IGBT (Insulated Gate Bipolar Translator) test seat

Abstract

The utility model provides an IGBT test seat comprising a test assembly, and the test assembly comprises an IGBT body, a lower housing, an upper housing, a first needle plate, a second needle plate, a first conductor, a floating plate, a pin, and a second conductor. According to the utility model, the first electric conductor and the second electric conductor are sheet-shaped, the first adhesive tape clamping groove and the second adhesive tape clamping groove are processed in the middle of the first electric conductor and the second electric conductor, and the IGBT pin profiling groove is further arranged, so that the first electric conductor and the second electric conductor can be tightly attached to the pins of the IGBT body, and the IGBT body is placed on the floating plate of the lower shell at the beginning; during testing, pins of the IGBT body are not temporarily inserted into the first electric conductor and the second electric conductor, then the lower shell and the upper shell are combined and pressed downwards through the buckling part and the clamping groove, so that the IGBT body is inserted into the first electric conductor and the second electric conductor, and the first electric conductor and the second electric conductor are initially fixed on the lead-out PCB and are in point contact with a PAD on the lead-out PCB to form testing. The novel conductor of the IGBT adopts an integrated design, so that the novel conductor is higher in voltage resistance and overcurrent capability.

Description

Technical Field

[0001] The utility model relates to a test socket, in particular to an IGBT test socket, and belongs to the technical field of IGBT test sockets. Background Art

[0002] IGBT is Insulated Gate Bipolar Transistor, which means insulated gate bipolar transistor in Chinese. It is a composite fully controlled voltage-driven power semiconductor device composed of BJT (bipolar transistor) and MOS (insulated gate field effect transistor). IGBT combines the advantages of MOSFET's high input impedance and GTR's low on-state voltage drop. It has the characteristics of MOSFET's low driving power and fast switching speed, and GTR's low saturation voltage drop and high current density. It is very suitable for use in converter systems with DC voltage of 600V and above, such as AC motors, inverters, switching power supplies, lighting circuits, traction drives and other fields;

[0003] IGBT is generally known for its high voltage, high power and high current. In the past, multiple ordinary POGO PINs were generally used as conductors or springs to contact the IGBT pins to solve the difficulty of large current. When ordinary POGO PINs are tested, the current capacity of a single PIN is generally 1A-5A. When the current of the IGBT reaches hundreds of amperes, it is difficult to achieve. For this reason, an IGBT test socket is proposed. Utility Model Content

[0004] In view of this, the utility model provides an IGBT test socket to solve or alleviate the technical problems existing in the prior art and at least provide a beneficial option.

[0005] The technical solution of the embodiment of the utility model is implemented as follows: an IGBT test socket, comprising a test assembly, wherein the test assembly comprises an IGBT body, a lower shell, an upper shell, a first pin plate, a second pin plate, a first conductor, a floating plate, a pin, a second conductor, an IGBT pin profiling groove, a first rubber strip card slot, and a second rubber strip card slot;

[0006] The lower shell is rotatably connected to the upper shell, a first needle plate is provided on one side of the upper shell, a second needle plate is provided on one side of the lower shell, a floating plate is provided on the top of the second needle plate, the top of the floating plate is movably in contact with the IGBT body, a first conductor is provided on the IGBT body, pins are provided on both sides of the IGBT body, a second conductor is provided on one side of the first needle plate, two IGBT pin profiling grooves are provided on one side of the second needle plate, a first rubber strip slot is provided on the first needle plate, and a second rubber strip slot is provided on the second needle plate.

[0007] Further preferably, a buckle portion is provided on the upper shell, and two buckle slots are provided on the front side of the lower shell, and the buckle slots cooperate with the buckle portion.

[0008] Further preferably, the second conductor is threadedly connected to the first needle plate through four bolts.

[0009] Further preferably, a threaded hole is provided on the second conductor, and the threaded hole is threadedly connected by a corresponding bolt.

[0010] Further preferably, circular holes are provided on both sides of the IGBT body, and the IGBT body is in active contact with the corresponding pins through the circular holes.

[0011] Further preferably, a PCB board is provided on the lower shell, and a handle is rotatably connected to the upper shell.

[0012] Further preferably, two limiting parts are provided on the lower shell body, and two protruding parts are provided on the first needle plate, and the protruding parts are in movably contact with the corresponding limiting parts.

[0013] Further preferably, the first conductor and the second conductor are both in sheet shape.

