Method and apparatus for configuring test tasks of a test interface and test method of a device

CN122653987APending Publication Date: 2026-08-28GUANGDONG WANHE THERMAL ENERGY TECH CO LTD
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Patent Information

Application Number
CN202610659106.5
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-05-13
Publication Date
2026-08-28

AI Technical Summary

Technical Problem

[0003]这种依赖个人经验的测试方式存在显著局限性:

Benefits of technology

[0012] By applying the technical solution of this application, the method for configuring test tasks in the aforementioned test interface involves setting the test actions that the test device can execute in the action setting window and setting the status information that the device under test can feedback in the judgment setting window, thereby forming the action set and status set required for testing devices under test of different models and functional requirements. Furthermore, for a single device under test, at least one test process can be set in the test process window. After clicking on the test process in the test process window, the test step information corresponding to the test process is configured in the test step window based on the action set and status set, forming an association between the test process and the corresponding test step information. Based on this association, a test task is generated. Therefore, this solution facilitates testers in creating and adjusting test plans for devices under test of different models and functional requirements, eliminating the need to write test script code for different models and functional requirements, thus reducing the workload of test script development.

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Abstract

The application provides a configuration method of a test task of a test interface and a test method of a device, which comprises the following steps: setting a test action capable of being executed by a test device in an action setting window to form an action set; setting state information capable of being fed back by a device under test in a judgment setting window to form a state set; setting at least one test flow in a test flow window; clicking the test flow in the test flow window; and configuring test step information corresponding to the test flow based on the action set and the state set in a test step window to form an association relationship between the test flow and the corresponding test step information, wherein the test step information comprises test actions selected from the action set, state information selected from the state set, and the order of the test actions and the state information; and generating a test task based on the association relationship between the test flow and the corresponding test step information, so as to solve the problem of high workload of test script development.
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Description

Technical Field

[0001] This application relates to the field of electrical control testing technology, and more specifically, to a method for configuring test tasks on a test interface, a test method for equipment, and an automatic test platform. Background Technology

[0002] In practice, traditional testing methods are still widely used in electrical control testing, and the testing work relies heavily on the personal experience and professional skills of the testers. Specifically, testers need to thoroughly study the product specifications, and based on their understanding of the working principles, control logic, and potential risks of the electrical control system, they need to manually design test cases, plan the test process, and complete the test execution, data recording, and result analysis through manual operation.

[0003] This testing method, which relies on personal experience, has significant limitations:

[0004] 1. Adjusting test plans for different models and functional requirements of electronic control products requires manually redesigning test cases, resulting in a large amount of secondary development work;

[0005] 2. Manual testing is inefficient, especially when dealing with complex electronic control systems or large-scale testing needs. The testing cycle is long and the labor cost is high. In addition, subjective judgment bias or operational errors can easily introduce test errors during manual operation, affecting the accuracy and consistency of test results. Summary of the Invention

[0006] The first technical problem solved by this invention is to provide a method for configuring test tasks in a test interface, which effectively reduces the workload of test script development.

[0007] The second technical problem solved by this invention is to provide a testing method for a device that effectively improves testing efficiency and accuracy.

[0008] The third technical problem solved by this invention is to provide an automated testing platform that effectively improves testing efficiency and accuracy.

[0009] The first technical problem mentioned above is solved by the following technical solution:

[0010] A method for configuring test tasks on a test interface, the test interface comprising a test process window, an action setting window, a judgment setting window, and a test step window, the method comprising: setting test actions that a test device can execute in the action setting window to form an action set; setting status information that the device under test can feedback in the judgment setting window to form a status set; setting at least one test process in the test process window; after clicking the test process in the test process window, configuring test step information corresponding to the test process in the test step window based on the action set and the status set to form an association between the test process and the corresponding test step information; wherein, the test step information includes the test actions selected in the action set and the status information selected in the status set, as well as the order of each test action and each status information; and generating the test task based on the association between the test process and the corresponding test step information.

[0011] The method for configuring test tasks in the test interface described in this invention has the following advantages compared to the prior art:

[0012] By applying the technical solution of this application, the method for configuring test tasks in the aforementioned test interface involves setting the test actions that the test device can execute in the action setting window and setting the status information that the device under test can feedback in the judgment setting window, thereby forming the action set and status set required for testing devices under test of different models and functional requirements. Furthermore, for a single device under test, at least one test process can be set in the test process window. After clicking on the test process in the test process window, the test step information corresponding to the test process is configured in the test step window based on the action set and status set, forming an association between the test process and the corresponding test step information. Based on this association, a test task is generated. Therefore, this solution facilitates testers in creating and adjusting test plans for devices under test of different models and functional requirements, eliminating the need to write test script code for different models and functional requirements, thus reducing the workload of test script development.

[0013] Optionally, after clicking the test process in the test process window, the test step information corresponding to the test process is configured in the test step window based on the action set and the state set, including: after clicking the test process in the test process window, in response to the operation of adding test steps and selection operation, adding an action test step or a judgment test step corresponding to the selection operation, wherein the selection operation is an operation of selecting the test action in the action set or selecting the state information in the state set; in response to the operation of selecting execution time, increasing the execution time of each action test step and the judgment test step.

[0014] Optionally, after increasing the execution time of each of the action test steps and the judgment test steps in response to the operation of selecting execution time, the method further includes: in response to the operation of adding a repeating step, adding a repeating step after each of the judgment test steps to return to executing the action test step when the judgment result is negative; in response to the operation of selecting an upper limit for the number of repetitions, increasing the upper limit for the number of repetitions of the action test step, such that the repeating step is invalid when the number of repetitions of the action test step is equal to the upper limit for the number of repetitions; in response to the operation of selecting the repeating step, enabling the repeating step, and in response to the operation of not selecting the repeating step, invalidating the repeating step.

[0015] Optionally, at least one test process is set in the test process window, including: adding a corresponding test process in response to the operation of adding the test process; and deleting a corresponding test process in response to the operation of deleting the test process.

