High-conductivity test probe

Abstract

The utility model discloses a high-conduction-capacity test probe, which comprises a support carrier, a probe body, a probe body, a probe body, a probe body, a probe body, a probe body and a probe body, the support carrier is internally provided with a loading cavity, and ports at two ends of the loading cavity are communicated with the outside; the elastic conductive part comprises an elastic plastic body and metal conductive particles distributed in the elastic plastic body; the needle heads are arranged at the two ends of the elastic conductive part, and the needle heads at the two ends are electrically connected through the metal conductive particles; the needle heads and the elastic conductive part are arranged in the loading cavity, and the two needle heads elastically abut against each other through the elastic conductive part and are kept to extend out of ports in the two ends of the loading cavity respectively; the needle head is provided with a stopping part, end openings of the two ends of the loading cavity are each provided with a limiting part matched with the stopping part, and the limiting parts are matched with the stopping parts and used for limiting the needle head to be separated from the supporting carrier. The surfaces of the metal conductive particles are provided with plating layers made of single materials such as gold, silver, cobalt, rhodium, tungsten and the like or alloy materials of the gold, the silver, the cobalt, the rhodium, the tungsten and the like.

Description

Technical Field

[0001] The present application relates to the technical field of semiconductor component devices, and in particular to a high-throughput test probe. Background Art

[0002] When performing packaging tests on integrated circuit (IC) components, the current test probe has a spring inside that supports and compresses the probe head. When testing integrated circuit components, the probe heads at both ends are electrically connected through the spring. However, due to the small diameter of the spring wire, the overload current capacity is weak, and the spring is an unstable elastic device. After the spring is compressed, the spring will shrink as the environment vibrates, causing unstable shaking, resulting in poor contact between the electrical contacts of the probe head and the product under test, causing signal transmission oscillation, self-excitation, and other reasons that lead to signal test failure, affecting the connection effectiveness and stability. Utility Model Content

[0003] The utility model mainly aims at the above problems and proposes a high-conductivity test probe, aiming to solve the technical problems in the background technology.

[0004] To achieve the above object, the utility model provides a high-conductivity test probe, comprising:

[0005] A support carrier, wherein a loading cavity is provided in the support carrier, and ports at both ends of the loading cavity are connected to the outside;

[0006] An elastic conductive member, the elastic conductive member comprising an elastic plastic body and metal conductive particles distributed in the elastic plastic body;

[0007] The needle is arranged at both ends of the elastic conductive member, and the needles at both ends are electrically connected through the metal conductive particles; the needle and the elastic conductive member are both arranged in the loading cavity, and the two needles are elastically supported by the elastic conductive member to keep extending out of the two end ports of the loading cavity respectively; the needle is provided with a stopper, and the two end ports of the loading cavity are both provided with a limiting portion matching the stopper, and the limiting portion cooperates with the stopper to limit the needle from detaching from the supporting carrier.

[0008] Furthermore, the elastic plastic material is silicone rubber.

[0009] Furthermore, the surface of the metal conductive particles is provided with a coating of a single material such as gold, silver, cobalt, rhodium, tungsten, or an alloy of these elements.

[0010] Furthermore, the metal conductive particles are in a star-shaped or horseshoe-shaped shape.

[0011] Furthermore, the supporting carrier is a syringe.

[0012] Furthermore, the limiting portion is a constricted structure provided at the loading chamber port with a diameter smaller than the loading chamber inner diameter; the stopping portion is an annular convex structure provided at the needle head with an outer diameter larger than the loading chamber port diameter.

[0013] Furthermore, it includes an insulating connector; both ends of the support carrier are connected to the insulating connector.

[0014] Furthermore, the insulating connector is an annular body, and the inner hole of the annular body is sleeved on the outer wall of the supporting carrier.

[0015] Furthermore, the end of the needle away from the elastic conductive member is any one of a flat head, a cone, a flat head spiral protrusion, a bevel blade, and a crown shape.

[0016] Compared with the prior art, the high-conductivity test probe provided by the utility model can use the metal conductive particles distributed in the elastic plastic body to act as a conductor, and the gaps between the metal conductive particles can also play an elastic compression avoidance role for the elastic plastic body. Compared with the traditional spring, the elastic conductive part of this structure not only meets the function of needle retraction but also solves the problem of unstable test probe caused by environmental vibration. The metal conductive particles not only meet the overcurrent capacity but also solve the problem of stable signal transmission and signal integrity, which greatly improves the effectiveness and stability of the electrical contact connection between the needle and the product under test. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic diagram of the three-dimensional structure decomposition of the high-throughput test probe of this application.

[0018] Figure 2 This is a cross-sectional view of the metal conductive particles of the high-throughput test probe of the present application when they are in a horseshoe shape.

[0019] Figure 3 This is a cross-sectional view of the high-throughput test probe of the present application when the metal conductive particles are in a star shape.

[0020] Figure 4 This is a schematic diagram of the needle structure of the high-throughput test probe of this application.

