Test pin assembly and test fixture

Abstract

The application provides a test needle assembly and a test clamp, relates to the technical field of circuit board testing, and is used for solving the problem of excessive pressure between the probe and the component to be detected due to the movement deviation of the probe and the bending failure of the probe. The test needle assembly comprises a fixing mechanism, a probe assembly and a limiting piece. The limiting piece is provided with a clearance hole penetrating through the limiting piece and is movably connected with the fixing mechanism and can move along a first direction relative to the fixing mechanism. The first direction is the extension direction of the probe assembly. The probe assembly is connected with the fixing mechanism, the probe assembly has a first end and a second end opposite to each other along the first direction, the first end is close to the clearance hole relative to the second end, and the first end is arranged opposite to the clearance hole. The fixing mechanism has a first limiting part, and the limiting piece has a second limiting part. The first limiting part and the second limiting part are used for abutting against each other to limit the movement of the limiting piece towards the second end of the probe assembly. The test needle assembly provided by the application is used for testing the circuit board of an electronic device.

Description

Technical Field

[0001] This application relates to the field of circuit board testing technology, and in particular to a test probe assembly and a test fixture. Background Technology

[0002] With the continuous improvement of people's living standards, electronic devices such as mobile phones and tablets are widely used. Electronic devices generally include circuit boards. During the manufacturing process of electronic devices, testing tools are typically used to test the circuit boards to detect problems such as leakage current.

[0003] Currently, circuit board testing tools generally include two test boards. One test board can be used to set up the circuit board to be tested in the electronic device, and the other test board is equipped with probes. The probes are used to contact the position to be tested on the circuit board, and then the signal output by the testing device connected to the probes is used to determine whether there is leakage on the circuit board.

[0004] However, existing testing tools require the test board with probes to be moved during the testing of circuit boards so that the probes can come into contact with the location to be tested. This can lead to excessive pressure between the probes and the components under test due to deviations in the movement, causing the probes to bend and fail. Summary of the Invention

[0005] This application provides a test probe assembly and a test fixture to solve the problem of excessive pressure between the probe and the component under test due to probe movement deviation, resulting in probe bending and failure.

[0006] To achieve the above objectives, the embodiments of this application adopt the following technical solutions:

[0007] In a first aspect, embodiments of this application provide a test probe assembly, including a fixing mechanism, a probe assembly, and a limiting member. The limiting member has a through-hole and is movably connected to the fixing mechanism, allowing it to move relative to the fixing mechanism along a first direction. The first direction is the extending direction of the probe assembly. The probe assembly is connected to the fixing mechanism and has a first end and a second end opposite to each other along the first direction. The first end is close to the through-hole relative to the second end and is disposed opposite to the through-hole. The fixing mechanism has a first limiting portion, and the limiting member has a second limiting portion. The first and second limiting portions abut against each other to restrict the limiting member from moving towards the second end of the probe assembly.

[0008] The test probe assembly provided in this application embodiment allows for contact between the test probe assembly and the test position of the device under test. A limiting member can abut against the device under test. As the limiting member moves, the first end of the probe assembly gradually extends from the clearance hole of the limiting member and abuts against the test position of the device under test. Simultaneously, when the first and second limiting parts abut against each other, the limiting member cannot move relative to the fixing mechanism, thus preventing the fixing mechanism from continuing to abut. This avoids damage to the probe assembly due to excessive pressure between it and the test position.

[0009] In one possible implementation of the first aspect, the fixing mechanism includes a housing. A mounting cavity is formed inside the housing, and one end of the housing has a first opening communicating with the mounting cavity. The probe assembly passes through the mounting cavity, and the first end of the probe assembly protrudes from the housing through the first opening. A limiting member is movably connected to the housing. Thus, the housing can provide a certain degree of protection for the probe assembly. Furthermore, since the mounting cavity extends through the housing, the first end of the probe assembly is located outside the mounting cavity, allowing the first end of the probe assembly to connect or contact with other components, achieving electrical connection between the probe assembly and other components, thereby realizing the detection function.

[0010] In one possible implementation of the first aspect, the limiting member is fitted onto the end of the housing with the first opening. Thus, the limiting member can be easily fitted onto the outside of the housing by means of the clearance hole in the limiting member.

[0011] In one possible implementation of the first aspect, the housing includes a first peripheral wall surrounding the probe assembly and having a first limiting portion. The limiting member includes a second peripheral wall surrounding the first peripheral wall and having a second limiting portion. Thus, as the limiting member slides relative to the housing along a first direction, the first limiting portion can abut against the second limiting portion, thereby restricting the movement of the limiting member relative to the housing.

[0012] In one possible implementation of the first aspect, a first limiting portion is formed on the side of the first peripheral wall near the second peripheral wall. The second limiting portion is a limiting groove. The first limiting portion is located within the limiting groove, and is slidably connected to the limiting groove along a first direction. Thus, since the first limiting portion is located inside the limiting groove, the sliding connection between the limiting member and the outer shell can also be achieved through the connection between the first limiting portion and the limiting groove. Simultaneously, when the limiting member moves along the first direction, the first limiting portion can abut against the groove wall of the limiting groove, thereby restricting the movement of the limiting member.

[0013] In one possible implementation of the first aspect, the fixing mechanism further includes an elastic element. Along the first direction, the elastic element is located on the side of the limiting member near the second end of the probe assembly. One end of the elastic element is connected to the housing, and the other end is connected to the limiting member. When the first end of the probe assembly is inside the limiting member, the elastic element can be in a normal state or an elastically deformed state. When needed, the limiting member overcomes the elastic force of the elastic element and moves towards the second end of the probe assembly, allowing the probe assembly to extend out of the limiting member. During this process, the elastic deformation of the elastic element gradually increases, and the elastic force applied to the limiting member gradually increases. After use, under the elastic force of the elastic element, the limiting member moves away from the second end, and the first end of the probe assembly can retract back into the limiting member.

