Testing device for switch discharge tube
By designing a test device including base, test board, insulating plate, copper plate and frame, the problem of conducting light-proof test of switching discharge tubes in bright environments is solved, and the convenience of direct light-proof test in bright environments is achieved. and accuracy.
Patent Information
- Application Number
- CN202420816884.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-18
- Publication Date
- 2024-12-27
- Estimated Expiration
- 2034-04-18
AI Technical Summary
The existing switch discharge tube test device cannot be tested directly in a bright environment in a light environment, and the light source needs to be blocked or disconnected to simulate a dark environment.
A test device is designed, including a base, test board, insulating plate, copper plate and frame, and the switch discharge tube is placed in a dark environment through abutment and snap structure, and the probe is used to contact the discharge tube through the test hole to collect data. Avoid direct occlusion or disconnection of the light source.
In a bright environment, it can effectively simulate light-proof conditions and collect test data of the switch discharge tube without additional occlusion or disconnection of the light source, which improves the convenience and accuracy of the test.
Smart Images
Figure CN222259495U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of electronic component detection equipment, and in particular to a testing device for a switch discharge tube. Background Art
[0002] The switching discharge tube is a switching device that is turned on by voltage. It can provide short-term, extremely high-peak leading-edge voltage and current pulses and generate high-voltage pulses.
[0003] When testing the photosensitivity effect of an existing switch discharge tube, it is necessary not only to obtain data under illumination but also under light-shielded conditions, and to compare the data measured under light-shielded conditions with the data under illumination to observe whether the two sets of data under light-shielded conditions and under illumination conditions are within an error range.
[0004] When testing the switch discharge tube in the dark, if it is in a bright environment, it is impossible to directly test the switch discharge tube in the dark. The light source must be blocked or turned off first so that the switch discharge tube is in a dark environment. Only then can the data of the switch discharge tube in the dark be obtained. Utility Model Content
[0005] In order to perform a light-shielding test in a bright environment without blocking or disconnecting the light source, the present application provides a testing device for a switch discharge tube.
[0006] The present application provides a testing device for a switch discharge tube, which adopts the following technical solution:
[0007] A testing device for a switch discharge tube comprises a base and a test board, wherein the base comprises an insulating plate, a copper plate and a frame abutting against each other in sequence, the test board is embedded in the frame and abuts against the copper plate, and a plurality of equally spaced placement grooves are provided at one end of the test board abutting against the copper plate, wherein the placement grooves are used to place the switch discharge tube.
[0008] By adopting the above technical scheme, the insulating plate, the copper plate and the frame are abutted in sequence, the test board is embedded in the frame, and the test board is abutted against the copper plate. A plurality of equally spaced placement grooves are provided at one end where the test board abuts against the copper plate. The placement grooves are used to place the switch discharge tube. It is only necessary to place the switch discharge tube in the placement groove, and then the entire test board is embedded in the frame and abutted against the copper plate, so that the switch discharge tube placed in the placement groove is in a dark environment, and there is no need to block or cut off the light source separately, which is conducive to testing the light protection condition of the switch discharge tube in bright conditions.
[0009] Optionally, a test hole for a probe to extend into is provided at the bottom of the storage slot.
[0010] By adopting the above technical solution, a test hole for the probe to extend into is opened at the bottom of the storage slot, so that the probe can contact the switch discharge tube through the test hole, which is conducive to obtaining test data.
[0011] Optionally, one end of the frame that abuts against the copper plate is provided with a plurality of equally spaced clips, and the clips pass through the copper plate and are clipped to the insulating plate.
[0012] By adopting the above technical solution, a plurality of equally spaced clips are provided at one end where the frame abuts against the copper plate, and the clips are passed through the copper plate and snapped into the insulating plate, so that the frame can be quickly connected to the insulating plate by passing through the copper plate through the clips.
[0013] Optionally, the insulating plate is provided with a plurality of first positioning holes which are equidistantly distributed, and the positions of the first positioning holes are consistent with the positions of the buckles.
[0014] By adopting the above technical solution, a plurality of equidistantly distributed first positioning holes are opened on the insulating plate, and the positions of the first positioning holes and the buckles are consistent, so that before the frame and the insulating plate are snapped together, the frame and the insulating plate can be pre-positioned by aligning the buckles with the first positioning holes.
[0015] Optionally, a plurality of equally spaced slots are formed on one end of the insulating plate away from the end abutting against the copper plate, and the slots are connected to the first positioning hole.
[0016] By adopting the above technical solution, a card slot is opened at the end of the insulating plate that is away from the copper plate and abuts against the copper plate, and the card slot is connected to the first positioning hole, so that the buckle can pass through the copper plate and the insulating plate in sequence and snap into the card slot. The setting of the card slot prevents the buckle from passing through the insulating plate, which is beneficial to protecting the buckle.
