Electric control aging test device, equipment and system

Abstract

The utility model discloses an electric control aging test device, equipment and system, and relates to the technical field of aging test, and the device comprises a DC power supply which is connected with the DC end of a first electric control module and the DC end of a second electric control module; the inductive reactance load is respectively connected with the alternating current end of the first electric control module and the alternating current end of the second electric control module; and the controller is respectively connected with the control end of the first electric control module and the control end of the second electric control module. The controller controls the first electric control module and the second electric control module on the two sides of the inductive reactance load to be conducted at the same time, so that the direct-current power source, the first electric control module, the inductive reactance load and the second electric control module form a test loop, and the first electric control module and the second electric control module are made to conduct aging tests synchronously in the test loop. The efficiency of the aging test is improved, the number of inductive reactance loads required by the aging test is reduced, and the cost is saved.

Description

Technical Field

[0001] The present application relates to the technical field of aging testing, and in particular to an electronically controlled aging testing device, equipment and system. Background Art

[0002] With the development of science and technology, motors have entered every corner of people's lives. In order to better manipulate the motor to work at a specific angle and speed, a motor controller is generally used to control the motor. In the prior art, in order to ensure the safety of the motor's operation, higher and higher requirements are placed on the service life and working stability of the motor controller. Usually, aging tests can be used to evaluate the service life and stability of motor controllers produced in the same batch. Therefore, aging tests are often performed during the development of motor controller products to determine the service life and working stability of new products. For traditional aging test devices, usually only a group of loads can be connected to a motor controller to perform aging tests separately, which has low test efficiency, long development time, and high cost. Utility Model Content

[0003] The main purpose of the present application is to provide an electronically controlled aging test device, equipment and system, aiming to solve the technical problem of how to synchronously perform aging tests on two electronically controlled modules through the same set of loads.

[0004] To achieve the above-mentioned purpose, an embodiment of the present application provides an electrically controlled aging test device, the electrically controlled aging test device comprising:

[0005] A DC power supply, connected to a DC terminal of the first electric control module and a DC terminal of the second electric control module, respectively, for providing DC power supply to the first electric control module and the second electric control module;

[0006] An inductive load, connected to an AC end of the first electric control module and an AC end of the second electric control module respectively;

[0007] The controller is respectively connected to the control end of the first electric control module and the control end of the second electric control module, and is used to send a control signal to the first electric control module and the second electric control module when receiving an aging test signal, so as to control the first electric control module and the second electric control module to form a test loop through the DC power supply and the inductive load, and synchronously perform an aging test in the test loop.

[0008] In one embodiment, the inductive load includes a plurality of test branches, and the first electric control module and the second electric control module both include a multi-channel bridge;

[0009] Each of the test branches is respectively connected to the bridge arms corresponding to the first electric control module and the second electric control module;

[0010] The control signal of the controller is used to control the first electric control module and the second electric control module on both sides of the same test branch to be turned on at the same time.

[0011] In one embodiment, when an upper bridge arm connected to one of the test branches in the first electric control module is turned on, a lower bridge arm connected to the test branch in the second electric control module is turned on;

[0012] When the lower bridge arm connected to one of the test branches in the first electric control module is turned on, the upper bridge arm connected to the test branch in the second electric control module is turned on.

[0013] In one embodiment, the first end of each of the test branches is connected to one of the bridge arms of the first electronic control module in a one-to-one correspondence, and the second end of each of the test branches is connected to one of the bridge arms of the second electronic control module in a one-to-one correspondence;

[0014] Each of the test branches comprises: a first resistor and a first inductor;

[0015] The first end of the first resistor is connected to one of the bridge arms of the first electric control module, the second end of the first resistor is connected to the first end of the first inductor, and the second end of the first inductor is connected to one of the bridge arms of the second electric control module.

[0016] In one embodiment, the resistance values ​​of the first resistors are the same, and the inductance values ​​of the first inductors are the same.

[0017] In one embodiment, the first electric control module includes a first three-phase bridge, the second electric control module includes a second three-phase bridge, and each of the test branches includes a first test branch, a second test branch, and a third test branch;

[0018] The A-phase port of the first three-phase bridge is connected to the A'-phase port of the second three-phase bridge through the first test branch, the B-phase port of the first three-phase bridge is connected to the B'-phase port of the second three-phase bridge through the second test branch, the C-phase port of the first three-phase bridge is connected to the C'-phase port of the second three-phase bridge through the third test branch, the bus positive end of the first three-phase bridge is respectively connected to the bus positive end of the second three-phase bridge and the positive electrode of the DC power supply, and the bus negative end of the first three-phase bridge is respectively connected to the bus negative end of the second three-phase bridge and the negative electrode of the DC power supply.

