Testing method and system of DCDC converter, electronic equipment and storage medium

Abstract

The invention provides a DCDC converter test method and system, electronic equipment and a storage medium. The test method of the DCDC converter comprises the following steps: testing the DCDC converter based on a test disturbance parameter, and respectively acquiring a voltage test parameter, a current test parameter, a temperature test parameter and a loop response signal of the DCDC converter so as to obtain test data; determining a dynamic response parameter of the DCDC converter based on the test data; and if the dynamic response parameter does not meet a preset standard, adjusting the test disturbance parameter, and performing a test based on the adjusted test parameter, thereby generating a test report. According to the method, through injection disturbance parameter testing, synchronous acquisition of voltage, current, temperature and loop response signals, coverage of electrical performance, thermal characteristics and loop control multi-dimensional data, the working state of the DCDC converter is comprehensively captured, the one-sidedness of single parameter testing is avoided, and it is guaranteed that the testing result reflects real performance.

Description

Technical Field

[0001] This invention relates to the field of power electronics testing technology, and in particular to a testing method, system, electronic device, and storage medium for a DC-DC converter. Background Technology

[0002] Traditional DC-DC converter testing relies on fixed loads and input conditions, failing to dynamically simulate real-world operating conditions such as sudden load changes and voltage fluctuations. Furthermore, traditional testing methods only verify basic indicators like efficiency and ripple, resulting in limited test results. Summary of the Invention

[0003] This invention provides a testing method, system, electronic device, and storage medium for DC-DC converters, which helps to avoid the one-sidedness of testing a single parameter and ensures that the test results reflect the true performance.

[0004] The first technical solution adopted by this invention is: providing a testing method for a DC-DC converter, comprising:

[0005] The DC-DC converter is tested based on the test disturbance parameters, and the voltage test parameters, current test parameters, temperature test parameters and loop response signals of the DC-DC converter are collected respectively to obtain the test data.

[0006] The dynamic response parameters of the DC-DC converter are determined based on the test data.

[0007] If the dynamic response parameters do not meet the preset standards, the test disturbance parameters are adjusted, and the test is performed based on the adjusted test parameters to generate a test report.

[0008] In one embodiment, the DC-DC converter is tested based on test perturbation parameters, and voltage test parameters, current test parameters, temperature test parameters, and loop response signals of the DC-DC converter are collected respectively to obtain the test data, including:

[0009] The load of the DC-DC converter is driven by an initial sinusoidal wave signal, an initial pulse interference signal, and an initial load adjustment signal generated by a pseudo-random sequence generator. The voltage test parameters, current test parameters, temperature test parameters, and loop response signal of the DC-DC converter are collected to obtain the test data.

[0010] In one embodiment, determining the dynamic response parameters of the DC-DC converter based on the test data includes:

[0011] Based on the voltage test parameters, current test parameters, and temperature test parameters in the test data, as well as the loop response signal, the time-domain parameters and frequency-domain parameters are determined to obtain the dynamic response parameters; wherein, the time-domain parameters characterize the overshoot, recovery, and loop response of the DC-DC converter, and the frequency-domain parameters characterize the stability of the loop.

[0012] In one embodiment, adjusting the test disturbance parameters includes adjusting at least one of the initial sinusoidal fluctuation signal, the initial pulse interference signal, and the initial load adjustment signal.

[0013] In one embodiment, if the time-domain parameters meet a first preset condition and the frequency-domain parameters meet a second preset condition, then the dynamic response parameters are determined to meet a preset standard.

[0014] In one embodiment, if the dynamic response parameters meet a preset standard, the process further includes the following steps before generating a test report:

[0015] The gain margin parameter and / or the phase margin parameter are calculated using a Bode plot fitting algorithm;

[0016] If the gain margin parameter and / or the phase margin parameter meet the third preset condition, a test report is generated; if the gain margin parameter and / or the phase margin parameter do not meet the third preset condition, the test disturbance parameter is adjusted.

[0017] The second technical solution adopted in this invention is: providing a testing system for a DC-DC converter, comprising:

[0018] The test module is used to test the DC-DC converter based on test disturbance parameters and collect test data; the test data includes voltage test parameters, current test parameters, temperature test parameters, and loop response signals of the DC-DC converter.

[0019] The data processing module is electrically connected to the test module. The data processing module is used to generate test disturbance parameters and send them to the test module, as well as to receive the test data collected by the test module, process the test data, and generate a test report.

[0020] In one embodiment, the test module includes a load matrix unit and a control unit; the control unit is electrically connected to the load matrix unit, and the control unit is used to control the load matrix unit using test disturbance parameters generated by the data processing module, thereby configuring the load of the DC-DC converter and driving the load of the DC-DC converter.

[0021] The third technical solution adopted by the present invention is: to provide an electronic device, the electronic device including a memory and a processor coupled to each other, the processor being used to execute program instructions stored in the memory, and the processor being used to execute program data to implement the steps in the test method of the DC-DC converter as described above.

