Integrated circuit testing device
The integrated circuit testing device addresses uneven heating in existing devices by using a motor-driven placement rack with clamping arms and adjustable heating lamp spacing to achieve uniform heating and accurate test results.
Patent Information
- Application Number
- CN202420529589.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-19
- Publication Date
- 2024-12-20
- Estimated Expiration
- 2034-03-19
AI Technical Summary
Existing integrated circuit testing devices suffer from uneven heating on the upper and lower surfaces of circuit boards during high-temperature tests, leading to inaccurate test results.
An integrated circuit testing device with a placement rack and symmetrically distributed heating lamps, where the placement rack includes a main frame driven by a motor to rotate, and the placement rack has a clamping unit with movable clamping arms and adjustable spacing between heating lamps, ensuring uniform heating by rotating the main frame.
The device ensures even heating of the circuit board surfaces, resulting in more accurate high-temperature resistance test results by uniformly distributing heat and allowing adjustable spacing for varying heating speeds.
Smart Images
Figure CN222212820U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of circuit testing, and more specifically to an integrated circuit testing device. Background Art
[0002] An integrated circuit (IC) is a miniature electronic device or component. Using a certain process, the transistors, resistors, capacitors, inductors and other components and wiring required in a circuit are interconnected and made on a small piece or several small pieces of semiconductor wafers or dielectric substrates. After the integrated circuit is completed, it needs to be tested for high temperature resistance. The reason is that the test can provide the undesirable conditions that may be encountered when the integrated circuit is used. Through high temperature resistance testing, the reliability of the integrated circuit in a high temperature environment can be verified. If the performance of the integrated circuit is abnormal, it means that its reliability still needs to be improved and further optimized. When performing high temperature testing, the integrated circuit is mounted on a circuit board, which fixes and supports the integrated circuit.
[0003] At present, when conducting high-temperature tests, it is easy for the upper and lower surfaces to be heated unevenly. For example, patent number CN215067129U discloses an integrated circuit high-temperature aging test device, which includes two heating modules distributed on the upper and lower sides. Between the two heating modules, there are two circuit boards distributed up and down. They move toward or in opposite directions in the lateral direction, and can also move up or down slightly. However, in this device, the circuit board on the upper side is far away from the heating module on the lower side, and the circuit board on the lower side is far away from the heating module on the upper side, resulting in uneven heating on the upper and lower sides of both circuit boards, making it difficult to ensure the accuracy of the test.
[0004] Therefore, there is still a need to improve the existing testing device to solve the problems of uneven heating and inaccurate test results. Utility Model Content
[0005] The technical problem to be solved by the utility model is to provide an integrated circuit testing device in view of the above-mentioned defects of the prior art.
[0006] The technical solution adopted by the utility model to solve its technical problems is:
[0007] Provided is an integrated circuit testing device, comprising a test box and a placement rack located inside the test box; the placement rack comprises a main frame and at least one clamping unit installed on the main frame; the clamping unit comprises two movable clamping arms for clamping a circuit board; the test box is also provided with a driving component for driving the main frame to rotate, two heating lamps symmetrically distributed on both sides of the placement rack, and an adjustment component; the rotation centerline of the main frame coincides with the symmetry centerline of the clamping unit; the driving component is fixed to the test box.
[0008] In some embodiments, the main frame includes a main body axis; the main body axis and the heating lamp tube have the same length direction;
[0009] The clamping unit also includes a clamping ring and a cross arm perpendicular to the main body axis; the two movable clamping arms are respectively installed on both sides of the cross arm; the clamping ring is movably clamped with the main body axis; the middle part of the cross arm is fixed to the outer circumferential surface of the clamping ring.
[0010] In some embodiments, the movable clamping arm includes a rear baffle, a spring, and a clamping plate arranged in sequence along the length direction of the cross arm; the rear baffle is fixed to the end of the cross arm; the two ends of the spring are respectively fixed to the rear baffle and the clamping plate; the clamping plate slides along the cross arm and is used to clamp the circuit board.
[0011] In some embodiments, an alignment protrusion is fixedly provided on the inner wall of the retaining ring; an alignment groove adapted to the alignment protrusion is provided on the upper side of the main shaft; and the alignment groove is a symmetrical groove.
[0012] In some embodiments, the adjustment component includes two adjustment units corresponding to the two heating lamps one by one;
[0013] The adjustment unit includes two lamp tube sleeves respectively sleeved and fixed on both ends of the heating lamp tube, and two extension rods corresponding to the two lamp tube sleeves one by one; the extension rods are made of insulating material; one end of the extension rod passes through the side wall of the test box, and the other end is fixed to the outer periphery of the lamp tube sleeve.