[0019] In one embodiment, the electrically controlled aging test device further comprises: a current detection module;

[0020] The current detection module is arranged between the DC power supply and the first electric control module, and the current detection module is also connected to the controller; the controller is also connected to the test host;

[0021] The current detection module is used to detect the test current in the test loop and transmit the test current to the controller;

[0022] The controller is further configured to send a test failure signal to the test host when the test current does not meet a standard current range preset by a user, so that the test host determines that the aging test of the first electronic control module and the second electronic control module fails.

[0023] In one embodiment, the electronically controlled aging test device further comprises: a voltage detection module;

[0024] The voltage detection module is connected in parallel to the DC power supply, and the voltage detection module is also connected to the controller; the controller is also connected to the test host;

[0025] The voltage detection module is used to detect the test voltage across the DC power supply and transmit the test voltage to the controller;

[0026] The controller is further configured to send a test failure signal to the test host when the test voltage does not meet a standard voltage range preset by a user, so that the test host determines that the aging test of the first electronic control module and the second electronic control module fails.

[0027] In addition, to achieve the above-mentioned purpose, the present application also provides an electrically controlled aging test device, which adopts the electrically controlled aging test device as described above.

[0028] In addition, to achieve the above-mentioned purpose, the present application also provides an electrically controlled aging test system, which adopts the electrically controlled aging test equipment as described above.

[0029] The embodiment of the present application provides an electronically controlled aging test device, equipment and system, wherein the electronically controlled aging test device comprises: a DC power supply, connected to the DC end of the first electronic control module and the DC end of the second electronic control module, respectively, for providing DC power supply to the first electronic control module and the second electronic control module; an inductive load, connected to the AC end of the first electronic control module and the AC end of the second electronic control module, respectively; and a controller, connected to the control end of the first electronic control module and the control end of the second electronic control module, respectively, for sending a control signal to the first electronic control module and the second electronic control module when receiving an aging test signal, so as to control the first electronic control module and the second electronic control module to form a test loop through the DC power supply and the inductive load, and synchronously perform an aging test in the test loop. The controller controls the first electronic control module and the second electronic control module on both sides of the inductive load to be turned on at the same time, so that the DC power supply, the first electronic control module, the inductive load and the second electronic control module form a test loop, and the first electronic control module and the second electronic control module are synchronously tested in the test loop, which not only improves the efficiency of the aging test, but also reduces the number of inductive loads required for the aging test, saving costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0031] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0032] Figure 1 A structural connection diagram provided for the first embodiment of the electronically controlled aging test device of the present application;

[0033] Figure 2 A circuit connection diagram provided for the second embodiment of the electronically controlled aging test device of the present application;

[0034] Figure 3 This is a circuit connection diagram provided for Example 3 of the electronically controlled aging test device of the present application.

[0035] The purpose, features and advantages of this application will be further described in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0036] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0037] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0038] The main solution of the present application is: a DC power supply, connected to the DC end of the first electric control module and the DC end of the second electric control module respectively; an inductive load, connected to the AC end of the first electric control module and the AC end of the second electric control module respectively; a controller, connected to the control end of the first electric control module and the control end of the second electric control module respectively. The controller controls the first electric control module and the second electric control module on both sides of the same group of inductive loads to be turned on at the same time, so that the DC voltage, the first electric control module, the inductive load and the second electric control module form a test loop, in which the first electric control module and the second electric control module can be synchronously subjected to aging test.

[0039] At present, a motor controller can generally be connected through a group of loads, and a single motor controller can be controlled by the motor controller to connect the load and the power supply, so as to perform aging tests on the motor controller separately. If multiple motor controllers need to be aged at the same time, each motor controller needs to be connected to its corresponding load and aged separately. In order to save costs, the number of loads is generally small. If each motor controller is aged separately, the total test time is long and the efficiency is low; if multiple motor controllers are aged at the same time, multiple loads need to be purchased, which increases the space required for the aging test and the cost required for the aging test. Therefore, how to synchronously perform aging tests on two motor controllers through the same group of loads is a problem that needs to be solved urgently.

