Solar cell IV tester based on MCU and FPGA architecture

Abstract

According to the solar cell IV tester based on the MCU and FPGA architecture, the functions of external communication, flow control, data processing and the like can be realized through the MCU master control module, and the acquisition of voltage, current and light intensity data can be synchronously carried out in the excitation scanning process through the FPGA module. According to the solar cell IV tester, data acquisition and process control are performed in different modules, so that the efficiency in solar cell testing is greatly improved, the accuracy of measured data can be ensured, and the performance of the solar cell IV tester is remarkably enhanced.

Description

Technical Field

[0001] The utility model relates to the field of solar cells, in particular to an IV tester for solar cell sheets based on an MCU and FPGA architecture. Background Art

[0002] The development of the solar industry has increased the demand for solar cell testing and measurement solutions, and as the size and efficiency of solar cells increase, there is a need to develop cell testing equipment with a larger test range and higher accuracy.

[0003] The IV curve of the solar cell IV tester can reflect the open circuit voltage, short circuit current, maximum power and other parameters of the solar cell IV tester, and then analyze the process, defects, quality, etc. of the solar cell IV tester. Considering the production efficiency, cost and other issues, the requirements for test time are getting higher and higher. Traditional solar cells mostly use a single MCU as the core of the test equipment, which is responsible for collecting data and controlling the test process. This control method will increase the test time and cannot synchronize data between the collection points, affecting the test accuracy. Utility Model Content

[0004] The utility model aims to provide a solar cell IV tester based on MCU and FPGA architecture to improve the stability and accuracy of the test.

[0005] The utility model provides a solar cell IV tester based on MCU and FPGA architecture, characterized in that it comprises: an MCU main control module, a data acquisition module, an FPGA module and a load module;

[0006] The MCU main control module is configured at least to communicate and interact with the FPGA module and external devices, to set and generate a load curve, and to control a load curve test process;

[0007] The data acquisition module is configured to at least measure the current, voltage, temperature of the solar cell and the irradiance data of the light source;

[0008] The FPGA module is at least configured to output the load curve and synchronously collect different data output by the data acquisition module;

[0009] The load module is at least configured to provide a bipolar load for the solar cell according to the load curve, and to output and / or absorb power.

[0010] As a further improvement of the present invention, the MCU main control module is configured to exchange data with the FPGA module through a flexible static storage controller.

[0011] As a further improvement of the present invention, the MCU main control module is configured to perform a burning process with the FPGA module through a fast passive parallel configuration.

[0012] As a further improvement of the present invention, the MCU main control module is configured to generate a load curve and send it to the FPGA module after receiving the excitation range data, and to control the FPGA module to output the load curve and collect data after receiving the measurement instruction.

[0013] As a further improvement of the utility model, the data acquisition module includes a voltage acquisition unit, a current acquisition unit, a light intensity acquisition unit and a temperature acquisition unit;

[0014] The voltage collection unit is configured to collect the voltage of the solar cell;

[0015] The current collection unit is configured to collect the output current of the solar cell;

[0016] The light intensity collection unit is configured to collect the irradiance of the light source;

[0017] The temperature acquisition unit is configured to acquire the temperature of the test equipment and the environment.

[0018] As a further improvement of the present invention, the solar cell IV tester further includes a communication module, which is configured to implement communication interaction between the MCU main control module and external devices.

[0019] As a further improvement of the present invention, the solar cell IV tester further comprises an interface module, and the interface module comprises a connection interface between the solar cell IV tester and an external device.

[0020] As a further improvement of the present invention, the interface module includes an RS232 interface, an RS485 interface, a LAN interface, a USB interface, an infrared temperature measurement interface, a monitoring battery interface, and an IO interface.

[0021] As a further improvement of the present invention, the solar cell IV tester further includes an alarm module, which is configured to monitor and feedback abnormal conditions occurring during the operation of the solar cell IV tester.

