Semiconductor silicon wafer detection lighting device

Abstract

The utility model provides a semiconductor silicon wafer detection lighting device, which relates to the technical field of semiconductor silicon wafer detection and comprises a detection device body and a snakelike connecting sleeve arranged at the upper end of the detection device body. A first snake-shaped connecting rod is arranged at the upper end of the fastening block, an extrusion placing ring is arranged at the upper end of the first snake-shaped connecting rod, a built-in extrusion arc-shaped block is arranged on the inner side of the extrusion placing ring, an adjusting threaded rod is connected to the side face of the built-in extrusion arc-shaped block, and a second snake-shaped connecting rod is arranged on the side face of the first snake-shaped connecting rod; the tail end of the second snake-shaped connecting rod is connected with a magnifying lens body, the distance between the built-in extrusion arc-shaped block and the built-in extrusion arc-shaped block can be adjusted through an adjusting threaded rod, and an extrusion placing ring is connected with the stretching connecting column in a clamped mode through a stretching spring; through the improvement, the observation definition and the working efficiency of workers can be effectively improved, and the use practicability of the semiconductor silicon wafer detection lighting device can be improved.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor silicon wafer detection, in particular to a semiconductor silicon wafer detection lighting device. Background Art

[0002] Silicon wafers, also known as silicon wafers, are important materials for making integrated circuits. Integrated circuits and various semiconductor devices can be made by photolithography, ion implantation and other means. The semiconductor silicon wafer detection lighting device is used for semiconductor silicon wafer surface defect inspection lamp. The lamp body uses wavelength light between 510-590NM, which is sensitive to human eyes. It is a desktop inspection lamp that can detect scratches or particles below 1um, and has a composite light of two colors, green light and yellow light, which can almost detect dust and greatly reduce the defective rate of wafers. The service life is more than 20,000 hours. The light source intensity can reach 90,000LX, and can detect surface dirt as small as 1μ, which is 10 times more effective than traditional inspection lamps.

[0003] The existing application number is CN201820771437.9, which discloses a lighting device for detection, including a housing, a concave ring groove is arranged on the housing, a first fixing ring is arranged at the concave ring groove, and the first fixing ring is connected to the first cable; a second fixing ring for sleeved on the wrist is connected to the second cable; a length adjustment component has a main body, the main body has an inner cavity, a first through hole is arranged at the top of the main body, a second through hole is arranged at the bottom of the main body, a first adjustment rod is arranged in the first through hole, the upper end of the first adjustment rod is connected to the first cable, a second adjustment rod is arranged in the second through hole, and the lower end of the second adjustment rod is connected to the second cable, an elastic body is arranged in the inner cavity, the elastic body has a first disc portion located on the upper side and a second disc portion located on the lower side, a spring is arranged between the first disc portion and the second disc portion, the first disc portion is pressed against the first adjustment rod, and the second disc portion is pressed against the second adjustment rod; and negative pressure ventilation components are arranged on the upper and lower parts of the main body. The utility model can avoid falling from the hand when used, thereby improving safety.

[0004] However, when the semiconductor silicon wafer inspection lighting device is held by the user for inspection, if the inspection time is long, it is easy to cause fatigue of the inspector and reduce work efficiency. At the same time, when the defects are minor, it is difficult for the staff to detect them, and negligence can easily affect subsequent products. The utility model improves the above-mentioned problems, and specifically relates to a semiconductor silicon wafer inspection lighting device that is convenient for clamping according to the size of the crystal and convenient for observation. Utility Model Content

[0005] Based on this, it is necessary to provide a semiconductor silicon wafer inspection lighting device to address the problem that when a semiconductor silicon wafer inspection lighting device is held by a user for inspection, after a long inspection time, it is easy for the inspector to become fatigued, resulting in reduced work efficiency. At the same time, when the defects are minor, it is difficult for the staff to detect them, and negligence can easily affect subsequent products.

