Test fixture and RF test system

Abstract

The present application discloses a test fixture and a radio frequency test system. The test fixture includes a carrier. The carrier is provided with at least one first test terminal and at least one second test terminal. The first test terminal is used to dock with the third test terminal of the device under test in a one-to-one correspondence, and the second test terminal is used to dock with the fourth test terminal of the test equipment. At least part of the first test terminal is connected to at least part of the second test terminal to establish a radio frequency transmission channel between the device under test and the test equipment. The test fixture is connected to the device under test and the test equipment respectively by docking, which is easy to disassemble and assemble, and the replacement cycle is shorter, thereby improving the efficiency of radio frequency testing.

Description

Technical Field

[0001] The present application belongs to the technical field of radio frequency testing, and in particular, relates to a test fixture and a radio frequency testing system. Background Art

[0002] Before wireless communication devices such as mobile phones leave the factory, the RF indicators of the wireless communication devices can be tested by performing RF tests on their circuit boards, so that the RF performance of the wireless communication devices can meet the standards and provide reliable performance during actual use after leaving the factory.

[0003] The circuit board of the wireless communication device is the object to be tested. During the RF test, a test fixture is usually used to fix the circuit board in the shielding box of the test equipment to facilitate RF testing. Different objects to be tested usually require different test fixtures. Therefore, when changing the object to be tested, the test fixture must be replaced at the same time.

[0004] However, currently, when replacing the test fixture, the disassembly and assembly process of the test fixture is complicated, which makes the replacement cycle of the test fixture long and greatly reduces the efficiency of radio frequency testing. Utility Model Content

[0005] The present application provides a test fixture and a radio frequency test system, which can solve the current technical problem of low radio frequency test efficiency caused by a long test fixture replacement cycle.

[0006] In a first aspect, an embodiment of the present application provides a test fixture for fixing a device under test during a radio frequency test. The test fixture includes a carrier. The carrier is provided with at least one first test terminal and at least one second test terminal. The first test terminal is used to dock with a third test terminal of the device under test, and the second test terminal is used to dock with a fourth test terminal of the test equipment. At least part of the first test terminal is connected to at least part of the second test terminal to establish a radio frequency transmission channel between the device under test and the test equipment.

[0007] Docking refers to a detachable electrical connection method in which two connecting bodies are directly connected to each other without an intermediate medium (such as a cable). For example, docking can be plug-in, abutment (i.e., a contact relationship formed by abutting together), etc.

[0008] In the related art, the positions of the third test terminals of different devices under test are different, the positions of the first test terminals of different test fixtures adapted to different devices under test corresponding to the first test terminals of the devices under test are also different, and the positions of the second test terminals of the test fixture connected to the test equipment are also scattered everywhere. In other words, the positions of the first test terminal and the second test terminal of the test fixture are not fixed as the position of the third test terminal of the device under test changes, while the fourth test terminal of the test equipment connected to the test fixture is usually fixed, which makes it possible for the test fixture and the test equipment to be connected only through cables such as coaxial cables. It can be understood that when replacing the device under test that requires RF testing, the test fixture may be replaced together because the test fixtures adapted to different devices under test may be different. In the related art, since the test fixture and the test equipment are connected by cables, the cable is disassembled and assembled when the test fixture is replaced. Since both ends of the cable are connected, a single cable involves the disassembly and assembly of both ends, which is cumbersome, especially when there are many cables, involving the disassembly and assembly of a large number of cables, and the replacement cycle is long, which greatly reduces the efficiency of RF testing.

[0009] In the test fixture provided in this embodiment, the third test end of the device under test is opposite to the first test end of the test fixture, and the second test end of the test fixture is opposite to the fourth test end of the test equipment. In other words, the positions where the device under test and the test fixture are connected, and the positions where the test fixture and the test equipment are connected are opposite. Therefore, this embodiment supports connection by docking, without the need to use cables for connection.

