Dust sensor verification method and system, medium and electronic equipment

Abstract

The invention provides a dust sensor verification method and system, a medium and electronic equipment. The dust sensor verification method comprises the following steps: carrying out pretreatment test on a dust sensor to be tested to obtain reference measurement data of the dust sensor to be tested; performing an optical path offset test on the to-be-tested dust sensor to obtain an optical path initial state of the to-be-tested dust sensor; performing a structured test on the to-be-tested dust sensor to obtain a structured test result and a post-test dust sensor after the structured test, wherein the structured test result comprises an interference measurement result and a vibration test result; performing post-test on the post-test dust sensor to obtain a post-test result; and obtaining a verification result of the to-be-tested dust sensor based on the reference measurement data, the optical path initial state, the structured test result and the post-test result. According to the method, the verification reliability of the dust sensor can be improved.

Description

Technical Field

[0001] This application belongs to the field of sensor detection technology, and relates to a sensor verification method, particularly a dust sensor verification method, system, medium, and electronic equipment. Background Technology

[0002] With the widespread adoption of air purifiers, HVAC systems, and industrial environmental monitoring equipment, dust sensors, as core components of sensing terminals, are finding increasingly diverse and complex applications. Whether in long-term static monitoring in home environments or in high-intensity dynamic environments such as vehicles and industrial sites, the detection accuracy and long-term reliability of dust sensors face severe challenges. However, current verification systems lack specific quantitative assessments of optical path offset, and tests are conducted in isolation, without considering structural reliability and electrical stability. Furthermore, they focus only on whether the current test passes, ignoring the sensor's performance degradation curve throughout the testing process, making it difficult to comprehensively evaluate reliability and preventing many potential problems from being detected and eliminated in a timely manner. Therefore, providing a multi-dimensional integrated sensor reliability verification method has become one of the urgent problems to be solved. Summary of the Invention

[0003] The purpose of this application is to provide a dust sensor verification method, system, medium, and electronic device to improve the reliability of dust sensor verification.

[0004] In a first aspect, this application provides a dust sensor verification method, the method comprising: initializing and calibrating a dust sensor to be tested to obtain a standard dust concentration test environment; performing a preprocessing test on the dust sensor to be tested to obtain reference measurement data of the dust sensor to be tested; performing an optical path offset test on the dust sensor to be tested to obtain the initial state of the optical path of the dust sensor to be tested; performing a structured test on the dust sensor to be tested to obtain structured test results and a post-test dust sensor after structured testing, the structured test results including interference measurement results and vibration test results; performing a post-test on the post-test dust sensor to obtain post-test results; and obtaining a verification result of the dust sensor to be tested based on the reference measurement data, the initial state of the optical path, the structured test results, and the post-test results.

[0005] In one implementation of the first aspect, preprocessing the dust sensor under test to obtain the reference measurement data of the dust sensor under test includes: obtaining the zero-point output of the dust sensor under test in a dust-free environment; and obtaining the standard dust concentration measurement value of the dust sensor under test in the standard dust concentration test environment.

[0006] In one implementation of the first aspect, performing an optical path offset test on the dust sensor under test to obtain the initial state of the optical path includes: emitting a calibration beam to the dust sensor under test using a laser emitter; obtaining the initial spot position of the dust sensor under test using a position-sensitive detector; obtaining the initial optical path trajectory of the dust sensor under test using an image acquisition unit; and obtaining the initial state of the optical path based on the initial spot position and the initial optical path trajectory.

[0007] In one implementation of the first aspect, performing structured testing on the dust sensor under test to obtain structured test results includes: performing electromagnetic interference testing on the dust sensor under test to obtain interference measurement results; and performing vibration testing on the dust sensor under test to obtain vibration test results.

[0008] In one implementation of the first aspect, performing a post-test on the post-test dust sensor to obtain post-test results includes: performing a preprocessing test on the post-test dust sensor to obtain post-measurement data of the post-test dust sensor; and performing an optical path offset test on the post-test dust sensor to obtain the post-optical path state of the post-test dust sensor.

