Automatic testing device for temperature characteristics of capacitor

Abstract

The utility model discloses an automatic testing device for temperature characteristics of a capacitor. The automatic testing device comprises a testing seat, a clamping jig and a control mechanism, the testing seat comprises a testing seat body, a testing plate arranged on the testing seat body, a fixing block which is arranged on the testing plate and is used for fixing the clamping jig, and a plurality of first contact probes which are arranged on the fixing block at intervals and are connected with the testing plate; the clamping jig is used for installing and fixing the capacitor and comprises a clamping assembly used for installing and fixing the capacitor, a positioning block arranged at the bottom of the clamping assembly and a plurality of second contact probes arranged in the positioning block at intervals and connected with the clamping assembly. The second contact probe is in contact connection with the corresponding first contact probe; the control mechanism is connected with the test plate and is used for carrying out temperature characteristic test on the capacitor on the clamping assembly; the capacitor testing device can be suitable for testing a large batch of capacitors, testers can operate equipment easily on the premise that the reliability of a testing result is met, and meanwhile the capacity requirement of devices is met.

Description

Technical Field

[0001] This utility model belongs to the field of capacitor performance testing, specifically relating to an automatic testing device for the temperature characteristics of capacitors. Background Technology

[0002] Capacitors are widely used components in electronic devices, and their temperature characteristics are one of the important indicators for evaluating capacitor quality. During capacitor manufacturing and use, in order to determine the relative change in capacitance at different test temperatures compared to the capacitance at a reference temperature, it is necessary to test the capacitor's temperature characteristics to assess its quality and reliability.

[0003] However, existing methods for testing the temperature characteristics of capacitors rely on three devices—an LCR meter, a CTV parameter conversion device, and a small ultra-low temperature test chamber—connected by wiring and fixtures. This results in low testing efficiency, inaccurate test results, and a cumbersome testing process, among other shortcomings and defects. Utility Model Content

[0004] The purpose of this invention is to overcome the shortcomings of the prior art and provide an automatic testing device for the temperature characteristics of capacitors.

[0005] The present invention adopts the following technical solution:

[0006] An automatic testing device for the temperature characteristics of capacitors includes a test stand, a clamping fixture, and a control mechanism.

[0007] The test fixture includes a test fixture body, a test plate disposed on the test fixture body, a fixing block disposed on the test plate for fixing a clamping fixture, and a plurality of first contact probes disposed at intervals on the fixing block and connected to the test plate.

[0008] A clamping fixture for mounting and fixing a capacitor includes a clamping assembly for mounting and fixing the capacitor, a positioning block disposed at the bottom of the clamping assembly, and a plurality of second contact probes disposed at intervals in the positioning block and connected to the clamping assembly. The bottom of the positioning block has an upwardly extending fixing groove for the fixing block to be embedded in. The second contact probes are disposed in the fixing groove and are in contact with the opposite first contact probe.

[0009] The control mechanism, connected to the test board, performs temperature characteristic tests on the capacitors on the mounting assembly.

[0010] Furthermore, the clamping assembly includes a first detection circuit board and a second detection circuit board disposed opposite to each other, a mounting block disposed on the first detection circuit board, a mounting groove disposed on the mounting block extending inward for mounting a capacitor, a plurality of connecting probes disposed on the second detection circuit board opposite to the mounting groove, and a locking member disposed between the first detection circuit board and the second detection circuit board.

[0011] Furthermore, the bottom of the mounting groove is provided with a plurality of fixing holes for mounting capacitors at intervals, and the plurality of connecting probes are aligned with the plurality of fixing holes one by one.

[0012] Furthermore, the locking component includes a first locking hole disposed on the first detection circuit board, a second locking hole disposed on the second detection circuit board opposite to the first locking hole, and a locking bolt passing through the second locking hole and engaging with the first locking hole.

[0013] Furthermore, there are two positioning blocks, with the first detection circuit board and the second detection circuit board respectively disposed on the two positioning blocks.

[0014] Furthermore, the positioning block has a connecting groove extending downward from its top surface for connecting the first detection circuit board or the second detection circuit board, the lower end of the first detection circuit board or the second detection circuit board being detachably disposed in the connecting groove via a bolt assembly.

