Aperture device, camera device, and optical device

Abstract

The aperture device according to the present embodiment includes a fixed unit, a moving unit disposed on the fixed unit, a driving unit for moving the moving unit, and a plurality of vanes having vane holes that change in size according to movement of the moving unit, wherein: the driving unit includes a magnet disposed in the moving unit and a coil disposed in the fixed unit, and includes a sensor for sensing a position of the magnet; the coil includes a plurality of coils spaced apart from each other; and the sensor is adjacent to any one of the plurality of coils.

Description

Technical Field

[0001] This embodiment relates to an aperture device, a camera device, and an optical device. Background Technology

[0002] Recently, smartphones have been equipped with camera functions that can capture high-resolution photos and videos.

[0003] In particular, recent smartphone cameras are equipped with a variety of features such as autofocus, image stabilization, and zoom, thus providing high satisfaction to many users.

[0004] However, a problem with conventional smartphone cameras is their limited performance in dark environments. As a result, images captured in low-light conditions may have high noise and low sharpness. Summary of the Invention

[0005] Technical topics

[0006] This embodiment aims to provide a camera device that can be used even in dark environments without performance limitations. Furthermore, this embodiment aims to provide an aperture device provided in the aforementioned camera device.

[0007] Technical solutions

[0008] To solve the above-mentioned technical problems, the aperture device according to an embodiment of the present invention includes: a fixed unit; a movable unit disposed on the fixed unit; a drive unit for moving the movable unit; and a plurality of blades forming a blade aperture, the size of which varies according to the movement of the movable unit, wherein: the drive unit includes a magnet disposed on the movable unit and a coil disposed on the fixed unit, and includes a sensor for sensing the position of the magnet; the coil includes a plurality of coils spaced apart from each other; and the sensor is disposed adjacent to any one of the plurality of coils.

[0009] The coil has an annular shape including a hole region, and the center point obtained by dividing the hole regions of multiple coils equally in the radial direction and the center of the sensor can be aligned on the circumference of an imaginary circle.

[0010] The fixing unit includes a substrate, a coil formed as a patterned coil on the substrate, and a sensor that can be mounted on the substrate.

[0011] The substrate includes: a core; a first coil layer disposed on one side of the core; a second coil layer disposed on the other side of the core; and an adhesive disposed between the core and the first coil layer and between the core and the second coil layer, and a sensor may be disposed on the core.

[0012] Terminals are provided on the core, and the sensor can be wired to the terminals.

[0013] The sensor can be configured not to protrude from one surface of the substrate.

[0014] The substrate includes an opening corresponding to the blade hole, and the radius of curvature of the inner surface in the circumferential direction of the hole region of the coil can be the same as the radius of curvature of the opening of the substrate.

[0015] To solve the technical problem, the aperture device according to an embodiment of the present invention includes: a fixed unit; a movable unit disposed on the fixed unit; a magnet and a coil for moving the movable unit; a plurality of blades forming an aperture, the size of which changes according to the movement of the movable unit; a sensor for sensing the position of the magnet; and the coil having an annular shape including an aperture region, the coil including a plurality of coils spaced apart from each other, and the center point obtained by equally dividing the aperture region of the plurality of coils in the radial direction and the center of the sensor being aligned on the circumference of an imaginary circle.

[0016] In the magnet, the N pole and S pole are alternately arranged along the circumference, and the sensor can face the magnet.

[0017] The magnet comprises regions with 2N polarities, and the number of multiple coils can be N.

[0018] The fixing unit includes a substrate on which a coil is disposed, wherein the inner surface of the hole region of the coil includes a first inner surface closer to the opening of the substrate and a second inner surface closer to the outer surface of the substrate, and wherein the radius of curvature of the first inner surface may be the same as the radius of curvature of the second inner surface.

[0019] The inner surface of the hole region of the coil includes a third inner surface connecting the first inner surface and the second inner surface, and a fourth inner surface opposite to the third inner surface, wherein the third inner surface and the fourth inner surface may have the same length.

[0020] The camera device according to this embodiment may include: a printed circuit board; an image sensor disposed on the printed circuit board; a lens disposed on the image sensor; and an aperture device disposed on the lens.

[0021] The optical device according to this embodiment may include: a main body; a camera device disposed on the main body; and a display disposed on the main body and outputting at least one of an image and a video captured by the camera device.

[0022] To solve the technical problem, the aperture device according to an embodiment of the present invention includes: a fixed unit; a movable unit disposed on the fixed unit; a driving unit for moving the movable unit; and a plurality of blades forming a blade aperture, the size of which changes according to the movement of the movable unit. The fixed unit includes a substrate, and the driving unit includes a magnet disposed on the movable unit and a coil disposed on the substrate, and includes a sensor for sensing the position of the magnet, and the die of the sensor is disposed facing a surface of the substrate.

[0023] The sensor die is disposed on a pad formed on a substrate, and the pad can be an anisotropic conductive film (AFC) bonding area.

[0024] The pads can be connected to patterned coils that apply power and signals to the sensor.

[0025] Patterned coils may include multiple patterned coils connected to different areas of the pads.

[0026] The pads can overlap with the sensor die in the optical axis direction.

[0027] The coil comprises multiple coils spaced apart from each other, and the sensor can be configured to be adjacent to any one of the multiple coils.

[0028] The coil has an annular shape including a hole region, and the center point obtained by dividing the hole regions of multiple coils equally in the radial direction and the center of the sensor can be aligned on the circumference of an imaginary circle.

[0029] To solve the technical problem, the aperture device according to an embodiment of the present invention includes: a fixed unit; a movable unit disposed on the fixed unit; a magnet and a coil for moving the movable unit; a plurality of blades forming an aperture, the size of which changes according to the movement of the movable unit; and a sensor for sensing the position of the magnet, wherein the fixed unit includes a substrate, and wherein the die of the sensor is configured to face a pad formed on the substrate.

[0030] The pads can be connected to patterned coils that apply power and signals to the sensor.

[0031] Patterned coils may include multiple patterned coils connected to different areas of the pads.