[0009] In one implementation of the first aspect, performing a preprocessing test on the post-test dust sensor to obtain post-measurement data of the post-test dust sensor includes: obtaining the zero-point output of the post-test dust sensor in a dust-free environment; and obtaining the standard dust concentration measurement value of the post-test dust sensor in the standard dust concentration test environment.

[0010] In one implementation of the first aspect, the process of obtaining the verification result of the dust sensor under test includes: obtaining a zero-point offset and a measurement error rate based on the reference measurement data of the dust sensor under test and the post-measurement data of the post-test dust sensor; obtaining an optical path offset change based on the initial optical path state of the dust sensor under test and the post-optical path state of the post-test dust sensor; and comparing the zero-point offset, the measurement error rate, and the optical path offset change with a threshold to obtain the verification result of the dust sensor under test.

[0011] Secondly, this application provides a dust sensor verification system, comprising: an initialization module for initializing and calibrating the dust sensor under test to obtain a standard dust concentration test environment; a preprocessing test module for performing preprocessing tests on the dust sensor under test to obtain reference measurement data of the dust sensor under test; an optical path offset test module for performing optical path offset tests on the dust sensor under test to obtain the initial optical path state of the dust sensor under test; a structured test module for performing structured tests on the dust sensor under test to obtain structured test results and a post-test dust sensor after structured testing, wherein the structured test results include interference measurement results and vibration test results; a post-test module for performing post-tests on the post-test dust sensor to obtain post-test results; and a verification result acquisition module for obtaining the verification result of the dust sensor under test based on the reference measurement data, the initial optical path state, the structured test results, and the post-test results.

[0012] Thirdly, this application provides an electronic device, the electronic device comprising: a memory storing a computer program thereon; and a processor communicatively connected to the memory for executing the computer program to implement the dust sensor verification method described above.

[0013] Fourthly, this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by an electronic device, implements the dust sensor verification method described above.

[0014] As described above, the dust sensor verification method, system, medium, and electronic device described in this application have the following beneficial effects:

[0015] Precise detection of spot offset and optical path deviation in dust sensors enables accurate quantification of optical path offset and precise identification of the causes of performance degradation in dust sensors. Simultaneously, multi-dimensional testing is integrated for the dust sensors under test, correlating and verifying optical path stability, electromagnetic interference performance, structural robustness, and performance degradation before and after testing, forming a complete reliable verification chain. By comparing and quantifying the zero-point offset, measurement error rate, and optical path offset changes of the dust sensors under test and subsequent test sensors before and after testing, accurate and reliable quantitative evaluation of the testing process is achieved, enabling reliability screening after mass production. Attached Figure Description

[0016] Figure 1 The diagram shown illustrates an application scenario of Embodiment 1 of this application.

[0017] Figure 2The diagram shows a process schematic of the dust sensor verification method described in the embodiments of this application.

[0018] Figure 3 The diagram shows a process for performing an optical path offset test on the dust sensor under test as described in an embodiment of this application.

[0019] Figure 4 This diagram illustrates the process of obtaining the verification results of the dust sensor under test as described in an embodiment of this application.

[0020] Figure 5 The diagram shown is a structural schematic of the dust sensor verification system described in an embodiment of this application.

[0021] Figure 6 The diagram shown is a structural schematic of the electronic device described in an embodiment of this application. Detailed Implementation

[0022] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0023] It should be noted that the illustrations provided in the following embodiments are only schematic representations of the basic concept of this application. Therefore, the drawings only show the components related to this application and are not drawn according to the actual number, shape and size of the components in the actual implementation. In the actual implementation, the form, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0024] With the widespread adoption of air purifiers, HVAC systems, and industrial environmental monitoring equipment, dust sensors, as core components of sensing terminals, are finding increasingly diverse and complex applications. Whether in long-term static monitoring in home environments or in high-intensity dynamic environments such as vehicles and industrial sites, dust sensors face significant challenges in achieving both detection accuracy and long-term reliability.