[0022] As a further improvement of the present invention, the alarm module is configured to monitor and feedback overheating and overcurrent conditions that occur during the operation of the solar cell IV tester, and feedback abnormality type and occurrence time data.

[0023] The beneficial effects of the utility model are as follows: the solar cell IV tester based on MCU and FPGA architecture can realize functions such as external communication, process control and data processing through the MCU main control module, and can synchronously collect voltage, current and light intensity data during the excitation scanning process through the FPGA module. The data collection and process control are divided into different modules to work, which greatly improves the efficiency of solar cell testing, while ensuring the accuracy of measurement data, and significantly enhances the performance of the solar cell IV tester. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a structural block diagram of a solar cell IV tester in one embodiment of the utility model. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solution and advantages of the utility model clearer, the technical solution of the utility model will be clearly and completely described below in combination with the specific implementation methods of the utility model and the corresponding drawings. Obviously, the described implementation methods are only part of the implementation methods of the utility model, not all of the implementation methods. Based on the implementation methods in the utility model, all other implementation methods obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0026] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0027] This embodiment provides a solar cell IV tester based on MCU (Microcontroller Unit) and FPGA (Field-Programmable Gate Array) architecture, which can realize external communication, process control and data processing through the MCU main control module, and can synchronously collect voltage, current and light intensity data during the excitation scan process through the FPGA module. The data collection and process control are divided into different modules to work, which greatly improves the efficiency of solar cell testing, while ensuring the accuracy of measurement data, and significantly enhances the performance of the solar cell IV tester.

[0028] like Figure 1As shown, this embodiment provides a solar cell IV tester based on MCU and FPGA architecture, which includes: MCU main control module 1, data acquisition module 2, FPGA module 3 and load module 4. Among them, the MCU main control module 1 is at least configured to communicate and interact with the FPGA module 3 and external devices, set to generate a load curve, and to control the load curve test process. The data acquisition module 2 is at least configured to at least measure the current, voltage, temperature and irradiance data of the solar cell. The FPGA module 3 is at least configured to output the load curve and synchronously collect different data output by the data acquisition module 2. The load module 4 is at least configured to provide a bipolar load for the solar cell according to the load curve, and output and / or absorb power.

[0029] The MCU main control module 1 is the control core of the solar cell IV tester, which is used to coordinate and control the work of each module inside the device and ensure that the device operates as expected by executing predetermined instructions and algorithms.

[0030] The MCU main control module 1 is configured to exchange data with the FPGA module 3 through a flexible static memory controller (FSMC). The flexible static memory controller can provide an efficient and reliable data transmission channel, so that a large amount of data can be quickly and efficiently transmitted between the MCU main control module 1 and the FPGA module 3, thereby improving the data throughput of the system, so that the voltage, current, light intensity and other data collected in real time by the FPGA module 3 can be accurately processed through the MCU main control module 1, and the two modules can work efficiently together.

[0031] Furthermore, the MCU main control module 1 is also configured to perform burning processing with the FPGA module 3 through the Fast Passive Parallel Configuration (FPP), thereby providing support for the dynamics and programmability of the system. Fast passive parallel configuration is an FPGA configuration method that allows the FPGA to be dynamically configured and re-burned at runtime. Therefore, the MCU main control module 1 can perform real-time functional updates and modifications to the FPGA module 3 through the fast passive parallel configuration. In addition, by adopting the fast passive parallel configuration, the hardware structure of the FPGA module 3 can be dynamically reconstructed according to different test requirements without redesigning the hardware circuit. By configuring the MCU main control module 1 to use the fast passive parallel configuration to burn with the FPGA, the instant update and dynamic configuration of the hardware is achieved, so that the solar cell test equipment can maintain a high degree of adaptability in different application scenarios.

