Optical microcavity dispersion measurement method based on dispersion line type real-time calibration

Abstract

The invention provides an optical microcavity dispersion measurement method based on dispersion linetype real-time calibration, which is applied to the technical field of microcavity dispersion measurement, and comprises the following steps: converting the position extraction of an optical sideband into the position extraction of a dispersion linetype, and demodulating the optical sideband through a frequency mixer to obtain a sideband harmonic peak of a specific dispersion linetype; adjusting the phase difference between a modulation signal and a demodulation signal of the high-stability radio frequency source, identifying the position of a dispersion line type sideband harmonic peak, and extracting the frequency interval of the sideband harmonic peaks on the two sides of each resonance mode; dynamically calibrating the optical fiber Mach-Zehnder interferometer based on the number of sinusoidal signal cycles in the frequency interval of the dispersion line type sideband resonance peaks on the two sides of each resonance mode to obtain a calibrated Mach-Zehnder interferometer; and generating a dispersion measurement result of the optical microcavity according to the calibrated Mach-Zehnder interferometer interference signal. According to the invention, the dispersion measurement precision and the automation level can be improved.

Description

Technical Field

[0001] This invention relates to the field of microcavity dispersion measurement technology, and in particular to an optical microcavity dispersion measurement method based on real-time calibration of dispersion line shape. Background Technology

[0002] The microcavity dispersion parameter directly affects the phase matching condition for the generation of dissipative Kerr solitons in the microcavity and is a key physical quantity in the generation and control of microcavity optical frequency combs.

[0003] Traditional dispersion measurement methods include: frequency calibration methods based on wavelength meter scanning, which are simple to operate but have limited wavelength resolution and measurement accuracy; interferometry based on mode-locked fiber combs, which have high measurement accuracy but complex systems; spectral measurement methods based on Mach-Zehnder interferometer (MZI) interference structures, which have the advantages of large bandwidth, high accuracy and simple operation, but require pre-calibration of their own dispersion. Traditional dispersion calibration methods rely on HCN gas cells and can only achieve dispersion calibration at specific optical frequencies, making it difficult to meet real-time calibration requirements and requiring stable environments; and sideband detection methods based on electro-optic modulators (EOMs), which have high measurement accuracy but limited modulation bandwidth, making it difficult to meet the requirements of microcavity dispersion measurement over a wide free spectral range.

[0004] It is evident that existing microcavity dispersion measurement techniques cannot simultaneously achieve high precision, wide spectrum, and high measurement speed. Summary of the Invention

[0005] This invention provides an optical microcavity dispersion measurement method based on real-time dispersion line calibration, which solves the shortcomings of existing microcavity dispersion measurement technology in achieving high precision, wide spectrum and high measurement speed at the same time, and improves the dispersion measurement accuracy and automation level.

[0006] This invention provides a method for measuring the dispersion of an optical microcavity based on real-time calibration of dispersive linearity, comprising the following steps: Optical sidebands with fixed frequency intervals are generated on both sides of the resonant peak of the optical microcavity using an electro-optic modulator; the position extraction of the optical sidebands is converted into the position extraction of the dispersive linearity sideband resonant peaks; the optical sidebands are demodulated using a mixer to obtain the dispersive linearity sideband resonant peaks corresponding to the optical sidebands, wherein the frequency interval of the dispersive linearity sideband resonant peaks is consistent with the frequency interval of the optical sidebands; the phase difference between the modulation signal and the demodulation signal of a high-stability RF source is adjusted to identify the position of the dispersive linearity sideband resonant peaks, and the frequency interval of the dispersive linearity sideband resonant peaks on both sides of each resonant mode is extracted; based on the number of sinusoidal signal cycles within the frequency interval of the dispersive linearity sideband resonant peaks on both sides of each resonant mode, a Mach-Zehnder interferometer is dynamically calibrated to obtain a calibrated Mach-Zehnder interferometer; the dispersion measurement result of the optical microcavity is generated based on the interference signal of the calibrated Mach-Zehnder interferometer.

[0007] According to the present invention, an optical microcavity dispersion measurement method based on real-time calibration of dispersion line shape is provided, wherein the method utilizes an electro-optic modulator to generate optical sidebands with fixed frequency intervals on both sides of the resonance peak of the optical microcavity, comprising: driving the electro-optic modulator to generate first-order sidebands with fixed intervals on both sides of the resonance peak of the optical microcavity, wherein the frequency interval of the first-order sidebands is set by a high-stability radio frequency source.

[0008] According to the present invention, an optical microcavity dispersion measurement method based on real-time calibration of dispersion line type includes adjusting the phase difference between the modulation signal and demodulation signal of a high-stability radio frequency source, identifying the position of the dispersion line type sideband resonance peak, and extracting the frequency interval of the dispersion line type sideband resonance peaks on both sides of each resonance mode. This includes: adjusting the phase difference between the modulation signal and demodulation signal of the high-stability radio frequency source until the main peak signal in the dispersion line type sideband resonance peak is completely suppressed; establishing a first time window centered on each resonance mode of the optical microcavity; and identifying the dispersion line type sideband resonance peaks on the left and right sides of the resonance mode within the first time window. The peak position is obtained to obtain the position of the coarsely measured dispersive linear sideband resonance peak; the phase difference is further adjusted until the slope of the dispersive linear sideband resonance peak is maximized, and the window width is set with the position of the coarsely measured dispersive linear sideband resonance peak as the center. A second time window is established with the dispersive linear sideband resonance peak corresponding to the optical sideband as the center. The zero-crossing point position of the dispersive linear sideband resonance peak within the second time window is identified to obtain the position of the finely measured dispersive linear sideband resonance peak on both sides of each resonance mode; based on the position of the finely measured dispersive linear sideband resonance peak, the frequency interval of the dispersive linear sideband resonance peak on both sides of each resonance mode is extracted.

[0009] According to the present invention, an optical microcavity dispersion measurement method based on real-time calibration of dispersion line type is provided. The method involves dynamically calibrating a Mach-Zehnder interferometer based on the number of sinusoidal signal cycles within the frequency interval of the dispersion line type sideband resonant peaks on both sides of each resonant mode. The method includes: establishing a signal peak value axis of the acquired Mach-Zehnder interferometer with the resonant mode corresponding to the target wavelength as the center; determining the number of signal cycles within the frequency interval of the dispersion line type sideband resonant peaks based on the signal peak value axis; determining the signal period of the central peak of the Mach-Zehnder interferometer interference signal based on the ratio of the frequency interval of the dispersion line type sideband resonant peaks to the number of signal cycles; and determining the dispersion parameters of the Mach-Zehnder interferometer based on the signal period of the central peak according to the following formula: ;in, This indicates the magnitude of the signal period at different central peak positions of the calibrated Mach-Zehnder interferometer. The signal period of a Mach-Zehnder interferometer indicates the central interference order. This represents the first-order dispersion coefficient of the interference signal from a Mach-Zehnder interferometer. This represents the number of central peaks in the interference signal of the Mach-Zehnder interferometer; based on the dispersion parameters of the Mach-Zehnder interferometer, the Mach-Zehnder interferometer is dynamically calibrated.