[0025] However, existing dust sensor reliability verification methods generally suffer from significant technical deficiencies, making it difficult to meet the testing requirements for high precision and high reliability. These deficiencies are mainly manifested in the following three aspects:

[0026] (1) Lack of a dedicated quantitative judgment mechanism for optical path offset. Existing tests usually only focus on the final output value, while ignoring the physical state of the optical path as the sensing "source". Since even a small relative displacement between the laser emitter, lens group and receiver can cause the spot to fall, resulting in a significant attenuation of the received signal, if there is no dedicated detection method for optical path offset (such as spot coordinates, optical path trajectory), the system cannot accurately identify whether the performance degradation is caused by physical optical path offset or circuit noise, making it difficult to attribute the fault and control the optical accuracy from the root.

[0027] (2) EMC testing and vibration testing are conducted in isolation, failing to establish a deep correlation between structural reliability and electrical stability. In traditional testing procedures, electromagnetic compatibility (EMC) testing and mechanical vibration testing are often two separate and independent steps. The system assumes that structural changes will not significantly affect electrical performance, or that electrical interference is unrelated to structural stress. However, under actual operating conditions, severe vibration may cause components to loosen or connectors to have poor contact, thereby reducing the equipment's anti-interference threshold; conversely, strong electromagnetic interference may also drive the actuator to produce micro-vibrations. Existing technology cannot couple and analyze "structural damage after vibration testing" with "electrical performance in EMC testing," resulting in one-sided test results that cannot reproduce the real and complex composite stress environment.

[0028] (3) Lack of closed-loop comparison logic for zero-point and measured values ​​before and after testing. Existing verification methods are mostly "snapshot" tests, which only focus on whether the current test passes, while ignoring the performance degradation curve of the sensor throughout the stress test process. Due to the lack of a closed-loop comparison mechanism to construct zero-point output offset, measurement error rate, and changes in optical path state between "preprocessing" and "post-testing", the system has difficulty in quantitatively evaluating the degree of degradation of the sensor's performance indicators after experiencing stress over a simulated life cycle. This makes it impossible to detect and eliminate many potential and cumulative reliability hazards in a timely manner.

[0029] At least in response to the above-mentioned problems, the following embodiments of this application provide a dust sensor verification method, system, medium, and electronic device.

[0030] The technical solutions in the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0031] Figure 1 This diagram illustrates an application scenario according to an embodiment of this application. For example... Figure 1As shown, the dust sensor verification device 100 includes an optical path offset judgment module 101, an EMC (Electromagnetic Compatibility) testing module 102, a vibration testing module 103, a performance change monitoring module 104, and a comprehensive evaluation module 105. The optical path offset judgment module 101 includes a laser emitter, a position-sensitive detector, a signal processing unit, and an image acquisition unit. The laser emitter emits a calibration beam, which, after reflection or transmission through the internal optical path of the dust sensor, is received by the position-sensitive detector and outputs a spot position signal. The image acquisition unit synchronously captures the optical path trajectory inside the dust sensor. The signal processing unit performs threshold comparisons to determine the spot deviation and optical path trajectory deviation before and after the test. The EMC testing module 102 includes an electromagnetic interference generator, a signal shielding box, and a data acquisition card. The EMC testing module simulates electromagnetic interference environments such as electrostatic discharge and radio frequency radiation, and collects data on the stability of the dust sensor's measurements under interference to determine whether it meets EMC standards. The vibration testing module 103 includes a programmable vibration table, a force sensor, and an acoustic detection unit. The vibration table vibrates in multiple directions according to a preset vibration frequency (e.g., 5-500Hz) and a preset amplitude. The force sensor detects changes in the insertion and extraction force of the connectors, and the acoustic detection unit captures abnormal noises caused by loose screws. Combined with physical inspection after vibration, the tightness of the connectors and screws is determined. The performance change monitoring module 104 includes a standard dust generator and a high-precision data logger. The high-precision data logger tests the zero-point output of the dust sensor in a dust-free standard clean environment. The standard dust concentration environment is obtained through the standard dust generator. The standard dust measurement value is recorded in a known dust concentration environment. After electromagnetic interference testing and vibration testing, the standard clean environment and the known dust concentration environment are repeatedly tested to obtain the zero-point offset and test value error rate, and a performance change report is generated. The comprehensive evaluation module 105 integrates the optical path offset judgment results, EMC test pass rate, vibration test structural reliability and performance change data, calculates the comprehensive reliability score according to the weight, and outputs the verification results of whether the dust sensor under test is qualified or unqualified, as well as the defect location report.