[0010] Therefore, when replacing the test fixture, the first test end and the second test end on the carrier are separated from the third test end of the device under test and the fourth test end of the test equipment by directly peeling off the device under test, the test fixture and the test equipment, and then the first test end and the second test end on the carrier of the replaced test fixture are aligned and connected to the third test end of the device under test and the fourth test end of the test equipment, respectively, so that the test fixture can be disassembled and assembled. Obviously, compared with the process of disassembling and assembling cables in the related art, especially the process of disassembling and assembling multiple cables, the disassembly and assembly of the test fixture in this embodiment (such as disassembly and assembly by plugging and unplugging) can realize the disassembly and assembly of multiple pairs of mutually connected test ends at the same time, which is simple to disassemble and assemble, and the replacement cycle is shorter, thereby improving the efficiency of RF testing.

[0011] In some designs of the present application, a test fixture having a carrier board is provided, which is suitable for a device under test having a third test terminal on a single side.

[0012] The test fixture includes a carrier board. A first test end and a second test end are respectively arranged on a first surface and a second surface opposite to the carrier board. During the radio frequency test process, the test fixture is used to fix the device under test on the side facing the first surface of the carrier board, and the second surface of the carrier board faces the panel of the test equipment; the first test end is used to dock with a third test end on the surface of the device under test facing the carrier board; and the second test end is used to dock with a fourth test end on the surface of the panel facing the carrier board.

[0013] Thus, during the RF test, the device under test, the carrier board, and the panel are stacked in sequence, with the device under test stacked on the side of the carrier board to which the first test end is directed, and the panel stacked on the side of the carrier board to which the second test end is directed. It should be noted that the technical term "stacked" in the embodiments of the present application refers to an area where the orthographic projections of two stacked structures in the stacking direction have overlap.

[0014] In this embodiment, in the case where the device under test is stacked on the side where the first test end of the carrier is located, and the panel is stacked on the side where the second test end of the carrier is located, when the device under test is fixed by the test fixture during the RF test process, the third test end of the device under test is directed toward the first surface of the carrier, and the fourth test end of the panel is directed toward the second surface of the carrier, so that the third test end of the device under test and the first test end of the carrier face each other, and the fourth test end of the panel and the second test end of the carrier face each other, thereby providing a basis for achieving relative and docking. On this basis, by customizing the positions and structures of the first test end and the third test end, the second test end and the fourth test end, the first test end can be used to dock with the third test end on the surface of the device under test facing the carrier, and the second test end can be used to dock with the fourth test end on the surface of the panel facing the carrier.

[0015] In some other design modes of the present application, a test fixture having multiple carriers is provided, which is suitable for a device under test having multiple surfaces with third test terminals. The multiple carriers are used to face the multiple surfaces of the device under test one by one. When radio frequency testing is required, the first test terminal of the carrier is used to connect with the third test terminal on the opposite surface of the multiple surfaces of the device under test.

[0016] Optionally, this embodiment provides a test fixture having two oppositely disposed carrier plates, which is suitable for a device under test having third test terminals on two opposite surfaces.

[0017] Specifically, the test fixture includes two carriers; the two carriers are respectively a first carrier and a second carrier that are arranged opposite to each other. The surface of the first carrier facing the second carrier and the surface of the second carrier facing the first carrier are both provided with at least one first test end; the first test end on the first carrier is used to dock with the third test end on the surface of the device under test facing the first carrier; the first test end on the second carrier is used to dock with the third test end on the surface of the device under test facing the second carrier.

[0018] In this embodiment, when the test fixture is used to fix the device under test during the RF test, the device under test is fixed between the first carrier plate and the second carrier plate, so that one of the two opposite surfaces of the device under test provided with the third test end faces the first carrier plate, and the other faces the second carrier plate. In this way, the first carrier plate, the device under test, and the second carrier plate are stacked in sequence.

[0019] In the case where the first test end of the first carrier board is arranged on the surface of the first carrier board facing the second carrier board, it can face the third test end of the device under test on the surface facing the first carrier board, so as to facilitate docking with the third test end of the device under test; the first test end of the second carrier board is arranged on the surface of the second carrier board facing the first carrier board, and it can face the third test end of the device under test on the surface facing the second carrier board, so as to facilitate docking with the third test end of the device under test on the surface facing the second carrier board.

[0020] In the specific implementation process, when the position of the third test end of the device under test is determined, the test fixture can be customized so that the first test end of the first carrier board can be opposite to the third test end of the device under test, and the first test end of the second carrier board can be opposite to the third test end on the lower surface of the device under test. In addition, each test end can also be customized into a structure that can achieve docking, such as the RF seat or RF probe mentioned above.