[0010] According to the present invention, an optical microcavity dispersion measurement method based on real-time dispersion line calibration is provided. The step of generating the dispersion measurement result of the optical microcavity based on the calibrated Mach-Zehnder interferometer interference signal includes: establishing a relative frequency axis based on the dispersion parameters of the Mach-Zehnder interferometer and the number of central peaks of the Mach-Zehnder interferometer interference signal; determining the position of each resonant mode on the relative frequency axis; encoding each resonant mode on the relative frequency axis, wherein the central resonant mode is denoted as number 0, the first left-hand resonant mode of the central resonant mode is denoted as number -1, and the first right-hand resonant mode of the central resonant mode is denoted as number 1; averaging the mode spacing between number -1 and number 0 with the mode spacing between number 0 and number 1 to obtain the microcavity free spectral range corresponding to the target wavelength; and establishing an absolute frequency axis by finding the resonant mode corresponding to the target wavelength based on the relative frequency axis and assigning it a corresponding absolute frequency value. : ;in, This represents the absolute frequency corresponding to the central resonant mode. Indicates the resonant mode number, The microcavity's free spectral range is represented; based on the absolute frequency axis, a frequency window is established with the microcavity's free spectral range as the window width to obtain the relative positions of different resonant modes and generate the microcavity's dispersion measurement results.

[0011] This invention also provides an optical microcavity dispersion measurement device based on real-time dispersion line-type calibration, comprising the following modules: a modulation module for generating optical sidebands with fixed frequency intervals on both sides of the resonance peak of the optical microcavity using an electro-optic modulator; a demodulation module for converting the position extraction of the optical sidebands into the position extraction of the dispersion line-type sideband resonance peaks, demodulating the optical sidebands using a mixer to obtain the dispersion line-type sideband resonance peaks corresponding to the optical sidebands, wherein the frequency interval of the dispersion line-type sideband resonance peaks is consistent with the frequency interval of the optical sidebands; and an adjustment module. The system includes a phase difference adjustment module for adjusting the phase difference between the modulation and demodulation signals of a high-stability RF source, identifying the position of the dispersive linear sideband resonant peaks, and extracting the frequency interval of the dispersive linear sideband resonant peaks on both sides of each resonant mode; a calibration module for dynamically calibrating the Mach-Zehnder interferometer based on the number of sinusoidal signal cycles within the frequency interval of the dispersive linear sideband resonant peaks on both sides of each resonant mode, to obtain the calibrated Mach-Zehnder interferometer; and a generation module for generating the dispersion measurement results of the optical microcavity based on the interference signal of the calibrated Mach-Zehnder interferometer.

[0012] The present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the optical microcavity dispersion measurement method based on real-time dispersion line-type calibration as described above.

[0013] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the optical microcavity dispersion measurement method based on real-time dispersion line-type calibration as described above.

[0014] The present invention also provides a computer program product, including a computer program that, when executed by a processor, implements the optical microcavity dispersion measurement method based on real-time dispersion line-type calibration as described above.

[0015] The optical microcavity dispersion measurement method based on real-time calibration of dispersive linear resonant peaks provided by this invention first generates fixed-interval optical sidebands on both sides of the resonance peak through electro-optic modulation, establishing a stable frequency reference for measurement and effectively suppressing disturbances introduced by environmental temperature changes. Next, the traditional optical sideband position extraction is transformed into the position extraction of the dispersive linear resonant peaks. The dispersive linear resonant peaks are obtained using frequency mixing and demodulation techniques; this transformation significantly improves the signal-to-noise ratio and measurement sensitivity. Subsequently, by automatically adjusting the phase difference between the modulation and demodulation signals, the characteristic positions and frequency intervals of the dispersive linear resonant peaks on both sides of each resonance mode can be accurately identified and locked, achieving high-precision, automated pattern recognition. Based on this, the Mach-Zehnder interferometer is dynamically calibrated using information within the frequency intervals of the identified dispersive linear resonant peaks, directly compensating for the drift of its optical frequency reference period and ensuring the long-term stability of subsequent measurements. Finally, the dispersion measurement results generated based on the calibrated interference signal show a systematic improvement in accuracy, stability, and resistance to environmental interference. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced one by one below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0017] Figure 1 This is a flowchart illustrating the optical microcavity dispersion measurement method based on real-time dispersion line calibration provided by the present invention.

[0018] Figure 2 This is a schematic diagram of the simulated microcavity transmission spectrum and its corresponding dispersive line-type sideband resonance peak provided by the present invention.

[0019] Figure 3 This is a schematic diagram of the measured optical microcavity transmission spectrum and its corresponding dispersive line-type sideband resonance peak provided by the present invention.

[0020] Figure 4 This is a schematic diagram of the measured optical microcavity transmission spectrum and its corresponding dispersive line-type sideband resonance peak provided by the present invention.

[0021] Figure 5 This is a schematic diagram illustrating the optical microcavity dispersion curve and soliton frequency comb verification provided by the present invention.

[0022] Figure 6 This is a schematic diagram of the optical microcavity dispersion measurement device based on real-time dispersion line calibration provided by the present invention.

[0023] Figure 7This is a schematic diagram of the physical structure of the electronic device provided by the present invention. Detailed Implementation

[0024] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0025] This invention proposes a real-time MZI calibration method based on dispersion line shape and recognition algorithm, achieving accurate measurement of microcavity dispersion. By generating fixed-frequency sidebands on both sides of the resonant mode through EOM modulation, the corresponding dispersion line shape sideband resonant peaks are obtained through mixer demodulation. The peak positions of these sideband resonant peaks are then determined using a recognition algorithm to form a scale, enabling real-time calibration of MZI dispersion near the resonant peaks of the microcavity whispering-gallery mode, thus achieving microcavity dispersion measurement. This method improves the accuracy and automation level of microcavity dispersion measurement.

[0026] Figure 1 This is a flowchart illustrating the optical microcavity dispersion measurement method based on real-time dispersion line shape calibration provided by the present invention, as shown below. Figure 1 As shown, the method includes the following steps: Step 101: Using an electro-optic modulator, optical sidebands with fixed frequency intervals are generated on both sides of the resonance peak of the optical microcavity.

[0027] In this embodiment of the invention, when the ambient temperature changes, the MZI dispersion is affected, and real-time calibration is performed using EOM sideband fixed intervals.

[0028] When the ambient temperature changes (e.g., exceeding ±0.1℃), a high-precision temperature sensor installed near the microcavity platform will detect and generate an ambient temperature change signal in real time, and transmit the ambient temperature change signal to the central control unit.