[0022] The fourth technical solution adopted in this invention is: providing a computer-readable storage medium on which a computer program is stored, and when the computer program is executed by a processor, it implements the steps in the test method for the DC-DC converter described above.

[0023] The beneficial effects of this invention are as follows: Unlike existing technologies, the testing method for a DC-DC converter provided by this invention includes: testing the DC-DC converter based on test disturbance parameters, and respectively collecting voltage test parameters, current test parameters, temperature test parameters, and loop response signals of the DC-DC converter to obtain test data; determining the dynamic response parameters of the DC-DC converter based on the test data; if the dynamic response parameters do not meet a preset standard, adjusting the test disturbance parameters, and conducting tests based on the adjusted test parameters to generate a test report. This method, by injecting disturbance parameters for testing, simultaneously collects voltage, current, temperature, and loop response signals, covering multi-dimensional data on electrical performance, thermal characteristics, and loop control, comprehensively capturing the operating state of the DC-DC converter, avoiding the one-sidedness of single-parameter testing, and ensuring that the test results reflect the true performance. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 This is a flowchart illustrating the first embodiment of the testing method for the DC-DC converter of this application;

[0026] Figure 2 for Figure 1 A flowchart illustrating an embodiment of step S11;

[0027] Figure 3 This is a flowchart illustrating a second embodiment of the testing method for the DC-DC converter of this application;

[0028] Figure 4 This is a schematic diagram of the structure of a first embodiment of the test system for the DC-DC converter of this application;

[0029] Figure 5 This is a schematic diagram of the structure of a second embodiment of the test system for the DC-DC converter of this application;

[0030] Figure 6 A schematic diagram of the framework of an embodiment of the electronic device provided by the present invention;

[0031] Figure 7 A schematic diagram of a framework of an embodiment of a computer-readable storage medium provided by the present invention. Detailed Implementation

[0032] The embodiments of this application will now be described in detail with reference to the accompanying drawings.

[0033] In the following description, specific details such as particular system architectures, interfaces, and technologies are presented for illustrative purposes rather than for limiting purposes, in order to provide a thorough understanding of this application.

[0034] In this article, the term "and / or" simply describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. Additionally, the character " / " generally indicates that the preceding and following related objects have an "or" relationship. Furthermore, "more" in this article means two or more objects.

[0035] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0036] Before providing a further detailed description of the embodiments of this application, the nouns and terms involved in the embodiments of this application will be explained, and the nouns and terms involved in the embodiments of this application shall be interpreted as follows.

[0037] The testing method for DC-DC converters provided in this application can be implemented by a server or terminal alone, or by a server and terminal working together. In some embodiments, the terminal or server can implement the testing method for DC-DC converters provided in this application by running a computer program. For example, the computer program can be a native program or software module in an operating system; it can be a native application (APP), i.e., a program that needs to be installed in the operating system to run, such as a client that supports virtual scenes, such as a game APP; it can also be a mini-program, i.e., a program that only needs to be downloaded to a browser environment to run; or it can be a mini-program that can be embedded in any APP. In short, the above-mentioned computer program can be any form of application, module, or plugin.

[0038] To enable those skilled in the art to better understand the technical solution of the present invention, the following describes in further detail a test method for a DC-DC converter provided by the present invention, in conjunction with the accompanying drawings and specific embodiments.

[0039] See Figure 1 , Figure 1 This is a flowchart illustrating the first embodiment of the testing method for the DC-DC converter of this application, specifically including:

[0040] Step S11: Test the DC-DC converter based on the test disturbance parameters, and collect the voltage test parameters, current test parameters, temperature test parameters and loop response signal of the DC-DC converter to obtain the test data.

[0041] Specifically, a programmable load matrix is ​​established using a MOSFET array topology, such as an 8×8 MOSFET load matrix, which can support switching of load current from 0.1A to 100A. Load adjustment can be achieved by switching the MOSFET load matrix in series and parallel. Experiments have shown that, under 25°C conditions, the embodiments of this application can achieve rapid response during load switching, realizing microsecond-level switching with a switching time ≤1μs.

[0042] During testing, this application simulates multiple modes of test disturbance parameters, such as injected load step, sinusoidal fluctuation, and pulse interference. The DC-DC converter is tested under these test disturbance parameters, and the voltage test parameters, current test parameters, temperature test parameters, and loop response signals of the DC-DC converter can be collected respectively to obtain the test data.

[0043] In one embodiment, combined with Figure 2 , Figure 2 yes Figure 1 A flowchart illustrating an embodiment of step S11, wherein step S11 specifically includes:

[0044] Step S111: Use a pseudo-random sequence generator to generate an initial sinusoidal wave signal, an initial pulse interference signal, and an initial load adjustment signal to drive the load of the DC-DC converter;

[0045] Specifically, a pseudo-random sequence generator is used to generate test disturbance parameters in multiple modes, such as load step, sinusoidal fluctuation, and pulse interference. In some embodiments, the pseudo-random sequence generator is used to generate an initial sinusoidal fluctuation signal, an initial pulse interference signal, and an initial load adjustment signal, respectively, as test disturbance parameters to drive the load of the DC-DC converter.