[0006] The utility model provides a semiconductor silicon wafer detection lighting device, comprising: a detection device body and a serpentine connecting sleeve arranged at the upper end of the detection device body; an irradiation lamp body is arranged at the end of the serpentine connecting sleeve. In the above-mentioned semiconductor silicon wafer detection lighting device, a fastening block is arranged at the middle upper side of the detection device body, a first serpentine connecting rod is arranged at the upper end of the fastening block, an extrusion placement ring is arranged at the upper end of the first serpentine connecting rod, the extrusion placement ring is divided into two parts, the two parts of the extrusion placement ring are connected by the tension spring and the tension connection column arranged thereon, a built-in extrusion arc block is arranged on the inner side of the extrusion placement ring, the side of the built-in extrusion arc block is connected with an adjustment threaded rod, a second serpentine connecting rod is arranged on the side of the first serpentine connecting rod, the end of the second serpentine connecting rod is connected with a magnifying glass body, the distance between the built-in extrusion arc block can be adjusted by adjusting the threaded rod, and the extrusion placement ring is connected by a tension spring and the tension connection column.

[0007] In one of the embodiments, a lamp shield is disposed at the lower end of the irradiation lamp body, and the lamp shield is made of organic glass material.

[0008] In one embodiment, an extrusion block is provided on the side of the fastening block, and a rubber pad is provided on the inner side of the extrusion block.

[0009] In one of the embodiments, a connecting and adjusting threaded rod is connected to the inner side surface of the extrusion block near the upper end, a toggle knob is arranged on the outer side of the connecting and adjusting threaded rod, and vertical lines are arranged on the outer side of the toggle knob.

[0010] In one of the embodiments, a control button is provided near the left side of the upper end of the detection device body, and the control button controls the switch and switching of the irradiation lamp body.

[0011] In one of the embodiments, a side air-permeable net is provided on the front side of the detection device body, and the side air-permeable net is installed and connected by means of snap-fitting and fastening with screws.

[0012] In one embodiment, a rear connection plug hole is provided on the right side of the detection device body, and the detection device body is electrically connected to an external power source by plugging an external connection power source into the rear connection plug hole.

[0013] In one embodiment, a bottom rubber base is provided at the bottom of the detection device body, and a thread is provided on the outer side of the bottom rubber base near the upper end. The bottom rubber base is rotatably installed and connected to the lower end of the bottom rubber base near the corner through the thread.

[0014] Compared with the prior art, the utility model provides a semiconductor silicon wafer detection lighting device, which has the following beneficial effects:

[0015] In the semiconductor silicon wafer detection lighting device, the above-mentioned semiconductor silicon wafer detection lighting device, a fastening block is arranged on the middle upper side of the detection device body, a first serpentine connecting rod is arranged on the upper end of the fastening block, an extrusion placement ring is arranged on the upper end of the first serpentine connecting rod, the extrusion placement ring is divided into two parts, the two parts of the extrusion placement ring are connected by a tension spring and a tension connecting column arranged thereon, a built-in extrusion arc block is arranged on the inner side of the extrusion placement ring, the side of the built-in extrusion arc block is connected with an adjustment threaded rod, the side of the first serpentine connecting rod is arranged with a second serpentine connecting rod, the end of the second serpentine connecting rod is connected with a magnifying glass body, the built-in extrusion arc block can adjust the distance between the threaded rods, the extrusion placement ring is connected by a tension spring and the tension connecting column, after the clamping, the bending angle can be arbitrarily adjusted and maintained by the first serpentine connecting rod and the second serpentine connecting rod, the user can clearly observe the surface of the semiconductor silicon wafer through the magnifying glass body, and this improvement can effectively reduce the fatigue of the user during operation, thereby effectively improving the observation clarity and work efficiency of the staff, thereby effectively improving the practicality of the semiconductor silicon wafer detection lighting device. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a schematic diagram of the overall structure of the semiconductor silicon wafer detection lighting device of the utility model;

[0017] Figure 2 This is a schematic diagram of the structure of the fastening block of the semiconductor silicon wafer detection lighting device of the utility model;

[0018] Figure 3 It is a schematic diagram of the cross-sectional structure of the extrusion placement ring of the semiconductor silicon wafer detection lighting device of the utility model;

[0019] Figure 4 It is a schematic diagram of the top cross-sectional structure of the fastening block of the semiconductor silicon wafer detection lighting device of the present utility model.

