X-ray fluorescence spectrum analyzer
By setting up a strong magnetic electron trap device in an X-ray fluorescence spectrometer, the magnetic field deflects the moving electrons, the problem of high-energy X-ray fluorescence generating free electrons in a non-vacuum environment is solved, and the effect of reducing background noise and improving analysis accuracy is achieved.
Patent Information
- Application Number
- CN202421004407.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-10
- Publication Date
- 2025-03-14
- Estimated Expiration
- 2034-05-10
AI Technical Summary
In X-ray fluorescence spectrometer, when high-energy X-ray fluorescence is transmitted in a non-vacuum environment, it is easy to interact with gas molecules and produce free electrons. These electrons may enter the detector, resulting in an increase in background noise, reducing the signal-to-noise ratio, and affecting the analysis accuracy.
A strong magnetic electron trap device is designed, with the ring outside the detector window, and the magnetic field generated by the strong magnet applies a Lorentz force to move the electrons, causing them to deflect outside the detector window, thereby reducing the free electrons entering the detector.
It effectively reduces background noise signals, improves the signal-to-noise ratio and sensitivity of the X-ray fluorescence spectrometer, and reduces noise interference.
Smart Images
Figure CN222618532U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to an X-ray fluorescence spectrometer. Background Art
[0002] X-ray fluorescence spectrometer can be used to analyze the type and content of elements in samples. In order to stimulate the X-ray fluorescence of the target element in the sample, the energy of the incident X-ray of the X-ray fluorescence spectrometer needs to be higher than the excitation limit of the element. When the atomic number of the target element is high, the energy of the incident X-ray also needs to be increased accordingly, and the fluorescence energy emitted by the sample after being excited will also be higher. If the light path from the fluorescence to the detector is not a vacuum environment, the X-rays will interact with the gas molecules on the light path, including Rayleigh scattering, Compton scattering and photoelectric effect, among which Compton scattering and photoelectric effect can generate free electrons. If these electrons have high energy and are close to the detector, they will enter the detector and form an electrical signal, causing an increase in the background, resulting in a reduction in the signal-to-noise ratio, and causing adverse consequences such as noise interference and reduced sensitivity of the X-ray fluorescence spectrometer. Utility Model Content
[0003] The present application provides an X-ray fluorescence spectrometer, which can reduce the number of free electrons entering a detector, thereby achieving the purpose of reducing background noise signals.
[0004] Specifically, the present application is implemented through the following technical solutions: an X-ray fluorescence spectrometer, comprising a light tube, a sample and a detector, wherein the light tube generates X-rays, the sample is irradiated by the X-rays and stimulates X-ray fluorescence, a window for receiving X-ray fluorescence is provided at the front end of the detector, and the detector also comprises a strong magnetic electron trap device, wherein the strong magnetic electron trap device is arranged on the optical path from the sample to the detector, and the magnetic field generated by the strong magnetic electron trap device deflects electrons moving on the optical path from the sample to the detector to outside the window of the detector.
[0005] Furthermore, the strong magnetic electron trap device is arranged outside the window of the detector.
[0006] Furthermore, the strong magnetic electron trap device includes a bracket and a plurality of strong magnets fixed to the bracket.
[0007] Furthermore, the bracket has a plurality of grooves evenly distributed along the circumference, and the strong magnets are fixed in the grooves.
[0008] Furthermore, the bracket is made of plastic.
[0009] The X-ray fluorescence spectrometer of the present application is provided with a strong magnetic electron trap device, which can deflect moving electrons outside the detector window under the action of the Lorentz force, thereby reducing the number of free electrons entering the detector and achieving the purpose of reducing background noise signals.
[0010] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS
[0011] Figure 1 is a three-dimensional schematic diagram of an X-ray fluorescence spectrometer according to one embodiment of the present application;
[0012] Figure 2 for Figure 1 A top view of an X-ray fluorescence spectrometer in FIG.
[0013] Figure 3 For along Figure 2 The cross-sectional view obtained along the AA line in FIG.
[0014] Figure 4 for Figure 1 A stereogram of the magnetic ring of the X-ray fluorescence spectrometer in FIG.
[0015] Figure 5 for Figure 4 Schematic diagram of the setting method of the strong magnets in the central magnetic ring.