[0017] Optionally, a contact sheet is provided on one side wall of the copper plate.
[0018] By adopting the above technical solution, a contact sheet is provided on one side wall of the copper plate, which is beneficial to testing the switch discharge tube.
[0019] Optionally, the insulating plate is provided with a pull portion at a pair of opposite side walls.
[0020] By adopting the above technical solution, a pair of opposite side walls of the insulating plate are provided with a lever part, so that when the insulating plate and the frame need to be disassembled, the lever part on the insulating plate can be pulled, which is conducive to the disassembly of the insulating plate and the frame.
[0021] Optionally, the diameter of the test hole is smaller than the diameter of the storage slot.
[0022] By adopting the above technical solution, the diameter of the test hole is set smaller than the diameter of the storage slot, so that the light source is not easy to enter the storage slot through the test hole.
[0023] In summary, the present application includes at least one of the following beneficial technical effects:
[0024] The insulating plate, the copper plate and the frame are sequentially butted, the test board is embedded in the frame, and the test board is butted against the copper plate. A plurality of equally spaced placement slots are provided at one end where the test board is butted against the copper plate. The placement slots are used to place the switch discharge tube. The switch discharge tube only needs to be placed in the placement slot, and then the entire test board is embedded in the frame and butted against the copper plate, so that the switch discharge tube placed in the placement slot is in a dark environment, and there is no need to block or cut off the light source, which is conducive to testing the light-shielding condition of the switch discharge tube in bright conditions;
[0025] A test hole for the probe to be inserted is provided at the bottom of the storage slot, so that the probe can contact the switch discharge tube through the test hole, which is conducive to obtaining test data;
[0026] A plurality of equally spaced buckles are arranged at one end where the frame abuts against the copper plate. The buckles are passed through the copper plate and snapped into the insulating plate, so that the frame passes through the copper plate and is quickly connected to the insulating plate through the buckles. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] Figure 1 It is a structural diagram of the overall structure in the embodiment of the present application.
[0028] Figure 2 It is a schematic diagram of the exploded structure of the base in the embodiment of the present application.
[0029] Figure 3 It is a structural diagram of the framework in the embodiment of the present application.
[0030] Figure 4 yes Figure 3 Schematic diagram of the structure of part A in the middle.
[0031] Figure 5 It is a schematic diagram of the structure of the insulation board in the embodiment of the present application.
[0032] Figure 6 yes Figure 5 Schematic diagram of the structure of part B.
[0033] Figure 7 It is a schematic diagram of the structure of the test board in the embodiment of the present application.
[0034] Explanation of the reference numerals: 1. base; 11. copper plate; 111. contact piece; 112. second positioning hole; 12. frame; 121. buckle; 1211. first clamping block; 1212. second clamping block; 13. insulating plate; 131. first positioning hole; 132. clamping slot; 133. lever part; 2. test board; 21. storage slot; 22. test hole. DETAILED DESCRIPTION
[0035] The following is combined with Figure 1-7 This application is described in further detail.
[0036] The present application embodiment discloses a testing device for a switch discharge tube. Figure 1 A testing device for a switch discharge tube comprises a base 1 and a test board 2. The switch discharge tube is placed in the test board 2, and the test board 2 with the switch discharge tube is embedded in the base 1, so that the test board 2 and the base 1 are covered, which is conducive to testing the light-shielding condition of the switch discharge tube in a bright environment.
[0037] Reference Figure 1 and Figure 2 The base 1 includes a copper plate 11, a frame 12 and an insulating plate 13, and the insulating plate 13, the copper plate 11 and the frame 12 are abutted in sequence, the copper plate 11 is located between the insulating plate 13 and the frame 12, and the insulating plate 13 is assumed to be the bottom of the base 1, and the frame 12 is the top of the base 1, and the size of the copper plate 11 is smaller than that of the frame 12 and the insulating plate 13, so that the four side walls of the copper plate 11 can not protrude outside, which is beneficial to protecting the four sides of the copper plate 11. A contact piece 111 is integrally formed at the side wall of one end of the copper plate 11, and the contact piece 111 is arranged to protrude outside. The contact piece 111 is used for powering on, which is beneficial to collecting data of the switch discharge tube.
[0038] Reference Figure 3 and Figure 4 A plurality of equally spaced snaps 121 are integrally formed at the bottom where the frame 12 and the copper plate 11 are in contact. In the present embodiment, according to the structural dimensions of the frame 12, four groups of equally spaced snaps 121 are provided on the frame 12. To facilitate the snapping and disconnecting of the snaps 121, the snaps 121 include a first snap block 1211 and a second snap block 1212 that are relatively arranged. When the frame 12 and the insulating plate 13 need to be disconnected, the first snap block 1211 and the second snap block 1212 can move closer in opposite directions under the action of force.
