Semiconductor die with vertical transistor device

By setting the drain region of the additional transistor device on the first side of the semiconductor body and connecting it with vertical contact elements, combined with electrical isolation technology, the integration problem of the vertical transistor device and the additional transistor device is solved, the reusability and integration of manufacturing steps are improved, and wiring and connection are simplified.

CN121751744APending Publication Date: 2026-03-27INFINEON TECH AUSTRIA AG
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-08-27
Publication Date
2026-03-27

AI Technical Summary

Technical Problem

In the existing technology, it is difficult to effectively integrate additional transistor devices with vertical transistor devices during the manufacturing process of vertical transistor devices, resulting in insufficient repeatability and integration of manufacturing steps.

Method used

The drain region of an additional transistor device is provided on the first side of the semiconductor body and connected to the first side of the semiconductor body by a vertical contact element. Combined with electrical isolation technology, the vertical transistor device and the additional transistor device are isolated in the lateral direction to realize vertical current flow and reuse the manufacturing steps.

Benefits of technology

It enables efficient integration of vertical transistor devices with additional transistor devices, improves the reusability and integration of manufacturing steps, and provides source and drain contacts on the same side, simplifying wiring and connections.

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Abstract

A semiconductor die with a vertical transistor device is disclosed. The present disclosure relates to a semiconductor die (1) having a semiconductor body (10), the semiconductor die (1) comprising: a vertical transistor device (20) having a first load region (21) and a second load region (22) at opposite sides (10.1, 10.2) of the semiconductor body (10); an additional transistor device (40) having a source region (41) at the first side (10.1) of the semiconductor body (10), a gate trench (45), a body region (47) next to the gate trench (45), and a drain region (42) below the body region (47); an electrical isolation (60) in the semiconductor body (10); a vertical contact element (80) extending from the first side (10.1) into the semiconductor body (10); wherein the electrical isolation (60) is arranged laterally between the vertical transistor device (20) and the additional transistor device (40), and wherein the vertical contact element (80) makes electrical contact with the drain region (42) of the additional transistor device (40) and connects the drain region (42) to the first side (10.1) of the semiconductor body (10).
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