HDMI test system and method, and test device

Abstract

The invention relates to the technical field of electronics, and discloses an HDMI test system, method and device, and the method comprises the steps: disconnecting each first connection circuit when each first pin outputs a first voltage, so as to enable a control unit to switch off the first connection circuit when detecting that the pin voltage of any second pin is smaller than or equal to an open-circuit voltage threshold value, and enabling the first connection circuit to switch off the second connection circuit when detecting that the pin voltage of any second pin is smaller than or equal to an open-circuit voltage threshold value; and determining that the to-be-tested device has an open circuit abnormity, or when the ith first pin of the control unit outputs a second voltage and the other first pins output the first voltage, conducting a first connection circuit connected with the ith first pin and a second connection circuit connected with the ith second pin, the control unit is connected with the first short-circuit voltage and the second short-circuit voltage, so that when the control unit detects that the pin voltage of any second pin except the i-th second pin is larger than the first short-circuit voltage or the pin voltage of the i-th second pin is smaller than the second short-circuit voltage, it is determined that the to-be-tested device is short-circuit abnormities, and the universality and the testing efficiency of the HDMI testing system can be improved.

Description

Technical Field

[0001] This application relates to the field of electronic technology, and in particular to an HDMI testing system, method and testing equipment. Background Technology

[0002] High Definition Multimedia Interface (HDMI) is a high-definition digital video and audio interface used to transmit video or audio signals. When the HDMI circuit has an open circuit or short circuit, the clarity of the transmitted video or audio signal will be reduced, and in severe cases, it can damage the device. Therefore, to ensure product quality, it is necessary to perform open circuit and short circuit tests on the HDMI circuit of the product.

[0003] Existing solutions typically employ indirect testing methods to perform open-circuit or short-circuit tests on HDMI circuits. For example, by detecting the quality of the video or audio signals output by the HDMI circuit, it can be determined whether the HDMI circuit has an open-circuit or short-circuit problem.

[0004] In the process of developing this application, the inventors discovered that the prior art has at least the following problems: due to the differences in the HDMI circuit structure of different products, testers need to change the test requirements, test channels, and test parameters according to the specific HDMI circuit configuration, which increases the complexity of operation and results in low test efficiency. Summary of the Invention

[0005] This application provides an HDMI testing system, method, and testing equipment, which enables open-circuit and short-circuit detection of HDMI circuits in different products through a single testing system, thereby improving the versatility and testing efficiency of the testing system.

[0006] The embodiments of this application provide the following technical solutions:

[0007] In a first aspect, embodiments of this application provide an HDMI testing system, which includes a control unit and a line coupling unit. The control unit includes a plurality of first pins and second pins.

[0008] The line coupling unit includes a first connection circuit and a second connection circuit. Each first pin corresponds to a first connection circuit, which is used to connect the first pin to the first HDMI port of the device under test. Each second pin corresponds to a second connection circuit, which is used to connect the second pin to the first HDMI port.

[0009] The control unit, connected to the line coupling unit, is used to output a first voltage or a second voltage to the line coupling unit and to detect the pin voltage of the second pin to determine whether the device under test has an open circuit or short circuit abnormality.

[0010] The line coupling unit connects the control unit and the first HDMI port, and is used for:

[0011] When each first pin outputs a first voltage, each first connection circuit is disconnected and each second connection circuit is turned on, so that when the control unit detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold, it determines that the device under test has an open circuit abnormality.

[0012] Alternatively, when the i-th first pin of the control unit outputs a second voltage and the other first pins output a first voltage, the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin are turned on, so that when the control unit detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short-circuit voltage, or the pin voltage of the i-th second pin is less than the second short-circuit voltage, it determines that the device under test has a short-circuit abnormality.

[0013] The first short-circuit voltage is greater than the second short-circuit voltage.

[0014] Secondly, embodiments of this application provide a testing device, which includes:

[0015] Such as the HDMI test system in the first aspect.

[0016] Thirdly, embodiments of this application provide an HDMI testing method, which is applied to the HDMI testing system of the first aspect. The HDMI testing method includes:

[0017] After plugging the device into the system through the first HDMI port, a short circuit test is performed on the device under test to determine whether the circuit of the device under test is normal.

[0018] If the short-circuit test result indicates that the line is normal, an open-circuit test is performed on the device under test to determine whether the device under test has an open-circuit abnormality.

[0019] Fourthly, embodiments of this application provide a testing device, including:

[0020] At least one processor; and

[0021] A memory that is communicatively connected to at least one processor; wherein,

[0022] The memory stores instructions that can be executed by at least one processor to enable the at least one processor to perform HDMI test methods such as those described in the third aspect.

[0023] Fifthly, embodiments of this application provide a non-volatile computer-readable storage medium storing computer-executable instructions for causing a test device to perform the HDMI test method as described in the third aspect.

[0024] Sixthly, embodiments of this application provide a computer program product, including instructions or programs that, when executed by at least one processor, cause at least one processor to execute the HDMI test method computer program as described in the third aspect.

[0025] The beneficial effects of the embodiments of this application are as follows: Unlike the prior art, the embodiments of this application provide an HDMI testing system. The HDMI testing system includes a control unit and a line coupling unit. The control unit includes a plurality of first pins and second pins. The line coupling unit includes a first connection circuit and a second connection circuit. Each first pin corresponds to a first connection circuit, which connects the first pin to a first HDMI port of the device under test. Each second pin corresponds to a second connection circuit, which connects the second pin to the first HDMI port. The control unit is connected to the line coupling unit and is used to output a first voltage or a second voltage to the line coupling unit, and to detect the pin voltage of the second pin to determine whether the device under test has an open circuit or short circuit abnormality. The line coupling unit is connected to the control unit. The control unit and the first HDMI port are configured to: disconnect each first connection circuit and connect each second connection circuit when each first pin outputs a first voltage, so that the control unit determines that the device under test has an open circuit abnormality when it detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold; or, when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output a first voltage, connect the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin, so that the control unit determines that the device under test has a short circuit abnormality when it detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short circuit voltage, or that the pin voltage of the i-th second pin is less than the second short circuit voltage; wherein the first short circuit voltage is greater than the second short circuit voltage.

[0026] By disconnecting each first connection circuit and turning on each second connection circuit when each first pin outputs a first voltage, the control unit determines that the device under test has an open circuit abnormality when it detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold. Alternatively, when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output a first voltage, the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin are turned on, so that the control unit determines that the device under test has a short circuit abnormality when it detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short circuit voltage, or the pin voltage of the i-th second pin is less than the second short circuit voltage. This application can determine whether the device under test has an open circuit abnormality or a short circuit abnormality by using pin voltage. It can perform open circuit detection and short circuit detection on HDMI circuits of different products, improving the versatility and testing efficiency of the test system. Attached Figure Description

[0027] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0028] Figure 1 This is a schematic diagram illustrating the connection between a test instrument and a device under test when using an indirect testing method, as provided in an embodiment of this application.

[0029] Figure 2 This is a schematic diagram of the structure of an HDMI testing system provided in an embodiment of this application;

[0030] Figure 3 This is a detailed structural diagram of an HDMI testing system provided in an embodiment of this application;

[0031] Figure 4 This is a schematic diagram of the structure of a testing device provided in an embodiment of this application;

[0032] Figure 5 This is a flowchart illustrating an HDMI testing method provided in an embodiment of this application;

[0033] Figure 6 yes Figure 5 Detailed flowchart of step S501 in the process;

[0034] Figure 7 yes Figure 5 Detailed flowchart of step S502 in the process;

[0035] Figure 8 This is a complete flowchart illustrating an HDMI testing method provided in an embodiment of this application;

[0036] Figure 9 This is a schematic diagram of another testing device provided in an embodiment of this application.

[0037] Explanation of icon numbers:

[0038]

[0039] Detailed Implementation

[0040] To facilitate understanding of this application, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. It should be noted that when an element is described as "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as "connected to" another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this specification are for illustrative purposes only.

[0041] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of this application. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.

[0042] The technical solution of this application is described in detail below with reference to the accompanying drawings:

[0043] High Definition Multimedia Interface (HDMI) is a high-definition digital video and audio interface used to transmit video or audio signals. HDMI can be used in devices such as set-top boxes, DVD players, personal computers, televisions, game consoles, integrated amplifiers, digital audio systems, and televisions. HDMI can transmit audio and video signals simultaneously, and because audio and video signals use the same cable, it greatly simplifies the installation of system wiring.

[0044] When an HDMI circuit has an open circuit or short circuit, it will reduce the clarity of the transmitted video or audio signal, and in severe cases, it may even damage the device. Therefore, to ensure product quality, it is necessary to perform open circuit and short circuit tests on the product's HDMI circuit.

[0045] Existing solutions typically employ indirect testing methods to perform open-circuit or short-circuit tests on HDMI circuits.

[0046] Please see Figure 1 , Figure 1 This is a schematic diagram illustrating the connection between a test instrument and a device under test when using an indirect testing method, as provided in an embodiment of this application.