[0014] In one possible implementation of the first aspect, the elastic element is a spring. The spring is fitted onto the housing. The spring can generate a spring force that causes the limiting element to move away from the probe assembly. Furthermore, the spring can be directly fitted onto the housing, making installation simple and convenient.

[0015] In one possible implementation of the first aspect, the probe assembly includes an insulating sleeve and multiple probes. The insulating sleeve has multiple independent partition holes. One probe passes through one partition hole. Since multiple probes are directly connected together through the insulating sleeve, the relevant positions of the device under test can be directly detected during testing.

[0016] In one possible implementation of the first aspect, the probe assembly further includes an adapter circuit board. The adapter circuit board is located on the side of the housing near the second end of the probe assembly and is connected to the housing. The adapter circuit board is electrically connected to the second end of the probe assembly. Thus, the probe assembly is electrically connected to the output port via the adapter circuit board.

[0017] In one possible implementation of the first aspect, a blocking portion is formed on the inner wall of the mounting cavity. A portion of the probe assembly is located on the side of the blocking portion near the adapter circuit board and abuts against the blocking portion. The other end of the housing has a second opening communicating with the mounting cavity, at least a portion of the adapter circuit board covers the second opening, and a portion of the probe assembly abuts against the side of the adapter circuit board near the housing. The blocking portion can restrict movement of the probe assembly away from the adapter circuit board. The adapter circuit board can restrict movement of the probe assembly towards the adapter circuit board, thereby allowing the probe assembly to be fixed inside the housing 312.

[0018] Secondly, embodiments of this application provide a test fixture, including any of the test probe assemblies described in the first aspect.

[0019] Since the test fixture provided in this application includes any of the test probe components in the first aspect, it can solve the same technical problems as the test probe components described above and achieve the same technical effects, so it will not be described again here.

[0020] In one possible implementation of the second aspect, the test fixture further includes a first test bracket and a second test bracket. The first test bracket is used to hold the device under test. The test probe assembly is detachably connected to the second test bracket. Because the test probe assembly is detachably connected to the second test bracket, when the test probe assembly is damaged and needs to be replaced, the damaged test probe assembly can be directly removed and a new test probe assembly can be replaced without replacing the second test bracket, making testing more convenient.

[0021] In one possible implementation of the second aspect, the test fixture further includes an interface assembly and an adapter cable assembly. The interface assembly is connected to the first test bracket. One end of the adapter cable assembly is detachably connected to the interface assembly, and the other end is used to connect to the testing equipment.

[0022] In one possible implementation of the second aspect, the adapter cable assembly includes an adapter port, an adapter cable, and an adapter mechanism. The adapter port is detachably connected to the interface assembly. One end of the adapter cable connects to the adapter port, and the other end connects to the adapter mechanism. The adapter mechanism is used to connect to testing equipment. The interface assembly can transmit signals through the adapter cable assembly, transferring the signal of the device under test to the external testing equipment. Because the adapter cable assembly and the interface assembly are detachably connected, when the adapter cable assembly needs to be replaced, it can simply be detached.

[0023] In one possible implementation of the second aspect, the test fixture further includes a mounting component. The mounting component is mounted on the first test bracket. The interface component snaps into the mounting component. The interface component can be mounted on the first test bracket via the mounting component. Furthermore, since the interface component and the mounting component are connected via a snap-fit ​​mechanism, installation and removal are relatively convenient.

[0024] In one possible implementation of the second aspect, the mounting component has a mounting slot. A portion of the interface component is located within the mounting slot and engages with it. By placing a portion of the interface component within the mounting slot, the connection between the mounting component and the interface component can be achieved, making the connection convenient. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the structure of a test fixture provided in an embodiment of this application;

[0026] Figure 2 for Figure 1 Exploded view of the test fixture shown;

[0027] Figure 3 This is a schematic diagram of the structure of a test probe assembly provided in an embodiment of this application;

[0028] Figure 4 for Figure 3 The test probe assembly shown is a bottom view.

[0029] Figure 5 for Figure 3 An exploded view of the test probe assembly shown.

[0030] Figure 6 A schematic diagram showing the structure where the first limiting part is located at the top of the second limiting part;

[0031] Figure 7 A schematic diagram showing the structure where the first limiting part is located at the bottom of the second limiting part;

[0032] Figure 8 for Figure 7 A cross-sectional view of the test probe assembly shown;

[0033] Figure 9 This is a schematic diagram of the structure of a mounting base provided in an embodiment of this application;

[0034] Figure 10 This is a schematic diagram of the structure when the outer casing is installed on the mounting base;

[0035] Figure 11 for Figure 3 Top view of the test probe assembly shown;

[0036] Figure 12 This is a schematic diagram of the structure of a probe assembly provided in an embodiment of this application;

[0037] Figure 13 for Figure 12 The diagram shows the probe assembly from another angle.

[0038] Figure 14 A schematic diagram showing the structure when the interface components and adapter cable components are plugged in;

[0039] Figure 15 A schematic diagram of the structure when the interface component and the installation component are separated;

[0040] Figure 16 for Figure 14 The exploded view of the device shown.