[0021] Figure 5 This is a schematic diagram of the support carrier structure of the high-throughput test probe of this application.

[0022] Figure 6 This is a cross-sectional view of the high-throughput test probe of the present application when installed in a test socket.

[0023] Figure 7 This is a cross-sectional view of another structural embodiment of the insulating connector when the high-throughput test probe of the present application is installed in a test socket.

[0024] Figure 8This is a schematic structural diagram of Embodiment 1 of the structure of one end of the needle of the high-conductivity test probe of the present application that is away from the elastic conductive member.

[0025] Fig. 9 This is a schematic structural diagram of Embodiment 2 of the structure of one end of the needle of the high-conductivity test probe of the present application that is away from the elastic conductive member.

[0026] Fig.10 This is a schematic structural diagram of Embodiment 3 of the structure of one end of the needle of the high-conductivity test probe of the present application away from the elastic conductive member.

[0027] Fig.11 This is a schematic structural diagram of Embodiment 4 of the structure of one end of the needle of the high-conductivity test probe of the present application that is away from the elastic conductive member.

[0028] Fig.12 This is a structural schematic diagram of Embodiment 5 of the structure of one end of the needle of the high-conductivity test probe of the present application away from the elastic conductive member.

[0029] Fig.13 This is a structural schematic diagram of Embodiment 6 of the structure of one end of the needle of the high-conductivity test probe of the present application away from the elastic conductive member.

[0030] Fig.14 This is a structural schematic diagram of Embodiment 7 of the structure of one end of the needle of the high-conductivity test probe of the present application away from the elastic conductive member.

[0031] The reference numerals shown in the figure are: 1. support carrier; 110. loading cavity; 111. limiting part; 2. elastic conductive part; 210. elastic plastic body; 220. metal conductive particles; 3. needle head; 301. flat head; 302. flat head spiral protrusion; 303. oblique blade body; 304. short high line cone; 305. long high line cone; 306. flat head reduced material to form a crown-shaped end; 307. ball head reduced material to form a crown-shaped end; 310. stopper; 5. insulating connector. DETAILED DESCRIPTION

[0032] Please refer to Figure 1 - Fig.14 , this embodiment provides a high-throughput test probe, including:

[0033] A support carrier 1, wherein a loading chamber 110 is provided in the support carrier 1, and ports at both ends of the loading chamber 110 are connected to the outside;

[0034] An elastic conductive member 2, the elastic conductive member 2 comprising an elastic plastic body 210 and metal conductive particles 220 distributed in the elastic plastic body 210;

[0035] The needle 3 is provided at both ends of the elastic conductive member 2, and the needles 3 at both ends are electrically connected through the metal conductive particles 220; the needle 3 and the elastic conductive member 2 are both provided in the loading chamber 110, and the two needles 3 are elastically supported by the elastic conductive member 2 to keep extending out of the two end ports of the loading chamber 110 respectively; the needle 3 is provided with a stopper 310, and the two end ports of the loading chamber 110 are both provided with a limiting portion 111 matching the stopper 310, and the limiting portion 111 cooperates with the stopper 310 to limit the needle 3 from detaching from the supporting carrier 1.

[0036] The metal conductive particles 220 distributed in the elastic plastic body 210 act as conductors, and the gaps between the metal conductive particles 220 also allow the elastic plastic body 210 to play an elastic compression avoidance role. Compared with the traditional spring, the elastic conductive member 2 of this structure not only satisfies the function of needle 3 contraction but also solves the problem of unstable test probe caused by environmental vibration. The metal conductive particles 220 not only meet the overcurrent capacity, but also solve the problems of large signal transmission loss and test signal distortion of current products, greatly improving the effectiveness and stability of the electrical contact connection between the needle 3 and the product under test, so that the integrated circuit test application can detect the DUT line connection and has the LOOP sustainable operation characteristic.

[0037] Preferably, the elastic plastic body 210 is made of silicone rubber.

[0038] By properly adjusting the parameters, the silicone rubber can also have the same elastic coefficient as the traditional metal spring parameters, and its own elastic compression and elastic support for the needle 3 can meet the performance requirements. In addition, compared with metal springs, which will produce metal fatigue and cause failure, the elastic plastic body 210 is made of silicone rubber and has a longer service life.

[0039] The elastic plastic body 210 may also be made of other materials having the same performance as silicone rubber.

[0040] Preferably, the surface of the metal conductive particles 220 is provided with a gold or silver coating.

[0041] By coating the metal conductive particles 220 with a single material such as gold, silver, cobalt, rhodium, tungsten, or an alloy of these elements, the overall conductivity of the elastic conductive part 2 is improved. The metal conductive particles 220 do not have to be made of gold or silver particles as a whole, and copper particles can be used as the inner core, which saves costs and ensures conductivity.

[0042] Please refer to Figure 2 and Figure 3 The metal conductive particles 220 may be in a star shape or a horseshoe shape.

[0043] By designing the metal conductive particles 220 to be in such a special-shaped particle shape, the contact degree between the metal conductive particles 220 distributed in the elastic plastic body 210 can be improved, thereby improving the electrical connectivity.