[0047] like Figure 1 As shown, the third HDMI port 201 of the testing instrument 200 is communicatively connected to the first HDMI port 101 of the device under test 100. The testing instrument 200 determines whether the circuit of the first HDMI port 101 has an open circuit or short circuit problem by detecting the quality of the video or audio signal output from the first HDMI port 101. Specifically, the testing instrument 200 is used to perform open circuit or short circuit tests on the circuit of the first HDMI port 101 of the device under test 100; the first HDMI port 101 is the HDMI port of the device under test 100, and the third HDMI port 201 is the HDMI port of the testing instrument 200.

[0048] For example, the device to be tested 100 is a TV board that can output HDMI signals. After the TV board is manufactured, the TV board is connected to the testing instrument 200. The testing instrument 200 determines whether there is an open circuit or short circuit problem in the HDMI circuit of the first HDMI port 101 by detecting the quality of the video or audio signal output by the first HDMI port 101 of the TV board.

[0049] However, the HDMI circuit structures of different products vary depending on the usage scenario. Therefore, to perform open-circuit or short-circuit tests on the HDMI circuits of different products, testers need to modify the testing instrument 200 according to the specific HDMI circuit configuration, manually select the appropriate test channel, and adjust the corresponding test parameters. The testing instrument 200 is limited by the usage scenario, resulting in poor universality for testing HDMI circuits of different products. Furthermore, it is cumbersome to operate, time-consuming, and inefficient, especially when a large number of repetitive tests are required.

[0050] To address the aforementioned deficiencies, this application proposes an HDMI testing system. By disconnecting each first connection circuit and connecting each second connection circuit when each first pin outputs a first voltage, the control unit determines that the device under test has an open-circuit fault when it detects that the voltage of any second pin is less than or equal to an open-circuit voltage threshold. Alternatively, when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output first voltages, the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin are connected. This allows the control unit to determine that the device under test has a short-circuit fault when it detects that the voltage of any second pin other than the i-th second pin is greater than a first short-circuit voltage, or that the voltage of the i-th second pin is less than a second short-circuit voltage. This application can determine whether the device under test has an open-circuit or short-circuit fault based on the pin voltage. It can perform open-circuit and short-circuit detection on HDMI circuits of different products, improving the versatility of the testing system, reducing testing time, and increasing testing efficiency.

[0051] Please see Figure 2 , Figure 2 This is a schematic diagram of the structure of an HDMI testing system provided in an embodiment of this application;

[0052] like Figure 2 As shown, the HDMI test system 300 includes a control unit 301 and a line coupling unit 302. The HDMI test system 300 is connected to the first HDMI port 101 of the device under test 100. The HDMI test system 300 is used to perform open circuit detection or short circuit detection on the device under test 100 to determine whether the device under test 100 has an open circuit or short circuit abnormality.

[0053] The device under test 100 is an HDMI device with a high-definition multimedia interface that requires short-circuit or open-circuit testing. In this embodiment, the device under test 100 includes, but is not limited to, HDMI devices such as TV boards, monitors, and projectors.

[0054] The open-circuit detection is used to detect whether the first HDMI port 101 of the device under test 100 has an open-circuit abnormality. An open-circuit abnormality refers to a break in the circuit that prevents current from flowing. The short-circuit detection is used to detect whether the first HDMI port 101 of the device under test 100 has a short-circuit abnormality. A short-circuit abnormality refers to an abnormal connection between two or more points in the circuit that should not be directly connected, causing the current to bypass the original circuit path.

[0055] The control unit 301, connected to the line coupling unit 302, is used to determine whether the device under test 100 has an open circuit or short circuit abnormality. The control unit 301 includes several first pins and second pins, the first pins being different from the second pins.

[0056] Specifically, the control unit 301 is used to: output a first voltage or a second voltage to the line coupling unit, and detect the pin voltage of the second pin to determine whether the device under test has an open circuit or short circuit abnormality. In this embodiment, the first voltage is a low-level voltage and the second voltage is a high-level voltage; for example, the first voltage is 0V and the second voltage is 3.3V.

[0057] The line coupling unit 302 connects the control unit 301 and the first HDMI port 101, and is used to turn on or off the circuit between the control unit 301 and the first HDMI port 101 according to the first voltage or the second voltage output by the control unit 301, so that the control unit 301 can determine whether the device under test has an open circuit or a short circuit.

[0058] The line coupling unit 302 includes a first connection circuit 321 and a second connection circuit 322. Each first pin corresponds to a first connection circuit 321, which is used to connect the first pin to the first HDMI port 101 of the device under test 100. Each second pin corresponds to a second connection circuit 322, which is used to connect the second pin to the first HDMI port 101.

[0059] In this embodiment, the line coupling unit 302 is specifically used to: disconnect each first connection circuit 321 and connect each second connection circuit 322 when each first pin outputs a first voltage, so that the control unit 301 determines that the device under test 100 has an open circuit abnormality when it detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold. The open circuit voltage threshold is a low-level voltage value; exemplarily, the open circuit voltage threshold is 1V.

[0060] Alternatively, the line coupling unit 302 is specifically used to: when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output a first voltage, conduct the first connection circuit 321 connected to the i-th first pin and the second connection circuit 322 connected to the i-th second pin, so that when the control unit 301 detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short-circuit voltage, or the pin voltage of the i-th second pin is less than the second short-circuit voltage, it determines that the device under test 100 has a short-circuit abnormality. Wherein, the first short-circuit voltage is a high-level voltage, the second short-circuit voltage is a low-level voltage, and the first short-circuit voltage is greater than the second short-circuit voltage. For example, the first short-circuit voltage is 1.8V and the second short-circuit voltage is 0.6V.

[0061] In this embodiment, by disconnecting each first connection circuit and connecting each second connection circuit when each first pin outputs a first voltage, the control unit determines that the device under test has an open circuit fault when it detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold. Alternatively, when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output a first voltage, the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin are connected, so that the control unit determines that the device under test has a short circuit fault when it detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short circuit voltage, or the pin voltage of the i-th second pin is less than the second short circuit voltage. This application can determine whether the device under test has an open circuit fault or a short circuit fault by using pin voltage, and can perform open circuit and short circuit detection on HDMI circuits of different products, improving the versatility and testing efficiency of the test system.

[0062] Please see Figure 3 , Figure 3 This is a detailed structural diagram of an HDMI testing system provided in an embodiment of this application;

[0063] In this embodiment, the first HDMI port 101 has multiple pins, for example, the first HDMI port 101 has 19 pins, including a zeroth channel pin, a zeroth channel data shield pin, a first channel pin, a first channel data shield pin, a second channel pin, a second channel data shield pin, a clock signal pin, a Consumer Electronics Control (CEC) pin, an Audio Return Channel (ARC) pin, a Serial Clock Line (SCL) pin, a Serial Data Line (SDA) pin, a ground pin, a power supply pin, and a Hot Plug Detect (HPD) pin.

[0064] The HDMI channel pin is used to transmit audio or video data of the zeroth channel; the zeroth channel data shielding pin is used to provide electromagnetic shielding for the data transmitted on the zeroth channel to reduce interference; the first channel pin is used to transmit audio or video data of the first channel; the first channel data shielding pin is used to provide electromagnetic shielding for the data transmitted on the first channel to reduce interference; the second channel pin is used to transmit audio or video data of the second channel; the second channel data shielding pin is used to provide electromagnetic shielding for the data transmitted on the second channel to reduce interference; the clock signal pin is used to transmit a clock signal to synchronize audio or video data; and the consumer electronics control pin is used to allow HDMI devices to be controlled via an HDMI cable to achieve communication between devices.

[0065] The audio return channel pin allows audio signals to be transmitted from the ARC port to the audio receiver of the device under test 100; the clock line pin connects to the clock signal line in the communication protocol to enable communication between devices; the data line pin connects to the data signal line in the communication protocol to enable communication between devices; the ground pin provides a common ground point for the Display Data Channel (DDC) and CEC signals, ensuring that the DDC and CEC signals are transmitted correctly between the sending and receiving devices while reducing electromagnetic interference; the power pin connects to an external power supply to provide power to the HDMI device; and the hot-plug detection pin detects whether the HDMI device is connected.

[0066] Among them, the zeroth channel pin includes the positive pin (D0+) and negative pin (D0-) of the zeroth channel, the first channel pin includes the positive pin (D1+) and negative pin (D1-) of the first channel, the second channel pin includes the positive pin (D2+) and negative pin (D2-) of the second channel, and the clock signal pin includes the positive pin (CLK+) and negative pin (CLK-) of the clock signal channel.

[0067] When performing a short circuit test, the first HDMI port 101 needs to test 14 pins, including: the positive and negative pins of the zero channel pins, the positive and negative pins of the first channel pins, the positive and negative pins of the second channel pins, the positive and negative pins of the clock signal pins, the consumer electronics control pins, the audio return channel pins, the clock line pins, the data line pins, the power pins, and the hot-plug detection pins.

[0068] When performing an open circuit test, the first HDMI port 101 needs to test 8 pins, including: the positive and negative pins of the zero channel pins, the positive and negative pins of the first channel pins, the positive and negative pins of the second channel pins, and the positive and negative pins of the clock signal pins.

[0069] Since the HDMI signal includes four pairs of Transition Minimized Differential Signaling (TMDS) signals, the zero channel pin, the first channel pin, the second channel pin, and the clock signal pin of the first HDMI port 101 are each used to transmit a pair of TMDS signals. The HDMI test system 300 processes each pair of TMDS signals in the same way.