[0046] Step S112: Collect the voltage test parameters, current test parameters, temperature test parameters, and loop response signal of the DC-DC converter respectively to obtain the test data.

[0047] During the process of driving the load of the DC-DC converter based on the above-mentioned test disturbance parameters, the voltage test parameters, current test parameters, temperature test parameters, and loop response signal of the DC-DC converter are collected respectively to obtain the test data. The test data includes the voltage test parameters, current test parameters, temperature test parameters, and loop response signal.

[0048] It's important to note that a pseudo-random sequence (PRBS) generator essentially uses algorithms to generate seemingly random but actually predictable numerical sequences. The core of this is achieved through shift registers and feedback logic (for example, a commonly used 15-bit PRBS consists of four shift registers and XOR feedback). Simply put, it uses hardware or software logic to make a set of binary numbers "roll" according to specific rules, outputting a sequence of 0s and 1s. However, the tests in this application require "load disturbances" and dynamic changes in voltage / current. Therefore, the PRBS sequence will actually be mapped to analog quantity changes; for example, the "0-1 transition" of the PRBS sequence corresponds to a step change in load current from 10% to 90%; and the "periodic fluctuation" of the sequence corresponds to the amplitude change of a sinusoidal current.

[0049] Pseudo-random sequence (PRBS) generators typically combine an FPGA and a digital-to-analog converter (DAC). The FPGA generates the digital PRBS sequence. In one embodiment, the FPGA integrates an LFSR (Linear Feedback Shift Register) logic circuit, which is the key module for generating the PRBS sequence. The PRBS sequence is used to simulate complex scenarios such as load steps, sinusoidal fluctuations, and impulse interference to test the dynamic response parameters of the DC-DC converter. By configuring different feedback polynomials and initial states, the LFSR can generate PRBS sequences with different characteristics, simulating diverse load changes, thereby comprehensively testing the performance of the DC-DC converter under various operating conditions. As long as the same feedback polynomial and initial state are set, the LFSR can generate exactly the same pseudo-random sequence, making the testing process repeatable and facilitating comparison and analysis of test results. The DAC is used to convert the PRBS sequence from a digital sequence into an analog disturbance; it should be noted that the digital sequence output by the FPGA itself is "discrete 0s and 1s" and cannot directly drive load changes. A digital-to-analog converter (DAC) converts digital signals into analog voltage / current signals, for example, assigning "0" to 0V and "1" to 5V in a PRBS (Pressure Producer Scale), outputting a continuously changing analog waveform. Finally, the analog signal output from the DAC is amplified by a high-speed driver (such as a SiC MOSFET driver circuit) and directly controls the load circuit (such as the on / off state of a MOSFET array). In this way, the load's current / voltage "dynamically changes" with the PRBS analog signal, achieving disturbance injection.

[0050] As mentioned above, the PRBS can be made to include an initial sinusoidal ripple signal, an initial pulse interference signal, and an initial load adjustment signal. Specifically, the PRBS sequence contains a large number of "0→1" or "1→0" transitions. These transitions can be used to simulate sudden changes in load current, thus obtaining the initial load adjustment signal. This initial load adjustment signal can cause the load of the DC-DC converter to switch from 10% to 90% during testing, thereby simulating a load step scenario. Although the PRBS sequence itself is a "discrete transition," by taking a longer period of the sequence or filtering the sequence, it can be made to approximate a smooth "sine wave" change, thus obtaining the initial sinusoidal ripple signal. For example, to simulate a 50Hz sinusoidal ripple signal, first, the PRBS generator outputs a high-frequency sequence, then a low-pass filter is used to filter out the high-frequency components, leaving low-frequency components that approximate a sine curve. Then, this "sine-like" analog signal is injected into the load, and the output of the DC-DC converter will follow the "sine wave," allowing for the measurement of its ripple and loop stability. PRBS (Pressure Probes) naturally contain "narrow pulse"-like transitions (such as a single 1 or 0 appearing occasionally in a sequence, surrounded by opposite values). By capturing these "sharp transitions," pulse interference can be simulated, thus generating initial pulse interference signals. For example, to test the anti-interference capability of a DC-DC converter, one can specifically find a "sudden single high level (lasting a few microseconds)" in the PRBS, amplify it into a large current pulse, and inject it into the load. At this time, the DC-DC output voltage will be momentarily "pulled off," and whether it can recover quickly can verify the anti-interference performance.

[0051] This application utilizes a pseudo-random sequence generator to generate initial sinusoidal wave signals, initial pulse interference signals, and initial load adjustment signals to drive the load of the DC-DC converter. Since the pseudo-random sequence (PRBS) contains almost all possible 0 / 1 combinations, it effectively simulates countless disturbance modes at once, covering a wide frequency range of disturbances and offering high efficiency. In practical applications, the load changes encountered by DC-DC converters (such as motor startup in a car or instantaneous high load in a server) are inherently random and complex. This "pseudo-random disturbance" of PRBS is more realistic than a manually set "single step / sine wave," and the measured results better reflect product reliability.