[0014] In some embodiments, the extension rod is provided with a plurality of positioning holes which are equally spaced along its length direction; the side wall of the test box is provided with rubber protrusions; and each of the extension rods corresponds to one of the rubber protrusions.
[0015] In some embodiments, the driving assembly includes a motor; a housing of the motor is fixed to the test box;
[0016] The test box is also provided with a bearing and a bearing mounting seat; one end of the main frame is provided for the bearing to be mounted and fixed, and the other end is mounted on the motor shaft of the motor; the lower end of the bearing mounting seat is fixed to the test box, and the upper end is provided for the bearing to be embedded and fixed.
[0017] In some embodiments, the main frame also includes a reinforced main shaft and a reinforced secondary shaft; the length direction of the reinforced main shaft and the main shaft is the same; the reinforced main shaft is provided on both sides of the main shaft; and multiple reinforced secondary shafts are connected between the reinforced main shaft and the main shaft.
[0018] In some embodiments, the test box includes a front cover plate and a box body that fit tightly together; one of the opposite ends of the front cover plate and the box body is fixed with a magnet, and the other end is fixed with an iron sheet that matches the magnet.
[0019] In some embodiments, the lower end of the front cover is rotatably connected to the lower end of the box body; and a gripping portion is formed on the upper end of the front cover.
[0020] Compared with the prior art, the beneficial effect of the utility model is that during the test of the circuit board with the integrated circuit installed, the upper and lower surfaces are heated more evenly, and accordingly, the high temperature resistance test results of the integrated circuit are more accurate. Specifically, when in use, the circuit board is placed on the placement rack, and then the placement rack with the circuit board is placed in the test box, and then the driving component drives the main frame to rotate. During the rotation process, all parts of the circuit board can absorb the heat emitted by the heating lamp tube, thereby ensuring that the overall heating of the circuit board is uniform and avoiding excessive local temperature. In addition, the spacing between the two heating lamp tubes can be adjusted by adjusting the component. When the spacing becomes larger, the heating speed of the heating lamp tube to the circuit board becomes slower, and when the spacing becomes smaller, the heating speed of the heating lamp tube to the circuit board becomes faster. Therefore, the spacing between the two heating lamp tubes can be adjusted according to actual detection needs, and the applicability is good. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the utility model will be further described below in conjunction with the accompanying drawings and embodiments. The drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work:
[0022] Figure 1 This is a schematic diagram of the overall structure of an integrated circuit testing device according to a preferred embodiment of the utility model;
[0023] Figure 2 It is another overall structural schematic diagram of an integrated circuit testing device of a preferred embodiment of the utility model;
[0024] Figure 3 This is a structural schematic diagram of an integrated circuit test device of a preferred embodiment of the utility model after a part of the box is hidden;
[0025] Figure 4 This is another structural schematic diagram of an integrated circuit test device of a preferred embodiment of the utility model after a part of the box is hidden;
[0026] Figure 5 yes Figure 4 A1 in the middle is an enlarged view;
[0027] Figure 6 yes Figure 4 A2 in the middle is an enlarged view;
[0028] Figure 7 yes Figure 4 A3 in the middle is an enlarged view;
[0029] Figure 8 yes Figure 4 A4 enlarged image. DETAILED DESCRIPTION
[0030] In order to make the purpose, technical solution and advantages of the embodiments of the utility model clearer, the following will be described clearly and completely in combination with the technical solution in the embodiments of the utility model. Obviously, the described embodiments are partial embodiments of the utility model, not all embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the protection scope of the utility model.
[0031] An integrated circuit testing device according to a preferred embodiment of the utility model is as follows Figure 1-Figure 8 As shown, it includes a test box 10 and a placement rack 20 located inside the test box 10; the placement rack 20 includes a main frame 200 and at least one clamping unit 201 installed on the main frame 200; the clamping unit 201 includes two movable clamping arms 2010 that cooperate with the clamping circuit board (not shown in the figure); the interior of the test box 10 is also provided with a driving component 30 for driving the main frame 200 to rotate, two heating lamps 40 symmetrically distributed on both sides of the placement rack 20, and an adjustment component 50; the rotation center line of the main frame 200 coincides with the symmetry center line of the clamping unit 201; the driving component 30 is fixed to the test box 10.
[0032] Compared with the prior art, the beneficial effect of the utility model is that during the test of the circuit board with the integrated circuit installed, the upper and lower surfaces are heated more evenly, and accordingly, the high temperature resistance test result of the integrated circuit is more accurate. Specifically, when in use, the circuit board is placed on the placement rack 20, and then the placement rack 20 with the circuit board is placed in the test box 10, and then the driving component 30 drives the main frame 200 to rotate. During the rotation process, all parts of the circuit board can absorb the heat emitted by the heating lamp tube 40, thereby ensuring that the overall heating of the circuit board is uniform, and avoiding excessive local temperature. In addition, the spacing between the two heating lamp tubes 40 can be adjusted by adjusting the component 50. When the spacing becomes larger, the heating speed of the heating lamp tube 40 to the circuit board slows down, and when the spacing becomes smaller, the heating speed of the heating lamp tube 40 to the circuit board speeds up. Therefore, the spacing between the two heating lamp tubes 40 can be adjusted according to the actual detection requirements, and the applicability is good.
