Scattering parameter determination method and device based on reference impedance, equipment and medium

Abstract

The invention provides a scattering parameter determination method and device based on reference impedance, equipment and a medium, is used for the technical field of electromagnetic simulation calculation, and can solve the problems of low accuracy and efficiency of scattering parameter determination in the prior art. Comprising the following steps: substituting original reference impedance data, original scattering parameter data and target reference impedance data into a target conversion relational expression for calculation to obtain a target scattering parameter; therefore, the corresponding target conversion relation is determined by distinguishing the original reference impedance as a frequency-variable type or a non-frequency-variable type, and the target reference impedance is further determined, so that the three types of data are substituted into the target conversion relation for calculation, the target scattering parameter is obtained, and the accuracy and efficiency of determining the scattering parameter are improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electromagnetic simulation calculation, and particularly relates to a scattering parameter determination method and device based on reference impedance, equipment and medium. BACKGROUND

[0002] Scattering parameters, also known as S parameters, are parameters used to describe the signal transmission and reflection characteristics between ports of a linear passive or active network under the action of high-frequency signals. As a key parameter for describing the characteristics of high-frequency circuits, scattering parameters have an important influence on the accuracy and reliability of circuit design. Reference impedance is the reference impedance used to define scattering parameters, and the selection of reference impedance has a direct impact on the numerical value of scattering parameters. Only when the reference impedance is determined can the scattering parameters be accurately calculated and measured.

[0003] Existing scattering parameter determination methods generally need to solve matrix determinants or measure scattering parameters through impedance converters. Different impedance converters require different calibration procedures, and the accuracy of the calibration process directly affects the reliability of the test results.

[0004] However, the existing scattering parameter determination method has the problems of low efficiency and accuracy. SUMMARY

[0005] The present application provides a scattering parameter determination method and device based on reference impedance to solve the problem of low efficiency and accuracy of the existing scattering parameter determination method.

[0006] In a first aspect, the present application provides a scattering parameter determination method based on reference impedance, which comprises: Substituting the original reference impedance data, the original scattering parameter data and the target reference impedance data into the target conversion relationship formula to obtain the target scattering parameter. The target conversion relationship formula is as follows:

[0007] Wherein, S2 represents the target scattering parameter, Z n1 represents the original reference impedance, Z n2 represents the target reference impedance, u represents the unit matrix, and S1 represents the original scattering parameter.

[0008] In some embodiments of the present application, the target conversion relationship formula is obtained based on the following steps: For the test port, based on a first preset relationship, original voltages corresponding to original data and target voltages corresponding to target data are determined, and based on a second preset relationship, original currents corresponding to the original data and target currents corresponding to the target data are determined; the original data includes original incident waves, original outgoing waves and an original reference impedance; the target data includes target incident waves, target outgoing waves and a target reference impedance; Based on the original voltage value, the original current value, the target voltage value, the target current value and the impedance category of the original reference impedance, a target conversion relationship of the scattering parameter under different reference impedances is obtained.

[0009] In some embodiments of the present application, based on the original voltage value, the original current value, the target voltage value, the target current value and the impedance category of the original reference impedance, a target conversion relationship of the scattering parameter under different reference impedances is obtained, including: According to the original voltage value and the target voltage value, and the original current value and the target current value, an initial conversion relationship between the original incident wave and the target incident wave, and between the original outgoing wave and the target outgoing wave is determined; According to the scattering parameters corresponding to the original outgoing wave and the target outgoing wave respectively, and the impedance category of the original reference impedance, a target conversion relationship corresponding to the initial conversion relationship is determined.

[0010] In some embodiments of the present application, according to the scattering parameters corresponding to the original outgoing wave and the target outgoing wave respectively, and the impedance category of the original reference impedance, a target conversion relationship corresponding to the initial conversion relationship is determined, including: According to the original outgoing wave and the original incident wave, an original scattering parameter is obtained, and according to the target outgoing wave and the target incident wave, a target scattering parameter is obtained; The original outgoing wave in the initial conversion relationship is replaced by the product of the original incident wave and the original scattering parameter, the target outgoing wave is replaced by the product of the target incident wave and the target scattering parameter, and the original incident wave and the target incident wave are eliminated, to obtain a conversion relationship; According to the impedance category of the original reference impedance, a target conversion relationship corresponding to the conversion relationship is determined.

