Testing fixture for SIP (Session Initiation Protocol) memory

Abstract

The utility model discloses a test fixture for an SIP (Session Initiation Protocol) memory, which comprises a clamping seat which is arranged in a rectangular structure, and a groove is formed in the top end of the clamping seat; the clamping cover is rotationally connected with the clamping seat, the clamping cover and the clamping seat are mutually clamped, the clamping groove is formed in the middle position of a groove in the top end of the clamping seat, a sliding groove is embedded in the inner wall of the clamping groove, and a testing main body which can be driven by an extrusion mechanism to move up and down is arranged in the sliding groove. A test fixture of the SIP memory; a lifting plate on the up-down moving mechanism drives the whole test main body to move upwards under the action of a meshing gear, so that the memory can be ensured to be located between the tested cover plate and the moving plate for mutual extrusion work; in this way, the effect that the memory can make full contact with the test base can be achieved, and it is guaranteed that subsequent detection work is more accurate.

Description

Technical Field

[0001] The utility model relates to the technical field related to memory testing, in particular to a test fixture for a SIP memory. Background Art

[0002] SIP is a chip that integrates multiple functions, including processors, memories and other functional chips, into one package. SIP technology is not only an integrated circuit package containing multiple chips. A SIP chip is an integrated circuit with one or more different functions. Therefore, before alignment for use, it is generally necessary to place the memory inside the fixture to complete the test of the memory. When testing the existing memory on the market, it is necessary to clamp the entire memory with the fixture, connect the memory with the test base at the bottom of the fixture, and then press down the external top cover to press the memory downward, so that the test pins at the bottom of the memory can fully contact with the probes on the test base to make an electrical connection, so as to achieve the effect of testing. When the existing fixture on the market is clamped with the memory, the clamping work is completed only by the upper pressing mechanism, and it is often impossible to ensure that the pins at the bottom of the memory are fully in contact with the probes on the test base. Therefore, when the clamping test between the memory and the fixture is performed, serious errors in the test results often occur. Utility Model Content

[0003] The utility model aims to provide a test fixture for a SIP memory, so as to solve the problem that the fixture currently on the market only completes the engagement with the memory by means of a downward pressing mechanism at the top when engaging with the memory, and often cannot ensure that the pins at the bottom of the memory are in full contact with the probes on the test base, thus resulting in serious test result errors when the engagement test between the memory and the fixture is performed.

[0004] To achieve the above object, the utility model provides the following technical solutions: a test fixture for a SIP memory, comprising a card holder, which is arranged in a rectangular structure and has a groove at the top;

[0005] The card cover is rotatably connected to the card seat, and the two are engaged with each other;

[0006] A test cover plate, which is arranged at the center of the top of the card cover, and has protrusions on both sides thereof, and the top of the protrusions is integrally installed with the card cover;

[0007] Also includes:

[0008] The card slot is arranged at the middle position of the groove at the top end of the card seat, and a slide groove is inlaid on the inner wall of the card slot. A test body which can be driven by the extrusion mechanism to move up and down is arranged inside the slide groove.

[0009] Preferably, the clamp further comprises a limiting mechanism, which is arranged at the top end of the extrusion mechanism and is used for performing the limiting work of the limiting mechanism. The limiting mechanism can be engaged with the limiting holes, and the limiting holes are distributed in a circular shape with equal spacing on the outer wall of the clamping seat.

[0010] Preferably, the extrusion mechanism includes an up-and-down moving mechanism and an intermediate rotating mechanism, the up-and-down moving mechanism includes a descending plate and an ascending plate, and the inner sides of the descending plate and the ascending plate are evenly spaced with first tooth blocks and second tooth blocks, and the outer side of the ascending plate is connected to the test body through a connecting rod;

[0011] The intermediate rotating mechanism comprises meshing gears, wherein an intermediate shaft runs through the middle, and both sides of the intermediate shaft are connected to the inner side of the fixed cover through torsion springs, and the top end of the fixed cover is connected to the inside of the card seat.