[0039] Reference Figure 2 , Figure 3 and Figure 5, a plurality of equidistantly distributed first positioning holes 131 are opened on the insulating plate 13. In the present embodiment, according to the structural dimensions of the insulating plate 13, four equidistantly distributed first positioning holes 131 are opened on the insulating plate 13, and the first positioning holes 131 correspond one-to-one to the buckles 121. A plurality of equidistantly distributed second positioning holes 112 are also opened on the copper plate 11. In the present embodiment, according to the structural dimensions of the insulating plate 13, four equidistantly distributed second positioning holes 112 are opened on the copper plate 11, and the second positioning holes 112 correspond one-to-one to the first positioning holes 131, so that the second positioning holes 112 also correspond one-to-one to the buckles 121.
[0040] Reference Figure 2 , Figure 4 and Figure 6 A plurality of equally spaced card slots 132 are provided at the bottom of the insulating plate 13 away from the copper plate 11. In the present embodiment, according to the structural dimensions of the insulating plate 13, four equally spaced card slots 132 are provided at the insulating plate 13, and the card slots 132 are connected to the first positioning hole 131, so that the buckle 121 can pass through the second positioning hole 112 and the second positioning hole 112 in sequence so that the buckle 121 is engaged with the card slot 132. At the same time, in order to facilitate the disconnection of the frame 12 and the insulating plate 13, a pull portion 133 is integrally formed at a pair of opposite side walls of the insulating plate 13.
[0041] Reference Figure 1 , Figure 2 and Figure 7 A plurality of equally spaced placement grooves 21 are provided at the bottom of the test board 2 where the test board 2 abuts against the copper plate 11, so that the switch discharge tube can be placed in the placement groove 21. When the test board 2 is covered on the base 1, the switch discharge tube can abut against the copper plate 11. A plurality of equally spaced test holes 22 are provided at one end of the test board 2 away from the abutment with the copper plate 11. The test holes 22 are used for the probe to extend into the placement groove 21 and contact the switch discharge tube. The plurality of equally spaced test holes 22 correspond to the plurality of equally spaced placement grooves 21 one by one and each test hole 22 is connected to each placement groove 21. In order to prevent the light source from easily entering the placement groove 21 through the test hole 22, the diameter of the test hole 22 is set smaller than the diameter of the placement groove 21, and the diameter of the test hole 22 can only pass the probe.
[0042] The implementation principle of a test device for a switch discharge tube in an embodiment of the present application is as follows: the insulating plate 13, the copper plate 11 and the frame 12 are abutted in sequence, the buckle 121 is passed through the second positioning hole 112 and the first positioning hole 131 in sequence to make the frame 12 and the insulating plate 13 snap-fitted, the switch discharge tube is placed in the storage slot 21, after the switch discharge tube is placed, the test board 2 is embedded in the frame 12, so that the test board 2 and the base 1 are covered, and after covering, the switch discharge tube is abutted against the copper plate 11, after power is applied to the contact piece 111, the probe is extended into the storage slot 21 through the test hole 22 to contact the switch discharge tube, so as to collect test data of the switch discharge tube in a light-proof state.
[0043] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.
Claims
1. A test device for a switch discharge tube, characterized in that: The invention comprises a base (1) and a test board (2), wherein the base (1) comprises an insulating plate (13), a copper plate (11) and a frame (12) which are abutted in sequence, the test board (2) is embedded in the frame (12) and abuts against the copper plate (11), and a plurality of equally spaced placement grooves (21) are provided at one end of the test board (2) abutting against the copper plate (11), and the placement grooves (21) are used to place switch discharge tubes.
2. A test device for a switch discharge tube according to claim 1, characterized in that: The bottom of the storage groove (21) is provided with a test hole (22) for the probe to extend into.
3. A testing device for a switch discharge tube according to claim 1, characterized in that: One end of the frame (12) that abuts against the copper plate (11) is provided with a plurality of equally spaced snap fasteners (121), and the snap fasteners (121) pass through the copper plate (11) and are snap fastened to the insulating plate (13).
4. A testing device for a switch discharge tube according to claim 3, characterized in that: The insulating plate (13) is provided with a plurality of first positioning holes (131) distributed at equal intervals, and the positions of the first positioning holes (131) are consistent with the positions of the buckles (121).
5. A testing device for a switch discharge tube according to claim 4, characterized in that: A plurality of equally spaced slots (132) are provided on one end of the insulating plate (13) away from the end abutting against the copper plate (11); the slots (132) are connected to the first positioning hole (131).
6. A testing device for a switch discharge tube according to claim 5, characterized in that: A contact sheet (111) is provided on one side wall of the copper plate (11).
7. A testing device for a switch discharge tube according to claim 5, characterized in that: The insulating plate (13) is provided with a pull portion (133) at a pair of opposite side walls.
8. A testing device for a switch discharge tube according to claim 2, characterized in that: The diameter of the test hole (22) is smaller than the diameter of the storage groove (21).