Support plate line testing mechanism

Abstract

The utility model relates to the field of carrier plates, in particular to a carrier plate line testing mechanism which comprises a rack, and display screens are arranged on two sides of the front of the rack. According to the carrier plate line test mechanism, through the arrangement of the single-hole test probe assembly, the supporting plate, the connecting plate, the jacking mechanism, the infrared temperature measurement module, the key test module, the strip-shaped light source, the screen test module and the backflow disc, the carrier plate is placed on the backflow disc, and the backflow disc containing a tested product passes through the front station feeding code scanning equipment; a strip-shaped light source below a supporting plate is used for lighting a CCD test product LCD, screen detection is carried out on the lower portion of a carrier plate in a screen test, when the LCD screen test is completed by the CCD, a test position press-fit probe assembly is connected with a product test point, function test is carried out on the carrier plate, and in the test process, through the arrangement of an infrared temperature measurement and key test module, the test position press-fit probe assembly is connected with the product test point, and the test position press-fit probe assembly is connected with the product test point to carry out function test on the carrier plate. The key test is carried out on the carrier plate, so that a series of tests are integrated together, and the cost is reduced.

Description

Technical Field

[0001] The utility model relates to the field of carrier boards, in particular to a carrier board line testing mechanism. Background Art

[0002] The substrate is mainly used to carry ICs, and has internal circuits to conduct signals between the chip and the circuit board. In addition to the carrying function, the IC substrate also has additional functions such as protection circuits, dedicated lines, design of heat dissipation paths, and establishment of component modularization standards. The substrate functions need to be tested during the production process to ensure the quality of the substrate.

[0003] The existing carrier line test device tests various functions of the carrier board separately one by one. If the test is done separately, the process is long and slow, which not only delays the efficiency of the entire production inspection, but also indirectly increases the cost of manufacturing machinery, thereby reducing the practicality of the entire test device.

[0004] Therefore, it is necessary to invent a board line testing mechanism to solve the above problems. Utility Model Content

[0005] The purpose of the utility model is to provide a board line testing mechanism to solve the problems raised in the above background technology.

[0006] In order to achieve the above-mentioned purpose, the utility model provides the following technical solutions: a board line testing mechanism, comprising a rack, characterized in that: display screens are arranged on both sides of the front of the rack, tester components are arranged inside the rack, a burner component is fixedly arranged below the tester component, a mounting plate is fixedly installed below the burner component, test adapter slots are fixedly installed on both sides above the mounting plate, a functional test module is fixedly arranged above the mounting plate, a single-hole probe assembly is fixedly arranged below the functional test module, a support plate is fixedly installed inside the rack, a conveyor line is arranged inside the support plate, a connecting plate is arranged inside the support plate, a lifting mechanism is fixedly arranged below the connecting plate, an infrared temperature measurement is arranged inside the connecting plate, a button test module is arranged on one side of the infrared temperature measurement, a strip light source is movably arranged below the support plate, a screen test is fixedly arranged below the support plate, and a reflow tray is movably arranged above the conveyor line.

[0007] Preferably, the functional test module is integrated with the single-hole test probe assembly, and the functional test modules are distributed at equal intervals on the mounting plate.

[0008] Preferably, the infrared temperature measurement and button test modules are fixedly connected, and the infrared temperature measurement and button test modules are distributed at equal intervals on the connecting plate.

[0009] Preferably, the connecting plate is arranged inside the supporting plate, the lifting mechanism is arranged below the connecting plate, and the connecting plate is slidably connected to the supporting plate.

[0010] Preferably, blockers are fixedly provided above the support plates, and the number of the blockers is set to two groups.

[0011] Preferably, the strip light source is arranged below the support plate, the strip light source is a rectangular structure, and the strip light source is movably connected to the support plate.

[0012] In the above technical solution, the technical effects and advantages provided by the utility model are:

[0013] 1. Through the setting of single-hole probe assembly, support plate, connecting plate, lifting mechanism, infrared temperature measurement, button test module, strip light source, screen test and reflow tray, the carrier board is placed on the reflow tray, and the reflow tray containing the product to be tested is passed through the front station loading and scanning equipment. The strip light source function under the support plate is used to illuminate the LCD of the CCD test product, so that the screen test performs screen detection on the bottom of the carrier board. When the CCD completes the LCD screen test, the test position pressing probe assembly is connected to the product test point to perform a functional test on the carrier board. During the test, the carrier board is tested for buttons through the setting of infrared temperature measurement and button test modules. Such a setting brings a series of tests together, which not only improves the test efficiency of the overall test, but also reduces the cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0015] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0016] Figure 2 This is a schematic diagram of the internal structure of the frame of the utility model;

