Single-probe type electrostatic field simulation surveying and mapping device
By adopting a biaxial sliding table and spring probe structure in the electrostatic field simulation device, the problem of probe position adjustment offset in the prior art is solved, the accuracy and accuracy of the experiment are improved, and the accurate mapping of the electrostatic field distribution is achieved. .
Patent Information
- Application Number
- CN202420853496.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-23
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2034-04-23
AI Technical Summary
Existing electrostatic field simulation devices are prone to deviation when adjusting the probe position, resulting in inaccurate experimental results, especially in the measurement of electrostatic field distribution of complex-shaped charged bodies, which is difficult to ensure accuracy.
A single-probe electrostatic field simulation surveying and mapping device is designed, using a dual-axis sliding table and a spring probe structure, and the precise position adjustment of the X-axis and Y-axis direction is achieved through the scale adjustment of the dual-axis sliding table, and the spring probe is used. Ensure the probe is in close contact with the conductive dielectric and avoid poor contact.
The precise adjustment of probe position and stable contact are achieved, the accuracy and accuracy of the experiment are improved, and the accurate mapping of the electrostatic field distribution is ensured.
Smart Images
Figure CN222280738U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of electrostatic field simulation devices, and in particular relates to a single-probe type electrostatic field simulation surveying and mapping device. Background Art
[0002] The distribution of the electrostatic field generated by a charged body of complex shape is difficult to calculate using theoretical methods. When measuring, the instrument (or its probe) is placed in the electrostatic field, which easily distorts the original distribution of the measured field. At present, a double-probe electrostatic field simulation experimental device is often used to simulate the electrostatic field and observe its changes. However, when marking points, the existing simulation device requires manual adjustment of the probe bracket position to match the points of different equipotential points. However, manual movement cannot ensure that the points are not offset, resulting in inaccurate experimental results. Utility Model Content
[0003] The utility model aims to provide a single-probe electrostatic field simulation surveying and mapping device, which solves the problem of low experimental accuracy of the existing electrostatic field simulation device.
[0004] The technical solution adopted by the utility model is a single-probe electrostatic field simulation surveying and mapping device, comprising a base, a dual-axis slide table is arranged on the base, a supporting bottom plate is connected to the dual-axis slide table, a conductive medium is arranged on the supporting bottom plate, a positive electrode and a negative electrode are arranged on the conductive medium, a positive electrode terminal and a negative electrode are arranged on the supporting bottom plate, the positive electrode terminal is connected to the positive electrode, the negative electrode terminal is connected to the negative electrode, the base is connected to one end of the probe bracket, the other end of the probe bracket is connected to a spring probe, the spring probe is connected to the positive electrode of a potential tester, the negative electrode of the potential tester is connected to the negative electrode terminal, and the positive electrode terminal and the negative electrode terminal are connected to a power supply.
[0005] The utility model is also characterized in that:
[0006] The dual-axis slide includes a "concave"-shaped second slide base arranged on the base, one end of the second slide base is rotatably connected to the side wall of one end of the second lead screw, the other end of the second lead screw passes through the side wall of the other end of the second slide base and the other end of the second lead screw is connected to the second knob, the second lead screw is threadedly connected to the second slider, the upper surface of the second slider is connected to the "concave"-shaped first slide base, one end of the first slide base is rotatably connected to the side wall of one end of the first lead screw, the other end of the first lead screw passes through the side wall of the other end of the first slide base and the other end of the first lead screw is connected to the first knob, the first lead screw is threadedly connected to the first slider, and the upper surface of the first slider is connected to the lower surface of the support bottom plate.
[0007] The side walls of the second slide base and the first slide base are both provided with scales.
[0008] Two second guide shafts are arranged between the two ends of the second slide base, the two second guide shafts are respectively arranged on both sides of the second lead screw, and the two second guide shafts are both sleeved with the second slide block.
[0009] Two first guide shafts are arranged between the two ends of the first slide base, the two first guide shafts are respectively arranged on both sides of the first lead screw, and the two first guide shafts are both sleeved with the first slide block.
[0010] The probe bracket includes a mounting plate arranged on the base, wherein one end of the mounting plate away from the dual-axis slide is connected to one end of the vertical plate, and the other end of the vertical plate is connected to the support arm. An upper plate is arranged on the upper surface of the support arm, and a through hole is arranged at one end of the upper plate away from the support arm. The through hole is arranged above the bottom plate of the support, and is connected to the spring probe.
[0011] A slide groove is arranged at one end of the upper plate away from the through hole, a bolt is inserted into the slide groove, and the end of the bolt passes through the support arm and is connected with a nut.
[0012] The spring probe includes a probe seat, on the outer wall of the probe seat and along its circumference, a card groove is arranged, the card groove is engaged with the side wall of the through hole, a boss is arranged inside the probe seat, a metal spring is arranged on the boss, the bottom of the metal spring is connected with one end of the spring, the other end of the spring is sleeved with the probe head, the other end of the probe head extends out of the probe seat, and the metal spring is connected to the positive pole of the potential tester.