[0032] Figure 2 This diagram illustrates the process of a dust sensor verification method according to an embodiment of this application. Figure 2 As shown, the dust sensor verification method includes the following steps S11 to S16.

[0033] Step S11: Initialize and calibrate the dust sensor to be tested to obtain a standard dust concentration test environment.

[0034] For example, the dust sensor under test is fixed on a test bench, and the reference coordinates of the position-sensitive detector in the optical path offset judgment module and the standard dust concentration environment are calibrated. The calibration of the reference coordinates of the position-sensitive detector includes: in a clean, dust-free air environment, activating a laser emitter to emit a beam. The beam is processed by the internal optical elements (transmitting mirror, reflecting mirror) of the dust sensor under test and output to the photosensitive surface of the position-sensitive detector to form a reference spot. This reference spot represents the absolute zero point and serves as a reference for subsequent optical path offset comparisons. The signal processing unit reads the position signal of the spot on the position-sensitive detector and sets it as the reference coordinates. These reference coordinates represent the ideal state of perfect optical path alignment. The dust sensor under test is placed in a sealed test chamber and filled with standard dust. The dust concentration in the test chamber is monitored and calibrated to obtain the standard dust concentration test environment.

[0035] Step S12: Perform preprocessing tests on the dust sensor to be tested to obtain the reference measurement data of the dust sensor to be tested.

[0036] In one embodiment of this application, preprocessing the dust sensor under test to obtain its baseline measurement data includes: acquiring the zero-point output of the dust sensor under test in a dust-free environment; and acquiring the standard dust concentration measurement value of the dust sensor under test in a standard dust concentration test environment. The zero-point output of the dust sensor under test in a dust-free environment represents the electrical zero point of the sensor in a dust-free state. Based on the initialized standard dust concentration test environment, the standard dust concentration is measured using the dust sensor under test to obtain the standard dust concentration measurement value, which reflects the measurement accuracy of the dust sensor under ideal operating conditions.

[0037] Step S13: Perform an optical path offset test on the dust sensor under test to obtain the initial state of the optical path of the dust sensor under test. An optical path offset judgment module is used to perform the optical path offset test on the dust sensor under test to obtain the optical path evaluation result.

[0038] Figure 3 This diagram illustrates the process of performing an optical path offset test on a dust sensor under test according to an embodiment of this application. Figure 3 As shown, performing an optical path offset test on the dust sensor under test to obtain the initial state of the optical path includes the following steps S21 to S24.

[0039] Step S21: Use a laser emitter to emit a calibration beam toward the dust sensor under test.

[0040] Step S22: Use a position-sensitive detector to obtain the initial spot position of the dust sensor under test.

[0041] For example, the calibration beam enters the dust sensor under test, passes through the optical system (transmission mirror, reflection mirror) inside the sensor, and is emitted from the outlet and transmitted to the photosensitive surface of the position-sensitive detector. The position-sensitive detector obtains the coordinate data of the initial spot position and sends the coordinate data to the signal processing unit.

[0042] Step S23: Use the image acquisition unit to obtain the initial optical path trajectory of the dust sensor under test.

[0043] For example, the image acquisition unit captures the complete path of the calibration beam propagating inside the sensor to obtain the initial optical path trajectory.

[0044] Step S24: Obtain the initial state of the optical path based on the initial spot position and the initial optical path trajectory.

[0045] For example, the signal processing unit integrates and analyzes the initial spot position from the position-sensitive detector and the initial optical path trajectory from the image acquisition unit to obtain the initial optical path state.

[0046] Step S14: Perform structured testing on the dust sensor to be tested to obtain structured test results and a post-test dust sensor after structured testing. The structured test results include interference measurement results and vibration test results.

[0047] In one embodiment of this application, performing structured testing on the dust sensor under test to obtain structured test results includes: performing electromagnetic interference testing on the dust sensor under test to obtain interference measurement results; and performing vibration testing on the dust sensor under test to obtain vibration test results.