[0032] The coil comprises multiple coils spaced apart from each other, and the sensor can be configured to be adjacent to any one of the multiple coils.

[0033] The camera device according to this embodiment may include: a printed circuit board; an image sensor disposed on the printed circuit board; a lens disposed on the image sensor; and an aperture device disposed on the lens.

[0034] The optical device according to this embodiment may include: a main body; a camera device disposed on the main body; and a display disposed on the main body and outputting at least one of an image and a video captured by the camera device.

[0035] To solve the technical problem, the aperture device according to an embodiment of the present invention includes: a fixed unit; a movable unit disposed on the fixed unit; a driving unit for moving the movable unit; and a plurality of blades forming a blade aperture, the size of which changes according to the movement of the movable unit. The driving unit includes a magnet disposed on the movable unit and a coil disposed on the fixed unit. The coil is annular in shape including the aperture region. The coil includes a first region and a second region that do not generate Lorentz force, and a third region and a fourth region that generate Lorentz force. The first and second regions form a patterned coil, and the third and fourth regions form a plurality of patterned coils.

[0036] In the magnet, the N pole and S pole are alternately arranged along the circumference, and the third and fourth regions of the coil can be arranged to face different poles of the magnet.

[0037] The length of the first region of the coil in the direction perpendicular to the length direction can be less than the length of the third region of the coil in the direction perpendicular to the length direction.

[0038] The length of the hole region of the coil in the longitudinal direction can be less than the sum of the length of the third region of the coil in the direction perpendicular to the longitudinal direction and the length of the fourth region of the coil in the direction perpendicular to the longitudinal direction.

[0039] In the magnet, the N pole and S pole are alternately arranged along the circumferential direction, and the hole area of ​​the coil can overlap with the boundary surface between the N pole and S pole of the magnet in the optical axis direction.

[0040] A coil comprises multiple coils spaced apart from each other, and when the magnet comprises a region having 2N polarities (where are different polarities), the number of multiple coils can be N.

[0041] The fixing unit includes a substrate, and the coil can be formed as a patterned coil on the substrate.

[0042] The substrate includes an opening corresponding to the blade hole, and the radius of curvature of the inner surface in the circumferential direction of the hole region of the coil can be the same as the radius of curvature of the opening of the substrate.

[0043] To solve the above-mentioned technical problems, the aperture device according to an embodiment of the present invention includes: a fixed unit; a movable unit disposed on the fixed unit; a magnet and a coil for moving the movable unit; and a plurality of blades forming an aperture, the size of which varies according to the movement of the movable unit, wherein the coil is annular in shape including the aperture region, wherein the coil includes a first region that does not generate Lorentz force and a second region on the opposite side of the first region, wherein the coil includes a third region that generates Lorentz force and a fourth region on the opposite side of the third region, wherein the first region and the second region connect the third region and the fourth region, and wherein the length of the first region in a direction perpendicular to the length direction is less than the length of the third region in a direction perpendicular to the length direction.

[0044] The length of the hole region of the coil in the longitudinal direction can be less than the sum of the lengths of the third region in the direction perpendicular to the longitudinal direction and the lengths of the fourth region in the direction perpendicular to the longitudinal direction.

[0045] In the magnet, the N pole and S pole are alternately arranged along the circumference, and the third and fourth regions of the coil can be arranged to face different poles of the magnet.

[0046] The camera device according to this embodiment may include: a printed circuit board; an image sensor disposed on the printed circuit board; a lens disposed on the image sensor; and an aperture device disposed on the lens.

[0047] The optical device according to this embodiment may include: a main body; a camera device disposed on the main body; and a display disposed on the main body and outputting at least one of video and images captured by the camera device.

[0048] Beneficial effects

[0049] This implementation allows smartphone camera functionality to be used even in dark environments without performance limitations.

[0050] In addition, sensors, magnets, and coils can be effectively housed within an ultra-thin aperture device.

[0051] Furthermore, even in ultra-thin aperture devices, the driving force of the moving unit can be increased.

[0052] In addition, ultra-thin aperture devices can be achieved by improving the arrangement structure of the sensor on the substrate. Attached Figure Description

[0053] Figure 1 This is a perspective view of the aperture device according to this embodiment.

[0054] Figure 2 This is an exploded perspective view of the aperture device according to this embodiment.

[0055] Figure 3 This is a perspective view of the substrate, coil, and sensor according to this embodiment.

[0056] Figure 4 It is a cross-sectional view of the substrate, coil, and sensor of a conventional aperture device.

[0057] Figure 5 This is a cross-sectional view of the substrate, coil, and sensor according to this embodiment.

[0058] Figure 6 This is a view used to illustrate the arrangement of the substrate and sensor.

[0059] Figure 7 This is a view used to illustrate the arrangement of the substrate and sensor according to this embodiment.

[0060] Figure 8 This is a view used to illustrate the arrangement of the magnet and coil according to this embodiment.

[0061] Figure 9 This is a view used to illustrate the coil according to this embodiment.

[0062] Figure 10 This is an exploded perspective view of the camera device according to this embodiment.

[0063] Figure 11 This is a perspective view of the optical device according to this embodiment. Detailed Implementation

[0064] In the following, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

[0065] However, the technical concept of the present invention is not limited to the few embodiments described, but can be implemented in various forms, and within the scope of the technical concept of the present invention, one or more of the constituent elements can be selectively combined or substituted among the embodiments.

[0066] Furthermore, unless explicitly defined and described, the terms (including technical and scientific terms) used in the embodiments of the present invention may be interpreted as having meanings that are generally understood by those skilled in the art, and commonly used terms (such as terms defined in dictionaries) may be interpreted in light of their meaning in the context of the relevant art.

[0067] Furthermore, the terminology used in this specification is for describing embodiments and is not intended to limit the invention.

[0068] In this specification, unless specifically stated in the phrase, the singular form may include the plural form, and when described as “at least one (or more than one) of A, B and C”, it may include one or more of all combinations that can be combined with A, B and C.

[0069] Furthermore, when describing components of embodiments of the present invention, terms such as first, second, A, B, (a), and (b) may be used. These terms are intended only to distinguish components from other components, and the terms do not limit the nature, order, or sequence of the components.

