Intensive mass spectrometer vacuum test system
By designing an intensive mass spectrometer vacuum test system, using components such as control chips and serial port screens, intensive control and data acquisition of multiple mass spectrometers is solved, and the problem of vacuum testing occupying the site and data cannot be stored in the existing technology. Improves testing efficiency and data management convenience.
Patent Information
- Application Number
- CN202420859140.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-24
- Publication Date
- 2025-01-10
- Estimated Expiration
- 2034-04-24
AI Technical Summary
When existing vacuum testing schemes require multiple mass spectrometers for testing, they occupy a large site area, testers need to operate separately, which takes a long time and the test data can only be viewed but cannot be stored locally.
An intensive mass spectrometer vacuum test system was designed, and multiple mass spectrometer vacuum test devices were connected through the upper computer. Each mass spectrometer vacuum test device was connected to multiple mass spectrometers, and multiple mass spectrometers were realized using control chips, digital switches and serial port screens. The intensive control and data acquisition of the mass spectrometer supports RS232 and RS485 communication, is equipped with LED status indicators and buzzers, and uses GD32 or STM32 chips as the main control chip to realize data upload and local storage.
Intensive control of multiple mass spectrometers is achieved, which reduces site requirements, simplifies operational processes, reduces test time, and supports local storage of data for easy later backtracking.
Smart Images
Figure CN222337108U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of vacuum testing technology, and in particular to an intensive mass spectrometer vacuum testing system. Background Art
[0002] The existing vacuum testing solution requires the use of the desktop computer and monitor that comes with the mass spectrometer. When multiple mass spectrometers are used for testing, a large area is occupied. Testers need to operate a single mass spectrometer, which is time-consuming and the test data can only be viewed but not stored locally. Summary of the invention
[0003] The present application provides an intensive mass spectrometer vacuum testing system, which includes: a host computer, a mass spectrometer vacuum testing device and a mass spectrometer, the host computer is connected to multiple mass spectrometer vacuum testing devices, each mass spectrometer vacuum testing device is connected to multiple mass spectrometers, so that the mass spectrometers can be vacuum tested through the multiple mass spectrometer vacuum testing devices, the mass spectrometer vacuum testing device includes a control chip, a digital switch and a serial port screen, the mass spectrometer vacuum testing device is connected to the host computer through the control chip, the digital switch is respectively connected to the control chip and the multiple mass spectrometers, so that the control chip can selectively control the multiple mass spectrometers through the digital switch, and the serial port screen is connected to the control chip.
[0004] In some embodiments, the digital switch connects the plurality of mass spectrometers via an RS232 communication channel.
[0005] In some embodiments, the host computer is connected to the multiple mass spectrometer vacuum testing devices via an RS485 communication channel.
[0006] In some embodiments, the mass spectrometer vacuum testing device further includes an LED status indicator, which is connected to the control chip and is used to display the operating status of the mass spectrometer.
[0007] In some embodiments, the serial port screen is connected to the TTL serial port of the control chip for communication.
[0008] In some embodiments, the mass spectrometer vacuum testing device further includes a buzzer, and the buzzer is connected to the control chip.
[0009] In some embodiments, the control chip is a GD32 chip or an STM32 chip.
[0010] In some embodiments, the mass spectrometer vacuum testing device further includes a power supply and a low voltage dropout regulator, and the power supply supplies power to the mass spectrometer vacuum testing device through the low voltage dropout regulator.
[0011] In some embodiments, each of the mass spectrometer vacuum testing devices is connected to four mass spectrometers, and each of the mass spectrometers corresponds to an LED light on the LED status indicator to display its operating status.
[0012] In some embodiments, control buttons are also provided on the control chip.
[0013] In order to make the features and advantages of the present application more obvious and understandable, some embodiments are given below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. The drawings herein are incorporated into the specification and constitute a part of the specification. These drawings illustrate embodiments consistent with the present application and are used together with the specification to illustrate the technical solutions of the present application. It should be understood that the following drawings only illustrate certain embodiments of the present application and should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can also be obtained based on these drawings without creative work.
[0015] Figure 1 A schematic diagram of the structure of an intensive mass spectrometer vacuum testing system provided in an embodiment of the present application;
[0016] Figure 2 A schematic diagram of the partial structure of an intensive mass spectrometer vacuum testing system provided in an embodiment of the present application.
