Plate groove for crystal size detection
By designing the plate groove for crystal size detection and using the sorting plate for shaking sorting, the quartz crystal collection problem is solved, and effective sorting and collection of wafers of different sizes is achieved, which is convenient for subsequent utilization.
Patent Information
- Application Number
- CN202323156439.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-11-22
- Publication Date
- 2024-12-20
- Estimated Expiration
- 2033-11-22
AI Technical Summary
During the use of quartz crystals, there is a lack of effective solutions for how to effectively collect quartz crystals of different sizes for subsequent development and utilization.
A plate groove for crystal size detection is designed, including a detection frame, a plate groove cover and a sorting plate. By placing wafers of different sizes in the detection frame and moving the wafers on the sorting plate by shaking the device. Sorting and collecting wafers of different sizes.
The sorting and storage of multiple sets of chips according to the size specifications of three sets is realized, which facilitates subsequent development and utilization, avoids chip damage, and allows intuitive observation and collection through transparent structure.
Smart Images
Figure CN222197866U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of quartz crystal sorting equipment, in particular to a plate trough for crystal size detection. Background Art
[0002] Quartz is one of the main rock-forming minerals, generally referring to low-temperature quartz (α-quartz), which is the most widely distributed mineral in the quartz family. In a broad sense, quartz also includes high-temperature quartz (β-quartz) and coesite. The main component is SiO2, which is colorless and transparent, and often contains a small amount of impurities, turning into translucent or opaque crystals with a hard texture.
[0003] Quartz is a mineral resource with very stable physical and chemical properties. Its crystals belong to trigonal oxide minerals. Quartz block, also known as silica, is mainly used as raw material for producing quartz sand (also known as silica sand), as well as raw material for quartz refractory materials and sintering ferrosilicon.
[0004] Quartz is a mineral composed of silicon dioxide, with the chemical formula SiO2. Pure quartz is colorless and transparent, but due to the presence of trace pigment ions or finely dispersed inclusions, or color centers, it can appear in various colors and reduce transparency. It has a glassy luster and an oily luster on the fracture. It has a hardness of 7, no cleavage, and a shell-like fracture. It has a specific gravity of 2.65 and is piezoelectric.
[0005] Quartz crystal is an important electronic material. It not only has piezoelectric effect, but also has excellent mechanical, electrical and temperature characteristics. The resonators and oscillators designed and manufactured with it have outstanding advantages in frequency stabilization and frequency selection.
[0006] When a large number of quartz crystals are used, quartz crystals of similar sizes need to be collected together for the convenience of subsequent development and utilization. There is currently no effective solution to the problems in this technology, which led to the present case. Utility Model Content
[0007] The purpose of the utility model is to provide a plate groove for crystal size detection to solve the defects mentioned in the above background technology.
[0008] To achieve the above-mentioned purpose, a plate slot for crystal size detection is provided, comprising a detection outer frame, the top of the detection outer frame is covered with a plate slot cover, and the bottom of the detection outer frame is located and fixed on a plate slot detection separation seat, and a first docking plate and a second docking plate are respectively fixedly installed inside the plate slot detection separation seat, a first wafer collection area is provided on one side of the first docking plate, and a second wafer collection area is provided on the other side of the first docking plate, and a third wafer collection area is provided on the right side of the second docking plate;
[0009] The inner wall of the detection outer frame is screwed to fix the detection plate, and the first sorting plate, the second sorting plate and the third sorting plate are respectively installed on the surface of the detection plate from left to right.
[0010] Preferably, the transverse section of the plate slot cover is "U"-shaped, and a positioning groove with an "L"-shaped section is opened at the bottom of the plate slot cover. At the same time, the plate slot cover is clamped on the top of the detection outer frame through the positioning groove at the bottom and is screwed and fixed by fixing bolts.
[0011] Preferably, the first partition plate and the second partition plate are fixedly mounted on the bottom of the detection plate, and the bottoms of the first partition plate and the second partition plate are clamped on the upper end surfaces of the first docking plate and the second docking plate, respectively.
[0012] Preferably, a positioning groove with an "L"-shaped cross-section is provided on the top of the plate groove detection separation seat, and the bottom of the detection outer frame is clamped inside the positioning groove and is screwed and fixed by fixing bolts.