[0070] Figure 3 Taking a pair of TMDS signals as an example, the connection relationship between each module in the HDMI test system 300 and the pins (i.e., the zero channel pin, the first channel pin, the second channel pin, or the clock signal pin) in the first HDMI port 101 for transmitting a pair of TMDS signals is shown.

[0071] like Figure 3 As shown, the HDMI test system 300 includes a control unit 301, a line coupling unit 302, a second HDMI port 303, a first discharge resistor R1, and a second discharge resistor R2. The control unit 301 includes a voltage acquisition unit 3011 and a voltage output unit 3012, and the line coupling unit 302 includes a first diode D1, a second diode D2, a third diode D3, and a fourth diode D4.

[0072] The line coupling unit 302 is connected to the first HDMI port 101 through the second HDMI port 303, and the second HDMI port 303 is the HDMI port in the HDMI test system 300.

[0073] In some embodiments, the first HDMI port is an HDMI female connector and the second HDMI port is an HDMI male connector. By using the first HDMI port as an HDMI female connector and the second HDMI port as an HDMI male connector, this application can automatically complete short circuit and open circuit detection after the HDMI test system is inserted into the HDMI female connector of the device under test, without the need to set parameters, simplifying operation and improving testing efficiency.

[0074] The voltage output unit 3012 includes several voltage output pins (GPIO pins), and the voltage acquisition unit 3011 includes several voltage acquisition pins (ADC pins). Both the voltage output pins and voltage acquisition pins include a zero-channel pin, a first-channel pin, a second-channel pin, a clock signal pin, a consumer electronics control pin, an audio feedback channel pin, a clock line pin, a data line pin, a power supply pin, or a hot-plug detection pin. Each of the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin in both the voltage output pins and voltage acquisition pins includes one positive pin and one negative pin.

[0075] In this embodiment, the HDMI testing system 300 uses 14 voltage output pins and 14 voltage acquisition pins corresponding to the 14 pins of the first HDMI port 101. Specifically, the zeroth channel pin of the first HDMI port 101 corresponds to the zeroth channel pin in the voltage output pins and the zeroth channel pin in the voltage acquisition pins; the first channel pin of the first HDMI port 101 corresponds to the first channel pin in the voltage output pins and the first channel pin in the voltage acquisition pins; the second channel pin of the first HDMI port 101 corresponds to the second channel pin in the voltage output pins and the second channel pin in the voltage acquisition pins; the clock signal pin of the first HDMI port 101 corresponds to the clock signal pin in the voltage output pins and the clock signal pin in the voltage acquisition pins; and the consumer electronics control pin of the first HDMI port 101 corresponds to the consumer electronics control pin in the voltage output pins and the consumer electronics control pin in the voltage acquisition pins.

[0076] The audio return channel pin of the first HDMI port 101 corresponds to the audio return channel pin in the voltage output pin and the audio return channel pin in the voltage acquisition pin; the clock line pin of the first HDMI port 101 corresponds to the clock line pin in the voltage output pin and the clock line pin in the voltage acquisition pin; the data line pin of the first HDMI port 101 corresponds to the data line pin in the voltage output pin and the data line pin in the voltage acquisition pin; the power channel pin of the first HDMI port 101 corresponds to the power pin in the voltage output pin and the power pin in the voltage acquisition pin; the hot-plug detection pin of the first HDMI port 101 corresponds to the hot-plug detection pin in the voltage output pin and the hot-plug detection pin in the voltage acquisition pin.

[0077] Specifically, each positive pin among the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin of the first HDMI port 101 corresponds sequentially to each positive pin among the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin of the voltage output pins, and sequentially to each positive pin among the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin of the voltage acquisition pins. Similarly, each negative pin among the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin of the first HDMI port 101 corresponds sequentially to each negative pin among the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin of the voltage output pins, and sequentially to each negative pin among the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin of the voltage acquisition pins.

[0078] The control unit 301, connected to the line coupling unit 302, is used to determine whether the device under test 100 has an open circuit or short circuit abnormality. The control unit 301 includes several first pins and second pins. The first pins are any positive or negative pin among the zero-channel pin, first-channel pin, second-channel pin, or clock signal pin of the voltage output unit 3012. The second pins are any positive or negative pin among the zero-channel pin, first-channel pin, second-channel pin, or clock signal pin of the voltage acquisition unit 3011. Each of the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin includes one positive pin and one negative pin.

[0079] In this embodiment, the control unit 301 includes, but is not limited to, a microcontroller that uses Analog-to-Digital Converter Direct Memory Access (ADCDMA) technology for continuous sampling.

[0080] In this embodiment, the control unit 301 is specifically configured to: output a first voltage or a second voltage to the line coupling unit, and detect the pin voltage of the second pin to determine whether the device under test has an open circuit or short circuit fault. For example, the first voltage is 0V and the second voltage is 3.3V.

[0081] The voltage acquisition unit 3011 is connected to the line coupling unit 302 and is used to detect the pin voltage of each second pin.

[0082] The voltage output unit 3012 is connected to the line coupling unit 302 and is used to output a first voltage or a second voltage to the line coupling unit 302.

[0083] The line coupling unit 302 connects the control unit 301 and the second HDMI port 303, and is used to turn on or off the circuit between the control unit 301 and the second HDMI port 303 according to the first voltage or the second voltage output by the control unit 301, so that the control unit 301 can determine whether the device under test has an open circuit or a short circuit.

[0084] The line coupling unit 302 includes a first connection circuit 321 and a second connection circuit 322. Each first pin corresponds to a first connection circuit 321, and the first connection circuit 321 is specifically used to connect the first pin to the second HDMI port 303. Each second pin corresponds to a second connection circuit 322, and the second connection circuit 322 is specifically used to connect the second pin to the second HDMI port 303.

[0085] The line coupling unit 302 includes a first diode D1, a second diode D2, a third diode D3, and a fourth diode D4, each of which has the characteristics of forward conduction and reverse cutoff.

[0086] The positive pin of voltage output unit 3012 is connected to the anode of first diode D1, the cathode of first diode D1 is connected to the positive pin of second HDMI port 303, the negative pin of voltage output unit 3012 is connected to the anode of second diode D2, and the cathode of second diode D2 is connected to the negative pin of second HDMI port 303. The first connection circuit includes: a circuit between the positive pin of voltage output unit 3012 and the positive pin of second HDMI port 303, or a circuit between the negative pin of voltage output unit 3012 and the negative pin of second HDMI port 303. The circuit between the positive pin of voltage output unit 3012 and the positive pin of second HDMI port 303 includes the first diode D1, and the circuit between the negative pin of voltage output unit 3012 and the negative pin of second HDMI port 303 includes the second diode D2.

[0087] Understandably, the positive and negative pins of the voltage output unit 3012 are used to transmit a pair of TMDS signals. For any positive pin of the zero channel pin, the first channel pin, the second channel pin, and the clock signal pin of the voltage output unit 3012, the positive pin is connected to the anode of a first diode D1 via a differential signal line. The cathode of the first diode D1 is connected to the corresponding positive pin of the zero channel pin, the first channel pin, the second channel pin, and the clock signal pin of the second HDMI port 303. Each pin of the second HDMI port 303 is connected to a pin with the same name as the pin of the first HDMI port 101.

[0088] For example, the positive pin of the zero channel pin of the voltage output unit 3012 is connected to the anode of a first diode D1, the cathode of the first diode D1 is connected to the positive pin of the zero channel pin of the second HDMI port 303, and the positive pin of the zero channel pin of the second HDMI port 303 is connected to the positive pin of the zero channel pin of the first HDMI port 101 through a differential signal line.

[0089] For any negative pin among the zero channel pin, first channel pin, second channel pin, and clock signal pin of the voltage output unit 3012, the negative pin is connected to the anode of a second diode D2 through a differential signal line. The cathode of the second diode D2 is connected to the corresponding negative pin among the zero channel pin, first channel pin, second channel pin, and clock signal pin of the second HDMI port 303.

[0090] In this embodiment, the line coupling unit includes a first diode and a second diode. The positive and negative pins of the voltage output unit are respectively connected to the anodes of the first diode and the second diode, and the cathodes of the first diode and the second diode are respectively connected to the positive and negative pins of the second HDMI port. The first connection circuit includes a circuit between the positive pin of the voltage output unit and the positive pin of the second HDMI port, or a circuit between the negative pin of the voltage output unit and the negative pin of the second HDMI port. This application can realize the conduction or disconnection of the first connection circuit by controlling the low-cost diode to conduct or turn off, thereby completing short circuit detection or open circuit detection and reducing testing costs.

[0091] The positive pin of voltage acquisition unit 3011 is connected to the cathode of third diode D3, the anode of third diode D3 is connected to the positive pin of second HDMI port 303, the negative pin of voltage acquisition unit 3011 is connected to the cathode of fourth diode D4, and the anode of fourth diode D4 is connected to the negative pin of second HDMI port 303. The second connection circuit includes: a circuit between the positive pin of voltage acquisition unit 3011 and the positive pin of second HDMI port 303, or a circuit between the negative pin of voltage acquisition unit 3011 and the negative pin of second HDMI port 303. The circuit between the positive pin of voltage acquisition unit 3011 and the positive pin of second HDMI port 303 includes third diode D3, and the circuit between the negative pin of voltage acquisition unit 3011 and the negative pin of second HDMI port 303 includes fourth diode D4.