[0021] In some embodiments, the test device includes two panels, the two panels are respectively a first panel and a second panel arranged opposite to each other. A fourth test terminal is arranged on the first panel and the second panel facing each other. The second test terminal on the first carrier is arranged on the surface of the first carrier facing away from the second carrier, and is used to dock with the fourth test terminal on the surface of the first panel facing the second panel; the second test terminal on the second carrier is arranged on the surface of the second carrier facing away from the first carrier, and is used to dock with the fourth test terminal on the surface of the second panel facing the first panel.

[0022] On the basis of the previous embodiment, when the device under test is fixed by the test fixture during the RF test, the first carrier plate and the second carrier plate of the test fixture are located between the first panel and the second panel. In this way, the first panel, the first carrier plate, the device under test, the second carrier plate, and the second panel are stacked in sequence, the first carrier plate is stacked on the side to which the fourth test end of the first panel faces, and the second carrier plate is stacked on the side to which the fourth test end of the second panel faces.

[0023] The second test end on the first carrier is arranged on the surface of the first carrier facing away from the second carrier, and faces the fourth test end on the surface of the first panel facing the second panel, so as to facilitate docking with the fourth test end on the surface of the first panel facing the second panel; the second test end on the second carrier is arranged on the surface of the second carrier facing away from the first carrier, and faces the fourth test end on the surface of the second panel facing the first panel, so as to facilitate docking with the fourth test end on the surface of the second panel facing the first panel.

[0024] It is understood that in the specific implementation process, the second test end on the first carrier can be opposite to the fourth test end on the first panel, and the first test end on the second carrier can be opposite to the fourth test end on the second panel. In addition, each test end can be customized into a structure that can achieve docking, such as the RF seat or RF probe mentioned above.

[0025] Exemplarily, the test equipment includes a shielding box and a tester. During the RF test, the test fixture and the device under test are placed in the box of the shielding box, and the tester is located outside the box. The box of the shielding box includes a panel. The test fixture is used to fix the device under test in the box; the tester is located outside the box. The fourth test end is arranged on the inner surface of the panel, and is used to face the second test end; the fourth test end is also used to connect with the tester to establish a RF transmission channel between the device under test and the tester.

[0026] In this embodiment, the shielding box is set so that the device under test can be placed in the box of the shielding box during the RF test process, thereby shielding the interference of electromagnetic waves of other components (such as a tester) outside the shielding box in the test environment on the RF test results of the device under test, thereby improving the accuracy of the RF test results. In this case, part or all of the box of the shielding box can be used as a panel for setting the fourth test end. Because the device under test is placed in the box, in order to dock the second test end of the carrier board with the fourth test end of the panel, the fourth test end is set on the inner surface of the panel, and the second test end is facing each other, so as to facilitate the docking between the fourth test end and the second test end.

[0027] It can be understood that in this embodiment, the tester is an instrument for sending and / or receiving radio frequency test signals. When the fourth test terminal is connected to the tester, the first test terminal is connected to the third test terminal, and the second test terminal is connected to the fourth test terminal, the radio frequency test signal can be transmitted between the device under test and the tester to facilitate radio frequency testing.

[0028] In some embodiments of the present application, the docking mentioned above is plugging. Plug-in refers to connecting two or more connectors by inserting them together to perform signal transmission such as data transmission or power supply.

[0029] Optionally, the first test end is one of a radio frequency socket (ie, a structure with a hole) and a radio frequency probe (a structure with a needle that can be inserted into the hole of the radio frequency socket), and the third test end is the other of the radio frequency socket and the radio frequency probe.

[0030] For example, the first test end is an RF socket, and the third test end is an RF probe, and the two are adapted in size to facilitate plug-in; for another example, the first test end is an RF probe, and the third test end is an RF socket, and the two are adapted in size to facilitate plug-in.

[0031] In this embodiment, the connection between the RF socket and the RF probe can not only transmit the RF test signal, but also play a positioning role. It can reduce the impact of the lateral displacement (perpendicular to the insertion direction) of the test fixture and the device under test on the accuracy of the RF test results during the RF test process.

