Aging test power supply system for electronic products

Abstract

The invention discloses an aging test power supply system for electronic products, which comprises a switching power supply, a plurality of power supply channels are connected in parallel on the switching power supply, each power supply channel is used for realizing aging screening of one product, an anode of each power supply channel is connected in series with an mos tube, and a cathode of each mos tube is connected in series with an anode of the switching power supply. The plurality of mos transistors are controlled through a high-precision timer and are used for realizing sequential delay power-on of multiple channels, each power supply channel is also connected in series with a group of milliohm resistors, and the milliohm resistors are used for monitoring the total current of a to-be-detected product. And the mos tube on the over-current-limiting ground wire gives an alarm to the main control CPU and gives an alarm through the warning module. The burn-in test power supply system has the functions of multi-generation, time-sharing, multi-cycle, stability and automatic power-off in case of abnormity, the detection efficiency can be effectively improved, and the safety of the detection process is ensured while the detection quality is ensured.

Description

A power supply system for aging tests of electronic products Technical Field

[0001] This invention relates to the field of aging power supply screening technology, and in particular to a power supply system for aging tests of electronic products. Background Technology

[0002] The aging test for electronic products is a screening test to eliminate potential early failures of electronic products. According to the electronic industry standard QJ908B "Aging Test Method for Electronic Products" and the Aerospace Science and Industry Fourth Academy standard Q / N 511 "Screening Technical Specification for Aging Test of Electronic Products", all electronic products should undergo aging tests at room temperature or high temperature.

[0003] To improve product aging efficiency, high-temperature aging is typically used. Multiple products are placed inside a high-temperature chamber, and their electrical interfaces are connected to the outside of the chamber via adapter cables. Each cycle typically uses DC power for 2 hours, followed by a 0.5-hour power-off period. After the power-off, electrical performance testing is performed, for a total of 12 cycles.

[0004] The old-fashioned DC power supply method of one-to-many has instantaneous voltage surges at the moment of power failure, the cable connection is relatively messy, which is time-consuming and labor-intensive. Multiple power failures require manual control, which is a huge workload. Moreover, when the product has an abnormal short circuit, it is impossible to cut off the power in time without manual supervision, which poses a significant safety hazard. Summary of the Invention

[0005] To address the aforementioned technical problems, this invention proposes a power supply system for aging tests of electronic products, which features multiple power generation, time-sharing, multi-cycle, stable operation, and automatic power-off in case of abnormalities. This system can effectively improve testing efficiency and ensure the safety of the testing process while guaranteeing testing quality.

[0006] A power supply system for aging tests of electronic products includes a switching power supply with multiple power supply channels connected in parallel. Each power supply channel is used to screen one product for aging. A MOSFET is connected in series to the positive terminal of each power supply channel. The multiple MOSFETs are controlled by a high-precision timer to achieve sequential delayed power-on of multiple channels. A set of milliohm resistors is also connected in series to each power supply channel. The milliohm resistors are used to monitor the total current of the product under test. If the current exceeds the limit, the MOSFET on the ground wire sends an alarm to the main control CPU and a warning module is used to issue a warning.

[0007] As a preferred embodiment of the above technical solution, the high-precision timer is a single-chip microcomputer precision timer.

[0008] As a preferred embodiment of the above technical solution, the high-precision timer, combined with a MOSFET, enables the cyclic power-on and power-off of each power supply path.

[0009] As a preferred embodiment of the above technical solution, the delay of each power supply path is controlled within 100±2ms.

[0010] As a preferred embodiment of the above technical solution, the output current of the power supply path does not exceed 4A.

[0011] As a preferred embodiment of the above technical solution, the warning module connected to the main control CPU includes an alarm light.

[0012] As a preferred embodiment of the above technical solution, the warning module connected to the main control CPU also includes a buzzer.

[0013] The beneficial effects of this invention are as follows:

[0014] The aging test power supply system has multiple generation, time-sharing, multi-cycle, stable, and automatic power-off functions for abnormalities, which can effectively improve testing efficiency and ensure the safety of the testing process while ensuring testing quality.

[0015] The equipment has a built-in power supply for easy portability. It switches from mains power to the discrete aging power supply voltage required by the product, typically 3.3V, 5V, 12V, 21V, 28V, and 31V. Multiple products are connected to the equipment via cable. Power is applied sequentially at 100ms intervals with a single button press, and a timer is started (typically 2 hours). Power is then sequentially de-energized (typically 0.5 hours), constituting one cycle. Up to 12 cycles can be run continuously. There are no surge spikes or other abnormal signals during power-on and power-off. If a short circuit or other abnormality occurs in any channel during the entire aging power supply cycle, the equipment will automatically shut off power before triggering an alarm, ensuring testing safety while improving testing efficiency and quality. Attached Figure Description

[0016] Figure 1 is a circuit diagram of the present invention.

[0017] Figure 2 is a schematic diagram of the present invention.