[0070] Furthermore, when a component is described as being “connected,” “coupled,” or “interconnected” to another component, the component is not only directly connected, coupled, or interconnected to another component, but may also include cases where the component is “connected,” “coupled,” or “interconnected” due to another component between other components.

[0071] Additionally, when described as being formed or set "above" or "below" each component, "above" or "below" means not only that the two components are in direct contact, but also that one or more other components are formed or set between the two components. Furthermore, when expressed as "above" or "below," it can include the meaning of both upward and downward directions relative to a component.

[0072] As used below, “optical axis direction” is defined as the optical axis direction of the lens and / or image sensor coupled to the lens drive device.

[0073] The term "vertical direction" as used below can refer to a direction parallel to or the same as the optical axis. The vertical direction can correspond to the "z-axis direction." The term "horizontal direction" as used below can refer to a direction perpendicular to the vertical direction. That is, the horizontal direction can be perpendicular to the optical axis. Therefore, the horizontal direction can include both the "x-axis direction" and the "y-axis direction."

[0074] In the following text, "autofocus (AF) function" is defined as follows: It automatically focuses on the subject by moving the lens along the optical axis according to the distance to the subject, thereby adjusting the distance from the image sensor and obtaining a sharp image of the subject on the image sensor. Additionally, "closed-loop autofocus (CLAF) control" is defined as performing real-time feedback control of the lens position by sensing the distance between the image sensor and the lens, thereby improving the accuracy of focus adjustment.

[0075] In the following description, the configuration of the aperture device according to this embodiment will be described with reference to the accompanying drawings.

[0076] The aperture device 100 can be an aperture. The aperture device 100 can adjust the amount of light passing through the lens. The aperture device 100 can adjust the amount of light incident on the image sensor 60.

[0077] The aperture device 100 can be mounted on the lens. The aperture device 100 can be coupled to the lens. The aperture device 100 can be fixed to the lens. The aperture device 100 can move integrally with the lens. The aperture device 100 can move together with the lens. The aperture device 100 can move together with the lens in the optical axis direction.

[0078] The aperture device 100 may include a fixing unit 110. The fixing unit 110 may be a stator. The fixing unit 110 may be a portion that is fixed relative to the moving unit 120. The fixing unit 110 may movably support the moving unit 120.

[0079] The aperture device 100 may include a base 111. The fixing unit 110 may include a base 111. The base 111 may be referred to as a housing. The base 111 may be coupled to a cover 112. The base 111 may house a moving unit 120. The base 111 may movably support the moving unit 120.

[0080] The base 111 may include a first protrusion 113. The first protrusion 113 may project upward from the upper surface of the base 111. The first protrusion 113 may be coupled to the blade 140.

[0081] The aperture device 100 may include a cover 112. The fixing unit 110 may include a cover 112. The cover 112 may be disposed in the base 111. The cover 112 may be disposed on the base 111. The cover 112 may accommodate the moving unit 120 therein. The cover 112 may include a top plate and side plates extending from the top plate.

[0082] The aperture device 100 may include a moving unit 120. The moving unit 120 may be a rotor. The moving unit 120 may be a rotating body. The moving unit 120 may be a movable part. The moving unit 120 may be a moving component. The moving unit 120 may be a carrier.

[0083] The movable unit 120 can be disposed on the fixed unit 110. The movable unit 120 can be disposed within the fixed unit 110. The movable unit 120 can be movably disposed within the fixed unit 110. The movable unit 120 can be rotatably disposed within the fixed unit 110. The movable unit 120 can be disposed on the base 111. The movable unit 120 can be disposed within the base 111. The movable unit 120 can be movably disposed within the base 111. The movable unit 120 can be disposed within the cover 112. The movable unit 120 can rotate within the base 111. The movable unit 120 can rotate within the cover 112. The movable unit 120 can move the blade 140. The movable unit 120 can move together with the blade 140.

[0084] The moving unit 120 may include a second protrusion 121. The second protrusion 121 may project upward from the main body portion of the moving unit 120. The second protrusion 121 may be formed on the upper surface of the main body portion of the moving unit 120. The second protrusion 121 may be coupled to the blade 140. In this way, when the moving unit 120 moves, the blade 140 may also move together.

[0085] The moving unit 120 may include a clearance portion 122. The clearance portion 122 may be formed by recessing into the outer surface of the main body portion of the moving unit 120. The clearance portion 122 may be a region for clearance of a first protrusion 113 of the base 111 when the moving unit 120 moves.

[0086] When the moving unit 120 moves, the blade 140 can pivot relative to the fixed unit 110. The blade 140 can perform rotational and linear motion at the portion where it encounters the fixed unit 110. The blade 140 can perform linear motion at the portion where it encounters the moving unit 120.

[0087] The aperture device 100 may include a drive unit 130. The drive unit 130 can move the moving unit 120. The drive unit 130 can move the blade 140. The drive unit 130 can move the moving unit 120 through electromagnetic interaction. The drive unit 130 may include a magnet 131 and a coil 133.

[0088] The aperture device 100 may include a magnet 131. The drive unit 130 may also include a magnet 131. The magnet 131 may be disposed in the moving unit 120. The magnet 131 may be disposed on the moving unit 120. The magnet 131 may be annular in shape. The magnet 131 may have a shape including an opening. In the magnet 131, the N pole and S pole may be alternately arranged in a circumferential direction. The magnet 131 may be coupled to the moving unit 120. The magnet 131 may be fixed to the moving unit 120. The magnet 131 may be adhered to the moving unit 120 with an adhesive.

[0089] Magnet 131 is movable. Magnet 131 can move by interacting with coil 133. Magnet 131 can move integrally with moving unit 120. Magnet 131 can move together with moving unit 120. Magnet 131 can be disposed on the lower surface of moving unit 120.

[0090] The aperture device 100 may include a substrate 132. The substrate 132 may be disposed within a base 111. The substrate 132 may be disposed on the base 111. The substrate 132 may be disposed between the base 111 and the moving unit 120. A coil 133 may be disposed within the substrate 132. The coil 133 may be formed within the substrate 132. As an example, the coil 133 may be formed as a patterned coil within the substrate 132.

