Semiconductor secondary matching test workbench

By designing a secondary semiconductor test bench, using a U-shaped mount, self-positioned dust-proof opening and closing components and limit fixing components, the problem of single test module interfaces in the prior art and susceptible to moisture is solved, and the problem of moisture-prone interfaces is realized. Flexible testing and high accuracy testing of different models and specifications of devices.

CN222200477UActive Publication Date: 2024-12-20SHANGHAI JISHANG TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202420999199.2
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-05-10
Publication Date
2024-12-20
Estimated Expiration
2034-05-10

AI Technical Summary

Technical Problem

During the use of the existing semiconductor test platform, the test module has a single interface and cannot adapt to different types of equipment or systems. It is easily affected by moisture and dust, which affects the test accuracy; the device to be inspected is not convenient enough, resulting in the test accuracy being affected. Influence.

Method used

A secondary semiconductor equipment test workbench is designed, including a test workbench, a U-shaped mounting frame, a self-positioning dust-proof opening and closing assembly and a limit fixing assembly, through a transverse limiting chute, a positioning pin hole, and a drive motor and bidirectional threaded rods and other structures to achieve flexible testing of devices of different models and specifications, dust-proof and waterproofing effects, and improve device stability through limit fixing components.

Benefits of technology

It realizes flexible testing of semiconductor devices of different models and specifications, improves the accuracy and stability of the test, effectively prevents the invasion of dust and moisture, and improves the flexibility and accuracy of the test process.

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Abstract

The utility model relates to the technical field of semiconductor testing, in particular to a semiconductor secondary matching test workbench, which comprises a test operation table, test modules are fixedly arranged on the top of the test operation table, the test modules are linearly and uniformly distributed on the top of the test operation table, and the test functions of the test modules are different. A U-shaped mounting frame is fixedly mounted at the top of the test operation table, a transverse limiting sliding groove and a positioning pin hole are formed in the U-shaped mounting frame, a self-positioning dustproof opening and closing assembly is mounted in the transverse limiting sliding groove and corresponds to a test interface in the test module, and an inverted U-shaped mounting plate is fixedly mounted at the top of the test operation table; a limiting and fixing assembly used for clamping test equipment is mounted in the inverted U-shaped mounting plate; according to the utility model, the stability of the semiconductor device in the test process can be improved, the effective dustproof and waterproof effects can be realized, and the test requirements of semiconductor devices of different models and specifications can be met at the same time.
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Description

Technical Field

[0001] The utility model relates to a semiconductor secondary matching test workbench, belonging to the technical field of semiconductor testing. Background Art

[0002] Semiconductor testing is an important step in the semiconductor design, production, packaging, and testing process. It mainly uses specific instruments to detect the devices to be tested to distinguish defects, verify whether the devices meet the design goals, and separate good products from bad products. Semiconductor testing can ensure that the production chips meet the required yield, reduce cost waste, and provide effective test data to improve design and manufacturing. The semiconductor test bench plays a vital role in the semiconductor testing process. However, the existing semiconductor test platform has a single interface for the test module during use, which can only be connected to a specific type of test equipment or system, and cannot adapt to other types of equipment or systems. It is not flexible enough to use, and the interface of the test module is easily affected by moisture and dust, which affects the accuracy of the test. At the same time, it is not convenient to fix the device to be tested during the test process, and the shaking and offset of the device to be tested is also easy to affect the accuracy of the test. There are certain disadvantages in the use process.

[0003] In view of this, the present utility model is proposed. Utility Model Content

[0004] The purpose of the utility model is to provide a semiconductor secondary matching test workbench in order to solve the above-mentioned problems. The workbench has the advantages of meeting the testing requirements of semiconductor devices of different models and specifications, being more flexible to use, achieving effective dustproof and waterproof effects, and improving the stability of semiconductor devices during testing.

[0005] The utility model achieves the above-mentioned purpose through the following technical scheme: a semiconductor secondary matching test workbench, including a test operating table, the test module is fixedly arranged on the top of the test operating table, the test modules are linearly and evenly distributed on the top of the test operating table, and the test functions of each test module are different, the U-shaped mounting frame is fixedly installed on the top of the test operating table, the U-shaped mounting frame is provided with a transverse limiting slide groove and a positioning pin hole, the self-positioning dustproof opening and closing component is installed in the transverse limiting slide groove, and the self-positioning dustproof opening and closing component corresponds to the test interface on the test module, the inverted U-shaped mounting plate is fixedly installed on the top of the test operating table, and the limiting fixing component for clamping the test equipment is installed in the inverted U-shaped mounting plate.