[0052] When the load of the DC-DC converter is driven using an initial load adjustment signal, the injected test disturbance parameter is a load step. Injecting a load step disturbance can test the fast response capability of the DC-DC converter. When the load of the DC-DC converter is driven using an initial sinusoidal ripple signal, the injected test disturbance parameter is a sinusoidal disturbance. Injecting a sinusoidal disturbance can test the loop frequency response and stability of the DC-DC converter. When the load of the DC-DC converter is driven using an initial pulse interference signal, the injected test disturbance parameter is a pulse disturbance. Injecting a pulse disturbance can test the loop anti-interference capability and robustness of the DC-DC converter.

[0053] In the embodiments of this application, an initial sinusoidal wave signal, an initial pulse interference signal, and an initial load adjustment signal are generated using a pseudo-random sequence generator to drive the load of the DC-DC converter, and the voltage test parameters, current test parameters, temperature test parameters, and loop response signal of the DC-DC converter are collected to obtain the test data.

[0054] It is worth noting that voltage test parameters are the most direct "results" of the dynamic response of a DC-DC converter. By analyzing the waveform changes of voltage test parameters under disturbances, the step response index (corresponding to a load step scenario, which can be obtained through overshoot amplitude, recovery time, and number of oscillations) and dynamic ripple index (corresponding to a sinusoidal disturbance scenario) of the DC-DC converter can be quantified. Current test parameters reflect the energy transfer efficiency of the DC-DC converter under disturbances. Temperature test parameters reflect the cumulative power consumption under dynamic disturbances, affecting long-term dynamic response performance. Loop response signals can be used to verify the timeliness of loop adjustment and loop stability.

[0055] Step S12: Determine the dynamic response parameters of the DC-DC converter based on the test data.

[0056] The test data includes voltage test parameters, current test parameters, temperature test parameters, and loop response signals. In one embodiment, time-domain parameters and frequency-domain parameters are determined based on the voltage test parameters, current test parameters, temperature test parameters, and loop response signals in the test data, thereby obtaining the dynamic response parameters. That is, the dynamic response parameters of this application include time-domain parameters and frequency parameters. The time-domain parameters characterize the overshoot, recovery, and loop response of the DC-DC converter. The frequency-domain parameters characterize the stability of the loop.

[0057] Specifically, time-domain parameters reflect the signal's change over time. For DC-DC converter testing, these parameters reveal overshoot, recovery, and loop response. Overshoot is typically represented by the overshoot rate, which indicates the maximum deviation of the output voltage or current from its final stable value when a sudden load change or other disturbance occurs. For example, during a load step change, the DC-DC converter's output voltage may momentarily rise above its stable value. A higher overshoot rate indicates weaker control over the output at the moment of disturbance, potentially impacting subsequent circuitry and affecting its stability and reliability. Recovery time is typically used to represent recovery. It refers to the time required for the output voltage or current to recover to a specified stable range after being disturbed. A shorter recovery time indicates that the DC-DC converter can quickly adjust its state and recover to a stable operating state after being disturbed, demonstrating better dynamic response performance and adaptability to rapid load changes. The rise time of a pulse signal is generally used to represent the loop response. The rise time reflects the time required for the output voltage or current of a DC-DC converter to rise from a specified initial value to a target value when faced with input or load changes, thus demonstrating its response speed to changes. A shorter rise time indicates that the DC-DC converter can respond more promptly to input or load changes, and the output can quickly reach the desired value.

[0058] Frequency domain parameters characterize the stability of a circuit. Specifically, frequency domain parameters are obtained by converting time domain parameters to the frequency domain. Generally, the stability of a circuit can be determined by parameters such as the ripple spectrum and total harmonic distortion (THD) exhibited by the frequency domain parameters. It is worth noting that the ripple spectrum shows the amplitude distribution of different frequency components in the output voltage or current. High-frequency ripple can interfere with some noise-sensitive circuits (such as communication circuits and high-precision measurement circuits). By analyzing the ripple spectrum, we can understand the magnitude of ripple at different frequencies in the DC-DC converter output, and judge its filtering performance and its ability to suppress noise at different frequencies. For example, if the ripple amplitude is large at a specific frequency, it may mean that the noise at that frequency is not effectively suppressed, and it is necessary to check whether there is a problem with the filtering circuit or control loop. Total harmonic distortion (THD) represents the ratio of the total power of the harmonic components in the output signal to the fundamental power, reflecting the degree of signal distortion. In a DC-DC converter, a lower THD means that the output signal is closer to an ideal sine wave or DC signal. This indicates that the converter can better maintain the purity of the signal and reduce the negative impact of harmonics during the processing and conversion of electrical energy, such as reducing pollution to the power grid and reducing electromagnetic interference.

[0059] In one embodiment, a vector machine is used to extract features from the voltage test parameters, current test parameters, temperature test parameters, and loop response signal to obtain time-domain parameters. Further processing of the time-domain parameters using a Fourier algorithm yields the frequency-domain parameters.