[0011] In some embodiments of the present application, according to the impedance category of the original reference impedance, a target conversion relationship corresponding to the conversion relationship is determined, including: The impedance category corresponding to the original reference impedance is determined; If the impedance category is a frequency-varying impedance, the conversion relationship is determined as the target conversion relationship; If the impedance category is a non-frequency-varying impedance, the imaginary part in the conversion relationship is eliminated to obtain the target conversion relationship.

[0012] In some embodiments of the present application, the original reference impedance data, the original scattering parameter data and the target reference impedance data are substituted into the target conversion relationship formula to obtain the target scattering parameter, including: The original reference impedance data, the original scattering parameter data, the target reference impedance data and the target conversion relationship formula are imported into the target simulation software to obtain the target scattering parameter and the amplitude-frequency curve of the corresponding target frequency band; The target scattering parameter and the amplitude-frequency curve of the corresponding target frequency band are output.

[0013] In some embodiments of the present application, the target scattering parameter and the amplitude-frequency curve of the corresponding target frequency band are output, including: Based on the target simulation software, a parameter file corresponding to the target scattering parameter and the amplitude-frequency curve of the target frequency band is determined, and the parameter file in the target output format is output.

[0014] In a second aspect, the present application provides a reference impedance-based scattering parameter determination device, which is used to substitute the original reference impedance data, the original scattering parameter data and the target reference impedance data into a target conversion relationship formula to obtain a target scattering parameter. The target conversion relationship formula is as follows:

[0015] Wherein, S2 represents the target scattering parameter, Z n1 represents the original reference impedance, Z n2 represents the target reference impedance, u represents the unit matrix, and S1 represents the original scattering parameter.

[0016] In a third aspect, the present application provides a device, which includes a processor and a memory connected with the processor in communication; The memory stores computer execution instructions; The processor executes the computer execution instructions stored in the memory to implement the method of the present application.

[0017] In a fourth aspect, the present application provides a computer readable storage medium, which stores program codes, and the program codes are executed by a processor to implement the method of the present application.

[0018] The reference impedance-based scattering parameter determination method, device, equipment and medium provided by the present application are used to substitute the original reference impedance data, the original scattering parameter data and the target reference impedance data into a target conversion relationship formula to obtain a target scattering parameter; the target conversion relationship formula is as follows:

[0019] wherein S2 represents a target scattering parameter, Z n1 represents an original reference impedance, Z n2 represents a target reference impedance, u represents a unit matrix, S1 represents an original scattering parameter.

[0020] Thus, the correspondence between the original data and the target data and the port voltage and current can be determined, so as to further determine the conversion relationship of the scattering parameter under different reference impedances according to the characteristics that the port voltage and current are always unchanged under different reference impedances, realize the unified conversion standard of the scattering parameter under different reference impedances, and determine the corresponding target conversion relationship according to the category of the original reference impedance, thereby avoiding the conversion error caused by the difference in impedance categories; at the same time, the calculation and different formats of output are realized through the target simulation software, the adaptation requirement of the scattering parameter of different test scenes and equipment is met, the compatibility of the output is improved, and the efficiency and accuracy of the scattering parameter determination are improved. BRIEF DESCRIPTION OF DRAWINGS

[0021] The accompanying drawings, which are incorporated herein and form part of the specification, illustrate embodiments consistent with the present application and, together with the description, further serve to explain the principles of the application.

[0022] Figure 1 A flowchart of a scattering parameter determination method based on a reference impedance provided by an embodiment of the present application is shown in the figure. Figure 2 An application diagram of a scattering parameter determination method based on a reference impedance provided by an embodiment of the present application is shown in the figure. Figure 3 A structure block diagram of a device for executing a scattering parameter determination method based on a reference impedance according to an embodiment of the present application is shown in the figure. DETAILED DESCRIPTION

[0023] The exemplary embodiments will be described in detail herein with reference to the attached drawings. When the description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with the present application. Instead, they are merely examples of apparatuses and methods consistent with some aspects of the present application as detailed in the appended claims.

[0024] The technical solutions of the present application and how the technical solutions of the present application solve the above technical problems will be described in detail in the following specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes can not be described again in some embodiments. The embodiments of the present application will be described below with reference to the drawings.

[0025] Figure 1 A flowchart of a reference impedance-based scattering parameter determination method provided by an embodiment of the present application is shown in FIG. 1. As shown in the figure, the reference impedance-based scattering parameter determination method can include the following steps: Figure 1 S110, substituting original reference impedance data, original scattering parameter data and target reference impedance data into a target conversion relationship to obtain target scattering parameters.

