DCDC power supply aging test device

Abstract

The utility model provides a DCDC power supply aging test device, which relates to the technical field of PCS function detection and comprises an equipment storage box, a placement cavity is arranged in the equipment storage box, a test board is arranged in the placement cavity, a cover plate is arranged above the equipment storage box, a plurality of DCDC power supplies a are arranged at the top of the test board, and a plurality of DCDC power supplies b are arranged on the upper surface of the test board; the storage assembly is arranged between the equipment storage box and the cover plate and is used for storing the test board; and the test assembly is arranged in the equipment storage box and is used for testing the DCDC power supply a and the DCDC power supply b. According to the DCDC power supply aging test device, through the arrangement of the storage assembly, the DCDC power supply aging test device can be prevented from being damaged by external factors such as dust, moisture and mechanical collision, the service life of the DCDC power supply aging test device is prolonged, meanwhile, through the arrangement of the test assembly, multiple DCDC power supply modules can be aged at the same time, the test is flexible, and the efficiency is high.

Description

Technical Field

[0001] The utility model relates to the technical field of PCS function detection, in particular to a DCDC power supply aging test device. Background Art

[0002] The DCDC power aging test device is a device specially used to test and evaluate the stability and reliability of the DCDC power module under long-term operation conditions. The main purpose of this device is to simulate various stress factors in the actual use environment, such as voltage fluctuations, temperature changes, load changes, etc., to verify the performance and life of the power module under these conditions.

[0003] However, the existing DCDC power aging test device still has certain defects when in use. For example, the existing aging device and test method are relatively simple. Each device must be equipped with two bidirectional programmable power supplies to age the DCDC power module in the PCS, which has high overall cost and low test efficiency. In addition, when the test board of the existing DCDC power aging test device is not in use, the test board is directly exposed to the outside and is easily damaged by external factors such as dust, water vapor or mechanical collision, thereby reducing the service life of the test device. Utility Model Content

[0004] The utility model aims to solve the shortcomings existing in the background technology and provides a DCDC power aging test device. In order to solve the above problems, the storage component is set to prevent it from being damaged by external factors such as dust, moisture, mechanical collision, etc., thereby extending its service life. At the same time, through the setting of the test component, multiple DCDC power modules can be aged at the same time, and the test is flexible and efficient.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a DCDC power aging test device, comprising: an equipment storage box, a placement cavity is opened inside the equipment storage box, a test board is arranged inside the placement cavity, a cover is arranged above the equipment storage box, a plurality of DCDC power supplies a are arranged on the top of the test board, a plurality of DCDC power supplies b are arranged on the upper surface of the test board, a storage component arranged between the equipment storage box and the cover is used for storing the test board, and a test component arranged inside the equipment storage box is used for testing the DCDC power supplies a and the DCDC power supplies b.

[0006] Furthermore, the storage assembly includes: connecting rods arranged on both sides of the equipment storage box, the two connecting rods are symmetrically arranged about the equipment storage box, a plurality of limiting holes are opened on one side of the two connecting rods, a telescopic cavity is opened on the top of the two connecting rods, a telescopic rod is arranged inside the telescopic cavity, the top of the telescopic rod is fixedly connected to the cover plate, a spring cavity is opened inside the telescopic rod, a limiting connecting block is arranged inside the spring cavity, one end of the limiting connecting block extends into the telescopic cavity and is connected to a card block.

[0007] Furthermore, a spring is provided inside the spring cavity, one side of the limiting connecting block is fixedly connected to the spring, and the clamping block is clamped and connected to the limiting hole.

[0008] Furthermore, a through hole is provided on one side of the two connecting rods, and a limiting rotating shaft is provided on one side of the two connecting rods.

[0009] Furthermore, the test component includes: a bidirectional programmable power supply arranged on the upper surface of the test board, the DCDC power supply b and the DCDC power supply a are both provided with PCS positive and negative terminals, multiple DCDC power supplies b and multiple DCDC power supplies a are both provided with PACK positive and negative terminals, a control panel arranged on one side of the equipment storage box, and the control panel is connected to the test board through wires.