[0012] Preferably, the outer side of the meshing gear is meshed with both the first tooth block and the second tooth block, and the position of the descending plate on the outer side of the first tooth block corresponds to the position of the protrusion.

[0013] Preferably, the test subject includes:

[0014] The movable plate is arranged in a rectangular structure, and sliders are fixedly installed at two sides thereof, and the sliders move up and down inside the slide groove;

[0015] A test base is arranged at the center of the movable plate, and the position of the test base corresponds to the position of the test cover plate;

[0016] The outer side of the movable plate is integrally installed with the connecting rod.

[0017] Preferably, the limiting mechanism comprises:

[0018] The limiting tooth is arranged in an inclined structure and is located in the locking tooth above the meshing gear;

[0019] The connecting shaft is arranged in the middle of the limiting tooth, and the top end penetrates the outer wall of the clamping seat and is connected with the rotating plate. A movable fixing pin is clamped on the outer side of the rotating plate, and the fixing pin and the limiting hole are clamped with each other.

[0020] Compared with the prior art, the utility model has the following beneficial effects: the test fixture of the SIP memory; when the memory is placed on the test base and the control card cover is lowered, the convex block will press the pressing mechanism, so that the rising plate on the up-and-down moving mechanism will drive the entire test body to move upward under the action of the meshing gear, so that the memory can be placed between the tested cover plate and the moving plate to press each other, and when pressing each other, it can also achieve the effect of ensuring that the memory can fully contact the test base, ensuring that the subsequent detection work is more accurate;

[0021] The setting of the limit mechanism can ensure that the memory can be between the test cover and the movable plate for a long time during the inspection, so that continuous inspection work can be carried out. At the same time, because the memory is in an upward state driven by the movable plate at this time, it is convenient to take out the memory after the engagement. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 This is a schematic diagram of the main structure of the utility model;

[0023] Figure 2 This is a schematic diagram of the back structure of the utility model;

[0024] Figure 3 This is a schematic diagram of the top view of the extrusion mechanism of the utility model;

[0025] Figure 4 This is a side view structural diagram of the extrusion mechanism of the utility model;

[0026] Figure 5 It is a schematic diagram of the connection structure between the meshing gear and the limiting mechanism of the utility model.

[0027] In the figure: 1. card seat; 2. card cover; 3. test cover plate; 4. bump; 5. extrusion mechanism; 51. descending plate; 52. first tooth block; 53. meshing gear; 54. ascending plate; 55. connecting rod; 56. second tooth block; 57. intermediate shaft; 58. torsion spring; 59. fixed cover; 6. card slot; 61. slide slot; 7. test body; 71. moving plate; 72. test base; 73. slider; 8. limiting mechanism; 81. limiting tooth; 82. connecting shaft; 83. rotating plate; 9. limiting hole. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0029] See also Figure 1-5 , the utility model provides a technical solution: a test fixture for a SIP memory, comprising a card holder 1, which is arranged in a rectangular structure, and a groove is arranged at the top thereof;

[0030] The card cover 2 is rotatably connected to the card base 1, and the two are engaged with each other;

[0031] A test cover plate 3 is arranged at the top center of the card cover 2, and has protrusions 4 on both sides thereof, and the top of the protrusion 4 is integrally installed with the card cover 2;

[0032] Also includes:

[0033] The card slot 6 is arranged at the middle position of the groove at the top of the card holder 1, and a slide groove 61 is inlaid on the inner wall of the card slot 6. A test body 7 which can be driven by the squeezing mechanism 5 to move up and down is arranged inside the slide groove 61;

[0034] The present application provides a test fixture for a SIP memory with a test body 7 that moves up and down. Specifically, when using it, the memory to be tested needs to be placed inside the test body 7, and then the card cover 2 is rotated by an external rotating axis to engage with the card base 1. When engaging, the test cover plate 3 at the bottom of the card base 1 presses the test body 7 downward, and the protrusion 4 descends and contacts with the squeezing mechanism 5, so that the squeezing mechanism 5 drives the test body 7 to move upward, thereby allowing the test body 7 to be squeezed upward between the test cover plate 3, thereby ensuring that the memories inside the two can be fully in contact with each other, facilitating subsequent memory testing.

