Memory low-speed signal test fixture
By designing a memory low-speed signal testing tool, the problem of difficulty in performing signal testing outside the memory slot in the prior art is solved, and effective testing of memory low-speed signals is realized without affecting the performance of high-speed signals.
Patent Information
- Application Number
- CN202421231224.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-31
- Publication Date
- 2025-02-14
- Estimated Expiration
- 2034-05-31
AI Technical Summary
The prior art is difficult to perform signal testing outside the memory slot, which affects the stability of performance during memory read and write.
Design a memory low-speed signal testing tool, including a tool housing, a conductive contact piece and a signal interface. The tool housing is set on the memory to be tested. The conductive contact piece and the memory signal contact piece are in contact with each other. The signal interface is connected to the oscilloscope through a signal line. .
It realizes the introduction of low-speed memory signals and some power signals to the outside of the memory slot, which facilitates signal testing and does not affect the performance of high-speed memory signals.
Smart Images
Figure CN222482721U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of computers, and in particular relates to a memory low-speed signal testing tool. Background Art
[0002] With the rapid increase in data processing volume and speed of storage devices and servers, the performance of double data rate synchronous dynamic random access memory (full name: Double Data Rate SDRAM, English abbreviation: DDR, Chinese abbreviation: memory) has been greatly improved. When reading and writing memory, the CPU will first access the memory device address, and then establish data transmission after confirming that the memory address is correct. During output transmission, the memory address and other information will also be accessed from time to time. In order to ensure stable performance during memory reading and writing, it is extremely critical to test IIC signals, I3C signals, and power signals.
[0003] When the memory is inserted into the memory slot, the signal line to be tested is not led out of the slot, which makes it inconvenient to perform signal testing. Therefore, it is particularly important to perform information quality testing close to the memory end. Utility Model Content
[0004] In view of the above-mentioned deficiencies in the prior art, the utility model provides a memory low-speed signal test jig to solve the above-mentioned technical problems.
[0005] The utility model provides a memory low-speed signal testing tool, comprising:
[0006] A jig shell, the jig shell comprising a cavity, the cavity matching the size of the memory to be tested, the jig shell being sleeved on the memory to be tested;
[0007] A plurality of conductive contacts are arranged inside the cavity, and are used to contact and connect with corresponding signal contacts of the memory to be tested;
[0008] A signal interface, used to connect an oscilloscope via a signal line;
[0009] The plurality of conductive contacts are electrically connected to the signal interface via circuits inside the tool housing.
[0010] In an optional embodiment, the tool housing is a cuboid, and the cross-section of the cavity is a rectangle.
[0011] In an optional embodiment, a V-shaped fixing structure is provided at both ends of the cavity, and the V-shaped opening of the V-shaped fixing structure clamps the edge of the memory. The V-shaped fixing structure includes a fixing rod, and the fixing rod penetrates the tool shell from the cavity. The fixing rod is connected to a handle at one end outside the cavity.
[0012] In an optional embodiment, the V-shaped fixing structure is an elastic structure.
[0013] In an optional embodiment, the conductive contact includes a first gold finger, a second gold finger, a third gold finger and a fourth gold finger, the first gold finger is used to connect the power signal contact of the memory to be tested, the second gold finger is used to connect the serial clock signal contact of the memory to be tested, the third gold finger is used to connect the serial data signal contact of the memory to be tested, and the fourth gold finger is used to connect the ground signal contact of the memory to be tested.
[0014] In an optional embodiment, the conductive contact piece is mounted on the cavity wall of the tool housing via an elastic structure.
[0015] In an optional embodiment, the portion between the gold fingers on the tool housing is a hollow structure, and the location of the gold fingers is a protruding structure at the bottom of the tool housing.
[0016] In an optional embodiment, the protruding structure is movably connected to the bottom of the tool housing via a guide rail, and the guide rail is perpendicular to the edge of the cavity.
[0017] In an optional embodiment, the protruding structure is movably connected to the bottom of the tool housing via a rotating shaft.
[0018] In an optional embodiment, the tool shell includes a first rectangular shell and a second rectangular shell, one end of the first rectangular shell is connected to one end of the second rectangular shell via a rotating shaft, the other end of the first rectangular shell is connected to the other end of the second rectangular shell via a fixing buckle, and rectangular grooves are provided on the opposite surfaces of the first rectangular shell and the second rectangular shell, and the rectangular grooves of the first rectangular shell and the second rectangular shell enclose the cavity.
[0019] The beneficial effect of the utility model is that the memory low-speed signal test jig provided by the utility model leads the test signal required by research and development to the outside of the memory slot, and the jig is nested, with contact only at the gold finger of the target low-speed signal, and no contact at the gold finger of the high-speed signal, and will not introduce crosstalk to affect the quality of the high-speed signal. It can achieve the premise of facilitating research and development to carry out memory low-speed related signal testing without affecting the memory high-speed signal performance.