[0026] The original reference impedance refers to a reference impedance initially set when measuring or calculating scattering parameters, and is used for normalized calculation of scattering parameters. The value of the scattering parameter will change with the change of the reference impedance. For example, for the same port, the scattering parameter obtained under a reference impedance of 50Ω can be 10, but the scattering parameter of the port will change correspondingly under a reference impedance of 70Ω, for example, to 30. That is, the same physical network will obtain a completely different set of S parameter values under different reference impedances, and the physical characteristics of the corresponding port itself do not change. Therefore, in actual application, the selection of the reference impedance has a great influence on the determination of the scattering parameter, and the scattering parameter without indicating the reference impedance is meaningless. Further, the reference impedance can include a frequency-varying reference impedance and a non-frequency-varying reference impedance. The non-frequency-varying reference impedance refers to an impedance whose value remains constant in the entire working frequency range, which is usually a fixed real number. The frequency-varying reference impedance refers to an impedance whose value changes with the change of the working frequency, and its value is strongly related to the frequency.

[0027] The target reference impedance refers to a reference impedance used to define target data and target scattering parameters after conversion of the scattering parameter. For example, the scattering parameter obtained under a reference impedance of 50Ω can be 10, but the scattering parameter of the port will change correspondingly under a reference impedance of 70Ω, for example, to 30. Therefore, the reference impedance of 50Ω is the original reference impedance before conversion, and the reference impedance of 70Ω is the target reference impedance after conversion.

[0028] The original scattering parameter refers to a scattering parameter that has not been converted by the reference impedance. The scattering parameter, also known as S parameter, is a parameter used to describe the signal transmission and reflection characteristics between ports of a linear passive or active network under the action of high-frequency signals. The scattering parameter, as a key parameter for describing the characteristics of high-frequency circuits, has an important influence on the accuracy and reliability of circuit design.

[0029] ​The target scattering parameter refers to a scattering parameter determined after conversion, corresponding to a target reference impedance, for example, the scattering parameter obtained under a reference impedance of 50 Ω can be 10, but under a reference impedance of 70 Ω, the scattering parameter of this port will change accordingly, for example, to 30, and the scattering parameter of 30 is the target scattering parameter.

[0030] The target conversion relationship is a conversion relationship for converting the original scattering parameter into a scattering parameter under a target reference impedance, which can be expressed as:

[0031] S2 represents the target scattering parameter, representing a dimensionless ratio, and there is no corresponding unit, Z n1 represents the original reference impedance, and the corresponding unit is ohm, Z n2 represents the target reference impedance, and the corresponding unit is ohm, u represents the unit matrix, and there is no corresponding unit, S1 represents the original scattering parameter, and the corresponding unit is ohm.

[0032] Therefore, by determining the actual data corresponding to the original reference impedance, the original scattering parameter and the target reference impedance in actual application, the actual data is substituted into the corresponding target conversion relationship at this time, so as to determine the converted target scattering parameter.

[0033] On the basis of the above-mentioned feasible implementation manner of S110, the application further provides that the target conversion relationship is obtained based on the following steps: For the test port, based on the first preset relationship, the original voltage corresponding to the original data and the target voltage corresponding to the target data are determined, and based on the second preset relationship, the original current corresponding to the original data and the target current corresponding to the target data are determined; The original data includes the original incident wave, the original outgoing wave and the original reference impedance; The target data includes the target incident wave, the target outgoing wave and the target reference impedance; Based on the original voltage value, the original current value, the target voltage value, the target current value and the impedance category of the original reference impedance, the target conversion relationship of the scattering parameter under different reference impedances is obtained.

[0034] The test port refers to a high-frequency network, for example, a signal input or output interface of a device to be tested such as a filter, a coupler, a transmission line, etc., which is a physical carrier for collecting original data and target data before and after reference impedance conversion.

[0035] The incident voltage refers to the amplitude of the actual physical incident voltage wave of the test port, which can be represented as , n is the port number, for example, the incident voltage of port 1 is The corresponding unit is volt, which can be represented by V.

[0036] The incident wave refers to the voltage transmitted from the outside of the test port (such as a signal source, a front-stage network) to the inside of the test port (a network to be tested, such as a filter, a transmission line) with reference to the reference impedance, which is usually represented by the symbol , and n is the port number, such as the incident wave of port 1 , and the incident wave of port 2 .

[0037] The outgoing voltage refers to the amplitude of the actual physical reflected or transmitted voltage wave of the test port, which can be represented by , and n is the port number. The corresponding unit is volt, which can be represented by V.

