Probe module and detection device

Abstract

The utility model relates to a probe module and a detection device. The probe module comprises a first probe die, a second probe die, a first connecting piece, a first elastic piece, a first connecting module and a probe. The first needle die is movably connected to the second needle die through a first connecting piece, and the first needle die can move from a first position far away from the second needle die to a second position close to the second needle die; the first needle die is provided with a first needle hole, and the probe is connected to the second needle die through the first connecting module; when the first needle die is located at the first position, the probe does not protrude out of the surface, deviating from the second needle die, of the first needle die; when the first needle die is located at the second position, the probe protrudes out of the surface, deviating from the second needle die, of the first needle die from the first needle hole; the first elastic piece is connected between the first needle die and the second needle die and used for enabling the first needle die to be reset to the first position from the second position. In this way, the probe can be protected by the first probe die, the probe is prevented from being collided and damaged by foreign objects, and the probe can abut against the circuit board to be tested.

Description

Technical Field

[0001] The utility model belongs to the technical field of circuit board testing, and in particular relates to a probe module and a detection device. Background Art

[0002] FPC (FPC is the abbreviation of Flexible Printed Circuit, and its Chinese name is flexible printed circuit board) is an important component in electronic products. FPC has good bendability and can make maximum use of the space of electronic products.

[0003] After the FPC is bent, it is usually necessary to use a corresponding detection device to detect it to confirm whether the FPC is damaged due to the bending. The detection device usually includes a carrier, a drive module and a probe module. During the detection, the bent FPC is placed on the carrier, and then the drive module drives the probe module close to the carrier so that each probe of the probe module can contact the corresponding detection point of the FPC.

[0004] Normally, during the inspection process, after the FPC is placed on the carrier of the inspection device, its inspection point faces upward or downward, and the driving module can drive the probe module to move downward (when the inspection point faces upward) or upward (when the inspection point faces downward) so that the probe can contact the inspection point. However, in actual scenarios, after some FPCs are placed on the carrier, their inspection points face sideways, and in this case, the probe module needs to be driven to move horizontally so that the probe can contact the inspection point.

[0005] However, due to factors such as the dense arrangement of components in the detection device, the probe is easily damaged by collision with foreign objects when the probe module moves horizontally. Utility Model Content

[0006] The technical problem to be solved by the utility model is: to provide a probe module and a detection device in view of the problem that the probes of the existing probe module are easily damaged by collision.

[0007] In order to solve the above problems, on the one hand, the embodiment of the utility model provides a probe module, including a first needle mold, a second needle mold, a first connecting member, a first elastic member, a first connecting module and a probe; the first needle mold is movably connected to the second needle mold through the first connecting member, and the first needle mold can be moved from a first position away from the second needle mold to a second position close to the second needle mold; a sinking groove is provided on the surface of the first needle mold away from the second needle mold, and a first pinhole is provided on the first needle mold, the first pinhole is arranged on the bottom surface of the sinking groove, and penetrates to the surface of the first needle mold close to the second needle mold; the first connecting module is connected to the second needle mold, and the probe is connected to the first connecting module; when the first needle mold is located at the first position, the probe does not protrude from the surface of the first needle mold away from the second needle mold; when the first needle mold is located at the second position, the probe protrudes from the first pinhole to the surface of the first needle mold away from the second needle mold; the first elastic member is connected between the first needle mold and the second needle mold; when the first needle mold moves from the first position to the second position, it can apply force to the first elastic member, so that the first needle mold can be reset to the first position under the action of the first elastic member.

[0008] Optionally, a first groove is provided on the surface of the first needle mold close to the second needle mold, and the first connecting module is located in the first groove; and / or a second groove is provided on the surface of the second needle mold close to the first needle mold, and the first connecting module is located in the second groove.

[0009] Optionally, the probe module further includes a first circuit board, which is connected between the second needle mold and the first connection module; and one end of the probe close to the second needle mold is connected to the first circuit board.