[0040] The present application controls the first electronic control module and the second electronic control module on both sides of the inductive load to be turned on at the same time through a controller, so that the DC voltage, the first electronic control module, the inductive load and the second electronic control module form a test loop, so that the first electronic control module and the second electronic control module can perform aging tests synchronously, which not only improves the efficiency of the aging test, but also reduces the number of inductive loads required for the aging test, thereby saving costs.

[0041] Based on this, the present application proposes an electrically controlled aging test device of the first embodiment, please refer to Figure 1 , the electronically controlled aging test device comprises:

[0042] A DC power supply 10, connected to a DC terminal of the first electric control module M1 and a DC terminal of the second electric control module M2, respectively, for providing DC power supply to the first electric control module M1 and the second electric control module M2;

[0043] The inductive load 20 is connected to the AC end of the first electric control module M1 and the AC end of the second electric control module M2 respectively;

[0044] The controller 30 is respectively connected to the control end of the first electric control module M1 and the control end of the second electric control module M2, and is used to send a control signal to the first electric control module M1 and the second electric control module M2 when receiving an aging test signal, so as to control the first electric control module M1 and the second electric control module M2 to form a test loop through the DC power supply 10 and the inductive load 20, and synchronously perform an aging test in the test loop.

[0045] It should be understood that the electric control module refers to a motor controller. For the motor controller, the aging test is originally a process of converting DC power into AC power and transmitting it to the load by establishing a test loop between the DC power supply 10 and the load through a single motor controller. However, in this embodiment, a test loop is established between the DC power supply 10 and the inductive load 20 through the first electric control module M1 and the second electric control module M2, and the work of converting the DC power output by the DC power supply 10 into AC power is completed by the first electric control module M1 and the second electric control module M2.

[0046] It should be noted that, in this embodiment, the inductive load 20 can provide output impedance and output inductance for the DC power supply 10 to prevent the DC power supply 10 from being damaged due to excessive current and voltage. In a specific implementation, if the controller 30 receives an aging test signal sent by a user, it will generate a PWM signal corresponding to the aging test for controlling the first electric control module M1 and the second electric control module M2, that is, the control signal in this embodiment, and send the control signal to the first electric control module M1 and the second electric control module M2 respectively. When the first electric control module M1 receives the control signal sent by the controller 30, it connects the first connection branch between any one of the positive or negative poles of the DC power supply 10 and the inductive load 20, and at the same time, when the second electric control module M2 receives the control signal sent by the controller 30, it connects the second connection branch between the other pole of the DC power supply 10 and the inductive load 20, so that the DC power supply 10, the first electric control module M1, the inductive load 20 and the second electric control module M2 together form a test loop through the first connection branch and the second connection branch. Since the control signal can switch the corresponding connection relationship between the first connection branch and the second connection branch and the positive and negative poles of the DC power supply 10, under the joint action of the first electric control module M1 and the second electric control module M2, the DC power supply output by the DC power supply 10 can be converted into AC power supply and transmitted to the inductive load 20, so as to control the first electric control module M1 and the second electric control module M2 to synchronously complete the aging test. Among them, the technical solution of this embodiment can also be understood as allocating the work of performing aging test on a single electric control module to the first electric control module M1 and the second electric control module M2 respectively, so that the first electric control module M1 connects any pole of the DC power supply 10 with one end of the inductive load 20, and at the same time connects the other pole of the DC voltage with the other end of the inductive load 20, so that the first electric control module M1 and the second electric control module M2 cooperate with each other to synchronously complete the aging test.

[0047] It is worth noting that in the existing electric control aging test scheme, the aging test needs to be completed through a single electric control module through a single load, and multiple groups of loads need to be connected to their respective corresponding electric control modules for aging tests. In this embodiment, the two ends of each group of inductive loads 20 are connected to the first electric control module M1 and the second electric control module M2 respectively, and the aging test can be performed on the two connected electric control modules synchronously through a single inductive load 20. In the case of aging tests for multiple electric control modules, the number of required inductive loads 20 is reduced, which not only saves the space required for the aging test, but also improves the efficiency of the aging test and saves costs.