[0017] Figure 3 It is a schematic diagram of the overall test assembly structure of the utility model;

[0018] Figure 4 This is a schematic diagram of the mounting plate structure of the utility model;

[0019] Figure 5 This is a schematic diagram of the structure of the jacking mechanism of the utility model;

[0020] Figure 6This is a schematic diagram of the key test module structure of the utility model;

[0021] Figure 7 It is a schematic diagram of the screen test structure of the utility model.

[0022] Description of reference numerals:

[0023] 1. Rack; 2. Display screen; 3. Tester assembly; 4. Burner assembly; 5. Mounting plate; 6. Test adapter slot; 7. Functional test module; 8. Single-hole probe assembly; 9. Support plate; 10. Conveyor line; 11. Connecting plate; 12. Lifting mechanism; 13. Infrared temperature measurement; 14. Key test module; 15. Blocker; 16. Strip light source; 17. Screen test; 18. Reflow tray. DETAILED DESCRIPTION

[0024] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0025] The utility model provides Figure 1-7 A board line test mechanism shown in the figure comprises a frame 1, display screens 2 are arranged on both sides of the front of the frame 1, tester components 3 are arranged inside the frame 1, a burner component 4 is fixedly arranged below the tester component 3, a mounting plate 5 is fixedly installed below the burner component 4, test adapter slots 6 are fixedly installed on both sides above the mounting plate 5, function test modules 7 are fixedly arranged above the mounting plate 5, a single-hole test probe component 8 is fixedly arranged below the function test module 7, support plates 9 are fixedly installed inside the frame 1, a conveying line 10 is arranged inside the support plate 9, a connecting plate 11 is arranged inside the support plate 9, a lifting mechanism 12 is fixedly arranged below the connecting plate 11, an infrared temperature measuring device 13 is arranged inside the connecting plate 11, and an infrared temperature measuring device 14 is fixedly installed inside the connecting plate 11. A button test module 14 is provided on one side of 3, a strip light source 16 is movably provided under the support plate 9, a screen test 17 is fixedly provided under the support plate 9, and a reflow tray 18 is movably provided above the conveyor line 10. By placing the carrier on the reflow tray 18, the reflow tray 18 containing the product to be tested is passed through the front station loading and scanning equipment, and the strip light source 16 under the support plate 9 is used to illuminate the LCD of the CCD test product, so that the screen test 17 performs screen detection on the bottom of the carrier. When the CCD completes the LCD screen test 17, the test position pressing single-hole test probe assembly 8 is connected to the product test point to perform a functional test on the carrier. During the test, the carrier is subjected to a button test through the setting of the infrared temperature measurement 13 and the button test module 14.

[0026] like Figure 3 and Figure 4As shown, the functional test module 7 and the single-hole test probe assembly 8 are integrated, and the functional test modules 7 are evenly spaced on the mounting plate 5. Through multiple groups of functional test modules 7 and single-hole test probe assemblies 8, functional tests can be performed on multiple carriers at one time, thereby improving the overall test work efficiency.

[0027] like Figure 3 and Figure 6 As shown, the infrared temperature measurement 13 is fixedly connected to the button test module 14, and the infrared temperature measurement 13 and the button test module 14 are evenly spaced on the connecting plate 11. Through the cooperation of the infrared temperature measurement 13 and the button test module 14, the temperature of the carrier board is detected during the button test, and multiple groups of infrared temperature measurement 13 and button test modules 14 improve the overall test efficiency.

[0028] like Figure 3 and Figure 5 As shown, the connecting plate 11 is arranged inside the supporting plate 9, and the lifting mechanism 12 is arranged below the connecting plate 11. The connecting plate 11 is slidably connected to the supporting plate 9. Through the setting of the lifting mechanism 12, the connecting plate 11 and the reflux plate 18 are pushed up and down to facilitate the single-hole measuring probe assembly 8 to contact the carrier plate for testing.

[0029] like Figure 3 As shown, blockers 15 are fixedly arranged above the support plate 9, and the number of blockers 15 is set to two groups. Through the setting of the blockers 15, the reflux tray 18 and the carrier are transported to the test area for blocking and limiting, which is convenient for subsequent testing of the carrier.

