Sample introduction system of X-ray photoelectron spectrometer

Abstract

The utility model discloses a sample introduction system of an X-ray photoelectron spectrometer, which relates to the field of photoelectron spectroscopes, and comprises a placing table, a plurality of equidistantly distributed separation frames are arranged on the placing table along an annular track, every two adjacent separation frames are distributed in a V-shaped structure, the placing table is divided into a plurality of spaces capable of placing samples, and the spaces are arranged on the placing table. The separation frames are respectively provided with a containing channel, the device further comprises a cover plate capable of covering the surface of a sample, the separation frames are symmetrically distributed on the two sides of the cover plate, the two ends of the cover plate are respectively provided with an extending strip capable of sliding synchronously with the cover plate, and the containing channels can contain the extending strips to slide. In the process of detecting the sample, the cover plate can be in contact with or far away from the sample according to actual detection requirements, the cover plate does not need to be repeatedly disassembled and assembled on the placing table, the sample injection efficiency is improved, and the sample injection device is suitable for different samples. And the time required for manually mounting and dismounting the cover plate can be reduced. When the cover plate is far away from the sample, the stability of the cover plate can be kept.

Description

Technical Field

[0001] The utility model relates to the field of photoelectron spectrometers, in particular to a sample introduction system of an X-ray photoelectron spectrometer. Background Art

[0002] X-ray photoelectron spectroscopy analysis uses surface analysis technology and is mainly used to perform elemental analysis on the surface of materials. Its basic principle is to use X-rays to interact with the sample surface, use the photoelectric effect to stimulate the sample surface to emit photoelectrons, use an energy analyzer to measure the kinetic energy of the photoelectrons, calculate the binding energy of the photoelectrons, and obtain the type, content and chemical state of the material elements.

[0003] In the actual use of the existing sampling system applied to X-ray photoelectron spectrometer, the sample to be tested needs to be manually placed on the sample table. If the conductivity of the sample is poor, a cover plate needs to be covered on the sample to perform the detection operation. The cover plate is mostly installed on the sample table by screws. In the actual working process of the sampling system, it is necessary to continuously perform detection operations on different samples. Depending on the type of sample, the installation and removal of the cover plate takes a long time and the process is relatively cumbersome. Utility Model Content

[0004] In order to solve the above problems, the present application provides an X-ray photoelectron spectrometer sampling system.

[0005] To achieve the above-mentioned purpose, the present application provides the following technical solutions: an X-ray photoelectron spectrometer sampling system, comprising a placing table, on which a plurality of equally spaced partition racks are arranged along a circular trajectory, and two adjacent partition racks are arranged in a V-shaped structure to divide the placing table into a plurality of spaces for placing samples, and each of the partition racks is provided with a accommodating channel.

[0006] It also includes a cover plate that can be covered on the surface of the sample, and the partition frame is symmetrically distributed on both sides of the cover plate. Both ends of the cover plate are provided with extension strips that can slide synchronously with the cover plate. The accommodating channel can accommodate the sliding of the extension strip. The surface of the extension strip is provided with alignment holes, and the partition frame is provided with a locking structure that can limit the sliding of the extension strip.

[0007] Furthermore, the locking structure includes a limiting rod which can be vertically inserted into the positioning hole, and a rotatable guide sleeve is provided on the limiting rod. The limiting rod can be located inside the guide sleeve and move until it is disengaged from the positioning hole.

[0008] Furthermore, a limiting sleeve is provided on the guide sleeve, a gasket 1 is provided on the surface of the limiting rod, a gasket 2 is provided on the inner side of the limiting sleeve, the gasket 1 and the gasket 2 are connected by a pressure spring, and the gasket 1, the gasket 2 and the pressure spring are coaxially distributed with the limiting rod.

[0009] Furthermore, the partition frame is provided with limiting plates symmetrically arranged on both sides of the guide sleeve, and the limiting plates are connected to the guide sleeve through a rotating shaft. When the guide sleeve is located on the inner side of the limiting plate and rotates, the limit rod, gasket one, gasket two and pressure spring rotate synchronously.

[0010] Furthermore, the surface of the cover plate is provided with an alignment hole for exposing the sample.

[0011] Furthermore, the edge of the placing table protrudes outward to form an alignment ear, and a limiting bracket capable of accommodating the alignment ear to be snapped into is provided on the outer side of the placing table, and a base is provided on the limiting bracket.

