Replaceable modular ultra-fine pitch photovoltaic test probe row

Abstract

The utility model relates to a replaceable modular ultra-fine pitch photovoltaic test probe row, which comprises a PCB (printed circuit board), a PCB contact terminal is fixedly mounted above the PCB, a replaceable probe module limiting plate is fixedly mounted on the PCB through a plurality of fixing screws, and the replaceable probe module limiting plate is fixedly mounted on the PCB through a plurality of fixing screws. A plurality of replaceable probe modules are fixedly installed above the replaceable probe module limiting plate, and each replaceable probe module comprises a first positioning pin, a first probe limiting plate, a probe, a second probe limiting plate, a second positioning pin, a first fastening screw, a second fastening screw and a third positioning pin. A probe contact plate is fixedly installed above the replaceable probe module through a plurality of fourth fixing screws, and the probe contact plate is fixedly installed on the PCB in a penetrating mode through a plurality of second fastening screws. According to the utility model, the problem that the whole probe row needs to be dismounted and the dismounting and the mounting are very difficult when a certain test probe in a single partition grid line in the existing photovoltaic test probe row with extremely fine spacing needs to be replaced is solved.

Description

Technical Field

[0001] The utility model relates to the technical field of probe rows, in particular to a replaceable modular ultra-fine pitch photovoltaic test probe row. Background Art

[0002] As the photovoltaic industry's photocrystalline silicon wafers are becoming more and more sophisticated, the grid line size is getting smaller and smaller. When a test probe in a single partition grid line in the existing ultra-fine pitch photovoltaic test probe row needs to be replaced, the entire probe row needs to be disassembled. And because the test probe is very precise, improper operation may cause bending or damage. Now all the grid lines that need to be tested are divided into independent rows, and each row will be disassembled and installed as an independent module. If the probe in a single partition needs to be replaced, only a single independent module needs to be disassembled and the probe that needs to be replaced needs to be replaced, which greatly saves time and cost.

[0003] Since the entire probe row needs to be disassembled when a test probe in a single partition grid line in the existing ultra-fine pitch photovoltaic test probe row needs to be replaced, and since the test probe is very precise, improper operation may cause bending or damage. Now all the grid lines that need to be tested are divided into independent rows, and each row will be disassembled and installed as an independent module. If the probe in a single partition needs to be replaced, only a single independent module needs to be disassembled and the probe that needs to be replaced needs to be replaced, which greatly saves time and cost. Utility Model Content

[0004] The purpose of the utility model is to solve the problem in the prior art that when a test probe in a single partition grid line in an ultra-fine pitch photovoltaic test probe array needs to be replaced, the entire probe array needs to be disassembled, and the disassembly and installation are very difficult, and a replaceable modular ultra-fine pitch photovoltaic test probe array is proposed.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A replaceable modular ultra-fine pitch photovoltaic test probe row is designed, comprising a PCB board, wherein a PCB contact terminal is fixedly installed on the top of the PCB board;

[0007] A replaceable probe module limiting plate is fixedly mounted on the PCB board by a plurality of fixing screws, and a plurality of replaceable probe modules are fixedly mounted above the replaceable probe module limiting plate.

[0008] A single replaceable probe module comprises a positioning pin 1, a probe limiting plate 1, a probe, a probe limiting plate 2, a positioning pin 2, a fastening screw 1, a fixing screw 2 and a positioning pin 3. The lower part of the probe limiting plate 1 is positioned and installed on the limit plate of the replaceable probe module by a plurality of positioning pins 1. A probe is plugged and installed on the upper part of the probe limiting plate 1. A probe limiting plate 2 is plugged and provided on the upper part of the probe. The probe limiting plate 2 is positioned and installed on the probe limiting plate 1 by a plurality of positioning pins 2. The probe limiting plate 2 is limited and installed on the probe limiting plate 1 by a plurality of fastening screws 1. The probe limiting plate 2 is fixedly connected to the probe limiting plate 1 by a plurality of fixing screws 2. The upper part of the probe limiting plate 2 is positioned and installed on the probe contact plate by a plurality of positioning pins 3.

[0009] A probe contact plate is fixedly mounted on the upper side of the replaceable probe module by means of a plurality of fixing screws 4, and the probe contact plate is fixedly mounted on the PCB board by means of a plurality of fastening screws 2 penetrating therethrough.

