Structure for double-contact measurement of parameters of five-pin electronic component
By designing the electrical connection between the PCB board and the wire post and the contact block, the complex operation and low efficiency problems in the parameter test of five-pin electronic components are solved, and automated testing is realized that simplifies operation and improves efficiency is achieved.
Patent Information
- Application Number
- CN202420431963.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-06
- Publication Date
- 2024-12-10
- Estimated Expiration
- 2034-03-06
AI Technical Summary
In the production of electronic components, the parameter testing of five-pin electronic components requires frequent clamping of the test clips at both ends of the test instrument on the corresponding pins of the electronic components to be tested, resulting in operation errors and low efficiency.
A structure for measuring the parameters of five-pin electronic components with dual contacts is designed, including PCB board and wire posts. The wire posts are electrically connected to the contact block. During testing, only the pins of the electronic components are in contact with the wire posts. , and test the test endpoint of the test instrument to contact the corresponding contact block to avoid frequent clamping operations.
Simplifies testing operations, reduces error rates, improves testing efficiency, and provides a foundation for automated testing, enabling more efficient parameter measurements.
Smart Images
Figure CN222145065U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of electronic component testing, in particular to a structure for double-contact point measurement of parameters of five-pin electronic components. Background Art
[0002] In the manufacturing of electronic components, it is very important to test parameters such as line-to-line capacitance, line-to-ground capacitance, inductance, and line-to-ground insulation resistance to ensure product quality and batch performance consistency. For example, in the production of filter devices and their components, the measurement of capacitance and inductance parameters is crucial to controlling the filtering performance of the product.
[0003] For a filter device with five pins, the test end is divided into five points, including the positive input terminal, the positive output terminal, the negative input terminal, the negative output terminal, and the output ground. Usually, the two test clips of the test instrument need to be clamped on the corresponding two test points for testing to meet the requirements of the test items.
[0004] When it is necessary to test the line-to-line capacitance (the capacitance between the + pole and the - pole), clamp the two test clips of the test instrument on the positive and negative poles of the input or output terminal respectively; when it is necessary to test the line-to-ground capacitance (the capacitance between the + pole or - pole and the output ground), clamp the two test clips of the test instrument on the positive pole of the output terminal and the output ground, or on the negative pole of the output terminal and the output ground.
[0005] However, frequently clamping the two-end test clips of the test instrument on the corresponding pins of the electronic components to be tested and then removing them after testing is prone to errors and has low efficiency. Utility Model Content
[0006] To this end, the utility model provides a structure for double-contact measurement of parameters of five-pin electronic components, which mainly solves the technical problems of the prior art of frequently clamping the two end test clips of the test instrument on the corresponding pins of the electronic components to be tested, which is prone to errors and has low efficiency.
[0007] In order to achieve the above purpose, the utility model provides the following technical solutions:
[0008] A structure for measuring parameters of a five-pin electronic component with two contacts comprises a PCB board; the PCB board is provided with a first conductor post, a second conductor post, a third conductor post, a fourth conductor post and a fifth conductor post adapted to the pin positions of the five-pin electronic component, and used to contact the pins of the five-pin electronic component; the first conductor post and the third conductor post correspond to the positive or negative pole of the output end of the five-pin electronic component; the second conductor post corresponds to the grounding of the output end of the five-pin electronic component; the fourth conductor post and the fifth conductor post correspond to the positive or negative pole of the input end of the five-pin electronic component; a contact area is provided on the top surface of the PCB board; the contact area comprises a first contact block, a second contact block, a fourth contact block and a fifth contact block; a third contact block is provided on the top surface of the PCB board on the front side of the contact area; the first contact block is electrically connected to the fifth conductor post; the second contact block is electrically connected to the fourth conductor post; the third contact block is electrically connected to the second conductor post; the fourth contact block is electrically connected to the third conductor post; and the fifth contact block is electrically connected to the first conductor post.
[0009] Preferably, the first conductor post is provided with a first contact cap; the second conductor post is provided with a second contact cap; the third conductor post is provided with a third contact cap; the fourth conductor post is provided with a fourth contact cap; and the fifth conductor post is provided with a fifth contact cap.
[0010] Preferably, buffer springs are provided between the first wire post and the first contact cap, between the second wire post and the second contact cap, between the third wire post and the third contact cap, between the fourth wire post and the fourth contact cap, and between the fifth wire post and the fifth contact cap.
