Laser aging test channel plate

Abstract

The utility model discloses a laser aging test channel board, comprising an MCU circuit, an LD driving circuit, an MPD detection circuit, an EA bias circuit, a TEC driving circuit, an RT bias circuit, a 5V-to-3. 3V power supply circuit, a power supply management circuit, an electronic switch circuit, a channel board output socket, and a channel board input socket used for accessing a power supply and an upper computer signal. According to the utility model, the MCU circuit, the LD driving circuit, the MPD detection circuit, the EA bias circuit, the TEC driving circuit, the RT bias circuit, the 5V-to-3. 3V power supply circuit, the power supply management circuit, the electronic switch circuit and the like are integrated, so that the channel board has higher integration level and expandability, and can dynamically adjust output aging data in real time according to acquired data; therefore, the purpose of improving the stability and the reliability is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of laser testing, in particular to a laser aging test channel board, which is especially suitable for aging test of lasers in optical modules. Background Art

[0002] Laser is an extremely important component in optical module. In the production process of laser, it is usually necessary to perform aging test on the laser. The specific process of laser aging test is: in a high temperature environment, through power-on test, a stable controlled current is provided to the laser, and the single-board drive circuit communicates with the computer host through IIC communication to monitor and control the temperature of the laser in real time. Through aging test, reliability screening can be achieved, and early defective products can be eliminated, thereby achieving the purpose of improving the reliability and service life of laser products.

[0003] Existing aging test devices usually use external LD ​​current and TEC power supplies connected to each laser to achieve aging, but such aging test devices have technical problems such as poor system integration, poor scalability, inflexible configuration of aging parameters, and inability to dynamically adjust the output aging data in real time. In addition, due to the low degree of automation control, it is difficult to achieve real-time monitoring and recording of aging data, which is not conducive to analyzing abnormal aging data of lasers. Utility Model Content

[0004] The purpose of the utility model is to overcome the above-mentioned technical problems existing in the prior art, and provide a laser aging test channel board. The utility model integrates an MCU circuit, an LD drive circuit, an MPD detection circuit, an EA bias circuit, a TEC drive circuit, an RT bias circuit, a 5V to 3.3V power supply circuit, a power management circuit, an electronic switch circuit, etc. into one, so that the channel board has higher integration and scalability, and can dynamically adjust the output aging data in real time according to the collected data, thereby achieving the purpose of improving stability and reliability.

[0005] In order to achieve the above purpose, the technical solution adopted by the utility model is as follows:

[0006] A laser aging test channel board, comprising an MCU circuit, an LD drive circuit, an MPD detection circuit, an EA bias circuit, a TEC drive circuit, an RT bias circuit, a 5V to 3.3V power supply circuit, a power management circuit, an electronic switch circuit, a channel board output socket, and a channel board input socket for connecting power and host computer signals; wherein,

[0007] The signal output end of the channel board input socket is connected to the MCU circuit through an electronic switch circuit;

[0008] The power output end of the channel board input socket is respectively connected to a 5V to 3.3V power supply circuit and a power management circuit, the 5V to 3.3V power supply circuit is respectively connected to an MCU circuit, an electronic switch circuit and a power management circuit, the power management circuit, the MCU circuit and the channel board output socket are respectively connected to an LD drive circuit, an MPD detection circuit, an EA bias circuit, a TEC drive circuit and an RT bias circuit;

[0009] The MCU circuit is used to receive aging parameters through the electronic switch circuit and the channel board input socket, and is used to control the LD drive circuit, the TEC drive circuit and the EA bias circuit to output the LD current, the TEC voltage and the EA bias voltage respectively according to the aging parameters, and is used to collect the LD current, the TEC voltage and the EA bias voltage respectively through the LD drive circuit, the TEC drive circuit and the EA bias circuit, and is used to collect the TO temperature and the MPD current of the laser to be tested for aging respectively through the RT bias circuit and the MPD detection circuit, and is used to dynamically adjust the output LD current, the TEC voltage and the EA bias voltage in real time according to the collected data.