[0038] The outgoing wave refers to the voltage wave transmitted from the inside of the test port (a network to be tested) to the outside of the test port (such as a load, a rear-stage network) with reference to the reference impedance, which is usually represented by the symbol , such as the outgoing wave of port 1 .

[0039] The first preset relationship is used to determine the voltage corresponding to the test port according to the original data or the target data, which can be represented by = ( + ), , which refers to the reference impedance, and the corresponding unit is ohm, , which can be understood as a calculation form for determining the real part of the reference impedance; a n and b n are electromagnetic waves.

[0040] The second preset relationship is used to determine the current corresponding to the test port according to the original data or the target data, which can be represented by = ( - ).

[0041] Further, after conversion of the parameter impedance, the target reference impedance obtained can be represented by , and the target reference impedance is the same as the original reference impedance , and both are consistent in terms of actual physical meaning. Only because of the conversion of the parameter impedance, the specific numerical values corresponding to each other are different. Similarly, the target incident wave can be represented by , and the outgoing wave can be represented by .

[0042] The calculation relationship of the converted port voltage is , the conversion relationship formula corresponding to the converted port current is

[0043] The impedance category refers to a category corresponding to a reference impedance, including a non-frequency-variable impedance and a frequency-variable impedance. The non-frequency-variable reference impedance refers to an impedance whose impedance value remains constant in an entire working frequency range, which is usually a fixed real number. The frequency-variable reference impedance refers to an impedance whose impedance value changes with a working frequency, and the value is strongly related to the frequency.

[0044] Based on this, since the scattering parameters of the test port are defined according to the reference impedance, to determine the scattering parameters under different reference impedances, the voltage and the current corresponding to the test port under the original reference impedance and the target reference impedance can be respectively tested through the first preset formula and the second preset formula, so as to subsequently determine the conversion relationship formula of the scattering parameters under different reference impedances, that is, the target conversion formula, according to the conversion relationship between the original data and the target data of the voltage and the current of the same test port under different reference impedances, that is, the initial conversion formula, thereby further realizing the conversion of the scattering parameters.

[0045] Based on the above feasible implementation manner of S110, the present application further provides a method for obtaining a target conversion relationship formula of scattering parameters under different reference impedances based on an original voltage value, an original current value, a target voltage value, a target current value, and an impedance category of an original reference impedance, including: determining an initial conversion relationship formula between an original incident wave and a target incident wave, and between an original outgoing wave and a target outgoing wave according to the original voltage value and the target voltage value, and the original current value and the target current value; determining a target conversion relationship formula corresponding to the initial conversion relationship formula according to the scattering parameters corresponding to the original outgoing wave and the target outgoing wave, and the impedance category of the original reference impedance.

[0046] The initial conversion relationship formula is a conversion relationship formula for converting the original incident wave under the original reference impedance into the target incident wave under the target reference impedance, and converting the original outgoing wave under the original reference impedance into the target outgoing wave under the target reference impedance.

[0047] ​​​​​​​Based on this, since the voltage and current of the test port do not change with the change of the reference impedance, that is, the voltage and current remain consistent before and after conversion, which can be regarded as a constant value, the initial conversion relationship between the original incident wave and the target incident wave, and the original exit wave and the target exit wave can be determined by determining the calculation relationship between the voltage and current values before and after conversion and the incident wave, the exit wave and the reference impedance, so as to eliminate the voltage and current in the original calculation relationship, and to further determine the relationship between the scattering parameter and the reference impedance subsequently.

[0048] On the basis of the above-mentioned feasible implementation manner of S110, the application further provides a method for determining a target conversion relationship corresponding to the initial conversion relationship according to the scattering parameters corresponding to the original exit wave and the target exit wave respectively, and the impedance category of the original reference impedance, comprising: According to the difference between the original exit wave and the original incident wave, the original scattering parameter is obtained, and according to the difference between the target exit wave and the target incident wave, the target scattering parameter is obtained; The original exit wave in the initial conversion relationship is replaced by the product of the original incident wave and the original scattering parameter, the target exit wave is replaced by the product of the target incident wave and the target scattering parameter, and the original incident wave and the target incident wave are eliminated, to obtain the conversion relationship; According to the impedance category of the original reference impedance, the target conversion relationship corresponding to the conversion relationship is determined.