[0011] Preferably, a sixth contact block is provided on the top surface of the PCB board at the rear side of the contact area; and the sixth contact block is electrically connected to the third contact block.
[0012] Preferably, a placement platform is provided on the top surface of the PCB board; the placement platform is provided with a plurality of through pin holes; the plurality of pin holes are respectively located directly above the first wire post, the second wire post, the third wire post, the fourth wire post and the fifth wire post.
[0013] The utility model has at least the following beneficial effects:
[0014] A PCB board is provided, and the PCB board is provided with a first conductor post, a second conductor post, a third conductor post, a fourth conductor post and a fifth conductor post which are adapted to the pin positions of the five-pin electronic component. The first conductor post and the third conductor post correspond to the positive or negative pole of the output end of the five-pin electronic component, the second conductor post corresponds to the grounding of the output end of the five-pin electronic component, the fourth conductor post and the fifth conductor post correspond to the positive or negative pole of the input end of the five-pin electronic component, and a first contact block, a second contact block, a third contact block, a fourth contact block and a fifth contact block are provided on the top surface of the PCB board, the first contact block is electrically connected to the fifth conductor post, the second contact block is electrically connected to the fourth conductor post, the third contact block is electrically connected to the second conductor post, the fourth contact block is electrically connected to the third conductor post, and the fifth contact block is electrically connected to the first conductor post. During the test, it is only necessary to make the pins of the five-pin electronic component contact with the first wire post, the second wire post, the third wire post, the fourth wire post and the fifth wire post respectively, and then make the two test terminals of the test instrument contact with the first contact block, the second contact block, the third contact block, the fourth contact block or the fifth contact block respectively, so as to test the parameters of the five-pin electronic component. It is not necessary to frequently clamp the test clips at both ends of the test instrument on the corresponding pins of the electronic component to be tested and then remove them after the test to avoid operating errors. At the same time, it can also be used as a structure of automatic testing to realize automatic testing.
[0015] It can be seen that the structure of the utility model for double-contact measurement of parameters of five-pin electronic components has the advantages of simple structure, convenient operation, avoidance of test errors, improved work efficiency, and applicability to automatic testing. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] In order to more clearly explain the prior art and the present invention, the following briefly introduces the drawings required for describing the prior art and the present invention. Obviously, the drawings described below are only exemplary, and for ordinary technicians in this field, other drawings can be derived from the provided drawings without creative work.
[0017] The structures, proportions, sizes, etc. illustrated in this specification are only used to match the contents disclosed in the specification so that people familiar with this technology can understand and read them. They are not used to limit the conditions under which the present invention can be implemented. Any structural modification, change in proportion or adjustment of size should still fall within the scope of the technical contents disclosed in the present invention without affecting the effects and purposes that can be achieved by the present invention.
[0018] Figure 1 This is a schematic diagram of the structure of the utility model for double-contact measurement of parameters of five-pin electronic components;
[0019] Figure 2This is a schematic diagram of the structure of a PCB board used for double-contact measurement of parameters of five-pin electronic components in the utility model;
[0020] Figure 3 The utility model is an attachment of the structure for double-contact measurement of parameters of five-pin electronic components. Figure 2 Bottom view of
[0021] Figure 4 This is a schematic diagram of the use state of the structure of the utility model for double-contact measurement of parameters of five-pin electronic components;
[0022] Description of reference numerals:
[0023] 1. PCB board; 101. first contact block; 102. second contact block; 103. third contact block; 104. fourth contact block; 105. fifth contact block; 106. sixth contact block; 2. first conductor post; 201. first contact cap; 3. second conductor post; 301. second contact cap; 4. third conductor post; 401. third contact cap; 5. fourth conductor post; 501. fourth contact cap; 6. fifth conductor post; 601. fifth contact cap; 7. placement table; 701. pin hole; 8. electronic components. DETAILED DESCRIPTION
[0024] The present application is further described below in detail through specific embodiments in conjunction with the accompanying drawings.
[0025] In the description of this application: unless otherwise specified, the meaning of "plurality" is two or more. The terms "first", "second", "third", etc. in this application are intended to distinguish the objects referred to, and do not have special meanings in terms of technical connotations (for example, they should not be understood as emphasizing the importance or order, etc.). Expressions such as "including", "comprising", "having", etc. also mean "not limited to" (certain units, components, materials, steps, etc.).
