Circuit checking and testing device

Abstract

The utility model relates to the technical field of electronic component quality inspection, and discloses a circuit inspection testing device which comprises a base, two vertical frames are fixedly connected to the middle position of the top of the base in a front-back symmetrical mode, and the same testing host mechanism is fixedly installed between the side walls of the opposite sides of one ends of the two vertical frames. The side walls of the separated sides of the other ends of the two vertical frames are each fixedly connected with a fixing frame, strip-shaped grooves are formed between the front side wall and the rear side wall of each fixing frame, the two strip-shaped grooves are symmetrically formed in the front-back direction, and a detection probe mechanism is arranged between the two strip-shaped grooves. According to the utility model, the detection probe mechanism is of a rotatable structure, so that after the detection work of electronic components to be detected is completed, unqualified components can be directly taken out, collected and discarded, and the detection probe mechanism can be pulled and rotated by holding the handle if the components are not unqualified or all the components are qualified; and the detected components are poured onto a foam pad below for qualified product collection, and the detected circuit components can be conveniently classified and collected.

Description

Technical Field

[0001] The utility model relates to the technical field of electronic component quality inspection, in particular to a circuit inspection and testing device. Background Art

[0002] Electronic components are components of electronic components and small electrical machines and instruments. There are many types of electronic components, which can be roughly divided into two categories, one is components, such as resistors, capacitors, inductors, etc., and the other is devices, such as transistors, diodes, field effect transistors and integrated circuits. In terms of quality, electronic components have international certifications such as the EU CE certification, the US UL certification, Germany's VDE and TUV, and China's CQC certification to ensure the qualification of components. At present, after the electronic components are manufactured, circuit inspection and testing equipment is needed for quality inspection.

[0003] The utility model with prior art publication number CN203688752U relates to circuit board function testing equipment, including a test needle bed, a circuit board to be tested and the test needle bed are arranged correspondingly, a clamping device is arranged relative to the test needle bed, and the circuit board to be tested is pressed on the test needle bed, a detection system is connected to the circuit board to be tested, and the circuit board to be tested is automatically detected, which can solve the problem in the prior art that the circuit board testing steps are complicated and easily cause misjudgment by inspectors.

[0004] However, the above-mentioned device still has the following problems when in use: when the existing circuit inspection and testing device performs electronic component inspection, it is often necessary to use a handheld inspection probe to inspect each individual electronic component to be inspected one by one, and the efficiency of the overall circuit inspection and testing work is low. At the same time, the circuit components after inspection cannot be conveniently classified and collected. Utility Model Content

[0005] 1. Technical issues to be solved

[0006] In view of the deficiencies in the prior art, the utility model provides a circuit inspection and testing device, which is provided with a placement-type detection probe mechanism, and the detection probe mechanism is a rotatable structure, thereby solving the problems raised by the background technology.

[0007] (II) Technical solution

[0008] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a circuit inspection test device, including a base, wherein two vertical frames are fixedly connected to the middle position of the top of the base in a front-to-back symmetrical shape, the same test host mechanism is fixedly installed between the side walls facing each other at one end of the two vertical frames, and a fixed frame is fixedly connected to each side wall away from the other end of the two vertical frames, a strip groove is opened between the front and rear side walls of the fixed frame, the two strip grooves are arranged in a front-to-back symmetrical shape and a detection probe mechanism is arranged between them, the detection probe mechanism includes a limiting rotating block slidably connected to the bottom of the two strip grooves, and the same test table is fixedly connected between the two limiting rotating blocks. The two limit rotating blocks are each fixedly connected to a handle at the center position of the side wall on one side. A limit card slot is provided at the top of the stand and at both ends of the fixed frame. The same card block is slidably installed in the two limit card slots at the same end. The top of the card block is fixedly connected to the same test bench. The detection probe mechanism is a rotatable structure. That is, after completing the inspection of the electronic components to be inspected, if there are unqualified components, they are directly taken out and collected for scrapping. If there are no unqualified components or all are qualified, the handle is held to lift and rotate the detection probe mechanism to dump the components after inspection onto the foam pad below for qualified collection. The circuit components after inspection can be conveniently classified and collected.

[0009] As a further solution of the utility model: four test card slots are provided on the top of the test bench in a rectangular array, and the test circuits in the four test card slots are connected to the detection data transmission terminal in the test bench through parallel lines. The test host mechanism includes a circuit test micro host fixedly installed between two stands, and the circuit test micro host is connected to the test bench through a connecting line. The whole is provided with a placeable detection probe mechanism, that is, the overall circuit detector connects the detection probe mechanism and the test host mechanism through a connecting line, and the top of the detection probe mechanism is provided with four electronic component access slots for detection. Each electronic component access circuit is designed as a parallel circuit, which can cooperate with the test host mechanism to detect multiple electronic components to be detected.