[0010] Furthermore, the bidirectional programmable power supply is electrically connected to the PACK terminals of the multiple DCDC power supplies a and the multiple DCDC power supplies b respectively, and the PCS positive and negative terminals of the multiple DCDC power supplies a are electrically connected to the positive and negative terminals of the PACK terminals of the multiple DCDC power supplies b.

[0011] Furthermore, a display screen is provided on one side of the equipment storage box, and the display screen is electrically connected to the test board through wires.

[0012] The utility model provides a DCDC power supply aging test device, which has the following beneficial effects:

[0013] The utility model has the advantages that, by setting the equipment storage box and the cover plate in the storage assembly, the test board can be properly stored and protected when not being tested, preventing it from being damaged by external factors such as dust, moisture, mechanical collision, etc., thereby extending its service life;

[0014] Secondly, through the setting of the test components, multiple DCDC power modules can be aged simultaneously through a bidirectional programmable power supply, without the need to use two current sources for support aging. The DCDC power module test is flexible and efficient. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a schematic diagram of the overall structure of the utility model.

[0016] Figure 2 It is a sectional view of the overall structure of the utility model.

[0017] Figure 3 This is a schematic diagram of the cover structure of the utility model.

[0018] Figure 4 This is a schematic diagram of the card block structure of the utility model.

[0019] Figure 5 For the utility model Figure 2 Enlarged view of point A in .

[0020] Figure 6 This is a boost aging circuit diagram of a DCDC power supply of the utility model.

[0021] Figure 7 This is a step-down aging circuit diagram of a DCDC power supply of the utility model.

[0022] Figure 1-7 In: 1. Equipment storage box; 101. Display screen; 102. Control panel; 103. Limiting shaft; 104. Placement cavity; 2. Cover plate; 201. Telescopic rod; 202. Spring cavity; 203. Spring; 204. Limiting connecting block; 205. Card block; 3. Connecting rod; 301. Limiting hole; 302. Telescopic cavity; 303. Through hole; 4. Test board; 401. Bidirectional programmable power supply; 402. DCDC power supply a; 403. DCDC power supply b. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0024] The disclosure below provides many different embodiments or examples to realize the different structures of the present application. In order to simplify the disclosure of the present application, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present application. In addition, the present application can repeat reference numbers and / or reference letters in different examples, and this repetition is for the purpose of simplification and clarity, which itself does not indicate the relationship between the various embodiments and / or settings discussed. In addition, the various specific processes and material examples provided by the present application, but those of ordinary skill in the art can appreciate the application of other processes and / or the use of other materials.

[0025] The embodiment of the present application provides a DCDC power aging test device, which can prevent it from being damaged by external factors such as dust, moisture, and mechanical collision through the setting of the storage component, thereby extending its service life. At the same time, through the setting of the test component, multiple DCDC power modules can be aged at the same time, and the test is flexible and efficient. The DCDC power aging test device is described in detail below. It should be noted that the description order of the following embodiments is not intended to limit the preferred order of the embodiments.

[0026] The present application is described in detail below with reference to the accompanying drawings and specific implementation methods.

[0027] Example 1

[0028] See also Figure 1-7 In this embodiment, a DCDC power supply aging test device is provided, comprising:

[0029] An equipment storage box 1 is provided with a placement cavity 104 inside the equipment storage box 1, a test board 4 is provided inside the placement cavity 104, a cover plate 2 is provided above the equipment storage box 1, a plurality of DCDC power supplies a402 are provided on the top of the test board 4, and a plurality of DCDC power supplies b403 are provided on the upper surface of the test board 4; a storage component provided between the equipment storage box 1 and the cover plate 2 is used for storing the test board 4; and a test component provided inside the equipment storage box 1 is used for testing the DCDC power supplies a402 and the DCDC power supplies b403.

[0030] Among them, by setting the equipment storage box 1 and the cover plate 2 in the storage assembly, the test board 4 can be properly stored and protected when not being tested, preventing it from being damaged by external factors such as dust, moisture, mechanical collision, etc., thereby extending its service life;

[0031] Secondly, through the setting of the test component, multiple DCDC power supplies a402 and DCDC power supplies b403 can be aged simultaneously through a bidirectional programmable power supply 401, without using two current sources for support aging. The DCDC power supply module test is flexible and efficient.