[0006] Furthermore, in order to drive the limit slider to slide in the transverse limit slot by controlling the serpentine mounting plate, the opening and closing baffle can be driven to move laterally to achieve the covering and opening of the test interface, the self-positioning dustproof opening and closing assembly includes the limit slider, the limit slider is slidably engaged in the transverse limit slot, the serpentine mounting plate is fixedly installed on the top of the limit slider, the L-shaped connecting rod is fixedly installed on the bottom end of the serpentine mounting plate, and the opening and closing baffle for covering the test interface on the test module is fixed on one end of the L-shaped connecting rod.

[0007] Furthermore, in order to enable the serpentine mounting plate to be fixedly connected to the U-shaped mounting frame through the positioning pin rod, the positioning pin rod is slidably mounted on the serpentine mounting plate, and one end of the positioning pin rod is inserted into the positioning pin hole.

[0008] Furthermore, in order to enable the positioning pin rod to slide on the serpentine mounting plate by controlling the lifting handle, the lifting handle is fixedly mounted on the other end of the positioning pin rod.

[0009] Furthermore, in order to enable the connecting piece to drive the positioning pin rod to be fixedly inserted in the positioning pin hole through the positioning spring, the connecting piece is fixedly sleeved on the positioning pin rod, and the connecting piece is elastically connected to the inner wall of the serpentine mounting plate through the positioning spring.

[0010] Furthermore, in order to control the driving motor to be turned on so that the bidirectional threaded rod can rotate on the inner wall of the inverted U-shaped mounting plate through the rotating joint, the limiting fixing assembly includes the driving motor, the bidirectional threaded rod and the limiting slide bar, the driving motor and the limiting slide bar are both fixed on the inner wall of one end of the inverted U-shaped mounting plate, the bidirectional threaded rod is rotatably installed on the inner wall of the other end of the inverted U-shaped mounting plate through the rotating joint, and one end of the bidirectional threaded rod is fixedly connected to the output shaft of the driving motor.

[0011] Furthermore, in order to control the rotation of the bidirectional threaded rod so as to drive the two threaded bars to slide in opposite directions on the limiting slide rod, the bidirectional threaded rod is installed with the threaded bars, and both ends of the threaded bars are slidably sleeved on the limiting slide rod. There are two threaded bars, and the two threaded bars are respectively located at the opposite thread ends of the bidirectional threaded rod.

[0012] Furthermore, in order to control the two threaded blocks, the first connecting head and the second connecting head can be used to drive the first clamping seat and the second clamping seat to move closer or farther away, so as to achieve clamping and fixing of the test equipment, the first connecting head and the second connecting head are respectively fixedly installed on the two threaded blocks, and the first connecting head and the second connecting head are both slidably engaged in the makeshift hole groove formed on the inverted U-shaped mounting plate, and the first clamping seat and the second clamping seat are respectively fixedly installed on the first connecting head and the second connecting head.

[0013] The technical effects and advantages of the utility model are as follows: by setting test modules with different functions, it can meet the test requirements of semiconductor devices of different models and specifications, and it is more flexible to use; at the same time, through the self-positioning dustproof opening and closing components, the test interfaces on the test modules with different functions can be closed to achieve effective dustproof and waterproof effects; and under the action of the limiting fixing components, semiconductor devices of different specifications can be clamped and fixed, thereby improving the stability of the semiconductor devices during the testing process and effectively improving the accuracy of the testing process. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0015] Figure 2 This is a schematic diagram of the installation structure of the self-positioning dustproof opening and closing component of the utility model on the U-shaped mounting frame;

[0016] Figure 3 This is a schematic diagram of the overall structure of the self-positioning dustproof opening and closing assembly of the utility model;

[0017] Figure 4 It is a schematic diagram of the installation structure of the limit fixing component of the utility model on the inverted U-shaped installation plate;

[0018] Figure 5 This is a schematic diagram of the overall structure of the limit fixing assembly of the utility model;