[0015] Furthermore, the clamping assembly also includes a rotating dial plate rotatably disposed on the upper end of the second detection circuit board. The rotating dial plate includes a rotating part connected to the second detection circuit board and a toggle part perpendicularly connected to the rotating part. When the rotating part is parallel to the side of the second detection circuit board, its lower end is located below the top surface of the second detection circuit board.

[0016] Furthermore, the clamping assembly includes a circuit board and a welding area disposed on the circuit board for welding capacitors, and the positioning block is disposed at the bottom of the circuit board.

[0017] Furthermore, it also includes a guiding mechanism, which includes two guide blocks disposed opposite to each other on both sides of the fixed block and two connecting plates disposed on the test base for mounting the two guide blocks respectively.

[0018] Furthermore, the control mechanism includes a PLC controller connected to the test board and a display screen connected to the PLC controller for displaying test results.

[0019] As can be seen from the above description of the present invention, compared with the prior art, the beneficial effects of the present invention are: by defining the structure and specific operation of the testing device, multiple capacitors to be tested are clamped and fixed, and then, in conjunction with the control mechanism, all parameters can be tested. It is applicable to testing large batches of capacitors. Under the premise of ensuring the reliability of the test results, it is easy for test personnel to operate the equipment, while also meeting the production capacity requirements of the device.

[0020] The structure of the clamping fixture is further defined to ensure good contact between the capacitor and the connecting probe, and between the first contact probe and the second contact probe, so as to ensure the stability of the test results while ensuring that the appearance of the capacitor is not damaged. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the structure of this utility model;

[0022] Figure 2 Schematic diagram of the first embodiment of the clamping assembly Figure 1 ;

[0023] Figure 3 Schematic diagram of the first embodiment of the clamping assembly Figure 2 ;

[0024] Figure 4 Schematic diagram of the first embodiment of the clamping assembly Figure 3 ;

[0025] Figure 5 Schematic diagram of the second embodiment of the clamping assembly Figure 1 ;

[0026] Figure 6 Schematic diagram of the second embodiment of the clamping assembly Figure 2 ;

[0027] In the figure, 1-test seat, 2-clamping fixture, 3-control mechanism, 11-test seat body, 12-test plate, 13-fixing block, 14-first contact probe, 15-guide block, 151-guide groove, 16-connecting plate, 21-clamping assembly, 211-first detection circuit board, 212-second detection circuit board, 213-mounting block, 214-mounting groove, 2141-fixing hole, 215-connecting probe, 216-locking component, 2161-first locking hole, 2162-second locking hole, 217-rotating dial, 2171-rotating part, 2172-moving part, 218-circuit board, 219-welding area, 22-positioning block, 221-connecting groove, 222-fixing groove, 23-second contact probe, 31-display screen. Detailed Implementation

[0028] The present invention will be further described below through specific embodiments.

[0029] Reference Figures 1 to 6 As shown, an automatic testing device for the temperature characteristics of capacitors includes a test stand, a clamping fixture, and a control mechanism.

[0030] The testing device includes a test stand 1, a clamping fixture 2, and a control mechanism 3.

[0031] The test base 1 includes a test base body 11, a test plate 12 disposed on the test base body 11, two fixing blocks 13 spaced apart on the test plate 12 for fixing the clamping fixture 2, a plurality of first contact probes 14 spaced apart on the fixing blocks 13 and connected to the test plate 12, two guide blocks 15 disposed opposite to each other on both sides of the two fixing blocks 13, and a connecting plate 16 disposed on the test base body 11 for mounting the relative guide blocks 15; specifically, four test plates 12 are provided to cooperate with four clamping fixtures 2, which is suitable for testing large batches of capacitors. Under the premise of meeting the reliability of test results, it is easy for test personnel to operate the equipment, and at the same time meets the production capacity requirements of the devices.