[0032] Furthermore, after obtaining the excitation range set by the host computer, the MCU main control module 1 is responsible for generating a load curve according to the excitation range. The excitation range includes the upper and lower limits of parameters such as current and voltage. According to these ranges, the MCU main control module 1 generates a corresponding load curve for subsequent solar cell testing. Based on the load curve, the MCU main control module 1 provides clear current and voltage conditions for subsequent excitation scanning, ensuring that the performance of solar cells at different operating points can be comprehensively and accurately evaluated.

[0033] Furthermore, the MCU main control module 1 is also configured to control the load curve test process and communicate with external devices, such as a host computer, a solar simulator, etc., to receive and issue corresponding instructions. After obtaining the instructions sent by the host computer, the MCU main control module 1 controls the start and stop of each step in the entire test process. For example, the process of starting the flash instruction and starting the acquisition instruction.

[0034] Exemplarily, in this embodiment, the MCU main control module 1 uses an STM32F777NI chip as the MCU.

[0035] For the FPGA module 3, it receives the excitation scanning control signal output from the MCU main control module 1, and outputs the corresponding current and voltage waveforms according to the set load curve parameters. These waveforms constitute the load curve. After outputting the load curve signal to the load module 4, the load module 4 provides a dynamic load according to the load curve.

[0036] Furthermore, through the high-speed real-time data processing capability of the FPGA module 3, it is possible to simultaneously collect data such as current, voltage and light intensity, thereby improving the test accuracy and reliability of the solar cell IV tester.

[0037] As for the data acquisition module 2, in this embodiment, it includes a voltage acquisition unit, a current acquisition unit, a light intensity acquisition unit and a temperature acquisition unit. The voltage acquisition unit is configured to acquire the voltage of the solar cell; the current acquisition unit is configured to acquire the output current of the solar cell; the light intensity acquisition unit is configured to acquire the irradiance of the light source; and the temperature acquisition unit is configured to acquire the test equipment and the ambient temperature.

[0038] In other implementations of the present invention, other data acquisition units may also be provided according to test requirements.

[0039] For the load module 4, it provides a dynamic load according to the output, simulating the working conditions under different current and power conditions, so that the test can simulate the response of the solar cell under real working conditions. The functions of the load module 4 include outputting and absorbing power to realize a bipolar load.

[0040] Furthermore, the solar cell IV tester also includes a communication module 5, which is configured to realize communication interaction between the MCU main control module 1 and external devices. Through the communication module 5, the MCU main control module 1 can transmit data and interact with commands with the host computer, and the host computer can send test parameters, receive test results, and communicate with the test equipment in real time to realize monitoring and control of the test process. The MCU main control module 1 can communicate with the solar simulator device to ensure that the test is carried out under simulated actual lighting conditions.

[0041] Furthermore, the solar cell IV tester also includes an interface module 6. The interface module 6 includes an interface for connecting the solar cell IV tester with external equipment or devices, such as an RS232 interface, an RS485 interface, a LAN interface, a USB interface, an infrared temperature measurement interface, a monitoring battery interface, an IO interface, etc.

[0042] Furthermore, in some embodiments of the present invention, the solar cell IV tester further includes an alarm module, which is configured to monitor and feedback abnormal conditions that occur during the operation of the solar cell IV tester, such as overheating, overcurrent, etc. In addition, the alarm module can feedback further error information to the MCU main control module 1, such as the abnormality type, occurrence time, etc., so as to provide data for subsequent fault diagnosis and maintenance.

[0043] The following is an introduction to the working process of the solar cell IV tester, taking a test as an example:

[0044] 1. The host computer sets the excitation range and sends it to the MCU main control module 1. The MCU main control module 1 generates excitation data based on the excitation range data and sends it to the FPGA module 3.

[0045] 2. The host computer sends a measurement instruction to the MCU main control module 1, and the MCU main control module 1 communicates with the solar simulator to notify it to flash, and at the same time notifies the FPGA module 3 to synchronously output excitation and perform data collection;

[0046] 3. The MCU main control module 1 reads the signal collected by the FPGA module 3. After the collection is completed, the MCU main control module 1 performs data analysis and calculation and then transmits the data to the host computer, which performs further calculations.