[0026] The terms such as "upper", "lower", "left", "right", "middle", etc. used in this application are usually used to facilitate intuitive understanding by comparing with the accompanying drawings, and are not absolute limitations on the positional relationship in the actual product. Without departing from the technical concept disclosed in this application, changes in these relative positional relationships should also be regarded as the scope of this application.
[0027] The utility model is used for double-contact measurement of parameters of five-pin electronic components. Figures 1 to 3As shown, a PCB board 1 is provided, and the PCB board 1 is provided with a first wire post 2, a second wire post 3, a third wire post 4, a fourth wire post 5 and a fifth wire post 6 adapted to the pin positions of the five-pin electronic component. When used for testing, the pins of the five-pin electronic component are made to contact with the aforementioned wire posts correspondingly, the first wire post 2 and the third wire post 4 correspond to the positive or negative pole of the output end of the five-pin electronic component, the second wire post 3 corresponds to the grounding of the output end of the five-pin electronic component, and the fourth wire post 5 and the fifth wire post 6 correspond to the grounding of the output end of the five-pin electronic component. The positive or negative pole of the device input terminal, a contact area is provided on the top surface of the PCB board 1, the contact area includes a first contact block 101, a second contact block 102, a fourth contact block 104 and a fifth contact block 105, a third contact block 103 is provided on the top surface of the PCB board 1 on the front side of the contact area, the first contact block 101 is electrically connected to the fifth wire column 6, the second contact block 102 is electrically connected to the fourth wire column 5, the third contact block 103 is electrically connected to the second wire column 3, the fourth contact block 104 is electrically connected to the third wire column 4, and the fifth contact block 105 is electrically connected to the first wire column 2. In this way, during the test, it is only necessary to make the pins of the five-pin electronic component contact with the first wire post 2, the second wire post 3, the third wire post 4, the fourth wire post 5 and the fifth wire post 6 respectively, and then make the two test terminals of the test instrument contact the first contact block 101, or the second contact block 102, or the third contact block 103, or the fourth contact block 104, or the fifth contact block 105 respectively, so as to test the parameters of the five-pin electronic component, and it is not necessary to frequently clamp the test clips at both ends of the test instrument on the corresponding pins of the electronic component to be tested. The five-pin electronic component to be tested can be grasped by a mechanical arm so that its pins contact the first wire post 2, the second wire post 3, the third wire post 4, the fourth wire post 5 and the fifth wire post 6 respectively, and then the two test terminals of the test instrument are moved to the target position by a lifting structure so that they contact the first contact block 101, the second contact block 102, the third contact block 103, the fourth contact block 104, or the fifth contact block 105.
[0028] Preferably, in order to increase the contact area and facilitate pin contact, the first wire post 2 is provided with a first contact cap 201, the second wire post 3 is provided with a second contact cap 301, the third wire post 4 is provided with a third contact cap 401, the fourth wire post 5 is provided with a fourth contact cap 501, and the fifth wire post 6 is provided with a fifth contact cap 601.
[0029] Preferably, in order to make good contact between the pins and the contact caps of the five-pin electronic component, the five-pin electronic component will be pressed down during operation. In order to enhance the comfort of operation when pressing down, buffer springs are provided between the first wire post 2 and the first contact cap 201, between the second wire post 3 and the second contact cap 301, between the third wire post 4 and the third contact cap 401, between the fourth wire post 5 and the fourth contact cap 501, and between the fifth wire post 6 and the fifth contact cap 601. Taking the first wire post 2 and the first contact cap 201 as an example, specifically, a sliding hole can be provided in the first wire post 2, a sliding rod is provided at the bottom of the first contact cap 201, the sliding rod can be slidably embedded in the sliding hole, a buffer spring is placed in the sliding hole, and the bottom of the sliding rod is in contact with the top surface of the buffer spring. This structure is a prior art well known to those skilled in the art and will not be described in detail here.
[0030] Preferably, to facilitate operation and avoid the situation in which the two test points of the test instrument have a too large span when contacting and testing the first contact block 101, the second contact block 102, the fourth contact block 104 and the fifth contact block 105, thereby causing discomfort in operation, a sixth contact block 106 is provided on the top surface of the PCB board 1 on the rear side of the contact area, and the sixth contact block 106 is electrically connected to the third contact block 103. In this way, when the output end needs to be grounded, the nearby third contact block 103 or the sixth contact block 106 can be conveniently selected.