[0033] In some embodiments, the main frame 200 includes a main shaft 2000; the main shaft 2000 and the heating lamp 40 have the same length direction;
[0034] The clamping unit 201 also includes a clamping ring 2011 and a cross arm 2012 perpendicular to the main shaft 2000; two movable clamping arms 2010 are respectively installed on both sides of the cross arm 2012; the clamping ring 2011 is movably clamped with the main shaft 2000; the middle part of the cross arm 2012 is fixed to the outer cylindrical surface of the clamping ring 2011.
[0035] In the above embodiment, the clamping ring 2011 can be removed from the main shaft 200. When placing the circuit board, the clamping unit 201 can be removed first, so that the circuit board with the integrated circuit can be clamped to the two movable clamping arms 2010, and then the clamping unit 201 can be clamped and fixed to the main shaft 200, which is convenient and flexible to use. In addition, the clamping position of the clamping ring 2011 on the main shaft 200 can be flexibly adjusted according to the size of the circuit board to place more circuit boards. In addition, the two movable clamping arms 2010 can clamp the circuit board together, so that the circuit board can be placed in the center, and the heat received by both sides is more equal, and the heating is more uniform.
[0036] In some embodiments, the movable clamping arm 2010 includes a rear baffle 20100, a spring 20101, and a clamping plate 20102 arranged in sequence along the length direction of the cross arm 2012; the rear baffle 20100 is fixed to the end of the cross arm 2012; the two ends of the spring 20101 are respectively fixed to the rear baffle 20100 and the clamping plate 20102; the clamping plate 20102 slides against the cross arm 2012 and is used to clamp the circuit board. The movable clamping arm 2010 adopts the above structure, which is simple in structure and low in cost.
[0037] In some embodiments, the inner wall of the snap ring 2011 is fixed with a positioning protrusion 20110; the upper side of the main shaft 2000 is provided with a positioning groove 20000 adapted to the positioning protrusion 20110; the positioning groove 20000 is a symmetrical groove. Through the cooperation of the positioning protrusion 20110 and the positioning groove 20000, the positioning of the snap ring 2011 can be quickly completed, and the circuit board can be ensured to be in a horizontal state without tilting, and the heat received by both sides is more equal.
[0038] In some embodiments, the adjustment component 50 includes two adjustment units 500 corresponding to the two heating lamps 40 ;
[0039] The adjustment unit 500 includes two lamp sleeves 5000 respectively sleeved and fixed on both ends of the heating lamp 40, and two extension rods 5001 corresponding to the two lamp sleeves 5000; the extension rods 5001 are made of heat-insulating material; one end of the extension rod 5001 penetrates the side wall of the test box 10, and the other end is fixed to the outer periphery of the lamp sleeve 5000. The two sides of the heating lamp 40 are evenly supported, the force is balanced, and the support is stable. At the same time, because the extension rods 5001 extend to the outside, the position of the extension rods 5001 can be adjusted from the outside without opening the test box 10, which reduces the loss of heat and has a good heat preservation effect.
[0040] In some embodiments, the extension rod 5001 is provided with a plurality of equidistantly distributed positioning holes 50010 along its length direction; the side wall of the test box 10 is provided with rubber protrusions (not shown in the figure); each extension rod 5001 corresponds to a rubber protrusion. The extension rod 5001 can have a plurality of fixed stop positions, so that the user can quickly adjust the position with high adjustment accuracy.
[0041] In some embodiments, the driving assembly 30 includes a motor 300; a housing of the motor 300 is fixed to the test box 10;
[0042] A bearing 60 and a bearing mounting seat 70 are also provided inside the test box 10; one end of the main frame 200 is provided for the bearing 60 to be mounted and fixed, and the other end is mounted on the motor shaft of the motor 300; the lower end of the bearing mounting seat 70 is fixed to the test box 10, and the upper end is provided for the bearing 60 to be embedded and fixed.
[0043] The motor 300 is used for driving, and the movement precision is high and the driving is stable. In addition, both ends of the main frame 200 are supported, which is conducive to ensuring the stability during movement and effectively avoiding the shaking of the main frame 200.