[0016] Optionally, setting the test actions that the test device can perform in the action setting window includes: adding a setting for the corresponding test action in response to an operation of adding the test action; adding a setting for the corresponding component of each test action in response to an operation of setting the component of each test action; adding a setting for the corresponding action value of each test action in response to an operation of setting the action value of each test action; and deleting the setting for the corresponding action, the setting for the component of the action, and the setting for the action value in response to an operation of deleting the test action.

[0017] Optionally, in response to the operation of setting the action value of each of the test actions, the setting of the corresponding action value of each of the test actions is increased, including: when the components of the multiple test actions are the same, setting the action value of the multiple test actions so that the action values ​​of the multiple test actions are different from each other.

[0018] Optionally, setting the status information that the device under test can feedback in the judgment setting window includes: in response to the operation of setting the status information, adding the setting of the corresponding status information; in response to the operation of setting the judgment position corresponding to each status information, adding the setting of the judgment position corresponding to each status information, wherein the judgment position is the position of the status information in the status feedback information of the device under test; in response to the operation of setting the judgment value of each status information, adding the setting of the judgment value corresponding to each status information; and in response to the operation of deleting the status information, deleting the corresponding status information, the judgment position of the corresponding status information, and the judgment value of the corresponding status information.

[0019] Optionally, in response to the operation of setting the judgment value of each of the state information, the setting of the judgment value corresponding to each of the state information is increased, including: when the judgment positions corresponding to multiple state information are the same, setting the judgment value of multiple state information so that the judgment values ​​of multiple state information are different from each other.

[0020] The second technical problem mentioned above is solved by the following technical solution:

[0021] A testing method for a device is applied to an automated testing platform. The automated testing platform includes a host computer and a testing device that are communicatively connected. The host computer and the device under test are communicatively connected. The host computer is configured with at least one test process according to the test task configuration method of the test interface. The method includes: the host computer sequentially sending control commands corresponding to the test actions and status information to the testing device according to the order of the test actions and status information fed back by the device under test in the test step window corresponding to the test process in the test task, and performing status comparison.

[0022] The testing method for the device described in this invention has the following advantages compared to the prior art:

[0023] By applying the technical solution of this application, since the host computer has at least one test process through the test task configuration method of the above-mentioned test interface, when the test task is started on the device under test, the host computer can sequentially send the control command corresponding to the test action and compare the status information fed back by the device under test to the test device in the order of the test action and the status information in the test step window corresponding to the test process. This enables the test device to automatically complete the test action on the device under test, and directly output the test result by comparing the status information fed back by the device under test with the status information, thereby improving test efficiency and test accuracy.

[0024] Optionally, the host computer sequentially sends control commands corresponding to the test actions and status information to the test device according to the order of the test actions and status information in the test step window corresponding to the test process, and performs status comparison on the status information fed back by the device under test. This includes: sending control commands corresponding to the test actions to the test device according to the action test steps to control the corresponding components of the device under test to perform the corresponding actions; receiving status feedback information returned by the device under test; reading the status feedback information to obtain status information according to the judgment test steps corresponding to the action test steps, and judging whether the status information is consistent with the corresponding status information to obtain a judgment result; and taking all the judgment results as test results when all the test processes are completed.

[0025] The third technical problem mentioned above is solved by the following technical solution:

[0026] An automated testing platform includes a host computer, a testing device, and a connection fixture. The connection fixture is used to send test commands from the host computer to the testing device and to feed back status parameters of the device under test to the host computer. The host computer includes one or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors. The one or more programs include methods for performing any of the above embodiments.

[0027] The automatic testing platform described in this invention has the following advantages compared with the prior art:

[0028] By applying the technical solution of this application, since the host computer has at least one test process through the test task configuration method of the above-mentioned test interface, when the test task is started on the device under test, the host computer can sequentially send the control command corresponding to the test action and compare the status information fed back by the device under test to the test device in the order of the test action and the status information in the test step window corresponding to the test process. This enables the test device to automatically complete the test action on the device under test, and directly output the test result by comparing the status information fed back by the device under test with the status information, thereby improving test efficiency and test accuracy. Attached Figure Description

[0029] The accompanying drawings, which form part of this application, are used to provide a further understanding of this application. The illustrative embodiments and descriptions of this application are used to explain this application and do not constitute an undue limitation of this application. In the drawings:

[0030] Figure 1 A flowchart illustrating a method for configuring test tasks for a test interface according to an embodiment of this application is shown.

[0031] Figure 2 A structural block diagram of a host computer provided according to an embodiment of this application is shown;

[0032] Figure 3 A structural block diagram of an automated testing platform provided according to an embodiment of this application is shown;

[0033] Figure 4 A schematic diagram of a window 1 provided according to an embodiment of this application is shown;

[0034] Figure 5 A schematic diagram of a window 2 provided according to an embodiment of this application is shown;

[0035] Figure 6 A schematic diagram of a window 3 and a window 4 provided according to an embodiment of this application is shown. Detailed Implementation

[0036] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0037] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0038] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate for the embodiments of this application described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0039] As described in the background section, the development of test scripts in the prior art is labor-intensive. To address this technical problem, embodiments of this application provide a method for configuring test tasks for a test interface, a test method for a device, and an automated test platform.

[0040] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.

[0041] This embodiment provides a method for configuring test tasks on a test interface. It should be noted that the steps shown in the flowchart can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order. To better illustrate the solution, an optional application scenario of the method for configuring test tasks on a test interface according to this embodiment is first briefly introduced. This method can be applied to a host computer.

[0042] Figure 1 This is a flowchart illustrating the method for configuring test tasks using a test interface according to an embodiment of this application. Figure 1 As shown, the method includes the following steps:

[0043] Step S201: Set the test actions that the test device can perform in the above-mentioned action setting window to form an action set;

[0044] Specifically, the test actions that the test device can perform are set in the action settings window to form an action set, so that the required test actions can be selected from the action set later. The operation is flexible and adaptable to different test requirements.

[0045] Step S202: In the above-mentioned judgment setting window, set the status information that the device under test can feed back, and form a status set;

[0046] Specifically, the status information that the device under test can provide can be set in the aforementioned judgment settings window to form a status set, so that the status information required for the test result judgment can be selected from the status set in the subsequent operation. The operation is flexible and adaptable to different test result judgment needs.

