Device for measuring T-line temperature signal of photo-thermal test strip

Abstract

The utility model relates to the technical field of test strip temperature measurement, in particular to a device for measuring a T-line temperature signal of a photo-thermal test strip, which comprises a bin body and a bin cover, the center of one side wall of the bin body is provided with a placing port for inserting or taking out a test strip, and the bottom end of the bin cover is provided with a near-infrared emitter and an infrared thermal sensor. A touch display screen is installed in the top center of the bin cover. Compared with the traditional split operation, the test strip body does not need to be transferred, the test strip body does not need to be in contact with the test strip, non-contact measurement is adopted, transfer errors caused by split design and measurement errors caused by contact measurement are avoided, the accuracy and efficiency of temperature measurement are improved, and the test strip is simple in structure and convenient to use. The device can be used for rapidly and accurately measuring the surface temperature of the test strip and outputting corresponding data in the touch display screen. Therefore, reliable data support can be provided for research and experiments, and the method has wide application prospects.

Description

Technical Field

[0001] The utility model relates to the technical field of test strip temperature measurement, and in particular to a device for measuring T-line temperature signals of a photothermal test strip. Background Art

[0002] At present, the temperature measurement equipment for the T line of the test strip usually adopts a split design, that is, the laser irradiation and temperature measurement functions are completed by separate devices respectively, that is, after the laser irradiation is completed in one device, it needs to be transferred to another device for temperature measurement. The transfer process needs to be done manually, and in the process of temperature measurement, the staff often needs to hold a thermometer for measurement, which is a contact measurement. On the one hand, contact temperature measurement is prone to cause surface contamination of the test strip. On the other hand, during the transfer and measurement process, there may be contact time with the ambient temperature, which makes the measurement method of the handheld thermometer have certain measurement errors, and manual readings are also prone to deviations.

[0003] Therefore, it is necessary to invent a device for measuring the temperature signal of the T line of a photothermal test strip to solve the above problems. Utility Model Content

[0004] In order to address the deficiencies of the prior art, the purpose of the utility model is to provide a device for measuring the T-line temperature signal of a photothermal test strip, which solves the problem that contact-type temperature measurement in the prior art easily causes surface contamination of the test strip, and on the other hand, the contact time with the ambient temperature may occur during the transfer and measurement process, resulting in certain measurement errors in the measurement method of the handheld thermometer, and manual readings are also prone to deviations.

[0005] In order to achieve the above objectives, the utility model adopts the following technical solutions:

[0006] A device for measuring T-line temperature signals of photothermal test strips, comprising a chamber body which is hollow inside and has an open top, and a chamber cover which is detachably connected to the top of the chamber body, a placement opening for inserting or taking out a test strip is provided in the center of one side wall of the chamber body, a near-infrared emitter and an infrared thermal sensor for laser irradiation and temperature measurement of the test strip are provided at the bottom of the chamber cover, a touch display screen is installed at the center of the top of the chamber cover, the touch display screen can display measurement data of the near-infrared emitter and the infrared thermal sensor, and the touch display screen can adjust parameter values ​​of the near-infrared emitter and the infrared thermal sensor, and the near-infrared emitter is located on the side close to the placement opening.

[0007] As a preferred solution of the utility model, the size of the placement opening is larger than the cross-sectional size of the test strip body, and a protective frame strip is fitted and connected to the side wall around the placement opening.

[0008] As a preferred solution of the utility model, a placement base is detachably installed inside the warehouse body, and a surrounding frame is fitted and connected to the side walls of the top surface of the placement base.

[0009] As a preferred solution of the utility model, the top surface of the placement base is flush with the bottom side of the placement opening.

[0010] As a preferred solution of the utility model, a mounting plate is detachably mounted on the bottom end of the bin cover, and the near-infrared emitter and the infrared thermal sensor can be detachably mounted on the bottom surface of the mounting plate.

[0011] As a preferred solution of the present utility model, an MCU is arranged in the warehouse body, and the touch display screen, near infrared emitter and infrared thermal sensor are all electrically connected to the MCU.