[0013] Preferably, the mesh numbers of the first sorting plate, the second sorting plate and the third sorting plate increase in an arithmetic progression, and the areas of the first sorting plate, the second sorting plate and the third sorting plate are consistent.
[0014] Preferably, the first sorting plate, the second sorting plate and the third sorting plate cover the upper surfaces of the first chip collection area, the second chip collection area and the third chip collection area respectively, and the volumes of the first chip collection area, the second chip collection area and the third chip collection area are consistent.
[0015] Compared with the prior art, the beneficial effects of the utility model are as follows: chips of different sizes move on the first sorting plate, the second sorting plate and the third sorting plate, and are sorted by the first sorting plate, the second sorting plate and the third sorting plate, so that multiple groups of chips are collected according to three groups of size specifications, and the three groups of chips with the same size specifications are stored separately, which is convenient for subsequent development and utilization. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 This is a schematic diagram of the front view of the structure of the utility model;
[0017] Figure 2 The utility model structure Figure 1 Exploded diagram of
[0018] Figure 3 The utility model structure Figure 1 AA section structure schematic diagram in;
[0019] Figure 4 The utility model structure Figure 1 Schematic diagram of the BB cross-section structure;
[0020] Figure 5 The utility model structure Figure 1 Schematic diagram of the CC cross-section structure.
[0021] Numbers in the figure: 1. Plate slot cover; 2. Fixing bolts; 3. Detection frame; 4. Detection plate; 5. First sorting plate; 6. Second sorting plate; 7. Third sorting plate; 8. First partition plate; 9. Second partition plate; 10. First docking plate; 11. Second docking plate; 12. Plate slot detection separation seat; 13. First chip collection area; 14. Second chip collection area; 15. Third chip collection area. DETAILED DESCRIPTION
[0022] See also Figure 1-5 The utility model provides a plate slot for crystal size detection, including a detection outer frame 3, the top of the detection outer frame 3 is covered with a plate slot cover 1, and the bottom of the detection outer frame 3 is located and fixed on a plate slot detection separation seat 12, and the inside of the plate slot detection separation seat 12 is respectively fixed with a first docking plate 10 and a second docking plate 11, a first wafer collection area 13 is provided on one side of the first docking plate 10, and a second wafer collection area 14 is provided on the other side of the first docking plate 10, and a third wafer collection area 15 is provided on the right side of the second docking plate 11;
[0023] The inner wall of the detection outer frame 3 is screwed to fix the detection plate 4, and the surface of the detection plate 4 is respectively installed with a first sorting plate 5, a second sorting plate 6 and a third sorting plate 7 from left to right.
[0024] Working principle: Place wafers of different sizes on the upper inner side of the detection outer frame 3 and cover them with the plate slot cover 1, and slowly shake the device so that wafers of different sizes move on the first sorting plate 5, the second sorting plate 6, and the third sorting plate 7, and are sorted by the first sorting plate 5, the second sorting plate 6, and the third sorting plate 7, so that multiple groups of wafers are collected according to three groups of size specifications, and the three groups of wafers with the same size specifications are stored separately to facilitate subsequent development and utilization.
[0025] As a preferred embodiment, the transverse section of the plate slot cover 1 is set in a "U" shape, and a positioning groove with an "L"-shaped section is opened at the bottom of the plate slot cover 1. At the same time, the plate slot cover 1 is clamped on the top of the detection outer frame 3 through the positioning groove at the bottom and is screwed and fixed by fixing bolts 2.
[0026] like Figure 1-2 As shown: when multiple wafers are placed on the upper inner side of the detection outer frame 3 and the plate slot cover 1 is fixed, the detection outer frame 3 is shaken slowly to avoid damage to the wafers.
[0027] As a preferred embodiment, the first partition plate 8 and the second partition plate 9 are fixedly installed on the bottom of the detection plate 4, and the bottoms of the first partition plate 8 and the second partition plate 9 are respectively clamped on the upper end surfaces of the first docking plate 10 and the second docking plate 11.
[0028] like Figure 1-2 As shown: the bottom of the first partition plate 8 and the second partition plate 9 are respectively clamped on the upper end surfaces of the first docking plate 10 and the second docking plate 11; the chips falling from the first sorting plate 5, the second sorting plate 6 and the third sorting plate 7 are respectively collected inside the first chip collection area 13, the second chip collection area 14 and the third chip collection area 15.