[0020] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0021] 1. Detection device body; 2. Rear connection socket; 3. Bottom rubber base; 4. Control button; 5. Side air permeable net; 6. Serpentine connection sleeve; 7. Illumination lamp body; 8. Lamp shield; 9. Extrusion placement ring; 10. Adjustment threaded rod; 11. First serpentine connecting rod; 12. Second serpentine connecting rod; 13. Magnifying glass body; 14. Fastening block; 15. Toggle knob; 16. Extrusion block; 17. Tension spring; 18. Tension connecting column; 19. Built-in extrusion arc block; 20. Connecting adjustment threaded rod. DETAILED DESCRIPTION

[0022] In order to make the above-mentioned purposes, features and advantages of the utility model more obvious and easy to understand, the specific implementation methods of the utility model are described clearly and completely below in conjunction with the accompanying drawings. Obviously, the specific details described below are only part of the embodiments of the utility model, and the utility model can also be implemented in many other embodiments different from those described here. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work belong to the protection scope of the utility model.

[0023] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only implementation method.

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention.

[0025] Please refer to Figure 1The utility model provides a semiconductor silicon wafer detection lighting device, comprising: a detection device body 1 and a serpentine connecting sleeve 6 arranged at the upper end of the detection device body 1. The end of the serpentine connecting sleeve 6 is provided with an irradiation lamp body 7; a fastening block 14 is provided on the middle upper side of the detection device body 1, and a first serpentine connecting rod 11 is provided on the upper end of the fastening block 14, and an extrusion placement ring 9 is provided on the upper end of the first serpentine connecting rod 11, and the extrusion placement ring 9 is divided into two parts, and the two parts of the extrusion placement ring 9 are connected by a tension spring 17 and a tension connecting column 18 arranged thereon, and a built-in extrusion arc block 19 is provided on the inner side of the extrusion placement ring 9, and the side of the built-in extrusion arc block 19 is connected with an adjusting threaded rod 10, and a second serpentine connecting rod 12 is provided on the side of the first serpentine connecting rod 11, and the end of the second serpentine connecting rod 12 is provided. The end is connected to a magnifying glass body 13, and the built-in extrusion arc block 19 can adjust the distance between the threaded rod 10, and the extrusion placement ring 9 is clamped and connected by a tension spring 17 and a tension connecting column 18. After clamping, the bending angle can be arbitrarily adjusted and maintained through the first serpentine connecting rod 11 and the second serpentine connecting rod 12. The user can clearly observe the surface of the semiconductor silicon wafer through the magnifying glass body 13. This improvement can effectively reduce the fatigue of the user during operation, thereby effectively improving the observation clarity and work efficiency of the staff, thereby effectively improving the practicality of the semiconductor silicon wafer detection lighting device.

[0026] like Figure 1 As shown, a lamp shield 8 is provided at the lower end of the irradiation lamp body 7, and the lamp shield 8 is made of organic glass material. Organic glass material is a material with high light transmittance, rich colors and strong impact resistance. Compared with glass material, organic glass is lighter, less prone to breakage and has better processability.

[0027] like Figure 1 Figure 2 and Figure 4 As shown, an extrusion block 16 is arranged on the side of the fastening block 14, a rubber pad is arranged on the inner side of the extrusion block 16, a connecting and adjusting threaded rod 20 is connected to the inner side of the extrusion block 16 near the upper end, a toggle knob 15 is arranged on the outer side of the connecting and adjusting threaded rod 20, and vertical lines are arranged on the outer side of the toggle knob 15. By turning the toggle knob 15, the connecting and adjusting threaded rod 20 pulls the extrusion block 16 for extrusion connection, which can facilitate fastening and installation.

[0028] like Figure 1 As shown, a control button 4 is provided at the upper end of the detection device body 1 near the left side, and the control button 4 controls the switch and switching of the irradiation lamp body 7. A rear connection plug hole 2 is provided on the right side of the detection device body 1. The detection device body 1 is electrically connected to the external power supply by plugging an external connection power supply into the rear connection plug hole 2. The control button 4 controls the start and stop of the detection device body 1.