[0029] The central control unit triggers the electro-optic modulator (EOM) to operate, generating first-order optical sidebands with fixed intervals on both sides of the laser's main frequency by applying a specific frequency radio frequency signal (provided by a highly stable radio frequency source) to the EOM. These sidebands serve as precise frequency scales, and their frequency intervals are kept stable through a PID feedback locking mechanism. Since the sideband frequency intervals are fixed and unaffected by temperature, a stable reference standard is provided, enabling direct calibration of the MZI interferometer's frequency shift error caused by ambient temperature changes. This replaces the traditional, slow-response gas cell calibration method, achieving real-time calibration of the MZI and solving the problem of dispersion measurement accuracy degradation caused by temperature fluctuations.

[0030] Step 102: The position extraction of the optical sideband is converted into the position extraction of the dispersive linear sideband resonance peak. The optical sideband is demodulated by a mixer to obtain the dispersive linear sideband resonance peak corresponding to the optical sideband.

[0031] The frequency spacing of the dispersive linear sideband resonant peaks is consistent with the frequency spacing of the optical sidebands.

[0032] In this embodiment of the invention, an electro-optic modulator is used to generate first-order sidebands with a fixed interval on both sides of the microcavity resonant peak. The sideband frequency interval is set by a highly stable radio frequency source to ensure the stability of the sideband frequency. Then, a mixer is used to demodulate the corresponding dispersive linear sideband resonant peak, and the frequency interval of the dispersive linear sideband resonant peak is consistent with the sideband interval.

[0033] When the ambient temperature changes, a dynamic calibration method for the frequency interval of the dispersive linear sideband resonant peaks is used to replace the traditional gas cell calibration method. This method corrects the frequency shift error of MZI dispersion caused by changes in ambient temperature in real time, thereby enabling microcavity dispersion measurement based on the calibrated MZI.

[0034] Dispersion line type refers to a signal with dispersion characteristics obtained by mixing and low-pass filtering the microcavity transmission signal and demodulated signal. This is different from the microcavity dispersion measured in this invention. Microcavity dispersion is manifested as the response of the group refractive index to the wavelength of light caused by the microcavity material and structure.

[0035] Step 103: Adjust the phase difference between the modulation signal and demodulation signal of the high-stability RF source, identify the position of the dispersive linear sideband resonant peak, and extract the frequency interval of the dispersive linear sideband resonant peak on both sides of each resonant mode.

[0036] In this embodiment of the invention, the signal output from the high-stability RF source is divided into two independent paths: one path directly drives the electro-optic modulator as a modulation signal, generating sidebands with fixed frequency intervals on both sides of the optical microcavity resonant peak; the other path is connected to the demodulation system through a digital phase shifter. The demodulation system adjusts the phase difference between the two signals in real time through programmed control, so that the dispersion line shape reaches the optimal signal-to-noise ratio. During the adjustment process, it is necessary to focus on suppressing interference from the main peak signal and highlighting the dispersion line shape characteristics corresponding to the sidebands.

[0037] By adjusting the phase difference to completely suppress the main peak in the dispersive linear sideband resonance peak, a time window is established with each resonance mode as the center. An adaptive threshold algorithm is set to identify the peak positions of the dispersive linear sideband resonance peaks on the left and right sides, and the frequency interval of the dispersive linear sideband resonance peaks is initially determined.

[0038] Further fine-tuning the phase difference to maximize the slope of the dispersive linear sideband resonance peak, narrowing the time window based on the coarse measurement position, accurately capturing zero-crossing features, and achieving high-precision linear positioning.

[0039] When extracting frequency intervals, the system automatically records the start and end boundaries of the dispersive linear sideband resonant peaks on both sides of each resonant mode and performs cross-validation using the number of Mach-Zehnder interferometer signal cycles. If a valid signal is not detected on one side, the program will automatically trigger a fault-tolerant mechanism that inverts the signal or gradually lowers the threshold to ensure data integrity. The frequency intervals of the finally extracted dispersive linear sideband resonant peaks will serve as the core input parameter for MZI dynamic calibration.

[0040] refer to Figure 2 , Figure 2 This is a schematic diagram of the simulated microcavity transmission spectrum and its corresponding dispersive line-type sideband resonance peak provided by the present invention.

[0041] The horizontal axis in the figure represents the normalized detuning, indicating the offset of the laser frequency relative to the microcavity resonant frequency. The vertical axis represents the normalized signal amplitude. The figure contains two characteristic curves: the upper blue curve, with a narrow, sharp peak, represents the resonant transmission signal of the optical microcavity, with its peak center corresponding to the precise location of the resonant mode; the lower red curve, with three sharp, alternating peaks and valleys, represents the dispersive signal obtained through phase demodulation, with its zero-crossing point aligned with the center of the resonant mode, and its positive and negative peaks corresponding to the dispersive linear sideband resonant peaks on both sides of the resonant mode.

[0042] refer to Figure 3 , Figure 3 This is a schematic diagram of the measured transmission spectrum of an optical microcavity and its corresponding dispersive sideband resonance peak (Lorentz line type, main peak suppression) provided by this invention. The upper (blue) waveform in the diagram represents the transmission power signal of the optical microcavity. The lower (red) waveform represents the dispersive sideband resonance peak signal obtained after phase demodulation.

[0043] refer to Figure 4 , Figure 4 This is a schematic diagram of the measured transmission spectrum of the optical microcavity and its corresponding dispersive line-type sideband resonance peak (dispersive sideband) provided by this invention. The upper (blue) curve represents the transmission power signal of the optical microcavity. The lower (red) curve represents the dispersive line-type sideband resonance peak signal output after phase demodulation.

[0044] Step 104: Based on the number of sinusoidal signal cycles within the frequency interval of the dispersive linear sideband resonant peaks on both sides of each resonant mode, the Mach-Zehnder interferometer is dynamically calibrated to obtain the calibrated Mach-Zehnder interferometer.

[0045] In this embodiment of the invention, based on the frequency intervals of the dispersive linear sideband resonant peaks determined in the above steps, the Mach-Zehnder interferometer sinusoidal signal within the corresponding frequency interval is automatically extracted. Centered on the resonant mode corresponding to the target wavelength, a peak count axis for the Mach-Zehnder interferometer signal is established, and each interference peak is sequentially numbered to form a continuous signal periodic reference frame. This step converts the time-domain acquired interference signal into a standardized data axis with peak numbers as the unit, providing a structured data foundation for period calculation.

[0046] Based on the precise location of the signal boundary within the frequency interval of the dispersive linear sideband resonant peak, the number of complete sinusoidal signal cycles contained within this interval is calculated. By combining the peak counting method and the sinusoidal fitting method, the integer and fractional parts of the cycle are determined separately, and a high-precision total number of cycles is obtained. The ratio of the known frequency interval of the dispersive linear sideband resonant peak to the calculated number of cycles is the size of the central peak period of the Mach-Zehnder interferometer signal within that frequency interval.

[0047] To ensure the reliability of calibration data, abnormal signal periods and their corresponding central peaks that deviate significantly from the normal range are identified and removed to avoid interference with subsequent dispersive parameter fitting due to transient noise or signal distortion.