[0060] Voltage test parameters may include, for example, input voltage or output voltage, while current test parameters may include both input current and output current. Temperature test parameters are the basis for judging thermal reliability under dynamic loads. Loop response signals typically refer to voltage or current signals related to the control signals in the DC-DC converter control loop, such as the output of the error amplifier or PWM control signals. High-precision sampling circuits are used to synchronously acquire the input and output signals in the DC-DC converter control loop. For example, in a test system, a circuit that converts analog signals to 16-bit digital signals (with a sampling rate of 1-MSPS, meaning it can complete 1 million samples per second) is used to acquire the input signal (representing the input control command or reference signal) and the output signal (the control signal after loop adjustment) of the error amplifier.

[0061] Step S13: If the dynamic response parameters do not meet the preset standards, adjust the test disturbance parameters, perform the test based on the adjusted test parameters, and generate a test report.

[0062] In one embodiment, the dynamic response parameters include time-domain parameters and frequency-domain parameters. If the time-domain parameters meet a first preset condition and the frequency-domain parameters meet a second preset condition, then the dynamic response parameters are determined to meet a preset standard.

[0063] It should be noted that the first preset condition is used to determine the overshoot, recovery and loop response of the DC-DC converter. If the time domain parameters meet the first preset condition, it can be determined that the overshoot time, recovery time, loop response, pulse parameters, etc. all meet the predetermined expectations. This indicates that the current DC-DC converter has a stronger ability to cope with load changes, better dynamic response and better tolerance to extreme transient disturbances.

[0064] The second preset condition is used to determine the stability of the loop. If the frequency domain parameters meet the second preset condition, it can be determined that the ripple spectrum meets the predetermined expectations, indicating that the loop filtering and compensation of the DC-DC converter are well done and the dynamic response is stable.

[0065] It should be noted that adjusting the test disturbance parameters includes adjusting at least one of the initial sinusoidal wave signal, the initial pulse interference signal, and the initial load adjustment signal. In one embodiment, the amplitude and frequency of the test disturbance parameters can be adjusted to adjust the test disturbance parameters.

[0066] The test is repeated based on the adjusted test disturbance parameters. The above steps are repeated until the dynamic response parameters meet the preset standards, and the test results are generated.

[0067] The DCDC converter testing method described in this application involves injecting disturbance parameters and simultaneously acquiring voltage, current, temperature, and loop response signals. This covers multi-dimensional data on electrical performance, thermal characteristics, and loop control, comprehensively capturing the DCDC converter's operating state and avoiding the limitations of single-parameter testing, ensuring that test results reflect true performance. Based on multi-dimensional test data, dynamic response parameters are determined. Compared to traditional single-index judgments, this method more accurately assesses the dynamic performance of the DCDC converter under complex operating conditions, such as voltage recovery capability and ripple suppression level during load changes, providing accurate evidence for performance verification. If the dynamic response fails to meet standards, the disturbance parameters are adjusted and the test is repeated, achieving adaptive optimization of the testing process. The method allows for flexible exploration of the DCDC converter's performance boundaries, covering the entire operating range (CCM / DCM / Burst mode), improving the test's adaptability to different scenarios. After parameter adjustment and retesting, a report is generated. The report data originates from multiple rounds of optimization testing, providing reliable references for R&D (circuit design optimization), production (quality control), and application (selection and adaptation), helping to improve the overall R&D and application efficiency of DCDC converters.

[0068] Please see Figure 3 This is a flowchart illustrating a second embodiment of the testing method for the DC-DC converter of this application. In this embodiment, steps S31 and S32 are the same as those described above. Figure 1 In the illustrated embodiment, steps S11 and S12 are the same, the difference being that this embodiment further includes steps S33 to S37 after step S32. Steps S33 to S37 are described in detail below:

[0069] Step S33: Whether the time domain parameters in the dynamic response parameters meet the first preset condition and whether the frequency domain parameters meet the second preset condition.

[0070] Specifically, the time-domain parameters characterize the overshoot, recovery, and loop response of the DC-DC converter. A first preset condition is used to determine the overshoot, recovery, and loop response of the DC-DC converter. The frequency-domain parameters characterize the loop stability. Specifically, the frequency-domain parameters are obtained by converting the time-domain parameters to the frequency domain. A second preset condition is used to determine the loop stability.

[0071] If the time-domain parameters meet the first preset condition, it can be determined that the overshoot time, recovery time, loop response, pulse parameters, etc., all meet the predetermined expectations. This indicates that the current DC-DC converter has a stronger ability to cope with load changes, better dynamic response, and better tolerance to extreme transient disturbances. If the frequency-domain parameters meet the second preset condition, it can be determined that the ripple spectrum meets the predetermined expectations. This indicates that the DC-DC converter's loop filtering and compensation are well done, and the dynamic response is stable.

[0072] Specifically, if the time-domain parameters do not meet the first preset condition or the frequency-domain parameters do not meet the second preset condition, then step S34 is executed. If the time-domain parameters meet the first preset condition and the frequency-domain parameters meet the second preset condition, then step S35 is executed.

[0073] Step S34: Adjust the test disturbance parameters.