[0017] Explanation of the accompanying drawings: 1. Host computer; 2. Mass spectrometer vacuum testing device; 3. Mass spectrometer; 4. Control chip; 5. RS485 communication channel; 6. RS232 communication channel; 7. Digital switch; 8. Serial port screen; 9. LED status indicator; 10. Buzzer; 11. Power supply terminal; 12. Control button. DETAILED DESCRIPTION
[0018] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application generally described and shown here can be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.
[0019] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.
[0020] The term "and / or" herein only describes an association relationship, indicating that three relationships may exist. For example, A and / or B may represent the following three situations: A exists alone, A and B exist at the same time, and B exists alone. In addition, the term "at least one" herein represents any combination of at least two of any one or more of a plurality of. For example, including at least one of A, B, and C may represent including any one or more elements selected from the set consisting of A, B, and C.
[0021] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.
[0022] The present application proposes an intensive mass spectrometer vacuum testing system to achieve intensive control of mass spectrometer vacuum testing and reduce site requirements.
[0023] like Figure 1 , Figure 2 As shown, the present application provides an intensive mass spectrometer vacuum testing system, including: a host computer 1, a mass spectrometer vacuum testing device 2 and a mass spectrometer 3, the host computer 1 is connected to multiple mass spectrometer vacuum testing devices 2, each mass spectrometer vacuum testing device 2 is connected to multiple mass spectrometers 3, so that the mass spectrometers 3 are vacuum tested through the multiple mass spectrometer vacuum testing devices 2, the mass spectrometer vacuum testing device 2 includes a control chip 4, a digital switch 7 and a serial port screen 8, the mass spectrometer vacuum testing device 2 is connected to the host computer 1 through the control chip 4, the digital switch 7 is respectively connected to the control chip 4 and the multiple mass spectrometers 3, so that the control chip 4 selectively controls the multiple mass spectrometers 3 through the digital switch 7, and the serial port screen 8 is connected to the control chip 4.
[0024] Specifically, the mass spectrometer vacuum testing device 2 of the intensive mass spectrometer vacuum testing system adopts a single-chip microcomputer as the control chip 4, and the digital switch chip is used as a digital switch 7 for switching to selectively control the communication of multiple mass spectrometers 3, that is, the communication between the control chip 4 and the multiple mass spectrometers 3 is controlled by the digital switch 7. The mass spectrometer vacuum testing device 2 collects the vacuum data of the mass spectrometer 3 through the control chip 4 and transmits instructions. The host computer 1 is connected to the control chip 4 to realize data uploading, transmission of execution instructions and uploading error information, etc., and the host computer 1 can also perform protocol analysis, data summary display and data storage through software.
[0025] In some embodiments, the digital switch 7 is connected to the plurality of mass spectrometers 3 via the RS232 communication channel 6. The RS232 communication channel 6 is used to realize the communication between the control chip 4 and the mass spectrometer 3, collect the vacuum test data of the mass spectrometer, and control the operation of the mass spectrometer device.
[0026] In some embodiments, the host computer is connected to the multiple mass spectrometer vacuum testing devices 2 via an RS485 communication channel 5 .
[0027] Specifically, the host computer 1 is connected to multiple mass spectrometer vacuum testing devices 2 through the RS485 communication channel 5, and each mass spectrometer vacuum testing device 2 can be connected to multiple mass spectrometers 3 through the RS232 communication channel 6 to collect vacuum data from multiple mass spectrometers 3, that is, intensive management of vacuum data collection of multiple mass spectrometers 3 is achieved through one host computer.
[0028] In some embodiments, the mass spectrometer vacuum testing device 2 further includes an LED status indicator 9 , which is connected to the control chip 4 and is used to display the operating status of the mass spectrometer 3 .
[0029] Specifically, the operation status of the mass spectrometer 3 is displayed by the LED status indicator 9, which facilitates the monitoring and operation management of multiple mass spectrometers 3.
[0030] In some embodiments, the serial port screen 8 is connected to the TTL serial port of the control chip 4 for communication.
[0031] Specifically, the TTL of the control chip 4 communicates with the serial port screen 8 , and the serial port screen 8 displays the vacuum test data collected from the mass spectrometer 3 and the parameter configuration for the mass spectrometer 3 .
[0032] In some embodiments, the mass spectrometer vacuum testing device further includes a buzzer 10 , and the buzzer 10 is connected to the control chip 4 .
[0033] Specifically, the buzzer 10 is connected to the control chip 4 , and when an error occurs during the operation of the mass spectrometer 3 , the buzzer 10 will emit an alarm sound.
