Circuit board voltage stability testing device
By designing a circuit board voltage stability test device including a sliding test seat and a threaded connected test probe, the problem that the existing technology cannot be applied to various types of circuit boards for voltage testing is solved, and the circuit board voltage testing is realized Flexibility and convenience.
Patent Information
- Application Number
- CN202420972786.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-07
- Publication Date
- 2025-02-11
- Estimated Expiration
- 2034-05-07
AI Technical Summary
The existing circuit board testing device cannot be used for voltage testing of multiple circuit boards, and is limited in use and cannot meet multiple usage needs.
A circuit board voltage stability test device is designed, including a test lifting column, circuit board and voltage stability tester. The test components can adjust the test according to the position of the circuit board test point through a sliding test seat and a threaded-connected test probe. Probe position, suitable for various board models.
It realizes the flexibility and convenience of circuit board voltage testing, can be applied to a variety of circuit board models, meets a variety of usage needs, and is easy to use, and the position adjustment and installation of the test probe are easy to adjust and install.
Smart Images

Figure CN222461617U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of circuit board testing, in particular to a circuit board voltage stability testing device. Background Art
[0002] Circuit board voltage stability test is a test method to ensure that the power supply voltage of electronic circuit boards is stable and meets the expected requirements. The purpose of this test is to detect whether the circuit board can maintain a stable power supply voltage output under normal working conditions to ensure the reliability and performance of electronic equipment.
[0003] The existing circuit board test is to put the circuit board into a test fixture, power on the circuit board to burn the factory program, restart it, and use an instrument to test whether the voltage is normal. Although this method can provide a certain test coverage, it cannot cover all situations.
[0004] The existing automatic circuit board testing device mainly relies on the contact between the automatic test head and the test points on the circuit board to perform the test. However, due to certain characteristics of the circuit board, the test head on the existing circuit board corresponds to one type of circuit board, and the adjustment of the test head remains unchanged. It cannot be applied to various types of circuit boards for voltage testing, which limits its use and cannot meet the use requirements. Utility Model Content
[0005] The purpose of the utility model is to provide a circuit board voltage stability testing device to solve the problems raised in the above background technology.
[0006] In order to achieve the above purpose, the utility model provides the following technical solutions:
[0007] A circuit board voltage stability test device comprises a test lifting column, a circuit board and a voltage stability tester, wherein a test assembly for performing a voltage test on the circuit board is arranged at the bottom of the test lifting column, and the test assembly comprises a fixing plate, a test seat and a test probe located inside the test seat;
[0008] The test seat includes a sliding contact seat, a protective test cap is provided at the bottom of the sliding contact seat, a contact conductive screw column is provided at the top of the protective test cap, the contact conductive screw column is a hollow column with two sides passing through, the inner circumferential wall of the contact conductive screw column is provided with a connecting built-in thread, the outer circumferential wall at the top of the test probe is provided with a connecting external thread, and the test probe is threadedly connected to the connecting built-in thread on the inner wall of the contact conductive screw column through the top connecting external thread.
[0009] As a preferred solution of the utility model, the voltage stability tester is located on the outer wall of one side of the test lifting column, and the contact conductive screw columns inside each of the protective test caps are connected to the voltage stability tester through a wire penetrating the protective test cap shell.
[0010] As a preferred solution of the utility model, the bottom of the fixed plate is provided with sliding grooves in a criss-cross pattern, and the sliding contact seat slides on the bottom of the fixed plate through the sliding grooves.
[0011] As a preferred solution of the utility model, a connecting column is provided at the bottom of the fixing plate, and the top of the connecting column is connected to the bottom of the test lifting column through a coupling.
[0012] As a preferred solution of the utility model, the protective test cap is an insulating cap.
[0013] As a preferred solution of the utility model, the voltage stability tester is connected to a voltage display screen for displaying the test voltages of the multiple test probes via a wire.
[0014] Compared with the prior art, the beneficial effects of the utility model are:
[0015] In view of the problems raised in the background technology, the present application is simple to use and convenient for circuit board voltage testing. By setting a sliding test seat, the test probe can be driven to adjust the position according to the position of the circuit board test point. The position of the test probe is easy to adjust and can be applied to various models of circuit boards for voltage testing to meet various usage requirements.