[0010] The LD driving circuit includes an LD driving amplifier, an LD current collection amplifier and an NPN-type triode. The non-inverting input terminal of the LD driving amplifier circuit is connected to the DAC1 pin of the MCU circuit. The NPN-type triode includes a base, a collector and an emitter. The base is connected to the voltage output terminal of the LD driving amplifier. The collector, the power supply terminal of the LD driving amplifier and the power supply terminal of the LD current collection amplifier are all connected to the power management circuit. The emitter is respectively connected to the inverting input terminal of the LD driving amplifier circuit, the non-inverting input terminal of the LD current collection amplifier and the channel board output socket. The current output terminal of the LD current collection amplifier is respectively connected to the inverting input terminal of the LD current collection amplifier and the ADC2 pin of the MCU circuit.

[0011] A fifteenth resistor and a fourteenth grounding capacitor are sequentially arranged between the voltage output terminal and the base of the LD driving amplifier.

[0012] An eighteenth resistor and a nineteenth resistor are arranged in sequence between the emitter and the in-phase input terminal of the LD current collection amplifier, the connection point between the emitter and the inverting input terminal of the LD driving amplifier circuit is located between the emitter and the eighteenth resistor, and the connection point between the emitter and the channel board output socket is located between the emitter and the nineteenth resistor.

[0013] The MPD detection circuit includes a mirror current source and an MPD current amplifier. The mirror current source includes a mirror current input terminal, a mirror current output terminal, a first mirror power input terminal, a second mirror power input terminal, and a proportional mirror current output terminal. The mirror current input terminal and the mirror current output terminal are both connected to the channel board output socket, the first mirror power input terminal and the second mirror power input terminal are both connected to the EA bias circuit, the proportional mirror current output terminal is connected to the inverting input terminal of the MPD current amplifier, the output terminal of the MPD current amplifier is respectively connected to the inverting input terminal of the MPD current amplifier and the ADC0 pin of the MCU circuit, and the power supply terminal of the MPD current amplifier is connected to the power management circuit.

[0014] A fourteenth resistor is provided between the output end and the inverting input end of the MPD current amplifier, and an eleventh resistor and a twelfth grounding capacitor are provided between the output end of the MPD current amplifier and the ADC0 pin of the MCU circuit.

[0015] The EA bias circuit includes an EA_DC-DC chip, which includes a power supply end, an enable end, a control end, a first voltage output end and a second voltage output end. The power supply end and the enable end are both connected to the power management circuit, the control end is connected to the DAC2 pin of the MCU circuit, the first voltage output end is used to provide a bias power supply for the MPD detection circuit, and the second voltage output end is connected to the channel board output socket for outputting the EA bias voltage.

[0016] The TEC driving circuit includes a TEC_DC-DC chip, the power supply end of the TEC_DC-DC chip is connected to the power management circuit, the voltage output negative end of the TEC_DC-DC chip is connected to the channel board output socket, the voltage output positive end of the TEC_DC-DC chip is respectively connected to the channel board output socket and the ADC3 pin of the MCU circuit, and the control signal input end of the TEC_DC-DC chip is connected to the DAC0 pin of the MCU circuit.

[0017] The RT bias circuit includes an RT bias amplifier, a power supply end of the RT bias amplifier is connected to a power management circuit, a non-inverting input end of the RT bias amplifier is connected to a VREF pin of an MCU circuit, and a voltage output end of the RT bias amplifier is respectively connected to an inverting input end of the RT bias amplifier, an ADC1 pin of the MCU circuit, and an output socket of a channel board.

[0018] The advantages of adopting the utility model are:

[0019] 1. The input end of the channel board of the utility model can be used in conjunction with a main circuit board (control main board) with power management function and communication function with the host computer, and its output end can be used in conjunction with an aging board for inserting lasers through a cable. Its advantages are as follows:

[0020] On the one hand, the channel board integrates the MCU circuit, LD drive circuit, MPD detection circuit, EA bias circuit, TEC drive circuit, RT bias circuit, 5V to 3.3V power supply circuit, power management circuit, electronic switch circuit, etc. on the same circuit board as a whole, which reduces the number of peripheral circuit components, has a higher degree of integration, effectively reduces the circuit volume and reduces the cost.

[0021] On the other hand, the channel board can support the aging test of multiple lasers at the same time. In actual use, the number of channel boards can be increased or decreased to correspond to the lasers that need aging tests, which can meet different aging needs and is more practical.

[0022] On the other hand, the channel board can also dynamically adjust the output aging data in real time according to the collected data, thereby achieving the purpose of improving stability and reliability.