[0048] For example, an EMC testing module is used to perform electromagnetic interference testing on the dust sensor under test to obtain the measurement results of the dust sensor under test under electromagnetic interference. Electromagnetic interference is applied to the dust sensor under test placed in a shielded box, and the fluctuation range of the measured values ​​under electromagnetic interference is recorded to further obtain the stability of the measured values. A vibration testing module is used to perform vibration testing on the dust sensor under test to obtain the component reliability results of the dust sensor under test under vibration interference. The vibration table is adjusted according to preset parameters, and the vibration table with adjusted parameters is used to perform vibration testing on the dust sensor under test to obtain the connector insertion and extraction force, screw tightness, and abnormal noise.

[0049] The dust sensor under test after electromagnetic interference and vibration tests is the post-test dust sensor. The preprocessing test and optical path offset test are repeatedly performed on the post-test dust sensor to obtain the comparison results of the dust sensor before and after the test.

[0050] Step S15: Perform a post-test on the post-test dust sensor to obtain the post-test results.

[0051] In one embodiment of this application, performing a post-test on the post-test dust sensor to obtain post-test results includes: performing a preprocessing test on the post-test dust sensor to obtain post-measurement data of the post-test dust sensor; performing an optical path offset test on the post-test dust sensor to obtain the post-optical path state of the post-test dust sensor, the post-optical path state including the post-light spot position and the post-optical path trajectory.

[0052] Preferably, performing preprocessing tests on the post-test dust sensor to obtain post-measurement data of the post-test dust sensor includes: obtaining the zero-point output of the post-test dust sensor in a dust-free environment; and obtaining the standard dust concentration measurement value of the post-test dust sensor in the standard dust concentration test environment.

[0053] Step S16: Based on the benchmark measurement data, the initial state of the optical path, the structured test results, and the post-test results, obtain the verification results of the dust sensor under test.

[0054] Figure 4 This diagram illustrates the process of obtaining the verification results of a dust sensor under test in one embodiment of this application. Figure 4 As shown, the process of obtaining the verification results of the dust sensor under test includes the following steps S31 to S33.

[0055] Step S31: Obtain the zero-point offset and measurement error rate based on the reference measurement data of the dust sensor to be tested and the post-test measurement data of the dust sensor.

[0056] For example, zero-point offset = zero-point output of the post-test dust sensor in a dust-free environment - zero-point output of the dust sensor under test in a dust-free environment; measurement error rate = (standard dust concentration measurement value of the post-test dust sensor in a standard dust concentration test environment - standard dust concentration measurement value of the dust sensor under test in a standard dust concentration test environment) / standard dust concentration.

[0057] Step S32: Obtain the change in optical path offset based on the initial optical path state of the dust sensor under test and the subsequent optical path state of the subsequent dust sensor.

[0058] For example, the optical path offset change includes the deviation between the initial spot position and the subsequent spot position, and the deviation between the subsequent optical path trajectory and the initial optical path trajectory.

[0059] Step S33: Perform threshold comparison on the zero-point offset, the measurement error rate, and the optical path offset change to obtain the verification result of the dust sensor under test.

[0060] For example, the absolute value of the zero-point offset is compared with a preset zero-point offset threshold. If the absolute value of the zero-point offset is greater than the preset zero-point offset threshold, the zero-point stability is determined to be substandard. The measurement error rate is compared with a preset measurement error rate threshold. If the measurement error rate is greater than the preset measurement error rate threshold, the measurement accuracy attenuation is determined to be excessive. The spot position offset and optical path trajectory deviation in the optical path offset change are compared with thresholds. If the offset distance between the initial spot position and the subsequent spot position exceeds the spot position offset threshold, the spot position offset is determined to be excessive. If the deviation between the initial optical path trajectory and the subsequent optical path trajectory exceeds the trajectory similarity threshold, the optical path trajectory change is excessive. Based on the threshold comparison of all indicators, the final verification result of the dust sensor under test is obtained, achieving reliable quantitative evaluation.