[0047] Step S203: Set at least one test process in the above test process window;

[0048] Specifically, the test process window can set one or more test processes. Each test process corresponds to one test case, and the test process can be executed to complete the test of the corresponding test case.

[0049] Step S204: After clicking the test process in the test process window, configure the test step information corresponding to the test process in the test step window based on the action set and the state set, forming an association between the test process and the corresponding test step information; wherein, the test step information includes the test action selected in the action set and the state information selected in the state set, as well as the order of each test action and each state information.

[0050] Specifically, after clicking on the test process in the test process window, you can jump to the test step window to configure the test step information corresponding to the test process. Select the test actions in the action set and the status information in the status set, and configure the order of each test action and each status information to form the test step information corresponding to the test process, thus completing the association between the test process and the test step information.

[0051] Step S205: Based on the association between the above test process and the corresponding test step information, generate the above test task.

[0052] Specifically, based on the association between the test process and the corresponding test step information, a test task is generated. The test task includes at least one test process. When the test task is executed, the test steps corresponding to the test step information associated with each test process are executed to obtain the test results and achieve automatic testing.

[0053] The configuration method for test tasks in the aforementioned test interface involves setting the test actions that the test device can execute in the action settings window and setting the status information that the device under test (DUT) can provide in the judgment settings window. This forms the action set and status set required for testing DUTs of different models and functional requirements. Furthermore, for a single DUT, at least one test process can be set in the test process window. After clicking on a test process in the test process window, the corresponding test step information is configured in the test step window based on the action set and status set, forming a relationship between the test process and its corresponding test step information. Based on this relationship, a test task is generated. Therefore, this solution facilitates testers in creating and adjusting test plans for DUTs of different models and functional requirements without requiring the writing of test script code for different models and functional requirements, thus reducing the workload of test script development.

[0054] In some optional implementations, step S204 above includes:

[0055] Step S2041: After clicking the above test process in the above test process window, in response to the operation of adding test steps and selection operation, add the action test step or judgment test step corresponding to the above selection operation. The above selection operation is the operation of selecting the above test action in the above action set or selecting the above status information in the above status set.

[0056] To add a test step, select either an action test step or a judgment test step. Select the test action from the action set or the state information from the state set to add the corresponding action test step or judgment test step.

[0057] Step S2043: In response to the operation of selecting the execution time, increase the execution time of each of the above-mentioned action test steps and the above-mentioned judgment test steps.

[0058] Select the action test step and the execution time of the judgment test step, such as 0.1 seconds. After the action runs for 0.1 seconds, it will proceed to the next step to continue running.

[0059] In some optional implementations, after increasing the execution time of each of the above-mentioned action test steps and the above-mentioned judgment test steps in response to the operation of selecting the execution time, the method further includes:

[0060] Step S2044: In response to the operation of adding a repeating step, after each of the above-mentioned judgment test steps, the repeating step of performing the above-mentioned action test steps is added, and if the judgment result is negative, the process returns to the above-mentioned repeating step.

[0061] Add a check to determine if the condition is not met and return to the required repeating steps; alternatively, you can choose not to add repeating steps.

[0062] Step S2045: In response to the operation of selecting the upper limit of the number of repetitions, the upper limit of the number of repetitions of the above action test step is increased, so that the above repetition step is invalid when the number of repetitions of the above action test step is equal to the upper limit of the number of repetitions.

[0063] If the result is negative, the action test steps are repeated, with a maximum number of repetitions selected. If the number of repetitions of the action test steps reaches the maximum number of repetitions and the result is still negative, the action test steps are no longer repeated, meaning the repeated steps are invalid, and the final test result is negative.

[0064] In step S2046, in response to selecting the above-mentioned repeating step, the above-mentioned repeating step is enabled; in response to not selecting the above-mentioned repeating step, the above-mentioned repeating step is disabled.

[0065] In the box, selecting a checkmark will return to the required step if the condition is not met within the time limit; deselecting no checkmark will continue to the next step if the condition is met, and display "Test Failed" if the condition is not met.

[0066] In some optional implementations, step S203 above includes:

[0067] Step S2031: In response to the operation of adding the above test procedure, add the corresponding above test procedure;

[0068] The test process window adds test processes, such as the boot process, and displays the test steps in the test steps.

[0069] Step S2032: In response to the operation of deleting the above test process, delete the corresponding above test process.

[0070] The test process window has a delete button, which can be used to delete unnecessary test processes.

[0071] In some optional implementations, step S201 above includes:

[0072] Step S2011: In response to the operation of adding the above-mentioned test action, add the setting of the corresponding above-mentioned test action;

[0073] Add test action settings, such as pressing the power button, and perform the action of pressing the power button.

[0074] Step S2012: In response to the operation of setting the components for each of the above-mentioned test actions, the setting of the corresponding components for each of the above-mentioned test actions is increased;

[0075] The component that sets the test action, such as the test action of the on / off switch, is in component 1.

[0076] Step S2013: In response to the operation of setting the action value of each of the above test actions, the action value of each of the above test actions is increased accordingly;

[0077] Set the action value for using this component, such as a value of 1 for pressing and a value of 0 for releasing, to complete the action setting function.

[0078] In step S2014, in response to the operation of deleting the above test action, the settings of the corresponding test action, the settings of the components of the test action, and the settings of the action value of the test action are deleted.

[0079] The action settings window has a delete button, which can be used to delete unnecessary test action settings, component settings for the test actions, and action value settings for the test actions.

[0080] In some optional implementations, step S2013 above includes:

[0081] Step S20131: When the components of the multiple test actions are the same, set the action values ​​of the multiple test actions so that the action values ​​of the multiple test actions are different from each other.

[0082] Multiple test actions share the same component. For example, pressing and releasing the power button both use component 1. The action value of pressing the power button is 1, while the action value of releasing the power button is 0. The action values ​​of the two actions are not the same, so that the test script can easily distinguish between different actions.

[0083] In some optional implementations, step S202 above includes:

[0084] Step S2021: In response to the operation of setting the above status information, add the setting of the corresponding above status information;

[0085] Add status information settings, such as power-on status, to determine the current status of the device under test.