[0041] Figure label:

[0042] 100-Test fixture; 10-First test bracket; 101-Detection position; 20-Second test bracket; 21-Output port; 22-Adapter pin assembly; 30-Test pin assembly; 31-Fixing mechanism; 311-First limiting part; 312-Outer shell; 3121-Mounting cavity; 3122-First peripheral wall; 31221-Elastic part; 31222-First opening; 31223-Second opening; 3123-Main body; 31231-Groove; 31232-Blocking part; 3124-Connecting part; 313-Mounting base; 3131-Mounting hole; 3132-Limiting hole; 314-First fastener; 315-Adapter circuit board; 316-Second fastener; 317-Elastic element; 32-Probe assembly; 321-Insulating sleeve; 3211-Insulating sleeve body; 3212-Insulating cover plate; 3213-Separation hole; 3214-Opening; 322-Probe; 33-Limiting component; 331-Allowing hole; 332-Second limiting part; 333-Second peripheral wall; 40-Interface assembly; 401-Snap-fit ​​part; 50-Adapter cable assembly; 51-Adapter cable; 52-Adapter port; 53-Probe adapter mechanism; 531-Adapter base; 532-Adapter conductive component; 60-Mounting assembly; 601-Mounting groove; 602-Snap-fit ​​hole; 61-First mounting component; 62-Second mounting component; 621-Separating plate; 622-Support block; 63-Third mounting component; 631-Slide groove; 64-Mounting plate; 65-Third fastener. Detailed Implementation

[0043] In the embodiments of this application, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation" and "connection" should be interpreted broadly. For example, "connection" can be a detachable connection or a non-detachable connection; it can be a direct connection or an indirect connection through an intermediate medium.

[0044] In the embodiments of this application, it should be understood that the directional terms mentioned, such as "up", "down", "left", "right", "inner", "outer", etc., are only for reference to the direction of the accompanying drawings. Therefore, the directional terms used are for better and clearer explanation and understanding of the embodiments of this application, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.

[0045] In the embodiments of this application, the terms "first," "second," "third," and "fourth" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined with "first," "second," "third," and "fourth" may explicitly or implicitly include one or more of that feature.

[0046] In embodiments of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0047] In the embodiments of this application, "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects have an "or" relationship.

[0048] In the embodiments of this application, it should be noted that the descriptions of "vertical" and "parallel" respectively indicate approximately vertical and approximately parallel within a certain error range. This error range can be a range with a deviation angle of less than or equal to 5°, 8° or 10° relative to absolute verticality and absolute parallelism, respectively, and is not specifically limited here.

[0049] This application provides a test fixture that can test the circuit boards of electronic devices such as mobile phones and tablets. For example, this test fixture can be used to perform leakage current testing on the battery holder on the motherboard of a mobile phone to detect whether there is a leakage problem in the battery holder.

[0050] like Figure 1 As shown, Figure 1 This is a schematic diagram of a test fixture 100 provided in an embodiment of this application. The test fixture 100 may include a first test support 10, a second test support 20, and a test probe assembly 30. The first test support 10 can be used to place the device to be tested.

[0051] For example, such as Figure 2 As shown, Figure 2 for Figure 1 The exploded view of the test fixture 100 shown shows that a detection position 101 can be designed on one side of the first test bracket 10 (i.e., Figure 2 The frame-shaped area shown on the first test bracket 10 allows the bare mobile phone to be tested to be placed at the test position 101 and kept fixed to prevent the device under test from moving on the first test bracket 10.

[0052] In addition, such as Figure 2As shown, the first test bracket 10 can be designed with multiple detection positions 101. In this way, the first test bracket 10 can simultaneously set up multiple devices under test and test multiple devices under test at the same time, thereby improving testing efficiency.

[0053] The test probe assembly 30 can be used for leakage current testing. When testing the device under test using the test fixture 100, the second test bracket 20 can be moved so that the test probe assembly 30 on the second test bracket 20 contacts the testing position on the device under test for testing. For example, as shown... Figure 2 As shown, the second test bracket 20 can be located above the first test bracket 10. The second test bracket 20 can gradually move downward to approach the first test bracket 10, so that the test probe assembly 30 can contact the device under test on the first test bracket 10.

[0054] To facilitate disassembly of the test probe assembly 30, in some embodiments, the test probe assembly 30 can be detachably connected to the second test bracket 20. This means that when the test probe assembly 30 is detachably connected to the second test bracket 20 and needs replacement, the damaged test probe assembly 30 can be directly removed and replaced with a new one, without needing to replace the second test bracket 20, making testing more convenient. Of course, in other embodiments, the test probe assembly 30 can also be fixed to the second test bracket 20. For example, the test probe assembly 30 can also be soldered to the second test bracket 20.

[0055] In order to input test signals to the test probe assembly 30, such as Figure 2 As shown, an output port 21 can be installed on the second test bracket 20, and the test probe assembly 30 can be electrically connected to the output port 21. The output port 21 can be connected to external testing equipment.

[0056] For example, when using the test fixture 100 for testing, the external device outputs an electrical signal, which is transmitted to the test probe assembly through the output port 21. The test probe assembly 30 transmits the signal to the test position of the device under test, and then transmits the electrical signal back to the testing device. The testing device can determine the test result by comparing parameters such as the strength of the received and transmitted electrical signals, and determine whether there is a leakage.

[0057] Continue to refer to Figure 2In some embodiments, the test fixture 100 may further include an interface component 40. The interface component 40 may be connected to the first test bracket 10. The interface component 40 may be electrically connected to the port of the device under test. For example, the interface component 40 may be connected to the charging port of the device under test (e.g., a bare mobile phone), and the device under test can transmit electrical signals through the interface component 40 to achieve charging and information transmission.

[0058] In addition, such as Figure 2 As shown, in some embodiments, such as Figure 2 As shown, the test fixture 100 may further include an adapter cable assembly 50. One end of the adapter cable assembly 50 can be detachably connected to the interface assembly 40, and the other end of the adapter cable assembly 50 can be used for electrical connection to the testing equipment. Thus, the interface assembly 40 can transmit signals through the adapter cable assembly 50, transmitting the signals of the device under test to the external testing equipment.

