A relative light distribution experiment device
By introducing relative light distribution sensors and computer imaging technology into the optical double-slit interference experimental instrument, the problem of large error in measuring the spacing between optical double-slit interference fringes in the prior art is solved, and the accurate calculation of light wavelength and experimental accuracy are achieved.
Patent Information
- Application Number
- CN202421340309.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-13
- Publication Date
- 2025-04-08
- Estimated Expiration
- 2034-06-13
AI Technical Summary
The existing optical double-slit interference experimental instrument has a large error when measuring the spacing between light and dark, which affects the accuracy of the experiment.
A relative light distribution experimenter is designed to interfere with double-slits through the cooperation of the light emitting component, the light slit sheet and the relative light distribution sensor to form stripes separated by light and dark phases, and to accurately measure the distance between adjacent dark stripes through computer imaging, thereby calculating the wavelength of light.
The light and dark stripes are formed by the relative light distribution sensor, and the computer imaging is used to accurately calculate the wavelength of light, improving the accuracy of the experiment.
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Figure CN222734576U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of teaching instruments, in particular to a relative illumination distribution experiment device. Background Art
[0002] In physics, in optical experiments, the wavelength of light can be calculated using the data obtained from experimental measurements. When performing a double-slit interference experiment, light and dark stripes will be generated, and the wavelength of light can be calculated based on the spacing between the stripes. In current double-slit interference experiment instruments, after generating light and dark stripes, the spacing between two adjacent stripes is usually measured manually, and the error in the measured data is large, affecting the accuracy of the experiment. Utility Model Content
[0003] The utility model aims to provide a relative illumination distribution experiment device, which forms light and dark stripes through a relative illumination distribution sensor, and images the stripe information through a computer terminal, so as to accurately measure the distance between two adjacent dark stripes and accurately calculate the wavelength of light.
[0004] In order to achieve the above purpose, the utility model provides the following technical solutions:
[0005] A relative light distribution experiment device comprises a guide rail, a light emitting assembly is arranged at one end close to the guide rail, a first fixing bracket is installed at the other end close to the guide rail, and a relative light distribution sensor is installed on the first fixing bracket;
[0006] The second fixed bracket is movably arranged on the guide rail, and the optical slit sheet is placed on the second fixed bracket;
[0007] The light emitted by the light emitting component forms interference when passing through the double slits of the light slit sheet, forming light and dark stripes on the relative illumination distribution sensor;
[0008] According to the formula The wavelength of light can be calculated;
[0009] Wherein, λ is the wavelength, d is the distance between the double slits on the slit sheet, L is the distance from the relative light distribution sensor to the double slits, and △X is the distance between adjacent bright stripes or adjacent dark stripes.
[0010] Preferably, the relative illumination distribution sensor is electrically connected to a single-chip microcomputer, and the single-chip microcomputer sends information on light and dark stripes formed by double-slit interference to a computer terminal through a wired network, and forms an image on the computer terminal.
[0011] Preferably, the guide rail comprises a rail body, and recessed guide grooves are formed near both sides of the top of the rail body; a scale is provided on the rail body along the axial direction, and the distance between the relative illumination distribution sensor, the light slit sheet and the light emitting component can be accurately adjusted according to the scale.
[0012] Preferably, the first fixing bracket includes a first base, vertical first baffles are formed on both sides of the first base, and a first slider is arranged on the bottom surface of the first base; the distance between the first fixing bracket, the relative light distribution sensor and the light-emitting component can be adjusted by moving the first slider along the guide groove.
[0013] Preferably, the second fixing bracket comprises a second base, second baffles are vertically arranged at both ends of the second base, and a second slider is arranged at the bottom of the second base; the second slider is moved along the guide groove to adjust the distance between the second fixing bracket, the light slit sheet and the relative light distribution sensor.
[0014] Preferably, the second fixing bracket further comprises a second fixing clip, the second fixing clip is vertically mounted above the second base; a shift rod is fixed in front of the second fixing clip, the light slit sheet is clamped between the second fixing clip and the shift rod; a light-transmitting hole is opened in the upper part of the second fixing clip; the light emitted by the light-emitting component is irradiated onto the light slit sheet through the light-transmitting hole, and forms interference through the double slits on the light slit sheet.
[0015] Preferably, the light emitting assembly comprises a third base, third baffles are vertically arranged at both ends of the third base, and a third fixing clip is fixed above the third base; the light source is mounted on the third fixing clip; the light source is rotated to adjust the emission angle of the light, ensuring that the light is irradiated in parallel to the double slits on the light slit sheet.