[0016] Description of drawing numbers:
[0017] X-ray fluorescence spectrometer 100 , light tube 1 , sample 2 , detector 3 , window 31 , strong magnetic electron trap device 4 , bracket 41 , strong magnet 42 , center hole 43 . DETAILED DESCRIPTION
[0018] Here, exemplary embodiments will be described in detail, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. Instead, they are only examples of devices, systems, equipment and methods consistent with some aspects of the present application.
[0019] refer to Figures 1 to 3 As shown, an X-ray fluorescence spectrometer 100 according to one embodiment of the present application includes a light tube 1, a sample 2 and a detector 3. The light tube 1 generates X-rays and irradiates the X-rays at a certain angle onto the sample 2 placed on a sample table (not shown). Multiple elements in the sample 2 are excited and generate corresponding X-ray fluorescence. The detector 3 receives these X-ray fluorescence to determine the types and contents of elements contained in the sample.
[0020] When the energy of the X-rays provided by the light tube 1 is high, the energy of the X-ray fluorescence emitted by the sample 2 after being excited is also high, and the light path from the X-ray fluorescence to the detector 3 is not a vacuum environment, the X-ray fluorescence will react with the gas molecules on the light path by photoelectric effect and other effects to generate free electrons. The electrons entering the detector 3 will cause noise interference and reduced sensitivity of the X-ray fluorescence spectrometer 10 and other adverse consequences. In order to reduce the impact of the above situation, the X-ray fluorescence spectrometer 100 of the present application also includes a ring-shaped strong magnetic electron trap device 4, which is located on the light path from the sample 2 to the detector 3. In this embodiment, the ring is arranged outside the front window 31 of the detector 3. The magnetic field generated by the strong magnetic electron trap device 4 has no effect on the X-ray fluorescence, and the X-ray fluorescence can enter the window 31 of the detector 3 normally through the central hole 43 of the strong magnetic electron trap device 4; however, the magnetic field generated by the strong magnetic electron trap device 4 will form a Lorentz force on the moving electrons, and the electrons will deflect their motion trajectory under the action of the Lorentz force. The direction of the Lorentz force can be determined by the left-hand rule. By properly setting the direction of the magnetic field, the electrons can be deflected outside the window 31 of the detector 3 under the action of the Lorentz force, thereby reducing the number of free electrons entering the detector 3 and achieving the purpose of reducing the background noise signal.
[0021] Combination Figure 4 As shown, the strong magnetic electron trap device 4 includes an annular bracket 41 and a plurality of strong magnets 42 fixed to the bracket 41. The bracket 41 is made of plastic and is provided with a plurality of grooves (unnumbered) evenly distributed along the circumference. The grooves (unnumbered) penetrate the bracket 41 forward and radially outward to facilitate the assembly and fixation of the strong magnets 42. The strong magnets 42 are roughly square blocks, consistent with the shape of the grooves (unnumbered), and can be embedded in the grooves (unnumbered) and fixed. In this embodiment, the strong magnetic electron trap device 4 is provided with eight strong magnets 42. The strong magnets 42 include an N pole and an S pole. The specific arrangement can be referred to. Figure 5 shown.
[0022] The X-ray fluorescence spectrometer 100 of the present application is provided with a strong magnetic electron trap device 4 for free electrons, which can affect the movement trajectory of electrons to prevent a large number of electrons from entering the detector 3, reduce background noise signals, and improve the sensitivity of the X-ray fluorescence spectrometer.
[0023] The above is only a preferred implementation mode of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.
Claims
1. An X-ray fluorescence spectrometer, comprising a light tube, a sample and a detector, wherein the light tube generates X-rays, the sample is irradiated by the X-rays and excites X-ray fluorescence, and a window for receiving X-ray fluorescence is provided at the front end of the detector, characterized in that: It also includes a strong magnetic electron trap device, which is arranged on the optical path from the sample to the detector. The magnetic field generated by the strong magnetic electron trap device deflects electrons moving on the optical path from the sample to the detector to outside the window of the detector.
2. The X-ray fluorescence spectrometer according to claim 1, characterized in that: The strong magnetic electron trap device is arranged outside the window of the detector.
3. The X-ray fluorescence spectrometer according to claim 2, characterized in that: The strong magnetic electron trap device comprises a bracket and a plurality of strong magnets fixed on the bracket.
4. The X-ray fluorescence spectrometer according to claim 3, characterized in that: The bracket is evenly distributed with a plurality of grooves along the circumference, and the strong magnets are fixed in the grooves.
5. The X-ray fluorescence spectrometer according to claim 3, characterized in that: The bracket is made of plastic.