[0048] The embodiment of the present application provides an electronically controlled aging test device, which includes: a DC power supply, connected to the DC end of a first electronic control module and the DC end of a second electronic control module, respectively, for providing DC power supply to the first electronic control module and the second electronic control module; an inductive load, connected to the AC end of the first electronic control module and the AC end of the second electronic control module, respectively; and a controller, connected to the control end of the first electronic control module and the control end of the second electronic control module, respectively, for sending a control signal to the first electronic control module and the second electronic control module when receiving an aging test signal, so as to control the first electronic control module and the second electronic control module to form a test loop through the DC power supply and the inductive load, and synchronously perform an aging test in the test loop. The controller controls the first electronic control module and the second electronic control module on both sides of the inductive load to be turned on at the same time, so that the DC power supply, the first electronic control module, the inductive load and the second electronic control module form a test loop, and the first electronic control module and the second electronic control module are synchronously subjected to an aging test in the test loop, which not only improves the efficiency of the aging test, but also reduces the number of inductive loads required for the aging test, saving costs.

[0049] Based on the first embodiment of the present application, in the second embodiment of the present application, the same or similar contents as those in the above-mentioned embodiment 1 can refer to the above introduction, and will not be repeated later. Figure 2 , the inductive load 20 includes a plurality of test branches, and the first electric control module M1 and the second electric control module M2 both include a multi-channel bridge;

[0050] Each of the test branches is respectively connected to the bridge arms corresponding to the first electric control module M1 and the second electric control module M2;

[0051] The control signal of the controller 30 is used to control the first electric control module M1 and the second electric control module M2 on both sides of the same test branch to be turned on at the same time.

[0052] It is easy to understand that in this embodiment, the first electric control module M1 and the second electric control module M2 both contain multiple bridges, and the inductive load 20 can have multiple test branches. When the first electric control module M1 and the second electric control module M2 are subjected to aging tests at the same time, one end of each test branch is connected to the DC power supply 10 through a bridge arm of the first electric control module M1, and the other end of the test branch is connected to the DC power supply 10 through a bridge arm of the second electric control module M2, so that a complete test loop is formed between the DC power supply 10-the first electric control module M1-the inductive load 20 and the second electric control module M2.

[0053] Further, in this embodiment, when the upper bridge arm connected to one of the test branches in the first electric control module M1 is turned on, the lower bridge arm connected to the test branch in the second electric control module M2 is turned on;

[0054] When the lower bridge arm connected to one of the test branches in the first electric control module M1 is turned on, the upper bridge arm connected to the test branch in the second electric control module M2 is turned on.

[0055] It is easy to understand that when the aging test is performed on the first electric control module M1 and the second electric control module M2 at the same time, if one end of one of the test branches is connected to the positive pole of the DC power supply 10 through the upper bridge arm of the first electric control module M1 connected thereto, the other end of the test branch is connected to the negative pole of the DC power supply 10 through the lower bridge arm of the second electric control module M2 connected thereto, so as to form a complete test circuit; if one end of one of the test branches is connected to the negative pole of the DC power supply 10 through the lower bridge arm of the first electric control module M1 connected thereto, the other end of the test branch is connected to the positive pole of the DC power supply 10 through the upper bridge arm of the second electric control module M2 connected thereto, so as to form a complete test circuit.

[0056] Further, in this embodiment, the first end of each of the test branches is connected to one of the bridge arms of the first electric control module M1 in a one-to-one correspondence, and the second end of each of the test branches is connected to one of the bridge arms of the second electric control module M2 in a one-to-one correspondence;

[0057] Each of the test branches includes: a first resistor R1 and a first inductor L1;

[0058] The first end of the first resistor R1 is connected to one of the bridge arms of the first electric control module M1 , the second end of the first resistor R1 is connected to the first end of the first inductor L1 , and the second end of the first inductor L1 is connected to one of the bridge arms of the second electric control module M2 .

[0059] It is easy to understand that the inductive load 20 is composed of multiple test branches, each of which includes at least a first resistor R1 and a first inductor L1. The first end of each test branch is connected to one of the bridge arms of the first electric control module M1 in a one-to-one correspondence, and the second end of each test branch is connected to one of the bridge arms of the second electric control module M2 in a one-to-one correspondence. In each test branch, the first resistor R1 is also connected to the first inductor L1 in a one-to-one correspondence.

[0060] It is worth noting that since the voltage across the inductor cannot change suddenly, in this connection condition, if the upper bridge arm in the first electric control module M1 connected to one of the test branches and the lower bridge arm in the second electric control module M2 connected to it are turned on at the same time, the current flowing through the test branch will increase; if the lower bridge arm in the first electric control module M1 connected to one of the test branches and the upper bridge arm in the second electric control module M2 connected to it are turned on at the same time, the current flowing through the test branch will decrease.