[0034] In some embodiments, the control chip 4 is a GD32 chip or an STM32 chip.
[0035] Specifically, a GD32 chip or an STM32 chip is used as the main control chip to process communications and control the operation of the system.
[0036] In some embodiments, the mass spectrometer vacuum testing device 2 further includes a power supply 11 and a low voltage dropout regulator, and the power supply 11 supplies power to the system through the low voltage dropout regulator.
[0037] Specifically, the power supply 11 is a 5V power input, which is converted into 3.3V through a low-dropout regulator LDO chip to power the system.
[0038] In some embodiments, each of the mass spectrometer vacuum testing devices 2 is connected to four mass spectrometers 3 , and each of the mass spectrometers 3 corresponds to an LED light on the LED status indicator 9 to display its operating status.
[0039] Specifically, this system realizes collecting vacuum test data of four mass spectrometers 3 through one mass spectrometer vacuum test device 2 and uploading the data to the host computer 2.
[0040] In some embodiments, a control button 12 is also provided on the control chip 4 .
[0041] Specifically, when an error occurs in the operation of the mass spectrometer 3 , the error state can be eliminated by controlling the button 12 .
[0042] According to the above description, the intensive mass spectrometer vacuum test system of this application has a simple structure, low cost, wide application range, and the control logic can be applied to microprocessors of different architectures. This solution realizes intensive control of vacuum test data acquisition, reducing site requirements; one-key operation can be performed through the host computer to reduce test time; data is stored locally, which is convenient for later data tracing.
[0043] The embodiments described above are part of the embodiments of the present application, but not all of them. Based on the embodiments in the embodiments of the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the embodiments of the present application.
[0044] In the description of the embodiments of the present application, it should be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside", etc. indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, or are the positions or positional relationships in which the product of the application is usually placed when in use. They are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the electric vehicle or component referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.
[0045] In the description of the embodiments of the present application, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0046] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-described embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-described embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims
1. An intensive mass spectrometer vacuum test system, characterized in that: include: A host computer, a mass spectrometer vacuum testing device and a mass spectrometer, the host computer is connected to multiple mass spectrometer vacuum testing devices, each mass spectrometer vacuum testing device is connected to multiple mass spectrometers, so that the mass spectrometers can be vacuum tested through the multiple mass spectrometer vacuum testing devices, the mass spectrometer vacuum testing device includes a control chip, a digital switch and a serial port screen, the mass spectrometer vacuum testing device is connected to the host computer through the control chip, the digital switch is respectively connected to the control chip and the multiple mass spectrometers, so that the control chip can selectively control the multiple mass spectrometers through the digital switch, and the serial port screen is connected to the control chip.
2. The intensive mass spectrometer vacuum testing system according to claim 1, characterized in that: The digital switch is connected to the multiple mass spectrometers via an RS232 communication channel.
3. The intensive mass spectrometer vacuum testing system according to claim 2, characterized in that: The host computer is connected to the multiple mass spectrometer vacuum testing devices via an RS485 communication channel.
4. The intensive mass spectrometer vacuum testing system according to claim 3, characterized in that: The mass spectrometer vacuum testing device also includes an LED status indicator, which is connected to the control chip and is used to display the operating status of the mass spectrometer.
5. The intensive mass spectrometer vacuum testing system according to claim 4, characterized in that: The serial port screen is connected to the TTL serial port of the control chip for communication.
6. The intensive mass spectrometer vacuum testing system according to claim 5, characterized in that: The mass spectrometer vacuum testing device also includes a buzzer, which is connected to the control chip.
7. The intensive mass spectrometer vacuum testing system according to claim 6, characterized in that: The control chip is a GD32 chip or an STM32 chip.
8. The intensive mass spectrometer vacuum testing system according to claim 7, characterized in that: The mass spectrometer vacuum testing device further comprises a power supply and a low voltage difference regulator, and the power supply supplies power to the mass spectrometer vacuum testing device through the low voltage difference regulator.
9. The intensive mass spectrometer vacuum testing system according to claim 8, characterized in that: Each of the mass spectrometer vacuum testing devices is connected to four mass spectrometers, and each of the mass spectrometers corresponds to an LED light on the LED status indicator to display its operating status.
10. The intensive mass spectrometer vacuum testing system according to any one of claims 1 to 9, characterized in that: The control chip is also provided with control buttons.