[0059] Because the adapter cable assembly 50 is detachably connected to the interface assembly 40, when it is necessary to replace the adapter cable assembly 50, it can be directly removed, which is more convenient than soldering the adapter cable assembly 50 directly onto the interface assembly 40.

[0060] To facilitate the electrical connection between the adapter cable assembly 50 and the testing equipment, such as Figure 2 As shown, in some embodiments, the second test bracket 20 may also be provided with an adapter pin assembly 22. The adapter pin assembly 22 can be electrically connected to the adapter cable assembly 50 and to the output port 21. For example, as... Figure 2 As shown, the adapter pin assembly 22 can be positioned opposite to a portion of the adapter cable assembly 50. As the second test bracket 20 gradually moves downward toward the first test bracket 10, the adapter pin assembly 22 can come into contact with the adapter cable assembly 50 to achieve electrical connection.

[0061] Therefore, the signal received at interface component 40 can be transmitted through adapter cable assembly 50 to adapter pin group 22, and from adapter pin group 22 to output port 21, and finally received by external testing equipment. Of course, in other embodiments, adapter cable assembly 50 can also be directly electrically connected to output port 21 or external testing equipment.

[0062] The test probe assembly 30 provided in the embodiments of this application will be further described below. For example... Figure 3 As shown, Figure 3This is a schematic diagram of a test probe assembly 30 provided in an embodiment of this application. The test probe assembly 30 may include a fixing mechanism 31, a probe assembly 32, and a limiting member 33. The probe assembly 32 can be connected to the fixing mechanism 31. The fixing mechanism 31 can be mounted on the second test bracket 20. Figure 2 The probe assembly 32 can be installed and fixed by the fixing mechanism 31, which facilitates the installation of the probe assembly 32.

[0063] It is understandable that the installation method of the fixing mechanism 31 and the second test bracket 20 can be selected according to the actual situation. For example, the fixing mechanism 31 can be installed on the second test bracket 20 with screws. Alternatively, the fixing mechanism 31 can also be directly snapped onto the second test bracket 20.

[0064] Reference Figure 3 and Figure 4 As shown, Figure 4 for Figure 3 The bottom view of the test probe assembly 30 shown indicates that the limiting member 33 has a through-hole 331 and is movably connected to the fixing mechanism 31. The limiting member 33 can move relative to the fixing mechanism 31 along a first direction. The first direction is the extension direction of the probe assembly 32 (i.e., the direction of extension). Figure 3 (The up and down directions are shown).

[0065] The probe assembly 32 has a first end opposite to the first end along the first direction (i.e. Figure 3 The lower end of the probe assembly 32) and the second end (i.e. Figure 3 The upper end of the probe assembly 32 is located near the clearance hole 331 relative to the second end, and is positioned opposite to the clearance hole 331. Thus, when the limiting member 33 moves along the first direction, the first end of the probe assembly 32 can pass through the clearance hole 331 and abut against the detection position of the device to be tested.

[0066] like Figure 3 As shown, the fixing mechanism 31 has a first limiting portion 311. The limiting member 33 has a second limiting portion 332. The first limiting portion 311 and the second limiting portion 332 can be used to abut against each other to restrict the movement of the limiting member 33 toward the second end.

[0067] Therefore, when the test probe assembly 30 comes into contact with the test position of the device under test, the limiting member 33 can first abut against the device under test. As the limiting member 33 moves, the first end of the probe assembly 32 can gradually extend from the clearance hole 331 of the limiting member 33 and abut against the test position of the device under test. At the same time, when the first limiting part 311 and the second limiting part 332 abut against each other, the limiting member 33 cannot move relative to the fixing mechanism 31, thereby preventing the fixing mechanism 31 from continuing to abut, thus avoiding the problem of the probe assembly 32 being damaged due to excessive pressure between it and the test position.

[0068] Furthermore, it is understood that the positional relationship between the probe assembly 32 and the limiting member 33 during the movement of the limiting member 33 can be designed according to the actual situation. For example, when the first limiting part 311 and the second limiting part 332 abut against each other and the limiting member 33 cannot move relative to the fixing mechanism 31, one end of the probe assembly 32 extends out of the clearance hole 331, and the length of its extension can be designed according to the actual situation.

[0069] In some embodiments, such as Figure 5 As shown, Figure 5 for Figure 3 The exploded view of the test probe assembly 30 shown indicates that the fixing mechanism 31 may include a housing 312. A mounting cavity 3121 may be formed inside the housing 312, and one end of the housing 312 has a first opening 31222 communicating with the mounting cavity 3121. Figure 8 The probe assembly 32 can be inserted into the mounting cavity 3121, and the first end of the probe assembly 32 extends out of the housing through the first opening 31222. The limiting member 33 can be movably connected to the housing 312.

[0070] In this way, the outer shell 312 can provide a certain degree of protection for the probe assembly 32. In addition, since the mounting cavity 3121 penetrates the outer shell 312, the first end of the probe assembly 32 is located outside the mounting cavity 3121. The first end of the probe assembly 32 can be connected or contacted with other components to realize the electrical connection between the probe assembly 32 and other components, thereby realizing the detection function.

[0071] It is understood that the limiting member 33 can be connected to the housing 312 in different ways, such as in some embodiments. Figure 3 As shown, the limiting member 33 can be sleeved on the end of the outer shell 312 that has the first opening 31222. In this way, the limiting member 33 can be easily sleeved on the outside of the outer shell 312 by means of the clearance hole 331 of the limiting member 33. Of course, in some other embodiments, the limiting member 33 can also be located inside the outer shell 312 and movably connected to the outer shell 312.