[0047] In summary, through the MCU main control module 1 and the FPGA module 3, the solar cell IV tester divides the data acquisition and process control into different modules, so that the solar cell IV tester takes into account the convenience of control and the efficiency and synchronization of data acquisition, so that the original data for analyzing the characteristics of the solar cell can be obtained quickly and accurately. It effectively improves the efficiency of solar cell testing, while ensuring the accuracy of the measurement data, and significantly improves the performance of the solar cell IV tester.

[0048] It should be understood that although this specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each implementation mode may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

[0049] The series of detailed descriptions listed above are only specific descriptions of feasible implementation methods of the utility model and are not intended to limit the protection scope of the utility model. Any equivalent implementation methods or changes that do not deviate from the technical spirit of the utility model should be included in the protection scope of the utility model.

Claims

1. A solar cell IV tester based on MCU and FPGA architecture, characterized in that: include: MCU main control module, data acquisition module, FPGA module and load module; The MCU main control module is configured at least to communicate and interact with the FPGA module and external devices, to set and generate a load curve, and to control a load curve test process; The data acquisition module is configured to at least measure the current, voltage, temperature of the solar cell and the irradiance data of the light source; The FPGA module is at least configured to output the load curve and synchronously collect different data output by the data acquisition module; The load module is at least configured to provide a bipolar load for the solar cell according to the load curve, and to output and / or absorb power.

2. The solar cell IV tester based on MCU and FPGA architecture according to claim 1 is characterized in that: The MCU main control module is configured to exchange data with the FPGA module through a flexible static memory controller.

3. The solar cell IV tester based on MCU and FPGA architecture according to claim 1 is characterized in that: The MCU main control module is configured to perform a burning process with the FPGA module through a fast passive parallel configuration.

4. The solar cell IV tester based on MCU and FPGA architecture according to claim 1, characterized in that: The MCU main control module is configured to generate a load curve and send it to the FPGA module after receiving the excitation range data, and to control the FPGA module to output the load curve and collect data after receiving the measurement instruction.

5. The solar cell IV tester based on MCU and FPGA architecture according to claim 1, characterized in that: The data acquisition module includes a voltage acquisition unit, a current acquisition unit, a light intensity acquisition unit and a temperature acquisition unit; The voltage collection unit is configured to collect the voltage of the solar cell; The current collection unit is configured to collect the output current of the solar cell; The light intensity collection unit is configured to collect the irradiance of the light source; The temperature acquisition unit is configured to acquire the temperature of the test equipment and the environment.

6. The solar cell IV tester based on MCU and FPGA architecture according to claim 1, characterized in that: The solar cell IV tester also includes a communication module, which is configured to realize communication interaction between the MCU main control module and external devices.

7. The solar cell IV tester based on MCU and FPGA architecture according to claim 1, characterized in that: The solar cell IV tester further comprises an interface module, and the interface module comprises a connection interface between the solar cell IV tester and an external device.

8. The solar cell IV tester based on MCU and FPGA architecture according to claim 7, characterized in that: The interface module includes an RS232 interface, an RS485 interface, a LAN interface, a USB interface, an infrared temperature measurement interface, a monitoring battery interface, and an IO interface.

9. The solar cell IV tester based on MCU and FPGA architecture according to claim 1, characterized in that: The solar cell IV tester further comprises an alarm module, which is configured to monitor and feedback abnormal conditions occurring during the operation of the solar cell IV tester.

10. The solar cell IV tester based on MCU and FPGA architecture according to claim 9, characterized in that: The alarm module is configured to monitor and feedback overheating and overcurrent conditions that occur during the operation of the solar cell IV tester, and feedback abnormality type and occurrence time data.

Images