[0016] Preferably, the distance between the two slits on the optical slit sheet is 0.2 mm, 0.3 mm or 0.45 mm.
[0017] The beneficial effects of the utility model are as follows:
[0018] In the present application, double-slit interference is performed by cooperating with a light-emitting component, a light slit sheet, and a relative illumination distribution sensor to generate light and dark stripes with intervals between them. The relative illumination distribution sensor sends the information of the light and dark stripes with intervals between them to a computer terminal for imaging, calculates the distance between two dark stripes based on the image of the light and dark stripes with intervals between them formed on the computer terminal, then calculates the distance between adjacent dark stripes based on the distance between the two dark stripes, and calculates the wavelength of light based on the distance between adjacent dark stripes, the distance between the double slits on the light slit sheet, and the distance from the relative illumination distribution sensor to the double slits.
[0019] In this process, light and dark stripes are formed by the relative light distribution sensor, and an image is formed by the computer. Based on the image, the accurate distance between the two dark stripes is obtained to accurately calculate the wavelength of the light. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] Figure 1 The structure diagram of the relative illumination distribution experiment device of the utility model;
[0021] Figure 2 This is the image of the light and dark stripes obtained by the double-slit interference of the utility model on the computer terminal;
[0022] Figure 3 A structural diagram of the guide rail of the utility model;
[0023] Figure 4 A structural diagram of the first fixed bracket of the utility model;
[0024] Figure 5 A front view of the first fixing bracket of the utility model;
[0025] Figure 6 A structural diagram of the second fixing bracket of the utility model as viewed from the back;
[0026] Figure 7 A structural diagram of the second fixing bracket of the utility model as viewed from the front;
[0027] Figure 8 A structural diagram of the light-emitting component of the utility model;
[0028] Fig. 9 A front view of the light emitting component of the utility model;
[0029] Fig.10 The light and dark stripes formed by the double-slit interference of the utility model on the relative light distribution sensor;
[0030] Reference numerals:
[0031] 1. Guide rail; 11. Track body; 12. Guide groove; 13. Edge; 2. Relative light distribution sensor; 3. First fixed bracket; 31. First baffle; 32. First slide groove; 33. First slider; 34. First base; 35. First fixed clamp; 4. Second fixed bracket; 41. Second baffle; 42. Second slide groove; 43. Second slider; 44. Second base; 45. Second fixed clamp; 46. Light-transmitting hole; 47. Gear lever; 5. Light slit; 6. Light-emitting component; 61. Third baffle; 62. Third slide groove; 63. Third slider; 64. Third base; 65. Third fixed clamp; 66. Light source. DETAILED DESCRIPTION
[0032] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. The described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.
[0033] In current optical double-slit interference experiment instruments, after producing alternating light and dark stripes, the distance between two adjacent stripes is usually measured manually. The errors in the measured data are large, which affects the accuracy of the experiment.
[0034] For the above technical issues, refer to Figure 1 The present embodiment provides a relative illumination distribution experiment device, including a guide rail 1, a light emitting assembly 6 is arranged at one end close to the guide rail 1, a first fixing bracket 3 is installed at the other end close to the guide rail 1, and a relative illumination distribution sensor 2 is installed on the first fixing bracket 3. A second fixing bracket 4 is movably arranged on the guide rail 1, and a light slit sheet 5 is placed on the second fixing bracket 4.
[0035] The light emitted by the light emitting component 6 forms interference when passing through the double slits of the light slit sheet 5, and forms light and dark stripes on the relative illumination distribution sensor 2.
[0036] according to The wavelength of light can be calculated.
[0037] Wherein, λ is the wavelength of light, d is the distance between the double slits on the light slit sheet 5, L is the distance from the relative light distribution sensor to the double slits, and △X is the distance between adjacent bright stripes or adjacent dark stripes.
[0038] Reference Fig.10 , double-slit interference forms alternating light and dark fringes.
[0039] Regarding the relative illumination distribution sensor 2, the optical signal can be converted into an electrical signal according to the photoelectric effect. The intensity of the optical signal directly affects the magnitude of the current. By processing the electrical signal, image information can be displayed. This is the prior art in the field and will not be introduced in detail here.
[0040] The pixel size of the relative light distribution sensor 2 is 8um*200um, with a total of 3648 pixels.
[0041] Reference Figure 2 The relative illumination distribution sensor 2 is electrically connected to the single-chip microcomputer, and the relative illumination distribution sensor 2 sends the light and dark stripes formed by the double-slit interference to the single-chip microcomputer, and the single-chip microcomputer sends the light and dark stripes formed by the double-slit interference to the computer through the wired network, and images are formed on the computer. Figure 2 In the graph, the troughs correspond to the dark fringes, and the peaks correspond to the light fringes.