[0010] Optionally, the probe module also includes a second circuit board and a connecting needle, the second circuit board is arranged on the side of the second needle mold away from the first needle mold; a second pinhole is provided on the second needle mold, and the second pinhole penetrates the second needle mold along the arrangement direction of the first needle mold and the second needle mold; the connecting needle passes through the second needle mold from the second pinhole, and the two ends of the connecting needle are electrically connected to the first circuit board and the second circuit board.

[0011] Optionally, the first connecting module includes a third pin mold and a sealing plate; the third pin mold is provided with a receiving groove, the bottom surface of the receiving groove is provided with a first through hole, and the sealing plate is provided with a second through hole; the sealing plate is connected to the third pin mold and closes the receiving groove to form an receiving cavity; the probe is installed in the receiving cavity, and along the axial direction of the probe, the probe has a first section, a second section and a third section arranged in sequence; the second section is located in the receiving cavity, and the two ends of the third section are respectively in contact with the third pin mold and the sealing plate; the first section passes through the receiving cavity from the first through hole, and can protrude from the surface of the first pin mold away from the second pin mold when the first pin mold is located at the second position; the third section passes through the receiving cavity from the second through hole so as to be electrically connected to the first circuit board.

[0012] Optionally, a first detection limit structure is provided on the second needle mold, and a second detection limit structure is provided on the first connection module, and the first detection limit structure and the second detection limit structure cooperate to limit the connection position of the first connection module on the second needle mold.

[0013] Optionally, the probe module also includes a support seat, a second connecting member and a second elastic member; the support seat is movably connected to the side of the second needle mold facing away from the first needle mold through the second connecting member, so that the second needle mold can approach or move away from the support seat; the second elastic member is connected between the second needle mold and the support seat; when the second needle mold approaches the support seat, force can be applied to the second elastic member to deform the second elastic member; when the first needle mold is subjected to force and approaches the second needle mold, force can be applied to the second needle mold to make the second needle mold approach the support seat.

[0014] Optionally, the second connecting member includes a connecting shaft and a stopper, and the stopper is connected to the connecting shaft; a first detection guide hole is provided on the support seat, and the connecting shaft passes through the support seat from the first detection guide hole and is connected to the second needle mold; the connecting shaft moves synchronously with the second needle mold, and when the second needle mold moves away from the support seat, the stopper can abut against the support seat.

[0015] In order to solve the above problems, on the other hand, an embodiment of the present invention provides a detection device, including any one of the probe modules described above.

[0016] In the probe module and detection device provided by the embodiment of the utility model, initially, the first needle mold is located at the first position, and the probe does not protrude to the surface of the first needle mold away from the second needle mold; when the probe module is driven by the corresponding driving module to approach the circuit board, the first needle mold can contact the carrier on which the circuit board is placed. At this time, when the driving module continues to drive the probe module to approach the circuit board, the first needle mold stops moving, and the second needle mold drives the probe to continue to approach the circuit board, so that the second needle mold and the first needle mold are relatively displaced, and finally the first needle mold is in the second position relative to the second needle mold, so that the probe extends from the first pinhole to contact and electrically connect with the detection point on the circuit board. In this way, the probe can be protected by the first needle mold to avoid damage to the probe by collision with foreign objects, and the probe can be able to contact the detection point of the circuit board to be tested.

[0017] At the same time, the first pinhole is arranged on the bottom surface of the sinking groove, and an opening is formed on the bottom surface of the sinking groove. When working, the probe extends from the opening to protrude the surface of the first pin mold away from the second pin mold. The first pinhole is arranged on the bottom surface of the sinking groove to avoid the opening formed by the first pinhole on the bottom surface of the sinking groove from being damaged, and ensure that the probe can be smoothly extended from the first pinhole. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a structural schematic diagram of a probe module provided by an embodiment of the utility model;

[0019] Figure 2 This is an exploded view of a probe module provided in one embodiment of the utility model.