[0061] The dust sensor verification method provided in this application will now be described in detail through a specific example. It should be noted that the content of this example is only for explaining and illustrating the dust sensor verification method provided in this application, and is not intended to limit the scope of protection of this application in any way. In specific applications, corresponding steps can be added or deleted based on this example according to actual needs. The dust sensor verification method in this example includes the following steps S100 to S108.

[0062] Step S100: Initialize the dust sensor to be tested. Initialize and calibrate the dust sensor fixed on the test bench. Obtain the reference coordinates and standard dust concentration test environment through the position-sensitive detector of the optical path offset judgment module.

[0063] Step S101: Perform pre-processing tests on the dust sensor to be tested. Record the zero-point output of the dust sensor under test in a dust-free environment and the measured value of the standard dust concentration under a standard dust concentration test environment, as the reference measurement data of the dust sensor to be tested.

[0064] Step S102: Perform an optical path offset test on the dust sensor under test. Start laser calibration, and collect the initial spot position and initial optical path trajectory after passing through the dust sensor under test to preliminarily determine the initial state of the optical path.

[0065] Step S103: Perform electromagnetic interference testing on the dust sensor under test. Apply electromagnetic interference to the dust sensor under test, which is placed in a shielded box, and record the fluctuation range of the measured values ​​of the dust sensor under test to obtain the stability of the interference measurement.

[0066] Step S104: Perform a vibration test on the dust sensor under test. Start the vibration table according to the preset vibration parameters to perform a vibration test on the dust sensor under test, and obtain the vibration test results of the internal components of the dust sensor under test.

[0067] Step S105: Obtain the post-test dust sensor that has undergone electromagnetic interference testing and vibration testing.

[0068] Step S106: Repeat the preprocessing test on the post-test dust sensor to obtain the post-test measurement data of the post-test dust sensor, and repeat the optical path offset test on the post-test dust sensor to obtain the post-test optical path state of the post-test dust sensor.

[0069] Step S107: Obtain the zero-point offset based on the zero-point output of the dust sensor under test and the zero-point output of the subsequent dust sensor; obtain the measurement error rate based on the measured value of the dust sensor under test and the measured value of the subsequent dust sensor; and obtain the optical path offset change based on the initial optical path state of the dust sensor under test and the subsequent optical path state of the subsequent dust sensor.

[0070] Step S108: Threshold comparison and integration quantification are performed on the zero-point offset, measurement error rate, and optical path offset change to obtain the verification results and performance quantification report of the dust sensor under test.

[0071] It should be noted that the labels S100 to S108 are only used to indicate different steps, and not to restrict the execution order of these steps.

[0072] The scope of protection of the dust sensor verification method provided in this application is not limited to the execution order of the steps listed above. Any solution implemented by adding, subtracting, or replacing steps in the prior art based on the principles of this application is included within the scope of protection of this application.

[0073] In summary, the dust sensor verification method of this application employs a dual-dimensional detection approach using a position-sensitive detector and an image acquisition unit to accurately detect spot offset and optical path trajectory deviation, achieving quantification of optical path offset. This optical path offset is used to precisely locate the causes of performance degradation in the dust sensor. Simultaneously, multi-dimensional testing is integrated for the dust sensor under test, correlating and verifying optical path stability, electromagnetic interference performance, structural robustness, and performance degradation, forming a complete reliable verification chain. The zero-point offset, measurement error rate, and optical path offset change before and after testing of the dust sensor under test and subsequent test dust sensors are compared and quantified, achieving accurate and reliable quantitative evaluation. Furthermore, the verification process for the dust sensor under test is automated and standardized, enabling reliability screening after mass production.

[0074] This application also provides a dust sensor verification system, which can implement the dust sensor verification method described in this application. However, the implementation device of the dust sensor verification method described in this application includes, but is not limited to, the structure of the dust sensor verification system listed in this embodiment. All structural modifications and substitutions of the prior art made based on the principles of this application are included within the protection scope of this application.

