Power supply control method of separated test fixture
By using a dual-power supply system and a relay switching control circuit, the problem of circuit board damage caused by hot-swapping in the separate test fixture was solved, thus protecting the components.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- INTELLIGENT AUTOMATION ZHUHAI CO LTD
- Filing Date
- 2026-01-14
- Publication Date
- 2026-05-19
AI Technical Summary
In existing separate test fixtures, circuit boards 1 and 2 share a single power supply, leading to hot-swapping and potentially damaging circuit board components.
A dual power supply system is adopted, and the relay switching control circuit and power supply detection logic are used to ensure that the No. 2 circuit board remains disconnected before and after the test to avoid hot-swapping.
This effectively avoids damage to circuit board components caused by hot-swapping, improving the reliability and safety of the equipment.
Smart Images
Figure CN122068420A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the technical field of battery management unit testing equipment, and particularly to a power supply control method for a separate testing fixture. Background Technology
[0002] BMU refers to the Battery Management Unit, and DUT refers to the Device Under Test. In battery management unit testing, a test fixture is typically used to connect the DUT to the test instrument, forming an electrical test circuit for electrical function testing. The test instrument has power supply and communication control functions. A commonly used industry practice is a separate test fixture, consisting of a cabinet and a test carrier. These components are designed to be separable to meet customer production needs while maintaining structural versatility and ease of maintenance.
[0003] In existing technology, the test instrument and probe module are housed inside the cabinet. The carrier has copper pillars and probe modules, as well as a structure adapted to the DUT to secure it. The test instrument connects to the adapter module inside the cabinet via test leads. The adapter module connects to the copper pillars of the carrier via a snap-fit mechanism. The copper pillars of the carrier connect to the test probe module, which in turn connects to the DUT, thus establishing a complete electrical test circuit for functional testing of the DUT. For BMU testing, the test instrument is generally universal, with one model compatible with testing multiple BMU products. However, some BMU products have specific functional requirements. When a universal test instrument cannot meet certain testing needs, corresponding circuitry needs to be configured on circuit board 1 or circuit board 2 to satisfy the testing requirements. For separate fixtures, the test instrument powers circuit board 1, and circuit board 1 powers circuit board 2. Due to cost considerations, the industry often uses one power supply to share both circuit boards 1 and 2. When the test vehicle and cabinet need to be separated or reattached, there is a problem of hot plugging and unplugging, which can easily damage the electronic components of circuit boards 1 or 2.
[0004] like Figure 7 and Figure 8 As shown, for discrete test fixtures, the common power supply solution currently uses one power supply to power both circuit boards 1 and 2. In daily use, circuit board 1 needs to operate continuously with power, while circuit board 2 needs to be separated from the cabinet along with the fixture for other production operations. This means circuit board 2 needs to disconnect its power supply from circuit board 1. Therefore, because circuit boards 1 and 2 share a single power supply, hot-swapping can occur, easily generating stress overvoltage and posing a risk of damaging components on the circuit boards. Therefore, it is necessary to provide a power supply control method for discrete test fixtures that is simple, efficient, and effectively avoids component damage caused by hot-swapping. Summary of the Invention
[0005] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and provide a power supply control method for a split test fixture, which is simple, efficient and effectively avoids the problem of component damage caused by hot plugging.
[0006] The technical solution adopted in this invention is as follows: This invention includes a cabinet and a test carrier. The cabinet includes a tester, a first circuit board, and a probe module. The tester is connected to the probe module via the first circuit board. The probe module is connected to the test carrier. The test carrier includes a second circuit board, which is connected to the product under test. The first circuit board includes a first power supply and a second power supply. The first power supply powers the first circuit board, and the second power supply powers the second circuit board. The tester enables and disables the second power supply. As can be seen from the above solution, this application adds a power supply circuit, a relay circuit, a snap-fit status detection probe, and a power supply detection control logic for detachable test fixtures to the common fixture power supply solution, effectively avoiding the problem of component damage caused by hot-swapping.
[0007] In a preferred embodiment, the first circuit board further includes a relay switching control circuit, and the output terminal of the second power supply and the power input interface of the second circuit board are connected to the relay switching control circuit to realize the disconnection and connection switching of the power supply circuit.
[0008] In a preferred embodiment, an adapter pin membrane is provided between the cabinet and the test carrier. The adapter pin membrane is provided with several probes to form a circuit between the first circuit board and the second circuit board. The tester determines whether the test carrier and the cabinet are in a locked state by measuring the continuity resistance of the circuit.
[0009] A preferred embodiment is that the power supply control method includes power-on control logic, which includes the following steps: Step A1: The first power supply remains in an output state, and the tester supplies power to the first circuit board; Step A2: The second power supply is in the disabled state by default, the relay supplying power to the second circuit board is in the open state by default, and the second circuit board will not be powered by default; before testing, the tester first checks whether the test carrier and the cabinet are fastened together through the probe circuit; Step A3: After confirming that the test carrier and the cabinet are fastened together, the tester controls the relay contacts to close, so that the output circuit of the second power supply is connected to the second circuit board. Step A4: Control the second power supply to output power to the second circuit board.