[0016] The threaded test probe is convenient for adding or removing the test probe according to the test point, and is easy to use. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 This is the axonometric drawing of the overall structure of the utility model;
[0018] Figure 2 This is a schematic diagram of the overall test assembly of the utility model;
[0019] Figure 3 This is a schematic diagram of the structure of the contact conductive screw column and the test probe of the utility model;
[0020] Figure 4 This is a schematic diagram of the bottom slide groove structure of the fixed plate of the utility model;
[0021] Figure 5 For this utility model Figure 2 Enlarged view of area A in the middle.
[0022] In the figure: 1. test lifting column; 2. circuit board; 3. test assembly; 31. fixing plate; 311. slide groove; 312. connecting column; 32. test seat; 321. sliding contact seat; 322. protective test cap; 323. contact conductive screw column; 324. connecting internal thread; 33. test probe; 331. connecting external thread. DETAILED DESCRIPTION
[0023] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the embodiments of the present invention.
[0024] Example
[0025] See also Figure 1-5 The utility model provides a technical solution: a circuit board voltage stability test device, comprising a test lifting column 1, a circuit board 2 and a voltage stability tester, a test assembly 3 for performing a voltage test on the circuit board 2 is arranged at the bottom of the test lifting column 1, the test assembly 3 comprises a fixed plate 31, a test seat 32 and a test probe 33 located inside the test seat 32; the test seat 32 comprises a sliding contact seat 321, a sliding groove 311 is staggered at the bottom of the fixed plate 31, and the sliding contact seat 321 slides on the bottom of the fixed plate 31 through the sliding groove 311 The test probe 33 is movable; a protective test cap 322 is arranged at the bottom of the sliding contact seat 321, and the protective test cap 322 is an insulating cap; a contact conductive screw column 323 is arranged at the top inside the protective test cap 322, and the contact conductive screw column 323 is a hollow column with two sides penetrated, and the inner circumferential wall of the contact conductive screw column 323 is provided with a connecting built-in thread 324, and the outer circumferential wall at the top of the test probe 33 is provided with a connecting external thread 331, and the test probe 33 is threadedly connected with the connecting built-in thread 324 on the inner wall of the contact conductive screw column 323 through the top connecting external thread 331.
[0026] It should be noted that, in this embodiment, by setting the sliding test seat 32, the test probe 33 can be driven to adjust the position according to the test point position of the circuit board 2. The position adjustment of the test probe 33 is convenient, and it can be applied to various types of circuit boards for voltage testing to meet various usage requirements.
[0027] Further, when the position of the test probe 33 needs to be adjusted, refer to the test point position of the circuit board 2, move the sliding contact seat 321 to slide inside the slide groove 311, ensure that the position of the test probe 33 corresponds to the test point position, and after the adjustment is completed, fix the test assembly 3 to the bottom of the test lifting column 1 by bolts for testing;
[0028] Furthermore, the threaded test probe 33 is convenient for adding or removing the test probe 33 according to the test point, and is easy to use. When the test probe 33 needs to be reduced, the unnecessary test probe 33 is separated from the contact conductive screw column 323 connected to the top thereof by threaded rotation.
[0029] Further, when it is necessary to add a test probe 33, on the one hand, a new test assembly 3 is installed inside the slide groove 311, and on the other hand, the test probe 33 that is not inside the protective test cap 322 can be installed by threaded installation. During installation, the test probe 33 is threadedly connected with the internal thread 324 connected to the inner wall of the contact conductive screw column 323 through the top connecting external thread 331. After the connection is completed, the position of the test probe 33 is adjusted by sliding to perform a voltage test on the circuit board 2;
[0030] Furthermore, the protective test cap 322 is an insulating cap, and the protective test cap 322 is used for safety protection to prevent contact with the test probe 33 during the test process.