[0029] like Figure 1 As shown, a side air-permeable net 5 is provided on the front side of the detection device body 1, and the side air-permeable net 5 is installed and connected by means of snap-fitting and screw fastening. The side air-permeable net 5 can accelerate the air circulation inside and outside the detection device body 1, so that the inside of the detection device body 1 can be better heat-dissipated, thereby effectively avoiding the phenomenon that the life of components is greatly reduced due to high internal heat.

[0030] like Figure 1 As shown, a bottom rubber base 3 is provided at the bottom of the detection device body 1, and a thread is provided on the outer side of the bottom rubber base 3 near the upper end. The bottom rubber base 3 is rotatably installed and connected to the lower end of the bottom rubber base 3 near the corner by the thread. The bottom rubber base 3 can increase the friction between the placement surface, thereby effectively avoiding the phenomenon that the detection device body 1 slides off the placement surface and is damaged when placed.

[0031] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0032] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the utility model patent. It should be pointed out that for ordinary technicians in this field, several deformations, substitutions and improvements can be made without departing from the concept of the utility model, which should be included in the protection scope of the utility model. Therefore, the protection scope of the utility model patent should be based on the claims.

Claims

1. A semiconductor silicon wafer inspection lighting device, characterized in that: include: A detection device body (1) and a serpentine connecting sleeve (6) arranged at the upper end of the detection device body (1); an irradiation lamp body (7) is arranged at the end of the serpentine connecting sleeve (6); a fastening block (14) is arranged on the middle upper side of the detection device body (1), a first serpentine connecting rod (11) is arranged at the upper end of the fastening block (14), an extrusion placement ring (9) is arranged at the upper end of the first serpentine connecting rod (11), and the extrusion placement ring (9) is divided into two parts, and the two parts of the extrusion placement ring (9) are connected by a tension spring (17) and a tension connection column (17) arranged thereon. 8) for connection, the inner side of the extrusion placement ring (9) is provided with a built-in extrusion arc block (19), the side of the built-in extrusion arc block (19) is connected with an adjusting threaded rod (10), the side of the first serpentine connecting rod (11) is provided with a second serpentine connecting rod (12), the end of the second serpentine connecting rod (12) is connected with a magnifying glass body (13), the built-in extrusion arc block (19) can be adjusted by adjusting the threaded rod (10), and the extrusion placement ring (9) is connected by a clamping connection with the stretching spring (17) and the stretching connecting column (18).

2. The semiconductor silicon wafer inspection lighting device according to claim 1, characterized in that: A lamp shield (8) is provided at the lower end of the irradiation lamp body (7), and the lamp shield (8) is made of organic glass material.

3. The semiconductor silicon wafer inspection lighting device according to claim 1, characterized in that: An extrusion block (16) is arranged on the side surface of the fastening block (14), and a rubber pad is arranged on the inner side surface of the extrusion block (16).

4. The semiconductor silicon wafer inspection lighting device according to claim 3, characterized in that: The inner side surface of the extrusion block (16) is connected to a connection adjustment threaded rod (20) near the upper end, and the outer side of the connection adjustment threaded rod (20) is provided with a toggle knob (15), and the outer side of the toggle knob (15) is provided with vertical lines.

5. The semiconductor silicon wafer inspection lighting device according to claim 1, characterized in that: A control button (4) is provided on the upper end of the detection device body (1) near the left side, and the control button (4) controls the switch and switching of the irradiation lamp body (7).

6. The semiconductor silicon wafer inspection lighting device according to claim 1, characterized in that: The front side of the detection device body (1) is provided with a side air-permeable net (5), and the side air-permeable net (5) is installed and connected by means of snap-fitting and screw fastening.

7. The semiconductor silicon wafer inspection lighting device according to claim 1, characterized in that: The right side of the detection device body (1) is provided with a rear connection plug hole (2), and the detection device body (1) is electrically connected to an external power supply by plugging an external connection power supply into the rear connection plug hole (2).

8. The semiconductor silicon wafer inspection lighting device according to claim 1, characterized in that: A bottom rubber base (3) is provided at the bottom of the detection device body (1); a thread is provided on the outer side of the bottom rubber base (3) near the upper end; the bottom rubber base (3) is rotatably mounted and connected to the lower end of the bottom rubber base (3) near the corner via the thread.

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