[0086] Step S2022: In response to the operation of setting the judgment position corresponding to each of the above-mentioned status information, the setting of the judgment position corresponding to each of the above-mentioned status information is added, and the judgment position is the position of the above-mentioned status information in the status feedback information of the above-mentioned device under test.

[0087] Set the judgment position corresponding to the status information. For example, if the judgment is in the [1]th byte of the protocol, fill in 1 for the position value, and judge according to the protocol to know whether the component can be operated.

[0088] Step S2023: In response to the operation of setting the judgment value of each of the above-mentioned state information, the setting of the judgment value corresponding to each of the above-mentioned state information is increased;

[0089] Set the judgment value for this position, such as 1 for power-on status and 0 for power-off status, to complete the judgment setting function.

[0090] Step S2024: In response to the operation of deleting the above-mentioned status information, delete the corresponding above-mentioned status information, the judgment position of the corresponding above-mentioned status information, and the judgment value of the corresponding above-mentioned status information.

[0091] The settings window has a delete button. By using the delete button, you can delete unwanted status information, the corresponding judgment position of the aforementioned status information, and the corresponding judgment value of the aforementioned status information.

[0092] In some optional implementations, step S2023 above includes:

[0093] Step S20231: When the judgment positions corresponding to multiple states are the same, set the judgment values ​​of multiple states so that the judgment values ​​of multiple states are different from each other.

[0094] Multiple status information corresponds to the same judgment position. For example, the judgment position for both the power-on state and the power-off state is position 1. The judgment value for the power-on state is 1, and the judgment value for the power-off state is 0. The two judgment values ​​are not the same, so that the test script can easily distinguish different status information.

[0095] This embodiment provides a device testing method applied to an automated testing platform. The automated testing platform includes a host computer and a testing device that are communicatively connected. The host computer and the device under test are communicatively connected. The host computer configures at least one test process according to the test task configuration method of the test interface. The method includes:

[0096] In step S301, the host computer sends the control commands corresponding to the test actions and the status information to the test device in the order of the test actions and status information in the test step window corresponding to the test process in the test task, and compares the status information fed back by the device under test.

[0097] In the testing method of the above-mentioned equipment, since the host computer has at least one test process through the test task configuration method of the above-mentioned test interface, when the test task is started on the device under test, the host computer can send the control commands corresponding to the test actions and the status information fed back by the device under test to the test device in sequence according to the order of the test actions and the status information in the test step window corresponding to the test process. This enables the test device to automatically complete the test actions on the device under test, and directly output the test results by comparing the status information fed back by the device under test with the status information, thereby improving the test efficiency and test accuracy.

[0098] In some optional implementations, step S301 above includes:

[0099] Step S3011: Send the control command corresponding to the test action to the test device according to the action test steps, so as to control the corresponding component of the device under test to perform the corresponding action.

[0100] According to the action test steps, the test device sends the control command corresponding to the test action, so that the test script of the test device outputs the action control connection fixture through protocol 1, the connection fixture executes the action of protocol 1, and controls the device under test through protocol 2 or the fixture hardware.

[0101] Step S3012: Receive the status feedback information returned by the device under test;

[0102] The device under test executes the action of connecting the fixture, returns the current status of the device under test, and outputs Protocol 3, i.e., status feedback information.

[0103] Step S3013: Read the state feedback information according to the judgment test step corresponding to the above action test step to obtain state information, and determine whether the above state information is consistent with the corresponding state information to obtain the judgment result.

[0104] After receiving Protocol 3, the connection fixture forwards Protocol 3 to the test script of the test device for judgment, and judges whether the above status information is consistent with the corresponding status information, and obtains the judgment result.

[0105] Step S3014: After all the above test procedures have been completed, take all the above judgment results as test results.

[0106] By taking all the judgment results as test results, it is possible to determine whether the action has been completed and whether the tested equipment is qualified.

[0107] This application also provides an automated testing platform, including a host computer, a testing device, and a connection fixture. The connection fixture is used to send test commands from the host computer to the testing device and to feed back the status parameters of the device under test to the host computer. It should be noted that the automated testing platform of this application can be used to execute the interactive method for the test interface provided in this application. This device is used to implement the above embodiments and preferred embodiments; details already described will not be repeated. As used below, the term "module" can refer to a combination of software and / or hardware that implements a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0108] The following describes the automated testing platform provided in the embodiments of this application.

[0109] Figure 2 This is a structural block diagram of the host computer according to an embodiment of this application. Figure 2 As shown, the host computer includes:

[0110] The first setting unit 10 is used to set the test actions that the test device can perform in the above-mentioned action setting window to form an action set;

[0111] Specifically, the test actions that the test device can perform are set in the action settings window to form an action set, so that the required test actions can be selected from the action set later. The operation is flexible and adaptable to different test requirements.

[0112] The second setting unit 20 is used to set the status information that the device under test can feed back in the above-mentioned judgment setting window to form a status set;

[0113] Specifically, the status information that the device under test can provide can be set in the aforementioned judgment settings window to form a status set, so that the status information required for the test result judgment can be selected from the status set in the subsequent operation. The operation is flexible and adaptable to different test result judgment needs.

[0114] The third setting unit 30 is used to set at least one test process in the above-mentioned test process window;

[0115] Specifically, the test process window can set one or more test processes. Each test process corresponds to one test case, and the test process can be executed to complete the test of the corresponding test case.

[0116] The fourth setting unit 40 is used to configure the test step information corresponding to the test process in the test step window based on the action set and the state set after clicking the test process in the test process window, thereby forming an association between the test process and the corresponding test step information; wherein, the test step information includes the test action selected in the action set and the state information selected in the state set, as well as the order of each test action and each state information.

[0117] Specifically, after clicking on the test process in the test process window, you can jump to the test step window to configure the test step information corresponding to the test process. Select the test actions in the action set and the status information in the status set, and configure the order of each test action and each status information to form the test step information corresponding to the test process, thus completing the association between the test process and the test step information.

[0118] The generation unit 50 is used to generate the test task based on the association between the above test process and the corresponding test step information.

[0119] Specifically, based on the association between the test process and the corresponding test step information, a test task is generated. The test task includes at least one test process. When the test task is executed, the test steps corresponding to the test step information associated with each test process are executed to obtain the test results and achieve automatic testing.