[0049] Wherein, the initial conversion relationship is used to represent the calculation relationship between the original incident wave and the target incident wave, and the original reference impedance and the target reference impedance, and the original exit wave and the target exit wave, and the original reference impedance and the target reference impedance, and in order to further determine the conversion relationship between the scattering parameter and the reference impedance, the calculation relationship between the exit wave and the incident wave and the scattering parameter can be used to further simplify the initial conversion relationship, and the scattering parameter can be represented by S, then under the original reference impedance, Under the target reference impedance, So the exit wave in the initial conversion relationship is replaced by the corresponding reference impedance and incident wave, and the incident wave is eliminated, so as to obtain the conversion relationship between the scattering parameter and the reference impedance:

[0050] Wherein, I refers to the unit matrix, which represents the unit matrix, and there is no corresponding unit; I' refers to the reflection coefficient, which is a dimensionless coefficient, and there is no corresponding unit, which is a physical quantity for quantifying the degree of reflection of the signal in the test port or the transmission line, as follows:

[0051] It means The conjugate of complex numbers, It refers to the conjugate of I', and neither of them has a corresponding unit.

[0052] It can also be expressed as:

[0053] Based on this, by using the correspondence between the outgoing wave, the incident wave, and the scattering parameters, the outgoing wave in the initial transformation equation is further eliminated, and the result after elimination is simplified, thereby eliminating the outgoing wave and the incident wave in the initial transformation equation and obtaining the transformation equation between the scattering parameters and the reference impedance.

[0054] Based on the feasible implementation of S110 described above, this application further provides a method for determining the target transformation formula corresponding to the transformation formula based on the impedance category of the original reference impedance, including: Determine the impedance category corresponding to the original reference impedance; If the impedance type is frequency-varying impedance, then the conversion formula is determined as the target conversion formula; If the impedance type is non-frequency variable impedance, then eliminate the imaginary part in the transformation formula to obtain the target transformation formula.

[0055] Therefore, since the characteristics of reference impedances of different impedance categories are different, if the reference impedance is a frequency-varying impedance, the corresponding conversion formula is:

[0056] It can also be expressed as:

[0057] If the reference impedance is a non-frequency variable impedance, since the non-frequency variable impedance is a real number and has no imaginary part, the conversion relationship can be further eliminated as follows:

[0058] Based on the feasible implementation of S110 described above, this application further provides a method for calculating the target scattering parameters by substituting the original reference impedance data, the original scattering parameter data, and the target reference impedance data into the target transformation formula, including: The original reference impedance data, original scattering parameter data, target reference impedance data, and target transformation formula are imported into the target simulation software to obtain the target scattering parameters and their corresponding amplitude-frequency curves for the target frequency band. Output the target scattering parameters and their corresponding amplitude-frequency curves for the target frequency range.

[0059] The target simulation software refers to software capable of electromagnetic simulation calculation. By inputting relevant calculation parameters, simulation calculation of scattering parameters based on frequency-variable or non-frequency-variable reference impedance transformation is realized. The format compatibility is strong, and the calculation is efficient, thereby improving the efficiency and accuracy. Figure 2 , Figure 2 The application provides an application schematic diagram of the scattering parameter determination method based on the reference impedance. Figure 2 As shown in the figure, the target simulation software can adjust corresponding parameters according to index requirements, so as to quickly simulate and calculate scattering parameter results of a load or a source end under different reference impedance conditions.

[0060] The target frequency range refers to a frequency range required in actual application. For example, if a user requires scattering parameters of a frequency range of 10 Hz to 50 Hz, the target frequency range to be output is 10 Hz to 50 Hz.

[0061] Therefore, the target simulation software is used to perform conversion calculation of the scattering parameters according to the original reference impedance data, the original scattering parameter data, the target reference impedance data and the target conversion relationship, and further obtain the amplitude-frequency curve of the corresponding frequency range, thereby improving the use experience of the user.

[0062] Based on the feasible implementation manner of S110, the application further provides output of the target scattering parameter and the amplitude-frequency curve of the corresponding target frequency range, including: Based on the target simulation software, a parameter file corresponding to the target scattering parameter and the amplitude-frequency curve of the target frequency range is determined, and a parameter file in a target output format is output.

[0063] Therefore, the target simulation software can calculate a plurality of formats of the scattering parameter file and the reference impedance file, and output a data file in an actual required format, such as an Excel, DAT and TxT format.