[0044] Preferably, the supporting carrier 1 is a syringe.

[0045] The support carrier 1 is selected as a syringe to form a kit, which can be set in a test seat. When a test probe in the test seat is damaged, the probe can be directly replaced, making the test more efficient and convenient.

[0046] Please refer to Figure 4 and Figure 5 The limiting portion 111 is a shrinking structure provided at the port diameter of the loading chamber 110 and is smaller than the inner diameter of the loading chamber 110 ; the stopping portion 310 is an annular convex structure provided at the needle head 3 and is larger than the port diameter of the loading chamber 110 .

[0047] This structure can effectively prevent the needle 3 from being separated from the support carrier 1, and can also prevent the needle 3 from tilting and shaking, and keep it moving only in a linear lifting and telescopic range, thereby solving the risk of the needle 3 getting stuck and falling out of the loading chamber 110 due to temperature environment and test loop compression.

[0048] Please refer to Figure 6 and Figure 7 , including an insulating connector 5; both ends of the support carrier 1 are connected to the insulating connector 5.

[0049] When the aforementioned test probe is applied to the test socket, both ends of the support carrier 1 are connected to the test socket through the insulating connector 5 .

[0050] Please refer to Figure 6 and Figure 7 The insulating connector 5 is an annular body, and the inner hole of the annular body is sleeved on the outer wall of the supporting carrier 1.

[0051] The test socket is generally made of metal or engineering plastic with high structural strength. In order to avoid electrical connection between the test probe and the test socket and cause interference, the test socket is separated from the test probe by an insulating connector 5, which also serves as a connection and installation function.

[0052] Please refer to Figure 8 - Fig.14 The end of the needle 3 away from the elastic conductive member 2 is any structure of a flat head 301, a cone, a flat head spiral protrusion 302, a bevel blade body 303, or a crown shape.

[0053] Please refer to Figure 8 , the end of the needle 3 away from the elastic conductive member 2 is structured as a short high-wire cone 304;

[0054] Please refer to Fig. 9 , the end of the needle 3 away from the elastic conductive member 2 is structured as a long high-wire cone 305;

[0055] Please refer to Fig.10 , the end of the needle 3 away from the elastic conductive member 2 is structured as an oblique blade 303;

[0056] Please refer to Fig.11 The end of the needle 3 away from the elastic conductive member 2 is flat and reduced to form a crown-shaped end 306;

[0057] Please refer to Fig.12 The end of the needle 3 away from the elastic conductive member 2 is a ball head with a crown-shaped end 307 formed by material reduction;

[0058] Please refer to Fig.13 , the end of the needle 3 away from the elastic conductive member 2 is a flat head 301;

[0059] Please refer to Fig.14 The end of the needle 3 away from the elastic conductive member 2 is structured as a flat-head spiral protrusion 302 .

Claims

1. High-throughput test probe, characterized in that: include: A support carrier, wherein a loading cavity is provided in the support carrier, and ports at both ends of the loading cavity are connected to the outside; An elastic conductive member, the elastic conductive member comprising an elastic plastic body and metal conductive particles distributed in the elastic plastic body; The needle is arranged at both ends of the elastic conductive member, and the needles at both ends are electrically connected through the metal conductive particles; the needle and the elastic conductive member are both arranged in the loading cavity, and the two needles are elastically supported by the elastic conductive member to keep extending out of the two end ports of the loading cavity respectively; the needle is provided with a stopper, and the two end ports of the loading cavity are both provided with a limiting portion matching the stopper, and the limiting portion cooperates with the stopper to limit the needle from detaching from the supporting carrier.

2. The high-conductivity test probe according to claim 1, characterized in that: The elastic plastic material is silicone rubber.

3. The high-conductivity test probe according to claim 1, characterized in that: The surface of the metal conductive particles is provided with a coating of any single material of gold, silver, cobalt, rhodium or tungsten.

4. The high-conductivity test probe according to claim 1, characterized in that: The metal conductive particles are in the shape of a star or a horseshoe.

5. The high-conductivity test probe according to claim 1, characterized in that: The supporting carrier is a syringe.

6. The high-throughput test probe according to claim 1, characterized in that: The limiting part is a constricted structure provided at the port of the loading chamber and having a smaller diameter than the inner diameter of the loading chamber; the stopping part is an annular convex structure provided at the outer diameter of the needle head and having a larger diameter than the port of the loading chamber.

7. The high-conductivity test probe according to claim 1, characterized in that: It comprises an insulating connector; both ends of the support carrier are connected to the insulating connector.

8. The high-throughput test probe according to claim 7, characterized in that: The insulating connector is an annular body, and the inner hole of the annular body is sleeved on the outer wall of the supporting carrier.

9. The high-throughput test probe according to claim 1, characterized in that: The end of the needle away from the elastic conductive member is in any structure of a flat head, a cone, a flat head spiral protrusion, a bevel blade body, or a crown shape.

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