[0012] In the above technical solution, the technical effects and advantages provided by the utility model are:

[0013] In the utility model, for different test strips to be tested, the relevant parameters of the near-infrared emitter and the infrared thermal sensor are adjusted in time through the touch display screen, so that the near-infrared emitter and the infrared thermal sensor are in the best working state. In the subsequent measurement process, it is only necessary to insert the test strip after the titration reaction into the warehouse through the placement port. The near-infrared emitter and the infrared thermal sensor simultaneously perform laser irradiation and temperature measurement on the test strip, and the measurement data will be displayed on the touch display screen in real time. In the measuring device, laser irradiation and temperature measurement are combined through the near-infrared emitter and the infrared thermal sensor to form an integrated operation process for laser irradiation and temperature measurement. Compared with the traditional split operation, there is no need to transfer the test strip, and there is no need to contact the test strip. It belongs to non-contact measurement, avoids the transfer error caused by the split design and the measurement error caused by the contact measurement, improves the accuracy and efficiency of temperature measurement, can quickly and accurately measure the surface temperature of the test strip, and output the corresponding data on the touch display screen, that is, to provide reliable data support for research and experiments, and has broad application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0015] Figure 2 It is a schematic diagram of the overall structure of the utility model after being cut along the center line of the warehouse body.

[0016] Description of reference numerals:

[0017] 1. Bin body; 2. Placement opening; 3. Protective frame strip; 4. Placement base; 5. Frame; 6. Bin cover; 7. Touch screen; 8. Infrared thermal sensor; 9. Mounting plate; 10. Near-infrared emitter. DETAILED DESCRIPTION

[0018] The utility model is further described below in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the utility model, and cannot be used to limit the protection scope of the utility model.

[0019] The utility model provides Figure 1-Figure 2 A device for measuring the T-line temperature signal of a photothermal test strip is shown, comprising a chamber body 1 which is hollow inside and has an open top, and a chamber cover 6 which is detachably connected to the top of the chamber body 1. A placement opening 2 for inserting or taking out a test strip is provided in the center of one side wall of the chamber body 1. A near-infrared emitter 10 and an infrared thermal sensor 8 for laser irradiation and temperature measurement of the test strip are provided at the bottom of the chamber cover 6. A touch display screen 7 is installed at the center of the top of the chamber cover 6. The touch display screen 7 can display the measurement data of the near-infrared emitter 10 and the infrared thermal sensor 8, and the touch display screen 7 can adjust the parameter values ​​of the near-infrared emitter 10 and the infrared thermal sensor 8. The near-infrared emitter 10 is located on the side close to the placement opening 2. The near-infrared emitter 10 can perform laser irradiation on the test strip inside the chamber body 1, and the infrared thermal sensor 8 can measure the temperature of the test strip during the laser irradiation process.

[0020] The size of the placement opening 2 is larger than the cross-sectional size of the test strip, and the side walls of the placement opening 2 are fitted with a protective frame strip 3 , which can prevent the test strip from being scratched by the sharp edges of the placement opening 2 .

[0021] A placement base 4 is detachably installed inside the warehouse body 1, and a surrounding frame 5 is fitted around the side walls of the top surface of the placement base 4. Since there is a certain gap between the interior of the warehouse body 1 and the placement base 4, the presence of the surrounding frame 5 can prevent the test strip from falling into the gap space, and at the same time facilitates the subsequent removal of the test strip.

[0022] The top surface of the placement base 4 is flush with the bottom side of the placement opening 2. The top surface of the placement base 4 is flush with the bottom side of the placement opening 2 so that the insertion and removal of the test strip are both on the same horizontal line, avoiding rapid deviation of the titration liquid on the test strip due to height deviation.

[0023] A mounting plate 9 is detachably mounted on the bottom end of the compartment cover 6 , and the near-infrared emitter 10 and the infrared thermal sensor 8 can be detachably mounted on the bottom surface of the mounting plate 9 .