[0048] Based on the filtered effective periodic data, the dispersion parameters of the Mach-Zehnder interferometer are determined through linear fitting. The calibrated interferometer signal period can be expressed as a linear function of the peak sequence number, which includes the period of the central interference order and the first-order dispersion coefficient. The resulting calibration relationship will be used to construct an accurate frequency axis, thereby eliminating the interferometer's own dispersion drift error caused by factors such as ambient temperature fluctuations.

[0049] Step 105: Generate the dispersion measurement results of the optical microcavity based on the calibrated Mach-Zehnder interferometer interference signal.

[0050] In this embodiment of the invention, an absolute frequency axis is established based on the calibrated Mach-Zehnder interferometer interference signal. Using the resonant mode corresponding to the target wavelength as a reference point, the peak values ​​of the interference signal throughout the entire scanning range are converted into frequency values ​​through the calibrated frequency-peak index relationship.

[0051] The microcavity resonant modes are then systematically encoded. The central resonant mode is numbered zero as the reference point, the first resonant mode to its left is numbered negative one, the first resonant mode to its right is numbered positive one, and so on, forming a complete mode encoding sequence.

[0052] Next, the free spectral range parameters of the microcavity are calculated. The system selects two modes adjacent to the central resonant mode, calculates the frequency spacing between them and the central mode, and takes the average value as the free spectral range of that wavelength region.

[0053] Based on the obtained free spectral range, microcavity dispersion curves are automatically generated. Taking the generation process of the dispersion curve as an example, a programmed algorithm is used to achieve a complete characterization of the microcavity features. A sliding frequency window is established using the free spectral range, and the frequency offset of each resonant mode relative to an ideally equally spaced distribution is calculated. These offset data points constitute a discrete characterization of the dispersion properties, and a continuous dispersion curve is obtained by fitting a quadratic polynomial.

[0054] The final output includes complete dispersion measurement results, including dispersion curves, free spectral range values, and dispersion coefficients at each order. The entire process achieves fully automated conversion from the original interference signal to dispersion characteristics, significantly improving measurement efficiency and accuracy. This method overcomes the stringent environmental stability requirements of traditional techniques, providing reliable data support for the optimized design of devices such as microcavity optical frequency combs.

[0055] In this invention, optical sidebands with fixed intervals are first generated on both sides of the resonance peak through electro-optic modulation, establishing a stable frequency reference for measurement and effectively suppressing disturbances introduced by changes in ambient temperature. Next, the traditional extraction of optical sideband positions is transformed into the extraction of dispersive linear sideband resonance peak positions. Dispersive linear sideband resonance peaks are obtained using frequency mixing and demodulation techniques; this transformation significantly improves the signal-to-noise ratio and measurement sensitivity. Subsequently, by automatically adjusting the phase difference between the modulation and demodulation signals, the characteristic positions and frequency intervals of the dispersive linear sideband resonance peaks on both sides of each resonance mode can be accurately identified and locked, achieving high-precision, automated pattern recognition. Based on this, the Mach-Zehnder interferometer is dynamically calibrated using information within the frequency intervals of the identified dispersive linear sideband resonance peaks, directly compensating for the drift of its optical frequency reference period and ensuring the long-term stability of subsequent measurements. Finally, the dispersive measurement results generated based on the calibrated interference signal show a systematic improvement in accuracy, stability, and resistance to environmental interference.

[0056] The present invention provides an optical microcavity dispersion measurement method based on real-time dispersion line-type calibration, which utilizes an electro-optic modulator to generate optical sidebands with fixed frequency intervals on both sides of the resonance peak of the optical microcavity, comprising: The driving electro-optic modulator generates first-order sidebands with fixed intervals on both sides of the optical microcavity resonant peak. The frequency interval of the first-order sidebands is set by a highly stable radio frequency source.

[0057] In this embodiment of the invention, an electro-optic modulator is used to generate first-order sidebands with a fixed interval on both sides of the microcavity resonant peak. The sideband frequency interval is set by a highly stable radio frequency source to ensure the stability of the sideband frequency.

[0058] For example, the control unit monitors the ambient temperature in real time using a high-precision temperature sensor. When a temperature change exceeds a set threshold, a calibration mechanism is immediately triggered. The computer sends a command to a highly stable radio frequency source, outputting a radio frequency signal at the target frequency.

[0059] Subsequently, an RF signal is applied to the electro-optic modulator, generating symmetrical first-order sidebands at the laser's main frequency. For precise positioning, real-time feedback is provided via the microcavity transmission spectrum: the left sideband is aligned with the left wing of the current resonance peak, and the right sideband is aligned with the right wing. Once the sideband positions are locked, their fixed intervals serve as an anti-temperature drift optical scale.

[0060] Through this embodiment of the invention, an electro-optic modulator is used to generate first-order sidebands with fixed intervals on both sides of the microcavity resonant peak, providing a foundation for accurate measurement of microcavity dispersion. The fixed-interval sidebands enable more accurate capture of changes in the microcavity resonant peak during the measurement process, thereby improving the measurement accuracy.

[0061] According to the present invention, an optical microcavity dispersion measurement method based on real-time dispersion line-type calibration adjusts the phase difference between the modulation signal and the demodulation signal of a highly stable radio frequency source, identifies the position of the dispersion line-type sideband resonance peak, and extracts the frequency interval of the dispersion line-type sideband resonance peaks on both sides of each resonance mode, including: The phase difference between the modulation signal and demodulation signal of the high-stability RF source is adjusted until the main peak signal in the dispersive linear sideband resonance peak is completely suppressed. The first time window is established with each resonance mode of the optical microcavity as the center. The peak positions of the dispersive linear sideband resonance peaks on the left and right sides of the resonance mode within the first time window are identified to obtain the coarse measurement position of the dispersive linear sideband resonance peak. Continue adjusting the phase difference until the slope of the dispersive linear sideband resonance peak is maximized. Set the window width with the position of the coarsely measured dispersive linear sideband resonance peak as the center, establish a second time window centered on the dispersive linear sideband resonance peak corresponding to the optical sideband, identify the zero-crossing position of the dispersive linear sideband resonance peak within the second time window, and obtain the position of the finely measured dispersive linear sideband resonance peak of the dispersive linear pattern on both sides of each resonance mode. Based on the precise measurement of the position of the dispersive linear sideband resonance peak, the frequency interval of the dispersive linear sideband resonance peak on both sides of each resonance mode is extracted.

[0062] In this embodiment of the invention, in order to further improve the signal-to-noise ratio and enhance measurement accuracy, the optical sideband position extraction is converted into the position extraction of the dispersive linear sideband resonance peak, including: Lorentz fitting of the optical sidebands can be expressed as: in, Indicates the magnitude of the signal amplitude. , These represent the laser frequency and the center frequency of the optical microcavity resonant mode, respectively. The half-width at half-maximum (FWHM) of an optical microcavity resonant mode is also known as the mode linewidth. This represents the offset. According to the formula, Lorentz fitting performs a global fit by collecting data points. The fitting accuracy is related to the mode linewidth, signal-to-noise ratio (SNR), and the number of data points. Its frequency error can be approximated as: in, It represents the number of data points.