[0032] Example 2

[0033] On the basis of Example 1, the storage component includes: connecting rods 3 arranged on both sides of the equipment storage box 1, and the two connecting rods 3 are symmetrically arranged about the equipment storage box 1; a plurality of limiting holes 301 are opened on one side of the two connecting rods 3, and a telescopic cavity 302 is opened on the top of the two connecting rods 3, and a telescopic rod 201 is arranged inside the telescopic cavity 302, and the top of the telescopic rod 201 is fixedly connected to the cover plate 2, and a spring cavity 202 is opened inside the telescopic rod 201, and a limiting connecting block 204 is arranged inside the spring cavity 202, and one end of the limiting connecting block 204 extends into the telescopic cavity 302 and is connected to a clamping block 205; a spring 203 is arranged inside the spring cavity 202, and one side of the limiting connecting block 204 is fixedly connected to the spring 203, and the clamping block 205 is clamped and connected with the limiting hole 301; a through hole 303 is opened on one side of the two connecting rods 3, and a limiting rotating shaft 103 is arranged on one side of the two connecting rods 3.

[0034] When it is necessary to use the test device to perform aging detection on the DCDC power supply a402 and the DCDC power supply b403, the user can press the blocks 205 on both sides of the connecting rod 3 so that the blocks 205 push the limiting connecting block 204 to compress the spring 203, thereby moving the blocks 205 into the telescopic cavity 302, and then pull the cover 2 so that the telescopic rod 201 drives the blocks 205 to move upward, thereby changing the distance between the telescopic rod 201 and the connecting rod 3 until the cover 2 moves to the limiting hole 301 on the top side of the connecting rod 3. At this time, the spring 203 is released and engages with the limiting hole 301 on the top side of the connecting rod 3. At this time, the cover 2 is pulled to make the connecting rod 3 rotate around the limiting shaft 103, thereby rotating the cover 2 to one side of the equipment storage box 1, thereby exposing the test board 4.

[0035] Furthermore, when the aging test of DCDC power supply a402 and DCDC power supply b403 is completed, the user can pull the cover 2 to rotate the connecting rod 3 around the limiting shaft 103, and then when the cover 2 is moved to the top of the equipment storage box 1, press the block 205 to compress the spring 203, so that the telescopic rod 201 moves downward along the telescopic cavity 302 until the bottom of the telescopic rod 201 contacts the bottom of the inner wall of the telescopic cavity 302. At this time, the block 205 is engaged with the limiting hole 301 on one side of the bottom of the connecting rod 3, thereby completing the storage of the test board 4.

[0036] Example 3

[0037] On the basis of Example 1, the test component includes: a bidirectional programmable power supply 401 arranged on the upper surface of the test board 4, a PCS positive and negative terminal is provided on the DCDC power supply b403 and the DCDC power supply a402, and a plurality of DCDC power supplies b403 and a plurality of DCDC power supplies a402 are provided with a PACK positive and negative terminal; a control panel 102 is arranged on one side of the equipment storage box 1, and the control panel 102 is connected to the test board 4 through wires; the bidirectional programmable power supply 401 is electrically connected to the PACK terminals of the plurality of DCDC power supplies a402 and the plurality of DCDC power supplies b403, respectively, and the PCS positive and negative terminals of the plurality of DCDC power supplies a402 are electrically connected to the PACK positive and negative terminals of the plurality of DCDC power supplies b403; a display screen 101 is provided on one side of the equipment storage box 1, and the display screen 101 is electrically connected to the test board 4 through wires.

[0038] When the DCDC power supply a402 needs to be boosted and aged, and the DCDC power supply b403 needs to be bucked and aged, the bidirectional programmable power supply 401 is set to a constant voltage VO output, and the DCDC power supply a402 is set to be boosted and VA current limited and AA aging, wherein the voltage VB is greater than the voltage VO, and the current AB is less than AA, so that the current of the DCDC power supply b403 flows to the DCDC power supply a402, thereby achieving boost aging of the DCDC power supply a402 and buck aging of the DCDC power supply b403.