[0075] Figure 5 The diagram shown is a structural schematic of a dust sensor verification system according to an embodiment of this application. Figure 5 As shown, the dust sensor verification system 1 includes: an initialization module 11, a preprocessing test module 12, an optical path offset test module 13, a structured test module 14, a post-test module 15, and a verification result acquisition module 16. The initialization module 11 is used to initialize and calibrate the dust sensor under test to obtain a standard dust concentration test environment. The preprocessing test module 12 is used to perform preprocessing tests on the dust sensor under test to obtain reference measurement data. The optical path offset test module 13 is used to perform optical path offset tests on the dust sensor under test to obtain the initial optical path state of the dust sensor. The structured test module 14 is used to perform structured tests on the dust sensor under test to obtain structured test results and a post-test dust sensor after structured testing; the structured test results include interference measurement results and vibration test results. The post-test module 15 is used to perform post-tests on the post-test dust sensor to obtain post-test results. The verification result acquisition module 16 is used to acquire the verification result of the dust sensor under test based on the benchmark measurement data, the initial state of the optical path, the structured test result, and the post-test result.

[0076] It should be noted that, Figure 5 The modules in the dust sensor verification system 1 shown are... Figure 2 The steps in the dust sensor verification method are all corresponding and will not be repeated here.

[0077] In the embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, or methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules / units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple modules or units may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection of apparatuses or modules or units may be electrical, mechanical, or other forms.

[0078] The modules / units described as separate components may or may not be physically separate. The components shown as modules / units may or may not be physical modules; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules / units can be selected to achieve the objectives of the embodiments of this application, depending on actual needs. For example, the functional modules / units in the various embodiments of this application may be integrated into one processing module, or each module / unit may exist physically separately, or two or more modules / units may be integrated into one module / unit.

[0079] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0080] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the dust sensor verification method provided in this application. Those skilled in the art will understand that all or part of the steps in the methods of the above embodiments can be implemented by a program instructing a processor. The program can be stored in a computer-readable storage medium, which is a non-transitory medium, such as random access memory, read-only memory, flash memory, hard disk, solid-state drive, magnetic tape, floppy disk, optical disk, and any combination thereof. The storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center that integrates one or more available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., digital video disc (DVD)), or a semiconductor medium (e.g., solid-state disk (SSD)).

[0081] This application embodiment may also provide an electronic device. Figure 6 The diagram shown is a structural schematic of an electronic device 200 according to an embodiment of this application. Figure 6As shown, in this embodiment, the electronic device 200 includes a memory 201 and a processor 202.

[0082] The memory 201 is used to store computer programs. In some possible implementations, the memory 201 may include various media capable of storing program code, such as ROM, RAM, magnetic disk, USB flash drive, memory card, or optical disk.

[0083] In this embodiment, memory 201 may include a computer system readable medium in the form of volatile memory, such as RAM and / or cache memory. Electronic device 200 may further include other removable / non-removable, volatile / non-volatile computer system storage media. Memory 201 may include at least one program product having a set (e.g., at least one) of program modules configured to perform the functions of the embodiments of this application.

[0084] The processor 202 is connected to the memory 201 and is used to execute the computer program stored in the memory 201 so that the electronic device 200 performs the dust sensor verification method.

[0085] For example, processor 202 may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc. In other embodiments, processor 202 may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0086] In some implementations, the electronic device 200 provided in this application embodiment may further include a display 203. The display 203 is communicatively connected to the memory 201 and the processor 202, and is used to display a graphical user interface (GUI) related to the dust sensor verification method.

[0087] In this embodiment, the display 203 may include a display screen (display panel). In some implementations, the display panel may be configured using a liquid crystal display (LCD), an organic light-emitting diode (OLED), or other similar forms. Furthermore, the display 203 may also be a touch panel (touchscreen, touch screen), which may include a display screen and a touch-sensitive surface. When the touch-sensitive surface detects a touch operation on or near it, it transmits the information to the processor 202 to determine the type of touch event. Subsequently, the processor 202 provides corresponding visual output on the display device based on the type of touch event.

[0088] The descriptions of the processes or structures corresponding to the above figures each have their own emphasis. For parts of a process or structure that are not described in detail, please refer to the relevant descriptions of other processes or structures.

[0089] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.