[0092] It is understood that for any positive pin among the zero channel pin, first channel pin, second channel pin, and clock signal pin of the voltage acquisition unit 3011, the positive pin is connected to the cathode of a third diode D3 through a differential signal line, and the anode of the third diode D3 is connected to the corresponding positive pin among the zero channel pin, first channel pin, second channel pin, and clock signal pin of the second HDMI port 303.

[0093] For any negative pin among the zero channel pin, first channel pin, second channel pin, and clock signal pin of the voltage acquisition unit 3011, the negative pin is connected to the cathode of a fourth diode D4 through a differential signal line. The anode of the fourth diode D4 is connected to the corresponding negative pin among the zero channel pin, first channel pin, second channel pin, and clock signal pin of the second HDMI port 303.

[0094] In this embodiment, the line coupling unit further includes a third diode and a fourth diode. The positive and negative pins of the voltage acquisition unit are connected to the cathodes of the third and fourth diodes, respectively. The anodes of the third and fourth diodes are connected to the positive and negative pins of the second HDMI port, respectively. The second connection circuit includes either a circuit between the positive pin of the voltage acquisition unit and the positive pin of the second HDMI port, or a circuit between the negative pin of the voltage acquisition unit and the negative pin of the second HDMI port. This application can achieve the switching on or off of the second connection circuit by controlling the low-cost diode to complete short-circuit detection or open-circuit detection, thereby reducing testing costs.

[0095] In this embodiment, compared to existing solutions that easily damage the test instrument 200 and increase test costs when the HDMI circuit of the device under test has defects (such as short circuit), this application reduces test costs by using a diode to control the conduction and cutoff of the circuit through the line coupling unit.

[0096] In this embodiment, the positive pin of the voltage acquisition unit 3011 is also connected to the first discharge resistor R1, and the negative pin of the voltage acquisition unit 3011 is also connected to the second discharge resistor R2. The first end of the first discharge resistor R1 is also connected to the cathode of the third diode, and the second end of the first discharge resistor R1 is grounded; the first end of the second discharge resistor R2 is also connected to the cathode of the fourth diode, and the second end of the second discharge resistor R2 is grounded.

[0097] Both the first discharge resistor R1 and the second discharge resistor R2 are used to pull down any floating lines that are not pulled up by the voltage output unit 3012 during open-circuit or short-circuit detection, ensuring that they remain stable at a low level. The resistance values ​​of the first discharge resistor R1 and the second discharge resistor R2 can be set by those skilled in the art according to actual conditions, and are not limited here. For example, both the first discharge resistor R1 and the second discharge resistor R2 are 10 kΩ.

[0098] In this embodiment, the voltage output unit further includes a third pin, which may include a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot-plug detection pin.

[0099] When the HDMI test system 300 performs an open-circuit test on the device under test 100:

[0100] The power supply pin of the control unit 301 is connected to the power supply pin 101 of the first HDMI port. Specifically, the power supply pin of the control unit 301 is connected to the power supply pin of the second HDMI port 303, and the power supply pin of the second HDMI port 303 is connected to the power supply pin of the first HDMI port 101. The control unit 301 is also used to provide a third voltage to the device under test 100 to power on the device under test 100. The third voltage is greater than the first voltage and greater than the second voltage. For example, the third voltage is 5V.

[0101] The voltage output unit 3012 is used to control the output of a first voltage for each first pin and a third pin. The line coupling unit 302 is specifically used to: disconnect each first connection circuit 321 and connect each second connection circuit 322 when each first pin outputs a first voltage, so that when the control unit 301 detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold, it determines that the device under test 100 has an open circuit abnormality.

[0102] The voltage acquisition unit 3011 is used to detect the pin voltage of each second pin. The control unit 301 is also used to determine that the circuit of the device under test 100 is normal when the pin voltage of each second pin is greater than the open circuit voltage threshold.

[0103] The open-circuit voltage threshold can be set by those skilled in the art based on the magnitude of the first voltage and the second voltage, and there are no restrictions here. For example, the open-circuit voltage threshold is 1V.

[0104] The first HDMI port 101 includes a first terminating resistor and a second terminating resistor, which are used to control the voltage of the first HDMI port 101 to a second voltage. The first end of the first terminating resistor is connected to the positive pin of the first HDMI port 101, and the first end of the second terminating resistor is connected to the negative pin of the first HDMI port 101. The second end of the first terminating resistor is connected to the second end of the second terminating resistor, and both the second ends of the first and second terminating resistors are connected to the second voltage. The second voltage is greater than the first voltage. For example, the second voltage is 3.3V, and the resistance values ​​of both the first and second terminating resistors are 50 ohms.

[0105] Understandably, during open-circuit testing, since each first diode D1 and each second diode D2 connected to the voltage output unit 3012 is cut off, each first connection circuit is disconnected. Because the first and second terminating resistors raise the potential of the first HDMI port 101 to 3.3V, each second connection circuit between the first HDMI port 101 and the voltage acquisition unit 3011 is connected. Therefore, when the pin voltage of any second pin of the voltage acquisition unit 3011 is greater than the open-circuit voltage threshold, the circuit connection corresponding to that second pin is normal; when the pin voltage of any second pin is less than or equal to the open-circuit voltage threshold, the circuit corresponding to that second pin has an open-circuit abnormality; when the pin voltage of each second pin is greater than the open-circuit voltage threshold, the circuit of the device under test 100 is determined to be normal.

[0106] In this embodiment, during open circuit detection, the power supply pin of the control unit is connected to the power supply pin of the first HDMI port, the voltage output unit is used to control each first pin and third pin to output a first voltage, the voltage acquisition unit is used to detect the pin voltage of each second pin, and the control unit is also used to determine that the circuit of the device under test is normal when the pin voltage of each second pin is greater than the open circuit voltage threshold. This application can improve the speed of the HDMI test system in performing open circuit detection on the device under test and shorten the test time.

[0107] In this embodiment, the voltage acquisition unit 3011 further includes a fourth pin, which may include a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot-plug detection pin.

[0108] When the HDMI test system 300 performs a short circuit test on the device under test 100:

[0109] Control unit 301 stops supplying the third voltage to device under test 100. Voltage output unit 3012 is used to: sequentially execute the first step for each voltage output pin of voltage output unit 3012. The first step includes: controlling the i-th voltage output pin to output the second voltage and the remaining voltage output pins to output the first voltage, wherein the i-th voltage output pin is the voltage output pin currently executing the first step.

[0110] The line coupling unit 302 is specifically used to: when the voltage output unit 3012 outputs a second voltage at the i-th first pin and the remaining first pins and each third pin output a first voltage, conduct the first connection circuit 321 connected to the i-th first pin and the second connection circuit 322 connected to the i-th second pin, so that when the control unit 301 detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short-circuit voltage, or the pin voltage of the i-th second pin is less than the second short-circuit voltage, determine that the device under test 100 has a short-circuit abnormality.

[0111] The voltage acquisition unit 3011 is used to detect the pin voltage of each voltage acquisition pin, wherein the voltage acquisition pin includes a second pin or a fourth pin, and the i-th voltage acquisition pin and the i-th voltage output pin are connected to the same pin of the second HDMI port.

[0112] The control unit 301 is also configured to: determine that the device under test 100 has a short circuit abnormality when the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short circuit voltage, or when the pin voltage of the i-th voltage acquisition pin is less than the second short circuit voltage; and determine that the circuit of the device under test 100 is normal when the pin voltage detected by the voltage acquisition unit 3011 meets the first condition after each execution of the first step.

[0113] The first condition includes: the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage, and the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage.

[0114] The first short-circuit voltage and the second short-circuit voltage can be set by those skilled in the art according to the magnitude of the first voltage and the second voltage, and there is no limitation here. The first short-circuit voltage is greater than the second short-circuit voltage. For example, the first short-circuit voltage is 1.8V and the second short-circuit voltage is 0.6V.

[0115] Specifically, the voltage output unit 3012 controls one voltage output pin to output a second voltage at a time, while the remaining voltage output pins output the first voltage. When the circuit connection is normal, when the i-th voltage output pin outputs the second voltage and the remaining voltage output pins output the first voltage, the circuit between the i-th voltage output pin and the second HDMI port 303 is connected, and the circuit between the second HDMI port 303 and the i-th voltage acquisition pin is connected. The circuits between the remaining voltage output pins and the second HDMI port 303 are disconnected, and the circuits between the second HDMI port 303 and the remaining voltage acquisition pins are disconnected. The i-th voltage output pin and the i-th voltage acquisition pin are both connected to the i-th pin of the second HDMI port 303, and the i-th pin of the second HDMI port 303 is connected to the i-th pin of the first HDMI port 101.

[0116] Understandably, when the circuit connection is normal, when the i-th voltage output pin is the positive pin among the first pins, the first diode D1 in the first connection circuit connected to the i-th voltage output pin is turned on, and the first diode D1 and the second diode D2 in the remaining first connection circuits are turned off. The third diode D3 in the second connection circuit connected to the i-th voltage acquisition pin is turned on, and the remaining second connection circuits are turned off. At this time, only the circuit between the i-th voltage output pin and the i-th voltage acquisition pin is turned on.