[0074] Based on the above explanation, the test disturbance parameters include an initial sinusoidal wave signal, an initial pulse interference signal, and an initial load adjustment signal. Adjusting the test disturbance parameters includes adjusting at least one of the initial sinusoidal wave signal, the initial pulse interference signal, and the initial load adjustment signal. In one embodiment, the amplitude and frequency of the test disturbance parameters can be adjusted to adjust the test disturbance parameters.

[0075] Furthermore, after adjusting the test disturbance parameters, step S31 is executed. If either the time-domain parameter or the frequency-domain parameter does not meet the above conditions, it is determined that the dynamic response parameter does not meet the preset standard. At this time, the test disturbance parameters are adjusted, and the test is performed based on the adjusted test parameters until the time-domain parameter and frequency-domain parameter obtained by the test meet the above conditions, and finally a test report is generated.

[0076] Step S35: Calculate the gain margin parameter and / or phase margin parameter using the Bode plot fitting algorithm.

[0077] It is worth noting that meeting the preset standards for dynamic response parameters does not guarantee 100% loop stability. For example, using PRBS to simulate a 1kHz load step and obtaining "3% overshoot and 20μs recovery time" (meeting the standard) only verifies the dynamic performance around 1kHz. In practical applications, the DC-DC converter may encounter disturbances at other frequencies, such as 100kHz pulse interference, 50Hz power grid fluctuations, or loop characteristics shifting due to temperature / load changes. In such cases, even if the current dynamic response meets the standard, oscillation failure may still occur. Therefore, it is necessary to further calculate the gain margin parameters and / or the phase margin parameters using the Bode plot fitting algorithm, and then further verify the loop stability by combining the gain margin parameters and / or the phase margin parameters.

[0078] Therefore, if the dynamic response parameters meet the preset standards, that is, if the time domain parameters meet the first preset condition and the frequency domain parameters meet the second preset condition, the process before generating the test report further includes: calculating the gain margin parameter and / or the phase margin parameter using a Bode plot fitting algorithm.

[0079] It's worth noting that the loop response signal simulates sinusoidal disturbance signals of different frequencies input into the loop. For each frequency point, the loop gain and phase difference are calculated. Gain represents the ratio of the output signal amplitude to the input signal amplitude, and phase difference is the difference between the output signal phase and the input signal phase. Algorithms such as Fourier Transform (FFT) can be used to perform frequency domain transformation on the acquired time-domain signal, thereby extracting the gain and phase information at different frequencies. With frequency as the x-axis and gain (usually expressed in decibels, dB) and phase (in degrees) as the y-axis, amplitude-frequency response curves and phase-frequency response curves are plotted, forming a Bode plot. The amplitude-frequency response curve shows how the loop gain changes with frequency, and the phase-frequency response curve shows how the phase difference changes with frequency. Find the frequency point on the amplitude-frequency response curve where the gain is 0 dB (i.e., the output amplitude is equal to the input amplitude), read the corresponding phase difference on the phase-frequency response curve, and then add 180° to this phase difference to obtain the phase margin. For example, at a certain frequency point, when the gain is 0dB, the phase difference is -130°, then the phase margin = 180° + (-130°) = 50°. A larger phase margin indicates a stronger tolerance for phase lag in the loop, making it less prone to oscillation. Find the frequency point with a phase difference of -180° on the phase-frequency response curve, read the corresponding gain on the amplitude-frequency response curve, and subtract this gain value (absolute value) from 0dB. The result is the gain margin. For example, at a certain frequency point, when the phase difference is -180°, the gain is -12dB, then the gain margin = |0dB - (-12dB)| = 12dB. A larger absolute value of the gain margin indicates a stronger tolerance for gain fluctuations in the loop, resulting in higher stability.

[0080] After calculating the gain margin parameter and / or phase margin parameter, further execute step S36.

[0081] Step S36: Whether the gain margin parameter and / or phase margin parameter meet the third preset condition.

[0082] Specifically, a larger phase margin indicates a stronger tolerance for phase lag in the loop and a lower likelihood of oscillation. A larger absolute value of the gain margin indicates a stronger tolerance for gain fluctuations and higher stability in the loop. Therefore, a reasonable third preset condition can be determined based on the specific parameters of the loop, and then it can be determined whether the calculated gain margin parameters and / or phase margin parameters meet the third preset condition. If yes, proceed to step S37; otherwise, return to step S34.

[0083] Step S37: Generate a test report.

[0084] The above method is used to further verify whether the gain margin parameter and / or the phase margin parameter meet the third preset condition. If they do, a final test report is generated.

[0085] If the gain margin parameter and / or the phase margin parameter do not meet the third preset condition, the test perturbation parameter is adjusted. For example, the frequency of the test perturbation parameter can be adjusted until the final loop is in a stable state, and a test report is generated.