[0012] In summary, the technical effects and advantages of the utility model are:

[0013] In the process of testing samples, the cover plate can be in contact with or away from the sample according to the actual testing requirements, and there is no need to repeatedly remove and install the cover plate on the placement table, thereby improving the sampling efficiency and being suitable for different samples. The time required for manual installation and removal of the cover plate can be reduced. When the cover plate is away from the sample, the stability of the cover plate can be maintained, which is conducive to the continuous sampling and testing working state of the entire sampling system. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without paying any creative work.

[0015] Figure 1 It is a schematic diagram of the three-dimensional structure of the utility model.

[0016] Figure 2 This is a schematic diagram of the structure of the utility model after the cover plate is moved.

[0017] Figure 3 It is a schematic diagram of the structure of the utility model after partial cutaway.

[0018] Figure 4 For this utility model Figure 3 Enlarged structural diagram at A in the middle.

[0019] In the figure: 1. placing table; 11. alignment ear; 2. partition frame; 21. accommodating channel; 3. cover plate; 31. alignment hole; 32. extension strip; 321. positioning hole; 4. limiting rod; 5. guide sleeve; 51. limiting plate; 52. limiting sleeve; 6. gasket 1; 7. gasket 2; 8. pressure spring; 9. limiting support; 10. base. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0021] Example: Reference Figure 1-4 An X-ray photoelectron spectrometer sampling system shown includes a placement table 1, on which a plurality of equally spaced partition racks 2 are provided along a circular trajectory, and two adjacent partition racks 2 are arranged in a V-shaped structure to divide the placement table 1 into a plurality of spaces for placing samples, and each partition rack 2 is provided with a accommodating channel 21.

[0022] It also includes a cover plate 3 that can cover the surface of the sample, and the partition frame 2 is symmetrically distributed on both sides of the cover plate 3. Both ends of the cover plate 3 are provided with extension bars 32 that can slide synchronously therewith. During the process of testing the sample, if the cover plate 3 needs to be removed, the accommodating channel 21 can accommodate the sliding of the extension bar 32 until the cover plate 3 is away from the sample.

[0023] The surface of the extension bar 32 is provided with alignment holes 31, and the partition frame 2 is provided with a locking structure that can limit the sliding of the extension bar 32. When the cover plate 3 contacts the sample with poor conductivity, the locking structure can limit the movement of the extension bar 32 and maintain the stability of the extension bar 32. When the cover plate 3 is away from the sample, since the extension bar 32 is located on the inner side of the accommodating channel 21, the partition frame 2 can maintain the stability of the cover plate 3. In the process of continuous sample placement and detection operation of the injection system, there is no need to repeatedly remove and install the cover plate 3 on the placement table 1, which improves the injection efficiency and is suitable for different samples.

[0024] like Figure 2 , Figure 4 As shown, the locking structure includes a limiting rod 4 that can be vertically inserted into the positioning hole 321, and a rotatable guide sleeve 5 is provided on the limiting rod 4. If it is necessary to release the connection between the cover plate 3 and the sample, it is necessary to control the limiting rod 4 to move inside the guide sleeve 5 until it is separated from the positioning hole 321, so that the locking state of the positioning hole 321 can be released, leaving space for the cover plate 3 and the extension strip 32 to move.

[0025] like Figure 3 , Figure 4As shown, the guide sleeve 5 is provided with a limiting sleeve 52, the surface of the limiting rod 4 is provided with a gasket 1 6, the inner side of the limiting sleeve 52 is provided with a gasket 2 7, and the gasket 1 6 and the gasket 2 7 are connected by a pressure spring 8, which can maintain the tightness of the connection between the limiting rod 4 and the positioning hole 321, and can prevent the limiting rod 4 from shaking during the detection operation of the sample. In order to save installation space, the gasket 1 6, the gasket 2 7, the pressure spring 8 and the limiting rod 4 are coaxially distributed.

