanning detection program corresponding to the scanning dimension parameters sent by the host computer to the DPS board is obtained, as well as the measurement current corresponding to each scanning point output through a preset resistor under different scanning point voltages; where each measurement current constitutes the scanning dimension parameters.

[0096] Accordingly, it is determined whether the scan dimension parameters meet the corresponding setting standards, including:

[0097] Determine whether the measured current corresponding to each scanning point is within the accuracy range of the scanning current;

[0098] If all measured currents are within the accuracy range of the scanning current, then the scanning dimension parameters meet the corresponding setting standards.

[0099] If any of the measured currents is outside the accuracy range of the scanning current, then the scanning dimension parameter does not meet the corresponding setting standard.

[0100] In a specific implementation, the DPS Module Resistance Sweep Testing function performs a resistance equivalent frequency sweep test. Here, "frequency sweep" doesn't refer to frequency, but rather to sweeping voltage points. The code progressively increases the voltage from 0V to 4V (in 2.44mV steps). Each voltage point corresponds to a current. This is equivalent to simulating a fixed-resistance load and verifying the linearity of the IV relationship (current-voltage) point by point. The program verifies the correctness of these currents point by point. For current measurement, select the Sweep test with a current range of 0~1mA, a voltage range of 0V~4V, and a minimum adjustable voltage step (resolution step) of 2.44mV for output (or quantization). With an external resistor of 4KΩ, determine whether the current measured by the DPS board at each scan point is within the scanning current accuracy range (Spec Current measure range: ±1mA ±(0.2%+1.5uA)). For current measurement, select the Sweep test with a current range of 0~400mA, a voltage range of 0V~4V, and a step of 2.44mV. With an external resistor of 10Ω, determine whether the current measured by the DPS board at each scan point is within the scanning current accuracy range (Spec Current measure range: ±400mA: ±(2%+2mA)).

[0101] In the above embodiments, if the multi-dimensional parameters are API interface capability dimension parameters, then the API interface capability dimension parameters output by the DPS board under different programs and / or different configuration parameters are obtained, including:

[0102] The API interface capability detection program corresponding to the API interface capability dimension parameters sent by the host computer to the DPS board is obtained, as well as the continuous sending time of each API interface under different sampling periods; where the continuous sending time of each API interface constitutes the API interface capability dimension parameters.

[0103] Accordingly, it is necessary to determine whether the API interface capability parameters meet the corresponding setting standards, including:

[0104] Determine whether each continuous delivery time is less than the delivery threshold;

[0105] If all continuous delivery times are less than the delivery threshold, then the API interface capability dimension parameters meet the corresponding setting standards.

[0106] If any continuous delivery time is not less than the delivery threshold, then the API interface capability dimension parameter does not meet the corresponding setting standard.

[0107] In specific embodiments, the verification of each API of the DPS board uses the following API verification methods: The SML_MEAS_DPS2 API verifies the combination of sampling count (n) and time interval (t), where n ranges from 1 to 4096 with a step of 100, and t ranges from 14µs to 32767µs with a step of 1ms. This is a Sweep test, requiring the DPS board to run continuously for an extended period (12 hours or more) and continuously provide test results. The SML_MEAS_DPS_RAW API verifies the combination of n and t, where n ranges from 1 to 4096 with a step of 100, and t ranges from 14µs to 32767µs with a step of 1ms. This is a Sweep test, also requiring the DPS board to run continuously for an extended period (12 hours or more) and continuously provide test results. During the test (DPS Module Obtain Measurement Raw Data Testing), the DPS single-point test pin VS... Test the VS pin 300 times. Use the DPS command (SML_MEAS_DPS_RAW) to measure 300 points on the VS pin. Then use the command (SML_GET_VS_RAW) to retrieve the 300 data points. Check if there are any data jumps in the test data under these two scenarios. Verify the average value of the VS pin under various conditions and whether the test results match. Test 100 times. Use the command "SML_MEAS_VS2(300, 10US)" to measure the average value and use the command "SML_READ_VS(DPS)" to read the measured value. Use the command "SML_MEAS_DPS_RAW(300, 10US)" to measure the average value and use the command "SML_READ_VS(DPS)" to read the measured value. Measurements are performed using the command "SML_MEAS_DPS_RAW(300, 10US)". Raw data is obtained using the command "SML_GET_VS_RAW, DPS_RAW". The 300 data points are summed and then divided by 300 to obtain the average. During the above process, measurements are performed using the command "MEAS_DPS_DUT_LOOP(CN, 300, 10US)". Raw data is obtained using the command "SML_GET_VS_RAW, DPS_RAW". For DPS resources, multiple API interfaces are involved. The read time before and after each API interface is verified, and the confirmation (check) time is checked to ensure it meets expectations (i.e., the continuous delivery time is less than the delivery threshold). Generally, the delivery time for one API is 2ms. Values ​​that are too high will indicate a significant anomaly. If an anomaly occurs, it means the settings are not met.