[0091] Substrate 132 can be electrically connected to substrate 270 of lens drive device 200. In this way, substrate 132 can receive power from printed circuit board 50. Although not shown in the figures, substrate 132 of aperture device 100 and substrate 270 of lens drive device 200 can be directly connected. Alternatively, a separate conductive member can be provided to connect substrate 132 of aperture device 100 and substrate 270 of lens drive device 200. As a modified embodiment, substrate 132 of aperture device 100 can be directly connected to printed circuit board 50 without being connected to substrate 270 of lens drive device 200.

[0092] The aperture device 100 may include a coil 133. The driving unit 130 may include a coil 133. The coil 133 may be disposed in the fixing unit 110. The coil 133 may be disposed in the substrate 132. The coil 133 may be coupled to the substrate 132. The coil 133 may be soldered to the substrate 132. The coil 133 may be electrically connected to the substrate 132. The coil 133 may be integrally formed with the substrate 132. The coil 133 may be formed as a patterned coil in the substrate 132. The coil 133 may be disposed in the base 111. The coil 133 may be disposed on the base 111. The coil 133 may be disposed within the cover 112.

[0093] Coil 133 can be positioned corresponding to magnet 131. Coil 133 can overlap with magnet 131. Coil 133 can overlap with magnet 131 along the optical axis. Coil 133 can face magnet 131. Coil 133 can face magnet 131. Coil 133 can interact with magnet 131. Coil 133 can have electromagnetic interaction with magnet 131. When current is applied to coil 133, magnet 131 can be moved through the interaction between the electromagnetic fields of coil 133 and magnet 131. Coil 133 can move magnet 131. When magnet 131 moves, coil 133 can remain relatively fixed.

[0094] As a modified implementation, coil 133 can be disposed in moving unit 120, and magnet 131 can be disposed in fixed unit 110. Coil 133 can move together with moving unit 120, and magnet 131 can be fixed.

[0095] The aperture device 100 may include a sensor 161. The drive unit 130 may include a sensor 161. The sensor 161 may be disposed in the substrate 132. The sensor 161 may be electrically connected to the substrate 132. The sensor 161 may include multiple terminals 162 connected to the substrate 132. The sensor 161 may include four terminals 162 connected to the substrate 132. The sensor 161 may detect a magnet 131. The sensor 161 may be a Hall sensor. The sensor 161 may detect the magnetic force of the magnet 131. The sensor 161 may be disposed at a position corresponding to the magnet 131. The sensor 161 may overlap with the magnet 131 in the optical axis direction. The control of the blade 140 can be fed back in real time by the position of the magnet 131 detected by the sensor 161. That is, the blade 140 can be controlled in real time by the sensor 161.

[0096] Reference Figure 6 A conventional sensor 161 may include multiple terminals 162 connected to a substrate 132. The sensor 161 may include four terminals 162 connected to the substrate 132. The four terminals 162 may be spaced apart from the sensor 161. The sensor 161 and terminals 162 may be soldered onto the substrate 132. The sensor 161 may be connected to wiring 163 and terminals 162. A die connected to the terminals 162 may be formed on the upper surface of the sensor 161. The sensor 161 can be electrically connected via the die. The die of the sensor 161 may refer to the silicon substrate of the sensor chip, and the circuitry and components performing the sensor's function may be integrated within this die. In such a structure, the space for mounting the sensor 161 on the substrate 132 requires consideration of the size of the sensor 161, the size of the soldering area, and the wiring connection space, thus presenting the following problem: limitations on achieving an ultra-thin structure.

[0097] According to this embodiment, the sensor 161 can be disposed in pads 234 formed on the substrate 132. A die can be formed on one surface of the sensor 161, and one surface of the sensor 161 can be disposed facing the substrate 132. The die of the sensor 161 can be disposed facing one surface of the substrate 132. The pads 234 can be formed to correspond to the size of the sensor 161. The pads 234 can be formed to correspond to the die of the sensor 161 in terms of shape. The pads 234 can overlap with the die of the sensor 161 in the optical axis direction. The pads 234 can be anisotropic conductive film (ACF) bonding areas. AFC bonding is a method of electrically connecting electronic components to a substrate through anisotropic conductive film.

[0098] The pads 234 of the substrate 132 can be connected to the patterned coils 235. The sensor 161 can receive power and signals through the patterned coils 235 and the pads 234. The patterned coils 235 may include multiple patterned coils 235 connected to different areas of the pads 234. The number of patterned coils 235 connected to the pads 234 may be the same as the number of dies of the sensor 161.

[0099] In this way, the wiring connection between the sensor and the terminal can be omitted, and the sensor can be mounted on the substrate without soldering between the sensor, the terminal, and the substrate, thereby reducing the thickness caused by wiring connections and soldering.

[0100] Reference Figure 3 The coil 133 may be annular in shape. The coil 133 may include a plurality of coils 133 disposed on the substrate 132 and spaced apart from each other. When the magnet 131 includes regions with 2N polarities, the number of the plurality of coils 133 may be N. Each of the plurality of coils 133 may be annular in shape including a hole region. The radius of curvature of the line connecting the center points obtained by equally dividing the hole regions of the plurality of coils 133 in the radial direction may be the same as the radius of curvature of the opening of the substrate 132.

[0101] The radius of curvature of the inner surface of the hole region of coil 133 in the circumferential direction can be the same as the radius of curvature of the opening of substrate 132. The inner surface of the hole region of coil 133 in the circumferential direction may include a first inner surface more adjacent to the opening of substrate 132 and a second inner surface more adjacent to the outer surface of substrate 132. The radius of curvature of the first inner surface and the second inner surface of the hole region of coil 133 can be the same.

[0102] In the circumferential direction, the length of the second inner surface of the coil 133 may be greater than the length of the first inner surface. In the radial direction, the inner surface of the hole region of the coil 133 may include: a third inner surface connecting the first and second inner surfaces; and a fourth inner surface on the opposite side of the third inner surface. In the radial direction, the lengths of the third and fourth inner surfaces may be the same.