[0010] As a further solution of the utility model: a plurality of heat dissipation holes are opened on the rear side of one end of the circuit testing micro host, a power supply line is arranged on the front side of one end of the circuit testing micro host, a feedback light group is arranged on the rear end of one top side of the circuit testing micro host, and three control switches are arranged horizontally and equidistantly on the front end of one top side of the circuit testing micro host, which can be used to control the circuit testing micro host. The circuit testing micro host can analyze and process the detection data transmitted from the test bench, and cooperate with the feedback light group to provide feedback on the circuit testing working status.

[0011] As a further solution of the utility model: the top wall of the base is fixedly connected to a foam pad at the bottom of the test bench, which plays a role in protecting electronic components from tipping over. Both ends of the top wall of the base are fixedly connected to a handle frame, which can be held to lift and move the entire device. The four corners of the bottom wall of the base are fixedly connected to an anti-slip pad, which can be used for anti-slip placement of the entire device.

[0012] Compared with the prior art, the beneficial effects of the utility model are:

[0013] 1. In the utility model, a placement-type detection probe mechanism is provided, that is, the overall circuit detector connects the detection probe mechanism and the test host mechanism through a connecting line, and four electronic component access card slots for detection are provided on the top of the detection probe mechanism. Each electronic component access circuit is designed as a parallel circuit, which can cooperate with the test host mechanism to detect multiple electronic components to be detected.

[0014] 2. In the utility model, the detection probe mechanism is a rotatable structure, that is, after the detection of the electronic components to be detected is completed, if there are unqualified components, they will be directly taken out and collected for scrapping. If there are no unqualified components or all are qualified, the detection probe mechanism is pulled and rotated by holding the handle to dump the detected components onto the foam pad below for qualified collection. The circuit components after detection can be conveniently classified and collected. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is an overall three-dimensional diagram of the utility model;

[0016] Figure 2 This is a three-dimensional diagram of the base structure of the utility model;

[0017] Figure 3 This is a three-dimensional diagram of the test host mechanism of the utility model;

[0018] Figure 4 It is a three-dimensional diagram of the detection probe mechanism of the utility model.

[0019] In the figure: 1. base; 2. stand; 3. test host mechanism; 4. detection probe mechanism; 5. fixing frame; 6. strip groove; 7. limit card slot; 8. anti-slip pad; 9. handle frame; 10. connecting wire; 11. foam pad; 31. circuit test micro host; 32. feedback light group; 33. control switch; 34. heat dissipation hole; 35. power supply line; 41. test bench; 42. test card slot; 43. card block; 44. limit rotation block; 45. handle. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0021] It should be noted that the circuit testing micro host 31 is a prior art and is common knowledge to those skilled in the art, and will not be described in detail herein.

[0022] See also Figures 1 to 4 In an embodiment of the utility model, a circuit inspection and testing device comprises a base 1, wherein two vertical frames 2 are fixedly connected to the middle position of the top of the base 1 in a front-to-back symmetrical shape, and the same test host mechanism 3 is fixedly installed between the side walls of the two vertical frames 2 at one end facing each other, and a fixing frame 5 is fixedly connected to each side wall of the other end of the two vertical frames 2, and a strip groove 6 is opened between the front and rear side walls of the fixing frame 5, and the two strip grooves 6 are arranged in a front-to-back symmetrical shape and a detection probe mechanism 4 is arranged between them, and the detection probe mechanism 4 includes a limit rotation block 44 slidably connected to the bottom of the two strip grooves 6, and the same test table 41 is fixedly connected between the two limit rotation blocks 44, and the two limit rotation blocks 4 4 are fixedly connected to the center position of the side walls on one side, and a limit card slot 7 is provided at the top of the stand 2 and at both ends of the fixed frame 5. The same card block 43 is slidably installed in the two limit card slots 7 at the same end, and the top of the card block 43 is fixedly connected to the same test bench 41. The detection probe mechanism 4 is a rotatable structure, that is, after completing the detection of the electronic components to be detected, if there are unqualified components, they are directly taken out and collected for scrapping. If there are no unqualified components or all are qualified, the handle 45 is held to lift and rotate the detection probe mechanism 4 to dump the detected components onto the foam pad 11 below for qualified collection. The circuit components after detection can be conveniently classified and collected.

[0023] Four test card slots 42 are provided in a rectangular array on the top of the test bench 41. The test circuits in the four test card slots 42 are connected to the detection data transmission terminal in the test bench 41 through parallel lines. The test host mechanism 3 includes a circuit test micro host 31 fixedly installed between two stands 2. The circuit test micro host 31 is connected to the test bench 41 through a connecting line 10. A placement-type detection probe mechanism 4 is provided as a whole, that is, the overall circuit detector connects the detection probe mechanism 4 and the test host mechanism 3 through a connecting line 10. Four electronic component access slots for detection are provided on the top of the detection probe mechanism 4. Each electronic component access circuit is designed as a parallel circuit, which can cooperate with the test host mechanism 3 to detect multiple electronic components to be detected.