[0024] An MCU is provided in the warehouse body 1, and the touch display screen 7, near-infrared emitter 10 and infrared thermal sensor 8 are all electrically connected to the MCU. The data control of the near-infrared emitter 10 and the infrared thermal sensor 8 is completed through the MCU micro control unit. During the actual operation, the operation is performed through the touch display screen 7, so that the instructions are transmitted to the near-infrared emitter 10 and the infrared thermal sensor 8 through the MCU micro control unit, thereby completing the modification or setting of the parameters.

[0025] In the utility model, for different test strips to be tested, the relevant parameters of the near-infrared emitter 10 and the infrared thermal sensor 8 are adjusted in time through the touch display screen 7, so that the near-infrared emitter 10 and the infrared thermal sensor 8 are in the best working state. In the subsequent measurement process, it is only necessary to insert the test strip after the titration reaction into the warehouse body 1 through the placement port 2. The near-infrared emitter 10 and the infrared thermal sensor 8 simultaneously perform laser irradiation and temperature measurement on the test strip, and the measurement data will be displayed in real time on the touch display screen 7. In the measuring device, laser irradiation and temperature measurement are combined through the near-infrared emitter 10 and the infrared thermal sensor 8 to form an integrated operation process for laser irradiation and temperature measurement. Compared with the traditional split operation, there is no need to transfer the test strip, and there is no need to contact the test strip. It belongs to non-contact measurement, avoids the transfer error caused by the split design and the measurement error caused by the contact measurement, improves the accuracy and efficiency of temperature measurement, can quickly and accurately measure the surface temperature of the test strip, and output the corresponding data on the touch display screen 7, that is, to provide reliable data support for research and experiments, and has broad application prospects.

[0026] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as the protection scope of the present invention.

Claims

1. A device for measuring the temperature signal of the T line of a photothermal test strip, characterized in that: The invention comprises a chamber body (1) which is hollow inside and has an open top end, and a chamber cover (6) which is detachably connected to the top end of the chamber body (1). A placement opening (2) for inserting or removing a test paper strip is provided at the center of one side wall of the chamber body (1). A near-infrared emitter (10) and an infrared thermal sensor (8) which can perform laser irradiation and temperature measurement on the test paper strip are provided at the bottom end of the chamber cover (6). A touch display screen (7) is installed at the center of the top end of the chamber cover (6). The touch display screen (7) can display measurement data of the near-infrared emitter (10) and the infrared thermal sensor (8), and the touch display screen (7) can adjust parameter values ​​of the near-infrared emitter (10) and the infrared thermal sensor (8). The near-infrared emitter (10) is located on a side close to the placement opening (2).

2. A device for measuring T-line temperature signals of a photothermal test strip according to claim 1, characterized in that: The size of the placement opening (2) is larger than the cross-sectional size of the test paper strip being tested, and a protective frame strip (3) is fitted and connected to the side wall of the placement opening (2).

3. The device for measuring the temperature signal of the T line of a photothermal test strip according to claim 1, characterized in that: A placement base (4) is detachably mounted inside the warehouse body (1), and a surrounding frame (5) is fitted and connected to the side walls of the top surface of the placement base (4).

4. The device for measuring the temperature signal of the T line of a photothermal test strip according to claim 3, characterized in that: The top surface of the placement base (4) is flush with the bottom side of the placement opening (2).

5. The device for measuring the temperature signal of the T line of a photothermal test strip according to claim 1, characterized in that: A mounting plate (9) is detachably mounted on the bottom end of the bin cover (6), and the near-infrared emitter (10) and the infrared thermal sensor (8) are both detachably mounted on the bottom surface of the mounting plate (9).

6. The device for measuring the temperature signal of the T line of a photothermal test strip according to claim 1, characterized in that: An MCU is arranged in the warehouse body (1), and the touch display screen (7), the near-infrared emitter (10) and the infrared thermal sensor (8) are all electrically connected to the MCU.

Images