[0072] like Figure 5As shown, the housing 312 may include a first peripheral wall 3122. The first peripheral wall 3122 may be disposed around the probe assembly 32. The limiting member 33 has a second peripheral wall 333. When the limiting member 33 is mounted on the outside of the housing 312, the second peripheral wall 333 is disposed around the first peripheral wall 3122. Based on this, in some embodiments, the first peripheral wall 3122 may have a first limiting portion 311. The second peripheral wall 333 may have a second limiting portion 332. In this way, when the limiting member 33 slides relative to the housing 312 along the first direction X, the first limiting portion 311 may abut against the second limiting portion 332, thereby limiting the movement of the limiting member 33 relative to the housing 312.

[0073] The specific forms of the first limiting part 311 and the second limiting part 332 can be varied. In some embodiments, such as Figure 5 As shown, a first limiting portion 311 may be formed on the side of the first peripheral wall 3122 near the second peripheral wall 333. The second limiting portion 332 may be a limiting groove. The first limiting portion 311 may be located in the limiting groove and slidably connected to the limiting groove along the first direction X.

[0074] Thus, since the first limiting part 311 is located inside the limiting groove, the sliding connection between the limiting member 33 and the outer shell 312 can also be achieved through the connection between the first limiting part 311 and the limiting groove. At the same time, when the limiting member 33 moves along the first direction X, the first limiting part 311 can abut against the groove wall of the limiting groove, thereby restricting the movement of the limiting member 33.

[0075] For example, such as Figure 6 As shown, Figure 6 This is a schematic diagram of the structure where the first limiting part 311 is located at the top of the second limiting part 332. When the first limiting part 311 is located at the top of the second limiting part 332, the bottom end of the probe assembly 32 can be inside the limiting member 33, which plays a protective role.

[0076] like Figure 7 As shown, Figure 7 This is a schematic diagram showing the structure of the first limiting part 311 located at the bottom of the second limiting part 332. When detection is required using the probe assembly 32, the limiting member 33 can move upward relative to the outer shell 312, eventually abutting against the top of the second limiting part 332. At this time, as... Figure 8 As shown, Figure 8 for Figure 7 The cross-sectional view of the test probe assembly 30 shown shows that the bottom end of the probe assembly 32 gradually protrudes from the limiting member 33 and extends a portion of the limiting member 33.

[0077] based on Figure 7The sliding stroke of the first limiting part 311 within the limiting groove can be designed according to actual conditions. In some embodiments, the size h of the limiting groove along the first direction X can be less than or equal to 4 mm, that is, the movement stroke of the first limiting part 311 along the first direction X can be less than or equal to 4 mm.

[0078] In some embodiments, the number of first limiting portions 311 and limiting grooves can be multiple. Multiple first limiting portions 311 are spaced apart circumferentially along the first peripheral wall 3122, and limiting grooves are spaced apart circumferentially along the second peripheral wall 333. One first limiting portion 311 is located within one limiting groove. Thus, through the mutual cooperation between multiple first limiting portions 311 and limiting grooves, the connection between the housing 312 and the limiting member 33 can be more reliable. For example, the number of first limiting portions 311 and limiting grooves can be two. Of course, the number of first limiting portions 311 and limiting grooves can also be other, and the specific design can be tailored to the actual situation.

[0079] Of course, the first limiting part 311 and the second limiting part 332 can also be in other forms, as long as they can abut against each other and restrict the movement of the limiting member 33. In some other embodiments, the first limiting part 311 can be formed on the side of the first peripheral wall 3122 near the second peripheral wall 333. The second limiting part 332 can be formed on the side of the second peripheral wall 333 near the first peripheral wall 3122. Both the first limiting part 311 and the second limiting part 332 can be protruding structures. Furthermore, the first limiting part 311 and the second limiting part 332 are disposed opposite to each other along the first direction X.

[0080] In this way, during the movement of the limiting member 33 relative to the outer shell 312, the first limiting part 311 and the second limiting part 332 can abut against each other to restrict the movement of the limiting member 33.

[0081] Alternatively, in some embodiments, the first limiting portion 311 can be a limiting groove. A second limiting portion 332 is formed on the side of the second peripheral wall 333 near the first peripheral wall 3122. The second limiting portion 332 can be located within the limiting groove. In this way, when the limiting member 33 moves, the movement of the limiting member 33 can be restricted when the second limiting portion 332 abuts against the limiting groove.

[0082] In addition, such as Figure 5 As shown, an elastic portion 31221 is formed on the first peripheral wall 3122. The elastic portion 31221 has a free end that is suspended. A first limiting portion 311 is formed at the free end of the elastic portion 31221. When the second limiting portion 332 is a limiting groove, because the free end of the elastic portion 31221 is suspended, the elastic portion 31221 can deform, making it easier to install or separate the first limiting portion 311 from the limiting groove.

[0083] In some embodiments, such as Figure 5 As shown, the fixing mechanism 31 may further include a mounting base 313. The mounting base 313 can be used to connect with the second test bracket 20 ( Figure 2 As described above, the test probe assembly 30 can be detachably connected to the second test bracket 20. This detachable connection between the mounting base 313 and the second test bracket 20 is achieved through... Figure 9 As shown, Figure 9 This is a schematic diagram of the structure of a mounting base 313 provided in an embodiment of this application. The mounting base 313 may have a mounting hole 3131.

[0084] At the same time, such as Figure 10 As shown, Figure 10 This is a structural diagram showing the housing 312 installed on the mounting base 313. The fixing mechanism 31 may further include a first fastener 314. The first fastener 314 may pass through the mounting hole 3131 and connect with the second test bracket 20 (…). Figure 2 ) Threaded connection. In this way, the mounting base 313 can be installed on the second test bracket 20 by the first fastener 314, thereby realizing the installation and fixation of the test probe assembly 30.