[0010] Preferably, the plurality of positioning pins are positioned with a limit plate of the replaceable probe module to achieve precise positioning and reduce assembly tolerances generated during installation.

[0011] Preferably, the plurality of positioning pins 2 are positioned with the probe limit plate 1 to achieve precise positioning and reduce assembly tolerances generated during installation.

[0012] Preferably, the plurality of positioning pins three are positioned with the probe contact plate to achieve precise positioning and reduce assembly tolerances generated during installation.

[0013] Preferably, a plurality of the replaceable probe modules are arranged side by side and installed in parallel on the replaceable probe module limiting plates.

[0014] Preferably, the cross-sectional area of ​​the limit plate of the replaceable probe module is smaller than the cross-sectional area of ​​the PCB board.

[0015] The utility model provides a replaceable modular ultra-fine pitch photovoltaic test probe row, which has the following beneficial effects:

[0016] Firstly, the utility model solves the problem that when a test probe in a single partition grid line in the existing ultra-fine pitch photovoltaic test probe array needs to be replaced, the entire probe array needs to be disassembled, and the disassembly and installation are very difficult.

[0017] Then, the utility model has developed an ultra-fine pitch photovoltaic test probe row with replaceable modules. All the grid lines that need to be tested are divided into an independent row, and each row will be disassembled and installed as an independent module. If the probe in a single partition needs to be replaced, it is only necessary to disassemble a single independent module and replace the probe that needs to be replaced, which reduces the difficulty of disassembly and installation and saves time and cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the exploded structure of a replaceable modular ultra-fine pitch photovoltaic test probe row proposed by the utility model;

[0019] Figure 2 This is a schematic diagram of the exploded structure of a single replaceable probe module of a replaceable modular ultra-fine pitch photovoltaic test probe array proposed by the utility model;

[0020] Figure 3 The present invention is a schematic structural diagram of a replaceable modular ultra-fine pitch photovoltaic test probe array.

[0021] In the figure: 10, PCB board; 11, PCB contact terminal; 20, fixing screw one; 21, replaceable probe module limit plate; 31, positioning pin one; 32, probe limit plate one; 33, probe; 34, probe limit plate two; 35, positioning pin two; 36, fastening screw one; 37, fixing screw two; 38, positioning pin three; 40, fixing screw four; 41, fastening screw two; 42, probe contact plate. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0023] Reference Figure 1-3 , a replaceable modular ultra-fine pitch photovoltaic test probe 33 row, including a PCB board 10, characterized in that a PCB contact terminal 11 is fixedly installed above the PCB board 10;

[0024] A replaceable probe module limiting plate 21 is fixedly mounted on the PCB board 10 by a plurality of fixing screws 20, and a plurality of replaceable probe modules 33 are fixedly mounted above the replaceable probe module limiting plate 21.

[0025] A single replaceable probe 33 module includes a positioning pin 1 31, a probe limiting plate 1 32, a probe 33, a probe limiting plate 2 34, a positioning pin 2 35, a fastening screw 1 36, a fixing screw 2 37 and a positioning pin 38. The lower part of the probe limiting plate 1 32 is positioned and installed on the replaceable probe module limiting plate 21 by a plurality of positioning pins 1 31, the upper part of the probe limiting plate 1 32 is plugged and installed with the probe 33, the upper part of the probe 33 is plugged and provided with a probe limiting plate 2 34, the probe limiting plate 2 34 is positioned and installed on the probe limiting plate 1 32 by a plurality of positioning pins 2 35, the probe limiting plate 2 34 is limitedly installed on the probe limiting plate 1 32 by a plurality of fastening screws 1 36, the probe limiting plate 2 34 is fixedly connected to the probe limiting plate 1 32 by a plurality of fixing screws 2 37, and the upper part of the probe limiting plate 2 34 is positioned and installed on the probe contact plate 42 by a plurality of positioning pins 38;

[0026] A probe contact plate 42 is fixedly mounted above the replaceable probe 33 module by a plurality of fixing screws 40 , and the probe contact plate 42 is fixedly mounted on the PCB board 10 by a plurality of fastening screws 41 passing through it.

[0027] As an optimization solution of this embodiment, the plurality of positioning pins 31 are positioned with the limit plate 21 of the replaceable probe module to achieve precise positioning and reduce the assembly tolerance generated during installation.

[0028] As an optimization solution of this embodiment, the plurality of second positioning pins 35 are positioned with the probe limit plate 1 32 to achieve precise positioning and reduce assembly tolerances generated during installation.