[0061] Further, in this embodiment, the resistance values ​​of the first resistors R1 are the same, and the inductance values ​​of the first inductors L1 are the same.

[0062] It is easy to understand that in order to keep the fluctuation range of the electrical parameters in the test loop formed by the DC power supply 10, the first electric control module M1, the inductive load 20, and the second electric control module M2 from being too large due to the aging test, which will affect the aging test results. The resistance values ​​of the first resistors R1 in each test branch should be the same, and the corresponding inductance values ​​of the second inductors L1 should also be the same. In this way, when the first electric control module M1 and the second electric control module M2 are both in normal operation, the electrical parameters obtained by the corresponding aging test of each test loop are not much different and all meet the standards of the aging test.

[0063] Further, in this embodiment, the first electric control module M1 includes a first three-phase bridge, the second electric control module M2 includes a second three-phase bridge, and each of the test branches includes a first test branch, a second test branch and a third test branch;

[0064] The A-phase port of the first three-phase bridge is connected to the A'-phase port of the second three-phase bridge through the first test branch, the B-phase port of the first three-phase bridge is connected to the B'-phase port of the second three-phase bridge through the second test branch, the C-phase port of the first three-phase bridge is connected to the C'-phase port of the second three-phase bridge through the third test branch, the bus positive end of the first three-phase bridge is respectively connected to the bus positive end of the second three-phase bridge and the positive electrode of the DC power supply 10, and the bus negative end of the first three-phase bridge is respectively connected to the bus negative end of the second three-phase bridge and the negative electrode of the DC power supply 10.

[0065] It is easy to understand that in this embodiment, the first electric control module M1 and the second electric control module M2 have a first three-phase bridge inside, and the second electric control module M2 has a second three-phase bridge inside, and the inductive load 20 can include a first test branch, a second test branch, and a third test branch. Among them, the first three-phase bridge and the second three-phase bridge each include six switch tubes and a diode reversely connected in parallel with the switch tube, and the connection relationship between each switch tube and the controller 30 is not shown in the figure. The first electric control module M1 should have three bridge arms A, B, and C, and the second electric control module M2 also has three bridge arms A', B', and C', wherein the corresponding connection relationship is that the first test branch is respectively connected to the A bridge arm of the first electric control module M1 and the A' bridge arm of the second electric control module M2, the second test branch is respectively connected to the B bridge arm of the first electric control module M1 and the B' bridge arm of the second electric control module M2, and the third test branch is respectively connected to the C bridge arm of the first electric control module M1 and the C' bridge arm of the second electric control module M2. Among them, the connection interfaces of the A bridge arm, the B bridge arm and the C bridge arm respectively correspond to the A phase port, the B phase port and the C phase port mentioned above, and the connection interfaces of the A' bridge arm, the B' bridge arm and the C' bridge arm respectively correspond to the A' phase port, the B' phase port and the C' phase port mentioned above.

[0066] It should be noted that, from the above connection relationship, it can be seen that in this embodiment, the DC power supply 10, the A bridge arm of the first electric control module M1, the first test branch and the A' bridge arm of the second electric control module M2 can form two test circuits, namely, a test circuit consisting of the positive pole of the DC power supply 10-the A upper bridge arm of the first electric control module M1-the first test branch-the A' lower bridge arm of the second electric control module M2-the negative pole of the DC power supply 10, and a test circuit consisting of the negative pole of the DC power supply 10-the A lower bridge arm of the first electric control module M1-the first test branch-the A' upper bridge arm of the second electric control module M2-the positive pole of the DC power supply 10. Based on the control of the control signal, the two test circuits are switched alternately, so that the first test branch can receive the AC power supply formed by the first electric control module M1 and the second electric control module M2 jointly converting the DC power supply output by the DC power supply 10, even if a certain bridge arm of the first electric control module M1 and the second electric control module M2 is synchronously subjected to aging test. Similar to the above situation, the second test branch and the third test branch can also construct two test loops respectively, so that the other bridge arms of the first electric control module M1 and the second electric control module M2 can be synchronously subjected to aging test.

