Metallographic microstructure marking device

Abstract

The utility model discloses a metallographic microstructure marking device which comprises a workbench, a lifting system and a marking system, the lifting system is connected to the workbench, and the marking system is installed on the lifting system. And the observation requirements of a high-power optical microscope and a scanning electron microscope can be simultaneously met. The metallographic microscopic structure marking device is simple and reasonable in overall structural design, can mark metallographic microscopic structures in areas needing key observation through the workbench, the lifting system and the marking system, meets the observation requirements of an optical microscope and a scanning electron microscope at the same time, is greatly helpful for improving the observation accuracy and efficiency of the metallographic microscopic structures, and is suitable for large-scale popularization and application. In addition, the device has the advantages of being easy to operate, convenient to carry and wide in application prospect.

Description

Technical Field

[0001] The utility model relates to the technical field of metallographic microstructure testing, in particular to a metallographic microstructure marking device. Background Art

[0002] Metallographic microstructure is the intuitive morphology of the internal components of the alloy that can be seen under a metallographic microscope or an electron microscope. It describes the nature, form, size, quantity and distribution characteristics of each component, which is composed of different phases. The observation of metallographic microstructure before and after corrosion is of great significance for judging the type and mechanical properties of metal materials. However, in the process of metallographic microstructure observation, especially when observing under a high-power optical microscope and a scanning electron microscope, due to the large size of the sample, the test personnel often need a long time to find the area that needs to be focused on, or there is more than one area that needs to be focused on, and repeated comparative observations are required. In the process of comparative observation, the area that was previously focused on is often not found in a timely and effective manner, which greatly increases the difficulty of metallographic microstructure testing and greatly prolongs the test time, resulting in low test efficiency.

[0003] Therefore, in order to solve the above-mentioned technical problems, the utility model designs a metallographic microstructure marking device, which can mark the metallographic microstructure of the area that needs to be observed, and at the same time meet the observation requirements of high-power optical microscopes and scanning electron microscopes. This is of great help in improving the accuracy and efficiency of metallographic microstructure observation, and is of great significance to metallographic microstructure experiments. Utility Model Content

[0004] The purpose of the utility model is to overcome the above-mentioned deficiencies in the prior art and to provide a metallographic microstructure marking device with a reasonable structural design.

[0005] The technical solution adopted by the utility model to solve the above-mentioned problem is: a metallographic microstructure marking device, characterized in that it includes a workbench, a lifting system and a marking system, the lifting system is connected to the workbench, and the marking system is installed on the lifting system. The use of this device can realize preliminary observation and marking of metallographic microstructures, and can simultaneously meet the observation requirements of high-power optical microscopes and scanning electron microscopes.

[0006] Furthermore, the workbench includes a base, a sample slot and a sample fixing bolt. The base is provided with a sample slot, and the base is connected with a sample fixing bolt. The sample fixing bolt can be extended into the sample slot. The sample to be observed can be placed in the sample slot. When the position of the sample is determined, the sample can be fixed with the sample fixing bolt. At the same time, the base is fixedly connected to the support rod of the lifting system and cannot be disassembled.

[0007] Furthermore, the lifting system includes a support rod, a track, a slider fixing bolt, a lifting platform, an eyepiece fixing hole, a slider and an eyepiece fixing bolt. The support rod is provided with a track, the track is slidably connected to the slider, the lifting platform is connected to the slider, thereby realizing vertical movement of the lifting platform, the slider is fastened to the track by the slider fixing bolt, thereby realizing fixation of the lifting platform, the lifting platform is provided with an eyepiece fixing hole, the lifting platform is connected with an eyepiece fixing bolt, the eyepiece fixing bolt can be extended into the eyepiece fixing hole, and the marking system can be fastened to the lifting platform.

