Semiconductor precision part test fixture
By introducing a buffer spring and a buffer rubber block into the semiconductor precision component test fixture, and using an adjustment mechanism to improve the upward stability of the clamping plate and semiconductor precision component, the problem of lack of buffering effect in the prior art is solved, and safety and stability during the clamping process are achieved.
Patent Information
- Application Number
- CN202421340235.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-13
- Publication Date
- 2025-03-11
- Estimated Expiration
- 2034-06-13
AI Technical Summary
Existing semiconductor precision parts testing fixtures lack cushioning effects. Excessive clamping force may lead to damage or surface wear of semiconductor precision parts, reducing practicality.
A semiconductor precision component testing fixture is designed, including a main mechanism and an adjustment mechanism. A buffer spring and a buffer rubber block are introduced into the main mechanism. The adjustment mechanism drives the clamping plate and semiconductor precision component upwards through a reciprocating motor and a screw, improving clamping stability.
Through the design of cushioning springs and cushioning rubber blocks, the cushioning effect is provided during the clamping process, avoiding damage and wear of semiconductor precision parts, and improving the practicality and stability of the test fixture.
Smart Images

Figure CN222589514U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of semiconductors, in particular to a semiconductor precision component testing fixture. Background Art
[0002] Semiconductors refer to materials whose electrical conductivity at room temperature is between that of conductors and insulators. Semiconductors are used in integrated circuits, photovoltaic power generation, lighting, and high-power power conversion. From the perspective of science and technology or economic development, semiconductors are very important.
[0003] The prior art patent document CN218313152U discloses a semiconductor precision parts test fixture, including a main body plate, a cylinder and an electrode block, a fixing plate is fixed on one side of the main body plate, the cylinder is installed on a side of the fixing plate away from the main body plate, a U-shaped frame is fixed on the side of the fixing plate facing the main body plate, the U-shaped frame is located above the main body plate, a push block is fixed on the power output end of the cylinder, and also includes a rotating rod, a connecting rod and a clamping rod; in the semiconductor precision parts test fixture of the utility model, a clamping rod, a fixing block, a support rod, a U-shaped frame, a fixing plate, a cylinder, a rotating rod, a connecting rod, a first rotating shaft, a second rotating shaft and a push block are provided, and through the coordinated use of the above components, when the cylinder is energized and working, the semiconductor precision parts can be clamped, and self-locking is completed by the above components, which can improve the clamping force, improve the stability of the semiconductor precision parts, and facilitate subsequent testing.
[0004] However, the semiconductor precision parts test fixture in the prior art CN218313152U patent does not have a certain buffering effect. If the clamping force is too strong, the semiconductor precision parts may be damaged and the surface of the semiconductor precision parts may be worn. It is not convenient to meet people's usage needs and reduces practicality. Utility Model Content
[0005] 1. Technical issues to be resolved
[0006] The utility model aims to provide a semiconductor precision component test fixture to solve the problem that the test fixture mentioned in the background technology does not have a certain buffering effect.
[0007] (II) Technical solution
[0008] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a semiconductor precision parts test fixture, comprising a main body mechanism and an adjustment mechanism, the adjustment mechanism is located at the upper end of the main body mechanism, the main body mechanism comprises a mounting seat, a placement block and a connecting plate, the placement block is fixedly mounted at the left end of the upper end of the mounting seat, and the connecting plate is located above the mounting seat;
[0009] The main mechanism also includes a fixed plate, an electric push rod, a buffer spring, a clamping plate and a buffer rubber block. The fixed plate is fixedly installed at the upper and lower ends of the left end of the connecting plate, the electric push rod is fixedly installed in the middle of the fixed plate, the buffer spring is movably installed at the outer end of the electric push rod, the clamping plate is fixedly installed in the middle of the transmission end of the electric push rod, the clamping plate is located in the middle of the buffer spring, and the buffer rubber block is fixedly installed in the middle of the clamping plate.
[0010] Preferably, the adjustment mechanism includes a connecting block, a mounting plate, a mounting groove, a reciprocating motor, a screw, a positioning nut, a groove, a sliding rod, a slider, a mounting block and a through hole. The connecting block is fixedly mounted at the middle of the rear end of the connecting plate, and the mounting plate is movably mounted at the rear end of the connecting block, thereby improving practicality.
[0011] Preferably, the mounting groove is fixedly arranged at the front end of the left end of the mounting plate, the reciprocating motor is fixedly installed at the front end of the upper end of the mounting plate, and the transmission end of the reciprocating motor extends to the inside of the mounting groove to facilitate driving the screw to rotate.
[0012] Preferably, the screw rod is fixedly installed at the lower end of the transmission end of the reciprocating motor, the screw rod is movably connected to the mounting groove, the positioning nut is threadedly installed at the outer end of the screw rod, and the positioning nut is located at the front end of the right end of the connecting block, which is convenient for driving the clamping plate and the semiconductor precision parts to move upward through the connecting block, facilitating subsequent testing work.