[0023] On the other hand, the channel board can flexibly configure aging parameters according to needs during actual use, and can realize real-time monitoring and recording of aging data, which is not only conducive to the subsequent analysis of abnormal aging data, but also conducive to improving the degree of automation control of aging tests.

[0024] The aging parameters cannot be flexibly configured, and the output aging data cannot be adjusted dynamically in real time. In addition, due to the low degree of automation control, it is difficult to achieve real-time monitoring and recording of aging data, which is not conducive to analyzing abnormal aging data of lasers.

[0025] 2. The utility model adopts a LD drive circuit, MPD detection circuit, EA bias circuit, TEC drive circuit and RT bias circuit with a specific circuit structure, wherein the LD drive circuit adopts an NPN-type transistor, which is conducive to providing a wide range of LD drive currents. The MPD detection circuit adopts a dedicated current detection amplifier with high precision and accurate measurement. The TEC drive circuit adopts a monolithic integrated DC-DC chip, which has the advantages of stable output TEC voltage and high TO temperature control accuracy. The EA bias circuit adopts the form of MCU plus amplifier, which is conducive to providing a wide range of EA bias voltage output. After integrating it as a whole on the same circuit board, the channel board has the advantages of high integration, small size, better stability and higher reliability.

[0026] 3. The utility model sequentially arranges a fifteenth resistor and a fourteenth grounding capacitor between the voltage output terminal and the base of the LD drive amplifier. It utilizes the RC low-pass filter characteristic to filter out high-frequency clutter components in the output voltage of the LD drive amplifier, thereby obtaining a more stable and accurate LD drive control signal, which is beneficial to the stability and accurate control of the LD drive current.

[0027] 4. The utility model has an eighteenth resistor and a nineteenth resistor arranged in sequence between the emitter and the in-phase input terminal of the LD current acquisition amplifier. The eighteenth resistor has the function of limiting the LD current from exceeding the maximum current that may damage the LD. The nineteenth resistor can be used for potential isolation, which can reduce the mutual interference between the LD current output by the emitter of the NPN transistor and the in-phase input terminal of the LD current acquisition amplifier.

[0028] 5. The utility model provides a fourteenth resistor between the output terminal and the inverting input terminal of the MPD current amplifier, and provides an eleventh resistor and a twelfth grounding capacitor between the output terminal of the MPD current amplifier and the ADC0 pin of the MCU circuit. The fourteenth resistor is used to provide negative feedback for the MPD current amplifier to stabilize the working state of the amplifier. The eleventh resistor and the twelfth grounding capacitor can form a low-pass filter circuit, which is used to filter out high-frequency clutter components in the output signal of the MPD current amplifier, which is conducive to stable and accurate current acquisition. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 It is a schematic diagram of the circuit structure of the utility model;

[0030] Figure 2 It is the overall circuit block diagram when the utility model is used. DETAILED DESCRIPTION

[0031] The utility model provides a laser aging test channel board, the input end of which can be used in conjunction with a main circuit board (control main board) with power management function and communication function with a host computer, and the output end can be used in conjunction with an aging board for plug-in lasers through a cable connection. Its function is to receive and store aging parameters and related instructions from the host computer, apply LD current, TEC voltage, and EA bias voltage to the laser to be tested for aging according to the aging parameters, collect the LD current, TEC voltage, EA bias voltage, TO temperature, and MPD current of the laser to be tested for aging, and dynamically adjust the output LD current, TEC voltage, and EA bias voltage in real time according to the collected data.

[0032] like Figure 1As shown, the channel board includes an MCU circuit, an LD drive circuit, an MPD detection circuit, an EA bias circuit, a TEC drive circuit, an RT bias circuit, a 5V to 3.3V power supply circuit, a power management circuit, an electronic switch circuit, a channel board output socket, and a channel board input socket for accessing power and host computer signals. Among them, the channel board input socket can be connected to the main circuit board (control main board) known in the prior art, and it can access the power supply and connect to the host computer through the main circuit board (control main board). The channel board output socket can be connected to the aging board for inserting the laser through a cable. After the connection, the MCU circuit can control the LD drive circuit, the MPD detection circuit, the EA bias circuit, the TEC drive circuit, and the RT bias circuit according to the instructions of the host computer to perform aging tests on the laser and collect relevant data.