[0117] When the circuit connection is normal, when the i-th voltage output pin is the negative pin among the first pins, the second diode D2 in the first connection circuit connected to the i-th voltage output pin is turned on, and the first diode D1 and the second diode D2 in the remaining first connection circuits are turned off. The fourth diode D4 in the second connection circuit connected to the i-th voltage acquisition pin is turned on, and the remaining second connection circuits are turned off. At this time, only the circuit between the i-th voltage output pin and the i-th voltage acquisition pin is turned on.

[0118] When the line connection is normal, when the i-th voltage output pin is the third pin, the i-th voltage output pin is directly connected to the i-th pin of the second HDMI port 303, and the i-th pin of the second HDMI port 303 is directly connected to the i-th voltage acquisition pin. At this time, only the circuit between the i-th voltage output pin and the i-th voltage acquisition pin is connected.

[0119] Therefore, when the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage, the control unit 301 determines that the circuit connection corresponding to the i-th voltage acquisition pin is normal; when the pin voltage of the i-th voltage acquisition pin is less than the second short-circuit voltage, the control unit 301 determines that the i-th pin of the first HDMI port 101 is short-circuited to ground; when the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage, the control unit 301 determines that the circuit connection corresponding to the other voltage acquisition pins other than the i-th voltage acquisition pin is normal; when the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, the control unit 301 determines that the circuit corresponding to that voltage acquisition pin is short-circuited to the i-th pin of the first HDMI port 101.

[0120] In this embodiment, during short-circuit detection, the voltage output unit sequentially performs a first step on each voltage output pin of the voltage output unit, the voltage acquisition unit detects the pin voltage of each voltage acquisition pin, and the control unit determines that the device under test has a short-circuit abnormality when the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, or when the pin voltage of the i-th voltage acquisition pin is less than the second short-circuit voltage; or when the pin voltage detected by the voltage acquisition unit meets the first condition after each execution of the first step, the device under test's circuit is normal. This application can improve the speed of short-circuit detection of the device under test by the HDMI test system and shorten the test time.

[0121] This application provides an HDMI testing system, which includes a control unit and a line coupling unit. The control unit includes a plurality of first pins and second pins. The line coupling unit includes a first connection circuit and a second connection circuit. Each first pin corresponds to a first connection circuit, which connects the first pin to a first HDMI port of the device under test. Each second pin corresponds to a second connection circuit, which connects the second pin to the first HDMI port. The control unit, connected to the line coupling unit, is used to output a first voltage or a second voltage to the line coupling unit and to detect the pin voltage of the second pins to determine whether the device under test has an open circuit or short circuit. The line coupling unit is connected to the control unit and the first HDMI port. The port is used to: disconnect each first connection circuit and connect each second connection circuit when each first pin outputs a first voltage, so that the control unit determines that the device under test has an open circuit abnormality when it detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold; or, when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output a first voltage, connect the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin, so that the control unit determines that the device under test has a short circuit abnormality when it detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short circuit voltage, or that the pin voltage of the i-th second pin is less than the second short circuit voltage; wherein the first short circuit voltage is greater than the second short circuit voltage.

[0122] By disconnecting each first connection circuit and turning on each second connection circuit when each first pin outputs a first voltage, the control unit determines that the device under test has an open circuit abnormality when it detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold. Alternatively, when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output a first voltage, the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin are turned on, so that the control unit determines that the device under test has a short circuit abnormality when it detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short circuit voltage, or the pin voltage of the i-th second pin is less than the second short circuit voltage. This application can determine whether the device under test has an open circuit abnormality or a short circuit abnormality by using pin voltage. It can perform open circuit detection and short circuit detection on HDMI circuits of different products, improving the versatility and testing efficiency of the test system.

[0123] Please see Figure 4 , Figure 4 This is a schematic diagram of the structure of a testing device provided in an embodiment of this application;

[0124] like Figure 4 As shown, the test equipment 400 includes the HDMI test system 300 in any of the above embodiments.

[0125] In this application embodiment, the test equipment 400 includes the HDMI test system 300 in any of the above embodiments. This application can realize open circuit detection and short circuit detection for HDMI circuits of different products, thereby improving the versatility and test efficiency of the test system.

[0126] Please see Figure 5 , Figure 5 This is a flowchart illustrating an HDMI testing method provided in an embodiment of this application;

[0127] The HDMI testing method is applied to the HDMI testing system 300 in any of the above embodiments.

[0128] like Figure 5 As shown, the HDMI testing method includes:

[0129] Step S501: After the first HDMI port is inserted into the system, a short circuit test is performed on the device under test to determine whether the circuit of the device under test is normal.

[0130] Specifically, after the HDMI test system 300 is inserted into the first HDMI port 101 of the device under test 100, the HDMI test system 300 performs a short circuit detection on the device under test 100 to obtain the short circuit detection result. The short circuit detection result includes short circuit abnormality or normal line.

[0131] In some embodiments, the HDMI test system 300 includes a second HDMI port, the first HDMI port is an HDMI female connector, the second HDMI port is an HDMI male connector, and the first HDMI port is inserted into the HDMI test system by inserting into the second HDMI port.

[0132] In this embodiment, the control unit includes a voltage acquisition unit and a voltage output unit. The voltage output unit includes a plurality of voltage output pins, and the voltage acquisition unit includes a plurality of voltage acquisition pins. The voltage output pins include a first pin or a third pin, and the voltage acquisition pins include a second pin or a fourth pin. The first pin is any positive or negative pin among the zero-channel pin, the first channel pin, the second channel pin, or the clock signal pin of the voltage output unit. The third pin includes a consumer electronics control pin, an audio feedback channel pin, a clock line pin, a data line pin, or a hot-plug detection pin.

[0133] The second pin is any positive or negative pin among the zero-channel pin, first-channel pin, second-channel pin, or clock signal pin of the voltage acquisition unit. The fourth pin includes a consumer electronics control pin, an audio feedback channel pin, a clock line pin, a data line pin, or a hot-plug detection pin. Each of the zero-channel pin, first-channel pin, second-channel pin, and clock signal pin includes one positive pin and one negative pin.

[0134] In this embodiment, the voltage output unit includes several voltage output pins, and the voltage acquisition unit includes several voltage acquisition pins. The voltage output pins include a first pin or a third pin, and the voltage acquisition pins include a second pin or a fourth pin. This facilitates subsequent open-circuit testing by controlling each voltage output pin to output a first voltage and judging the magnitude of the pin voltage of each second pin to determine whether the device under test has an open-circuit abnormality. It also facilitates subsequent short-circuit testing by controlling one voltage output pin to output a second voltage and the remaining voltage output pins to output a first voltage, judging the magnitude of the pin voltage of each voltage acquisition pin to determine whether the device under test has a short-circuit abnormality.

[0135] In this embodiment of the application, the steps for short-circuit detection of the device under test include steps S1-S3:

[0136] Step S1: Perform a cyclic acquisition step for each voltage output pin in sequence;

[0137] The cyclic acquisition step includes: controlling the i-th voltage output pin to output a second voltage and the remaining voltage output pins to output a first voltage; sequentially acquiring the pin voltage of each voltage acquisition pin; when the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage, and the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage, controlling the i-th voltage output pin to output the first voltage.

[0138] Wherein, the i-th voltage output pin is the voltage output pin currently executing the cyclic acquisition step, i is greater than or equal to 1, and i is less than or equal to the number of voltage output pins. For example, the number of voltage output pins is 14.

[0139] Step S2: In any cyclic acquisition step, if the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, or if the pin voltage of the i-th voltage acquisition pin is less than the second short-circuit voltage, it is determined that the device under test has a short-circuit abnormality.

[0140] Specifically, in any loop acquisition step, if the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, it is determined that the circuit corresponding to the voltage acquisition pin with the pin voltage greater than the first short-circuit voltage is short-circuited with the i-th pin of the first HDMI port, and the loop acquisition step is stopped. For example, the first short-circuit voltage is 1.8V.

[0141] Alternatively, in any loop acquisition step, if the pin voltage of the i-th voltage acquisition pin is less than the second short-circuit voltage, it is determined that the i-th pin of the first HDMI port is short-circuited to ground, and the loop acquisition step is stopped. For example, the second short-circuit voltage is 0.6V.

[0142] Step S3: In any loop acquisition step, if the detected pin voltage meets the first condition, the loop acquisition step is executed for the next voltage output pin until the loop acquisition step is completed for each voltage output pin, and the pin voltage detected in each loop acquisition step meets the first condition, then the circuit of the device under test is determined to be normal.

[0143] The first condition includes: the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage, and the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage.

[0144] In this embodiment, by sequentially performing a cyclic acquisition step on each voltage output pin, if the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, or the pin voltage of the i-th voltage acquisition pin is less than the second short-circuit voltage, it is determined that the device under test has a short-circuit abnormality. When the cyclic acquisition step is completed for each voltage output pin, and the pin voltage detected in each cyclic acquisition step meets the first condition, it is determined that the circuit of the device under test is normal. This application can improve the speed of short-circuit detection of the device under test by the HDMI test system and shorten the test time.