[0103] The center point P obtained by equally dividing the hole regions of the multiple coils 133 in the radial direction can coincide with a point on the circumference of the virtual circle L. The sensor 161 can be positioned at a point on the circumference of the virtual circle L of the coils 133. The center point P obtained by equally dividing the hole regions of the multiple coils 133 in the radial direction and the center of the sensor 161 can be aligned on the circumference of the virtual circle L. The center point P obtained by equally dividing the hole regions of the multiple coils 133 in the radial direction, the center of the sensor 161, and the center of the virtual circle L can all be the same as the center of the opening of the substrate 132.

[0104] Sensor 161 can be positioned adjacent to any one of a plurality of spaced-apart coils. Sensor 161 can be positioned adjacent to any one of two spaced-apart coils. Sensor 161 can be positioned without overlapping coil 133 in the optical axis direction. Sensor 161 can be positioned in an area of ​​the substrate 132 where coil 133 is not located. In this way, design freedom can be ensured by positioning sensor 161 in an area of ​​the substrate 132 where coil 133 is not located.

[0105] Reference Figure 4 The substrate 132 includes a core 135, a first coil layer 136 disposed on one side of the core 135, and a second coil layer 137 disposed on the other side of the core 135. An adhesive 134 may be disposed between the core 135 and the first coil layer 136, and between the core 135 and the second coil layer 137. The adhesive 134 may be a solder resist layer. The solder resist layer may be an area used to protect circuit patterns or coil patterns formed on the substrate 132. The core 135 may be a support member for supporting the first coil layer 136 and the second coil layer 137. The core 135 may be a flexible printed circuit board. The core 135 may be made of polyimide material.

[0106] In a conventional aperture device 100, since the sensor 161 is mounted on the substrate 132 via a solder joint S, there are limitations to achieving an ultra-thin aperture device. When considering the solder joint S region, the thickness 'a' of the sensor 161 mounted on the substrate 132 in the optical axis direction can be approximately 60 μm. The thickness of the substrate 132 in the optical axis direction is the sum of the corresponding thicknesses of the first adhesive region, the first coil layer 136, the core 135, the second coil layer 137, and the second adhesive region from one direction to the other. The first adhesive region can refer to the region between the first coil layer 136 and the upper surface of the substrate 132. The second adhesive region can refer to the region between the second coil layer 137 and the lower surface of the substrate 132. The first adhesive region and the second adhesive region can respectively cover the first coil layer 136 and the second coil layer 137 to prevent them from being exposed to the outside.

[0107] For example, the thickness b of the first adhesive region in the optical axis direction and the thickness f of the second adhesive region in the optical axis direction can be about 10 μm, the thickness c of the first coil layer 136 in the optical axis direction and the thickness e of the second coil layer 137 in the optical axis direction can be about 50 μm, and the thickness d of the core 135 in the optical axis direction can be about 30 μm. That is, the thickness of the substrate 132 including the patterned coil in the optical axis direction can be about 200 μm. The structure of the sensor 161 disposed on the substrate 132 may require an area of ​​about 260 μm in the optical axis direction.

[0108] Reference Figure 5 According to this embodiment, the sensor 161 can be disposed on the core 135 of the substrate 132. This minimizes the length of the area on the substrate 132 where the sensor 161 is disposed in the optical axis direction. The sensor 161 can be disposed within the core 135 of the substrate 132. The substrate 132 may include areas 138 where the adhesive 134 is not disposed on the core 135. A portion of the substrate 132 can be masked to form the area where the sensor 161 is disposed. A portion of the substrate 132 may not be solder masked, allowing the core 135 to be exposed. The substrate 132 can form the area where the sensor 161 is disposed by forming a non-solder mask area 138 in a portion of the substrate.

[0109] exist Figure 5 In the diagram, sensor 161 is shown disposed on one side of core 135, and coil layer is shown formed on the other side of core 135. However, this is for illustrative purposes compared to the conventional arrangement of substrate 132 and sensor 161, and the coil layer may not be formed in the area where sensor 161 is disposed on substrate 132. When sensor 161 is disposed on one side of core 135 of substrate 132, coil 133 may not be disposed on the other side of core 135 where sensor 161 is disposed. The area where sensor 161 is disposed may not overlap with coil 133 in the optical axis direction.

[0110] Sensor 161 can be connected to terminal 162 disposed in core 135. Sensor 161 can be connected to terminal 162 disposed in core 135 via wiring 163. One surface of sensor 161 can be connected to core 135, and the other surface of sensor 161 can be wired to terminal 162. In this way, since sensor 161 and core 135 are not connected by welding, the thickness of sensor 161 disposed on core 135 of substrate 132 in the optical axis direction can be reduced.

[0111] In the optical axis direction, the length of sensor 161 can be greater than the length of terminal 162. Sensor 161 can be configured to face magnet 131. Sensor 161 can be configured not to protrude from the upper surface of substrate 132 by being disposed in core 135 of substrate 132. In this way, physical interference between sensor 161 and magnet 131 can be minimized.

[0112] Reference Figure 8 The coil 133 may include: a first region 133a disposed along the circumferential direction of the magnet 131 and more adjacent to the inner surface of the magnet 131; and a second region 133b more adjacent to the outer surface of the magnet 131. The coil 133 may include: a third region 133c connecting the first region 133a and the second region 133b; and a fourth region 133d on the opposite side of the third region 133c. The aperture region of the coil 133 may overlap with the boundary surface of the regions of the magnet 131 with different polarities in the optical axis direction.

[0113] The first region 133a and the second region 133b of coil 133 can face both the N pole 131A and the S pole 131B of magnet 131. The first region 133a and the second region 133b of coil 133 can overlap with the N pole 131A and the S pole 131B of magnet 131 in the optical axis direction. The first region 133a and the second region 133b of coil 133 can also not face magnet 131. The first region 133a and the second region 133b of coil 133 can also not overlap with magnet 131 in the optical axis direction.