[0026] like Figure 3 , Figure 4 As shown, the partition frame 2 is provided with limiting plates 51 symmetrically arranged on both sides of the guide sleeve 5, and the limiting plates 51 are connected to the guide sleeve 5 through a rotating shaft. When the guide sleeve 5 is located inside the limiting plates 51 and rotates, the limiting rod 4, the gasket 1 6, the gasket 2 7 and the pressure spring 8 rotate synchronously. Until the limiting rod 4 and the positioning hole 321 are offset, the two are in a non-coaxial distribution state, so as to avoid the limiting rod 4 hindering the movement of the cover plate 3, and facilitate the staff to move the cover plate 3 and the extension strip 32 to the specified position along the accommodating channel 21.

[0027] During operation, the time required for manually installing and removing the cover plate 3 can be reduced, and the cover plate 3 can be in contact with or away from the sample according to actual detection requirements, without repeatedly installing and removing the cover plate 3 from the placement table 1. When the cover plate 3 is away from the sample, since the extension bars 32 are all located on the inner side of the accommodating channel 21, the partition frame 2 can suppress the cover plate 3 to prevent the cover plate 3 from deflecting or shaking, and maintain the stability of the cover plate 3, which is conducive to the continuous sampling and detection working state of the entire sampling system.

[0028] like Figure 3 As shown, in order to smoothly implement the detection operation on the sample, the surface of the cover plate 3 is provided with an alignment hole 31 for exposing the sample.

[0029] like Figure 2 As shown, the edge of the placement table 1 protrudes outward to form an alignment ear 11, and the outer side of the placement table 1 is provided with a limit support 9 for accommodating the alignment ear 11. The connection between the alignment ear 11 and the limit support 9 can maintain the tightness and accuracy of the connection between the placement table 1 and the limit support 9. The limit support 9 is provided with a base 10, which is usually installed inside the X-ray photoelectron spectrometer to maintain the stability of the entire sampling system.

[0030] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. An X-ray photoelectron spectrometer sampling system, characterized in that: The device comprises a placing table (1), wherein a plurality of equally spaced partition frames (2) are arranged on the placing table (1) along a circular track, and two adjacent partition frames (2) are arranged in a V-shaped structure to divide the placing table (1) into a plurality of spaces for placing samples, and each of the partition frames (2) is provided with a containing channel (21); It also includes a cover plate (3) that can be covered on the surface of the sample, the partition frame (2) is symmetrically distributed on both sides of the cover plate (3), both ends of the cover plate (3) are provided with extension strips (32) that can slide synchronously therewith, the accommodating channel (21) can accommodate the sliding of the extension strip (32), the surface of the extension strip (32) is provided with a positioning hole (31), and the partition frame (2) is provided with a locking structure that can limit the sliding of the extension strip (32).

2. The X-ray photoelectron spectrometer sampling system according to claim 1, characterized in that: The locking structure comprises a limiting rod (4) which can be vertically inserted into the positioning hole (321), and a rotatable guide sleeve (5) is provided on the limiting rod (4). The limiting rod (4) can be located inside the guide sleeve (5) and move until it is disengaged from the positioning hole (321).

3. The X-ray photoelectron spectrometer sample introduction system according to claim 2, characterized in that: The guide sleeve (5) is provided with a limiting sleeve (52), the surface of the limiting rod (4) is provided with a gasket 1 (6), the inner side of the limiting sleeve (52) is provided with a gasket 2 (7), the gasket 1 (6) and the gasket 2 (7) are connected by a pressure spring (8), and the gasket 1 (6), the gasket 2 (7), the pressure spring (8) and the limiting rod (4) are coaxially distributed.

4. The X-ray photoelectron spectrometer sampling system according to claim 3, characterized in that: The partition frame (2) is provided with limiting plates (51) symmetrically arranged on both sides of the guide sleeve (5), and the limiting plates (51) are connected to the guide sleeve (5) via a rotating shaft. When the guide sleeve (5) is located inside the limiting plates (51) and rotates, the limiting rod (4), gasket 1 (6), gasket 2 (7) and pressure spring (8) rotate synchronously.

5. The X-ray photoelectron spectrometer sample introduction system according to claim 1, characterized in that: The surface of the cover plate (3) is provided with an alignment hole (31) for exposing the sample.

6. The X-ray photoelectron spectrometer sample introduction system according to claim 1, characterized in that: The edge of the placing platform (1) protrudes outward to form an alignment ear (11), and a limiting bracket (9) capable of accommodating the alignment ear (11) to be snapped in is provided on the outer side of the placing platform (1), and a base (10) is provided on the limiting bracket (9).

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