[0033] Specifically, the channel board input socket includes a power input terminal, a power output terminal, a signal input terminal and a signal output terminal. The power input terminal and the signal input terminal are connected to the main circuit board (control main board) to receive SCL signals, SDA signals and power input. The power output terminal is connected to the 5V to 3.3V power supply circuit and the power management circuit respectively. The 5V to 3.3V power supply circuit is connected to the MCU circuit, the electronic switch circuit and the power management circuit respectively. The power management circuit is connected to the LD drive circuit, the MPD detection circuit, the EA bias circuit, the TEC drive circuit and the RT bias circuit respectively. The signal output terminal is connected to the MCU circuit through the electronic switch circuit; in addition, the MCU circuit is connected to the LD drive circuit, the MPD detection circuit, the EA bias circuit, the TEC drive circuit and the RT bias circuit respectively; the channel board output socket is connected to the LD drive circuit, the MPD detection circuit, the EA bias circuit, the TEC drive circuit and the RT bias circuit respectively.

[0034] The functions of the MCU circuit are: for receiving aging parameters from the host computer through the electronic switch circuit and the channel board input socket, for controlling the LD drive circuit, TEC drive circuit and EA bias circuit according to the aging parameters to output LD current, TEC voltage and EA bias voltage to the laser installed on the aging board respectively, for collecting and storing LD current, TEC voltage and EA bias voltage respectively through the LD drive circuit, TEC drive circuit and EA bias circuit, for collecting and storing TO temperature and MPD current of the laser to be tested for aging respectively through the RT bias circuit and MPD detection circuit, and for dynamically adjusting the output LD current, TEC voltage and EA bias voltage in real time according to the collected data.

[0035] It should be noted that the channel board in this solution can be specifically composed of multiple (such as 10) channel circuits with the same circuit structure and electronic switch circuits, channel board input sockets, and channel board output sockets that are common to each channel circuit. Each channel circuit includes an MCU circuit, an LD drive circuit, an MPD detection circuit, an EA bias circuit, a TEC drive circuit, an RT bias circuit, a 5V to 3.3V power supply circuit, and a power management circuit. Each channel circuit works independently, and the host computer can establish IIC communication with the MCU circuit in each channel circuit to realize the aging parameter setting and aging data reading functions. In addition, the number of channel circuits is the same as the number of lasers that can be aged tested. When the channel circuit is set to 10 channels, the channel board can support aging tests of 10 lasers. In this solution, Figure 1 The circuit structure diagram of a channel board including 10 channel circuits is shown, which gives the detailed circuit structure of channel circuit 1, while channel circuits 2-10 are omitted because of the same circuit structure and function.

[0036] Specifically, Figure 1 As shown, the specific structures and connection relationships of each circuit in the channel board are:

[0037] The LD driving circuit includes an LD driving amplifier U19, an LD current collection amplifier U21 and an NPN transistor Q3. The non-inverting input terminal 3 pin of the LD driving amplifier circuit U19 is connected to the DAC1 pin of the MCU circuit U14. The NPN transistor Q3 includes a base, a collector and an emitter. The base is connected to the voltage output terminal 1 pin of the LD driving amplifier U19. The collector, the power supply terminal 5 pin of the LD driving amplifier U19 and the power supply terminal 5 pin of the LD current collection amplifier U21 are all connected to the PMOS tubes Q1 and Q2 in the power management circuit. The emitter is respectively connected to the inverting input terminal 4 pin of the LD driving amplifier circuit U19, the non-inverting input terminal 3 pin of the LD current collection amplifier U21 and the channel board output socket J6. The current output terminal 1 pin of the LD current collection amplifier U21 is respectively connected to the inverting input terminal 4 pin of the LD current collection amplifier U21 and the ADC2 pin of the MCU circuit U14. In actual application, the LD driving circuit can apply LD current to the laser mounted on the aging board through the emitter.

[0038] According to a preferred embodiment of the present utility model, in order to filter out high-frequency chaotic components in the output voltage of the LD driver amplifier so as to obtain a more stable and accurate LD drive control signal, this solution sequentially provides a fifteenth resistor R15 and a fourteenth grounding capacitor C14 between the voltage output terminal 1 pin and the base of the LD driver amplifier U19.