[0039] Furthermore, when it is necessary to perform voltage reduction aging on the DCDC power supply a402 and voltage boost aging on the DCDC power supply b403, the bidirectional programmable power supply 401 is set to a constant voltage VO output, the DCDC power supply a402 is set to perform voltage reduction VA current limiting AA aging, and the DCDC power supply b403 is set to perform voltage boost VB current limiting AB aging, wherein the voltage VA is greater than the voltage VO, and the current AA is less than AB, so that the current of the DCDC power supply a402 flows to the DCDC power supply b403, thereby achieving voltage reduction aging of the DCDC power supply a402 and voltage boost aging of the DCDC power supply b403, thereby improving the detection efficiency.

[0040] Among them, through the setting of the display screen 101, the test results of the DCDC power supply a402 and the DCDC power supply b403 can be displayed, and through the setting of the control panel, the on and off of the current on the test board 4 can be controlled, and through the setting of the bidirectional programmable power supply 401, it can compensate for the energy loss between the DCDC power supply a402 and the DCDC power supply b403 and maintain the aging process test.

[0041] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0042] The above is a detailed introduction to a DCDC power supply aging test device provided in an embodiment of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the technical solution and its core idea of ​​the present application. Ordinary technicians in this field should understand that they can still modify the technical solutions recorded in the aforementioned embodiments, or replace some of the technical features therein with equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A DCDC power supply aging test device, characterized in that: include: A device storage box (1), wherein a placement cavity (104) is provided inside the device storage box (1), a test board (4) is provided inside the placement cavity (104), a cover plate (2) is provided above the device storage box (1), a plurality of DC-DC power supplies a (402) are provided on the top of the test board (4), and a plurality of DC-DC power supplies b (403) are provided on the upper surface of the test board (4); A storage assembly provided between the equipment storage box (1) and the cover plate (2), used for storing the test plate (4); and The test component arranged inside the equipment storage box (1) is used for testing the DCDC power supply a (402) and the DCDC power supply b (403).

2. The DCDC power supply aging test device according to claim 1, characterized in that: The storage assembly comprises: Connecting rods (3) arranged on both sides of the equipment storage box (1), the two connecting rods (3) being symmetrically arranged with respect to the equipment storage box (1); A plurality of limiting holes (301) are provided on one side of the two connecting rods (3); a telescopic cavity (302) is provided on the top of each of the two connecting rods (3); a telescopic rod (201) is provided inside the telescopic cavity (302); the top end of the telescopic rod (201) is fixedly connected to the cover plate (2); a spring cavity (202) is provided inside the telescopic rod (201); a limiting connection block (204) is provided inside the spring cavity (202); one end of the limiting connection block (204) extends into the telescopic cavity (302) and is connected to a clamping block (205).

3. The DCDC power supply aging test device according to claim 2, characterized in that: A spring (203) is provided inside the spring cavity (202); one side of the limiting connection block (204) is fixedly connected to the spring (203); and the clamping block (205) is clamped and connected to the limiting hole (301).

4. The DCDC power supply aging test device according to claim 2, characterized in that: One side of the two connecting rods (3) is provided with a through hole (303), and one side of the two connecting rods (3) is provided with a limiting rotating shaft (103).

5. The DCDC power supply aging test device according to claim 1, characterized in that: The test components include: A bidirectional programmable power supply (401) is arranged on the upper surface of the test board (4), the DCDC power supply b (403) and the DCDC power supply a (402) are both provided with PCS positive and negative terminals, and a plurality of the DCDC power supplies b (403) and a plurality of the DCDC power supplies a (402) are both provided with PACK positive and negative terminals; A control panel (102) is arranged on one side of the equipment storage box (1), and the control panel (102) is connected to the test board (4) via an electric wire.

6. The DCDC power supply aging test device according to claim 5, characterized in that: The bidirectional programmable power supply (401) is electrically connected to the PACK terminals of the plurality of DCDC power supplies a (402) and the plurality of DCDC power supplies b (403), respectively, and the PCS positive and negative terminals of the plurality of DCDC power supplies a (402) are electrically connected to the positive and negative terminals of the PACK terminals of the plurality of DCDC power supplies b (403).

7. The DCDC power supply aging test device according to claim 1, characterized in that: A display screen (101) is provided on one side of the equipment storage box (1), and the display screen (101) is electrically connected to the test board (4) via electric wires.

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