[0014] The embodiment of the utility model has the following advantages due to the adoption of the above technical solution:

[0015] The utility model has a first conductor and a second conductor that are both in sheet shape, with a first rubber strip card slot and a second rubber strip card slot processed in the middle, and the silicone strip and the new conductor are installed in pairs in the first needle plate and the second needle plate, and an IGBT pin profiling groove is also provided, so that the first conductor and the second conductor can fit tightly with the pins of the IGBT body, the IGBT body is initially placed on the floating plate of the lower shell, and the pins of the IGBT body are temporarily not inserted into the first conductor and the second conductor, and then the lower shell and the upper shell are combined and pressed down through the buckle part and the card slot, so that the IGBT body is inserted into the first conductor and the second conductor, the first conductor and the second conductor are initially fixed on the lead-out PCB board, and contact with the PAD point on the lead-out PCB board, thereby forming a test, so that the new IGBT conductor adopts an integrated design, has a higher voltage resistance, and a stronger overcurrent capacity.

[0016] The above summary is for the purpose of description only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments and features described above, further aspects, embodiments and features of the utility model will be readily apparent by reference to the accompanying drawings and the following detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 It is a three-dimensional structural diagram of the utility model;

[0019] Figure 2 It is a rear three-dimensional structural diagram of the utility model;

[0020] Figure 3 It is a partial three-dimensional structural diagram of the utility model;

[0021] Figure 4 This is a three-dimensional structural diagram of the IGBT body of the utility model.

[0022] Figure numerals: 1. test assembly; 2. IGBT body; 3. lower shell; 4. upper shell; 5. first needle plate; 6. second needle plate; 7. first conductor; 8. floating plate; 9. pin; 10. second conductor; 11. IGBT pin profiling groove; 12. first rubber strip slot; 13. buckle part; 14. slot; 15. handle; 16. bolt; 17. circular hole; 18. second rubber strip slot; 19. limit part; 20. protrusion. DETAILED DESCRIPTION

[0023] In the following, only some exemplary embodiments are briefly described. As those skilled in the art will appreciate, the described embodiments may be modified in various ways without departing from the spirit or scope of the present invention. Therefore, the drawings and descriptions are considered to be exemplary and non-restrictive in nature.

[0024] The embodiments of the present utility model are described in detail below with reference to the accompanying drawings.

[0025] like Figure 1-4 As shown, the embodiment of the utility model provides an IGBT test socket, including a test assembly 1, the test assembly 1 includes an IGBT body 2, a lower shell 3, an upper shell 4, a first pin plate 5, a second pin plate 6, a first conductor 7, a floating plate 8, a pin 9, a second conductor 10, an IGBT pin profiling groove 11, a first rubber strip card slot 12, and a second rubber strip card slot 18;

[0026] The lower shell 3 is rotatably connected to the upper shell 4, a first needle plate 5 is provided on one side of the upper shell 4, a second needle plate 6 is provided on one side of the lower shell 3, a floating plate 8 is provided on the top of the second needle plate 6, and the top of the floating plate 8 is movably in contact with the IGBT body 2, a first conductor 7 is provided on the IGBT body 2, pins 9 are provided on both sides of the IGBT body 2, a second conductor 10 is provided on one side of the first needle plate 5, two IGBT pin-profile grooves 11 are provided on one side of the second needle plate 6, a first rubber strip groove 12 is provided on the first needle plate 5, and a second rubber strip groove 18 is provided on the second needle plate 6, the first conductor 7 and the second conductor 10 are both in sheet form, and the first rubber strip groove 12 and the second rubber strip groove 18 are processed in the middle, The silicone strip and the new conductor are installed in pairs in the first needle plate 5 and the second needle plate 6. An IGBT pin profiling groove 11 is also provided so that the first conductor 7 and the second conductor 10 can fit tightly with the pins of the IGBT body 2. The IGBT body 2 is initially placed on the floating plate 8 of the lower shell 3, and the pins of the IGBT body 2 are temporarily not inserted into the first conductor 7 and the second conductor 10. Then the lower shell 3 and the upper shell 4 are combined and pressed down through the buckle portion 13 and the slot 14 to insert the IGBT body 2 into the first conductor 7 and the second conductor 10. The first conductor 7 and the second conductor 10 are initially fixed on the lead-out PCB board and contact the PAD point on the lead-out PCB board, thereby forming a test.

[0027] In one embodiment, a buckle portion 13 is provided on the upper shell 4, and two slots 14 are provided on the front side of the lower shell 3. The slots 14 cooperate with the buckle portion 13. The buckle portion 13 facilitates the buckling of the upper shell 4 and the lower shell 3.