Claims

1. A method for verifying a dust sensor, characterized in that, The dust sensor verification method includes: Initialize and calibrate the dust sensor to be tested to obtain a standard dust concentration test environment; Preprocessing tests are performed on the dust sensor under test to obtain the reference measurement data of the dust sensor under test; An optical path offset test is performed on the dust sensor under test to obtain the initial state of the optical path of the dust sensor under test; The dust sensor under test is subjected to structured testing to obtain structured test results and a post-test dust sensor after structured testing. The structured test results include interference measurement results and vibration test results. The post-test dust sensor is subjected to a post-test to obtain the post-test results; The verification results of the dust sensor under test are obtained based on the benchmark measurement data, the initial state of the optical path, the structured test results, and the post-test results.

2. The dust sensor verification method according to claim 1, characterized in that, Pre-processing tests on the dust sensor under test to obtain baseline measurement data of the dust sensor under test include: Obtain the zero-point output of the dust sensor under test in a dust-free environment; Obtain the standard dust concentration measurement value of the dust sensor under test in the standard dust concentration test environment.

3. The dust sensor verification method according to claim 1, characterized in that, To obtain the initial state of the optical path, the dust sensor under test is subjected to an optical path offset test, including: A calibration beam is emitted toward the dust sensor under test using a laser emitter; The initial spot position of the dust sensor under test is obtained using a position-sensitive detector; The initial optical path trajectory of the dust sensor under test is obtained using the image acquisition unit; The initial state of the optical path is obtained based on the initial spot position and the initial optical path trajectory.

4. The dust sensor verification method according to claim 1, characterized in that, The structured testing of the dust sensor under test to obtain the structured test results includes: Electromagnetic interference testing was performed on the dust sensor under test to obtain the interference measurement results; A vibration test is performed on the dust sensor to be tested to obtain the vibration test results.

5. The dust sensor verification method according to claim 1, characterized in that, The post-testing of the dust sensor to obtain the post-test results includes: Perform a preprocessing test on the post-test dust sensor to obtain the post-measurement data of the post-test dust sensor; An optical path offset test is performed on the rear-mounted dust sensor to obtain the rear optical path state of the rear-mounted dust sensor.

6. The dust sensor verification method according to claim 5, characterized in that, Performing preprocessing tests on the post-test dust sensor to obtain post-measurement data from the post-test dust sensor includes: Obtain the zero-point output of the post-test dust sensor in a dust-free environment; Obtain the standard dust concentration measurement value of the post-test dust sensor under the standard dust concentration test environment.

7. The dust sensor verification method according to claim 5, characterized in that, The process of obtaining the verification results of the dust sensor under test includes: The zero-point offset and measurement error rate are obtained based on the baseline measurement data of the dust sensor under test and the post-test measurement data of the dust sensor. The change in optical path offset is obtained based on the initial state of the optical path of the dust sensor under test and the state of the rear optical path of the rear dust sensor. The zero-point offset, the measurement error rate, and the optical path offset change are compared with threshold values ​​to obtain the verification results of the dust sensor under test.

8. A dust sensor verification system, characterized in that, The dust sensor verification system includes: The initialization module is used to initialize and calibrate the dust sensor under test to obtain a standard dust concentration test environment. A preprocessing test module is used to perform preprocessing tests on the dust sensor under test to obtain the reference measurement data of the dust sensor under test. The optical path offset test module is used to perform an optical path offset test on the dust sensor under test in order to obtain the initial state of the optical path of the dust sensor under test. The structured testing module is used to perform structured testing on the dust sensor under test to obtain structured test results and a post-test dust sensor after structured testing. The structured test results include interference measurement results and vibration test results. The post-test module is used to perform post-tests on the post-test dust sensor to obtain post-test results; The verification result acquisition module is used to acquire the verification result of the dust sensor under test based on the benchmark measurement data, the initial state of the optical path, the structured test result, and the post-test result.

9. An electronic device, characterized in that, The electronic device includes: A memory on which computer programs are stored; A processor, communicatively connected to the memory, is used to execute the computer program to implement the dust sensor verification method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by an electronic device, the program implements the dust sensor verification method according to any one of claims 1 to 7.

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