[0018] The attached diagram is labeled as follows: 1-Switching power supply, 2-Power supply path, 3-MOSFET, 4-High-precision timer, 5-Milliohm resistor, 6-Main control CPU, 7-Alarm light, 8-Buzzer. Detailed Implementation

[0019] The technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0020] As shown in Figure 1, a power supply system for aging tests of electronic products includes a switching power supply 1. Multiple power supply channels 2 are connected in parallel to the switching power supply 1. Each power supply channel 2 is used to screen one product during aging. A MOSFET 3 is connected in series to the positive terminal of each power supply channel 2. Multiple MOSFETs 3 are controlled by a high-precision timer 4 to achieve sequential delayed power-on of multiple channels. A set of milliohm resistors 5 is also connected in series to each power supply channel 2. The milliohm resistors 5 are used to monitor the total current of the product under test. If the current exceeds the limit, the MOSFET 3 on the ground wire sends an alarm to the main control CPU 6 and issues a warning through an alarm module.

[0021] In this embodiment, the high-precision timer 4 is a single-chip microcomputer precision timer.

[0022] In this embodiment, the high-precision timer 4, in conjunction with the MOSFET 3, enables the cyclic power-on and power-off of each power supply path 2.

[0023] In this embodiment, the delay of each power supply path 2 is controlled within 100±2ms.

[0024] In this embodiment, the output current of the power supply path 2 does not exceed 4A.

[0025] In this embodiment, the warning module connected to the main control CPU 6 includes an alarm light 7.

[0026] In this embodiment, the alarm module connected to the main control CPU 6 also includes a buzzer 8.

[0027] The following is a further explanation of this embodiment.

[0028] (1) Multi-channel time-sharing power supply

[0029] The instrument is designed to power on 10 channels and is controlled by MOSFET 3. The delay start between MOSFET 3 is achieved by using a high-precision timer of a single-chip microcomputer to achieve a delay of (100±2) ms between each channel. Its working principle is shown in Figure 1.

[0030] The product is powered on in a time-sharing manner to ensure that no instantaneous large current flows through the test system. The 10 positive channels are arranged in sequence, and the negative channels are reused. When the power is off, both the positive and negative channels are disconnected.

[0031] (2) Stable power supply, without electrical stress impact

[0032] The instrument has a built-in highly reliable and stable power supply. Power is switched on and off via the instrument's built-in switch. The power supply voltage is smooth, without spikes, jitters, or surges. The time from the moment of power-on to voltage stabilization is no more than 1ms.

[0033] A two-stage power supply system is used. The first stage uses a precision adjustable switching power supply, and the second stage uses a precision adjustable linear power supply. When adjusting the voltage, the voltage of both power supplies is adjusted at the same time so that the voltage difference between the two stages is kept at about 3V. This maximizes efficiency, minimizes heat generation, and achieves control accuracy at the mV level.

[0034] The final stage power supply is designed with linear power supply ripple to ensure effective control of ripple and spikes on the power supply within ±50mV. Independent filter capacitors are set at the end of each channel output to effectively absorb the surge current generated when the power is turned off.

[0035] (3) Multi-cycle automatic power supply and shutdown improves the automation rate of testing.

[0036] The voltage output cycle is controlled by instrument software. The maximum power-on time is 240 minutes, and the maximum power-off time is 60 minutes. The duration is adjustable, and the maximum cycle is 12.

[0037] The implementation of timed cyclic power supply detection mainly utilizes the microcontroller's precision timer as the signal source, in conjunction with the MOSFETs 3 on each channel, to achieve multi-cycle cyclic control.

[0038] (4) Abnormal power supply protection

[0039] When the total current of the product exceeds the instrument's current limit, the instrument's self-protection function is triggered, first cutting off the power and then sounding an alarm to protect the product.

[0040] A milliohm resistor 5 is connected in series on the common ground line of the 10 channels. An independent microcontroller continuously monitors the output current of the entire instrument. If the current exceeds 4A, the MOSFET on the ground line will be disconnected to realize overcurrent and short circuit protection. At the same time, an alarm is sent to the main control CPU 6, and the system issues an audible and visual alarm. Its schematic diagram is shown in Figure 2.

[0041] The development and application of intelligent power supplies can ensure the safety and testing efficiency of product electrical aging tests from multiple dimensions, such as multi-channel, time-sharing, stable power-on, multi-cycle, and abnormal power failure protection.

[0042] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A power supply system for aging tests of electronic products, characterized in that: The system includes a switching power supply with multiple power supply channels connected in parallel. Each power supply channel is used to perform aging and screening of a product. A MOSFET is connected in series to the positive terminal of each power supply channel. The multiple MOSFETs are controlled by a high-precision timer to achieve sequential delayed power-on of multiple channels. A set of milliohm resistors is also connected in series to each power supply channel. The milliohm resistors are used to monitor the total current of the product under test. If the current exceeds the limit, the MOSFET on the ground wire sends an alarm to the main control CPU and is alerted through the warning module.

2. The power supply system for aging tests of electronic products according to claim 1, characterized in that: The high-precision timer is a single-chip microcomputer precision timer.

3. The power supply system for aging tests of electronic products according to claim 1, characterized in that: The high-precision timer, combined with the MOSFET, enables the cyclic power-on and power-off of each power supply path.

4. The power supply system for aging tests of electronic products according to claim 1, characterized in that: The delay of each power supply path is controlled within 100±2ms.

5. A power supply system for aging tests of electronic products according to claim 1, characterized in that: The output current of the power supply path does not exceed 4A.

6. A power supply system for aging tests of electronic products according to claim 1, characterized in that: The warning module connected to the main control CPU includes an alarm light.

7. A power supply system for aging tests of electronic products according to claim 6, characterized in that: The warning module connected to the main control CPU also includes a buzzer.

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