[0031] See also Figure 1-5 The voltage stability tester is located on the outer wall of one side of the test lifting column 1. The contact conductive screw column 323 inside each protective test cap 322 is connected to the voltage stability tester through a wire penetrating the protective test cap 322 shell; a connecting column 312 is provided at the bottom of the fixing plate 31, and the top of the connecting column 312 is connected to the bottom of the test lifting column 1 through a coupling; a voltage display screen for displaying the test voltages of multiple test probes 33 is connected to the voltage stability tester through a wire.
[0032] It should be noted that, in this embodiment, each test probe 33 is connected to an external voltage stability tester via a contact conductive screw column 323 threaded at the top, which facilitates voltage testing of the circuit board 2 according to the test point position. The redundant test probes 33 can be removed by threading, which is easy to use.
[0033] The utility model workflow:
[0034] When in use, refer to the test point position of the circuit board 2, move the sliding contact seat 321 to slide inside the slide groove 311, ensure that the position of the test probe 33 corresponds to the test point position, and after the adjustment is completed, fix the test assembly 3 to the bottom of the test lifting column 1 by bolts, turn on the voltage stability tester, and start the test lifting column 1 for testing;
[0035] When it is necessary to add a test probe 33, on the one hand, a new test assembly 3 is installed inside the slide groove 311, and on the other hand, the test probe 33 that is not inside the protective test cap 322 can be installed by threaded installation. During installation, the test probe 33 is threadedly connected through the top connection external thread 331 and the connection internal thread 324 of the inner wall of the contact conductive screw column 323. After the connection is completed, the position of the test probe 33 is adjusted by sliding, the voltage stability tester is turned on, and the test lifting column 1 is started to perform a voltage test on the circuit board 2. The present application is simple to use, and the voltage test of the circuit board 2 is convenient. By setting a sliding test seat 32, the test probe 33 can be driven to adjust the position according to the position of the test point of the circuit board 2. The position adjustment of the test probe 33 is convenient, and it can be applied to various models of circuit boards for voltage testing to meet various usage requirements; setting a threaded test probe 33 is convenient for adding or removing the test probe 33 according to the test point, and it is easy to use.
[0036] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.
Claims
1. A circuit board voltage stability test device, comprising a test lifting column (1), a circuit board (2) and a voltage stability tester, characterized in that: A test assembly (3) for performing a voltage test on the circuit board (2) is arranged at the bottom of the test lifting column (1), and the test assembly (3) comprises a fixing plate (31), a test seat (32) and a test probe (33) located inside the test seat (32); The test seat (32) comprises a sliding contact seat (321), a protective test cap (322) is arranged at the bottom of the sliding contact seat (321), a contact conductive screw column (323) is arranged at the top of the protective test cap (322), the contact conductive screw column (323) is a hollow column with two sides passing through, the inner circumferential wall of the contact conductive screw column (323) is provided with a connecting internal thread (324), the outer circumferential wall of the top of the test probe (33) is provided with a connecting external thread (331), and the test probe (33) is threadedly connected to the connecting internal thread (324) of the inner wall of the contact conductive screw column (323) through the connecting external thread (331) at the top.
2. A circuit board voltage stability test device according to claim 1, characterized in that: The voltage stability tester is located on an outer wall of one side of the test lifting column (1), and the contact conductive screw column (323) inside each of the protective test caps (322) is connected to the voltage stability tester via a wire penetrating through the shell of the protective test cap (322).
3. A circuit board voltage stability testing device according to claim 1, characterized in that: The bottom of the fixed plate (31) is provided with sliding grooves (311) in a crisscross pattern, and the sliding contact seat (321) slides on the bottom of the fixed plate (31) through the sliding grooves (311).
4. A circuit board voltage stability testing device according to claim 1, characterized in that: A connecting column (312) is provided at the bottom of the fixing plate (31), and the top of the connecting column (312) is connected to the bottom of the test lifting column (1) via a coupling.
5. A circuit board voltage stability test device according to claim 1, characterized in that: The protective test cap (322) is an insulating cap.
6. A circuit board voltage stability test device according to claim 1, characterized in that: The voltage stability tester is connected to a voltage display screen for displaying the test voltages of the plurality of test probes (33) via a wire.