[0044] In some embodiments, the main frame 200 further includes a reinforcing main axis 2001 and a reinforcing secondary axis 2002; the reinforcing main axis 2001 and the main axis 2000 have the same length direction; both sides of the main axis 2000 are provided with reinforcing main axis 2001; and a plurality of reinforcing secondary axes 2002 are connected between the reinforcing main axis 2001 and the main axis 2000. By adding the reinforcing main axis 2001 and the reinforcing secondary axis 2002, the main frame 200 can have better strength as a whole and is not easy to bend and deform.
[0045] In some embodiments, the test box 10 includes a front cover plate 100 and a box body 101 that fit tightly together; one of the opposite ends of the front cover plate 100 and the box body 101 is fixed with a magnet 80, and the other is fixed with an iron sheet (not shown in the figure) that matches the magnet 80. Through the attraction of the magnet 80 and the iron sheet, the front cover plate 100 and the box body 101 can be closed more tightly, and the thermal insulation effect can be better.
[0046] In some embodiments, the lower end of the front cover 100 is rotatably connected to the lower end of the box 101; a gripping portion 1000 is formed at the upper end of the front cover 100 to facilitate quick opening of the front cover 100 to take and place the circuit board.
[0047] It should be understood that those skilled in the art can make improvements or changes based on the above description, and all these improvements and changes should fall within the scope of protection of the claims attached to the utility model.
Claims
1. An integrated circuit testing device, comprising a test box and a placement rack located inside the test box; characterized in that: The placement rack includes a main frame and at least one clamping unit installed on the main frame; the clamping unit includes two movable clamping arms for clamping a circuit board; the interior of the test box is also provided with a driving component for driving the main frame to rotate, two heating lamps symmetrically distributed on both sides of the placement rack, and an adjustment component; the rotation center line of the main frame coincides with the symmetry center line of the clamping unit; the driving component is fixed to the test box.
2. An integrated circuit testing device according to claim 1, characterized in that: The main frame includes a main shaft; the main shaft and the heating lamp tube have the same length direction; The clamping unit also includes a clamping ring and a cross arm perpendicular to the main body axis; the two movable clamping arms are respectively installed on both sides of the cross arm; the clamping ring is movably clamped with the main body axis; the middle part of the cross arm is fixed to the outer circumferential surface of the clamping ring.
3. An integrated circuit testing device according to claim 2, characterized in that: The movable clamping arm includes a rear baffle, a spring, and a clamping plate which are sequentially arranged along the length direction of the cross arm; the rear baffle is fixed to the end of the cross arm; the two ends of the spring are respectively fixed to the rear baffle and the clamping plate; the clamping plate slides along the cross arm and is used to clamp the circuit board.
4. An integrated circuit testing device according to claim 2, characterized in that: An alignment protrusion is fixedly arranged on the inner wall of the clamping ring; an alignment groove matched with the alignment protrusion is arranged on the upper side of the main shaft; and the alignment groove is a symmetrical groove.
5. The integrated circuit testing device according to claim 1, characterized in that: The adjustment component includes two adjustment units corresponding to the two heating lamp tubes one by one; The adjustment unit includes two lamp tube sleeves respectively sleeved and fixed on both ends of the heating lamp tube, and two extension rods corresponding to the two lamp tube sleeves one by one; the extension rods are made of insulating material; one end of the extension rod passes through the side wall of the test box, and the other end is fixed to the outer periphery of the lamp tube sleeve.
6. An integrated circuit testing device according to claim 5, characterized in that: The extension rod is provided with a plurality of positioning holes which are equally distributed along its length direction; the side wall of the test box is provided with rubber protrusions; and each of the extension rods corresponds to one rubber protrusion.
7. The integrated circuit testing device according to claim 1, characterized in that: The driving assembly includes a motor; the housing of the motor is fixed to the test box; The test box is also provided with a bearing and a bearing mounting seat; one end of the main frame is provided for the bearing to be mounted and fixed, and the other end is mounted on the motor shaft of the motor; the lower end of the bearing mounting seat is fixed to the test box, and the upper end is provided for the bearing to be embedded and fixed.
8. The integrated circuit testing device according to claim 1, characterized in that: The main frame also includes a reinforced main shaft and a reinforced secondary shaft; the length direction of the reinforced main shaft and the main shaft is the same; the reinforced main shaft is provided on both sides of the main shaft; and a plurality of reinforced secondary shafts are connected between the reinforced main shaft and the main shaft.
9. The integrated circuit testing device according to claim 1, characterized in that: The test box comprises a front cover plate and a box body which are tightly fitted together; one of the opposite ends of the front cover plate and the box body is fixedly provided with a magnet, and the other end is fixedly provided with an iron sheet which matches the magnet.
10. An integrated circuit testing device according to claim 9, characterized in that: The lower end of the front cover is rotatably connected to the lower end of the box body; and a gripping portion is formed on the upper end of the front cover.