[0108] It should be noted that the embodiments provided in this application are only one possible implementation method, but are not limited to this only implementation method. Users can set their own implementation methods according to their needs.

[0109] In summary, the multi-dimensional verification method for DPS boards provided in this application has the following beneficial effects:

[0110] 1. Completeness: Utilizing the VSIM (Voltage Source & Current Measure) feature of the DPS board, the system covers functional dimensions, verifying the correctness of basic Force / Measure (voltage source mode operation), protection mechanisms, and communication interfaces. Performance-wise, it verifies accuracy, resolution, single-point, and multi-point stability under different voltage / current ranges. Reliability-wise, it verifies the system's robustness through long-term operation, overload protection, and testing. Interaction-wise, it examines timing, response latency, and data consistency during interaction with the ATE pattern (test vector) and DUT.

[0111] 2. Coverage of Scenarios: Stability verification under normal operating conditions and standard voltage and current ranges. Performance under boundary conditions, extreme voltage / current, sudden pulses, and load switching. Measurement accuracy and anti-interference capability in noisy environments with interference. Isolation and non-interference when multiple channels are running simultaneously in parallel scenarios.

[0112] 3. Diversity: VSIM enables rapid verification of algorithm logic and measurement methods. It verifies high-precision instruments and compares their performance to validate the actual hardware capabilities. ATE integration testing runs patterns in a real mass production environment to verify compatibility with the production system.

[0113] 4. Data and Decision-Making: Multi-dimensional verification generates more comprehensive data: raw measurement data, statistical analysis, and comparative differences can be analyzed through data mining to identify potential risks in advance (such as channel drift and batch consistency issues). This can support quality certification (such as ISO and customer acceptance testing).

[0114] Figure 3 A structural diagram of an electronic device provided in another embodiment of this application, such as... Figure 3 As shown, the electronic device includes: a memory 20 for storing computer programs;

[0115] The processor 21 is used to execute computer programs to implement the steps of the multi-dimensional verification method for the DPS board as mentioned in the above embodiments.

[0116] The electronic devices provided in this embodiment may include, but are not limited to, smartphones, tablets, laptops, or desktop computers.

[0117] The processor 21 may include one or more processing cores, such as a quad-core processor or an octa-core processor. The processor 21 may be implemented using at least one of the following hardware forms: Digital Signal Processor (DSP), Field-Programmable Gate Array (FPGA), or Programmable Logic Array (PLA). The processor 21 may also include a main processor and a coprocessor. The main processor, also known as the Central Processing Unit (CPU), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, the processor 21 may integrate a Graphics Processing Unit (GPU), which is responsible for rendering and drawing the content to be displayed on the screen. In some embodiments, the processor 21 may also include an Artificial Intelligence (AI) processor, which is used to handle computational operations related to machine learning.

[0118] The memory 20 may include one or more computer-readable storage media, which may be non-transitory. The memory 20 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In this embodiment, the memory 20 is used to store at least the following computer program 201, which, after being loaded and executed by the processor 21, is capable of implementing the relevant steps of the multi-dimensional verification method for the DPS board disclosed in any of the foregoing embodiments. In addition, the resources stored in the memory 20 may also include an operating system 202 and data 203, and the storage method may be temporary storage or permanent storage. The operating system 202 may include Windows, Unix, Linux, etc.

