An involute-based wire impact testing device and method
The wire impact testing device based on involutes solves the problems of wire clamp versatility and stability, enabling accurate testing and efficient clamping of different wires, improving the accuracy of test data and the service life of the equipment.
Patent Information
- Application Number
- CN202610550872.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-04-24
- Publication Date
- 2026-05-26
AI Technical Summary
Existing wire impact testing fixtures have poor versatility, insufficient clamping stability, and difficulty in ensuring coaxiality, leading to deviations in test data and equipment damage.
An involute-based wire impact testing device is adopted, including a base, a one-way ratchet, an involute winding assembly, a guide mechanism, and a stop assembly. Utilizing the separable center distance and strong contact uniformity of involutes, combined with a locking mechanism and a guide mechanism, it ensures that the wire transmits impact load along the axis without off-center loading or stress shift.
It achieves precise adaptation to wires of different diameters and stiffnesses, reduces test data deviation, improves test repeatability and accuracy, extends equipment lifespan, and simplifies clamping and maintenance processes.
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Abstract
Citation Information
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