Nitrogen-oxygen sensor chip aging test device

Abstract

The utility model discloses an aging test device for a nitrogen-oxygen sensor chip, and belongs to the technical field of sensor chip test devices. A nitrogen-oxygen sensor chip aging test device comprises a first support and further comprises a set of bidirectional threaded rods arranged on the first support, the lower end face of one bidirectional threaded rod is connected with a second support, the upper half portion of each bidirectional threaded rod is sleeved with a first sliding block, and the lower half portion of each bidirectional threaded rod is sleeved with a second sliding block; the first sliding block is fixedly connected with a detection cover plate, and the second sliding block is fixedly connected with a chip support. Multiple groups of detection notches are formed in the lower end surface of the detection cover plate; multiple groups of limiting grooves are formed in the chip bracket; the limiting groove penetrates through the chip bracket; a cross beam is arranged below the chip support, a transverse pulling plate capable of being pulled is arranged on the cross beam, and a vertical pulling plate capable of being pulled is arranged on the cross beam. According to the utility model, a plurality of groups of chips can be detected at the same time, the detection chip can be replaced without contact after the detection is completed, the next group of test can be carried out, and the time is saved.

Description

Technical Field

[0001] The utility model relates to the technical field of sensor chip testing devices, in particular to an aging testing device for a nitrogen and oxygen sensor chip. Background Art

[0002] The nitrogen oxide sensor is a key component in the vehicle exhaust control system. Its main function is to detect the content of nitrogen oxides in the vehicle exhaust. Through this detection, the nitrogen oxide sensor can assist the vehicle control system to adjust the exhaust, thereby reducing pollution to the environment.

[0003] Among them, the aging test of the nitrogen oxide sensor chip plays an important role in the product research and development stage, the production quality control stage, the after-sales service troubleshooting stage and other links. Through the aging test, it can be ensured that the nitrogen oxide sensor chip can operate stably and reliably under various conditions to meet customer needs and market requirements. However, in the existing test device, it is impossible to test multiple groups of chips at the same time; and because the nitrogen oxide sensor chip will be heated to a very high temperature during the test, it is often necessary to stand for a period of time after the test before it can be taken out to continue the next group of tests, which greatly affects the efficiency of the test. In view of this problem, the utility model provides a nitrogen oxide sensor chip aging test device. Utility Model Content

[0004] The technical problem to be solved by the utility model is to overcome the deficiencies of the prior art and provide a nitrogen oxide sensor chip aging test device that can overcome the above problems or at least partially solve the above problems.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A nitrogen oxygen sensor chip aging test device comprises a first bracket, and also includes: a group of bidirectional threaded rods are provided on the first bracket, wherein the lower end surface of one of the bidirectional threaded rods is connected to the second bracket, the upper half of the bidirectional threaded rod is sleeved with a first slider, and the lower half of the bidirectional threaded rod is sleeved with a second slider; the first slider is fixedly connected to a detection cover plate, and the second slider is fixedly connected to a chip bracket; the lower end surface of the detection cover plate is provided with multiple groups of detection notches, and the chip bracket is provided with multiple groups of limit grooves; the limit groove runs through the chip bracket; a crossbeam is provided under the chip bracket, and a horizontal pull plate that can be pulled out is provided on the crossbeam, and a vertical pull plate that can be pulled out is provided on the crossbeam.

[0007] Preferably, a cooling water tank is provided below the chip support, and a plurality of cooling grooves are provided on the upper end surface of the cooling water tank.

[0008] Furthermore, a rotating shaft is fixedly connected to both sides of the cooling groove, and one end of the rotating shaft is connected to the output end of the second servo motor.

[0009] Furthermore, a water inlet is provided on the upper side of the cooling trough, and a water outlet is provided at the bottom end of the cooling trough.

[0010] Preferably, the upper end of the bidirectional threaded rod is connected to a first servo motor fixed on the first bracket.

[0011] Preferably, a plurality of groups of indicator lights are provided above the detection cover.

[0012] Preferably, a waste trough is connected to the bottom ends of the first bracket and the second bracket.

[0013] Preferably, the crossbeam is provided with a plurality of plug-in interfaces, and sliding grooves are provided on both sides of the crossbeam.

[0014] Compared with the prior art, the utility model provides a nitrogen oxygen sensor chip aging test device, which has the following beneficial effects:

[0015] 1. The nitrogen oxygen sensor chip aging test device can detect multiple chips at the same time by detecting the cover plate and the chip bracket, thereby increasing the detection efficiency.

[0016] 2. The nitrogen oxide sensor chip aging test device can screen out unqualified products and replace the tested chips without contact through the pulling cooperation of the horizontal pull plate and the vertical pull plate, thus eliminating the time of waiting for the chip to cool down.

[0017] 3. The nitrogen oxide sensor chip aging test device can cool down the nitrogen oxide sensor chip after the test through the cooling tank and the cooling water tank, speeding up the cooling speed of the chip, so that qualified products can be collected earlier.