[0010] A preferred embodiment is that the power supply control method includes power-down control logic, which includes the following steps: Step B1: The tester completes the battery management unit test and performs a power-down control action; Step B2: The tester controls the second power supply to enable / disable the output; Step B3: The tester controls the relay to disconnect the contacts, thus disconnecting the second power supply from the second circuit board; Step B4: Separate the test vehicle and the cabinet to carry out other production operations. Attached Figure Description
[0011] Figure 1 This is a schematic diagram of the present invention; Figure 2 This is a flowchart of the power-on control logic; Figure 3 This is a flowchart of the power-down control logic; Figure 4 This is the circuit schematic of the first power supply; Figure 5 This is the circuit diagram of the second power supply; Figure 6 This is the circuit diagram of the relay switching control circuit. Figure 7 This is a block diagram of an existing power supply solution; Figure 8 This is a power supply circuit diagram without control and enable functions in the existing technology. Detailed Implementation
[0012] like Figures 1 to 5 As shown, in this embodiment, the present invention includes a cabinet 1 and a test carrier 2. The cabinet 1 includes a tester 3, a first circuit board 4, and a probe module 5. The tester 3 is connected to the probe module 5 via the first circuit board 4. The probe module 5 is connected to the test carrier 2. The test carrier 2 includes a second circuit board 6, which is connected to the product under test 7. The first circuit board 4 includes a first power supply and a second power supply. The first power supply powers the first circuit board 4, and the second power supply powers the second circuit board 6. The tester 3 enables and disables the second power supply.
[0013] like Figure 1 and Figure 6As shown, in this embodiment, the first circuit board 4 further includes a relay switching control circuit. The output terminal of the second power supply and the power input interface of the second circuit board 6 are connected to the relay switching control circuit to realize the disconnection and connection switching of the power supply circuit.
[0014] like Figure 1 As shown, in this embodiment, an adapter needle membrane is provided between the cabinet 1 and the test carrier 2. The adapter needle membrane is provided with several probes to form a circuit between the first circuit board 4 and the second circuit board 6. The tester 3 determines whether the test carrier 2 and the cabinet 1 are in a fastened state by measuring the continuity resistance of the circuit.
[0015] like Figure 2 As shown, in this embodiment, the power supply control method includes power-on control logic, which includes the following steps: Step A1: The first power supply remains in an output state, and the tester 3 supplies power to the first circuit board 4; Step A2: The second power supply is in the disabled state by default, the relay supplying power to the second circuit board 6 is in the open state by default, and the second circuit board 6 will not be powered by default; before testing, the tester 3 first checks whether the test carrier 2 and the cabinet 1 are fastened together through the probe circuit; Step A3: After confirming that the test carrier 2 and the cabinet 1 are fastened together, the tester 3 controls the relay contacts to close, so that the output circuit of the second power supply is connected to the second circuit board 6. Step A4: Control the second power supply to output power to the second circuit board 6.
[0016] like Figure 3 As shown, in this embodiment, the power supply control method includes power-down control logic, which includes the following steps: Step B1: The tester 3 completes the battery management unit test and performs a power-down control action; Step B2: The tester 3 controls the second power supply to enable / disable the output; Step B3: The tester 3 controls the relay to disconnect the contact, thereby disconnecting the second power supply from the second circuit board 6. Step B4: Separate the test carrier 2 from the cabinet 1 and carry out other production operations. Ensure that the second circuit board 6 is in a power-off state after the test is completed, thereby avoiding hot-swapping when the test carrier 2 is removed from the cabinet 1, thus protecting the components on the circuit board.
[0017] Although the embodiments of the present invention are described with reference to actual solutions, they do not constitute a limitation on the meaning of the present invention. Modifications to the embodiments and combinations with other solutions based on this specification will be obvious to those skilled in the art.
Claims
1. A power supply control method for a split-type test fixture, comprising a cabinet (1) and a test carrier (2), characterized in that: The cabinet (1) includes a tester (3), a first circuit board (4) and a probe module (5). The tester (3) is connected to the probe module (5) via the first circuit board (4). The probe module (5) is connected to the test carrier (2). The test carrier (2) includes a second circuit board (6). The second circuit board (6) is connected to the product under test (7). The first circuit board (4) includes a first power supply and a second power supply. The first power supply is used by the first circuit board (4), and the second power supply is used by the second circuit board (6). The tester (3) enables and disables the second power supply.
2. The power supply control method for the detachable test fixture according to claim 1, characterized in that, The first circuit board (4) also includes a relay switching control circuit. The output terminal of the second power supply and the power input interface of the second circuit board (6) are connected to the relay switching control circuit to realize the disconnection and connection switching of the power supply circuit.
3. The power supply control method for the detachable test fixture according to claim 2, characterized in that, An adapter needle membrane is provided between the cabinet (1) and the test carrier (2). The adapter needle membrane is provided with several probes to form a circuit between the first circuit board (4) and the second circuit board (6). The tester (3) determines whether the test carrier (2) and the cabinet (1) are in a snap-fit state by measuring the conduction resistance of the circuit.
4. The power supply control method for the detachable test fixture according to claim 3, characterized in that, The power supply control method includes power-on control logic, which includes the following steps: Step A1: The first power supply is always in the output state, and the tester (3) supplies power to the first circuit board (4); Step A2: The second power supply is in the de-enabled off state by default, the relay that supplies power to the second circuit board (6) is in the off state by default, and the second circuit board (6) will not be powered by default; before testing, the tester (3) first checks whether the test carrier (2) and the cabinet (1) are fastened together by probe circuit; Step A3: After confirming that the test carrier (2) and the cabinet (1) are fastened together, the tester (3) controls the relay contacts to close, so that the output circuit of the second power supply is connected to the second circuit board (6). Step A4: Control the second power supply to output power to the second circuit board (6).
5. The power supply control method for the detachable test fixture according to claim 3, characterized in that, The power supply control method includes power-down control logic, which includes the following steps: Step B1: The tester (3) completes the battery management unit test and performs a power-down control action; Step B2: The tester (3) controls the second power supply to enable / disable the output; Step B3: The tester (3) controls the relay to disconnect the contact, thereby disconnecting the second power supply from the second circuit board (6); Step B4: Separate the test vehicle (2) and the cabinet (1) to carry out other production operations.