[0063] By finding the location of the dispersive linear sideband resonance peak instead of the optical sideband location, the electro-optic modulator is driven to modulate the light field incident on the cavity, which can be expanded into a Bessel function form: in, For modulation depth, For modulation frequency, This represents the initial amplitude of the incident light field. Indicates the angular frequency of the laser. Represents a time variable. This represents the zeroth-order Bessel function, and represents the amplitude coefficient of the modulated carrier component; It is a first-order Bessel function, representing the amplitude coefficient of the first-order sideband; optical microcavity optical field complex amplitude transmittance It can be represented as: ; in, This represents the complex amplitude of the optical field output from the optical microcavity. This represents the complex amplitude of the light field incident on the optical microcavity. This represents the amplitude attenuation coefficient per revolution. Let represent the waveguide transmission coefficient. Then, the output light field after transmission through the cavity can be expressed as: Considering the incident light power is The carrier and sideband optical powers are respectively , Therefore, the optical power received by the photodetector can be expressed as: Among them, the interaction between the two sideband modulated light fields The interaction term between the carrier optical field and the sideband modulated optical field is relatively weak and can be ignored. This characterizes the detuning of the optical field frequency relative to the resonant frequency of the optical microcavity, which is the source of the dispersion line shape. This is achieved through a phase difference with the modulation signal. The demodulated signal is mixed and low-pass filtered to obtain the desired dispersion line shape: in, This indicates the photoelectric conversion efficiency of the photodetector. This represents the final detected dispersive linear voltage signal. and These represent the optical power of the carrier and the sideband in the modulated optical field, respectively. The complex response function representing the transmission characteristics of an optical microcavity, with its real part... With the imaginary part These correspond to the dispersive and absorption components of the signal, respectively, and together determine the linear characteristics of the signal.

[0064] At the resonant frequency Nearby, the dispersion line shape is approximately linear. ,in It's the slope. Assume power noise exists during the measurement process. The resulting frequency error is Therefore, the slope of the dispersion line The larger the value, the greater the frequency measurement error. The smaller; Dispersion line shape depends on the phase difference between the modulating and demodulating signals. Modulation signal power With the power of the demodulated signal and the quality factor of optical microcavities ( Q Therefore, under optimal phase conditions, the slope of the dispersion line can be expressed as: Simultaneously, laser intensity noise is suppressed through mixing and filtering, and the dispersion line shape typically has a higher signal-to-noise ratio, i.e. ; By adjusting the phase difference This method maximizes the slope of the dispersive signal, minimizing frequency measurement error. In contrast, the error of the Lorentz fitting method is limited by linewidth and signal-to-noise ratio, and it is more sensitive to noise. Therefore, when the slope of the dispersive signal is maximized, its measurement accuracy is higher than that of the Lorentz fitting method.

[0065] In some embodiments, preliminary adjustment and coarse positioning of the phase difference are first performed. The system controls the output signal of a highly stable RF source through a program: one path serves as the modulation signal to drive an electro-optic modulator, generating sidebands with fixed frequency intervals on both sides of the resonant peak of the optical microcavity; the other path, adjusted by a digital phase shifter, serves as the demodulation signal. In the initial stage, the phase difference between the modulation signal and the demodulation signal is adjusted to completely suppress the main peak signal in the dispersive linear sideband resonant peak. At this time, the carrier component is minimized, and the characteristics of the dispersive linear sideband resonant peak corresponding to the sideband are highlighted. Subsequently, a first time window is established on the time axis centered on each resonant mode of the optical microcavity. The window width needs to cover the sideband region near the resonant mode to ensure that the complete dispersive linearity can be captured. The system uses an adaptive threshold algorithm to automatically identify the peak positions of the dispersive linear sideband resonant peaks on the left and right sides of the resonant mode within the window. The peak position corresponds to the center frequency of the sideband, thus obtaining the coarsely measured position of the dispersive linear sideband resonant peak. This stage quickly determines the approximate range of the dispersive linear sideband resonant peak, laying the foundation for subsequent fine measurement.

[0066] Next, fine adjustment and precise positioning of the phase difference are performed. Based on the coarse measurement, the phase difference is further adjusted until the slope of the dispersive linear sideband resonance peak reaches its maximum value. At this point, the dispersive linear sideband resonance peak exhibits optimal linear characteristics near the zero-crossing point, minimizing frequency measurement error. Using the peak position obtained from the coarse measurement as the center, a narrower window width is set to establish a second time window. This window focuses on the fine structure of the sideband region, centered on the dispersive linear sideband resonance peak corresponding to the optical sideband. The system accurately identifies the zero-crossing position of the dispersive linear sideband resonance peak within the second time window using a zero-crossing detection algorithm. The zero-crossing point corresponds to the center of the linear interval of the dispersive linear sideband resonance peak, effectively eliminating noise interference and obtaining the precisely measured position of the dispersive linear sideband resonance peak. This stage, by optimizing the signal slope, significantly improves the resolution and reliability of position recognition.

[0067] Finally, the effective frequency intervals of the dispersive linear sideband resonant peaks are extracted based on the precise measurement results. The system automatically records the start and end boundaries of the dispersive linear sideband resonant peaks on both sides of each resonant mode, forming continuous frequency interval data. During the frequency interval extraction process, if the signal-to-noise ratio of a signal on one side is too low, the program will trigger a fault-tolerant mechanism, such as signal inversion or gradual reduction of the threshold, to ensure data integrity. The extracted frequency interval data will be directly used for subsequent dynamic calibration of the Mach-Zehnder interferometer, realizing the automated calculation of microcavity dispersion parameters.

[0068] According to the present invention, an optical microcavity dispersion measurement method based on real-time dispersion line-type calibration is provided. This method dynamically calibrates a Mach-Zehnder interferometer based on the number of sinusoidal signal cycles within the frequency interval of the sideband resonance peaks of the dispersion line-type on both sides of each resonance mode, including: With the resonant mode corresponding to the target wavelength as the center, establish the signal peak axis of the acquired Mach-Zehnder interferometer; Based on the signal peak value axis, determine the number of signal cycles within the frequency interval of the dispersive linear sideband resonant peak; The signal period of the central peak of the Mach-Zehnder interferometer interference signal is determined based on the ratio of the frequency interval of the dispersive linear sideband resonant peak to the number of signal periods. The dispersion parameters of the Mach-Zehnder interferometer are determined based on the signal period magnitude at the center peak using the following formula: ; in, This indicates the magnitude of the signal period at different central peak positions of the calibrated Mach-Zehnder interferometer. The signal period of a Mach-Zehnder interferometer indicates the central interference order. This represents the first-order dispersion coefficient of the interference signal from a Mach-Zehnder interferometer. This indicates the number of central peaks in the Mach-Zehnder interferometer signal; Dynamic calibration of the Mach-Zehnder interferometer is performed based on its dispersion parameters.