[0008] Furthermore, the marking system includes an eyepiece, an objective lens, an optical microscopic marker and a scanning microscopic marker, the top of the eyepiece is provided with an observation hole, the bottom of the observation hole is fixed with an eyepiece lens, the inner side of the bottom of the eyepiece is provided with a connecting thread, and the eyepiece can be connected to the objective lens, the optical microscopic marker or the scanning microscopic marker through the connecting thread; the upper part of the objective lens is provided with a thread, which can be connected to the eyepiece, and the bottom of the objective lens is installed with an objective lens; the optical microscopic marker and the scanning microscopic marker are both composed of a connecting column and a marking rod, the marking rod is connected to the bottom of the connecting column, the upper part of the connecting column is provided with a thread, which can be connected to the eyepiece, and the The connecting column is a solid cylindrical structure, the marking rod is a hollow cylindrical structure, and the inner wall diameter of the marking rod is Φ2mm; the bottom edge of the marking rod of the optical microscopic marker is a blunt edge. When the optical microscopic marker is used to mark the sample, the blunt edge contacts the sample surface. At this time, a fluorescent pen can be used to mark the contact area, or the blunt edge can be smeared with dye or ink in advance for use; the bottom of the marking rod of the scanning microscopic marker is a sharp blade edge. When the scanning microscopic marker is used to mark the sample, the blade edge is pressed down with force, leaving a hollow indentation on the sample surface. The material of the marking rod of the scanning microscopic marker is high-strength alloy structural steel.

[0009] Compared with the prior art, the utility model has the following advantages and effects: the overall structural design is simple and reasonable, and the metallographic microstructure of the area requiring key observation can be marked through the provided workbench, lifting system and marking system, and at the same time, the observation requirements of the optical microscope and the scanning electron microscope can be met, which is of great help in improving the accuracy and efficiency of metallographic microstructure observation, and the utility model is also simple to operate and easy to carry, and has broad application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 It is the front view of the overall assembly of the utility model;

[0011] Figure 2 It is a right side view of the overall assembly of the utility model;

[0012] Figure 3 It is a top view of the overall assembly of the utility model;

[0013] Figure 4 It is a partial cross-sectional schematic diagram of the eyepiece in the utility model;

[0014] Figure 5 It is the front view of the objective lens in the utility model;

[0015] Figure 6 It is a front view of the optical microscopic marker in the utility model;

[0016] Figure 7 It is a bottom view of the optical microscopic marker in the utility model;

[0017] Figure 8 This is a front view of the scanning microscopic marker in the utility model;

[0018] Fig. 9 It is a bottom view of the scanning microscopic marker in the utility model.

[0019] In the figure: workbench Ⅰ, lifting system Ⅱ, marking system Ⅲ.

[0020] Workbench Ⅰ: base 1, sample slot 2, sample fixing bolt 3;

[0021] Lifting system II: support rod 4, track 5, slider fixing bolt 6, lifting platform 7, eyepiece fixing hole 8, slider 9, eyepiece fixing bolt 10;

[0022] Marking system III: eyepiece 11, eyepiece lens 12, observation hole 13, connecting thread 14, objective lens 15, objective lens 16, optical microscope marker 17, connecting column 18, marking rod 19, blunt edge 20, scanning microscope marker 21, knife edge 22. DETAILED DESCRIPTION

[0023] The present invention will be further described in detail below with reference to the accompanying drawings and through examples. The following examples are provided to explain the present invention, but the present invention is not limited to the following examples.

[0024] Example

[0025] See also Figures 1 to 9 The utility model provides a metallographic microstructure marking device, comprising a workbench I, a lifting system II and a marking system III, wherein the lifting system II is connected to the workbench I, and the marking system III is installed on the lifting system II. The device can be used to achieve preliminary observation and marking of metallographic microstructures, so as to facilitate further observation of the metallographic microstructures under a high-power optical microscope and a scanning electron microscope.