[0039] According to a preferred embodiment of the utility model, in order to prevent the LD current from exceeding the maximum current that may damage the LD, and to reduce the mutual interference between the LD current output by the emitter of the NPN transistor Q3 and the in-phase input terminal of the LD current acquisition amplifier U21, this solution sequentially provides an eighteenth resistor R18 and a nineteenth resistor R19 between the emitter and the in-phase input terminal 3 pin of the LD current acquisition amplifier U21, and the connection point between the emitter and the inverting input terminal 4 pin of the LD drive amplifier circuit U19 is located between the emitter and the eighteenth resistor R18, and the connection point between the emitter and the channel board output socket J6 is located between the emitter and the nineteenth resistor R19.

[0040] The MPD detection circuit includes a mirror current source U18 and an MPD current amplifier U20. The mirror current source U18 includes a mirror current input terminal pin 5, a mirror current output terminal pin 3, a mirror power supply first input terminal pin 1, a mirror power supply second input terminal pin 4, and a proportional mirror current output terminal pin 6. The mirror current input terminal pin 5 and the mirror current output terminal pin 3 are both connected to the channel board output socket J6, the mirror power supply first input terminal pin 1 and the mirror power supply second input terminal pin 4 are both connected to the EA bias circuit, the proportional mirror current output terminal pin 6 is connected to the inverting input terminal pin 4 of the MPD current amplifier U20, the output terminal pin 1 of the MPD current amplifier U20 is respectively connected to the inverting input terminal pin 4 of the MPD current amplifier U20 and the ADC0 pin of the MCU circuit U14, and the power supply terminal pin 5 of the MPD current amplifier U20 is connected to the power management circuit.

[0041] According to the preferred embodiment of the utility model, in order to provide negative feedback for the MPD current amplifier U20 to stabilize the working state of the amplifier, the present solution provides a fourteenth resistor R14 between the output terminal 1 pin and the inverting input terminal 4 pin of the MPD current amplifier U20. In order to filter out the high-frequency clutter in the output signal of the MPD current amplifier U20 so as to facilitate stable and accurate current acquisition, the present solution provides an eleventh resistor R11 and a twelfth grounding capacitor C12 between the output terminal 1 pin of the MPD current amplifier U20 and the ADC0 pin of the MCU circuit U14.

[0042] It should be noted that during the actual aging test, the mirror current input terminal 5 pin and the mirror current output terminal 3 pin of the mirror current source U18 are connected to the MPD pin of the laser to be tested for aging through the channel board output socket J6. On the one hand, it provides bias current for the PD of the laser, and on the other hand, it utilizes the proportional mirror current output terminal 6 pin of the mirror current source U18 to output the mirror current, and converts it into a voltage of corresponding magnitude through the MPD current amplifier U20, so as to collect the MPD current for the ADC0 pin of the MCU circuit U14.

[0043] The EA bias circuit includes an EA_DC-DC chip U17. The EA_DC-DC chip U17 includes a power supply terminal IN, an enable terminal pin 2, a control terminal pin 3, a voltage output first terminal pin 7 and a voltage output second terminal pin 5. The power supply terminal IN and the enable terminal pin 2 are both connected to the power management circuit, the control terminal pin 3 is connected to the DAC2 pin of the MCU circuit U14, the voltage output first terminal pin 7 is connected to the mirror power supply first input terminal pin 1 and the mirror power supply second input terminal pin 4 in the MPD detection circuit, and is used to provide a stable bias power supply for the MPD detection circuit. The voltage output second terminal pin 6 is connected to the channel board output socket J6 for outputting the EA bias voltage.

[0044] The TEC driving circuit includes a TEC_DC-DC chip U15. The power supply pins 3, 2, 7, and 9 of the TEC_DC-DC chip U15 are connected to the power management circuit. The voltage output negative pins 4 and 6 of the TEC_DC-DC chip U15 are connected to the channel board output socket J6. The voltage output positive pin 10 of the TEC_DC-DC chip U15 is respectively connected to the channel board output socket and the ADC3 pin of the MCU circuit U14. The control signal input pin 1 of the TEC_DC-DC chip U15 is connected to the DAC0 pin of the MCU circuit U14.