[0032] In some examples of the present application, the second test end is one of a radio frequency socket and a radio frequency probe, and the fourth test end is the other of the radio frequency socket and the radio frequency probe.

[0033] For example, if the second test end is an RF socket, then the fourth test end is an RF probe, and the two are adapted in size to facilitate docking; for another example, if the second test end is an RF probe, then the fourth test end is an RF socket, and the two are adapted in size to facilitate docking.

[0034] In this example, the connection between the RF socket and the RF probe can not only realize the transmission of the RF test signal, but also play a positioning role, which can reduce the impact of the lateral displacement (perpendicular to the insertion direction) of the test fixture and the test equipment on the accuracy of the RF test results during the RF test. In addition, compared with the solution of positioning the test fixture by hexagonal screws in the related art, the positioning of the test fixture is achieved by plugging the RF socket and the RF probe in this embodiment. When replacing the test fixture, it does not involve the disassembly and assembly of additional positioning parts such as hexagonal screws, which makes disassembly and assembly easier and the replacement cycle shorter, thereby improving the efficiency of RF testing.

[0035] Optionally, a fifth test terminal is further provided on the carrier board; the fifth test terminal is used to connect with the sixth test terminal of the device under test. A power supply device is also provided on the carrier board; the power supply device is connected to the fifth test terminal and is used to supply power to the device under test when the fifth test terminal and the sixth test terminal are connected.

[0036] In this embodiment, before the RF test, the device under test can be assembled onto the test fixture so that the sixth test terminal of the device under test and the fifth test terminal on the test fixture are connected, so that the power supply device on the carrier can supply power to the device under test in advance. It can be understood that when the device under test is powered, the device under test can be powered on and started. Based on this, when performing RF testing on other devices under test, the test fixture provided in this embodiment can support powering on the device under test in advance so that the device under test can be started in advance, thereby realizing parallel testing, saving the time for starting the device under test, and thus improving the efficiency of RF testing and the test utilization rate of the test equipment.

[0037] It is understandable that the power supply device has a charging demand when there is no electricity. In order to meet the charging demand of the power supply unit, the present application provides the following two embodiments:

[0038] A first embodiment: at least one second test terminal includes a ninth test terminal, and at least one fourth test terminal includes a tenth test terminal, wherein the tenth test terminal is used to connect to a power source, and the ninth test terminal is used to connect to the tenth test terminal.

[0039] The ninth test end is also connected to the power supply device through a cable, etc., for charging the power supply device from the power supply when the ninth test end and the tenth test end are connected. This embodiment supports charging the power supply device during the RF test. Of course, the panel can also be used to transfer the power supply device to the power supply for charging without performing the RF test.

[0040] The second embodiment: A charging interface may also be provided on the carrier board, and the charging interface is used to connect to an external power source, such as connecting to an external power source through a power transmission line. The charging interface is also connected to a power supply device, and is used to charge the power supply device from the external power supply when the charging interface is connected to the external power source. This embodiment does not require charging by connecting to a power source through the panel of the test equipment, but can be charged by connecting to an external power source through the charging interface, thereby improving the test utilization rate of each component of the test equipment.

[0041] Optionally, in other embodiments, the charging interface may be the ninth test terminal. Different from the first embodiment, the ninth test terminal is not used to connect to the tenth test terminal, but to connect to the external power supply. In this way, this embodiment can make the disassembly and assembly process between the charging interface and the external power supply more convenient while improving the test utilization rate of each component of the test equipment.

[0042] In the specific implementation process, the above two embodiments can be implemented one by one or at the same time, and the embodiments of the present application do not limit this. It can be understood that when the charging demand of the power supply unit is met, the device under test can be kept powered off during the RF test.

[0043] Optionally, at least one second test terminal further includes a seventh test terminal, and at least one fourth test terminal includes an eighth test terminal; the seventh test terminal is used to dock with the eighth test terminal; the seventh test terminal is used to dock with the eighth test terminal of the test device. A storage device is also provided on the carrier; the storage device is used to store line loss parameters corresponding to the test fixture; the storage device is connected to the seventh test terminal, and is used for the test device to read the line loss parameters corresponding to the test fixture when the seventh test terminal and the eighth test terminal are docked, and the line loss parameters corresponding to the test fixture are used to assist in generating RF test signals.