[0031] Preferably, in order to facilitate the placement of five-pin electronic components, a placement platform 7 is provided on the top surface of the PCB board 1, and a plurality of through pin holes 701 are opened on the placement platform 7, and the plurality of pin holes 701 are respectively located directly above the first wire post 2, the second wire post 3, the third wire post 4, the fourth wire post 5, and the fifth wire post 6. During testing, the five-pin electronic component is placed on the placement platform 7, and the pins of the five-pin electronic component are inserted through the corresponding pin holes 701 and contact the first wire post 2, or the second wire post 3, or the third wire post 4, or the fourth wire post 5, or the fifth wire post 6.
[0032] When using, Figure 4 As shown, a five-pin electronic component 8 is placed on a placement table 7, and the pins of the five-pin electronic component 8 pass through the pin holes 701 and are inserted into the first wire post 2, or the second wire post 3, or the third wire post 4, or the fourth wire post 5, or the fifth wire post 6, and the two test terminals of the test instrument are respectively contacted with the first contact block 101, or the second contact block 102, or the third contact block 103, or the fourth contact block 104, or the fifth contact block 105 to perform tests on corresponding parameters.
[0033] The above is a relatively specific and detailed description of the present application through general description and specific embodiments. It should be understood that, based on the technical concept of the present application, several conventional adjustments or further innovations can be made to these specific embodiments; however, as long as they do not deviate from the technical concept of the present application, the technical solutions obtained by these conventional adjustments or further innovations also fall within the scope of protection of the claims of the present application.
Claims
1. A structure for double-contact measurement of parameters of five-pin electronic components, characterized in that: The invention comprises a PCB board (1); the PCB board (1) is provided with a first conductor post (2), a second conductor post (3), a third conductor post (4), a fourth conductor post (5) and a fifth conductor post (6) adapted to the positions of the pins of the five-pin electronic component, and used to contact the pins of the five-pin electronic component; the first conductor post (2) and the third conductor post (4) correspond to the positive pole or the negative pole of the output end of the five-pin electronic component; the second conductor post (3) corresponds to the grounding of the output end of the five-pin electronic component; the fourth conductor post (5) and the fifth conductor post (6) correspond to the positive pole or the negative pole of the input end of the five-pin electronic component; the PCB board (1) A contact area is provided on the top surface; the contact area includes a first contact block (101), a second contact block (102), a fourth contact block (104) and a fifth contact block (105); a third contact block (103) is provided on the top surface of the PCB board (1) at the front side of the contact area; the first contact block (101) is electrically connected to the fifth wire post (6); the second contact block (102) is electrically connected to the fourth wire post (5); the third contact block (103) is electrically connected to the second wire post (3); the fourth contact block (104) is electrically connected to the third wire post (4); and the fifth contact block (105) is electrically connected to the first wire post (2).
2. The structure for double-contact measurement of parameters of five-pin electronic components according to claim 1, characterized in that: The first conductor post (2) is provided with a first contact cap (201); the second conductor post (3) is provided with a second contact cap (301); the third conductor post (4) is provided with a third contact cap (401); the fourth conductor post (5) is provided with a fourth contact cap (501); and the fifth conductor post (6) is provided with a fifth contact cap (601).
3. The structure for double-contact measurement of parameters of five-pin electronic components according to claim 2, characterized in that: Buffer springs are provided between the first conductor post (2) and the first contact cap (201), between the second conductor post (3) and the second contact cap (301), between the third conductor post (4) and the third contact cap (401), between the fourth conductor post (5) and the fourth contact cap (501), and between the fifth conductor post (6) and the fifth contact cap (601).
4. The structure for double-contact measurement of parameters of five-pin electronic components according to claim 1, characterized in that: A sixth contact block (106) is provided on the top surface of the PCB board (1) at the rear side of the contact area; the sixth contact block (106) is electrically connected to the third contact block (103).
5. The structure for double-contact measurement of parameters of five-pin electronic components according to any one of claims 1 to 4, characterized in that: The top surface of the PCB board (1) is provided with a placement platform (7); the placement platform (7) is provided with a plurality of through pin holes (701); the plurality of pin holes (701) are respectively located directly above the first conductor post (2), the second conductor post (3), the third conductor post (4), the fourth conductor post (5) and the fifth conductor post (6).