[0042] The specific process of calculating the wavelength of light using the double-slit interference phenomenon is as follows:
[0043] △X=L / d*λ, so the wavelength λ=d△X / L.
[0044] Where, λ is the wavelength of light, d is the distance between the double slits on the slit sheet 5, L is the distance from the relative light distribution sensor to the double slits, and △X is the distance between adjacent bright stripes or dark stripes. Where, d and L are both known quantities.
[0045] Reference Figure 2 , △X is calculated by the distance between two adjacent dark fringes.
[0046] The light passes through the double slits on the slit sheet 5 to form light and dark stripes, where two adjacent dark stripes correspond to Figure 2 At the position P1 and the position P2 on the X-axis, the distance D between the two adjacent dark stripes is |P1.X-P2.X|, that is, the difference between the X coordinate of P1 and the X coordinate of P2. At this time, the unit of D is pixel.
[0047] Convert units from pixels to meters, △X=D*pixel size / 1000000.
[0048] Reference Figure 3 The guide rail 1 includes a rail body 11, and recessed guide grooves 12 are formed near both sides of the top of the rail body 11. Ridges 13 are vertically formed on the tops of both sides of the rail body 11, and scales are arranged on the rail body 11 along the axial direction.
[0049] When conducting the light interference experiment, the relative illumination distribution sensor 2, the light slit sheet 5 and the light emitting component 6 are moved along the guide rail 1 according to the experimental requirements to adjust the distance between the relative illumination distribution sensor 2 and the light slit sheet 5, and the distance between the light slit sheet 5 and the light emitting component 6. During the adjustment process, the distance between the relative illumination distribution sensor 2, the light slit sheet 5 and the light emitting component 6 is accurately determined according to the scale.
[0050] Reference Figure 4 and Figure 5 The first fixed bracket 3 includes a first base 34, and vertical first baffles 31 are formed on both sides of the first base 34. A first slider 33 is arranged on the bottom surface of the first base 34, and a first slide groove 32 is opened in the angle between the first baffle 31 and the first base 34.
[0051] The first fixing bracket 3 slides on the edge 13 through the first sliding groove 32 .
[0052] The first slider 33 extends downward into the guide groove 12, and the first slider 33 is moved along the guide groove 12, and the first fixing bracket 3 and the relative light distribution sensor 2 are moved along the guide rail 1 to adjust the distance from the relative light distribution sensor 2 to the light slit sheet 5 and the light emitting component 6.
[0053] Reference Figure 6 The second fixed bracket 4 includes a second base 44, and second baffles 41 are vertically arranged at both ends of the second base 44, and a second slider 43 is arranged at the bottom of the second base 44. A second slide groove 42 is provided in the included angle between the second baffle 41 and the second base 44, and the second fixed bracket 4 is movably arranged on the edge 13 through the second slide groove 42. The bottom of the second slider 43 extends downward into the guide groove 12.
[0054] The second sliding block 43 is moved along the guide groove 12, and the second fixing bracket 4 and the light slit sheet 5 are moved along the guide rail 1, so as to adjust the distance between the second fixing bracket 4, the light slit sheet 5 and the relative light distribution sensor 2.
[0055] Reference Figure 7 The second fixing bracket 4 further includes a second fixing clip 45, which is vertically mounted above the second base 44. A lever 47 is fixed in front of the second fixing clip 45, and the lever 47 extends in the longitudinal direction. The light slit sheet 5 is placed between the second fixing clip 45 and the lever 47. A light-transmitting hole 46 is opened on the upper part of the second fixing clip 45, and the light-transmitting hole 46 is directly opposite to the slit on the light slit sheet 5.
[0056] The light emitted by the light emitting component 6 passes through the light-transmitting hole 46 and irradiates onto the light slit sheet 5.
[0057] The light forms interference when passing through the double slits on the slit sheet 5 .
[0058] Reference Figure 8 and Fig. 9 The light emitting assembly 6 includes a third base 64, and third baffles 61 are vertically arranged at both ends of the third base 64. A third fixing clip 65 is fixed above the third base 64. A light source 66 is rotatably mounted on the third fixing clip 65. The light source 66 is rotated to adjust the emission angle of the light to ensure that the light is irradiated in parallel to the double slits on the light slit sheet 5, so as to achieve stable interference.
[0059] The distance between the two slits on the optical slit sheet is 0.2 mm, 0.3 mm or 0.45 mm.