[0086] The DCDC converter testing method described in this application involves injecting disturbance parameters and simultaneously acquiring voltage, current, temperature, and loop response signals. This covers multi-dimensional data on electrical performance, thermal characteristics, and loop control, comprehensively capturing the DCDC converter's operating state and avoiding the limitations of single-parameter testing, ensuring that test results reflect true performance. Based on multi-dimensional test data, dynamic response parameters are determined. Compared to traditional single-index judgments, this method more accurately assesses the dynamic performance of the DCDC converter under complex operating conditions, such as voltage recovery capability and ripple suppression level during load changes, providing accurate evidence for performance verification. If the dynamic response fails to meet standards, the disturbance parameters are adjusted and the test is repeated, achieving adaptive optimization of the testing process. The method allows for flexible exploration of the DCDC converter's performance boundaries, covering the entire operating range (CCM / DCM / Burst mode), improving the test's adaptability to different scenarios. After parameter adjustment and retesting, a report is generated. The report data originates from multiple rounds of optimization testing, providing reliable references for R&D (circuit design optimization), production (quality control), and application (selection and adaptation), helping to improve the overall R&D and application efficiency of DCDC converters.

[0087] See Figure 4 , Figure 4 This is a schematic diagram of an embodiment of the test system for the DC-DC converter of this application. The test system includes a test module 21 and a data processing module 22. The test module 21 is used to test the DC-DC converter based on test disturbance parameters and collect test data; the test data includes voltage test parameters, current test parameters, temperature test parameters, and loop response signals of the DC-DC converter. The data processing module 22 is electrically connected to the test module 21, and is used to generate test disturbance parameters and send them to the test module 21, and to receive the test data collected by the test module 21, process the test data, and generate a test report.

[0088] In one specific embodiment, the data processing module 22 is used to determine the dynamic response parameters of the DC-DC converter based on test data, and adjust the test perturbation parameters when the dynamic response parameters do not meet a preset standard, and perform testing based on the adjusted test perturbation parameters. The data processing module 22 also generates a test report when the dynamic response parameters meet the preset standard.

[0089] In one embodiment, combined with Figure 5 The test module 21 includes a load matrix unit 212 and a control unit 211. The control unit 211 is electrically connected to the load matrix unit 212 and is used to control the load matrix unit 212 using test disturbance parameters to configure and drive the load of the DC-DC converter. The load matrix unit 212 uses a MOSFET array topology to establish a programmable load matrix, for example, an 8×8 MOSFET load matrix, which can support switching of load current from 0.1A to 100A. The load can be adjusted by switching the MOSFET load matrix in series and parallel. Experiments have shown that, in an environment of 25°C, the embodiments of this application can respond quickly to load switching, achieving microsecond-level switching with a switching time ≤1μs.

[0090] In one specific embodiment, the control unit 211 may include an isolation driver for outputting a drive signal to the load matrix unit 212 to configure the load. Specifically, the test disturbance parameters include an initial sinusoidal fluctuation signal, an initial pulse interference signal, and an initial load adjustment signal. The initial load adjustment signal is used to adjust the load of the DC-DC converter. After receiving the test disturbance parameters generated by the data processing module 22, the control unit 211 drives the isolation driver to configure a load for the DC-DC converter that matches the initial load adjustment signal based on the initial load signal.

[0091] Understandably, the load matrix unit 212 includes an 8×8 MOSFET load matrix, in which eight isolation drivers are arranged horizontally, each driving one column of MOSFETs, and eight isolation drivers are arranged vertically, each driving one row of MOSFETs, thereby realizing the load configuration.

[0092] Furthermore, the control unit 211 also includes a drive unit, which drives the load of the DC-DC converter based on the initial sinusoidal fluctuation signal and the initial pulse interference signal in the test disturbance parameters, and acquires the voltage test parameters, current test parameters, temperature test parameters, and loop response signal of the DC-DC converter to obtain test data. In one embodiment, the drive unit may further include a precision shunt, which can perform current detection and output the current detection signal after differential processing.

[0093] Furthermore, the control unit 211 can also be equipped with overcurrent protection circuits, temperature sensors, and heat dissipation systems, etc.

[0094] The data processing module 22 is electrically connected to the test module 21. Specifically, the data processing module 22 is connected to the control unit 211. The data processing module 22 is used to generate test disturbance parameters and send them to the control unit 21. The data processing module 22 can be, for example, a host computer or other device or equipment capable of data analysis and processing. The data processing module 22 can also be, for example, a device to be displayed, which can perform waveform display, parameter configuration, etc., facilitating researchers to visualize and analyze test results.

[0095] In one specific embodiment, the data processing module 22 may be configured with an FPGA, which is used to inject test disturbance parameters.

[0096] In another embodiment, test perturbation parameters can also be generated by the test module, and the specific parameters are not limited.

[0097] Please see Figure 6 , Figure 6 This is a schematic diagram of a framework of an embodiment of the electronic device provided by the present invention. The electronic device 90 includes a memory 91 and a processor 92 coupled to each other. The processor 92 is used to execute program instructions stored in the memory 91 to implement the steps of any of the above-described DC-DC converter test method embodiments. In a specific implementation scenario, the electronic device 90 may include, but is not limited to, a microcomputer, a server, etc. In addition, the electronic device 90 may also include mobile devices such as laptops and tablets, which are not limited here.