[0029] As an optimization solution of this embodiment, the plurality of positioning pins 38 are positioned with the probe contact plate 42 to achieve precise positioning and reduce assembly tolerances generated during installation.

[0030] As an optimization solution of this embodiment, a plurality of replaceable probe modules 33 are arranged side by side and installed in parallel on the replaceable probe module limiting plate 21 .

[0031] As an optimization solution of this embodiment, the cross-sectional area of ​​the replaceable probe module limiting plate 21 is smaller than the cross-sectional area of ​​the PCB board 10 .

[0032] When in use, the utility model utilizes the probe 33 row contact plate and the replaceable probe module limit plate 21 to limit the replaceable probe 33 module through the fixing screw four 40, so that the needle tip of the probe 33 in the replaceable probe 33 module can accurately contact the test grid line, and the needle tip of the ultra-fine pitch test probe 33 can contact the gold-plated point of the PCB board 10, thereby achieving the purpose of good contact; in order to facilitate the fixing of the entire probe 33 row and the PCB board 10 to the carrier board, the fastening screw two 41 and the fixing screw one 20 are used to fasten, which is convenient for disassembly and maintenance.

[0033] The replaceable probe 33 module consists of a probe limit plate 1 32, a probe limit plate 2 34 and a probe 33. The probe limit plate 1 32 and the probe limit plate 2 34 are positioned by a positioning pin 2 35. The probe 33 is limited by the probe limit plate 1 32 and the probe limit plate 2 34 by a fastening screw 1 36. The positioning pin 38 is positioned with the probe contact plate 42. The positioning pin 1 31 is positioned with the limit plate 21 of the replaceable probe module, so as to achieve the purpose of precise positioning and reduce the assembly tolerance generated during installation.

[0034] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A replaceable modular ultra-fine pitch photovoltaic test probe row, including a PCB board, characterized in that: A PCB contact terminal is fixedly installed above the PCB board; A replaceable probe module limiting plate is fixedly mounted on the PCB board by a plurality of fixing screws, and a plurality of replaceable probe modules are fixedly mounted above the replaceable probe module limiting plate. A single replaceable probe module comprises a positioning pin 1, a probe limiting plate 1, a probe, a probe limiting plate 2, a positioning pin 2, a fastening screw 1, a fixing screw 2 and a positioning pin 3. The lower part of the probe limiting plate 1 is positioned and installed on the limit plate of the replaceable probe module by a plurality of positioning pins 1. A probe is plugged and installed on the upper part of the probe limiting plate 1. A probe limiting plate 2 is plugged and provided on the upper part of the probe. The probe limiting plate 2 is positioned and installed on the probe limiting plate 1 by a plurality of positioning pins 2. The probe limiting plate 2 is limited and installed on the probe limiting plate 1 by a plurality of fastening screws 1. The probe limiting plate 2 is fixedly connected to the probe limiting plate 1 by a plurality of fixing screws 2. The upper part of the probe limiting plate 2 is positioned and installed on the probe contact plate by a plurality of positioning pins 3. A probe contact plate is fixedly mounted on the upper side of the replaceable probe module by a plurality of fixing screws 4, and the probe contact plate is fixedly mounted on the PCB board by a plurality of fastening screws 2 penetrating therethrough.

2. The replaceable modular ultra-fine pitch photovoltaic test probe row according to claim 1, characterized in that: The plurality of positioning pins are positioned with the limit plate of the replaceable probe module to achieve precise positioning and reduce assembly tolerances generated during installation.

3. The replaceable modular ultra-fine pitch photovoltaic test probe row according to claim 1, characterized in that: The plurality of positioning pins 2 are positioned with the probe limit plate 1 to achieve precise positioning and reduce assembly tolerances generated during installation.

4. The replaceable modular ultra-fine pitch photovoltaic test probe row according to claim 1, characterized in that: The plurality of positioning pins 3 are positioned with the probe contact plate to achieve precise positioning and reduce assembly tolerances generated during installation.

5. The replaceable modular ultra-fine pitch photovoltaic test probe row according to claim 1, characterized in that: The replaceable probe modules are arranged side by side and installed in parallel on the replaceable probe module limiting plates.

6. The replaceable modular ultra-fine pitch photovoltaic test probe row according to claim 1, characterized in that: The cross-sectional area of ​​the limit plate of the replaceable probe module is smaller than the cross-sectional area of ​​the PCB board.

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