[0020] The reference numerals in the specification are as follows:

[0021] 100. Probe module;

[0022] 1. First needle mold; 11. First needle hole; 12. First groove; 2. Second needle mold; 21. Second groove; 22. Second needle hole; 3. First connecting member; 4. First elastic member; 5. First connecting module; 6. Probe; 7. First circuit board; 8. Second circuit board; 9. Connecting needle; 10. Support seat; 20. Second connecting member; 201. Connecting shaft; 202. Stop block; 30. Second elastic member. DETAILED DESCRIPTION

[0023] In order to make the technical problems, technical solutions and beneficial effects solved by the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0024] like Figure 1 and Figure 2As shown, in one embodiment, the probe module 100 includes a first needle mold 1, a second needle mold 2, a first connecting member 3, a first elastic member 4, a first connecting module 5 and a probe 6; the first needle mold 1 is movably connected to the second needle mold 2 through the first connecting member 3, and the first needle mold 1 can be moved from a first position away from the second needle mold 2 to a second position close to the second needle mold 2; a first needle hole 11 is provided on the first needle mold 1, and the first needle hole 11 passes through the first needle mold 1 along the arrangement direction of the first needle mold 1 and the second needle mold 2; the first connecting module 5 and the second needle mold 2 The probe 6 is connected to the first connecting module 5. When the first needle mold 1 is located at the first position, the probe 6 does not protrude from the surface of the first needle mold 1 away from the second needle mold 2; when the first needle mold 1 is located at the second position, the probe 6 protrudes from the first needle hole 11 to the surface of the first needle mold 1 away from the second needle mold 2; the first elastic member 4 is connected between the first needle mold 1 and the second needle mold 2; when the first needle mold 1 moves from the first position to the second position, it can apply force to the first elastic member 4, so that the first needle mold 1 can be reset to the first position under the action of the first elastic member 4.

[0025] In this embodiment, initially, the first needle mold 1 is located in the first position (the first needle mold 1 is in the first position relative to the second needle mold 2). At this time, the probe 6 does not protrude to the surface of the first needle mold 1 away from the second needle mold 2, so that the probe 6 can be protected by the first needle mold 1, and the probe 6 can be effectively prevented from being damaged by collision with foreign objects. In addition, in an actual use scenario, the probe module 100 can be a side push module, that is, the driving module drives the probe module 100 to move horizontally, so that the probe module 100 is electrically in conflict with the detection point of the circuit board to be tested. In this scenario, even if the components of the detection device using the probe module 100 are arranged relatively densely, the probe 6 can be effectively prevented from being damaged by collision with foreign objects.

[0026] When the probe module 100 is driven by the corresponding driving module to approach the circuit board to be tested, the first needle mold 1 can contact the carrier on which the circuit board to be tested is placed. At this time, when the driving module continues to drive the probe module 100 to approach the circuit board to be tested, the first needle mold 1 stops moving due to the contact with the carrier, and the second needle mold 2 drives the probe 6 to continue to approach the circuit board to be tested, so that the second needle mold 2 and the first needle mold 1 are relatively displaced, so that the second needle mold 2 can approach the first needle mold 1, and finally the first needle mold 1 is in the second position relative to the second needle mold 2, so that the probe 6 extends from the first pinhole 11 to contact and electrically connect with the detection point on the circuit board. In addition, the circuit board to be tested can be an FPC or a PCB.

[0027] There are multiple detection points on the circuit board to be tested, and there are multiple probes 6. One probe can collide with one detection point to achieve electrical connection. In addition, there can be multiple first pinholes 11, and one probe 6 can pass through the first needle mold 1 from one first pinhole 11; or there is only one first pinhole 11, and each probe 6 passes through the first needle mold 1 from the first pinhole 11. In addition, "multiple" means greater than or equal to two.