[0045] The RT bias circuit includes an RT bias amplifier U12, wherein the power supply terminal pin 5 of the RT bias amplifier U12 is connected to the power management circuit, the non-inverting input terminal pin 3 of the RT bias amplifier U12 is connected to the VREF pin of the MCU circuit, and the voltage output terminal pin 1 of the RT bias amplifier U12 is respectively connected to the inverting input terminal pin 4 of the RT bias amplifier U12, the ADC1 pin of the MCU circuit U14 and the channel board output socket J6.

[0046] Further, such as Figure 1 As shown, the signal connection and working principle of the channel board are:

[0047] The 5V at pins 29-39 of the input socket J5 of the channel board is fed to the input VIN pin of the 5V to 3.3V power supply circuit U16, and the other way is fed to the input pin 2 of the PMOS tube Q1 in the power management circuit. The 3.3V output from pins 6 / 10 of the 5V to 3.3V power supply circuit U16 is fed to pin 16 of the MCU circuit U14, pin 24 of the electronic switch circuit U11, and pin 24 of U13, and the other way is fed to the input pin 2 of the PMOS tube Q2 in the power management circuit. The CH_3.3V at the output pin 3 of the PMOS tube Q2 in the power management circuit provides working power for pin 5 of the RT bias circuit U12, pin 3 of the TEC drive circuit U15, and pin IN of the EA bias circuit U17. On the other hand, the CH_5V at the output terminal 3 of the PMOS tube Q1 in the power management circuit provides working power for the 5th pin of the LD driving circuit U19, the 5th pin of the LD current collection amplifier U21, and the 6th pin of the MPD current amplifier U20. In addition, the MCU circuit and the electronic switch circuit use 3.3V as the working power supply and are not controlled by the power management circuit.

[0048] The SDA signal output from pin 3 of the channel board input socket J5 is given to pin 1 of the electronic switch circuit U11, the SCL signal output from pin 1 of the channel board input socket J5 is given to pin 1 of the electronic switch circuit U13, the IO control signals output from pins 5, 7, 9, 11, and 13 of the channel board input socket J5 are given to pins 10, 11, 13, 14, and 15 of the electronic switch circuits U11 and U13, and the SDA-1 signal output from pin 9 of the electronic switch circuit U11 and the SCL-1 signal from pin 9 of U13 are connected to pins 32 and 33 of the MCU circuit U14, respectively, for communication with the host computer. The MCU circuit U14 can realize parameter setting and aging data acquisition functions using DAC and ADC.

[0049] After the power is turned on, the MCU circuit U14 waits for the host computer's instructions and controls the PMOS tubes Q1 and Q2 in the power management circuit to turn off the CH_3.3V and CH_5V power supplies. At this time, the channel board is in standby mode, waiting for the laser to be inserted for aging. When the laser is plugged in and starts to age (the power on and off time of each channel circuit is controlled by the MCU circuit U14), the MCU circuit 14 outputs an analog voltage to the 3rd pin of the LD drive circuit U19 through the 5th pin DAC1, and the base 1st pin output of the LD drive circuit U19 controls the conduction degree of the NPN transistor Q3 to adjust the LD current. The emitter 2nd pin of the NPN transistor Q3 is connected to the 4th pin of the LD drive circuit U19 to achieve negative feedback. The 40th pin ADC2 of the MCU circuit U14 collects the output voltage of the 1st pin of the LD current acquisition amplifier U21 to obtain the voltage related to the LD current. The MCU circuit U14 controls the DAC to adjust the output voltage to achieve the stability of the LD current. Since the LD driving circuit adopts an independent NPN transistor Q3, the LD current can be adjusted within a larger range, and has the advantages of being more stable and reliable.

[0050] DAC0 at pin 4 of MCU circuit U14 outputs an analog voltage to pin 1 of TEC driving circuit U15, controlling pins 4 and 10 of TEC driving circuit U15 to output a suitable TEC voltage. ADC3 at pin 1 of MCU circuit U14 collects the output voltage at pin 10 of TEC driving circuit U15 to obtain the TEC voltage. The DAC is controlled by MCU circuit U14 to adjust the output voltage to achieve TEC voltage stability.