[0026] The workbench I includes a base 1, a sample slot 2 and a sample fixing bolt 3. The base 1 is provided with a sample slot 2, and the base 1 is connected with a sample fixing bolt 3. Bolt through holes are provided at both ends of the base 1 to cooperate with the sample fixing bolt 3. The sample fixing bolt 3 can be inserted into the sample slot 2. The sample to be observed can be placed in the sample slot 2. The sample can be moved to any position in the sample slot 2 to meet the requirements of preliminary observation of metallographic microstructure. When the position of the sample is determined, the sample can be fixed with the sample fixing bolt 3. At the same time, the base 1 is fixedly connected to the support rod 4 of the lifting system II and cannot be disassembled.

[0027] Lifting system II includes a support rod 4, a track 5, a slider fixing bolt 6, a lifting platform 7, an eyepiece fixing hole 8, a slider 9 and an eyepiece fixing bolt 10. The support rod 4 is fixedly connected to the base 1 and cannot be disassembled. A track 5 is provided on the support rod 4. The track 5 is slidably connected to the slider 9. The lifting platform 7 is connected to the slider 9, so as to realize the vertical movement of the lifting platform 7. The slider 9 is fastened to the track 5 by the slider fixing bolt 6, so as to realize the fixation of the lifting platform 7. The lifting platform 7 is provided with an eyepiece fixing hole 8. The marking system III is connected to the lifting platform 7 through the eyepiece fixing hole 8. The lifting platform 7 is connected with an eyepiece fixing bolt 10. The eyepiece fixing bolt 10 can be extended into the eyepiece fixing hole 8, so as to fasten the marking system III to the lifting platform 7.

[0028] The marking system III includes an eyepiece 11, an objective lens 15, an optical microscopic marker 17 and a scanning microscopic marker 21. The top of the eyepiece 11 is provided with an inverted trapezoidal observation hole 13, and the bottom of the observation hole 13 is fixed with an eyepiece lens 12 through a slot, and the magnification of the eyepiece lens 12 is 5×. A connecting thread 14 is provided on the inner side of the bottom of the eyepiece 11, and the eyepiece 11 can be connected to the objective lens 15, the optical microscopic marker 17 or the scanning microscopic marker 21 through the connecting thread 14; the upper part of the objective lens 15 is provided with a thread, which can be connected to the eyepiece 11, and the bottom of the objective lens 15 is installed with an objective lens 16, and the magnification of the objective lens 16 is 10× and 20× respectively. The objective lens 15 should be used in a bright place to observe the sample. When the light is insufficient, an external light source should be used for illumination; the optical microscopic marker 17 and the scanning microscopic marker 21 are both composed of a connecting column 18 and a marking rod 19, and the marking rod 19 is connected to the eyepiece 11. It is connected to the bottom of the connecting column 18. The upper part of the connecting column 18 is provided with a thread and can be connected to the eyepiece 11. The connecting column 18 is a solid cylindrical structure, and the connecting column 18 is fixedly connected to the marking rod 19 and cannot be disassembled. The marking rod 19 is a hollow cylindrical structure, and the inner wall diameter of the marking rod 19 is Φ2mm; the bottom edge of the marking rod 19 of the optical microscopic marker 17 is a blunt edge 20. When the optical microscopic marker 17 is used to mark the sample, the blunt edge 20 contacts the surface of the sample. At this time, a fluorescent pen can be used to mark the contacting place, or the blunt edge 20 can be smeared with dye or ink in advance for use; the bottom of the marking rod 19 of the scanning microscopic marker 21 is a sharp blade edge 22. When the scanning microscopic marker 21 is used to mark the sample, the blade edge 22 is pressed down with force, leaving a hollow indentation on the surface of the sample. The material of the marking rod 19 of the scanning microscopic marker 21 is high-strength alloy structural steel.