[0120] In the aforementioned automated testing platform, since the host computer has at least one test process through the test task configuration method of the aforementioned test interface, when starting a test task on the device under test, the host computer can sequentially send the control commands corresponding to the test actions and the status information fed back by the device under test to the testing device through the order of the test actions and the status information in the test step window corresponding to the test process, and compare the status information fed back by the device under test. This enables the testing device to automatically complete the test actions on the device under test, and directly output the test results by comparing the status information fed back by the device under test with the status information, thereby improving test efficiency and test accuracy.

[0121] In some optional implementations, the fourth setting unit includes:

[0122] The generation module is used to add an action test step or a judgment test step corresponding to the above selection operation after clicking the above test process in the above test process window. The above selection operation is to select the above action in the above action set or to select the above status information in the above status set.

[0123] To add a test step, select either an action test step or a judgment test step. Select the test action from the action set or the state information from the state set to add the corresponding action test step or judgment test step.

[0124] The second setting module is used to increase the execution time of each of the above-mentioned action test steps and judgment test steps in response to the operation of selecting the execution time.

[0125] Select the action test step and the execution time of the judgment test step, such as 0.1 seconds. After the action runs for 0.1 seconds, it will proceed to the next step to continue running.

[0126] In some optional implementations, the host computer further includes:

[0127] The third setting module is used to, in response to the operation of selecting the execution time, add the execution time of each of the above-mentioned action test steps and the above-mentioned judgment test steps, and in response to the operation of adding repeating steps, add the above-mentioned repeating steps after each of the above-mentioned judgment test steps when the judgment result is negative;

[0128] Add a check to determine if the condition is not met and return to the required repeating steps; alternatively, you can choose not to add repeating steps.

[0129] The fourth setting module is used to increase the maximum number of repetitions of the above action test step in response to the operation of selecting the maximum number of repetitions, so that the above repetition step is invalid when the number of repetitions of the above action test step is equal to the maximum number of repetitions.

[0130] If the result is negative, the action test steps are repeated, with a maximum number of repetitions selected. If the number of repetitions of the action test steps reaches the maximum number of repetitions and the result is still negative, the action test steps are no longer repeated, meaning the repeated steps are invalid, and the final test result is negative.

[0131] The fifth setting module is used to enable the above repeating steps in response to selecting the above repeating steps, and to disable the above repeating steps in response to not selecting the above repeating steps.

[0132] In the box, selecting a checkmark will return to the required step if the condition is not met within the time limit; deselecting no checkmark will continue to the next step if the condition is met, and display "Test Failed" if the condition is not met.

[0133] In some optional implementations, the third setting unit includes:

[0134] The sixth settings module is used to add the corresponding test process in response to the operation of adding the above test process;

[0135] The test process window adds test processes, such as the boot process, and displays the test steps in the test steps.

[0136] The seventh settings module is used to delete the corresponding test process in response to the operation of deleting the above test process.

[0137] The test process window has a delete button, which can be used to delete unnecessary test processes.

[0138] In some optional implementations, the first setting unit includes:

[0139] The eighth setting module is used to add the corresponding settings for the above-mentioned test actions in response to the operation of adding the above-mentioned test actions;

[0140] Add test action settings, such as pressing the power button, and perform the action of pressing the power button.

[0141] The ninth setting module is used to add settings for the corresponding components of each of the above-mentioned test actions in response to the operation of the components for setting each of the above-mentioned test actions;

[0142] The component that sets the test action, such as the test action of the on / off switch, is in component 1.

[0143] The tenth setting module is used to add the corresponding setting of the action value of each of the above-mentioned test actions in response to the operation of setting the action value of each of the above-mentioned test actions;

[0144] Set the action value for using this component, such as a value of 1 for pressing and a value of 0 for releasing, to complete the action setting function.

[0145] The eleventh setting module is used to delete the settings of the corresponding test action, the settings of the components of the test action, and the settings of the action value of the test action in response to the operation of deleting the above test action.

[0146] The action settings window has a delete button, which can be used to delete unwanted actions.

[0147] In some optional implementations, the tenth setting module mentioned above includes:

[0148] The first setting submodule is used to set the action values ​​of multiple test actions when the components of multiple test actions are the same, so that the action values ​​of multiple test actions are different from each other.

[0149] Multiple test actions share the same component. For example, pressing and releasing the power button both use component 1. The action value of pressing the power button is 1, while the action value of releasing the power button is 0. The action values ​​of the two actions are not the same, so that the test script can easily distinguish between different actions.

[0150] In some optional embodiments, the second setting unit includes:

[0151] The twelfth setting module is used to add the corresponding settings of the above-mentioned status information in response to the operation of setting the above-mentioned status information;

[0152] Add status information settings, such as power-on status, to determine the current status of the device under test.

[0153] The thirteenth setting module is used to respond to the operation of setting the judgment position corresponding to each of the above-mentioned status information, and to add the setting of the judgment position corresponding to each of the above-mentioned status information, wherein the judgment position is the position of the above-mentioned status information in the status feedback information of the above-mentioned device under test.

[0154] Set the judgment position corresponding to the status information. For example, if the judgment is in the [1]th byte of the protocol, fill in 1 for the position value, and judge according to the protocol to know whether the component can be operated.

[0155] The fourteenth setting module is used to add the setting of the judgment value corresponding to each of the above-mentioned state information in response to the operation of setting the judgment value of each of the above-mentioned state information.

[0156] Set the judgment value for this position, such as 1 for power-on status and 0 for power-off status, to complete the judgment setting function.

[0157] The fifteenth setting module is used to respond to the operation of deleting the above-mentioned status information by deleting the corresponding above-mentioned status information, the judgment position of the corresponding above-mentioned status information, and the judgment value of the corresponding above-mentioned status information.

[0158] The settings window has a delete button. By using the delete button, you can delete unwanted status information, the corresponding judgment position of the aforementioned status information, and the corresponding judgment value of the aforementioned status information.

[0159] In some alternative implementations, the fourteenth setting module described above includes:

[0160] The second setting submodule is used to set the judgment values ​​of multiple state information when the judgment positions corresponding to multiple state information are the same, so that the judgment values ​​of multiple state information are different from each other.