[0085] like Figure 9 As shown, the mounting base 313 also has a limiting hole 3132, and the limiting hole 3132 penetrates through the mounting base 313. Meanwhile, as... Figure 10 As shown, the housing 312 may include a main body portion 3123 and a connecting portion 3124 that are connected to each other. The connecting portion 3124 passes through the limiting hole 3132, and the main body portion 3123 is located on one side of the mounting base 313.

[0086] In some embodiments, such as Figure 10 As shown, grooves 31231 can be formed on opposite sides of the main body 3123. Simultaneously, two first fasteners 314 are mounted on the mounting base 313. The two first fasteners 314 are respectively located within the grooves 31231. Thus, the grooves 31231 can serve to limit and avoid movement.

[0087] like Figure 8 As shown, the fixing mechanism 31 may further include an adapter circuit board 315. The adapter circuit board 315 may be located at the second end of the housing 312 near the probe assembly 32 (i.e., Figure 8 One side of the upper end of the probe assembly 32 is electrically connected to the second end and to the housing 312. Thus, the probe assembly 32 is electrically connected to the output port 21 via the adapter circuit board 315. For example, the adapter circuit board 315 can be connected to the output port 21 by wire bonding.

[0088] To achieve the connection between the adapter circuit board 315 and the housing 312 in some embodiments, such as Figure 8 and Figure 11 As shown, Figure 11 for Figure 3 The top view of the test probe assembly 30 shown indicates that the fixing mechanism 31 may further include a second fastener 316. The second fastener 316 may pass through the adapter circuit board 315 and be connected to the housing 312. Thus, the housing 312 can be mounted on the mounting base 313, and then mounted on the second test bracket 20 using the mounting base 313.

[0089] For example, the second fastener 316 can pass through the adapter circuit board 315 and the main body 3123, and be threadedly connected to the mounting base 313. Thus, the connection between the adapter circuit board 315, the housing 312, and the mounting base 313 can be completed by the second fastener 316.

[0090] To allow the probe assembly 32 to be fixed inside the housing. For example... Figure 10 As shown, a blocking portion 31232 may be formed on the inner wall of the mounting cavity 3121. A portion of the probe assembly 32 may be located near the adapter circuit board 315 within the blocking portion 31232. Figure 8 On one side of the probe assembly 32. In this way, the blocking part 31232 can restrict the movement of the probe assembly 32 away from the adapter circuit board 315.

[0091] At the same time, such as Figure 8 As shown, the other end of the outer casing 312 is provided with a mounting cavity 3121 ( Figure 5 The second opening 31223 is connected, and at least a portion of the adapter circuit board 315 covers the second opening 31223. A portion of the probe assembly 32 abuts against the side of the adapter circuit board 315 near the housing 312. In this way, the adapter circuit board 315 can restrict the movement of the probe assembly 32 toward the direction of the adapter circuit board 315, thereby allowing the probe assembly 32 to be fixed inside the housing 312.

[0092] like Figure 8 As shown, in some embodiments, the fixing mechanism 31 may further include an elastic element 317. Along the first direction X, the elastic element 317 is located at the second end of the limiting member 33 near the probe assembly 32 (i.e., Figure 8 One side of the upper end of the probe assembly 32. One end of the elastic member 317 is connected to the housing 312, and the other end is connected to the limiting member 33.

[0093] For example, when the first end of the probe assembly 32 (i.e. Figure 8When the lower end of the probe assembly 32 is inside the limiting member 33, the elastic member 317 can be in a normal state or an elastically deformed state. When needed, the limiting member 33 overcomes the elastic force of the elastic member 317 and moves towards the second end of the probe assembly 32, allowing the probe assembly 32 to extend out from the limiting member 33. During this process, the elastic deformation of the elastic member 317 gradually increases, and the elastic force applied to the limiting member 33 gradually increases. After use, under the elastic force of the elastic member 317, the limiting member 33 moves away from the second end, and the first end of the probe assembly 32 can retract back into the limiting member 33.

[0094] In some embodiments, such as Figure 6 As shown, the elastic element 317 can be a spring. The spring can be sleeved on the housing 312, thereby generating a spring force that causes the limiting element 33 to move away from the probe assembly 32. Furthermore, the spring can be directly sleeved on the housing 312, making installation simple and convenient.

[0095] The spring force can be selected based on the specific circumstances. For example, the spring force can be 2N-4N. Of course, the spring force can also be other values; the specific choice depends on the actual situation. This is only an example for illustration.

[0096] like Figure 5 As shown, in some embodiments, the probe assembly 32 may include an insulating sleeve 321 and a plurality of probes 322. Wherein, as Figure 12 As shown, Figure 12 This is a schematic diagram of a probe assembly 32 provided in an embodiment of this application. The insulating sleeve 321 has multiple independent partition holes 3213, and a probe 322 passes through one partition hole 3213. Thus, multiple probes 322 can be isolated from each other by the insulating sleeve 321, allowing for individual conductivity testing. Simultaneously, the insulating sleeve 321 can mount multiple probes 322 together, thereby facilitating the installation of the probe assembly 32 inside the housing 312.

[0097] Furthermore, since multiple probes 322 are directly connected together via the insulating sleeve 321, the relevant locations of the device under test can be directly inspected during testing. For example, when inspecting the battery holder of a mobile phone motherboard, multiple probes 322 can be directly brought into contact with the battery holder for inspection. This eliminates the need to design multiple inspection points at different locations on the motherboard, saving motherboard layout area and facilitating the layout of different motherboard architectures.