[0064] In some embodiments of the present application, by determining the original reference impedance, and combining the original incident wave, the original outgoing wave and the original reference impedance, etc. original data, the calculation relationship between the original data and the test port voltage, current is determined; and taking the target reference impedance as the reference, combining the target data, including the target incident wave, the target outgoing wave and the target reference impedance, etc. port data, the calculation relationship between the target data and the test port voltage, current is further determined, so as to realize the calculation relationship between the original data, the target data and the test port voltage, current respectively, through the characteristics that the voltage and current of the test port remain unchanged before and after the reference impedance conversion, so as to determine the initial conversion relationship between the original data and the target data, and further according to the scattering parameter and the incident wave, the outgoing wave is represented, so as to eliminate the incident wave and the outgoing wave in the initial conversion relationship, and obtain the conversion relationship of the scattering parameter between the original reference impedance and the target reference impedance; and in actual application, according to the impedance category to which the original reference impedance belongs, whether it is a frequency-varying reference impedance or a non-frequency-varying reference impedance, the corresponding target conversion relationship is determined according to the determined scattering parameter conversion relationship, and the original reference impedance data, the original scattering parameter data and the target reference impedance data are substituted into the target conversion relationship for calculation according to the target simulation software, and finally the target scattering parameter is obtained, realizing the conversion of the scattering parameter between different reference impedances.

[0065] In this way, the corresponding relationship between the original data and the target data and the port voltage and current can be determined, so as to further determine the conversion relationship of the scattering parameter under different reference impedances according to the characteristics that the port voltage and current remain unchanged under different reference impedances, realize the unified conversion standard of the scattering parameter under different reference impedances, and determine the corresponding target conversion relationship according to the category of the original reference impedance, thereby avoiding the conversion error caused by the difference in impedance category; at the same time, the calculation and different format output are realized through the target simulation software, meeting the adaptation demand of the scattering parameter of different test scenes and equipment, improving the compatibility of the output, and improving the efficiency and accuracy of the scattering parameter determination.

[0066] In addition, the present application also provides a scattering parameter determination device based on reference impedance for substituting the original reference impedance data, the original scattering parameter data and the target reference impedance data into the target conversion relationship for calculation to obtain the target scattering parameter; The target conversion relationship is as follows:

[0067] Wherein, S2 represents the target scattering parameter, Z n1 represents the original reference impedance, Z n2 represents the target reference impedance, u represents the unit matrix, S1 represents the original scattering parameter.

[0068] In the embodiment of the present application, the scattering parameter determination device based on the reference impedance specifically further comprises: The determination module is configured to determine, for the test port, the original voltage corresponding to the original data and the target voltage corresponding to the target data based on a first preset relationship, and determine the original current corresponding to the original data and the target current corresponding to the target data based on a second preset relationship; the original data comprises the original incident wave, the original outgoing wave and the original reference impedance; the target data comprises the target incident wave, the target outgoing wave and the target reference impedance. The relationship obtaining module is configured to obtain the target conversion relationship of the scattering parameter under different reference impedances based on the original voltage value, the original current value, the target voltage value, the target current value and the impedance category of the original reference impedance.

[0069] In the embodiment of the present application, the relationship obtaining module specifically further comprises: The initial conversion relationship determination sub-module is configured to determine the initial conversion relationship between the original incident wave and the target incident wave, and between the original outgoing wave and the target outgoing wave according to the original voltage value and the target voltage value, and the original current value and the target current value. The target conversion relationship determination sub-module is configured to determine the target conversion relationship corresponding to the initial conversion relationship according to the scattering parameters corresponding to the original outgoing wave and the target outgoing wave, and the impedance category of the original reference impedance.

[0070] In the embodiment of the present application, the target conversion relationship determination sub-module specifically further comprises: The scattering parameter determination unit is configured to obtain the original scattering parameter according to the quotient of the original outgoing wave and the original incident wave, and obtain the target scattering parameter according to the quotient of the target outgoing wave and the target incident wave. The replacement unit is configured to replace the original outgoing wave in the initial conversion relationship with the product of the original incident wave and the original scattering parameter, replace the target outgoing wave with the product of the target incident wave and the target scattering parameter, and eliminate the original incident wave and the target incident wave to obtain the conversion relationship. The determination unit is configured to determine the target conversion relationship corresponding to the conversion relationship according to the impedance category of the original reference impedance.

[0071] In the embodiment of the present application, the determination unit specifically further comprises: The judgment sub-unit is configured to judge the impedance category corresponding to the original reference impedance. The target conversion relationship determination sub-unit is configured to determine the conversion relationship as the target conversion relationship if the impedance category is a frequency-varying impedance. The eliminating subunit is configured to eliminate the imaginary part in the conversion relationship to obtain a target conversion relationship if the impedance type is a non-frequency-varying impedance.