[0020] In addition, the utility model has a reliable design principle, a simple structure and a very broad application prospect. BRIEF DESCRIPTION OF THE DRAWINGS
[0021] In order to more clearly illustrate the technical solutions in the embodiments of the utility model or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0022] Figure 1 It is a schematic diagram of a memory low-speed signal test jig according to an embodiment of the utility model.
[0023] Figure 2 It is a schematic diagram of a V-shaped fixing structure of a memory low-speed signal test jig according to an embodiment of the utility model.
[0024] Figure 3 It is a schematic diagram of the elastic structure of a memory low-speed signal test jig according to an embodiment of the utility model.
[0025] Figure 4 It is a schematic diagram of a jig shell of a memory low-speed signal test jig according to an embodiment of the utility model.
[0026] Among them, 1. test jig; 11. jig housing; 111. V-shaped fixing structure; 112. conductive contact; 113. elastic structure; 114. protruding structure; 2. memory to be tested; 21. signal contact; 3. DIMM slot. DETAILED DESCRIPTION
[0027] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.
[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention.
[0029] For details, please refer to Figure 1 , memory low speed signal test fixture includes:
[0030] The jig shell 11 includes a cavity, the cavity matches the size of the memory 2 to be tested, and the jig shell 11 is sleeved on the memory 2 to be tested; a plurality of conductive contacts 112 are arranged inside the cavity, and the plurality of conductive contacts 112 are used to contact and connect with the plurality of signal contacts 21 of the memory 2 to be tested; the plurality of conductive contacts 112 are electrically connected to the signal interface through the circuit inside the jig shell 11, and the signal interface is connected to the oscilloscope through the signal line. The memory 2 to be tested is inserted into the DIMM slot 3 of the motherboard.
[0031] To adapt to the memory shape, the jig housing 11 is a cuboid, and the cross section of the cavity is a rectangle.
[0032] Through this test fixture, all low-speed signals and some power signals on the memory can be led out to the outside of the memory slot, which is convenient for R&D and test personnel to conduct related signal tests and improve the speed and stability of signal testing. In addition, the fixture is nested on the memory to be tested, and only low-speed signals and some power signals are led out. The fixture has no contact with the high-speed signals of the memory monomer, and will not introduce crosstalk to affect the impedance and loss of TX and RX. It has no effect on memory performance, but is only convenient for testing low-speed signals.
[0033] The signal contact sheet of DDR5 memory has two sides, each side has 80 pins. The signal sequence of the signal contact sheet 21 of DDR5 memory is fixed, and the position of the low-speed signal to be tested is also fixed. Therefore, the fixture does not need to lead out all the signals of the 160 signal contact sheets 21 of the memory, but only needs to lead out the power supply signal to be tested, SCL and SDA signals and part of the GND signal.
[0034] Specifically, a first gold finger, a second gold finger, a third gold finger and a fourth gold finger are provided inside the cavity. The first gold finger is used to connect the power signal contact of the memory 2 to be tested, the second gold finger is used to connect the serial clock signal contact of the memory 2 to be tested, the third gold finger is used to connect the serial data signal contact of the memory 2 to be tested, and the fourth gold finger is used to connect the ground signal contact of the memory 2 to be tested.
[0035] If the cavity is too small, it will be difficult to set the jig. If the cavity is too large, the gap between the test jig 1 and the memory will be too large, and the jig cannot be fixed, which may cause poor contact of the conductive contact sheet 112. Therefore, V-shaped fixing structures 111 are provided at both ends of the cavity. Figure 2 As shown, the V-shaped opening of the V-shaped fixing structure 111 clamps the edge of the memory, and the V-shaped fixing structure 111 includes a fixing rod, which penetrates the jig housing 11 from the cavity, and one end of the fixing rod outside the cavity is connected to the handle. The V-shaped fixing structure 111 can fix the jig and the memory position, improving the convenience of testing.
[0036] In order to prevent the V-shaped fixing structure 111 from squeezing and damaging the memory, an elastic structure, such as a silicone pad, is used on the V-shaped inner side of the V-shaped fixing structure 111 .
[0037] Since the conductive contact piece 112 is protruding from the surface of the cavity, in order to prevent the conductive contact piece 112 from being damaged by collision when installing the jig and to improve the bonding degree between the conductive contact piece 112 and the contact piece, a retractable design is adopted, such as Figure 3 The conductive contact piece 112 is mounted on the cavity wall of the tool housing 11 through an elastic structure 113. The elastic structure 113 is a spring.