[0028] like Figure 2 As shown, in one embodiment, a sinking groove 13 is provided on the surface of the first needle mold 1 facing away from the second needle mold 2, and the first pinhole 11 is arranged on the bottom surface of the sinking groove 13; when the first needle mold 1 is close to the circuit board to be tested, the surface of the first needle mold 1 facing away from the second needle mold 2 can collide with the carrier. In this way, the bottom surface of the sinking groove 13 can be prevented from being hit, and the opening formed by the first pinhole 11 on the bottom surface of the sinking groove 13 can be prevented from being damaged, so as to ensure that the probe 6 can be smoothly extended from the first pinhole 11. Among them, the sinking groove 13 is equivalent to a blind hole arranged on the surface of the first needle mold 1 facing away from the second needle mold 2, and the side wall of the sinking groove 13 can be a closed-loop structure. In addition, in some feasible embodiments, the side wall of the sinking groove 13 can also be provided with an opening, so that the side wall of the sinking groove 13 finally presents an open-loop structure.

[0029] In one embodiment, the first connecting member 3 may be an equal height bolt, which includes a threaded portion, a guide portion, and a stop portion connected in sequence, wherein a through hole is provided on the first pin mold 1, the axis of which is parallel to the arrangement direction of the first pin mold 1 and the second pin mold 2, and a threaded hole is provided on the second pin mold 2, and the threaded portion of the equal height bolt passes through the first pin mold 1 from the through hole and cooperates with the threaded hole on the second pin mold 2. After assembly, the guide portion of the equal height bolt is located in the through hole penetrated through the first pin mold 1, and the stop portion is located on the side of the first pin mold 1 away from the second pin mold 2. When the first pin mold 1 is in the first position, the first pin mold 1 abuts against the stop portion under the action of the first elastic member 4, and when the first pin mold 1 and the second pin mold 2 move relative to each other, the guide portion can cooperate with the through hole to guide the relative movement of the first pin mold 1 and the second pin mold 2.

[0030] There may be multiple equal-height bolts, each of which is connected to the first pin mold 1 and the second pin mold 2 respectively. The threaded portion of each equal-height bolt cooperates with the threaded hole on the second pin mold 2 respectively. The resisting portion of the equal-height bolt is located on the side of the first pin mold 1 away from the second pin mold 2. When the first pin mold 1 is in the first position, the first pin mold 1 contacts the resisting portion of each equal-height bolt under the action of the first elastic member 4.

[0031] In one embodiment, the first elastic member 4 may be a spring or the like. In one feasible implementation, a first spring hole is provided on the surface of the first needle mold 1 close to the second needle mold 2, and a second spring hole is provided on the surface of the second needle mold 2 close to the first needle mold 1. The two ends of the first elastic member 4 are respectively located in the first spring hole and the second spring hole, and respectively abut against the bottom surfaces of the two spring holes. When the first needle mold 1 is close to the second needle mold 2, the first elastic member 4 can be compressed. In another feasible implementation, the first elastic member may be sleeved on the guide portion of the equal height bolt, and the two ends of the first elastic member 4 abut against the first needle mold 1 and the second needle mold 2 respectively.

[0032] like Figure 2 As shown, in one embodiment, the probe module 100 further includes a first circuit board 7, which is connected between the second needle mold 2 and the first connection module 5; the end of the probe 6 close to the second needle mold 2 is connected to the first circuit board 7. The first circuit board 7 is used to lead out each probe. When working, the corresponding detector can be electrically connected to each probe through the first circuit board 7, and then the circuit board to be tested can be detected by the detector. In addition, the detector can be of existing design, which is not the innovation of this solution.

[0033] like Figure 2 As shown, in one embodiment, the probe module 100 further includes a second circuit board 8 and a connecting needle 9. The second circuit board 8 is arranged on the side of the second needle mold 2 away from the first needle mold 1; the second needle mold 2 is provided with a second pinhole 22, and the second pinhole 22 penetrates the second needle mold 2 along the arrangement direction of the first needle mold 1 and the second needle mold 2; the connecting needle 9 passes through the second needle mold 2 from the second pinhole 22, and the two ends of the connecting needle 9 are electrically connected to the first circuit board 7 and the second circuit board 8. Among them, the second circuit board 8 is also connected to the first detector, and at this time, it is equivalent to leading each probe through two circuit boards.