[0072] In the embodiments of the present application, the device for determining a scattering parameter based on a reference impedance can further include: The importing module is configured to import the original reference impedance data, the original scattering parameter data, the target reference impedance data, and the target conversion relationship into the target simulation software to obtain the target scattering parameter and the amplitude-frequency curve of the target frequency range corresponding to the target scattering parameter. The output module is configured to output the target scattering parameter and the amplitude-frequency curve of the target frequency range corresponding to the target scattering parameter.

[0073] In the embodiments of the present application, the output module can further include: The file determining sub-module is configured to determine a parameter file corresponding to the target scattering parameter and the amplitude-frequency curve of the target frequency range based on the target simulation software, and output the parameter file in the target output format.

[0074] Figure 3 A structural schematic diagram of a device for performing a method for determining a scattering parameter based on a reference impedance according to the embodiments of the present application is provided in the embodiments of the present application. As shown in the structural schematic diagram, the device 300 includes: Figure 3 The device 300 can include a processor 301 with one or more processing cores, a memory 302 with one or more computer readable storage media, a communication component 303, and the like. The processor 301, the memory 302, and the communication component 303 are connected through a bus 304. The device 300 can include a processor 301 with one or more processing cores, a memory 302 with one or more computer readable storage media, a communication component 303, and the like. The processor 301, the memory 302, and the communication component 303 are connected through a bus 304.

[0075] In the specific implementation process, the at least one processor 301 executes the computer execution instructions stored in the memory 302, so that the at least one processor 301 performs the method for determining a scattering parameter based on a reference impedance as described above.

[0076] The specific implementation process of the processor 301 can refer to the method embodiments described above, which have similar implementation principles and technical effects, and will not be described here again in the present embodiment.

[0077] Further, the processor can be a central processing unit (CPU), and can also be other general-purpose processors, a digital signal processor (DSP), an application specific integrated circuit (ASIC), or the like. The general-purpose processor can be a microprocessor or the like, or can also be any conventional processor. The steps of the method disclosed in the present application can be directly embodied as execution completed by a hardware processor, or can be executed by a combination of hardware and software modules in the processor.

[0078] The memory can include a random access memory (RAM), and can also include a non-volatile memory (NVM), such as at least one disk memory.

[0079] The bus can be an industry standard architecture (ISA) bus, a peripheral component (PCI) bus, an extended industry standard architecture (EISA) bus, or the like. The bus can be divided into an address bus, a data bus, a control bus, or the like. For ease of representation, the bus in the drawings of the present application does not limit to only one bus or one type of bus.

[0080] In some embodiments, a computer program product is also provided, including a computer program or instructions, which, when executed by a processor, implements the steps of any of the above reference impedance-based scattering parameter determination methods.

[0081] The specific implementation of each operation above can refer to the previous embodiments, which will not be repeated here.

[0082] Those of ordinary skill in the art can understand that all or part of the steps of the various methods of the above embodiments can be completed by instructions, or by relevant hardware controlled by the instructions, which can be stored in a computer readable storage medium and loaded and executed by a processor.

[0083] To this end, the embodiments of the present application provide a computer readable storage medium, which stores a plurality of program codes. The program codes can be loaded by a processor to execute the steps of any of the reference impedance-based scattering parameter determination methods provided by the embodiments of the present application.

[0084] The storage medium can include a Read Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, etc.

[0085] According to an aspect of the present application, a computer program product or computer program is provided, which comprises computer instructions stored in a computer readable storage medium.

[0086] The steps of any of the reference-impedance-based scattering parameter determination methods provided by the embodiments of the present application can be executed due to the instructions stored in the storage medium, thus the beneficial effects of any of the reference-impedance-based scattering parameter determination methods provided by the embodiments of the present application can be achieved, which will be described in detail in the foregoing embodiments and will not be repeated here.

[0087] Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the application disclosed herein. It is intended that the present application cover any and all variations of the application that come within the scope of the claims and their equivalents. It is intended that the specification and examples be considered exemplary only, with the true scope and spirit of the application being indicated by the following claims.

[0088] It should be understood that the application is not limited to the precise construction that has been described above and shown in the accompanying drawings, and that various modifications and changes can be made by those skilled in the art without departing from the scope of the application.