[0032] The clamping fixture 2 is used to install and fix the capacitor. It includes a clamping assembly 21 for installing and fixing the capacitor, two positioning blocks 22 respectively connected to two fixing blocks 13 at the bottom of the clamping assembly 21, and a plurality of second contact probes 23 connected to the clamping assembly 21 in the positioning blocks 22. Specifically, the bottom of the positioning block 22 has an upwardly extending fixing groove 222 for embedding relative to the fixing block 13. The second contact probes 23 are disposed in the fixing groove 222 and can contact and connect with the relative first contact probe 14. After the clamping fixture 2 has installed and fixed the capacitor, it is moved between the two guide blocks 15 and then moved downward so that the fixing block 13 is embedded in the fixing groove 222. At this time, the first contact probe 14 and the second contact probe 23 just make contact and connect to perform temperature characteristic detection.

[0033] This application describes two implementations of the clamping assembly, see reference 2. Figures 2 to 4In a first embodiment of the clamping assembly of this application, the clamping assembly 21 includes a first detection circuit board 211 and a second detection circuit board 212 disposed opposite to each other on two positioning blocks 22, a mounting block 213 disposed on the first detection circuit board 211, a mounting groove 214 extending inwardly on the mounting block 213 for mounting capacitors, a plurality of connecting probes 215 disposed on the second detection circuit board 212 opposite to the mounting groove 214, a locking member 216 disposed between the first detection circuit board 211 and the second detection circuit board 212, and a rotating lever 217 rotatably disposed on the upper end of the second detection circuit board 212. Specifically, a plurality of mounting probes for mounting capacitors are spaced apart at the bottom of the mounting groove 214. The container has a fixing hole 2141, and multiple connecting probes 215 are aligned with the fixing hole 2141 one by one. Furthermore, the positioning block 22 has a connecting groove 221 extending downward from its top surface for connecting the first detection circuit board 211 or the second detection circuit board 212. The lower end of the first detection circuit board 211 or the second detection circuit board 212 is detachably mounted in the connecting groove 221 by a bolt assembly. The inner side of the guide block 15 has guide grooves 151 formed at intervals for the first detection circuit board 211 and the second detection circuit board 212 to be embedded. Through the guiding effect of the guide grooves 151, the first contact probe 14 and the second contact probe 23 can be contacted and connected, ensuring the stable performance of the temperature characteristic test.

[0034] The locking component 216 includes a first locking hole 2161 on the first detection circuit board 211, a second locking hole 2162 on the second detection circuit board 212 opposite to the first locking hole 2161, and a locking bolt that passes through the second locking hole 2162 and engages with the first locking hole 2161. After the capacitor is installed, the locking bolt passes through the second locking hole 2162 and engages with the first locking hole 2161, so that the connecting probe 215 maintains stable contact with the relative capacitor.

[0035] The rotating dial 217 includes a rotating part 2171 connected to the second detection circuit board 212 and a toggle part 2172 connected perpendicularly to the rotating part 2171. When the rotating part 2171 is parallel to the side of the second detection circuit board 212, its lower end is located below the top surface of the second detection circuit board 212. After the capacitor has completed the test, the rotating dial 217 is toggle so that its lower end abuts against the upper end of the guide block 15 and the clamping fixture 2 springs upward so as to facilitate the removal of the clamping fixture 2 from the test seat 1.

[0036] Reference Figures 5 to 6In a second embodiment of the clamping assembly of this application, the clamping assembly 21 includes a circuit board 218 and a welding area 219 disposed on the circuit board 218 for welding capacitors. Two positioning blocks 22 are disposed at intervals on the bottom of the circuit board 218. When the capacitor is tested for temperature characteristics, it is welded to the welding area 219. Then, the clamping fixture is fixed on the test seat 1 by the cooperation of the fixing groove 222 and the fixing block 13.

[0037] The control mechanism 3, connected to the test board 12, performs temperature characteristic tests on the capacitors on the clamping assembly 21, including a PLC controller connected to the test board 12 and a display screen 31 connected to the PLC controller for displaying the test results.