[0119] In some embodiments, the electronic device may further include a display screen 22, an input / output interface 23, a communication interface 24, a power supply 25, and a communication bus 26.

[0120] Those skilled in the art will understand that Figure 3 The structures shown do not constitute a limitation on electronic devices and may include more or fewer components than those shown.

[0121] The electronic device provided in this application includes a memory and a processor. When the processor executes the program stored in the memory, it can implement the multi-dimensional verification method for DPS boards described above and has the same beneficial effects.

[0122] Finally, this application also provides an embodiment corresponding to a computer-readable storage medium. The computer-readable storage medium stores a computer program, which, when executed by a processor, implements the steps described in the above method embodiments.

[0123] It is understood that if the methods in the above embodiments are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and executes all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0124] The foregoing has provided a detailed description of a multi-dimensional verification method, device, and medium for a DPS board provided in this application. The various embodiments in the specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple; relevant parts can be referred to in the method section. It should be noted that those skilled in the art can make several improvements and modifications to this application without departing from the principles of this application, and these improvements and modifications also fall within the protection scope of the claims of this application.

[0125] It should also be noted that, in this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

Claims

1. A multi-dimension verification method of a DPS board card, characterized in that, The method comprises the following steps: acquiring multi-dimension parameters output by a DPS board card under different programs and / or different configuration parameters, wherein the multi-dimension parameters comprise current-voltage dimension parameters, resolution dimension parameters, output capacity dimension parameters, scanning dimension parameters, and API interface capacity dimension parameters; judging whether each dimension parameter in the multi-dimension parameters meets a corresponding setting standard, and generating a comprehensive report according to a judgment result; acquiring each dimension parameter in the comprehensive report that does not meet the setting standard, and determining a corresponding verification result level according to the dimension parameter that does not meet the setting standard; determining a DPS board card design optimization suggestion corresponding to the verification result level based on an optimization standard, so as to construct the DPS board card according to a design requirement of the optimized DPS board card; wherein acquiring the output capacity dimension parameters output by the DPS board card under different programs and / or different configuration parameters comprises: acquiring a voltage parameter group and a current parameter group output by the DPS board card under an output capacity detection program corresponding to the output capacity dimension parameters issued by an upper computer, wherein the voltage parameter group and the current parameter group constitute the output capacity dimension parameters; correspondingly, judging whether the output capacity dimension parameters meet the corresponding setting standard comprises: determining current parameters corresponding to each voltage parameter in the voltage parameter group in the current parameter group, respectively; judging whether each group of voltage parameters and corresponding current parameters are within a capacity fluctuation accuracy range; if each group of voltage parameters and corresponding current parameters are within the capacity fluctuation accuracy range, the output capacity dimension parameters meet the corresponding setting standard; if any one group of voltage parameters and corresponding current parameters are outside the capacity fluctuation accuracy range, the output capacity dimension parameters do not meet the corresponding setting standard.

2. The method of claim 1, wherein, acquiring the current-voltage dimension parameters output by the DPS board card under different programs and / or different configuration parameters comprises: acquiring a forced voltage output by the DPS board card under a current-voltage detection program corresponding to the current-voltage dimension parameters issued by an upper computer; under the current-voltage detection program and the forced voltage, acquiring a plurality of groups of initial forced currents output by the DPS board card by using a single-point current sampling mode and a multi-point current sampling mode, so as to construct a forced current according to the plurality of groups of initial forced currents; wherein the forced voltage and the forced current both constitute the current-voltage dimension parameters.