[0161] Multiple status information corresponds to the same judgment position. For example, the judgment position for both the power-on state and the power-off state is position 1. The judgment value for the power-on state is 1, and the judgment value for the power-off state is 0. The two judgment values ​​are not the same, so that the test script can easily distinguish different status information.

[0162] In some optional implementations, the host computer further includes:

[0163] The execution unit is used to send control commands corresponding to the test actions and compare the status information fed back by the device under test to the test device in sequence according to the order of the test actions and status information in the test step window corresponding to the test process in the test task.

[0164] In the above embodiments, since the host computer has at least one test process through the test task configuration method of the above test interface, when the test task is started on the device under test, the host computer can send the control commands corresponding to the test actions and the status information fed back by the device under test to the test device in sequence according to the order of the test actions and the status information in the test step window corresponding to the test process. This enables the test device to automatically complete the test actions on the device under test, and directly output the test results by comparing the status information fed back by the device under test with the status information, thereby improving test efficiency and test accuracy.

[0165] In some optional implementations, the above-mentioned execution unit includes:

[0166] The sending module is used to send control commands corresponding to the test actions to the test device according to the action test steps, so as to control the corresponding components of the device under test to perform the corresponding actions.

[0167] According to the action test steps, the test device sends the control command corresponding to the test action, so that the test script of the test device outputs the action control connection fixture through protocol 1, the connection fixture executes the action of protocol 1, and controls the device under test through protocol 2 or the fixture hardware.

[0168] The receiving module is used to receive the status feedback information returned by the device under test.

[0169] The device under test executes the action of connecting the fixture, returns the current status of the device under test, and outputs Protocol 3, i.e., status feedback information.

[0170] The reading module is used to read the status feedback information according to the judgment test step corresponding to the above action test step to obtain status information, and to determine whether the above status information is consistent with the corresponding status information, and to obtain the judgment result.

[0171] After receiving Protocol 3, the connection fixture forwards Protocol 3 to the test script of the test device for judgment, and judges whether the above status information is consistent with the corresponding status information, and obtains the judgment result.

[0172] The determination module is used to take all the above judgment results as test results after all the above test processes have been completed.

[0173] By taking all the judgment results as test results, it is possible to determine whether the action has been completed and whether the tested equipment is qualified.

[0174] The aforementioned host computer includes a processor and a memory. The first setting unit, second setting unit, third setting unit, fourth setting unit, and generation unit are all stored as program units in the memory. The processor executes the program units stored in the memory to implement the corresponding functions. All of the above modules are located in the same processor; alternatively, the above modules may be located in different processors in any combination.

[0175] The processor contains a kernel, which retrieves the corresponding program units from memory. One or more kernels can be configured, and adjusting kernel parameters can address the high workload of test script development in existing technologies.

[0176] The memory may include non-permanent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM, and the memory includes at least one memory chip.

[0177] To enable those skilled in the art to better understand the technical solution of this application, the automated testing platform of this application will be described in detail below with reference to specific embodiments.

[0178] This embodiment relates to a specific automated testing platform, such as... Figure 3 As shown, the automated testing platform includes a testing device and a connection fixture. The connection fixture is used to send the test instructions of the testing device to the device under test and to feed back the status parameters of the device under test to the testing device. The testing device includes window 1 (action setting window), window 2 (judgment setting window), window 3 (test step window) and window 4 (test process window).

[0179] Among them, window 1 is as follows Figure 4 As shown, the steps to set up window 1 include:

[0180] 1. Add action settings: such as: pressing the power button to perform the action of pressing the power button;

[0181] 2. Set the component that performs this action, such as: the action of the on / off switch is in component 1;

[0182] 3. Set the action values ​​for using this component, such as: the action value for pressing is 1, and the action value for releasing is 0;

[0183] 4. Function to complete the action setting;

[0184] 5. Delete button: Deletes unwanted actions.

[0185] Among them, window 2 is as follows Figure 5 As shown, the steps to set up window 2 include:

[0186] 1. Add judgment settings: such as: power-on status, determine the current status of the current device;

[0187] 2. Set the position of the judgment, such as: the judgment is in the [1]th byte of the protocol, the position value is filled with 1, and the judgment is made according to the protocol to know whether the component can be operated;

[0188] 3. Set the judgment value for this position, such as: the power-on status judgment value is 1, and the power-off status judgment value is 0;

[0189] 4. Complete the setting function for judgment.

[0190] 5. Delete button: Delete unnecessary judgments.

[0191] Among them, windows 3 and 4 are as follows Figure 6 As shown, the setup steps for windows 2 and 4 include:

[0192] Test process:

[0193] 1. Add test procedures, such as the boot process, and display the test steps in the test steps;

[0194] 2. Delete button: Delete unnecessary test processes.

[0195] Test steps:

[0196] 1. Add a test step, allowing you to choose between an action or a condition, and select the corresponding action from the action / condition list;

[0197] 2. Select the execution time, such as 0.1 seconds. This action will run for 0.1 seconds and then proceed to the next step.

[0198] 3. Select Action: Choose the corresponding action from the action list;

[0199] 4. Select Decision: Select the corresponding decision from the decision list, and add a step to return if the decision is not met;

[0200] 5. In the box, selecting the option will check the box, and if the condition is not met within the time limit, the system will return to the required step; not selecting the option will continue to the next step if the condition is met, and display "Test Failed" if the condition is not met.

[0201] 6. After completing all the steps in the test procedure, proceed to the next test process.

[0202] 7. Once all testing procedures are completed, the test is considered complete and has passed.

[0203] 8. Delete button: Delete unnecessary test steps.

[0204] This invention provides a computer-readable storage medium including a stored program, wherein a configuration method is provided for controlling the device containing the computer-readable storage medium to execute test tasks of the test interface when the program is running.

[0205] Specifically, the configuration methods for test tasks on the test interface include:

[0206] Step S201: Set the test actions that the test device can perform in the above-mentioned action setting window to form an action set;

[0207] Specifically, the test actions that the test device can perform are set in the action settings window to form an action set, so that the required test actions can be selected from the action set later. The operation is flexible and adaptable to different test requirements.