[0018] The parts not involved in the device are the same as the existing technology or can be implemented by using the existing technology. The utility model can detect multiple groups of chips, and at the same time greatly reduces the time waiting for the chips to cool down, which helps to improve the efficiency of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is a structural schematic diagram of a nitrogen and oxygen sensor chip aging test device proposed by the utility model;

[0020] Figure 2 This is a front view of a nitrogen and oxygen sensor chip aging test device proposed by the utility model;

[0021] Figure 3 This is a bottom view of a chip bracket in a nitrogen and oxygen sensor chip aging test device proposed by the utility model;

[0022] Figure 4This is a cross-sectional view of a cooling water tank in a nitrogen and oxygen sensor chip aging test device proposed by the utility model;

[0023] Figure 5 This is a bottom view of a detection cover plate in a nitrogen and oxygen sensor chip aging test device proposed by the utility model;

[0024] In the figure: 1. first bracket; 2. second bracket; 3. chip bracket; 4. detection cover; 5. indicator light; 6. bidirectional threaded rod; 7. vertical pull plate; 9. cooling water tank; 10. waste trough; 11. horizontal pull plate; 12. crossbeam; 13. first servo motor; 14. first slider; 15. second slider; 16. second servo motor; 17. rotating shaft; 18. water inlet; 19. water outlet; 20. cooling trough; 21. limit slot; 22. detection slot; 23. slide slot; 24. plug interface. DETAILED DESCRIPTION

[0025] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0026] In the description of the present invention, it should be understood that the terms "upper", "lower", "front", "back", "left", "right", "top", "bottom", "inside", "outside", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as a limitation on the present invention. Example

[0027] Reference Figure 1-Figure 5 A nitrogen oxygen sensor chip aging test device comprises a first bracket 1, and further comprises: a group of bidirectional threaded rods 6 are arranged on the first bracket 1, wherein the lower end surface of one bidirectional threaded rod 6 is connected to the second bracket 2, the upper half of the bidirectional threaded rod 6 is sleeved with a first slider 14, and the lower half of the bidirectional threaded rod 6 is sleeved with a second slider 15; the first slider 14 is fixedly connected to a detection cover plate 4, and the second slider 15 is fixedly connected to a chip bracket 3; a plurality of detection notches 22 are provided on the lower end surface of the detection cover plate 4, and a plurality of limit grooves 21 are provided on the chip bracket 3; the limit groove 21 runs through the chip bracket 3; a crossbeam 12 is provided below the chip bracket 3, a horizontal pull plate 11 that can be pulled out is provided on the crossbeam 12, and a vertical pull plate 7 that can be pulled out is provided on the crossbeam 12.

[0028] In the utility model, the first bracket 1 and the second bracket 2 play a supporting role for the entire device. When the user uses it, the first slider 14 and the second slider 15 drive the chip bracket 3 and the detection cover plate 4 to move relatively in or relatively away by rotating the bidirectional threaded rod 6. Each limit groove 21 corresponds to each detection notch 22. The user can first rotate the bidirectional threaded rod 6 to make the chip bracket 3 and the detection cover plate 4 relatively away from each other, so as to facilitate the placement of the chip into the limit groove 21, and then rotate the bidirectional threaded rod 6 to make the chip bracket 3 and the detection cover plate 4 relatively close, so that the chip can be inserted into the detection notch 22 for detection. When the detection is completed, the chip in the limit groove 21 can be made to lose support and slide out of the limit groove 21 by pulling the horizontal pull plate 11 and the vertical pull plate 7 below. Then the user can restore the horizontal pull plate 11 and the vertical pull plate 7 to detect the next group of chips. Example

[0029] Reference Figure 1-Figure 5 , which is basically the same as Example 1, and further: a cooling water tank 9 is provided below the chip bracket 3, and a plurality of cooling grooves 20 are provided on the upper end surface of the cooling water tank 9, and rotating shafts 17 are fixedly connected on both sides of the cooling grooves 20, and one end of the rotating shaft 17 is connected to the output end of the second servo motor 16, and a water inlet 18 is provided above one side of the cooling groove 20, and a water outlet 19 is provided at the bottom of the cooling groove 20, a waste trough 10 is connected to the bottom ends of the first bracket 1 and the second bracket 2, and a first servo motor 13 fixed on the first bracket 1 is connected to the upper end of the bidirectional threaded rod 6, and a plurality of indicator lights 5 are provided above the detection cover plate 4, and slide grooves 23 are provided on both sides of the crossbeam 12, and a plurality of plug interfaces 24 are provided on the crossbeam 12.

[0030] In the utility model, the first servo motor 13 serves as the rotational power source of the bidirectional threaded rod 6 to facilitate the user to control the lifting operation more accurately. The position of each cooling groove 20 corresponds to each limit groove 21. When the user completes the chip detection, the chip bracket 3 can be moved close to the cooling water tank 9 by controlling the first servo motor 13 to ensure that the chip can accurately slide from the limit groove 21 to the cooling groove 20 when the user pulls the horizontal pull plate 11 and the vertical pull plate 7.