[0067] It is worth noting that in this embodiment, the aging test can be performed on a certain bridge arm of the first electric control module M1 and the second electric control module M2 separately, or the aging test can be performed on each bridge arm of the first electric control module M1 and the second electric control module M2 simultaneously.

[0068] Based on the first embodiment and / or the second embodiment of the present application, in the third embodiment of the present application, the same or similar contents as those of the above-mentioned first and second embodiments can refer to the above introduction, and will not be repeated later. Figure 3 , the electric control aging test device further includes: a current detection module 40;

[0069] The current detection module 40 is disposed between the DC power supply 10 and the first electric control module M1 , and the current detection module 40 is also connected to the controller 30 ; the controller 30 is also connected to the test host 50 ;

[0070] The current detection module 40 is used to detect the test current in the test loop and transmit the test current to the controller 30;

[0071] The controller 30 is further configured to send a test failure signal to the test host 50 when the test current does not meet a standard current range preset by a user, so that the test host 50 determines that the aging test of the first electric control module M1 and the second electric control module M2 fails.

[0072] It is easy to understand that, for the first electric control module M1 and the second electric control module M2, the indicators used in the aging test to evaluate the service life and reliability of the electric control modules include the test current in the test loop, and there is a corresponding relationship between the test current and the aging test signal sent to the controller 30, so that the test current will theoretically remain within the standard current range expected by the user. In a specific implementation, if during the aging test, the current detection module 40 can collect the test current in the test loop and send the test current to the controller 30, if the collected test current is not within the standard current range expected by the user, the controller 30 sends a test failure signal to the test host 50, and when the test host 50 receives the test failure signal, it can determine that the aging test of the current first electric control module M1 and the second electric control module M2 has failed, and display the test result of "aging test failure" to the user through a display device (not shown) connected thereto.

[0073] It is worth noting that in this embodiment, the aging test signal received by the controller 30 described above can be generated by the user through the test host 50 and sent to the controller 30. In addition, the controller 30 can also send a test current to the test host 50, and the test host 50 can also display the received test current to the user through a display device.

[0074] Furthermore, in this embodiment, the electronically controlled aging test device further includes: a voltage detection module 60;

[0075] The voltage detection module 60 is connected in parallel to the DC power supply 10, and the voltage detection module 60 is also connected to the controller 30; the controller is also connected to the test host 50;

[0076] The voltage detection module 60 is used to detect the test voltage across the DC power supply 10 and transmit the test voltage to the controller 30;

[0077] The controller 30 is further configured to send a test failure signal to the test host 50 when the test voltage does not meet a standard voltage range preset by a user, so that the test host 50 determines that the aging test of the first electric control module M1 and the second electric control module M2 fails.

[0078] For the first electric control module M1 and the second electric control module M2, the indicators used in the aging test to evaluate the service life and reliability of the electric control modules include the test voltage in the test circuit, and there is also a corresponding relationship between the test voltage and the aging test signal sent to the controller 30, so that the test voltage will theoretically remain within the standard voltage range expected by the user. In a specific implementation, if during the aging test, the voltage detection module 60 can collect the test voltage at both ends of the DC power supply 10 and send the test voltage to the controller 30, if the collected test voltage is not within the standard voltage range expected by the user, the controller 30 sends a test failure signal to the test host 50, and when the test host 50 receives the test failure signal, it can determine that the aging test of the current first electric control module M1 and the second electric control module M2 has failed, and display the test result of "aging test failure" to the user through the display device connected thereto.

[0079] It is worth noting that the controller 30 can also send a test voltage to the test host 50 , and the test host 50 can also display the received test voltage to the user through a display device.

[0080] In addition, to achieve the above-mentioned purpose, the embodiment of the present application also proposes an electrically controlled aging test device, which adopts all the embodiments of the electrically controlled aging test device described above. Compared with the prior art, the beneficial effects of the electrically controlled aging test device provided by the embodiment of the present application are the same as the beneficial effects of the electrically controlled aging test device provided by the above-mentioned embodiment, and other technical features of the electrically controlled aging test device are the same as the features disclosed in the above-mentioned embodiment, which will not be repeated here.

[0081] In addition, to achieve the above-mentioned purpose, the embodiment of the present application also proposes an electrically controlled aging test system, which adopts all the embodiments of the electrically controlled aging test equipment described above. Compared with the prior art, the beneficial effects of the electrically controlled aging test system provided by the embodiment of the present application are the same as the beneficial effects of the electrically controlled aging test equipment provided by the above-mentioned embodiment, and will not be described in detail here.