[0069] In this embodiment of the invention, a peak axis for the MZI signal is established centered on the resonant mode corresponding to a wavelength of 1550 nm, and the correction period of the MZI signal is calculated within the frequency interval of the corresponding dispersive linear sideband resonant peaks. The frequency interval of adjacent dispersive linear sideband resonant peaks is then... Divide by the number of peak periods within the interval The number of central peaks can then be obtained. Corresponding MZI correction period Substitute into the formula: This can correct the effects of MZI dispersion and establish an accurate frequency axis.

[0070] In some embodiments, using the resonant mode corresponding to a wavelength of 1550 nm as the center, the central resonant mode and the first modes to its left and right are located to obtain the microcavity free spectral range (FSR) corresponding to the center wavelength. A window is established based on the FSR, and... The formula yields the microcavity dispersion. The curve, by performing a quadratic polynomial fitting on the dispersion curve, can be further obtained. , Dispersion coefficient.

[0071] In this embodiment of the invention, spline interpolation and smoothing filtering are performed on the interference signal output by the calibrated Mach-Zehnder interferometer to obtain a periodic interference waveform; the number of interference signal cycles of the periodic interference waveform within the oscilloscope sampling time is determined step by step based on the peak counting method and the sine fitting method.

[0072] In some embodiments, the program automatically selects and removes the deviated signal period and its corresponding central peak value to avoid affecting the subsequent fitting of dispersion parameters.

[0073] Peak identification and numbering are performed on the acquired Mach-Zehnder interferometer interference signals. An automatic identification algorithm extracts all peak points in the interference signal, which are then sequentially numbered according to their time sequence to establish a standardized data framework with the peak numbers as the horizontal axis. This axis construction process transforms the raw time-domain acquired signal into an ordered peak sequence, providing a structured data foundation for subsequent periodic calculations. During axis construction, the system automatically filters out spurious peaks caused by noise, ensuring the accuracy and continuity of the numbering sequence.

[0074] Based on the established signal peak count axis, the system accurately locates the corresponding position on the count axis of the frequency interval boundary of the dispersive linear sideband resonant peak obtained in the previous steps. By calculating the number of complete peak intervals contained within this frequency interval, and combining a sine fitting algorithm to perform fractional compensation on some periods at the boundary, a high-precision total number of signal periods is finally obtained.

[0075] Based on the calculated central peak period, the system uses a linear relationship model to determine the dispersion characteristics of the Mach-Zehnder interferometer. This model reflects the variation of the interferometer signal period with the peak sequence, including the reference period value of the central interference order and the first-order dispersion coefficient characterizing the rate of period change. The system automatically solves for the optimal dispersion parameters by fitting the period data at multiple peak positions using the least squares method. During the parameter determination process, the program intelligently identifies and eliminates outlier data points that significantly deviate from the fitting trend, ensuring the reliability of the parameter calculation results.

[0076] Finally, based on the determined dispersion parameters, the system establishes a calibration function relationship for the Mach-Zehnder interferometer. This function maps the peak indices of the interference signal to precise frequency values, realizing the conversion from relative indices to absolute frequencies. During calibration, the system monitors ambient temperature changes in real time and compensates for frequency errors caused by temperature drift through an adaptive parameter adjustment mechanism. The calibrated Mach-Zehnder interferometer can serve as a high-precision frequency scale, providing an accurate frequency reference for subsequent microcavity dispersion measurements.

[0077] The present invention provides an optical microcavity dispersion measurement method based on real-time dispersion line-type calibration, which generates dispersion measurement results of the optical microcavity according to the calibrated Mach-Zehnder interferometer interference signal, including: The relative frequency axis is established based on the dispersion parameters of the Mach-Zehnder interferometer and the number of central peaks of the Mach-Zehnder interferometer interference signal; Determine the position of each resonant mode on the relative frequency axis, and encode each resonant mode on the relative frequency axis. The center resonant mode is denoted as number 0, the first left resonant mode of the center resonant mode is denoted as number -1, and the first right resonant mode of the center resonant mode is denoted as number 1. The microcavity free spectral range corresponding to the target wavelength is obtained by averaging the mode spacing between number-1 and number 0 and the mode spacing between number 0 and number 1. Based on the relative frequency axis, the resonant modes corresponding to the target wavelength are found and assigned corresponding absolute frequency values ​​to establish the absolute frequency axis. : ; in, This represents the absolute frequency corresponding to the center resonant mode. Indicates the resonant mode number, Indicates the free spectral range of the microcavity; Based on the absolute frequency axis, a frequency window is established with the free spectral range of the microcavity as the window width to obtain the relative positions of different resonant modes and generate the dispersion measurement results of the microcavity.

[0078] In this embodiment of the invention, a relative frequency axis is first established based on the dispersion parameters of the Mach-Zehnder interferometer and the number of central peaks in the Mach-Zehnder interferometer interference signal to determine the specific position of each resonant mode on the relative frequency axis. The center frequencies of all resonant modes are identified using a peak detection algorithm, establishing a complete mode distribution map. Subsequently, an intelligent coding strategy is employed, with the center resonant mode corresponding to the target wavelength as the reference point, numbered zero. The first resonant mode to its left is numbered negative one, the first resonant mode to its right is numbered positive one, and so on, forming a complete integer coding sequence.

[0079] Three adjacent resonant modes, coded as negative one, zero, and positive one, are selected. The frequency spacing between the negative one and zero modes, and between the zero and positive one modes, are calculated respectively. The arithmetic mean of these two spacing values ​​is then used to obtain the free spectral range of the microcavity corresponding to the target wavelength region. This parameter characterizes the basic spectral properties of the microcavity and is a key reference data for dispersion calculation.

[0080] A frequency mapping relationship is established by associating the interferometer signal peak numbers with their corresponding absolute frequency values. Then, the center resonant mode corresponding to the target wavelength is located on the relative frequency axis and assigned a known absolute frequency reference value, thus establishing a complete absolute frequency axis. This absolute frequency axis converts relative measurements into physically meaningful absolute frequency values, ensuring the traceability and accuracy of the measurement results.

[0081] Finally, using the calculated free spectral range as the window width, a sliding frequency window is established on the absolute frequency axis. The frequency shifts of different resonant modes relative to the ideal equally spaced distribution are analyzed; these shift data constitute a discrete characterization of the microcavity dispersion properties. A continuous dispersion curve is generated using a polynomial fitting algorithm, and key parameters such as the dispersion coefficients of each order are output. Throughout the process, cross-validation is performed to ensure the reliability and repeatability of the dispersion measurement results.