[0051] The 6-pin DAC2 of the MCU circuit U14 outputs an analog voltage to the 3-pin of the EA bias circuit U17, controlling the 5-pin of the EA bias circuit U17 to output a suitable EA voltage. The 3-pin ADC4 of the MCU circuit U14 collects the output voltage of the 5-pin of the EA bias circuit U17 to obtain the EA voltage. The MCU circuit U14 controls the DAC to adjust the output voltage to achieve stability of the EA voltage.

[0052] In addition, pins 3 and 5 of the mirror current source U18 are connected to the MPD pin of the laser mounted on the aging board through the channel board output socket, and a mirror current proportional to the current flowing through the MPD is output from pin 6 of the mirror current source U18. After being converted into a voltage by the MPD current amplifier U20, it is output from pin 1 of the MPD current amplifier U20. ADC0 at pin 38 of the MCU circuit U14 collects the MPD current output from pin 1 of the MPD current amplifier U20 to realize the MPD current detection function.

[0053] Pin 1 of the RT bias amplifier U12 is connected to the RT pin of the laser mounted on the aging board through the channel board output socket. The RT bias amplifier U12 provides a bias voltage for the RT pin of the laser, and the 39-pin ADC1 of the MCU circuit collects the RT voltage to realize the TO temperature detection function.

[0054] In general, the utility model adopts a channel board including an MCU circuit, an LD driving circuit, an MPD detection circuit, an EA bias circuit, a TEC driving circuit, an RT bias circuit, a 5V to 3.3V power supply circuit, a power management circuit, an electronic switch circuit, a channel board input socket and a channel board output socket. Therefore, the utility model has the advantages of being able to provide a wide range of LD driving current, a wide range of EA bias voltage output, high precision, accurate measurement, stable output TEC voltage, high TO temperature control precision, few peripheral circuit components, small circuit size, low circuit cost, high stability and reliability.

[0055] It should be noted that each circuit in the present invention may also involve related conventional components such as resistors and capacitors, which can be specifically arranged accordingly according to the structure shown in the figure.

[0056] It should also be noted that the aging test of the lasers to be tested is usually performed in batches, so the number of channel boards and the number of aging boards are usually multiple. Figure 2 The circuit principle block diagram of the utility model combined with the main circuit board (control main board) and the aging board to form an aging test device is shown. The main circuit board (control main board) and the aging board can be implemented using existing conventional technologies or can be implemented using Figure 2 The structure shown. Figure 2 It can be seen that the aging test device is mainly composed of a main control board, 12 channel boards with the same circuit structure and function, and 4 aging boards with the same circuit structure and function. The connection relationship is: the 12 channel boards can be directly plugged into the main control board through sockets, and each aging board is connected to the channel board through a cable. The main control board and the channel board can be installed together in a chassis. Among them, each channel board can support aging tests of 10 lasers, each aging board can be plugged in 30 lasers, and each aging board is connected to three channel boards. After it is assembled, the function of powering on and aging 120 lasers at the same time can be realized.

[0057] The above description is only a specific implementation method of the present utility model. Any feature disclosed in this specification, unless otherwise stated, can be replaced by other equivalent or alternative features with similar purposes; all disclosed features, or all methods or steps in the process, except for mutually exclusive features and / or steps, can be combined in any way.

Claims

1. A laser aging test channel board, characterized in that: It includes MCU circuit, LD drive circuit, MPD detection circuit, EA bias circuit, TEC drive circuit, RT bias circuit, 5V to 3.3V power supply circuit, power management circuit, electronic switch circuit, channel board output socket, and channel board input socket for connecting power supply and host computer signal; among them, The signal output end of the channel board input socket is connected to the MCU circuit through an electronic switch circuit; The power output end of the channel board input socket is respectively connected to a 5V to 3.3V power supply circuit and a power management circuit, the 5V to 3.3V power supply circuit is respectively connected to an MCU circuit, an electronic switch circuit and a power management circuit, the power management circuit, the MCU circuit and the channel board output socket are respectively connected to an LD drive circuit, an MPD detection circuit, an EA bias circuit, a TEC drive circuit and an RT bias circuit; The MCU circuit is used to receive aging parameters through the electronic switch circuit and the channel board input socket, and is used to control the LD drive circuit, the TEC drive circuit and the EA bias circuit to output the LD current, the TEC voltage and the EA bias voltage respectively according to the aging parameters, and is used to collect the LD current, the TEC voltage and the EA bias voltage respectively through the LD drive circuit, the TEC drive circuit and the EA bias circuit, and is used to collect the TO temperature and the MPD current of the laser to be tested for aging respectively through the RT bias circuit and the MPD detection circuit, and is used to dynamically adjust the output LD current, the TEC voltage and the EA bias voltage in real time according to the collected data.