[0013] Preferably, the positioning nut is fixedly connected to the connecting block, the groove is fixedly arranged at the rear end of the left end of the mounting plate, the sliding rod is fixedly installed at the inner end of the groove, and the slider is movably installed at the outer end of the sliding rod, so as to improve the stability of the upward movement of the clamping plate and the semiconductor precision parts.
[0014] Preferably, the slider is located at the rear end of the right end of the connecting block, the slider is fixedly connected to the connecting block, the mounting block is fixedly mounted at the lower end of the outer end of the mounting seat, and the through hole is fixedly arranged at the inner end of the mounting block, which is easy to install and quick and convenient to use.
[0015] Compared with the prior art, the beneficial effects of the utility model are:
[0016] 1. The semiconductor precision parts test fixture has a certain buffering effect by installing the main body mechanism, which can avoid wear or damage to the semiconductor precision parts during the clamping process, meet people's use needs, and improve practicality;
[0017] 2. The semiconductor precision parts test fixture is installed with an adjustment mechanism, which makes it easy to drive the clamping plate and the semiconductor precision parts to move upward through the connecting block, which is convenient for subsequent testing work and improves the stability of the clamping plate and the semiconductor precision parts moving upward. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 It is a schematic diagram of the three-dimensional structure of the utility model;
[0019] Figure 2 This is a schematic diagram of the structure of the adjustment mechanism of the utility model;
[0020] Figure 3 This is a schematic diagram of the main structure of the utility model;
[0021] Figure 4 For this utility model Figure 3 Schematic diagram of the enlarged structure with local details.
[0022] In the figure: 1. main body mechanism; 101. mounting seat; 102. placement block; 103. connecting plate; 104. fixing plate; 105. electric push rod; 106. buffer spring; 107. clamping plate; 108. buffer rubber block; 2. adjustment mechanism; 201. connecting block; 202. mounting plate; 203. mounting groove; 204. reciprocating motor; 205. lead screw; 206. positioning nut; 207. groove; 208. slide rod; 209. slide block; 210. mounting block; 211. through hole. DETAILED DESCRIPTION
[0023] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0024] See also Figure 1-Figure 4 The utility model provides a technical solution: a semiconductor precision parts test fixture, including a main body mechanism 1 and an adjustment mechanism 2, the adjustment mechanism 2 is located at the upper end of the main body mechanism 1, the main body mechanism 1 includes a mounting seat 101, a placement block 102 and a connecting plate 103, the placement block 102 is fixedly installed at the left end of the upper end of the mounting seat 101, and the connecting plate 103 is located above the mounting seat 101;
[0025] The main body mechanism 1 also includes a fixed plate 104, an electric push rod 105, a buffer spring 106, a clamping plate 107 and a buffer rubber block 108. The fixed plate 104 is fixedly installed at the upper and lower ends of the left end of the connecting plate 103, the electric push rod 105 is fixedly installed in the middle of the fixed plate 104, the buffer spring 106 is movably installed at the outer end of the electric push rod 105, the clamping plate 107 is fixedly installed in the middle of the transmission end of the electric push rod 105, the clamping plate 107 is located in the middle of the buffer spring 106, and the buffer rubber block 108 is fixedly installed in the middle of the clamping plate 107.
[0026] The adjusting mechanism 2 includes a connecting block 201, a mounting plate 202, a mounting groove 203, a reciprocating motor 204, a screw 205, a positioning nut 206, a groove 207, a slide bar 208, a slider 209, a mounting block 210 and a through hole 211. The connecting block 201 is fixedly mounted in the middle of the rear end of the connecting plate 103, the mounting plate 202 is movably mounted at the rear end of the connecting block 201, the mounting groove 203 is fixedly arranged at the front end of the left end of the mounting plate 202, the reciprocating motor 204 is fixedly mounted at the front end of the upper end of the mounting plate 202, and the transmission of the reciprocating motor 204 is The movable end extends to the inside of the mounting groove 203, the screw rod 205 is fixedly installed at the lower end of the transmission end of the reciprocating motor 204, the screw rod 205 is movably connected to the mounting groove 203, the positioning nut 206 is threadedly installed at the outer end of the screw rod 205, the positioning nut 206 is located at the front end of the right end of the connecting block 201, the positioning nut 206 is fixedly connected to the connecting block 201, the groove 207 is fixedly set at the rear end of the left end of the mounting plate 202, the slide bar 208 is fixedly installed at the inner end of the groove 207, the slider 209 is movably installed at the outer end of the slide bar 208, and the slider 209 is located at the front end of the right end of the connecting block 201. At the rear end of the right end of the connecting block 201, the slider 209 is fixedly connected to the connecting block 201, the mounting block 210 is fixedly mounted at the lower end of the outer end of the mounting seat 101, and the through hole 211 is fixedly arranged at the inner end of the mounting block 210. First, when using the semiconductor precision parts test fixture, the staff puts the semiconductor precision parts on the placement block 102 for the convenience of subsequent clamping work, and the electric push rod 105 pushes the clamping plate 107 to clamp and fix the semiconductor precision parts. The buffer rubber block 108 contacts the semiconductor precision parts, which can not only improve the clamping plate 107 and the semiconductor precision parts. The friction force of the contact with the semiconductor precision parts can also prevent the clamping plate 107 from wearing the semiconductor precision parts during the clamping process. The buffer spring 106 can play a certain buffering role to prevent the semiconductor precision parts from being damaged. After clamping the semiconductor precision parts, the reciprocating motor 204 drives the screw rod 205 to rotate, the screw rod 205 drives the positioning nut 206 to move up, and the positioning nut 206 drives the connecting block 201 and the semiconductor precision parts to move up. During the movement, the connecting block 201 will synchronously drive the slider 209 to move on the slide rod 208, thereby improving the stability during the up and down movement.