[0208] Step S202: In the above-mentioned judgment setting window, set the status information that the device under test can feed back, and form a status set;

[0209] Specifically, the status information that the device under test can provide can be set in the aforementioned judgment settings window to form a status set, so that the status information required for the test result judgment can be selected from the status set in the subsequent operation. The operation is flexible and adaptable to different test result judgment needs.

[0210] Step S203: Set at least one test process in the above test process window;

[0211] Specifically, the test process window can set one or more test processes. Each test process corresponds to one test case, and the test process can be executed to complete the test of the corresponding test case.

[0212] Step S204: After clicking the test process in the test process window, configure the test step information corresponding to the test process in the test step window based on the action set and the state set, forming an association between the test process and the corresponding test step information; wherein, the test step information includes the test action selected in the action set and the state information selected in the state set, as well as the order of each test action and each state information.

[0213] Specifically, after clicking on the test process in the test process window, you can jump to the test step window to configure the test step information corresponding to the test process. Select the test actions in the action set and the status information in the status set, and configure the order of each test action and each status information to form the test step information corresponding to the test process, thus completing the association between the test process and the test step information.

[0214] Step S205: Based on the association between the above test process and the corresponding test step information, generate the above test task.

[0215] Specifically, based on the association between the test process and the corresponding test step information, a test task is generated. The test task includes at least one test process. When the test task is executed, the test steps corresponding to the test step information associated with each test process are executed to obtain the test results and achieve automatic testing.

[0216] This invention provides a processor for running a program, wherein the program executes a configuration method for the test tasks of the test interface.

[0217] Specifically, the configuration methods for test tasks on the test interface include:

[0218] Step S201: Set the test actions that the test device can perform in the above-mentioned action setting window to form an action set;

[0219] Specifically, the test actions that the test device can perform are set in the action settings window to form an action set, so that the required test actions can be selected from the action set later. The operation is flexible and adaptable to different test requirements.

[0220] Step S202: In the above-mentioned judgment setting window, set the status information that the device under test can feed back, and form a status set;

[0221] Specifically, the status information that the device under test can provide can be set in the aforementioned judgment settings window to form a status set, so that the status information required for the test result judgment can be selected from the status set in the subsequent operation. The operation is flexible and adaptable to different test result judgment needs.

[0222] Step S203: Set at least one test process in the above test process window;

[0223] Specifically, the test process window can set one or more test processes. Each test process corresponds to one test case, and the test process can be executed to complete the test of the corresponding test case.

[0224] Step S204: After clicking the test process in the test process window, configure the test step information corresponding to the test process in the test step window based on the action set and the state set, forming an association between the test process and the corresponding test step information; wherein, the test step information includes the test action selected in the action set and the state information selected in the state set, as well as the order of each test action and each state information.

[0225] Specifically, after clicking on the test process in the test process window, you can jump to the test step window to configure the test step information corresponding to the test process. Select the test actions in the action set and the status information in the status set, and configure the order of each test action and each status information to form the test step information corresponding to the test process, thus completing the association between the test process and the test step information.

[0226] Step S205: Based on the association between the above test process and the corresponding test step information, generate the above test task.

[0227] Specifically, based on the association between the test process and the corresponding test step information, a test task is generated. The test task includes at least one test process. When the test task is executed, the test steps corresponding to the test step information associated with each test process are executed to obtain the test results and achieve automatic testing.

[0228] This application also provides a computer program product, which, when executed on a data processing device, is suitable for executing an initialization program having at least the following method steps:

[0229] Step S201: Set the test actions that the test device can perform in the above-mentioned action setting window to form an action set;

[0230] Specifically, the test actions that the test device can perform are set in the action settings window to form an action set, so that the required test actions can be selected from the action set later. The operation is flexible and adaptable to different test requirements.

[0231] Step S202: In the above-mentioned judgment setting window, set the status information that the device under test can feed back, and form a status set;

[0232] Specifically, the status information that the device under test can provide can be set in the aforementioned judgment settings window to form a status set, so that the status information required for the test result judgment can be selected from the status set in the subsequent operation. The operation is flexible and adaptable to different test result judgment needs.

[0233] Step S203: Set at least one test process in the above test process window;

[0234] Specifically, the test process window can set one or more test processes. Each test process corresponds to one test case, and the test process can be executed to complete the test of the corresponding test case.

[0235] Step S204: After clicking the test process in the test process window, configure the test step information corresponding to the test process in the test step window based on the action set and the state set, forming an association between the test process and the corresponding test step information; wherein, the test step information includes the test action selected in the action set and the state information selected in the state set, as well as the order of each test action and each state information.

[0236] Specifically, after clicking on the test process in the test process window, you can jump to the test step window to configure the test step information corresponding to the test process. Select the test actions in the action set and the status information in the status set, and configure the order of each test action and each status information to form the test step information corresponding to the test process, thus completing the association between the test process and the test step information.

[0237] Step S205: Based on the association between the above test process and the corresponding test step information, generate the above test task.

[0238] Specifically, based on the association between the test process and the corresponding test step information, a test task is generated. The test task includes at least one test process. When the test task is executed, the test steps corresponding to the test step information associated with each test process are executed to obtain the test results and achieve automatic testing.

[0239] It is obvious to those skilled in the art that the modules or steps of the present invention described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. They can be implemented using computer-executable program code, and thus can be stored in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those described herein, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, the present invention is not limited to any particular combination of hardware and software.

[0240] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0241] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0242] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0243] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0244] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0245] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0246] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0247] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0248] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0249] As can be seen from the above description, the embodiments of this application achieve the following technical effects:

[0250] 1) In the test task configuration method of the test interface of this application, test actions that the test device can execute are set in the action setting window, and status information that the device under test can feedback is set in the judgment setting window, thereby forming the action set and status set required for testing devices under test of different models and functional requirements. Furthermore, for a single device under test, at least one test process can be set in the test process window. After clicking on the test process in the test process window, the test step information corresponding to the test process is configured in the test step window based on the action set and status set, forming an association between the test process and the corresponding test step information. Based on this association, a test task is generated. Therefore, this solution facilitates testers in creating and adjusting test plans for devices under test of different models and functional requirements, eliminating the need to write test script code for different models and functional requirements, thus reducing the workload of test script development.