[0098] Specifically, processor 92 controls itself and memory 91 to implement the steps of any of the above-described test method embodiments of the DC-DC converter. Processor 92 can also be referred to as a CPU (Central Processing Unit). Processor 92 may be an integrated circuit chip with signal processing capabilities. Processor 92 can also be a general-purpose processor, digital signal processor (DSP), application-specific integrated circuit (ASIC), field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. A general-purpose processor can be a microprocessor or any conventional processor. Furthermore, processor 92 can be implemented using integrated circuit chips.

[0099] Please see Figure 7 , Figure 7 This is a schematic diagram of a framework of an embodiment of a computer-readable storage medium provided by the present invention. The computer-readable storage medium 100 stores program instructions 101 that can be executed by a processor. The program instructions 101 are used to implement the steps of any of the above-described test method embodiments of the DC-DC converter.

[0100] In some embodiments, the functions or modules of the apparatus provided in this disclosure can be used to perform the methods described in the above method embodiments. The specific implementation can be referred to the description of the above method embodiments, and for the sake of brevity, it will not be repeated here.

[0101] The description of the various embodiments above tends to emphasize the differences between the various embodiments. The similarities or similarities between them can be referred to, and for the sake of brevity, they will not be repeated here.

[0102] In the several embodiments provided in this application, it should be understood that the disclosed methods and apparatus can be implemented in other ways. For example, the apparatus implementations described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection of devices or units may be electrical, mechanical, or other forms.

[0103] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0104] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the methods of various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0105] The above are merely embodiments of the present invention and do not limit the scope of patent protection of the present invention. Any equivalent structural or procedural transformations made based on the content of the present invention's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of the present invention.

Claims

1. A method of testing a DCDC converter, characterized in that, The method comprises the following steps: testing the DCDC converter based on a test disturbance parameter, and collecting voltage test parameters, current test parameters, temperature test parameters and loop response signals of the DCDC converter respectively, so as to obtain the test data; determining a dynamic response parameter of the DCDC converter based on the test data; if the dynamic response parameter does not meet a preset standard, adjusting the test disturbance parameter, testing based on the adjusted test parameter, and generating a test report.

2. The test method of claim 1, wherein, The method of testing the DCDC converter based on a test disturbance parameter, and collecting voltage test parameters, current test parameters, temperature test parameters and loop response signals of the DCDC converter respectively, so as to obtain the test data, comprises the following steps: generating an initial sinusoidal fluctuation signal, an initial pulse interference signal and an initial load adjustment signal by using a pseudo-random sequence generator to drive the load of the DCDC converter; collecting the voltage test parameters, current test parameters, temperature test parameters and loop response signals of the DCDC converter respectively, so as to obtain the test data.

3. The test method of claim 2, wherein, The method of determining a dynamic response parameter of the DCDC converter based on the test data comprises the following steps: determining time domain parameters and frequency domain parameters based on the voltage test parameters, current test parameters, temperature test parameters and loop response signals in the test data, so as to obtain the dynamic response parameter; wherein the time domain parameters represent the overshoot, recovery and loop response of the DCDC converter, and the frequency domain parameters represent the stability of the loop.

4. The test method of claim 3, wherein, The adjustment of the test disturbance parameter comprises the adjustment of at least one of the initial sinusoidal fluctuation signal, the initial pulse interference signal and the initial load adjustment signal.

5. The test method of claim 4, wherein, If the time domain parameters meet a first preset condition and the frequency domain parameters meet a second preset condition, it is determined that the dynamic response parameter meets the preset standard.

6. The test method of claim 5, wherein, If the dynamic response parameter meets the preset standard, the method further comprises the following steps before generating the test report: calculating a gain margin parameter and / or a phase margin parameter by using a Bode diagram fitting algorithm; generating the test report in response to the gain margin parameter and / or the phase margin parameter meeting a third preset condition, and adjusting the test disturbance parameter in response to the gain margin parameter and / or the phase margin parameter not meeting the third preset condition.

7. A test system for a DCDC converter, characterized by The method comprises the following steps: a test module for testing the DCDC converter based on a test disturbance parameter and collecting test data; the test data comprises voltage test parameters, current test parameters, temperature test parameters and loop response signals of the DCDC converter; a data processing module electrically connected to the test module, the data processing module being configured to generate a test disturbance parameter and send it to the test module, receive the test data collected by the test module and process the test data, and generate a test report.

8. The test system of claim 7, wherein, The test module comprises a load matrix unit and a control unit; the control unit is electrically connected with the load matrix unit, and the control unit is used for controlling the load matrix unit to configure the load of the DCDC converter and drive the load of the DCDC converter by using the test perturbation parameter generated by the data processing module.

9. An electronic device, comprising: The electronic device comprises a memory and a processor which are coupled with each other, the processor is used for executing program instructions stored in the memory, and the processor is used for executing program data to implement the steps in the test method of the DCDC converter according to any one of claims 1 to 6.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, and the computer program is executed by the processor to implement the steps in the test method of the DCDC converter according to any one of claims 1 to 6.

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