[0029] When the device is used for metallographic microstructure calibration, the metallographic microstructure is firstly observed. The eyepiece 11 is connected to the objective lens 15 by connecting the thread 14, and the eyepiece 11 is fixed on the lifting platform 7. The height of the lifting platform 7 is adjusted by the track 5. The sample placed in the sample slot 2 is observed in the eyepiece 11. The metallographic microstructure to be observed is found by adjusting the magnification of the objective lens 15. If the metallographic microstructure at this location needs to be observed under a high-power optical microscope, the objective lens 15 is replaced with an optical microscopic marker 17. The height of the lifting platform 7 is adjusted by the track 5 so that the blunt edge 20 contacts the sample surface. At this time, a fluorescent pen can be used to mark the metallographic microstructure at the contact point. If the metallographic microstructure at this location needs to be observed under a scanning electron microscope, the objective lens 15 is replaced with a scanning microscopic marker 21. The height of the lifting platform 7 is adjusted by the track 5 so that the blade edge 22 contacts the sample surface. The blade edge 22 is pressed down with force to leave a hollow indentation on the sample surface to achieve the marking of the metallographic microstructure.

[0030] The contents not described in detail in this specification belong to the prior art known to professional and technical personnel in this field.

[0031] In addition, it should be noted that the above content described in this specification is only an example of the structure of the utility model. All equivalent changes made based on the structure, features and principles described in the utility model patent are included in the protection scope of the utility model patent. Technicians in the technical field of the utility model can make various modifications, supplements or replace the specific embodiments described in a similar manner, as long as they do not deviate from the structure of the utility model or exceed the scope defined by the claims, they should all fall within the protection scope of the utility model.

Claims

1. A metallographic microstructure marking device, characterized in that: It comprises a workbench (Ⅰ), a lifting system (Ⅱ) and a marking system (Ⅲ), wherein the lifting system (Ⅱ) is connected to the workbench (Ⅰ), and the marking system (Ⅲ) is installed on the lifting system (Ⅱ); The workbench (I) comprises a base (1), the base (1) is provided with a sample slot (2), the base (1) is connected with a sample fixing bolt (3), the sample fixing bolt (3) extends into the sample slot (2) and is used to fix the sample in the sample slot (2); The lifting system (II) comprises a support rod (4), a slider fixing bolt (6), a lifting platform (7), a slider (9) and an eyepiece fixing bolt (10); the support rod (4) is fixedly connected to the base (1); a track (5) is provided on the support rod (4); the track (5) is slidably connected to the slider (9); the lifting platform (7) is connected to the slider (9); the slider (9) is fixed to the track (5) by the slider fixing bolt (6); an eyepiece fixing hole (8) is provided on the lifting platform (7); the eyepiece fixing bolt (10) is connected to the lifting platform (7); the eyepiece fixing bolt (10) extends into the eyepiece fixing hole (8) and is used to fix the marking system (III); The marking system (III) comprises an eyepiece (11), an objective lens (15), an optical microscopic marker (17) and a scanning microscopic marker (21); an observation hole (13) is provided at the top of the eyepiece (11); an eyepiece lens (12) is fixed at the bottom of the observation hole (13); and a connecting thread (14) is provided on the inner side of the bottom of the eyepiece (11) for connecting the objective lens (15), the optical microscopic marker (17) or the scanning microscopic marker (21).

2. The metallographic microstructure marking device according to claim 1, characterized in that: The upper portion of the objective lens (15) is provided with a thread, and the bottom of the objective lens (15) is mounted with an objective lens (16).

3. The metallographic microstructure marking device according to claim 1 or 2, characterized in that: The optical microscopic marker (17) and the scanning microscopic marker (21) are both composed of a connecting column (18) and a marking rod (19), wherein the marking rod (19) is connected to the bottom of the connecting column (18), and a thread is provided on the top of the connecting column (18). The connecting column (18) is a solid cylindrical structure, and the marking rod (19) is a hollow cylindrical structure.

4. The metallographic microstructure marking device according to claim 3, characterized in that: The bottom edge of the marking rod (19) of the optical microscopic marker (17) is a blunt edge (20), and the bottom of the marking rod (19) of the scanning microscopic marker (21) is a sharp edge (22).

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