[0114] The third region 133c and the fourth region 133d of coil 133 can face magnet 131. The third region 133c and the fourth region 133d of coil 133 can overlap with magnet 131 in the optical axis direction. The third region 133c and the fourth region 133d of coil 133 can each overlap with regions of magnet 131 of different polarities in the optical axis direction. For example, the third region 133c of coil 133 can overlap with the N pole 131A of magnet 131 in the optical axis direction, and the fourth region 133d of coil 133 can overlap with the S pole 131B of magnet 131 in the optical axis direction.

[0115] When current is applied to coil 133, moving unit 120 can move through electromagnetic interaction with magnet 131. Third region 133c and fourth region 133d of coil 133 are regions capable of generating Lorentz force through electromagnetic interaction with magnet 131. First region 133a and second region 133b of coil 133 are regions that cannot generate Lorentz force because they face either the N pole 131A or the S pole 131B of magnet 131, or they do not face magnet 131.

[0116] When current is applied to coil 133, a Lorentz force is generated through the interaction between the magnetic field generated around coil 133 and the magnetic field of magnet 131. When current is applied to coil 133, moving unit 120 can move due to the Lorentz force. The Lorentz force is proportional to the current intensity flowing through coil 133 and the magnetic field strength generated by coil 133. The magnetic field strength generated by coil 133 is proportional to the number of turns of coil 133. That is, the larger the number of turns of coil 133, the stronger the Lorentz force is generated. The number of turns of coil 133 can be the number of wires in coil 133.

[0117] Reference Figure 9 The first region 133a and the second region 133b, which are regions in coil 133 that do not generate Lorentz force, can be formed into a patterned coil. The number of turns in the first region 133a and the second region 133b can be 1. The first region 133a and the second region 133b, which are formed into a patterned coil, can have a wide cross-sectional area so that the resistance can be reduced as much as possible.

[0118] The Lorentz force can be increased by increasing the number of turns in the third region 133c and the fourth region 133d due to the reduced resistance in the first region 133a and the second region 133b. The third region 133c and the fourth region 133d, which are the regions that generate the Lorentz force in coil 133, can be formed by multiple patterned coils spaced apart from each other. The number of turns in the third region 133c and the fourth region 133d can be multiple. The number of turns in the third region 133c and the fourth region 133d can be approximately 20 turns. This is merely exemplary and not specifically limited thereto.

[0119] The length A of the first region 133a of coil 133 in the first direction can be less than the length B of the third region 133c of coil 133 in the second direction. The length A of the first region 133a of coil 133 in the first direction can be less than the length D of the fourth region 133d of coil 133 in the second direction. The length A of the first region 133a of coil 133 in the first direction can be the same as the sum of the cross-sectional areas of the coil patterns included in the third region 133c of coil 133. That is, although the first region 133a of coil 133 is formed by a single patterned coil, the third region 133c and the fourth region 133d of coil 133 are formed by multiple patterned coils, and therefore require a gap between the individual patterned coils, such that A becomes less than B as described above. The size of the cross-sectional area of ​​a single coil pattern in the first region 133a of coil 133 can be the same as the sum of the cross-sectional areas of each of the multiple patterned coils in the third region 133c of coil 133.

[0120] The length C of the hole region of coil 133 in the second direction can be less than the sum of the length B of the third region 133c of coil 133 in the second direction and the length D of the fourth region 133d of coil 133 in the second direction. In this way, within the finite area where coil 133 is located, the number of turns in the third region 133c and the fourth region 133d of coil 133 can be maximized as much as possible, and a strong Lorentz force can be generated. The length C of the hole region of coil 133 in the longitudinal direction can be the distance between the third region 133c and the fourth region 133d of coil 133. The length C of the hole region of coil 133 in the longitudinal direction can be the shortest distance between the third region 133c and the fourth region 133d of coil 133.

[0121] like Figure 9As shown, when the outermost shape of coil 133 is rectangular, the lengths of the first region 133a and the second region 133b of coil 133 in the first direction can be the same. When the outermost shape of coil 133 is rectangular, the lengths of the first region 133a and the second region 133b of coil 133 in the second direction can be the same. When the outermost shape of coil 133 is rectangular, the lengths of the third region 133c and the fourth region 133d of coil 133 in the first direction can be the same. When the outermost shape of coil 133 is rectangular, the length B of the third region 133c in the second direction and the length D of the fourth region 133d in the second direction can be the same. When the outermost shape of coil 133 is rectangular, the lengths of the first region 133a and the second region 133b of coil 133 in the longitudinal direction can be the same as the sum of the length B of the third region 133c of coil 133 in the second direction, the length D of the fourth region 133d of coil 133 in the second direction, and the length C of the hole region of coil 133 in the second direction.

[0122] like Figure 3 and Figure 8 As shown, when the outermost shape of coil 133 is not rectangular, the lengths of the first region 133a and the second region 133b in the length direction can be different from each other. When the outermost shape of coil 133 is not rectangular, the lengths of the first region 133a and the second region 133b in the direction perpendicular to the length direction can be the same. When the outermost shape of coil 133 is not rectangular, the lengths of the third region 133c and the fourth region 133d in the length direction can be the same. When the outermost shape of coil 133 is rectangular, the lengths of the third region 133c and the fourth region 133d in the direction perpendicular to the length direction can be the same.

[0123] Here, the first direction and the second direction can be perpendicular. The first direction and the second direction can be perpendicular to the optical axis. Figure 5 In this context, assuming the outermost shape of the coil is rectangular, the first and second directions are described as perpendicular to each other, but as... Figure 3 and Figure 8In this configuration, when the outermost shape of the coil is not rectangular, the first direction and the second direction are not perpendicular to each other. The first direction may refer to the vertical direction of the length of the first region 133a and the second region 133b of the coil, and the second direction may refer to the vertical direction of the length of the third region 133c and the fourth region 133d of the coil. Alternatively, the first direction may be the radial direction of the first region 133a and the second region 133b of the coil, and the second direction may be the circumferential direction of the third region 133c and the fourth region 133d of the coil.