[0027] Working principle: First, when using the semiconductor precision parts test fixture, the staff puts the semiconductor precision parts on the placement block 102 to facilitate the subsequent clamping work, and the electric push rod 105 pushes the clamping plate 107 to clamp and fix the semiconductor precision parts. The buffer rubber block 108 contacts the semiconductor precision parts, which can not only increase the friction between the clamping plate 107 and the semiconductor precision parts, but also avoid the wear of the semiconductor precision parts during the clamping process of the clamping plate 107. The buffer spring 106 can play a certain buffering role to prevent the semiconductor precision parts from being clamped. After clamping the semiconductor precision parts, the reciprocating motor 204 drives the lead screw 205 to rotate, and the lead screw 205 drives the positioning nut 206 to move up, and the positioning nut 206 drives the connecting block 201 and the semiconductor precision parts to move up. During the movement, the connecting block 201 will synchronously drive the slider 209 to move on the slide rod 208 to improve the stability during the up and down movement.
[0028] Finally, it should be noted that the above content is only used to illustrate the technical solution of the utility model, rather than to limit the protection scope of the utility model. Simple modifications or equivalent substitutions of the technical solution of the utility model by ordinary technicians in this field do not deviate from the essence and scope of the technical solution of the utility model.
Claims
1. A semiconductor precision component testing fixture, comprising a main body mechanism (1) and an adjustment mechanism (2), characterized in that: The adjustment mechanism (2) is located at the upper end of the main mechanism (1); the main mechanism (1) comprises a mounting seat (101), a placement block (102) and a connecting plate (103); the placement block (102) is fixedly mounted on the left end of the upper end of the mounting seat (101); and the connecting plate (103) is located above the mounting seat (101); The main body mechanism (1) further comprises a fixing plate (104), an electric push rod (105), a buffer spring (106), a clamping plate (107) and a buffer rubber block (108); the fixing plate (104) is fixedly mounted at the upper and lower ends of the left end of the connecting plate (103); the electric push rod (105) is fixedly mounted at the middle of the fixing plate (104); the buffer spring (106) is movably mounted at the outer end of the electric push rod (105); the clamping plate (107) is fixedly mounted at the middle of the transmission end of the electric push rod (105); the clamping plate (107) is located at the middle of the buffer spring (106); and the buffer rubber block (108) is fixedly mounted at the middle of the clamping plate (107).
2. A semiconductor precision parts test fixture according to claim 1, characterized in that: The adjusting mechanism (2) comprises a connecting block (201), a mounting plate (202), a mounting groove (203), a reciprocating motor (204), a screw rod (205), a positioning nut (206), a groove (207), a sliding rod (208), a slider (209), a mounting block (210) and a through hole (211); the connecting block (201) is fixedly mounted at the middle of the rear end of the connecting plate (103); and the mounting plate (202) is movably mounted at the rear end of the connecting block (201).
3. A semiconductor precision component test fixture according to claim 2, characterized in that: The mounting groove (203) is fixedly arranged at the front end of the left end of the mounting plate (202), the reciprocating motor (204) is fixedly mounted at the front end of the upper end of the mounting plate (202), and the transmission end of the reciprocating motor (204) extends into the interior of the mounting groove (203).
4. A semiconductor precision component test fixture according to claim 3, characterized in that: The screw rod (205) is fixedly mounted at the lower end of the transmission end of the reciprocating motor (204), the screw rod (205) is movably connected to the mounting groove (203), the positioning nut (206) is threadedly mounted on the outer end of the screw rod (205), and the positioning nut (206) is located at the front end of the right end of the connecting block (201).
5. A semiconductor precision component test fixture according to claim 4, characterized in that: The positioning nut (206) is fixedly connected to the connecting block (201), the groove (207) is fixedly arranged at the rear end of the left end of the mounting plate (202), the sliding rod (208) is fixedly installed at the inner end of the groove (207), and the sliding block (209) is movably installed at the outer end of the sliding rod (208).
6. A semiconductor precision component test fixture according to claim 5, characterized in that: The slider (209) is located at the rear end of the right end of the connecting block (201), the slider (209) is fixedly connected to the connecting block (201), the mounting block (210) is fixedly mounted at the lower end of the outer end of the mounting seat (101), and the through hole (211) is fixedly arranged at the inner end of the mounting block (210).
Citation Information
Patent Citations
Semiconductor precision part test fixture
CN218313152U