[0034] Among them, during the detection, the circuit board to be tested can be functionally tested to simulate the actual working scenario of the circuit board to be tested. For example, when the circuit board to be tested is used to connect to the battery of a mobile phone, at this time, the circuit board to be tested can be charged and discharged. This requires a large current to be passed through the circuit board to be tested. In this embodiment, during the test, when a large current is passed, the large current first passes through the second circuit board 8, and then passes to the first circuit board 7 through the connecting pin 9, and then passes from the probe to the circuit board to be tested. Compared with directly passing a large current through the first circuit board 7 to the circuit board to be tested, this setting can improve the accuracy of the detection.

[0035] like Figure 2As shown, in one embodiment, a first groove 12 is provided on the surface of the first needle mold 1 close to the second needle mold 2, the first connecting module 5 is located in the first groove 12, and the first pinhole 11 is also provided in the first groove 12, so that the length of the first pinhole 11 can be shortened, and the processing of the first pinhole 11 is convenient. At the same time, by providing the first groove 12, the size of the entire probe module 100 can be reduced while ensuring the strength of the first needle mold 1, and the probe 6 can be more easily extended from the first needle mold 1. In addition, a second depression 21 is provided on the surface of the second needle mold 2 close to the first needle mold 1, and the first connecting module 5 is located in the second groove 21, so that the size of the entire probe module 100 can be further reduced. In other embodiments, only the first needle mold 1 may be provided with the first groove 12, and the second needle mold 2 may not be provided with the second groove 21; or only the second needle mold 2 may be provided with the second groove 21, and the first needle mold 1 may not be provided with the first groove 12.

[0036] In addition, the first groove 12 penetrates the side of the first needle mold 1, so that the first circuit board 7 can be extended from between the first needle mold 1 and the second needle mold 2. At the same time, the second groove 21 penetrates the side of the second needle mold 2, and the opening formed by the first groove 12 on the side of the first needle mold 1 is connected with the opening formed by the second groove 21 on the side of the second needle mold 2.

[0037] like Figure 2 As shown, in one embodiment, the first connection module 5 includes a third needle mold 51 and a sealing plate 52; the third needle mold 51 is provided with a receiving groove, the bottom surface of the receiving groove is provided with a first through hole, and the sealing plate 52 is provided with a second through hole; the sealing plate 52 is connected to the third needle mold 51 and closes the opening of the receiving groove to form a receiving cavity; the probe 6 is installed in the receiving cavity, and along the axial direction of the probe 6, the probe 6 has a first section, a second section and a third section arranged in sequence, wherein the three sections can be coaxially arranged, and the diameter of the second section is greater than the diameter of the first section, and the diameter of the second section is greater than the diameter of the third section. After assembly, the second section is located in the receiving cavity, and the two ends of the second section are respectively in conflict with the third needle mold 51 and the sealing plate 52; the first section passes through the receiving cavity from the first through hole, and can protrude from the surface of the first needle mold 1 away from the second needle mold 2 when the first needle mold 1 is in the second position; the third section passes through the receiving cavity from the second through hole to be electrically connected to the first circuit board 7. Among them, the probe 6 is a double-headed probe, and its design can be the prior art, and this embodiment will not be described in detail here. In addition, after assembly, the first pin mold 1 can be connected to the second pin mold 2 by bolts, etc., so as to realize the connection between the first connection module 5 and the second pin mold 2. In addition, the sealing plate 52 and the third pin mold 51 can also be connected by bolts.

[0038] like Figure 2As shown, in one embodiment, a first detection limit structure is provided on the second needle mold 2, and a second detection limit structure is provided on the first connection module 5. The first detection limit structure and the second detection limit structure cooperate to limit the connection position of the first connection module 5 on the second needle mold 2, which is more convenient for assembling the probe module 100. Specifically, the first detection limit structure can be a limit column, and the second detection limit structure can be a limit hole. In addition, the first detection limit structure can be set in the second groove 21, and the second detection limit structure can be set on the third needle mold 51.