[0145] Please see Figure 6 , Figure 6 yes Figure 5 Detailed flowchart of step S501 in the process;

[0146] like Figure 6 As shown, step S501 includes:

[0147] Step S511: Initialize parameters;

[0148] Specifically, the parameters include pin execution number i, number of short-circuit test pins N, first short-circuit voltage, and second short-circuit voltage. The pin execution number is the pin number of the voltage output pin that currently outputs the first voltage. The number of short-circuit test pins is the number of pins of the first HDMI port that need to be short-circuited. The number of pins of the first HDMI port that need to be short-circuited is the same as the number of voltage acquisition pins and the number of voltage output pins.

[0149] For example, the HDMI test system uses 14 voltage output pins and 14 voltage acquisition pins to perform short circuit detection on the 14 pins of the first HDMI port. The initial pin execution number i is 0, the number of short circuit test pins N is 14, the first short circuit voltage is 1.8V, and the second short circuit voltage is 0.6V.

[0150] Step S512: Update the pin execution number;

[0151] Specifically, the pin execution number is incremented by one to obtain the updated pin execution number, thereby enabling short-circuit detection for the next voltage output pin.

[0152] Step S513: The control pin executes the voltage output pin corresponding to the number to output the second voltage;

[0153] Specifically, the voltage output unit control pins control the output of the second voltage corresponding to the specified voltage output pin number, and control the remaining voltage output pins to output the first voltage. For example, it controls the i-th voltage output pin to output 3.3V, and controls the remaining voltage output pins to output 0V.

[0154] Step S514: Detect the pin voltage of each voltage acquisition pin;

[0155] Specifically, the voltage acquisition unit detects the pin voltage of 14 voltage acquisition pins.

[0156] Step S515: Initialize the index number;

[0157] Specifically, let index number m be 1, and index number be the pin number of the voltage acquisition pin.

[0158] Step S516: Determine if the index number is equal to the pin execution number;

[0159] Specifically, if the index number is equal to the pin execution number, proceed to step S517; if the index number is greater than or less than the pin execution number, proceed to step S518.

[0160] Step S517: Determine whether the pin voltage of the voltage acquisition pin corresponding to the index number is greater than the second short-circuit voltage;

[0161] Specifically, if the index number is equal to the pin execution number, then it is determined whether the pin voltage of the voltage acquisition pin corresponding to the index number is greater than the second short-circuit voltage.

[0162] If the pin voltage of the voltage acquisition pin corresponding to the index number is greater than the second short-circuit voltage, proceed to step S519; if the pin voltage of the voltage acquisition pin corresponding to the index number is less than or equal to the second short-circuit voltage, proceed to step S524.

[0163] Step S518: Determine whether the pin voltage of the voltage acquisition pin corresponding to the index number is less than the first short-circuit voltage;

[0164] Specifically, if the index number is greater than or less than the pin execution number, then it is determined whether the pin voltage of the voltage acquisition pin corresponding to the index number is less than the first short-circuit voltage.

[0165] If the pin voltage of the voltage acquisition pin corresponding to the index number is less than the first short-circuit voltage, proceed to step S519; if the pin voltage of the voltage acquisition pin corresponding to the index number is greater than or equal to the first short-circuit voltage, proceed to step S524.

[0166] Step S519: Update the index number;

[0167] Specifically, when the index number is equal to the pin execution number, and the pin voltage of the voltage acquisition pin corresponding to the index number is greater than the second short-circuit voltage, the index number is incremented by one to obtain the updated index number, thereby obtaining the pin voltage of the next voltage acquisition pin.

[0168] Alternatively, if the index number is not equal to the pin execution number, and the pin voltage of the voltage acquisition pin corresponding to the index number is less than the first short-circuit voltage, the index number is incremented by one to obtain the updated index number, thereby obtaining the pin voltage of the next voltage acquisition pin.

[0169] Step S520: Determine whether the index number is less than or equal to the number of short-circuit test pins;

[0170] Specifically, if the index number is less than or equal to the number of short-circuit test pins, proceed to step S521; if the index number is greater than the number of short-circuit test pins, return to step S516 to determine the relationship between the index number updated in step S519 and the pin execution number.

[0171] Step S521: The control pin executes the voltage output pin corresponding to the number to output the first voltage;

[0172] Step S522: Determine whether the pin execution number is less than or equal to the number of short-circuit test pins;

[0173] Specifically, if the pin execution number is less than or equal to the number of short-circuit test pins, return to step S512; if the pin execution number is greater than the number of short-circuit test pins, proceed to step S523.

[0174] Step S523: Confirm that the circuitry of the device under test is normal;

[0175] Specifically, for each voltage output pin, when the second voltage is output by the i-th voltage output pin, the pin voltage of the voltage acquisition pin must satisfy the following: the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage, and the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage. In this case, the short-circuit detection result is determined to be that the line is normal.

[0176] Step S524: The control pin executes the voltage output pin corresponding to the number to output the first voltage;

[0177] Specifically, when the index number is equal to the pin execution number, and the pin voltage of the voltage acquisition pin corresponding to the index number is less than or equal to the second short-circuit voltage, the voltage output pin corresponding to the control pin execution number outputs the first voltage.

[0178] Alternatively, when the index number is not equal to the pin execution number, and the pin voltage of the voltage acquisition pin corresponding to the index number is greater than or equal to the first short-circuit voltage, the voltage output pin corresponding to the control pin execution number outputs the first voltage.

[0179] Step S525: Determine that the device under test has a short circuit anomaly.

[0180] Specifically, a short circuit fault includes any pin of the first HDMI port 101 being shorted to ground, or the circuit corresponding to any voltage acquisition pin being shorted to a pin of the first HDMI port 101. When the i-th voltage output pin outputs the second voltage, if the pin voltage of the i-th voltage acquisition pin is less than the second short circuit voltage, it is determined that the i-th pin of the first HDMI port 101 is shorted to ground.

[0181] Alternatively, when the i-th voltage output pin outputs the second voltage, if the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, the circuit corresponding to the voltage acquisition pin whose pin voltage is greater than the first short-circuit voltage is determined to be short-circuited to the i-th pin of the first HDMI port 101.

[0182] Step S502: If the short circuit test result indicates that the line is normal, perform an open circuit test on the device under test to determine whether the device under test has an open circuit abnormality.

[0183] Specifically, when the short-circuit test result indicates that the line is normal, the HDMI test system 300 performs an open-circuit test on the device under test 100 to obtain the open-circuit test result. The open-circuit test result includes either an open-circuit abnormality or a normal line.

[0184] Understandably, when the short-circuit test result indicates a short-circuit anomaly, it is already determined that the line of the device under test 100 is faulty, and there is no need to perform an open-circuit test. When the open-circuit test result indicates that the line is normal, the HDMI test system 300 determines that the line connectivity of the device under test 100 is fault-free.

[0185] In this embodiment of the application, the step of performing open-circuit testing on the device under test includes steps S4-S7:

[0186] Step S4: Control each voltage output pin to output the first voltage;

[0187] Specifically, the voltage output unit controls each voltage output pin to output 0V voltage.

[0188] Step S5: Detect the pin voltage of each second pin;

[0189] Specifically, the voltage acquisition unit detects the pin voltage of each second pin.

[0190] Step S6: If the pin voltage of any second pin is less than or equal to the open-circuit voltage threshold, it is determined that the device under test has an open-circuit fault.

[0191] Specifically, when the pin voltage of any second pin is less than or equal to the open-circuit voltage threshold, it is determined that the pin corresponding to that second pin in the first HDMI port 101 is open-circuited.

[0192] Step S7: When the pin voltage of each second pin is greater than the open circuit voltage threshold, the circuit of the device under test is determined to be normal.

[0193] Specifically, if the voltage of each second pin is greater than the open-circuit voltage threshold, the open-circuit detection result is determined to be that the circuit is normal.

[0194] In this embodiment, by controlling each voltage output pin to output a first voltage and collecting the pin voltage of each second pin, the circuit of the device under test is determined to be normal when the pin voltage of each second pin is greater than the open circuit voltage threshold. When the pin voltage of any second pin is less than or equal to the open circuit voltage threshold, the device under test is determined to have an open circuit abnormality. This application can improve the speed of the HDMI test system in detecting open circuits in the device under test and shorten the test time.

[0195] Please see Figure 7 , Figure 7yes Figure 5 Detailed flowchart of step S502 in the process;

[0196] like Figure 7 As shown, step S502 includes:

[0197] Step S521: Initialize parameters;

[0198] Specifically, the parameters include index number m, number of open-circuit test pins, and open-circuit voltage threshold. The number of open-circuit test pins is the number of pins that need to be tested for open circuit on the first HDMI port. The number of pins that need to be tested for open circuit on the first HDMI port is the same as the number of pins that need to be tested for open circuit on the second HDMI port.

[0199] For example: The HDMI test system uses 8 second pins to perform open circuit detection on 8 pins of the first HDMI port. The initial index number m is 1, the number of open circuit test pins is 8, and the open circuit voltage threshold is 1V.

[0200] Step S522: Detect the pin voltage of each second pin;

[0201] Specifically, after the short circuit detection is completed, each voltage output pin of the voltage output unit outputs a first voltage, and the voltage acquisition unit detects the pin voltage of each second pin.