[0124] In existing coil patterns, the number of turns in the first region 133a to the fourth region 133d is the same, therefore the lengths A, C, and D are formed to be the same. The coil according to this embodiment can increase the cross-sectional area and reduce the resistance by forming the regions that do not generate Lorentz force into a pattern or a single turn.

[0125] The aperture device 100 may include blades 140. Blades 140 may be light-blocking components. Blades 140 may be mounted on a fixed unit 110. Blades 140 may be mounted on a base 111. Blades 140 may be mounted inside a cover 112. Blades 140 may be mounted on a moving unit 120. Blades 140 may move together with the moving unit 120. That is, when the moving unit 120 moves, the blades 140 can also move together.

[0126] The blade 140 may include a first portion coupled to the fixed unit 110 and a second portion coupled to the moving unit 120. In this way, the blade 140 can pivot relative to the fixed unit 110 when the moving unit 120 moves. The blade 140 may include a first hole into which a first protrusion 113 of the fixed unit 110 is inserted. The blade 140 may include a second hole into which a second protrusion 121 of the moving unit 120 is inserted. The blade 140 can perform rotational and linear motion at the portion where it encounters the fixed unit 110. The blade 140 can also perform linear motion at the portion where it encounters the moving unit 120.

[0127] The aperture device 100 may include an aperture 145. The blades 140 may include an aperture 145 formed by a plurality of blades 140. The size or shape of the aperture 145 may be varied by the plurality of blades 140. Light can pass through the aperture 145.

[0128] The blade 140 may include multiple blades. The blade 140 may include eight blades. In this case, the eight blades 140 may be arranged in two layers, with four blades in each layer. Multiple blades 140 may form holes 145, the size of which changes according to the movement of the moving unit 120. The holes 145 may be formed by the inner surfaces 141 of the multiple blades. The number of blades 140 may be odd. The blade 140 may include six blades. The blade 140 may include 12 blades. The blade 140 may include 6 to 12 blades. The blade 140 may include an inner surface. The inner surface may form holes 145 through which light passes.

[0129] The blade 140 may include an inner surface forming the aperture 145. The inner surface may be an inner surface. The inner surface may include a plurality of arcuate regions and a transition region formed between each of the plurality of arcuate regions.

[0130] In this embodiment, the blade 140 can move when current is applied to the coil 133 of the aperture device 100. That is, the shape of the aperture 145 formed by the blade 140 can be changed by applying current to the coil 133 of the aperture device 100. In other words, the F-number of the aperture device 100 can be changed by applying current to the coil 133.

[0131] The aperture device 100 may include a sphere 150. The sphere 150 may include multiple spheres. The sphere 150 may include four spheres. The sphere 150 may be disposed between the fixed unit 110 and the moving unit 120. The sphere 150 may be disposed between the base 111 and the moving unit 120. The sphere 150 may be disposed within the base 111. The sphere 150 may contact the base 111. The sphere 150 may move along the base 111. The sphere 150 may move along a groove in the base 111.

[0132] A ball 150 can be disposed within the moving unit 120. The ball 150 can contact the moving unit 120. The ball 150 can move along the moving unit 120. The ball 150 can move along a groove in the moving unit 120. The ball 150 can be disposed between a groove in the base 111 and a groove in the moving unit 120. The grooves in the base 111 and the moving unit 120 can be tracks.

[0133] The ball 150 can guide the movement of the moving unit 120 in the circumferential direction. That is, the ball 150 can guide the moving unit 120 to rotate around the optical axis. The ball 150 can restrict the moving unit 120, making movement only around the optical axis possible.

[0134] The aperture device 100 may include a yoke 160. The yoke 160 may be disposed in the fixing unit 110. The yoke 160 may be disposed in the base 111. The yoke 160 may be disposed in the lower plate of the base 111. The yoke 160 may be disposed on the upper surface of the lower plate of the base 111. The yoke 160 may be disposed on the lower surface of the lower plate of the base 111.

[0135] The yoke 160 can be positioned corresponding to the magnet 131. The yoke 160 can overlap with the magnet 131 along the optical axis. An attractive force can act between the yoke 160 and the magnet 131. In this way, pressure can be applied to the ball 150 between the moving unit 120 and the fixed unit 110. Pressure can also be applied to the ball 150 between the moving unit 120 and the base 111 by the attractive force between the yoke 160 and the magnet 131.

[0136] In the following description, the configuration of the camera device according to this embodiment will be described with reference to the accompanying drawings.

[0137] Figure 10 This is a perspective view of the camera device according to this embodiment.

[0138] The camera device 10 may include a lens module. The lens module may include at least one lens. The lens may be positioned corresponding to the image sensor 75. The lens module may include a lens and a lens barrel. The lens module may be coupled to a retainer of the lens drive device 20. The lens module may be coupled to the retainer by screws and / or adhesive. The lens module may be movable integrally with the retainer.

[0139] Camera device 10 may include a filter 30. The filter 30 can function to block light of a specific frequency band passing through the lens module from incident on the image sensor 75. The filter 30 may be configured parallel to the xy plane. The filter 30 may be disposed between the lens module and the image sensor 75. The filter 30 may be disposed in the sensor base 40. As a modified embodiment, the filter 30 may be disposed in the base of the lens driving device 20. The filter 30 may include an infrared filter. The infrared filter can block light in the infrared region from incident on the image sensor 75.

[0140] The camera device 10 may include a sensor base 40. The sensor base 40 may be disposed between the lens drive device 20 and the printed circuit board 50. The sensor base 40 may include a protrusion 41 on which a filter 30 is disposed. An opening may be formed in the portion of the sensor base 40 on which the filter 30 is disposed, so that light passing through the filter 30 can be incident on the image sensor 75.

[0141] The camera device 10 may include a printed circuit board (PCB) 50. The PCB 50 may be a substrate or a circuit board. A lens driving device 20 may be disposed within the PCB 50. A sensor base 40 may be disposed between the PCB 50 and the lens driving device 20. The PCB 50 may be electrically connected to the lens driving device 20. An image sensor 75 may be disposed within the PCB 50. Various circuits, components, controllers, etc., may be disposed on the PCB 50 to convert the image formed on the image sensor 75 into electrical signals and transmit the electrical signals to external devices.