[0024] A plurality of heat dissipation holes 34 are provided on the rear side of one end of the circuit testing micro host 31, a power supply line 35 is provided on the front side of one end of the circuit testing micro host 31, a feedback light group 32 is provided on the rear end of one top side of the circuit testing micro host 31, and three control switches 33 are provided horizontally and equidistantly on the front end of one top side of the circuit testing micro host 31, which can be used to control the circuit testing micro host 31. The circuit testing micro host 31 can analyze and process the detection data transmitted from the test bench 41, and cooperate with the feedback light group 32 to provide feedback on the circuit testing working status.

[0025] A foam pad 11 is fixedly connected to the top wall of the base 1 and located at the bottom of the test bench 41, which serves to protect the electronic components from tipping over. A handle frame 9 is fixedly connected to each of the two ends of the top wall of the base 1, which can be used to hold and lift the entire device. An anti-slip pad 8 is fixedly connected to each of the four corners of the bottom wall of the base 1, which can be used to prevent the entire device from slipping.

[0026] The working principle of the utility model is as follows: a placement-type detection probe mechanism 4 is integrally arranged, that is, the overall circuit detector connects the detection probe mechanism 4 and the test host mechanism 3 through a connecting line 10, and four electronic component access slots for detection are arranged on the top of the detection probe mechanism 4. Each electronic component access circuit is designed as a parallel circuit, and can cooperate with the test host mechanism 3 to detect multiple electronic components to be detected, and three control switches 33 can control the circuit test micro host 31. The circuit test micro host 31 can analyze and process the detection data transmitted from the test bench 41, and cooperate with the feedback light group 32 to provide feedback on the circuit test work status. The detection probe mechanism 4 is a rotatable structure, that is, after completing the detection work of the electronic components to be detected, if there are unqualified components, they are directly taken out and collected for scrapping. If there are no unqualified components or all are qualified, the handle 45 is held to lift and rotate the detection probe mechanism 4, and the components after detection are dumped onto the foam pad 11 below for qualified product collection, and the circuit components after detection can be conveniently classified and collected.

[0027] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A circuit inspection and testing device, comprising a base (1), wherein two vertical frames (2) are fixedly connected to the middle of the top of the base (1) in a front-to-back symmetrical manner; Features: A same test host mechanism (3) is fixedly installed between the side walls facing each other at one end of the two stands (2), and a fixing frame (5) is fixedly connected to each of the side walls away from each other at the other end of the two stands (2), and a strip groove (6) is provided between the front and rear side walls of the fixing frame (5); The two strip grooves (6) are arranged in a front-to-back symmetrical shape and a detection probe mechanism (4) is arranged between them. The detection probe mechanism (4) comprises a limit rotation block (44) slidably connected to the bottom of the two strip grooves (6), and a same test table (41) is fixedly connected between the two limit rotation blocks (44); The top of the test bench (41) is provided with four test card slots (42) in a rectangular array, and the test circuits in the four test card slots (42) are connected to the detection data transmission terminal in the test bench (41) via parallel lines.

2. A circuit inspection and testing device according to claim 1, characterized in that: The test host mechanism (3) comprises a circuit test micro host (31) fixedly mounted between two stands (2); the circuit test micro host (31) is connected to a test bench (41) via a connecting line (10).

3. A circuit inspection and testing device according to claim 2, characterized in that: A plurality of heat dissipation holes (34) are provided on the rear side of one end of the circuit testing microcomputer (31), and a power supply line (35) is provided on the front side of one end of the circuit testing microcomputer (31).

4. A circuit inspection and testing device according to claim 2, characterized in that: A feedback lamp group (32) is arranged at the rear end of one side of the top of the circuit testing microcomputer (31), and three control switches (33) are arranged horizontally and equidistantly at the front end of one side of the top of the circuit testing microcomputer (31).

5. A circuit inspection and testing device according to claim 1, characterized in that: The two limit rotation blocks (44) are each fixedly connected to a handle (45) at the center of the side wall on one side, and limit slots (7) are provided at the top of the stand (2) and at both ends of the fixed frame (5).

6. A circuit inspection and testing device according to claim 5, characterized in that: The same clamping block (43) is slidably installed in the two limit clamping grooves (7) at the same end, and the top of the clamping block (43) is fixedly connected to the same test bench (41).

7. A circuit inspection and testing device according to claim 1, characterized in that: A foam pad (11) is fixedly connected to the top wall of the base (1) and located at the bottom of the test bench (41), a handle frame (9) is fixedly connected to each of the two ends of the top wall of the base (1), and an anti-slip pad (8) is fixedly connected to each of the four corners of the bottom wall of the base (1).

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