[0035] Among them, according to Figure 1 and Figure 5 As shown, the clamp further includes a limiting mechanism 8, which is arranged at the top of the extrusion mechanism 5 and is used to perform the limiting work of the limiting mechanism 8. The limiting mechanism 8 can be engaged with the limiting holes 9, and the limiting holes 9 are distributed in a circular shape with equal spacing on the outer wall of the clamping base 1;

[0036] When the card holder 1 and the card cover 2 are engaged, in order to ensure that the test body 7 inside can always be in an upward and fully contacted state with the test cover plate 3, the squeezing mechanism 5 can be kept in an upward state under the action of the limiting mechanism 8 to ensure that it will not loosen during the detection process.

[0037] The extrusion mechanism 5 includes an up-and-down moving mechanism and an intermediate rotating mechanism. The up-and-down moving mechanism includes a descending plate 51 and an ascending plate 54. The inner sides of the descending plate 51 and the ascending plate 54 are evenly spaced with first tooth blocks 52 and second tooth blocks 56. The outer side of the ascending plate 54 is connected to the test body 7 through a connecting rod 55.

[0038] The intermediate rotating mechanism includes a meshing gear 53 , through which an intermediate shaft 57 runs. Both sides of the intermediate shaft 57 are connected to the inner side of a fixed cover 59 through a torsion spring 58 , and the top end of the fixed cover 59 is connected to the inside of the card holder 1 .

[0039] The outer side of the meshing gear 53 is meshed with the first tooth block 52 and the second tooth block 56, and the position of the descending plate 51 on the outer side of the first tooth block 52 corresponds to the position of the protrusion 4;

[0040] Specifically, when the protrusion 4 presses the top of the descending plate 51 downward, the descending plate 51 will descend and drive the first tooth block 52 at its top downward to engage with the meshing gear 53, so that the meshing gear 53 and the second tooth block 56 will contact and engage with each other, thereby causing the rising plate 54 on the second tooth block 56 to move upward. When the rising plate 54 moves upward, the connecting rod 55 will also rise and drive the entire test body 7 to move upward, thereby achieving the effect of squeezing and contacting the storage device located between the test body 7 and the test cover plate 3 upward.

[0041] Among them, according to Figure 3-4 As shown, the test subject 7 includes:

[0042] The movable plate 71 is arranged in a rectangular structure, and sliders 73 are fixedly installed at two sides thereof, and the sliders 73 move up and down inside the slide groove 61;

[0043] A test base 72, which is arranged at the center of the movable plate 71, and the position of the test base 72 corresponds to the position of the test cover plate 3;

[0044] The outer side of the moving plate 71 is integrally mounted with the connecting rod 55;

[0045] Specifically, when the movable plate 71 is driven to move upward by the connecting rod 55, the entire movable plate 71 will drive the test base 72 at its top to move upward, thereby driving the storage device engaged at its top to also press and contact with the bottom of the test cover plate 3 upward, thereby achieving the effect of continued full contact.

[0046] In this application, according to Figure 1 and Figure 5 As shown, the limiting mechanism 8 includes:

[0047] The limiting tooth 81 is arranged in an inclined structure and is located in the locking tooth above the meshing gear 53;

[0048] The connecting shaft 82 is arranged in the middle of the limiting tooth 81, and the top end thereof penetrates the outer wall of the holder 1 and is connected to the rotating plate 83. A movable fixing pin is engaged with the outer side of the rotating plate 83, and the fixing pin and the limiting hole 9 are engaged with each other;