[0013] The beneficial effects of the utility model are:
[0014] (1) The single-probe electrostatic field simulation surveying and mapping device of the utility model realizes position adjustment in the X-axis and Y-axis directions by setting a dual-axis slide table, can accurately adjust its position, and can be clearly observed through the scale. Moreover, due to the mechanical structure setting, as long as the first knob and the second knob are not turned, the adjusted position will not be offset, thereby improving the experimental accuracy;
[0015] (2) The single-probe electrostatic field simulation surveying and mapping device of the utility model can always be in contact with the conductive medium under the action of the spring by setting a spring probe, thereby avoiding poor contact and improving the accuracy of the experiment. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 This is a structural schematic diagram of the utility model single-probe electrostatic field simulation surveying and mapping device;
[0017] Figure 2 This is a front view of the single-probe electrostatic field simulation surveying and mapping device of the utility model;
[0018] Figure 3 It is a structural schematic diagram of a dual-axis slide table in a single-probe electrostatic field simulation surveying and mapping device of the utility model;
[0019] Figure 4 It is a schematic diagram of the structure of the probe bracket in the single-probe electrostatic field simulation surveying and mapping device of the utility model;
[0020] Figure 5 The utility model is a schematic diagram of the structure of a spring probe in a single-probe electrostatic field simulation surveying and mapping device.
[0021] In the figure, 1. conductive medium, 2. support bottom plate, 3. dual-axis slide, 4. probe bracket, 5. base, 6. spring probe, 7. power supply, 8. potential tester, 9. buckle, 10. positive terminal, 11. wire, 12. upper plate, 13. support arm, 14. vertical plate, 15. mounting plate, 16. bolt, 17. slide groove, 18. nut, 19. through hole, 20. probe seat, 21. slot, 22. probe head, 23. spring, 24. metal spring, 25. first slide base, 26. first knob, 27. first screw, 28. first guide shaft, 29. first slider, 30. second slide base, 31. second knob, 32. second screw, 33. second guide shaft, 34. second slider, 35. negative terminal, 36. boss. DETAILED DESCRIPTION
[0022] The utility model is described in detail below with reference to the accompanying drawings and specific implementation modes.
[0023] Example 1
[0024] The utility model single-probe electrostatic field simulation surveying and mapping device has a structure as follows Figure 1 and Figure 2 As shown, it includes a base 5, a biaxial slide 3 is arranged on the base 5, the biaxial slide 3 is used for moving and changing in the X-axis and Y-axis directions, the biaxial slide 3 is connected to a support base 2, a buckle 9 is arranged on the support base 2, a conductive medium 1 is arranged between the buckles 9, that is, the conductive medium 1 is fixed by the buckle 9, the conductive medium 1 is made of ITO conductive glass, a positive electrode and a negative electrode are arranged on the conductive medium 1, a positive electrode terminal 10 and a negative electrode terminal 35 are arranged on the support base 2, the positive electrode terminal 10 is connected to the positive electrode, The negative terminal 35 is connected to the negative electrode, the base 5 is connected to one end of the probe bracket 4, and the other end of the probe bracket 4 is connected to a spring probe 6, which is arranged directly above the conductive medium 1, and the spring probe 6 is in contact with the conductive medium 1. The spring probe 6 is connected to the positive pole of the potential tester 8, and the negative pole of the potential tester 8 is connected to the negative terminal 35. The potential tester 8 is used to measure the potential of each point on the conductive medium. The positive terminal 10 and the negative terminal 35 are connected to a power supply 7, and the power supply 7 is used to apply voltage.