[0082] refer to Figure 5 , Figure 5 This is a schematic diagram illustrating the optical microcavity dispersion curve and soliton frequency comb verification provided by this invention. The chart consists of two parts. The upper part compares the experimental data of integral dispersion measured over a wide frequency range (186-198 THz) with the theoretical simulation curve. The two are in high agreement, intuitively demonstrating the high accuracy of this measurement method, and directly extracting the key dispersion parameters (D1 / 2π=24.979GHz, D2 / 2π=69.822kHz). The lower part shows the microcavity frequency comb spectrum and the theoretical fitting curve for the corresponding spectral range.

[0083] Through the embodiments of the present invention, an efficient conversion from the original interference signal to dispersion characteristics is achieved, which significantly improves the accuracy and efficiency of microcavity characterization and provides reliable data support for the optimized design of precision photonic devices such as optical frequency combs.

[0084] The optical microcavity dispersion measurement device based on real-time dispersion line calibration provided by the present invention will be described below. The optical microcavity dispersion measurement device based on real-time dispersion line calibration described below can be referred to in correspondence with the optical microcavity dispersion measurement method based on real-time dispersion line calibration described above.

[0085] refer to Figure 6 , Figure 6 This is a schematic diagram of the optical microcavity dispersion measurement device based on real-time dispersion line calibration provided by the present invention.

[0086] The modulation module 601 is used to generate optical sidebands with fixed frequency intervals on both sides of the resonant peak of the optical microcavity using an electro-optic modulator. The demodulation module 602 is used to convert the position extraction of the optical sideband into the position extraction of the dispersive linear sideband resonance peak. The optical sideband is demodulated by the mixer to obtain the dispersive linear sideband resonance peak corresponding to the optical sideband. The frequency interval of the dispersive linear sideband resonance peak is consistent with the frequency interval of the optical sideband. The adjustment module 603 is used to adjust the phase difference between the modulation signal and the demodulation signal of the high-stability RF source, identify the position of the dispersive linear sideband resonance peak, and extract the frequency interval of the dispersive linear sideband resonance peak on both sides of each resonance mode. The calibration module 604 is used to dynamically calibrate the Mach-Zehnder interferometer based on the number of sinusoidal signal cycles within the frequency interval of the dispersive linear sideband resonant peaks on both sides of each resonant mode, so as to obtain the calibrated Mach-Zehnder interferometer. The generation module 605 is used to generate the dispersion measurement results of the optical microcavity based on the calibrated Mach-Zehnder interferometer interference signal.

[0087] Specifically, the optical microcavity dispersion measurement device based on real-time dispersion line calibration provided by the present invention can realize all the method steps implemented in the above-mentioned embodiment of the optical microcavity dispersion measurement method based on real-time dispersion line calibration, and can achieve the same technical effect. Here, the parts that are the same as those in the method embodiment and the beneficial effects will not be described in detail.

[0088] Figure 7 This is a schematic diagram of the physical structure of the electronic device provided by the present invention, such as... Figure 7As shown, the electronic device may include: a processor 710, a communications interface 720, a memory 730, and a communications bus 740, wherein the processor 710, the communications interface 720, and the memory 730 communicate with each other through the communications bus 740. The processor 710 can call logic instructions in the memory 730 to execute an optical microcavity dispersion measurement method based on real-time dispersion line-type calibration. This method includes: generating optical sidebands with fixed frequency intervals on both sides of the resonant peak of the optical microcavity using an electro-optic modulator; converting the position extraction of the optical sidebands into the position extraction of the dispersion line-type sideband resonant peaks; demodulating the optical sidebands using a mixer to obtain the dispersion line-type sideband resonant peaks corresponding to the optical sidebands, wherein the frequency interval of the dispersion line-type sideband resonant peaks is consistent with the frequency interval of the optical sidebands; adjusting the phase difference between the modulation signal and demodulation signal of the high-stability RF source to identify the position of the dispersion line-type sideband resonant peaks and extracting the frequency interval of the dispersion line-type sideband resonant peaks on both sides of each resonant mode; dynamically calibrating the Mach-Zehnder interferometer based on the number of sinusoidal signal cycles within the frequency interval of the dispersion line-type sideband resonant peaks on both sides of each resonant mode to obtain a calibrated Mach-Zehnder interferometer; and generating the dispersion measurement results of the optical microcavity based on the interference signal of the calibrated Mach-Zehnder interferometer.

[0089] Furthermore, the logical instructions in the aforementioned memory 730 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0090] On the other hand, the present invention also provides a computer program product, which includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can execute the optical microcavity dispersion measurement method based on real-time calibration of dispersion lines provided by the above methods. The method includes: generating optical sidebands with fixed frequency intervals on both sides of the resonance peak of the optical microcavity using an electro-optic modulator; converting the position extraction of the optical sidebands into the position extraction of the resonance peak of the dispersion line sidebands; demodulating the optical sidebands using a mixer to obtain the dispersion lines corresponding to the optical sidebands. The dispersive line-type sideband resonance peaks are identified, with the frequency spacing of the dispersive line-type sideband resonance peaks being consistent with the frequency spacing of the optical sidebands. The phase difference between the modulation and demodulation signals of the high-stability RF source is adjusted to identify the positions of the dispersive line-type sideband resonance peaks, and the frequency spacing of the dispersive line-type sideband resonance peaks on both sides of each resonance mode is extracted. Based on the number of sinusoidal signal cycles within the frequency spacing of the dispersive line-type sideband resonance peaks on both sides of each resonance mode, the Mach-Zehnder interferometer is dynamically calibrated to obtain the calibrated Mach-Zehnder interferometer. The dispersive measurement results of the optical microcavity are generated based on the interference signal of the calibrated Mach-Zehnder interferometer.

[0091] In another aspect, the present invention also provides a non-transitory computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the optical microcavity dispersion measurement method based on real-time dispersion line-type calibration provided by the methods described above. This method includes: generating optical sidebands with fixed frequency intervals on both sides of the resonance peak of the optical microcavity using an electro-optic modulator; converting the position extraction of the optical sidebands into the position extraction of the dispersion line-type sideband resonance peak; demodulating the optical sidebands using a mixer to obtain the dispersion line-type sideband resonance peak corresponding to the optical sidebands, wherein the dispersion... The frequency spacing of the linear sideband resonant peaks is consistent with the frequency spacing of the optical sidebands. The phase difference between the modulation signal and the demodulation signal of the high-stability RF source is adjusted to identify the position of the dispersive linear sideband resonant peaks, and the frequency spacing of the dispersive linear sideband resonant peaks on both sides of each resonant mode is extracted. Based on the number of sinusoidal signal cycles within the frequency spacing of the dispersive linear sideband resonant peaks on both sides of each resonant mode, the Mach-Zehnder interferometer is dynamically calibrated to obtain the calibrated Mach-Zehnder interferometer. The dispersion measurement results of the optical microcavity are generated based on the interference signal of the calibrated Mach-Zehnder interferometer.

[0092] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0093] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., including several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods of various embodiments or some parts of embodiments.