[0082] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent processing scope of the present application.

Claims

1. An electrically controlled aging test device, characterized in that: The electronically controlled aging test device comprises: A DC power supply, connected to a DC terminal of the first electric control module and a DC terminal of the second electric control module, respectively, for providing DC power supply to the first electric control module and the second electric control module; An inductive load, connected to an AC end of the first electric control module and an AC end of the second electric control module respectively; The controller is respectively connected to the control end of the first electric control module and the control end of the second electric control module, and is used to send a control signal to the first electric control module and the second electric control module when receiving an aging test signal, so as to control the first electric control module and the second electric control module to form a test loop through the DC power supply and the inductive load, and synchronously perform an aging test in the test loop.

2. The electronically controlled aging test device according to claim 1, characterized in that: The inductive load includes a plurality of test branches, and the first electric control module and the second electric control module both include a multi-channel bridge; Each of the test branches is respectively connected to the bridge arms corresponding to the first electric control module and the second electric control module; The control signal of the controller is used to control the first electric control module and the second electric control module on both sides of the same test branch to be turned on at the same time.

3. The electronically controlled aging test device according to claim 2, characterized in that: When the upper bridge arm connected to one of the test branches in the first electric control module is turned on, the lower bridge arm connected to the test branch in the second electric control module is turned on; When the lower bridge arm connected to one of the test branches in the first electric control module is turned on, the upper bridge arm connected to the test branch in the second electric control module is turned on.

4. The electrically controlled aging test device according to claim 2, characterized in that: The first end of each of the test branches is connected to one of the bridge arms of the first electric control module in a one-to-one correspondence, and the second end of each of the test branches is connected to one of the bridge arms of the second electric control module in a one-to-one correspondence; Each of the test branches comprises: a first resistor and a first inductor; The first end of the first resistor is connected to one of the bridge arms of the first electric control module, the second end of the first resistor is connected to the first end of the first inductor, and the second end of the first inductor is connected to one of the bridge arms of the second electric control module.

5. The electrically controlled aging test device according to claim 4, characterized in that: The resistance values ​​of the first resistors are the same, and the inductance values ​​of the first inductors are the same.

6. The electrically controlled aging test device according to claim 2, characterized in that: The first electric control module includes a first three-phase bridge, the second electric control module includes a second three-phase bridge, and each of the test branches includes a first test branch, a second test branch and a third test branch; The A-phase port of the first three-phase bridge is connected to the A'-phase port of the second three-phase bridge through the first test branch, the B-phase port of the first three-phase bridge is connected to the B'-phase port of the second three-phase bridge through the second test branch, the C-phase port of the first three-phase bridge is connected to the C'-phase port of the second three-phase bridge through the third test branch, the bus positive end of the first three-phase bridge is respectively connected to the bus positive end of the second three-phase bridge and the positive electrode of the DC power supply, and the bus negative end of the first three-phase bridge is respectively connected to the bus negative end of the second three-phase bridge and the negative electrode of the DC power supply.

7. The electronically controlled aging test device according to any one of claims 1 to 6, characterized in that: The electronically controlled aging test device further comprises: a current detection module; The current detection module is arranged between the DC power supply and the first electric control module, and the current detection module is also connected to the controller; the controller is also connected to the test host; The current detection module is used to detect the test current in the test loop and transmit the test current to the controller; The controller is further configured to send a test failure signal to the test host when the test current does not meet a standard current range preset by a user, so that the test host determines that the aging test of the first electronic control module and the second electronic control module fails.

8. The electronically controlled aging test device according to any one of claims 1 to 6, characterized in that: The electronically controlled aging test device further comprises: a voltage detection module; The voltage detection module is connected in parallel to the DC power supply, and the voltage detection module is also connected to the controller; the controller is also connected to the test host; The voltage detection module is used to detect the test voltage across the DC power supply and transmit the test voltage to the controller; The controller is further configured to send a test failure signal to the test host when the test voltage does not meet a standard voltage range preset by a user, so that the test host determines that the aging test of the first electronic control module and the second electronic control module fails.

9. An electrically controlled aging test device, characterized in that: The aging test equipment adopts the electronically controlled aging test device as described in any one of claims 1-8.

10. An electronically controlled aging test system, characterized in that: The electrically controlled aging test system adopts the electrically controlled aging test equipment as claimed in claim 9.

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