[0025] like Figure 3As shown, the dual-axis slide 3 includes a "concave"-shaped second slide base 30 arranged on the base 5, one end of the second slide base 30 is rotatably connected to the side wall of one end of the second lead screw 32, the other end of the second lead screw 32 passes through the other end side wall of the second slide base 30 and the other end of the second lead screw 32 is connected to a second knob 31, and a second slider 34 is threadedly connected to the second lead screw 32. The second knob 31 is rotated to drive the second lead screw 32 to rotate, and the second slider 34 moves to achieve position adjustment in the X-axis direction. The upper surface of the second slider 34 The first surface is connected with a "concave"-shaped first slide base 25, one end of the first slide base 25 is rotatably connected to the side wall of one end of the first lead screw 27, the other end of the first lead screw 27 passes through the other end of the side wall of the first slide base 25 and the other end of the first lead screw 27 is connected to a first knob 26, and a first slider 29 is threadedly connected to the first lead screw 27. When the first knob 26 is turned to drive the first lead screw 27 to rotate, the first slider 29 moves to achieve position adjustment in the Y-axis direction. The upper surface of the first slider 29 is connected to the lower surface of the support bottom plate 2. In order to achieve the adjustment of the X-axis and Y-axis directions of the support base 2, two second guide shafts 33 are arranged between the two ends of the second slide base 30, that is, one end of each second guide shaft 33 is connected to one end of the second slide base 30, and the other end of each second guide shaft 33 is connected to the other end of the second slide base 30. The two second guide shafts 33 are respectively arranged on both sides of the second lead screw 32, and the two second guide shafts 33 are sleeved with the second slider 34. The second slider 34 can slide along the second guide shaft 33. In order to improve the stability of the second slider 34 and make the movement smoother, two first guide shafts 28 are arranged between the two ends of the first slide base 25, that is, one end of each first guide shaft 28 is connected to one end of the first slide base 25, and the other end of each first guide shaft 28 is connected to the other end of the first slide base 25. The two first guide shafts 28 are respectively arranged on both sides of the first lead screw 27, and the two first guide shafts 28 are both sleeved with the first slider 29. By setting the first guide shaft 28, the stability of the first slider 29 is improved, and the movement is smoother.
[0026] Scales are provided on the side walls of the second slide base 30 and the first slide base 25. The 0 scale on the second slide base 30 is set in the middle of the second slide base 30, and the 0 scale on the first slide base 25 is set in the middle of the first slide base 25, so that the distance moved in the X-axis and Y-axis directions can be clearly observed.
[0027] Example 2
[0028] On the basis of Example 1, Figure 4As shown, the probe bracket 4 includes an upper plate 12 and a mounting plate 15 arranged on the base 5, the mounting plate 15 is connected to the base 5 by bolts, one end of the mounting plate 15 away from the dual-axis slide 3 is connected to one end of the vertical plate 14, the other end of the vertical plate 14 is connected to the support arm 13, the mounting plate 15 is vertically arranged with the vertical plate 14, the mounting plate 15 is parallel to the support arm 13, one end of the upper plate 12 is provided with a through hole 19, the other end of the upper plate 12 is provided with a slide groove 17, the through hole 19 is arranged on the upper side of the support bottom plate 2 The through hole 19 is connected to the spring probe 6, the bolt 16 is inserted in the slide groove 17, and the end of the bolt 16 passes through the support arm 13 and is connected to the nut 18, then the upper plate 12 and the support arm 13 are connected and locked by the threaded connection between the nut 18 and the bolt 16. When the position of the spring probe 6 needs to be adjusted, the nut 18 and the bolt 16 are loosened, and the relative position of the slide groove 17 and the bolt 16, that is, the overlap length between the upper plate 12 and the support arm 13 is adjusted, and then the nut 18 and the bolt 16 are tightened to lock.
[0029] Example 3
[0030] On the basis of Example 2, Figure 5 As shown, the spring probe 6 includes a probe seat 20, and a slot 21 is arranged on the outer wall of the probe seat 20 and along its circumference. The probe seat 20 passes through the through hole 19, and the slot 21 is engaged with the side wall of the through hole 19. A boss 36 is arranged inside the probe seat 20, and a metal spring 24 is arranged on the boss 36. The bottom of the metal spring 24 is connected to one end of the spring 23, and the other end of the spring 23 is sleeved with the probe head 22. The other end of the probe head 22 extends out of the probe seat 20, and the metal spring 24 is connected to the positive pole of the potential tester 8. The probe head 22 is in contact with the conductive medium 1. Under the action of the spring 23, the probe head 22 can be ensured to be in close contact with the conductive medium 1 to avoid poor contact.
[0031] The working principle of the utility model single-probe electrostatic field simulation surveying and mapping device is as follows:
[0032] Step 1, fix the conductive medium 1 on the support bottom plate 2 by the buckle 9, set the positive electrode and the negative electrode on the conductive medium 1, the positive electrode is connected to the positive terminal 10, and the negative electrode is connected to the negative terminal 35, and the first screw 27 is driven to rotate by rotating the first knob 26, and the first screw 27 drives the first slider 29 to move along the Y-axis direction, and the midpoint of the first slider 29 is adjusted to align with the 0 scale point, and the second screw 32 is driven to rotate by rotating the second knob 31, and the second screw 32 drives the second slider 34 to move along the X-axis direction, and the midpoint of the second slider 34 is adjusted to align with the 0 scale point, that is, the dual-axis slide 3 is completed to the (0, 0) coordinate, and then the initial position of the spring probe 6 in contact with the conductive medium 1 is adjusted by adjusting the overlap length between the upper plate 12 and the support arm 13, and all adjustments are completed;
[0033] Step 2, turn on the power supply 7, set the output voltage of the power supply 7, turn on the potential tester 8, rotate the second knob 31 to drive the second screw 32 to rotate, the second screw 32 drives the second slider 34 to move along the X-axis direction, and rotate the first knob 26 to drive the first screw 27 to rotate, the first screw 27 drives the first slider 29 to move along the Y-axis direction, thereby driving the conductive medium 1 to move slowly, and the probe head 22 moves relatively on the conductive medium 1, finds the equipotential point, records the coordinate value of the point according to the scale value on the dual-axis slide, repeats this step, and finally draws the equipotential lines of different voltages according to all the coordinate values obtained, thereby obtaining the simulated electrostatic field distribution law and coordinate data.