[0039] like Figure 2 As shown, in one embodiment, the probe module 100 also includes a support seat 10, a second connecting member 20 and a second elastic member 30; wherein the support seat 10 is used to connect with the driving module; the second needle mold 2 is movably connected to the support seat 10 through the second connecting member 20, so that the second needle mold 2 can approach or move away from the support seat 10; the second elastic member 30 is connected between the second needle mold 2 and the support seat 10; when the second needle mold 2 approaches the support seat 10, it can apply force to the second elastic member 30 to deform the second elastic member 30; when the first needle mold 1 is subjected to force and approaches the second needle mold 2, it can apply force to the second needle mold 2 to make the second needle mold 2 approach the support seat 10.

[0040] In this embodiment, the support seat 10 is located on the side of the second needle mold 2 away from the first needle mold 1. The driving module can apply force to the support seat 10 to drive the support seat 10, the first needle mold 1 and the second needle mold 2 to move synchronously to approach the circuit board to be tested. When the first needle mold 1 contacts the carrier on which the circuit board to be tested is placed, and when the probe 6 contacts the circuit board to be tested, the second needle mold 2 stops moving; when the driving module continues to drive the support seat 10 to approach the circuit board to be tested, the support seat 10 will approach the second needle mold 2 (equivalent to the second needle mold 2 approaching the support seat 10), and the second elastic member 30 will be deformed. Among them, the setting of the support seat 10 and the elastic member can play a buffering role and reduce the impact force of the probe 6 on the circuit board to be tested. Among them, the second elastic member 30 can be a spring or the like.

[0041] like Figure 2As shown, in one embodiment, the second connecting member 20 includes a connecting shaft 201 and a stopper 202, and the stopper 202 is connected to the connecting shaft 201; a first detection guide hole is provided on the support seat 10, and the connecting shaft 201 passes through the support seat 10 from the first detection guide hole and is connected to the second needle mold 2; the connecting shaft 201 moves synchronously with the second needle mold 2, and when the second needle mold 2 is away from the support seat 10, the stopper 202 can abut against the support seat 10. Among them, the connecting shaft 201 can be embedded in the second needle mold 2, or it can be connected to the second needle mold 2 by a threaded connection. In addition, the second elastic member 30 can be sleeved on the connecting shaft 201, and the two ends of the second elastic member 30 respectively abut against the second needle mold 2 and the support seat 10.

[0042] In one embodiment, a first positioning structure is further provided on the first needle mold 1, and the first positioning structure is used to cooperate with the second positioning structure on the carrier to define the relative position relationship between the first needle mold 1 and the carrier, and ensure that the probe can accurately contact the corresponding detection point of the circuit board to be tested on the carrier. Wherein, initially, the first positioning structure and the second positioning structure are not matched together, and when the first needle mold 1 moves a certain position close to the carrier, the first positioning structure can be matched with the second positioning structure. In addition, the first positioning structure can be a positioning column, and the second positioning structure can be a positioning hole, wherein the positioning column can be embedded in the first needle mold 1 and protrude from the surface of the first needle mold 1 away from the second needle mold 2.

[0043] In one embodiment, the connecting shaft 201 can also move radially along the first detection guide hole, so that the second needle mold 2 can float in various directions along the radial direction of the first detection guide hole, and then the first needle mold 1 can float in various directions along the radial direction of the first detection guide hole, which is beneficial to the coordination between the first positioning structure and the second positioning structure.

[0044] The embodiment of the utility model also provides a detection device, which includes a workbench, a carrier, a drive module, and the probe module 100 described in any of the above embodiments. Among them, the carrier is connected to the workbench and is used to support and place the circuit board to be tested; the drive module is connected to the workbench and is connected to the probe module 100, and is used to drive the probe module 100 to move so that the probe module 100 approaches or moves away from the carrier. When the probe module 100 approaches the carrier, the probe of the probe module 100 can electrically conflict with the detection point of the circuit board to be tested on the carrier.