[0030] like Figure 2 , Figure 3 and Figure 7 As shown, the strip light source 16 is arranged below the support plate 9. The strip light source 16 is a rectangular structure. The strip light source 16 is movably connected to the support plate 9. Through the setting of the strip light source 16, the support plate 9 can be slid and adjusted, so as to cooperate with the screen test 17 to perform screen detection on the bottom of the carrier plate.

[0031] The practical working principle of the present invention is as follows: firstly, the external power supply is connected, and then the switch of the conveyor line 10 is turned on to convey the reflow tray 18 of the previous process and the placed carrier board. After conveying to the test area, the switch of the blocker 15 is turned on to block and limit the reflow tray 18 and the carrier board, and the reflow tray 18 containing the tested product is passed through the front station loading and scanning equipment, and the function of the strip light source 16 under the support plate 9 is to illuminate the LCD of the CCD test product, so that the screen test 17 performs screen detection on the bottom of the carrier board. When the CCD completes the LCD screen test 17, the switch of the lifting mechanism 12 is turned on again to lift the reflow tray 18 and the carrier board, and the single-hole test probe assembly 8 is connected to the product test point to perform a functional test on the carrier board. During the test, the infrared temperature measurement 13 and the key test module 14 are set to perform a key test on the carrier board, and during the key test, the infrared temperature measurement 1 is used to measure the temperature of the carrier board. 3. Carry out temperature test on the carrier board, and all test items are completed after the test position pressing probe is connected with the product; the test machine is divided into 4 test positions to independently complete the test items of the tested product; each of the 4 independent test positions respectively and simultaneously completes the requirements of each test item for the 8 products on the reflow tray 18 in sequence, and finally, when the test is completed, turn off the switch of the key test module 14, and transmit all the test data results to the display screen 2 in front of the rack 1 for the convenience of the staff to watch. When the carrier board test is completed, turn off the switch of the lifting mechanism 12, lower the reflow tray 18 and the carrier board back to the conveyor line 10, and then turn off the switch of the blocker 15, and let the tested carrier board flow into the next process. Finally, when the device is not used, turn off the switch of the conveyor line 10, cut off the external power supply, and the use process of the carrier board line testing mechanism is completed.

[0032] The above only describes some exemplary embodiments of the present invention by way of illustration. It is undoubted that those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A board line testing mechanism, comprising a frame (1), characterized in that: Display screens (2) are arranged on both sides of the front of the frame (1); a tester assembly (3) is arranged inside the frame (1); a burner assembly (4) is fixedly arranged below the tester assembly (3); a mounting plate (5) is fixedly installed below the burner assembly (4); test adapter slots (6) are fixedly installed on both sides above the mounting plate (5); a function test module (7) is fixedly arranged above the mounting plate (5); a single-hole test probe assembly (8) is fixedly arranged below the function test module (7); and a support plate is fixedly installed inside the frame (1). (9), a conveyor line (10) is arranged inside the support plate (9), a connecting plate (11) is arranged inside the support plate (9), a lifting mechanism (12) is fixedly arranged below the connecting plate (11), an infrared temperature measurement (13) is arranged inside the connecting plate (11), a key test module (14) is arranged on one side of the infrared temperature measurement (13), a strip light source (16) is movably arranged below the support plate (9), a screen test (17) is fixedly arranged below the support plate (9), and a reflow tray (18) is movably arranged above the conveyor line (10).

2. A board line testing mechanism according to claim 1, characterized in that: The functional test module (7) and the single-hole test probe assembly (8) are integrated, and the functional test modules (7) are distributed at equal intervals on the mounting plate (5).

3. A board line testing mechanism according to claim 1, characterized in that: The infrared temperature measurement (13) is fixedly connected to the key test module (14), and the infrared temperature measurement (13) and the key test module (14) are distributed at equal intervals on the connection plate (11).

4. A board line testing mechanism according to claim 1, characterized in that: The connecting plate (11) is arranged inside the supporting plate (9), the lifting mechanism (12) is arranged below the connecting plate (11), and the connecting plate (11) is slidably connected to the supporting plate (9).

5. The board line testing mechanism according to claim 1, characterized in that: Blockers (15) are fixedly arranged above the support plates (9), and the blockers (15) are provided in two groups.

6. A board line testing mechanism according to claim 1, characterized in that: The strip-shaped light source (16) is arranged below the support plate (9); the strip-shaped light source (16) is a rectangular structure; the strip-shaped light source (16) is movably connected to the support plate (9).

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