[0251] 2) In the testing method of the device in this application, since the host computer has at least one test process through the test task configuration method of the above-mentioned test interface, when the test task is started on the device under test, the host computer can send the control command corresponding to the test action and the status information fed back by the device under test to the test device in sequence according to the order of the test action and the status information in the test step window corresponding to the test process, so as to realize that the test device automatically completes the test action on the device under test, and directly outputs the test result by comparing the status information fed back by the device under test with the status information, thereby improving the test efficiency and test accuracy.

[0252] 3) In the automatic testing platform built in this application, since the host computer has at least one test process through the test task configuration method of the above-mentioned test interface, when the test task is started on the device under test, the host computer can send the control command corresponding to the test action and the status information fed back by the device under test to the test device in sequence according to the order of the test action and the status information in the test step window corresponding to the test process. This enables the test device to automatically complete the test action on the device under test, and directly output the test result by comparing the status information fed back by the device under test with the status information, thereby improving the test efficiency and test accuracy.

[0253] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for configuring test tasks on a test interface, characterized in that, The test interface includes a test process window, an action setting window, a judgment setting window, and a test step window. The method includes: In the action setting window, set the test actions that the test device can perform to form an action set; In the judgment setting window, the status information that the device under test can feedback is set to form a status set; Set at least one test process in the test process window; After clicking the test process in the test process window, the test step information corresponding to the test process is configured in the test step window based on the action set and the state set, forming an association between the test process and the corresponding test step information; wherein, the test step information includes the test action selected in the action set and the state information selected in the state set, as well as the order of each test action and each state information. The test task is generated based on the association between the test process and the corresponding test step information.

2. The method according to claim 1, characterized in that, After clicking the test process in the test process window, the test step window configures the test step information corresponding to the test process based on the action set and the state set, including: After clicking the test process in the test process window, in response to the operation of adding test steps and selection operation, an action test step or judgment test step corresponding to the selection operation is added. The selection operation is the operation of selecting the test action in the action set or selecting the status information in the status set. In response to the operation of selecting the execution time, the execution time of each of the action test steps and the judgment test steps is increased.

3. The method according to claim 2, characterized in that, After increasing the execution time of each of the action test steps and the judgment test steps in response to the operation of selecting the execution time, the method further includes: In response to the operation of adding a repeating step, the repeating step of executing the action test step is added after each of the judgment test steps if the judgment result is negative; In response to the operation of selecting the maximum number of repetitions, the maximum number of repetitions of the action test step is increased, such that the repeated step is invalid when the number of repetitions of the action test step is equal to the maximum number of repetitions; In response to selecting the repeat step, the repeat step is enabled; in response to not selecting the repeat step, the repeat step is disabled.

4. The method according to claim 1, characterized in that, Set at least one test process in the test process window, including: In response to the operation of adding the test process, the corresponding test process is added; In response to the operation of deleting the test process, the corresponding test process is deleted.

5. The method according to claim 1, characterized in that, The test actions that the test device can perform are set in the action setting window, including: In response to the operation of adding the test action, the setting of the corresponding test action is added; In response to the operation of setting the components for each of the test actions, the settings for the corresponding components for each of the test actions are increased; In response to the operation of setting the action value of each of the test actions, the corresponding action value of each of the test actions is increased; In response to the operation of deleting the test action, the settings of the corresponding test action, the settings of the components of the test action, and the settings of the action value of the test action are deleted.

6. The method according to claim 5, characterized in that, In response to the operation of setting the action value of each of the test actions, the setting of the corresponding action value of each of the test actions is increased, including: When multiple test actions have the same components, the action values ​​of multiple test actions are set so that the action values ​​of multiple test actions are different from each other.

7. The method according to claim 1, characterized in that, The determination setting window configures the status information that the device under test can feedback, including: In response to the operation of setting the status information, the corresponding status information setting is added; In response to the operation of setting the judgment position corresponding to each of the aforementioned status information, the setting of the judgment position corresponding to each of the aforementioned status information is added, wherein the judgment position is the position of the status information in the status feedback information of the device under test; In response to the operation of setting the judgment value of each of the aforementioned state information, the setting of the judgment value corresponding to each of the aforementioned state information is increased; In response to the operation of deleting the status information, the corresponding status information, the judgment position of the corresponding status information, and the judgment value of the corresponding status information are deleted.

8. The method according to claim 7, characterized in that, In response to the operation of setting the judgment value for each of the aforementioned state information, the setting of the judgment value corresponding to each of the aforementioned state information is increased, including: When multiple states correspond to the same judgment position, the judgment values ​​of multiple states are set such that the judgment values ​​of multiple states are different from each other.

9. A testing method for a device, applied to an automated testing platform, characterized in that, The automated testing platform includes a host computer and a testing device that are communicatively connected. The host computer and the device under test are communicatively connected. The host computer is configured with at least one testing process according to the method for configuring testing tasks of the testing interface as described in any one of claims 1 to 7. The method includes: The host computer sends control commands corresponding to the test actions and status information to the test device in the order of the test actions and status information in the test step window corresponding to the test process in the test task, and compares the status information fed back by the device under test.

10. The method according to claim 9, characterized in that, The host computer, following the order of the test actions and status information in the test step window corresponding to the test process, sequentially sends control commands corresponding to the test actions to the test device and performs status comparison on the status information fed back by the device under test, including: According to the action test steps, the test device sends the control command corresponding to the test action to control the corresponding component of the device under test to perform the corresponding action; Receive the status feedback information returned by the device under test; The state information is obtained by reading the state feedback information according to the judgment test step corresponding to the action test step, and the state information is judged to determine whether the state information is consistent with the corresponding state information to obtain the judgment result; Once all the aforementioned test procedures have been completed, all the aforementioned judgment results will be taken as the test results.

11. An automated testing platform, characterized in that, The device includes a host computer, a testing device, and a connection fixture. The connection fixture is used to send test commands from the host computer to the testing device and to feed back status parameters of the device under test to the host computer. The host computer includes one or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors. The one or more programs include methods for performing the method according to any one of claims 1 to 8 and the method according to claim 9 or 10.