[0049] Specifically, when the meshing gear 53 is driven by the up-and-down moving mechanism to rotate, the tooth block on its outer side will move the limiting tooth 81 to change its angle, thereby causing the rotating plate 83 on the outer side of the limiting tooth 81 to also rotate. Therefore, when the up-and-down moving mechanism moves to a suitable height and needs to fix the position of the meshing gear 53, at this time, it is only necessary to take the external fixing pin to engage the rotating plate 83 with the limiting hole 9 on the card seat 1, thereby achieving the effect of limiting. When the limit needs to be released, it is only necessary to separate the limiting pin from the limiting hole 9. At this time, the meshing gear 53 will automatically reset under the action of the torsion spring 58, so that the entire test body 7 can be lowered to the initial state again, thereby achieving the effect of performing memory detection again. The content not described in detail in this specification belongs to the prior art known to professional and technical personnel in this field.

[0050] Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art may still modify the technical solutions described in the aforementioned embodiments, or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention shall be included in the protection scope of the present invention.

Claims

1. A test fixture for a SIP memory, comprising: The card seat (1) is arranged in a rectangular structure and has a groove at the top thereof; The card cover (2) is rotatably connected to the card base (1), and the two are mutually engaged; A test cover plate (3) is arranged at the center of the top end of the card cover (2), and has protrusions (4) on both sides thereof, wherein the top end of the protrusions (4) is integrally installed with the card cover (2); Features: Also includes: The card slot (6) is arranged at the middle position of the groove at the top end of the card seat (1), and a slide groove (61) is embedded on the inner wall of the card slot (6). A test body (7) which can be driven by the squeezing mechanism (5) to move up and down is arranged inside the slide groove (61).

2. A test fixture for a SIP memory according to claim 1, characterized in that: The clamp also includes a limiting mechanism (8), which is arranged at the top end of the extrusion mechanism (5) and is used to perform the limiting work of the limiting mechanism (8). The limiting mechanism (8) can be engaged with the limiting holes (9), and the limiting holes (9) are distributed in a circular shape with equal spacing on the outer wall of the clamping seat (1).

3. A test fixture for a SIP memory according to claim 1, characterized in that: The squeezing mechanism (5) comprises an up-and-down moving mechanism and an intermediate rotating mechanism, the up-and-down moving mechanism comprises a descending plate (51) and an ascending plate (54), and first tooth blocks (52) and second tooth blocks (56) are distributed at equal intervals on the inner sides of the descending plate (51) and the ascending plate (54), and the outer side of the ascending plate (54) is connected to the test body (7) via a connecting rod (55); The intermediate rotating mechanism comprises a meshing gear (53) with an intermediate shaft (57) running through the middle thereof. Both sides of the intermediate shaft (57) are connected to the inner side of a fixed cover (59) via a torsion spring (58), and the top end of the fixed cover (59) is connected to the inside of the card seat (1).

4. A test fixture for a SIP memory according to claim 3, characterized in that: The outer side of the meshing gear (53) is meshed with the first tooth block (52) and the second tooth block (56), and the position of the descending plate (51) on the outer side of the first tooth block (52) corresponds to the position of the protrusion (4).

5. The test fixture for SIP memory according to claim 1, characterized in that: The test subject (7) comprises: The movable plate (71) is arranged in a rectangular structure, and sliders (73) are fixedly installed at two sides thereof, and the sliders (73) move up and down inside the slide groove (61); A test base (72) is arranged at the center of the movable plate (71), and the position of the test base (72) corresponds to the position of the test cover plate (3); The outer side of the movable plate (71) is integrally mounted with the connecting rod (55).

6. A test fixture for a SIP memory according to claim 2, characterized in that: The limiting mechanism (8) comprises: The limiting tooth (81) is arranged in an inclined structure and is located in the locking tooth above the meshing gear (53); The connecting shaft (82) is arranged in the middle of the limiting tooth (81), and the top end thereof passes through the outer wall of the holder (1) and is connected to the rotating plate (83). A movable fixing pin is engaged on the outer side of the rotating plate (83), and the fixing pin and the limiting hole (9) are engaged with each other.

Images