[0202] Step S523: Determine whether the pin voltage of the second pin corresponding to the index number is greater than the open-circuit voltage threshold;

[0203] Specifically, if the pin voltage of the second pin corresponding to the index number is greater than the open-circuit voltage threshold, proceed to step S524; if the pin voltage of the second pin corresponding to the index number is less than or equal to the open-circuit voltage threshold, proceed to step S527.

[0204] Step S524: Update the index number;

[0205] Specifically, the index number is incremented by one to obtain the updated index number, thereby obtaining the pin voltage of the next voltage acquisition pin and determining whether the pin voltage is greater than the open circuit voltage threshold.

[0206] Step S525: Determine whether the index number is less than or equal to the number of open-circuit test pins;

[0207] Specifically, if the index number is less than or equal to the number of open-circuit test pins, return to step S523 to determine the relationship between the pin voltage of the second pin corresponding to the index number updated in step S524 and the open-circuit voltage threshold; if the index number is greater than the number of short-circuit test pins, proceed to step S526.

[0208] Step S526: Confirm that the circuitry of the device under test is normal;

[0209] Specifically, if the voltage of each second pin is greater than the open-circuit voltage threshold, the open-circuit detection result is determined to be that the circuit is normal.

[0210] Step S527: Determine that the device under test has an open circuit anomaly.

[0211] Specifically, when the pin voltage of any second pin is less than or equal to the open-circuit voltage threshold, it is determined that the pin corresponding to that second pin in the first HDMI port 101 is open-circuited.

[0212] Please see Figure 8 , Figure 8 This is a complete flowchart illustrating an HDMI testing method provided in an embodiment of this application;

[0213] In this embodiment of the application, the HDMI test system further includes a first indicator light and a second indicator light. The first indicator light and the second indicator light display different colors. When the first indicator light is lit, it indicates that the device under test has been tested successfully, that is, it has successfully passed the short circuit detection and open circuit detection. When the second indicator light is lit, it indicates that the device under test has failed the test, that is, it has not passed the short circuit detection or open circuit detection, or the test is abnormal because the first HDMI port was unplugged from the HDMI test system during the test.

[0214] like Figure 8 As shown, the complete process of the HDMI testing method includes:

[0215] Step S801: Initialize the HDMI test system;

[0216] Specifically, the 14 voltage output pins and 14 voltage acquisition pins of the HDMI test system are connected to the corresponding 14 pins of the first HDMI port 101.

[0217] Step S802: Control the HDMI test system to supply power to the device under test;

[0218] Specifically, the control unit of the HDMI test system provides a third voltage to the device under test (DUT) to power it on. For example, the third voltage is 5V.

[0219] Step S803: Determine whether the first HDMI port is plugged into the HDMI test system;

[0220] Specifically, if the first HDMI port has been inserted into the HDMI test system, proceed to step S804; if the first HDMI port has not been inserted into the HDMI test system, repeat step S803 until the first HDMI port is inserted into the HDMI test system, then proceed to step S804.

[0221] Step S804: Control the HDMI test system to stop supplying power to the device under test;

[0222] Specifically, the control unit stops supplying power to the device under test in order to perform short-circuit detection on the device under test.

[0223] Step S805: Perform short-circuit detection on the device under test;

[0224] Specifically, this step is the same as step S501, and will not be repeated here.

[0225] Step S806: Determine whether the short circuit detection result indicates that the line is normal;

[0226] Specifically, if the short circuit detection result is that the line is normal, proceed to step S807; if the short circuit detection result is that the short circuit is abnormal, proceed to step S812.

[0227] Step S807: Control the HDMI test system to supply power to the device under test;

[0228] Specifically, the control unit supplies power to the device under test in order to perform open circuit detection on the device under test.

[0229] Step S808: Determine whether the first HDMI port has been disconnected from the HDMI test system;

[0230] Specifically, if the first HDMI port has been unplugged from the HDMI test system, proceed to step S812; if the first HDMI port has not been unplugged from the HDMI test system, proceed to step S809.

[0231] Step S809: Perform open circuit testing on the device under test;

[0232] Specifically, this step is the same as step S502, and will not be repeated here.

[0233] Step S810: Determine whether the open circuit test result indicates that the line is normal;

[0234] Specifically, if the open-circuit test result is that the line is normal, proceed to step S811; if the open-circuit test result is that the line is normal, proceed to step S812.

[0235] Step S811: Control the first indicator light to illuminate;

[0236] Specifically, when the open-circuit test result indicates that the circuit is normal, the first indicator light illuminates. At this point, the device under test has passed both the short-circuit and open-circuit tests. For example, the first indicator light is green.

[0237] Step S812: Control the second indicator light to illuminate;

[0238] Specifically, if the device under test fails the short circuit or open circuit test, or if the first HDMI port is unplugged from the HDMI test system during the test, the second indicator light will illuminate to indicate that the test has failed. For example, the first indicator light is red.

[0239] In this embodiment, by determining whether the first HDMI port has been unplugged from the HDMI test system, the second indicator light is controlled to illuminate when the first HDMI port has been unplugged from the HDMI test system. This application can promptly remind relevant personnel in the event of a test abnormality caused by the first HDMI port being unplugged from the HDMI test system during the test.

[0240] Step S813: Determine whether the first HDMI port has been disconnected from the HDMI test system;

[0241] Specifically, if the first HDMI port has been unplugged from the HDMI test system, proceed to step S814; if the first HDMI port has not been unplugged from the HDMI test system, repeat step S813 until the first HDMI port is unplugged from the HDMI test system, then proceed to step S814.

[0242] Step S814: Reset parameters.

[0243] Specifically, the parameters used by the HDMI test system during open circuit or short circuit detection are reset. After step S814 is completed, the system returns to step S812 to perform short circuit and open circuit detection on the next device under test.

[0244] In this application embodiment, an HDMI testing method is provided, which is applied to the HDMI testing system in any of the above embodiments. The HDMI testing method includes: after the first HDMI port is inserted into the system, performing a short-circuit test on the device under test to determine whether the circuit of the device under test is normal; if the short-circuit test result indicates that the circuit is normal, performing an open-circuit test on the device under test to determine whether the device under test has an open-circuit abnormality. By applying this HDMI testing method to the HDMI testing system, performing a short-circuit test on the device under test after the first HDMI port is inserted into the system to determine whether the circuit of the device under test is normal; and performing an open-circuit test on the device under test if the short-circuit test result indicates that the circuit is normal, this application can achieve open-circuit and short-circuit tests on the HDMI circuits of different products through a single testing system, improving the versatility of the testing system. Furthermore, by performing open-circuit tests when the short-circuit test result indicates that the circuit is normal, open-circuit tests are not required for products with short-circuit abnormalities, thus improving testing efficiency.

[0245] Please see Figure 9, Figure 9 This is a schematic diagram of another testing device provided in an embodiment of this application;

[0246] like Figure 9 As shown, the test device 400 includes one or more processors 401 and a memory 402. Wherein, Figure 9 Take a processor 401 as an example.

[0247] Processor 401 and memory 402 can be connected via a bus or other means. Figure 9 Taking the example of a connection between China and Israel via a bus.

[0248] The processor 401 provides computing and control capabilities to control the test device 400 to perform corresponding tasks, such as controlling the test device 400 to execute the HDMI test method in any of the above method embodiments. When this HDMI test method is applied to an HDMI test system, after the first HDMI port is inserted into the system, a short-circuit test is performed on the device under test to determine if the circuit of the device under test is normal. If the short-circuit test result indicates that the circuit is normal, an open-circuit test is performed on the device under test to determine if the device under test has an open-circuit abnormality. This application enables open-circuit and short-circuit tests to be performed on the HDMI circuits of different products using a single test system, improving the versatility of the test system. Furthermore, since open-circuit testing is performed only when the short-circuit test result indicates that the circuit is normal, there is no need to perform open-circuit testing on products with short-circuit abnormalities, thus improving test efficiency.

[0249] Processor 401 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), a hardware chip, or any combination thereof; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The aforementioned PLD can be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL), or any combination thereof.

[0250] Memory 402, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs, non-transitory computer-executable programs, and modules, such as the program instructions / modules corresponding to the HDMI testing method in the embodiments of this application. Processor 401 can implement the HDMI testing method in any of the above method embodiments by running the non-transitory software programs, instructions, and modules stored in memory 402. Specifically, memory 402 may include volatile memory (VM), such as random access memory (RAM); memory 402 may also include non-volatile memory (NVM), such as read-only memory (ROM), flash memory, hard disk drive (HDD), solid-state drive (SSD), or other non-transitory solid-state storage devices; memory 402 may also include combinations of the above types of memory.

[0251] Memory 402 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, memory 402 may optionally include memory remotely located relative to processor 401, which can be connected to processor 401 via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0252] One or more modules are stored in memory 402. When executed by one or more processors 401, they perform the HDMI test method in any of the above method embodiments, for example, the method described above. Figure 5 The steps shown.

[0253] In this embodiment, the test device 400 may also have wired or wireless network interfaces, a keyboard, and input / output interfaces for input and output. The test device 400 may also include other components for implementing device functions, which will not be described in detail here.

[0254] This application also provides a non-volatile computer-readable storage medium, such as a memory including program code, which can be executed by a processor to complete the HDMI testing method in the above embodiments. For example, the non-volatile computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a compact disc read-only memory (CDROM), magnetic tape, floppy disk, and optical data storage device, etc.