[0060] In addition, the light slit plate 5 can be replaced with a light slit plate 5 with only one slit to perform a single slit diffraction experiment.
[0061] Working principle:
[0062] In the present application, double-slit interference is performed by the cooperation of the light-emitting component 6, the light slit sheet 5 and the relative illumination distribution sensor 2, and the interference generates light and dark stripes. The relative illumination distribution sensor 2 sends the information of the light and dark stripes to the computer end for imaging, and calculates the distance D between two adjacent dark stripes based on the image of the light and dark stripes formed on the computer end, and then calculates the distance △X between adjacent dark stripes based on the distance D between the two dark stripes, and calculates the wavelength of light based on the distance between adjacent dark stripes, the distance between the double slits on the light slit sheet, and the distance from the relative illumination distribution sensor to the double slits.
[0063] In this process, light and dark stripes are formed by the relative illumination distribution sensor 2, and an image is formed by the computer. Based on the image, the accurate distance between the two dark stripes is obtained to accurately calculate the wavelength of the light.
[0064] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.
Claims
1. A relative light distribution experiment device, characterized in that , comprising a guide rail (1), a light emitting assembly (6) being arranged at one end close to the guide rail (1), a first fixing bracket (3) being installed at the other end close to the guide rail (1), and a relative light distribution sensor (2) being installed on the first fixing bracket (3); The second fixed bracket (4) is movably arranged on the guide rail (1), and the optical slit sheet (5) is placed on the second fixed bracket (4); When the light emitted by the light emitting component (6) passes through the double slits of the light slit sheet (5), interference is formed, thereby forming light and dark stripes on the relative light distribution sensor (2); According to the formula The wavelength of light can be calculated; Wherein, λ is the wavelength, d is the distance between the double slits on the light slit sheet (5), L is the distance from the relative light distribution sensor to the double slits, and ΔX is the distance between adjacent bright stripes or adjacent dark stripes.
2. The relative illumination distribution experiment device according to claim 1, characterized in that The relative illumination distribution sensor (2) is electrically connected to a single-chip microcomputer, and the single-chip microcomputer sends information about light and dark stripes formed by double-slit interference to a computer terminal through a wired network, and forms an image on the computer terminal.
3. The relative illumination distribution experiment device according to claim 1 is characterized in that The guide rail (1) comprises a rail body (11), and recessed guide grooves (12) are formed near both sides of the top of the rail body (11); a scale is provided on the rail body (11) along the axial direction, and the distance between the relative light distribution sensor (2), the light slit sheet (5) and the light emitting component (6) is accurately adjusted according to the scale.
4. The relative illumination distribution experiment device according to claim 3 is characterized in that The first fixed bracket (3) comprises a first base (34), vertical first baffles (31) are formed on both sides of the first base (34), and a first slider (33) is arranged on the bottom surface of the first base (34); the first slider (33) is moved along the guide groove (12) to adjust the distance between the first fixed bracket (3), the relative light distribution sensor (2) and the light emitting component (6).
5. The relative illumination distribution experiment device according to claim 3 is characterized in that The second fixed bracket (4) comprises a second base (44), second baffles (41) are vertically arranged at both ends of the second base (44), and a second slider (43) is arranged at the bottom of the second base (44); the second slider (43) is moved along the guide groove (12) to adjust the distance between the second fixed bracket (4), the light slit sheet (5) and the relative light distribution sensor (2).
6. The relative illumination distribution experiment device according to claim 5, characterized in that The second fixing bracket (4) further comprises a second fixing clamp (45), the second fixing clamp (45) being vertically mounted above the second base (44); a shift rod (47) being fixed in front of the second fixing clamp (45), the light slit sheet (5) being clamped between the second fixing clamp (45) and the shift rod (47); a light transmission hole (46) being provided in the upper part of the second fixing clamp (45); the light emitted by the light emitting component (6) is irradiated onto the light slit sheet (5) through the light transmission hole (46), and forms interference through the double slits on the light slit sheet (5).
7. The relative illumination distribution experiment device according to claim 1, characterized in that The light emitting component (6) comprises a third base (64), third baffles (61) are vertically arranged at both ends of the third base (64), and a third fixing clip (65) is fixed above the third base (64); a light source (66) is mounted on the third fixing clip (65); the light source (66) is rotated to adjust the emission angle of light, ensuring that the light is irradiated in parallel to the double slits on the light slit sheet (5).
8. The relative illumination distribution experiment device according to claim 1, characterized in that The distance between the two slits on the optical slit sheet (5) is 0.2 mm, 0.3 mm or 0.45 mm.