2. The laser aging test channel board according to claim 1, characterized in that: The LD driving circuit includes an LD driving amplifier, an LD current collection amplifier and an NPN-type triode. The non-inverting input terminal of the LD driving amplifier circuit is connected to the DAC1 pin of the MCU circuit. The NPN-type triode includes a base, a collector and an emitter. The base is connected to the voltage output terminal of the LD driving amplifier. The collector, the power supply terminal of the LD driving amplifier and the power supply terminal of the LD current collection amplifier are all connected to the power management circuit. The emitter is respectively connected to the inverting input terminal of the LD driving amplifier circuit, the non-inverting input terminal of the LD current collection amplifier and the channel board output socket. The current output terminal of the LD current collection amplifier is respectively connected to the inverting input terminal of the LD current collection amplifier and the ADC2 pin of the MCU circuit.

3. The laser aging test channel board according to claim 2, characterized in that: A fifteenth resistor and a fourteenth grounding capacitor are arranged in sequence between the voltage output terminal and the base of the LD driving amplifier.

4. The laser aging test channel board according to claim 2, characterized in that: An eighteenth resistor and a nineteenth resistor are arranged in sequence between the emitter and the in-phase input terminal of the LD current collection amplifier, the connection point between the emitter and the inverting input terminal of the LD driving amplifier circuit is located between the emitter and the eighteenth resistor, and the connection point between the emitter and the channel board output socket is located between the emitter and the nineteenth resistor.

5. The laser aging test channel board according to claim 1, characterized in that: The MPD detection circuit includes a mirror current source and an MPD current amplifier. The mirror current source includes a mirror current input terminal, a mirror current output terminal, a first mirror power input terminal, a second mirror power input terminal, and a proportional mirror current output terminal. The mirror current input terminal and the mirror current output terminal are both connected to the channel board output socket, the first mirror power input terminal and the second mirror power input terminal are both connected to the EA bias circuit, the proportional mirror current output terminal is connected to the inverting input terminal of the MPD current amplifier, the output terminal of the MPD current amplifier is respectively connected to the inverting input terminal of the MPD current amplifier and the ADC0 pin of the MCU circuit, and the power supply terminal of the MPD current amplifier is connected to the power management circuit.

6. The laser aging test channel board according to claim 5, characterized in that: A fourteenth resistor is provided between the output end and the inverting input end of the MPD current amplifier, and an eleventh resistor and a twelfth grounding capacitor are provided between the output end of the MPD current amplifier and the ADC0 pin of the MCU circuit.

7. A laser aging test channel board according to any one of claims 1 to 6, characterized in that: The EA bias circuit includes an EA_DC-DC chip, which includes a power supply end, an enable end, a control end, a first voltage output end and a second voltage output end. The power supply end and the enable end are both connected to the power management circuit, the control end is connected to the DAC2 pin of the MCU circuit, the first voltage output end is used to provide a bias power supply for the MPD detection circuit, and the second voltage output end is connected to the channel board output socket for outputting the EA bias voltage.

8. The laser aging test channel board according to claim 1, characterized in that: The TEC driving circuit includes a TEC_DC-DC chip, the power supply end of the TEC_DC-DC chip is connected to the power management circuit, the voltage output negative end of the TEC_DC-DC chip is connected to the channel board output socket, the voltage output positive end of the TEC_DC-DC chip is respectively connected to the channel board output socket and the ADC3 pin of the MCU circuit, and the control signal input end of the TEC_DC-DC chip is connected to the DAC0 pin of the MCU circuit.

9. The laser aging test channel board according to claim 1, characterized in that: The RT bias circuit includes an RT bias amplifier, a power supply end of the RT bias amplifier is connected to a power management circuit, a non-inverting input end of the RT bias amplifier is connected to a VREF pin of an MCU circuit, and a voltage output end of the RT bias amplifier is respectively connected to an inverting input end of the RT bias amplifier, an ADC1 pin of the MCU circuit, and an output socket of a channel board.

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