[0028] In one embodiment, the second conductor 10 is threadedly connected to the first needle plate 5 via four bolts 16. The second conductor 10 is provided with threaded holes, which are threadedly connected via corresponding bolts 16. The bolts 16 are provided to facilitate quick disassembly and assembly.

[0029] In one embodiment, circular holes 17 are provided on both sides of the IGBT body 2 , and the IGBT body 2 is in active contact with the corresponding pins 9 through the circular holes 17 . The provision of the circular holes 17 plays a role of limiting.

[0030] In one embodiment, a PCB board is disposed on the lower housing 3 , and a handle 15 is rotatably connected to the upper housing 4 , and the upper housing 4 can be rotated by the handle 15 .

[0031] In one embodiment, two limiting portions 19 are provided on the lower shell body 3, and two protrusions 20 are provided on the first needle plate 5. The protrusions 20 are in movable contact with the corresponding limiting portions 19. The first conductor 7 and the second conductor 10 are both sheet-shaped and are limited by the limiting portions 19 to prevent displacement during the engagement process.

[0032] The utility model is in operation: when in use, the first conductor 7 and the second conductor 10 are both in sheet shape, and the first rubber strip slot 12 and the second rubber strip slot 18 are processed in the middle. The silicone strip and the new conductor are installed in pairs in the first needle plate 5 and the second needle plate 6. An IGBT pin profiling slot 11 is also provided, so that the first conductor 7 and the second conductor 10 can fit tightly with the pins of the IGBT body 2. The IGBT body 2 is initially placed on the floating plate 8 of the lower shell 3, and the pins of the IGBT body 2 are temporarily not inserted into the first conductor 7 and the second conductor 10. Then the lower shell 3 and the upper shell 4 are combined and pressed down through the buckle portion 13 and the slot 14, so that the IGBT body 2 is inserted into the first conductor 7 and the second conductor 10. The first conductor 7 and the second conductor 10 are initially fixed on the lead-out PCB board and contact the PAD point on the lead-out PCB board, thereby forming a test.

[0033] The above is only a specific implementation of the utility model, but the protection scope of the utility model is not limited thereto. Any technician familiar with the technical field can easily think of various changes or substitutions within the technical scope disclosed by the utility model, which should be included in the protection scope of the utility model. Therefore, the protection scope of the utility model should be based on the protection scope of the claims.

Claims

1. An IGBT test socket, comprising a test assembly (1), characterized in that: The test assembly (1) comprises an IGBT body (2), a lower housing (3), an upper housing (4), a first needle plate (5), a second needle plate (6), a first conductor (7), a floating plate (8), a pin (9), a second conductor (10), an IGBT pin profiling groove (11), a first rubber strip slot (12), and a second rubber strip slot (18); The lower shell (3) is rotatably connected to an upper shell (4); a first needle plate (5) is provided on one side of the upper shell (4); a second needle plate (6) is provided on one side of the lower shell (3); a floating plate (8) is provided on the top of the second needle plate (6); the top of the floating plate (8) is in movably contact with an IGBT body (2); a first conductor (7) is provided on the IGBT body (2); pins (9) are provided on both sides of the IGBT body (2); a second conductor (10) is provided on one side of the first needle plate (5); two IGBT pin-profile grooves (11) are provided on one side of the second needle plate (6); a first rubber strip card slot (12) is provided on the first needle plate (5); and a second rubber strip card slot (18) is provided on the second needle plate (6).

2. The IGBT test socket according to claim 1, characterized in that: The upper shell (4) is provided with a buckle portion (13), and the front side of the lower shell (3) is provided with two buckle slots (14), the buckle slots (14) matching with the buckle portion (13).

3. The IGBT test socket according to claim 1, characterized in that: The second conductor (10) is threadedly connected to the first needle plate (5) via four bolts (16).

4. The IGBT test socket according to claim 1, characterized in that: The second conductor (10) is provided with a threaded hole, and the threaded hole is threadedly connected via a corresponding bolt (16).

5. The IGBT test socket according to claim 1, characterized in that: Circular holes (17) are provided on both sides of the IGBT body (2), and the IGBT body (2) is in active contact with corresponding pins (9) through the circular holes (17).

6. The IGBT test socket according to claim 1, characterized in that: The lower shell (3) is provided with a PCB board, and the upper shell (4) is rotatably connected with a handle (15).

7. The IGBT test socket according to claim 1, characterized in that: The lower housing (3) is provided with two limiting portions (19), and the first needle plate (5) is provided with two protruding portions (20), the protruding portions (20) being in active contact with corresponding limiting portions (19).

8. The IGBT test socket according to claim 1, characterized in that: The first conductor (7) and the second conductor (10) are both in sheet form.

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