Claims
1. Single-probe electrostatic field simulation surveying and mapping device, characterized in that: The invention comprises a base (5), wherein a biaxial slide (3) is arranged on the base (5), wherein the biaxial slide (3) is connected to a support base (2), wherein a conductive medium (1) is arranged on the support base (2), wherein a positive electrode and a negative electrode are arranged on the conductive medium (1), wherein a positive electrode terminal (10) and a negative electrode terminal (35) are arranged on the support base (2), wherein the positive electrode terminal (10) is connected to the positive electrode, and the negative electrode terminal (35) is connected to the negative electrode, wherein the base (5) is connected to one end of a probe bracket (4), wherein the other end of the probe bracket (4) is connected to a spring probe (6), wherein the spring probe (6) is connected to the positive electrode of a potential tester (8), wherein the negative electrode of the potential tester (8) is connected to the negative electrode terminal (35), and wherein the positive electrode terminal (10) and the negative electrode terminal (35) are connected to a power source (7).
2. The single-probe electrostatic field simulation surveying and mapping device according to claim 1, characterized in that: The dual-axis slide (3) comprises a second slide base (30) in a concave shape arranged on a base (5); one end of the second slide base (30) is rotatably connected to a side wall of one end of a second lead screw (32); the other end of the second lead screw (32) passes through the side wall of the other end of the second slide base (30); and the other end of the second lead screw (32) is connected to a second knob (31); a second slider (34) is threadedly connected to the second lead screw (32); and the upper end of the second slider (34) is The surface is connected with a first slide base (25) in the shape of a "concave" character, one end of the first slide base (25) is rotatably connected to a side wall of one end of a first lead screw (27), the other end of the first lead screw (27) passes through the side wall of the other end of the first slide base (25) and the other end of the first lead screw (27) is connected with a first knob (26), the first lead screw (27) is threadedly connected with a first slider (29), and the upper surface of the first slider (29) is connected to the lower surface of the support bottom plate (2).
3. The single-probe electrostatic field simulation surveying and mapping device according to claim 2, characterized in that: The side walls of the second slide base (30) and the first slide base (25) are both provided with scales.
4. The single-probe electrostatic field simulation surveying and mapping device according to claim 2, characterized in that: Two second guide shafts (33) are arranged between the two ends of the second slide base (30), the two second guide shafts (33) are respectively arranged on both sides of the second lead screw (32), and the two second guide shafts (33) are both sleeved with the second slide block (34).
5. The single-probe electrostatic field simulation surveying and mapping device according to claim 2, characterized in that: Two first guide shafts (28) are arranged between the two ends of the first slide base (25), the two first guide shafts (28) are respectively arranged on both sides of the first lead screw (27), and the two first guide shafts (28) are both sleeved with the first slide block (29).
6. The single-probe electrostatic field simulation surveying and mapping device according to claim 1, characterized in that: The probe bracket (4) comprises a mounting plate (15) arranged on a base (5); one end of the mounting plate (15) away from the dual-axis slide (3) is connected to one end of a vertical plate (14); the other end of the vertical plate (14) is connected to a support arm (13); an upper plate (12) is arranged on the upper surface of the support arm (13); one end of the upper plate (12) away from the support arm (13) is provided with a through hole (19); the through hole (19) is arranged above the support bottom plate (2); and the through hole (19) is connected to a spring probe (6).
7. The single-probe electrostatic field simulation surveying and mapping device according to claim 6, characterized in that: A slide groove (17) is provided at one end of the upper plate (12) away from the through hole (19), a bolt (16) is inserted into the slide groove (17), and the end of the bolt (16) passes through the support arm (13) and is connected to the nut (18).
8. The single-probe electrostatic field simulation surveying and mapping device according to claim 6, characterized in that: The spring probe (6) comprises a probe seat (20), a slot (21) is arranged on the outer wall of the probe seat (20) and along the circumference thereof, the slot (21) is engaged with the side wall of the through hole (19), a boss (36) is arranged inside the probe seat (20), a metal spring (24) is arranged on the boss (36), the bottom of the metal spring (24) is connected to one end of the spring (23), the other end of the spring (23) is sleeved with the probe head (22), the other end of the probe head (22) extends out of the probe seat (20), and the metal spring (24) is connected to the positive electrode of the potential tester (8).