3. The method of claim 2, wherein, judging whether the current-voltage dimension parameters meet the corresponding setting standard comprises: when the current-voltage dimension parameters are the forced voltage, judging whether the forced voltage is within a voltage accuracy range, if the forced voltage is within the voltage accuracy range, the forced voltage in the current-voltage dimension parameters meets the corresponding setting standard, if the forced voltage is outside the voltage accuracy range, the forced voltage in the current-voltage dimension parameters does not meet the corresponding setting standard. When the current-voltage dimension parameter is the forced current, it is judged whether each group of forced current differences corresponding to each group of initial forced currents in the forced current is within a current accuracy range, and each group of forced current differences is within the current accuracy range, so that the forced current in the current-voltage dimension parameter meets the corresponding setting standard, and if any one of the forced current differences is outside the current accuracy range, the forced current in the current-voltage dimension parameter does not meet the corresponding setting standard.

4. The method of claim 2, wherein, The resolution dimension parameter output by the DPS board card under different programs and / or different configuration parameters is acquired, including: Two voltage resolutions output by the DPS board card under a resolution detection program corresponding to the resolution dimension parameter issued by the host computer and two different forced voltages are acquired. Under the resolution detection program received by the DPS board card, a plurality of groups of initial current resolutions output by the DPS board card are acquired by using the single-point current sampling mode and the multi-point current sampling mode, so as to construct a current resolution according to the plurality of groups of initial current resolutions; wherein the voltage resolution and the current resolution constitute the resolution dimension parameter.

5. The method of claim 4, wherein, It is judged whether the resolution dimension parameter meets the corresponding setting standard, including: When the resolution dimension parameter is the voltage resolution, a voltage resolution difference between the two voltage resolutions is acquired, and if the voltage resolution difference is within a voltage resolution accuracy range, the voltage resolution in the resolution dimension parameter meets the corresponding setting standard; When the resolution dimension parameter is the current resolution, average current resolutions of each group of initial current resolutions collected under the single-point current sampling mode and the multi-point current sampling mode are respectively acquired, and if a difference between the average current resolution corresponding to the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is within a current resolution accuracy range, the current resolution in the resolution dimension parameter meets the corresponding setting standard, and if the difference between the average current resolution corresponding to the single-point current sampling mode and the average current resolution corresponding to the multi-point current sampling mode is outside the current resolution accuracy range, the current resolution in the resolution dimension parameter does not meet the corresponding setting standard.

6. The method of claim 1, wherein, The scanning dimension parameter output by the DPS board card under different programs and / or different configuration parameters is acquired, including: Each scanning point corresponding to a measurement current output through a preset resistor under a scanning detection program corresponding to the scanning dimension parameter issued by the host computer and different scanning point voltages is acquired; wherein each measurement current constitutes the scanning dimension parameter. Correspondingly, it is judged whether the scanning dimension parameter meets the corresponding setting standard, including: It is judged whether the measurement current corresponding to each scanning point is within a scanning current accuracy range; If each of the measurement currents is within the scanning current accuracy range, the scanning dimension parameter meets the corresponding setting standard. If any one of the measurement currents is outside the scanning current accuracy range, the scanning dimension parameter does not meet the corresponding setting standard.

7. The method of claim 1, wherein, The API interface capability dimension parameter output by the DPS board card under different programs and / or different configuration parameters is acquired, including: The continuous issuing time corresponding to each API interface output by the DPS board card under the API interface capability detection program corresponding to the API interface capability dimension parameter issued by the upper computer and different sampling periods is acquired; wherein the continuous issuing time corresponding to each API interface constitutes the API interface capability dimension parameter; Correspondingly, the API interface capability dimension parameter is determined whether it meets the corresponding setting standard, including: It is determined whether each of the continuous issuing times is less than an issuing threshold; If each of the continuous issuing times is less than the issuing threshold, the API interface capability dimension parameter meets the corresponding setting standard. If any one of the continuous issuing times is not less than the issuing threshold, the API interface capability dimension parameter does not meet the corresponding setting standard.

8. An electronic device, comprising: The computer readable storage medium has a computer program stored thereon, and the computer program is executed by the processor to implement the steps of the multi-dimension verification method of the DPS board card according to any one of claims 1 to 7. The computer readable storage medium has a computer program stored thereon, and the computer program is executed by the processor to implement the steps of the multi-dimension verification method of the DPS board card according to any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that, ​

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