[0029] As a preferred embodiment, a positioning groove with an "L"-shaped cross-section is opened on the top of the plate groove detection separation seat 12, and the bottom of the detection outer frame 3 is clamped inside the positioning groove and is screwed and fixed by fixing bolts 2.
[0030] like Figure 1-2 As shown: the plate slot cover 1, the detection outer frame 3 and the plate slot detection separation seat 12 are all transparent structures made of acrylic material, and the collection status of the chips can be directly observed through the transparent shell.
[0031] As a preferred embodiment, the mesh sizes of the first sorting plate 5, the second sorting plate 6 and the third sorting plate 7 increase in an arithmetic progression, and the areas of the first sorting plate 5, the second sorting plate 6 and the third sorting plate 7 are consistent.
[0032] As a preferred embodiment, the first sorting plate 5, the second sorting plate 6 and the third sorting plate 7 respectively cover the upper surfaces of the first chip collection area 13, the second chip collection area 14 and the third chip collection area 15, and the volumes of the first chip collection area 13, the second chip collection area 14 and the third chip collection area 15 are consistent.
[0033] like Figure 1-2 As shown: when the collection of the first chip collection area 13, the second chip collection area 14 and the third chip collection area 15 is completed, the fixing bolt 2 can be held to remove the plate slot detection separation seat 12 from the bottom of the self-detection outer frame 3, so as to facilitate the collection of the chip sizes that have been detected in the three groups.
[0034] Before filtering and testing multiple groups of chips, it is necessary to place the multiple groups of chips on the surface of the third sorting plate 7 to avoid placing the multiple groups of chips on the surface of the first sorting plate 5 with the least mesh number, so that the multiple groups of chips on the first sorting plate 5 are all collected inside the first chip collection area 13 before sorting and testing.
Claims
1. A plate tank for crystal size detection, comprising a detection frame (3), characterized in that: The top of the detection outer frame (3) is covered with a plate slot cover (1), and the bottom of the detection outer frame (3) is located and fixed on a plate slot detection separation seat (12), and the first docking plate (10) and the second docking plate (11) are respectively fixedly installed inside the plate slot detection separation seat (12), a first chip collection area (13) is opened on one side of the first docking plate (10), and a second chip collection area (14) is opened on the other side of the first docking plate (10), and a third chip collection area (15) is opened on the right side of the second docking plate (11); The inner wall of the detection outer frame (3) is screwed to fix the detection plate (4), and the surface of the detection plate (4) is respectively installed with a first sorting plate (5), a second sorting plate (6) and a third sorting plate (7) from left to right.
2. A plate trough for crystal size detection according to claim 1, characterized in that: The transverse section of the plate slot cover (1) is set in a "U" shape, and a positioning groove with an "L" shape is provided at the bottom of the plate slot cover (1). At the same time, the plate slot cover (1) is clamped on the top of the detection outer frame (3) through the positioning groove at the bottom and is screwed and fixed by fixing bolts (2).
3. The plate trough for crystal size detection according to claim 1, characterized in that: The bottom of the detection plate (4) is respectively fixedly mounted with a first partition plate (8) and a second partition plate (9), and the bottoms of the first partition plate (8) and the second partition plate (9) are respectively clamped on the upper end surfaces of the first docking plate (10) and the second docking plate (11).
4. The plate trough for crystal size detection according to claim 1, characterized in that: The top of the plate slot detection separation seat (12) is provided with a positioning slot with an "L"-shaped cross section, and the bottom of the detection outer frame (3) is clamped inside the positioning slot and is screwed and fixed by fixing bolts (2).
5. The plate trough for crystal size detection according to claim 1, characterized in that: The mesh numbers of the first sorting plate (5), the second sorting plate (6) and the third sorting plate (7) increase in sequence in an arithmetic progression, and the areas of the first sorting plate (5), the second sorting plate (6) and the third sorting plate (7) are consistent.
6. The plate trough for crystal size detection according to claim 1, characterized in that: The first sorting plate (5), the second sorting plate (6) and the third sorting plate (7) respectively cover the upper surfaces of the first chip collection area (13), the second chip collection area (14) and the third chip collection area (15), and the volumes of the first chip collection area (13), the second chip collection area (14) and the third chip collection area (15) are consistent.