[0031] When there are substandard samples among the chips being tested, the indicator light 5 at the corresponding position will give a prompt, and the user can first open the pull plate at the corresponding position to make the defective products fall into the cooling tank 20, and then start the second servo motor 16 to drive the rotating shaft 17 and the cooling water tank 9 to flip, so that the defective products fall into the waste tank 10 below. It should be noted that when the cooling water tank 9 flips, the chip holder 3 must be away from the cooling water tank 9 to prevent the cooling water tank 9 from colliding with the chip holder 3 when flipping.

[0032] When the water temperature in the cooling water tank 9 increases, the water in the cooling water tank 9 can be replaced through the water inlet 18 and the water outlet 19, thereby ensuring the cooling effect of the cooling water tank 9.

[0033] The slide groove 23 on the crossbeam 12 can limit the movement of the vertical pull plate 7, and the plug interface 24 can limit the movement of the horizontal pull plate 11, thereby ensuring that the horizontal pull plate 11 and the vertical pull plate 7 will not deviate from the track to cause the chip to accidentally slide and cause additional losses.

[0034] When in use, the user first controls the first servo motor 13 to drive the bidirectional threaded rod 6 to move the chip holder 3 and the detection cover plate 4 relatively away from each other, so as to facilitate the placement of the chip into the limiting groove 21, and then controls the first servo motor 13 to drive the bidirectional threaded rod 6 to rotate, so that the detection cover plate 4 and the chip holder 3 are close to each other, so that the upper end of the chip in the limiting groove 21 is inserted into the detection notch 22, and then the chip in the limiting groove 21 is detected with the detection end in the detection notch 22. After the detection is completed, the indicator light 5 corresponding to the unqualified chip will change color to remind, and the user controls the first servo motor 13 to make the detection cover plate 4 dock with the cooling water tank 9 below. , and then according to the reminder of the indicator light 5, the horizontal pull plate 11 and the vertical pull plate 7 at the corresponding position are pulled out, so that the chip falls into the cooling tank 20, and then the chip bracket 3 is controlled to rise a certain distance to prevent obstruction of the turning of the cooling water tank 9. Then the user can control the second servo motor 16 to turn the cooling water tank 9 to turn the defective products in the cooling tank 20 into the waste tank 10 below. Then the user uses the same method as above to introduce all qualified chips into the cooling tank 20 and let them stand. The thermal conductivity of the water accelerates the heat dissipation of the chip. While the chip is dissipating heat, the user can test the next batch of chips, eliminating the waiting time.

[0035] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A nitrogen and oxygen sensor chip aging test device, comprising a first bracket (1), characterized in that: Also includes: The first bracket (1) is provided with a group of bidirectional threaded rods (6), wherein the lower end surface of one of the bidirectional threaded rods (6) is connected to the second bracket (2), the upper part of the bidirectional threaded rod (6) is sleeved with a first slider (14), and the lower part of the bidirectional threaded rod (6) is sleeved with a second slider (15); The first sliding block (14) is fixedly connected to the detection cover plate (4), and the second sliding block (15) is fixedly connected to the chip bracket (3); The lower end surface of the detection cover plate (4) is provided with a plurality of detection notches (22), and the chip bracket (3) is provided with a plurality of limit grooves (21); the limit grooves (21) penetrate the chip bracket (3); A crossbeam (12) is provided below the chip support (3), a horizontal pull plate (11) that can be pulled out is provided on the crossbeam (12), and a vertical pull plate (7) that can be pulled out is provided on the crossbeam (12).

2. The nitrogen oxygen sensor chip aging test device according to claim 1 is characterized in that: A cooling water tank (9) is provided below the chip support (3), and a plurality of cooling grooves (20) are provided on the upper end surface of the cooling water tank (9).

3. The nitrogen oxygen sensor chip aging test device according to claim 2 is characterized in that: A rotating shaft (17) is fixedly connected to both sides of the cooling groove (20), and one end of the rotating shaft (17) is connected to the output end of the second servo motor (16).

4. The nitrogen oxygen sensor chip aging test device according to claim 3 is characterized in that: A water inlet (18) is provided at the top of one side of the cooling groove (20), and a water outlet (19) is provided at the bottom of the cooling groove (20).

5. The nitrogen oxygen sensor chip aging test device according to claim 1 is characterized in that: The upper end of the bidirectional threaded rod (6) is connected to a first servo motor (13) fixed on the first bracket (1).

6. The nitrogen oxygen sensor chip aging test device according to claim 1 is characterized in that: A plurality of groups of indicator lights (5) are provided above the detection cover plate (4).

7. The nitrogen oxygen sensor chip aging test device according to claim 1 is characterized in that: A waste trough (10) is connected at the bottom ends of the first bracket (1) and the second bracket (2).

8. The nitrogen oxygen sensor chip aging test device according to claim 1 is characterized in that: Slide grooves (23) are provided on both sides of the crossbeam (12), and a plurality of plug-in interfaces (24) are provided on the crossbeam (12).

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