[0255] This application also provides a computer program product comprising one or more lines of program code stored in a non-volatile computer-readable storage medium. The processor of the test device reads the program code from the non-volatile computer-readable storage medium and executes the program code to complete the method steps of the HDMI testing method provided in the above embodiments.

[0256] Those skilled in the art will understand that all or part of the steps of the above embodiments can be implemented by hardware, or by a program or program code related to hardware. The program can be stored in a computer-readable storage medium, such as a read-only memory, a disk, or an optical disk.

[0257] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented using software plus a general-purpose hardware platform, or of course, using hardware. Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a non-volatile computer-readable storage medium. When executed, the program can include the processes of the embodiments of the above methods. The non-volatile computer-readable storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0258] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and not to limit them; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations as described above in different aspects of this application, which are not provided in detail for the sake of brevity; although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. An HDMI testing system, characterized in that, The system includes a control unit and a line coupling unit, wherein the control unit includes a plurality of first pins and second pins; The line coupling unit includes a first connection circuit and a second connection circuit. Each first pin corresponds to a first connection circuit. The first connection circuit is used to connect the first pin to the first HDMI port of the device under test. Each second pin corresponds to a second connection circuit. The second connection circuit is used to connect the second pin to the first HDMI port. The control unit is connected to the line coupling unit and is used to output a first voltage or a second voltage to the line coupling unit and to detect the pin voltage of the second pin to determine whether the device under test has an open circuit or a short circuit. The line coupling unit, connecting the control unit and the first HDMI port, is used for: When each of the first pins outputs a first voltage, each of the first connection circuits is disconnected and each of the second connection circuits is turned on, so that when the control unit detects that the pin voltage of any second pin is less than or equal to the open circuit voltage threshold, it determines that the device under test has an open circuit abnormality. Alternatively, when the i-th first pin of the control unit outputs a second voltage and the remaining first pins output a first voltage, the first connection circuit connected to the i-th first pin and the second connection circuit connected to the i-th second pin are turned on, so that when the control unit detects that the pin voltage of any second pin other than the i-th second pin is greater than the first short-circuit voltage, or the pin voltage of the i-th second pin is less than the second short-circuit voltage, it determines that the device under test has a short-circuit abnormality. Wherein, the first short-circuit voltage is greater than the second short-circuit voltage.

2. The system according to claim 1, characterized in that, The system also includes a second HDMI port, and the line coupling unit is connected to the first HDMI port through the second HDMI port; The control unit includes a voltage output unit, which is used to output a first voltage or a second voltage to the line coupling unit; The first pin is any positive or negative pin among the zero channel pin, the first channel pin, the second channel pin, or the clock signal pin of the voltage output unit, wherein the zero channel pin, the first channel pin, the second channel pin, and the clock signal pin each include one positive pin and one negative pin; The line coupling unit includes a first diode and a second diode; The positive pin of the voltage output unit is connected to the anode of the first diode, and the cathode of the first diode is connected to the positive pin of the second HDMI port; The negative pin of the voltage output unit is connected to the anode of the second diode, and the cathode of the second diode is connected to the negative pin of the second HDMI port. The first connection circuit includes: a circuit between the positive pin of the voltage output unit and the positive pin of the second HDMI port, or a circuit between the negative pin of the voltage output unit and the negative pin of the second HDMI port.

3. The system according to claim 2, characterized in that, The control unit also includes a voltage acquisition unit, which is used to detect the pin voltage of each second pin; The second pin is any positive or negative pin among the zero channel pin, the first channel pin, the second channel pin, or the clock signal pin of the voltage acquisition unit; The line coupling unit also includes a third diode and a fourth diode; The positive pin of the voltage acquisition unit is connected to the cathode of the third diode, and the anode of the third diode is connected to the positive pin of the second HDMI port; The negative pin of the voltage acquisition unit is connected to the cathode of the fourth diode, and the anode of the fourth diode is connected to the negative pin of the second HDMI port. The second connection circuit includes: a circuit between the positive pin of the voltage acquisition unit and the positive pin of the second HDMI port, or a circuit between the negative pin of the voltage acquisition unit and the negative pin of the second HDMI port.

4. The system according to claim 3, characterized in that, The voltage output unit also includes a third pin, which may include a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot-plug detection pin. When the HDMI testing system is used for open-circuit detection of the device under test: The power supply pin of the control unit is connected to the power supply pin of the first HDMI port. The control unit is also used to provide a third voltage to the device under test so that the device under test is powered on. The third voltage is greater than the first voltage and the third voltage is greater than the second voltage. The voltage output unit is used to control the output of a first voltage from each first pin and third pin; The voltage acquisition unit is used to detect the pin voltage of each second pin; The control unit is also used to determine that the circuit of the device under test is normal when the pin voltage of each second pin is greater than the open circuit voltage threshold.

5. The system according to claim 3, characterized in that, The voltage acquisition unit also includes a fourth pin, which may include a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot-plug detection pin. When the HDMI testing system is used to perform short-circuit detection on the device under test: The voltage output unit is used to: sequentially perform the first step on each voltage output pin of the voltage output unit, wherein the voltage output pin includes a first pin or a third pin; The first step includes: controlling the i-th voltage output pin to output a second voltage and the remaining voltage output pins to output a first voltage, wherein the i-th voltage output pin is the voltage output pin currently executing the first step; The voltage acquisition unit is used to detect the pin voltage of each voltage acquisition pin, wherein the voltage acquisition pin includes a second pin or a fourth pin, and the i-th voltage acquisition pin and the i-th voltage output pin are connected to the same pin of the second HDMI port. The control unit is also used for: If the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, or if the pin voltage of the i-th voltage acquisition pin is less than the second short-circuit voltage, it is determined that the device under test has a short-circuit abnormality. After each execution of the first step, if the pin voltage detected by the voltage acquisition unit meets the first condition, it is determined that the circuit of the device under test is normal. The first condition includes: the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage, and the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage.

6. The system according to any one of claims 2-5, characterized in that, The first HDMI port is an HDMI female connector, and the second HDMI port is an HDMI male connector.

7. A testing device, characterized in that, include: The HDMI testing system as described in any one of claims 1-6.

8. An HDMI testing method, characterized in that, The method, applied to the HDMI testing system according to any one of claims 1-6, comprises: After the system is plugged into the first HDMI port, a short circuit test is performed on the device under test to determine whether the circuit of the device under test is normal. If the short-circuit test result indicates that the line is normal, an open-circuit test is performed on the device under test to determine whether the device under test has an open-circuit abnormality.

9. The method according to claim 8, characterized in that, The control unit includes a voltage acquisition unit and a voltage output unit. The voltage output unit includes a plurality of voltage output pins, and the voltage acquisition unit includes a plurality of voltage acquisition pins. The voltage output pin includes a first pin or a third pin, and the voltage acquisition pin includes a second pin or a fourth pin; The first pin is any positive or negative pin among the zero channel pin, the first channel pin, the second channel pin, or the clock signal pin of the voltage output unit; The third pin includes a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot-plug detection pin. The second pin is any positive or negative pin among the zero channel pin, the first channel pin, the second channel pin, or the clock signal pin of the voltage acquisition unit; The fourth pin may be a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot-plug detection pin.

10. The method according to claim 9, characterized in that, The short-circuit detection of the device under test includes: Perform a cyclic sampling step for each voltage output pin sequentially. In any cyclic acquisition step, if the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is greater than the first short-circuit voltage, it is determined that the circuit corresponding to the voltage acquisition pin whose pin voltage is greater than the first short-circuit voltage is short-circuited with the i-th pin of the first HDMI port, and the cyclic acquisition step is stopped. Alternatively, in any cyclic acquisition step, if the pin voltage of the i-th voltage acquisition pin is less than the second short-circuit voltage, it is determined that the i-th pin of the first HDMI port is short-circuited to ground, and the cyclic acquisition step is stopped. In any loop acquisition step, if the detected pin voltage meets the first condition, the loop acquisition step is executed for the next voltage output pin until the loop acquisition step is completed for each voltage output pin, and the pin voltage detected in each loop acquisition step meets the first condition, then the circuit of the device under test is determined to be normal. The cyclic acquisition step includes: Control the i-th voltage output pin to output the second voltage, and the remaining voltage output pins to output the first voltage; The voltage of each voltage acquisition pin is collected sequentially; When the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage, and the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage, control the i-th voltage output pin to output the first voltage. The first condition includes: the pin voltage of any voltage acquisition pin other than the i-th voltage acquisition pin is less than or equal to the first short-circuit voltage, and the pin voltage of the i-th voltage acquisition pin is greater than or equal to the second short-circuit voltage.

11. The method according to claim 9, characterized in that, The open-circuit test of the device under test includes: Control each voltage output pin to output the first voltage; Collect the pin voltage of each second pin; When the pin voltage of each second pin is greater than the open-circuit voltage threshold, the circuit of the device under test is determined to be normal. If the voltage at any of the second pins is less than or equal to the open-circuit voltage threshold, the device under test is determined to have an open-circuit fault.

12. A testing device, characterized in that, include: At least one processor, and The memory communicatively connected to the at least one processor, wherein, The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the method according to any one of claims 8-11.

Images