[0094] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. An optical microcavity dispersion measurement method based on real-time dispersion line shape calibration, characterized in that, include: An electro-optic modulator is used to generate optical sidebands with fixed frequency intervals on both sides of the resonance peak of an optical microcavity. The position extraction of the optical sideband is converted into the position extraction of the dispersive linear sideband resonance peak. The optical sideband is demodulated by a mixer to obtain the dispersive linear sideband resonance peak corresponding to the optical sideband. The frequency interval of the dispersive linear sideband resonance peak is consistent with the frequency interval of the optical sideband. Adjust the phase difference between the modulation signal and demodulation signal of the high-stability RF source to identify the position of the dispersive linear sideband resonance peak, and extract the frequency interval of the dispersive linear sideband resonance peak on both sides of each resonance mode. Based on the number of sinusoidal signal cycles within the frequency interval of the dispersive linear sideband resonance peaks on both sides of each resonance mode, the Mach-Zehnder interferometer is dynamically calibrated to obtain the calibrated Mach-Zehnder interferometer. The dispersion measurement results of the optical microcavity are generated based on the interference signal from the calibrated Mach-Zehnder interferometer.

2. The optical microcavity dispersion measurement method based on real-time dispersion line shape calibration according to claim 1, characterized in that, The method of generating optical sidebands with fixed frequency intervals on both sides of the resonance peak of an optical microcavity using an electro-optic modulator includes: The driving electro-optic modulator generates first-order sidebands with fixed intervals on both sides of the optical microcavity resonant peak, and the frequency interval of the first-order sidebands is set by a high-stability radio frequency source.

3. The optical microcavity dispersion measurement method based on real-time dispersion line shape calibration according to claim 1, characterized in that, The adjustment of the phase difference between the modulation signal and demodulation signal of the high-stability RF source, identification of the position of the dispersive linear sideband resonance peak, and extraction of the frequency interval of the dispersive linear sideband resonance peaks on both sides of each resonance mode include: The phase difference between the modulation signal and the demodulation signal of the high-stability RF source is adjusted until the main peak signal in the dispersive linear sideband resonance peak is completely suppressed. A first time window is established with each resonance mode of the optical microcavity as the center. The peak positions of the dispersive linear sideband resonance peaks on the left and right sides of the resonance mode within the first time window are identified to obtain the coarse measurement position of the dispersive linear sideband resonance peak. Continue adjusting the phase difference until the slope of the dispersive linear sideband resonance peak is maximized. Set the window width with the position of the coarsely measured dispersive linear sideband resonance peak as the center, establish a second time window centered on the dispersive linear sideband resonance peak corresponding to the optical sideband, identify the zero-crossing position of the dispersive linear sideband resonance peak within the second time window, and obtain the position of the finely measured dispersive linear sideband resonance peak on both sides of each resonance mode. Based on the precisely measured position of the dispersive linear sideband resonance peak, the frequency interval of the dispersive linear sideband resonance peaks on both sides of each resonance mode is extracted.

4. The optical microcavity dispersion measurement method based on real-time dispersion line shape calibration according to claim 1, characterized in that, The dynamic calibration of the Mach-Zehnder interferometer based on the number of sinusoidal signal cycles within the frequency interval of the dispersive linear sideband resonant peaks on both sides of each resonant mode includes: With the resonant mode corresponding to the target wavelength as the center, establish the signal peak axis of the acquired Mach-Zehnder interferometer; Based on the signal peak value axis, determine the number of signal cycles within the frequency interval of the dispersive linear sideband resonant peak; The signal period of the center peak of the Mach-Zehnder interferometer interference signal is determined based on the ratio of the frequency interval of the dispersive linear sideband resonant peak to the number of signal periods. The dispersion parameters of the Mach-Zehnder interferometer are determined based on the signal period magnitude of the central peak using the following formula: ； in, This indicates the magnitude of the signal period at different central peak positions of the calibrated Mach-Zehnder interferometer. The signal period of a Mach-Zehnder interferometer, representing the central interference order, This represents the first-order dispersion coefficient of the interference signal from a Mach-Zehnder interferometer. This indicates the number of central peaks in the interference signal from the Mach-Zehnder interferometer. The Mach-Zehnder interferometer is dynamically calibrated based on its dispersion parameters.

5. The optical microcavity dispersion measurement method based on real-time dispersion line shape calibration according to claim 4, characterized in that, The step of generating the dispersion measurement results of the optical microcavity based on the calibrated Mach-Zehnder interferometer interference signal includes: A relative frequency axis is established based on the dispersion parameters of the Mach-Zehnder interferometer and the number of central peaks of the interference signal from the Mach-Zehnder interferometer. Determine the position of each resonant mode on the relative frequency axis, and encode each resonant mode on the relative frequency axis, wherein the center resonant mode is denoted as number 0, the first left resonant mode of the center resonant mode is denoted as number -1, and the first right resonant mode of the center resonant mode is denoted as number 1. The microcavity free spectral range corresponding to the target wavelength is obtained by averaging the mode spacing between number-1 and number 0 and the mode spacing between number 0 and number 1. Based on the relative frequency axis, the resonant mode corresponding to the target wavelength is found and assigned a corresponding absolute frequency value to establish the absolute frequency axis. : ； in, This represents the absolute frequency corresponding to the central resonant mode. Indicates the resonant mode number. This indicates the free spectral range of the microcavity; Based on the absolute frequency axis, a frequency window is established with the free spectral range of the microcavity as the window width to obtain the relative positions of different resonant modes and generate the dispersion measurement results of the microcavity.

6. An optical microcavity dispersion measurement device based on real-time dispersion line shape calibration, characterized in that, include: The modulation module is used to generate optical sidebands with fixed frequency intervals on both sides of the resonant peak of the optical microcavity using an electro-optic modulator. The demodulation module is used to convert the position extraction of the optical sideband into the position extraction of the dispersive linear sideband resonance peak, and demodulate the optical sideband through a mixer to obtain the dispersive linear sideband resonance peak corresponding to the optical sideband, wherein the frequency interval of the dispersive linear sideband resonance peak is consistent with the frequency interval of the optical sideband. The adjustment module is used to adjust the phase difference between the modulation signal and the demodulation signal of the high-stability RF source, identify the position of the dispersive linear sideband resonance peak, and extract the frequency interval of the dispersive linear sideband resonance peak on both sides of each resonance mode. The calibration module is used to dynamically calibrate the Mach-Zehnder interferometer based on the number of sinusoidal signal cycles within the frequency interval of the dispersive linear sideband resonant peaks on both sides of each resonant mode, so as to obtain the calibrated Mach-Zehnder interferometer. The generation module is used to generate the dispersion measurement results of the optical microcavity based on the calibrated Mach-Zehnder interferometer interference signal.

7. An electronic device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the computer program, it implements the optical microcavity dispersion measurement method based on real-time dispersion line-type calibration as described in any one of claims 1 to 5.

8. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the optical microcavity dispersion measurement method based on real-time dispersion line-type calibration as described in any one of claims 1 to 5.

9. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the optical microcavity dispersion measurement method based on real-time dispersion line-type calibration as described in any one of claims 1 to 5.

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