[0038] This application defines the structure and specific operation of the testing device. Multiple capacitors to be tested are clamped and fixed, and then, in conjunction with the control mechanism 3, all parameters can be tested. Furthermore, the structure of the clamping fixture 2 is defined to ensure good contact between the capacitor and the connecting probe 215, the first contact probe 14 and the second contact probe 23. This ensures that the appearance of the capacitor is not damaged, while also ensuring the stability of the test results. It is also suitable for testing large batches of capacitors. Under the premise of meeting the reliability of the test results, it is easy for test personnel to operate the equipment, while also meeting the production capacity requirements of the devices.

[0039] The above description is merely a preferred embodiment of the present utility model, and therefore cannot be construed as limiting the scope of the present utility model. All equivalent changes and modifications made in accordance with the scope of the present utility model application and the contents of the specification should still fall within the scope of the present utility model application.

Claims

1. An automatic test device for capacitor temperature characteristics, characterized in that: Including test seat, clamping fixture and control mechanism; The test socket comprises a test socket body, a test board arranged on the test socket body, a fixing block arranged on the test board for fixing the clamping fixture, and a plurality of first contact probes arranged at intervals on the fixing block and connected to the test board; A clamping fixture is used to install a fixed capacitor, comprising a clamping assembly for installing the fixed capacitor, a positioning block arranged at the bottom of the clamping assembly, and a plurality of second contact probes arranged at intervals in the positioning block and connected to the clamping assembly, wherein a fixing groove extending upward for the fixing block to be embedded is formed at the bottom of the positioning block; the second contact probe is arranged in the fixing groove and is in contact with the first contact probe; The control mechanism is connected to the test board to perform a temperature characteristic test on the capacitor on the clamping assembly.

2. The automatic testing device for capacitor temperature characteristics according to claim 1, characterized in that: The clamping assembly includes a first detection circuit board and a second detection circuit board arranged opposite to each other, a mounting block arranged on the first detection circuit board, a mounting groove arranged on the mounting block and extending inward for mounting a capacitor, a plurality of connecting probes arranged on the second detection circuit board opposite to the mounting groove, and a locking member arranged between the first detection circuit board and the second detection circuit board.

3. The automatic testing device for capacitor temperature characteristics according to claim 2, characterized in that: A plurality of fixing holes for installing capacitors are arranged at intervals at the bottom of the installation groove, and the plurality of connecting probes are opposite to the plurality of fixing holes one by one.

4. The automatic test device for capacitor temperature characteristics according to claim 2, characterized in that: The locking member comprises a first locking hole arranged on the first detection circuit board, a second locking hole arranged on the second detection circuit board opposite to the first locking hole, and a locking bolt passing through the second locking hole and cooperating with the first locking hole.

5. The automatic test device for capacitor temperature characteristics according to claim 2, characterized in that: The positioning blocks are provided with two, and the first detection circuit board and the second detection circuit board are respectively arranged on the two positioning blocks.

6. The automatic test device for capacitor temperature characteristics according to claim 5, characterized in that: The positioning block is formed with a connection groove extending downward from its top surface for connecting the first detection circuit board or the second detection circuit board, and the lower end of the first detection circuit board or the second detection circuit board is detachably arranged in the connection groove by a bolt assembly.

7. The automatic test device for capacitor temperature characteristics according to claim 2, characterized in that: The clamping assembly also includes a rotating dial plate rotatably arranged on the upper end of the second detection circuit board, the rotating dial plate includes a rotating part connected to the second detection circuit board and a toggle part vertically connected to the rotating part, and when the rotating part is parallel to the side of the second detection circuit board, its lower end is located below the top surface of the second detection circuit board.

8. The automatic test device for capacitor temperature characteristics according to claim 1, characterized in that: The clamping assembly comprises a circuit board and a welding area arranged on the circuit board for welding capacitors, and the positioning block is arranged at the bottom of the circuit board.

9. The automatic test device for capacitor temperature characteristics according to claim 1, characterized in that: It also includes a guiding mechanism, which includes two guiding blocks arranged on both sides of the fixing block and two connecting plates arranged on the test seat body and used for installing the two guiding blocks respectively.

10. The automatic test device for capacitor temperature characteristics according to claim 1, characterized in that: The control mechanism includes a PLC controller connected to the test board and a display screen connected to the PLC controller for displaying test results.

Images