[0019] In the figure: 1. test operating table; 2. test module; 3. U-shaped mounting frame; 4. self-positioning dustproof opening and closing assembly; 401. limit slider; 402. serpentine mounting plate; 403. L-shaped connecting rod; 404. opening and closing baffle; 405. positioning pin rod; 406. lifting handle; 407. connecting piece; 408. positioning spring; 5. inverted U-shaped mounting plate; 6. limit fixing assembly; 601. drive motor; 602. bidirectional threaded rod; 603. limit slider; 604. rotating joint; 605. threaded bar; 606. first connector; 607. second connector; 608. first clamping seat; 609. second clamping seat. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0021] See also Figure 1-Figure 5 As shown, a semiconductor secondary matching test workbench includes a test operation table 1, on the top of which a test module 2 is fixedly arranged, the test modules 2 are linearly and evenly distributed on the top of the test operation table 1, and the test functions of each test module 2 are different. When in use, the test functions are divided into different modules, each module has an independent test interface and expansion capability, so that the workbench can adapt to the testing requirements of semiconductor devices of different models and specifications, and a U-shaped mounting frame 3 is fixedly installed on the top of the test operation table 1, and a transverse limiting slide groove and a positioning pin hole are opened on the U-shaped mounting frame 3, and a positioning pin hole is installed in the transverse limiting slide groove. A self-positioning dustproof opening and closing component 4 corresponds to the test interface on the test module 2. When in use, the test interface on each test module 2 can be opened or closed to facilitate the use of the test interface. At the same time, the unused test interface can be closed to achieve effective waterproof and dustproof effects. An inverted U-shaped mounting plate 5 is fixedly installed on the top of the test operating table 1. A limiting fixing component 6 for clamping the test equipment is installed in the inverted U-shaped mounting plate 5 to facilitate clamping and fixing of test equipment of different specifications and improve the stability of the test equipment during the testing process.

[0022] The limit fixing assembly 6 includes a driving motor 601, a bidirectional threaded rod 602 and a limit sliding rod 603. The driving motor 601 and the limit sliding rod 603 are both fixed on the inner wall of one end of the inverted U-shaped mounting plate 5. The bidirectional threaded rod 602 is rotatably mounted on the inner wall of the other end of the inverted U-shaped mounting plate 5 through a rotating joint 604, and one end of the bidirectional threaded rod 602 is fixedly connected to the output shaft of the driving motor 601. A threaded bar 605 is installed on the bidirectional threaded rod 602. Both ends of the threaded bar 605 are slidably sleeved on the limit sliding rod 603. There are two threaded bars 605. The two threaded bars 605 are respectively located at the reverse thread ends of the bidirectional threaded rod 602. A first connector 606 and a second connector 607 are respectively fixedly mounted on the two threaded bars 605. When in use, the control driving motor 601 is turned on, so that the bidirectional threaded rod 602 rotates on the inner wall of the inverted U-shaped mounting plate 5 through the rotating joint 604, so as to drive the two threaded strips 605 to slide in opposite directions on the limiting slide bar 603, and the first connecting head 606 and the second connecting head 607 are both slidably engaged in the makeshift hole groove opened on the inverted U-shaped mounting plate 5, and the first clamping seat 608 and the second clamping seat 609 are fixedly installed on the first connecting head 606 and the second connecting head 607 respectively. When the two threaded strips 605 slide in opposite directions, the first clamping seat 608 and the second clamping seat 609 are driven to move closer or farther through the first connecting head 606 and the second connecting head 607, so as to clamp and fix test equipment of different specifications.

[0023] The self-positioning dustproof opening and closing component 4 includes a limit slider 401, which is slidably engaged in a transverse limit slide groove, a serpentine mounting plate 402 is fixedly installed on the top of the limit slider 401, an L-shaped connecting rod 403 is fixedly installed on the bottom of the serpentine mounting plate 402, and an opening and closing baffle 404 for shielding the test interface on the test module 2 is fixed at one end of the L-shaped connecting rod 403, a positioning pin rod 405 is slidably installed on the serpentine mounting plate 402, one end of the positioning pin rod 405 is inserted in the positioning pin hole, and a lifting handle 406 is fixedly installed on the other end of the positioning pin rod 405, and a connecting piece 407 is fixedly sleeved on the positioning pin rod 405, and the connecting piece 407 is connected to the inner wall of the serpentine mounting plate 402 through a positioning spring 408. Elastic connection. When in use, pull the lifting handle 406 to make one end of the positioning pin rod 405 disengage from the positioning pin hole, so that the limiting slider 401 can be driven to move in the horizontal limiting groove through the serpentine mounting plate 402, and the opening and closing baffle 404 can be driven to move through the L-shaped connecting rod 403, and under the action of the positioning spring 408, the connecting piece 407 drives the positioning pin rod 405 to be fixedly inserted in the positioning pin hole, so that the test interface on the test module 2 is in an open or closed state, wherein the positioning pin holes are set to two adjacent ones, one of which is located above the test interface, and the other is located on one side of the test interface, and the opening and closing baffle 404 can be fixed when the opening and closing baffle 404 is moved.