[0045] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0046] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A probe module, characterized in that: It includes a first needle mold, a second needle mold, a first connecting member, a first elastic member, a first connecting module and a probe; The first needle mold is movably connected to the second needle mold through the first connecting member, and the first needle mold can be moved from a first position away from the second needle mold to a second position close to the second needle mold; A sinking groove is provided on the surface of the first needle mold away from the second needle mold, and a first needle hole is provided on the first needle mold. The first needle hole is arranged on the bottom surface of the sinking groove and penetrates to the surface of the first needle mold close to the second needle mold; The first connection module is connected to the second needle mold, and the probe is connected to the first connection module; when the first needle mold is located at the first position, the probe does not protrude from the surface of the first needle mold away from the second needle mold; when the first needle mold is located at the second position, the probe protrudes from the first needle hole to the surface of the first needle mold away from the second needle mold; The first elastic member is connected between the first needle mold and the second needle mold; when the first needle mold moves from the first position to the second position, it can apply force to the first elastic member, so that the first needle mold can be restored to the first position under the action of the first elastic member.

2. The probe module according to claim 1, characterized in that: A first groove is provided on a surface of the first needle mold close to the second needle mold, and the first connecting module is located in the first groove.

3. The probe module according to claim 1, characterized in that: A second groove is provided on a surface of the second needle mold close to the first needle mold, and the first connecting module is located in the second groove.

4. The probe module according to claim 1, characterized in that: The probe module further comprises a first circuit board, wherein the first circuit board is connected between the second needle module and the first connection module; One end of the probe close to the second needle mold is connected to the first circuit board.

5. The probe module according to claim 4, characterized in that: The probe module further comprises a second circuit board and a connecting needle, wherein the second circuit board is arranged on a side of the second needle mold away from the first needle mold; A second needle hole is provided on the second needle mold, and the second needle hole penetrates the second needle mold along the arrangement direction of the first needle mold and the second needle mold; The connecting needle passes through the second needle mold from the second needle hole, and both ends of the connecting needle are electrically connected to the first circuit board and the second circuit board.

6. The probe module according to claim 4, characterized in that: The first connection module includes a third needle mold and a sealing plate; The third needle mold is provided with a receiving groove, the bottom surface of the receiving groove is provided with a first through hole, and the sealing plate is provided with a second through hole; The sealing plate is connected to the third needle mold and closes the receiving groove to form a receiving cavity; The probe is installed in the accommodating cavity, and along the axial direction of the probe, the probe has a first section, a second section and a third section which are arranged in sequence; The second section is located in the accommodating cavity, and two ends of the third section are respectively in contact with the third needle mold and the sealing plate; The first section passes through the accommodating cavity from the first through hole, and can protrude from the surface of the first needle mold away from the second needle mold when the first needle mold is located at the second position; The third section passes through the accommodating cavity from the second via hole so as to be electrically connected to the first circuit board.

7. The probe module according to claim 1, characterized in that: The second needle mold is provided with a first detection limit structure, and the first connection module is provided with a second detection limit structure. The first detection limit structure and the second detection limit structure cooperate to limit the connection position of the first connection module on the second needle mold.

8. The probe module according to claim 1, characterized in that: The probe module also includes a support seat, a second connecting member and a second elastic member; The support seat is movably connected to a side of the second needle mold facing away from the first needle mold through the second connecting member, so that the second needle mold can approach or move away from the support seat; The second elastic member is connected between the second needle mold and the support seat; When the second needle mold is close to the support seat, it can apply force to the second elastic member to deform the second elastic member; When the first needle mold is forced to approach the second needle mold, force can be applied to the second needle mold to make the second needle mold approach the supporting seat.

9. The probe module according to claim 8, characterized in that: The second connecting member includes a connecting shaft and a stopper, wherein the stopper is connected to the connecting shaft; The support seat is provided with a first detection guide hole, and the connecting shaft passes through the support seat from the first detection guide hole and is connected to the second needle mold; The connecting shaft moves synchronously with the second needle mold, and when the second needle mold moves away from the supporting seat, the stopper can abut against the supporting seat.

10. A detection device, characterized in that: A probe module comprising any one of claims 1 to 9.

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