[0044] It can be understood that the setting of the storage device enables the test fixture provided in this embodiment to perform RF calibration on the transmission channel from the device under test to the test fixture in advance before the RF test, and store the line loss parameters corresponding to the test fixture obtained by the RF calibration in the storage device in advance. Based on this, there is no need to perform RF calibration online during RF testing. The test equipment can directly read the pre-stored line loss parameters from the storage device through the seventh test terminal and the eighth test terminal connected to each other during RF testing to assist in generating RF test signals, thereby realizing parallel testing, saving RF calibration time, and thus improving RF testing efficiency and test equipment test utilization.

[0045] In order to implement the writing of line loss parameters corresponding to the test fixture, the present application embodiment provides the following two examples:

[0046] The first example: In the test fixture, the storage device is connected to the seventh test terminal, and is used for the test device to write the line loss parameters corresponding to the test fixture to the storage device when the seventh test terminal and the eighth test terminal are connected. This embodiment reuses the original components of the test device to write the line loss parameters corresponding to the test fixture, and can be performed when these components are not in use, so as to improve the test utilization rate of each component of the equipment test device.

[0047] The second example: the test fixture also includes a communication interface, and the communication interface is used to connect to a host computer, which is a computer that performs radio frequency calibration on the line loss corresponding to the test fixture and obtains the line loss corresponding to the test fixture. The communication interface is also connected to a storage device, and is used for the host computer to write the line loss parameters corresponding to the test fixture to the storage device when the communication interface and the host computer are connected. This embodiment connects to an additional host computer through the communication interface to write the line loss parameters, does not occupy the test equipment, and can improve the test utilization rate of each component of the equipment test device.

[0048] Optionally, in other embodiments, the communication interface may be the seventh test terminal, which is different from the first example in that the seventh test terminal is not used to connect to the eighth test terminal but to connect to the host computer. In this way, this embodiment can make the disassembly and assembly process between the communication interface and the host computer more convenient while improving the test utilization rate of each component of the test equipment.

[0049] During the specific implementation process, the above two examples can be implemented separately or simultaneously, and the embodiments of the present application do not limit this.

[0050] In a second aspect, an embodiment of the present application provides a radio frequency test system. The radio frequency test system includes a test fixture as in any embodiment of the first aspect, which is used to fix the device under test during the radio frequency test process, and also includes a test device. Among them, the test device includes a fourth test end. During the radio frequency test process, the first test end of the test fixture is used to dock with the third test end of the device under test, and the second test end of the test fixture is used to dock with the fourth test end to establish a radio frequency transmission channel between the device under test and the test device.

[0051] Exemplarily, the test equipment includes a shielding box and a tester. The shielding box includes a panel. The test fixture is used to fix the device under test in the box, and the tester is arranged outside the box. The fourth test end is arranged on the inner surface of the panel, and is used to face the second test end; the fourth test end is also used to connect with the tester to establish a radio frequency transmission channel between the device under test and the tester.

[0052] It can be understood that, unless otherwise described, the beneficial effects that can be achieved by the RF test system provided by any embodiment of the second aspect can refer to the beneficial effects of any embodiment of the test fixture provided by the first aspect, and will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] Figure 1 An architecture diagram of a mobile terminal device provided in an embodiment of the present application;

[0054] Figure 2 An architecture diagram of a radio frequency test system provided in an embodiment of the present application;

[0055] Figure 3 A more detailed architecture diagram of a radio frequency test system provided in an embodiment of the present application;

[0056] Figure 4 A test flow chart of the radio frequency emission index provided in the embodiment of the present application;

[0057] Figure 5 A test flow chart of the radio frequency reception index provided in the embodiment of the present application;

[0058] Figure 6It is a schematic diagram of assembling a device under test, a test fixture and a shielding box in the related art;

[0059] Figure 7 for Figure 6 The schematic diagram of the connection relationship between the panel, the test fixture, and the device under test during the RF test process is shown;

[0060] Figure 8 A schematic diagram of the positional relationship between a panel, a test fixture, and a device under test during a radio frequency test provided in some embodiments of the present application;