[0038] like Figure 4 As shown, the portion between the conductive contacts 112 on the jig housing 11 is a hollow structure, and the location of the conductive contacts 112 is a protruding structure at the bottom of the jig housing 11. In order to improve the contact between the conductive contacts 112 and the contacts of the memory, the following two designs are adopted:
[0039] First, the protruding structure is movably connected to the bottom of the jig housing 11 through a guide rail, and the guide rail is perpendicular to the edge of the cavity. During the installation process, the protruding structure is pushed to the side away from the memory, and after the installation is completed, the protruding structure is pushed to the position closest to the memory.
[0040] Secondly, the protruding structure is movably connected to the bottom of the jig housing 11 through a rotating shaft. The rotating shaft is set on the cavity surface. After installation, the protruding structure is rotated toward the cavity direction so that the conductive contact 112 at the bottom of the protruding structure is closer to the signal contact 21 of the memory.
[0041] For the convenience of installation, a split jig shell 11 can be used, which includes a first rectangular shell and a second rectangular shell. One end of the first rectangular shell is connected to one end of the second rectangular shell through a rotating shaft, and the other end of the first rectangular shell is connected to the other end of the second rectangular shell through a fixing buckle. Rectangular grooves are provided on the opposite surfaces of the first rectangular shell and the second rectangular shell, and the rectangular grooves of the first rectangular shell and the second rectangular shell form a cavity.
[0042] Although the present invention is described in detail by referring to the accompanying drawings and in combination with the preferred embodiments, the present invention is not limited thereto. Without departing from the spirit and essence of the present invention, a person skilled in the art may make various equivalent modifications or substitutions to the embodiments of the present invention, and these modifications or substitutions shall be within the scope of the present invention. Any person skilled in the art who is familiar with the present technical field may easily think of changes or substitutions within the technical scope disclosed in the present invention, and these shall be within the scope of protection of the present invention.
Claims
1. A memory low-speed signal test jig, characterized in that: include: A jig shell, the jig shell comprising a cavity, the cavity matching the size of the memory to be tested, the jig shell being sleeved on the memory to be tested; A plurality of conductive contacts are arranged inside the cavity, and are used to contact and connect with corresponding signal contacts of the memory to be tested; A signal interface, used to connect an oscilloscope via a signal line; The plurality of conductive contacts are electrically connected to the signal interface via circuits inside the tool housing.
2. The memory low-speed signal test jig according to claim 1, characterized in that: The tool housing is a cuboid, and the cross section of the cavity is a rectangle.
3. The memory low-speed signal test jig according to claim 2, characterized in that: Both ends of the cavity are provided with a V-shaped fixing structure, the V-shaped opening of the V-shaped fixing structure clamps the edge of the memory, and the V-shaped fixing structure includes a fixing rod, which penetrates the tool shell from the cavity, and the fixing rod is connected to a handle at one end outside the cavity.
4. The memory low-speed signal test jig according to claim 3, characterized in that: The V-shaped fixing structure is an elastic structure.
5. The memory low-speed signal test jig according to claim 1, characterized in that: The conductive contact includes a first gold finger, a second gold finger, a third gold finger and a fourth gold finger, the first gold finger is used to connect the power signal contact of the memory to be tested, the second gold finger is used to connect the serial clock signal contact of the memory to be tested, the third gold finger is used to connect the serial data signal contact of the memory to be tested, and the fourth gold finger is used to connect the ground signal contact of the memory to be tested.
6. The memory low-speed signal test jig according to claim 1, characterized in that: The conductive contact piece is mounted on the cavity wall of the tool housing through an elastic structure.
7. The memory low-speed signal test jig according to claim 1, characterized in that: The portion between the gold fingers on the jig shell is a hollow structure, and the location of the gold fingers is a protruding structure at the bottom of the jig shell.
8. The memory low-speed signal test jig according to claim 7, characterized in that: The protruding structure is movably connected to the bottom of the tool housing via a guide rail, and the guide rail is perpendicular to the edge of the cavity.
9. The memory low-speed signal test jig according to claim 7, characterized in that: The protruding structure is movably connected to the bottom of the tool housing via a rotating shaft.
10. The memory low-speed signal test jig according to claim 1, characterized in that: The tool shell includes a first rectangular shell and a second rectangular shell, one end of the first rectangular shell is connected to one end of the second rectangular shell through a rotating shaft, the other end of the first rectangular shell is connected to the other end of the second rectangular shell through a fixing buckle, and rectangular grooves are provided on the opposite surfaces of the first rectangular shell and the second rectangular shell, and the rectangular grooves of the first rectangular shell and the second rectangular shell enclose the cavity.