[0098] For example, such as Figure 12As shown, the insulating sleeve 321 may include an insulating sleeve body 3211 and an insulating cover plate 3212. One end of the insulating sleeve body 3211 has an opening and a plurality of partition holes 3213. Meanwhile, as... Figure 13 As shown, Figure 13 for Figure 12 The schematic diagram of the probe assembly 32 from another angle shows an insulating cover plate 3212 covering the opening of the insulating sleeve body 3211, with multiple openings 3214. One probe 322 is located within one opening 3214.

[0099] Understandably, the number of probes 322 can be selected according to the actual situation. For example, the number of probes 322 can be 4, 8, or 16. Furthermore, the specific form of the probes 322 can be designed according to the actual situation. For example, such as... Figure 5 As shown, probe 322 can be a sheet-like structure. Alternatively, probe 322 can also be a thin columnar structure. Probe 322 can be made of a material with good electrical conductivity. For example, probe 322 can be made of metallic copper.

[0100] The adapter cable assembly 50 provided in the embodiments of this application will be described exemplarily below, such as... Figure 14 As shown, Figure 14 This is a schematic diagram showing the structure of the interface component 40 and the adapter cable assembly 50 when they are plugged in. In some embodiments, the adapter cable assembly 50 may include an adapter cable 51, an adapter port 52, and an adapter mechanism 53. The adapter port 52 can be connected to one end of the adapter cable 51, and the adapter mechanism 53 can be connected to the other end of the adapter cable 51. The adapter port 52 can be plugged into the interface of the interface component 40.

[0101] For example, such as Figure 14 As shown, the adapter mechanism 53 can be connected to the other end of two adapter cables 51. One end of each adapter cable 51 can be connected to an adapter port 52, and each adapter port 52 can be connected to an interface component 40. Thus, in actual use, the adapter mechanism 53 can simultaneously receive signals from the devices under test connected to the two interface components 40 through the two adapter cables 51.

[0102] It is understood that the specific type of interface of interface component 40 can be selected according to the actual situation. For example, interface component 40 may include a Type-C port, which can be plugged into the charging port of an electronic device. Alternatively, interface component 40 may also include a Micro-USB port. Accordingly, the electronic device may include a Micro-USB interface.

[0103] Similarly, the specific type of adapter port 52 can be selected according to the actual situation. For example, adapter port 52 can also include a Type-C interface. Of course, adapter port 52 can also be a USB port; the specific choice depends on the actual situation, and this is only used as an example. Furthermore, to improve the communication performance of the adapter cable, a flexible cable with low impedance can be used. For example, the continuity resistance of the adapter cable can be less than or equal to 500mΩ.

[0104] The adapter pin assembly 22 can abut against the adapter mechanism 53 to establish an electrical connection between the two. For example, as shown... Figure 14 As shown, the adapter mechanism 53 includes an adapter base 531 and an adapter conductive element 532. The adapter conductive element 532 is disposed on the adapter base 531 and can abut against the adapter pin assembly 22.

[0105] In practical applications, after the device under test is placed on the first test bracket 10, the interface component 40 can be electrically connected to the device under test first, and then the probe component 32 on the second test bracket 20 can be used for testing.

[0106] In some embodiments, the interface component 40 can be detachably connected to the first test bracket 10. This allows the interface component 40 to be replaced individually, making replacement more convenient.

[0107] In some embodiments, such as Figure 14 As shown, the test fixture 100 may further include a mounting component 60. The mounting component 60 can be mounted on the first test bracket 10. The interface component 40 can snap-fit ​​with the mounting component 60. In this way, the interface component 40 can be mounted on the first test bracket 10 via the mounting component 60. At the same time, since the interface component 40 and the mounting component 60 are connected by snap-fit, installation and removal are relatively convenient.

[0108] It is understood that the interface component 40 can be detachably connected to the first test bracket 10 in different ways, mainly to achieve the detachable connection of the interface component 40. In some other embodiments, the interface component 40 can also be mounted to the first test bracket 10 with screws.

[0109] To achieve the snap-fit ​​connection between mounting component 60 and interface component 40, such as Figure 15 As shown, Figure 15 This is a schematic diagram showing the structure of the interface component 40 and the mounting component 60 when separated. In some embodiments, the mounting component 60 may have a mounting groove 601. A portion of the interface component 40 may be located within the mounting groove 601 and engage with it. Thus, by placing a portion of the interface component 40 within the mounting groove 601, the connection between the mounting component 60 and the interface component 40 can be achieved, making the connection convenient.

[0110] In some embodiments, such as Figure 15 As shown, the mounting groove 601 may have a snap-fit ​​hole 602 in its groove wall. Simultaneously, the interface assembly 40 may have a snap-fit ​​part 401. The snap-fit ​​part 401 may be located within the snap-fit ​​hole 602. Thus, through the mutual cooperation of the snap-fit ​​part 401 and the snap-fit ​​hole 602, the interface assembly 40 can be stably mounted within the mounting groove 601, resulting in a more secure and stable connection.

[0111] It is understood that the mounting component 60 can have different structures, as long as it can achieve a snap-fit ​​connection with the interface component 40. The mounting component 60 provided in the embodiments of this application will be described below as an example. Figure 16 As shown, Figure 16 for Figure 14 The exploded view of the device shown indicates that the mounting assembly 60 may include a first mounting member 61, a second mounting member 62, and a third mounting member 63. The first mounting member 61 may have the aforementioned mounting groove 601 and connect to the second mounting member 62. There are multiple third mounting members 63. A sliding groove 631 is formed on one side of each of the multiple third mounting members 63.

[0112] Multiple third mounting members 63 are connected to the second mounting member 62 and are arranged in parallel at intervals. Since the third mounting member 63 has a sliding groove 631, when the mounting assembly 60 is mounted on the first test bracket 10, the first test bracket 10 can be designed with a corresponding slide rail structure. Thus, the slide rail structure can be set within the sliding groove 631 of the third mounting member 63. The third mounting member 63 can slide along the slide rail, thereby achieving a sliding connection between the mounting assembly 60 and the first test bracket 10.