Claims

1. A reference impedance based scattering parameter determination method, characterized by, The method comprises: The original reference impedance data, the original scattering parameter data and the target reference impedance data are substituted into a target conversion relationship formula to obtain a target scattering parameter; The target conversion relationship formula is as follows: wherein S2 represents a target scattering parameter, Z n1 represents a raw reference impedance, S1 represents a raw scattering parameter, and Z n2 represents a target reference impedance, S1 represents a raw scattering parameter, and Z u represents a unit matrix, S1 represents a raw scattering parameter.

2. The method of claim 1, wherein, The target conversion relationship formula is obtained based on the following steps: For a test port, based on a first preset relationship formula, an original voltage corresponding to original data and a target voltage corresponding to target data are determined, and based on a second preset relationship formula, an original current corresponding to the original data and a target current corresponding to the target data are determined; the original data includes an original incident wave, an original outgoing wave and the original reference impedance; The target data includes a target incident wave, a target outgoing wave and the target reference impedance; Based on the original voltage value, the original current value, the target voltage value, the target current value and the impedance category of the original reference impedance, the target conversion relationship formula of the scattering parameter under different reference impedances is obtained.

3. The method of claim 2, wherein, The target conversion relationship formula of the scattering parameter under different reference impedances is obtained based on the original voltage value, the original current value, the target voltage value, the target current value and the impedance category of the original reference impedance, comprising: According to the original voltage value and the target voltage value, and the original current value and the target current value, an initial conversion relationship formula between the original incident wave and the target incident wave, and between the original outgoing wave and the target outgoing wave is determined; According to the scattering parameters corresponding to the original outgoing wave and the target outgoing wave respectively, and the impedance category of the original reference impedance, the target conversion relationship formula corresponding to the initial conversion relationship formula is determined.

4. The method of claim 3, wherein, According to the scattering parameters corresponding to the original outgoing wave and the target outgoing wave respectively, and the impedance category of the original reference impedance, the target conversion relationship formula corresponding to the initial conversion relationship formula is determined, comprising: According to the original outgoing wave and the original incident wave, the original scattering parameter is obtained, and according to the target outgoing wave and the target incident wave, the target scattering parameter is obtained; The original outgoing wave in the initial conversion relationship formula is replaced by the product of the original incident wave and the original scattering parameter, the target outgoing wave is replaced by the product of the target incident wave and the target scattering parameter, and the original incident wave and the target incident wave are eliminated to obtain a conversion relationship formula; According to the impedance category of the original reference impedance, the target conversion relationship formula corresponding to the conversion relationship formula is determined.

5. The method of claim 4, wherein, According to the impedance category of the original reference impedance, the target conversion relationship formula corresponding to the conversion relationship formula is determined, comprising: The impedance category corresponding to the original reference impedance is determined; If the impedance category is a frequency-varying impedance, the conversion relationship formula is determined as the target conversion relationship formula; If the impedance category is a non-frequency-varying impedance, the imaginary part in the conversion relationship formula is eliminated to obtain the target conversion relationship formula.

6. The method of claim 1, wherein, The original reference impedance data, the original scattering parameter data and the target reference impedance data are substituted into the target conversion relationship formula to obtain the target scattering parameter. The original reference impedance data, the original scattering parameter data, the target reference impedance data and the target conversion relationship formula are imported into a target simulation software to obtain the target scattering parameter and the amplitude-frequency curve of the corresponding target frequency range. The target scattering parameter and the amplitude-frequency curve of the corresponding target frequency range are outputted.

7. The method of claim 6, wherein, The target scattering parameter and the amplitude-frequency curve of the corresponding target frequency range are outputted. Based on the target simulation software, a parameter file corresponding to the target scattering parameter and the amplitude-frequency curve of the target frequency range is determined, and the parameter file in a target output format is outputted.

8. A reference impedance based scattering parameter determination apparatus, characterized by, The device is used for substituting original reference impedance data, original scattering parameter data and target reference impedance data into a target conversion relationship formula to obtain a target scattering parameter. The target conversion relationship formula is as follows: wherein S2 represents a target scattering parameter, Z n1 represents a raw reference impedance, S1 represents a raw scattering parameter, and Z n2 represents a target reference impedance, S1 represents a raw scattering parameter, and Z u represents a unit matrix, S1 represents a raw scattering parameter.

9. An apparatus, comprising: The device comprises: one or more processors; a memory; one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, and the one or more programs are configured to execute the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, A program code is stored in a computer readable storage medium, and the program code can be called and executed by a processor to execute the method according to any one of claims 1 to 7.

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