[0024] It is obvious to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the present invention can be implemented in other specific forms without departing from the spirit or essential features of the present invention. Therefore, the embodiments should be regarded as exemplary and non-restrictive from any point of view, and the scope of the present invention is defined by the appended claims rather than the above description, and it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims be included in the present invention. Any reference numeral in a claim should not be regarded as limiting the claim to which it relates.

[0025] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A semiconductor secondary assembly test workbench, comprising a test operation table (1), a test module (2) being fixedly arranged on the top of the test operation table (1), characterized in that: The test modules (2) are linearly and evenly distributed on the top of the test operation table (1), and the test functions of each of the test modules (2) are different. A U-shaped mounting frame (3) is fixedly installed on the top of the test operation table (1), and a transverse limiting slide groove and a positioning pin hole are provided on the U-shaped mounting frame (3). A self-positioning dustproof opening and closing component (4) is installed in the transverse limiting slide groove, and the self-positioning dustproof opening and closing component (4) corresponds to the test interface on the test module (2). An inverted U-shaped mounting plate (5) is fixedly installed on the top of the test operation table (1), and a limiting fixing component (6) for clamping the test equipment is installed in the inverted U-shaped mounting plate (5).

2. The semiconductor secondary matching test workbench according to claim 1, characterized in that: The self-positioning dustproof opening and closing assembly (4) comprises a limiting slider (401), the limiting slider (401) is slidably engaged in the transverse limiting slide groove, a serpentine mounting plate (402) is fixedly mounted on the top of the limiting slider (401), an L-shaped connecting rod (403) is fixedly mounted on the bottom of the serpentine mounting plate (402), and an opening and closing baffle (404) for shielding the test interface on the test module (2) is fixed on one end of the L-shaped connecting rod (403).

3. The semiconductor secondary matching test bench according to claim 2, characterized in that: A positioning pin rod (405) is slidably mounted on the serpentine mounting plate (402), and one end of the positioning pin rod (405) is inserted into the positioning pin hole.

4. The semiconductor secondary matching test bench according to claim 3, characterized in that: A lifting handle (406) is fixedly mounted on the other end of the positioning pin rod (405).

5. The semiconductor secondary matching test workbench according to claim 4, characterized in that: A connecting piece (407) is fixedly sleeved on the positioning pin rod (405), and the connecting piece (407) is elastically connected to the inner wall of the serpentine mounting plate (402) via a positioning spring (408).

6. The semiconductor secondary matching test workbench according to claim 1, characterized in that: The limit fixing assembly (6) comprises a driving motor (601), a bidirectional threaded rod (602) and a limit sliding rod (603); the driving motor (601) and the limit sliding rod (603) are both fixed on the inner wall of one end of the inverted U-shaped mounting plate (5); the bidirectional threaded rod (602) is rotatably mounted on the inner wall of the other end of the inverted U-shaped mounting plate (5) via a rotating joint (604); and one end of the bidirectional threaded rod (602) is fixedly connected to the output shaft of the driving motor (601).

7. The semiconductor secondary matching test workbench according to claim 6, characterized in that: A threaded bar (605) is installed on the bidirectional threaded rod (602), and both ends of the threaded bar (605) are slidably sleeved on the limiting sliding rod (603). There are two threaded bars (605), and the two threaded bars (605) are respectively located at the opposite thread ends of the bidirectional threaded rod (602).

8. The semiconductor secondary matching test workbench according to claim 7, characterized in that: A first connector (606) and a second connector (607) are fixedly mounted on the two threaded strips (605), respectively. The first connector (606) and the second connector (607) are both slidably engaged in the clearance holes provided on the inverted U-shaped mounting plate (5). A first clamping seat (608) and a second clamping seat (609) are fixedly mounted on the first connector (606) and the second connector (607), respectively.