[0113] Therefore, when installing the mounting component 60, the sliding groove 631 of the third mounting member 61 can be used for installation. It is only necessary to align the sliding groove 631 on the third mounting member 61 with the corresponding slide rail structure of the first test bracket 10. Furthermore, since the third mounting member 61 can slide, the position of the mounting component 60 can be adjusted according to actual needs, making the application more convenient.

[0114] In addition, such as Figure 16 As shown, in some embodiments, the mounting assembly 60 may further include a mounting plate 64. Additionally, the mounting assembly 60 may include a third fastener 65. The third fastener 65 may penetrate the mounting plate 64 and the second mounting member 62, and connect to the first mounting member 61. By providing the mounting plate 64, the overall structural stability of the mounting assembly 60 can be improved, and its support strength can be enhanced.

[0115] It is understood that the specific structures of the first mounting component 61, the second mounting component 62, and the third mounting component 63 can be designed according to actual conditions. For example, such as... Figure 16 As shown, the second mounting member 62 may include a partition plate 621 and two support blocks 622 located on opposite sides of the partition plate 621. The two support blocks 622 and the partition plate 621 form a recessed area. A first mounting member 61 can be installed in the recessed area and connected to the partition plate 621, while a third mounting member 63 can be connected to the support blocks 622. Simultaneously, a mounting plate 64 can be located on the side of the partition plate 621 away from the second mounting member 62, and a fastener 314 can penetrate the partition plate 621 and be connected to the first mounting member 61.

[0116] In the description of this specification, specific features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments or examples.

[0117] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A test pin assembly, characterized by, include: Fixing mechanism, limiting components, and probe assembly; The limiting member has a clearance hole that passes through it and is movably connected to the fixing mechanism, allowing it to move relative to the fixing mechanism along a first direction; the first direction is the extension direction of the probe in the probe assembly. The probe assembly is connected to the fixing mechanism; the probe assembly has a first end and a second end opposite to each other along the first direction, the first end being close to the clearance hole relative to the second end, and being disposed opposite to the clearance hole; The fixing mechanism has a first limiting part, and the limiting member has a second limiting part. The first limiting part and the second limiting part are used to abut against each other to restrict the movement of the limiting member toward the second end.

2. The test needle assembly of claim 1, wherein, The fixing mechanism includes: The outer casing has an interior forming a mounting cavity, and one end of the outer casing has a first opening communicating with the mounting cavity; The probe assembly is inserted into the mounting cavity, and the first end of the probe assembly protrudes from the housing through the first opening; the limiting member is movably connected to the housing.

3. The test needle assembly of claim 2, wherein, The limiting component is fitted onto the end of the outer shell that has the first opening.

4. The test needle assembly of claim 3, wherein, The housing includes a first peripheral wall, which surrounds the probe assembly, and the first peripheral wall has the first limiting portion; The limiting member includes a second peripheral wall, which is disposed around the first peripheral wall, and the second peripheral wall has a second limiting portion.

5. The test needle assembly of claim 4, wherein, The first limiting part is formed on the side of the first peripheral wall near the second peripheral wall, and the second limiting part is a limiting groove; The first limiting part is located inside the limiting groove, and along the first direction, the first limiting part is slidably connected to the limiting groove.

6. The test needle assembly of claim 3, wherein, The fixing mechanism also includes: An elastic element is located on the side of the limiting member near the second end of the probe assembly along the first direction; one end of the elastic element is connected to the housing, and the other end is connected to the limiting member.

7. The test needle assembly of claim 6, wherein, The elastic element is a spring, which is sleeved on the outer shell.

8. The test needle assembly of claim 2, wherein, The probe assembly includes: An insulating sleeve, wherein the insulating sleeve has a plurality of independent partition holes; and, Multiple probes, one of which is inserted into one of the partition holes.

9. The test needle assembly of claim 2, wherein, The fixing mechanism also includes: An adapter circuit board is located on the side of the housing near the second end of the probe assembly and is connected to the housing; the adapter circuit board is electrically connected to the second end of the probe assembly.

10. The test needle assembly of claim 9, wherein, The inner wall of the mounting cavity is formed with a blocking portion; a portion of the probe assembly is located on the side of the blocking portion near the adapter circuit board and abuts against the blocking portion; The other end of the housing is provided with a second opening communicating with the mounting cavity, and at least a portion of the adapter circuit board covers the second opening; a portion of the probe assembly abuts against the side of the adapter circuit board near the housing.

11. A test fixture, characterized by, Includes the test probe assembly according to any one of claims 1-10.

12. The test fixture of claim 11, wherein, The test fixture also includes: A first test bracket, used to hold the device under test; and... The second test bracket, wherein the test probe assembly is detachably connected to the second test bracket.

13. The test fixture of claim 12, wherein, The test fixture also includes: An interface component, the interface component being connected to the first test bracket; and, An adapter cable assembly, one end of which is detachably connected to the interface assembly, and the other end of which is used to connect to a testing device.

14. The test fixture of claim 13, wherein, The adapter cable assembly includes: An adapter port, which is detachably connected to the interface component; An adapter cable, one end of which is connected to the adapter port; and, An adapter mechanism is connected to the other end of the adapter cable, and the adapter mechanism is used to connect to the testing equipment.

15. The test fixture of claim 13 or 14, wherein, The test fixture also includes: The mounting component is mounted on the first test bracket; the interface component is snapped into the mounting component.

16. The test fixture of claim 15, wherein, The mounting component has a mounting slot; a portion of the interface component is located within the mounting slot and engages with the mounting slot.

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