[0142] Camera device 10 may include image sensor 75. Image sensor 75 may be configured such that light incident on lens and filter 30 forms an image. Image sensor 75 may be mounted on printed circuit board 50. Image sensor 75 may be electrically connected to printed circuit board 50. For example, image sensor 75 may be coupled to printed circuit board 50 via surface mount technology (SMT). As another example, image sensor 75 may be coupled to printed circuit board 50 via flip chip technology.

[0143] The image sensor 75 can be configured such that the optical axis of the lens coincides with the optical axis of the image sensor 75. That is, the optical axis of the image sensor 75 and the optical axis of the lens can be aligned. The image sensor 75 can convert light incident on its effective image area into an electrical signal. The image sensor 75 can be any of the following: charge-coupled device (CCD), metal-oxide-semiconductor (MOS), CPD, and CID.

[0144] The camera device 10 may include a motion sensor 70. The motion sensor 70 may be mounted on a printed circuit board 50. The motion sensor 70 may be electrically connected to the control unit 80 via a circuit pattern provided on the printed circuit board 50. The motion sensor 70 may output rotational angular velocity information based on the movement of the camera device 10. The motion sensor 70 may include a 2-axis or 3-axis gyroscope sensor or an angular velocity sensor.

[0145] The camera device 10 may include a control unit 80. The control unit 80 may be disposed in a printed circuit board 50. The control unit 80 may be electrically connected to the coil of the lens drive device 20. The control unit 80 may independently control the direction, intensity, and amplitude of the current supplied to the coil. The control unit 80 may perform autofocus and / or image stabilization functions by controlling the lens drive device 20. Furthermore, the control unit 80 may perform autofocus feedback control and / or image stabilization feedback control on the lens drive device 20.

[0146] The camera device 10 may include a connector 90. The connector 90 may be electrically connected to the printed circuit board 50. The connector 90 may include a port for electrical connection to an external device.

[0147] In the following description, the configuration of the optical device according to this embodiment will be described with reference to the accompanying drawings.

[0148] Figure 11 This is a perspective view of the optical device according to this embodiment.

[0149] Optical device 1 may include at least one of mobile phones, cellular phones, mobile terminals, portable terminals, smartphones, smart boards, portable smart devices, digital cameras, laptop computers, digital broadcasting terminals, personal digital assistants (PDAs), portable multimedia players (PMPs), and navigation devices. Optical device 1 may include any device for capturing video or photographs.

[0150] Optical device 1 may include a main body 2. Optical device 1 may include a camera device 10. Camera device 10 may be mounted on the main body 2. Camera device 10 can capture a subject. Optical device 1 may include a display. The display may be mounted on the main body 2. The display can output at least one of video and images captured by camera device 10. The display may be mounted on a first surface of the main body 2. Camera device 10 may be mounted on at least one of the first surface and a second surface opposite to the first surface of the main body 2. In camera device 10, a triple camera may be arranged in a vertical direction. Alternatively, in camera device 10, a triple camera may be arranged in a horizontal direction.

[0151] Those skilled in the art related to this embodiment will understand that the above description can be implemented in modified forms without departing from the basic characteristics described above. Therefore, the disclosed methods should be considered from an illustrative rather than a limiting perspective. The scope of the invention is shown in the claims rather than in the foregoing description, and all differences within the equivalent scope should be interpreted as included in the invention.

Claims

1. An aperture device, comprising: Fixed unit; A movable unit disposed on the fixed unit; A drive unit that moves the moving unit; as well as Multiple blades forming blade orifices, the size of which changes according to the movement of the moving unit. The driving unit includes a magnet disposed on the moving unit and a coil disposed on the fixed unit. The aperture device includes a sensor for sensing the position of the magnet. The coil comprises a plurality of coils spaced apart from each other, and The sensor is configured to be adjacent to any one of the plurality of coils.

2. The aperture device according to claim 1, in, The coil is annular in shape, including a hole region, and The center point obtained by dividing the hole region of the plurality of coils into equal parts in the radial direction and the center of the sensor are aligned on the circumference of an imaginary circle.

3. The aperture device according to claim 1, in, The fixing unit includes a base plate. Wherein, the coil is formed as a patterned coil on the substrate, and The sensor is mounted on the substrate.

4. The aperture device according to claim 3, in, The substrate includes: a core; a first coil layer disposed on one side of the core; a second coil layer disposed on the other side of the core; and an adhesive disposed between the core and the first coil layer and between the core and the second coil layer. The sensor is mounted on the core.

5. An aperture device, comprising: Fixed unit; A movable unit disposed on the fixed unit; A drive unit that moves the moving unit; as well as Multiple blades forming blade orifices, the size of which changes according to the movement of the moving unit. The driving unit includes a magnet disposed on the moving unit and a coil disposed on the fixed unit. The coil is ring-shaped, including a hole region. The coil includes a first and a second region that do not generate Lorentz force, and a third and a fourth region that generate Lorentz force. The first and second regions form a patterned coil, and the third and fourth regions form multiple patterned coils.

6. The aperture device according to claim 5, in, In the magnet, the N pole and S pole are alternately arranged along the circumferential direction, and The third and fourth regions of the coil are configured to face different poles of the magnet.

7. The aperture device according to claim 5, in, The length of the first region of the coil in the direction perpendicular to the length direction is less than the length of the third region of the coil in the direction perpendicular to the length direction.

8. An aperture device, comprising: Fixed unit; A movable unit disposed on the fixed unit; A drive unit that moves the moving unit; as well as Multiple blades forming blade orifices, the size of which changes according to the movement of the moving unit. The fixing unit includes a substrate. The driving unit includes a magnet disposed on the moving unit and a coil disposed on the substrate. The aperture device includes a sensor for sensing the position of the magnet, and The sensor die is configured to face one surface of the substrate.

9. The aperture device according to claim 8, in, The sensor die is disposed on pads formed on the substrate, and The pad is a region bonded with an anisotropic conductive film (ACF).

10. The aperture device according to claim 9, in, The pads are connected to patterned coils that apply power and signals to the sensor.

Images