[0061] Fig. 9 A schematic diagram of the structure of a radio frequency base and a radio frequency probe provided in an embodiment of the present application;

[0062] Fig.10 A schematic diagram of the positional relationship between a panel, a test fixture, and a device under test during a radio frequency test provided in some other embodiments of the present application;

[0063] Fig.11 A schematic diagram of a power supply connection scheme for a power supply device of a test fixture provided in some embodiments of the present application;

[0064] Fig.12 A schematic diagram of a power supply connection scheme for a power supply device of a test fixture provided in some other embodiments of the present application;

[0065] Fig.13 A schematic diagram of the connection relationship of the storage device of the test fixture provided in some embodiments of the present application;

[0066] Fig.14 A schematic diagram of the connection relationship of the protection plate of the test fixture provided in an embodiment of the present application;

[0067] Fig.15 Schematic diagram of assembly of a device under test, a test fixture, and a shielding box provided in some embodiments of the present application.

[0068] Reference numerals:

[0069] 10-RF test system;

[0070] 100 - test fixture; 110 - carrier; 111 - first carrier; 112 - second carrier; 120 - power supply device; 130 - charging interface; 140 - memory; RF1 - first test end; RF2 - second test end;

[0071] 200-test equipment; 210-industrial computer; 220-test instrument; 230-programmable power supply; 240-RF switch; 250-shielding box; 251-panel; 2511-first panel; 2512-second panel; 252-drawer; RF4-fourth test terminal;

[0072] 300-device under test; RF3-third test terminal. DETAILED DESCRIPTION

[0073] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0074] The terms "first" and "second" in the specification and claims herein are used to distinguish different objects rather than to describe a specific order of objects. In the description of the embodiments of the present application, unless otherwise specified, the meaning of "multiple" refers to two or more than two, for example, multiple processing units refer to two or more processing units, etc.; multiple elements refer to two or more elements, etc.

[0075] The technical term "electrical connection" involved in the embodiments of the present application refers to connecting two electrical components to achieve the transmission and interconnection of current between the electrical components.

[0076] In the embodiments of the present application, the words "exemplarily" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design described as "exemplarily" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplarily" or "for example" is intended to present related concepts in a specific way.

[0077] RF calibration and board test (Calibration and Board Test, CBT) refers to the calibration of the parameters of the RF transmission channel on the circuit board, and the testing of the RF indicators of the calibrated circuit board. RF calibration and board test will be referred to as RF test in the future. The test items cover the RF indicators required by the 3rd Generation Partnership Project (3GPP) protocol.

[0078] It can be seen that before the wireless communication device leaves the factory, the RF indicators of the wireless communication device can be tested by performing RF testing on its circuit board, so that the RF performance of the wireless communication device can meet the standards and can provide reliable performance during actual use after leaving the factory.

[0079] For example, please refer to Figure 1 , Figure 1Taking the wireless communication device as a mobile terminal device as an example, the architecture of the mobile terminal device is illustrated. The mobile terminal device can be an electronic device with wireless communication function such as a mobile phone or a tablet.

[0080] Taking a mobile phone as an example, the mobile terminal device may include an application subsystem, memory, massive storage, a baseband subsystem, a radio frequency integrated circuit (RFIC), a radio frequency front end (RFFE) device, and an antenna (ANT), and these devices can be coupled through various interconnection buses or other connection methods.

[0081] Figure 1 In the figure, ANT_1 represents the first antenna, ANT_N represents the Nth antenna, and N is a positive integer greater than 1. Tx represents the transmit path, Rx represents the receive path, and different numbers represent different paths. FBRx represents the feedback receive path, PRx represents the main receive path, and DRx represents the diversity receive path. HB represents high frequency, and LB represents low frequency, and the two refer to the relative high and low frequencies. BB represents baseband. It should be understood that Figure 1 The marks and components are for illustration purposes only and are only used as one possible implementation method. The embodiments of the present application also include other implementation methods.

[0082] Among them, the application subsystem can be used as the main control system or main computing system of the mobile terminal device to run the main operating system and application programs, manage the software and hardware resources of the entire mobile terminal device, and provide a user interface for the user. The application subsystem may include one or more processing cores. In addition, the application subsystem may also include driver software related to other subsystems (such as the baseband subsystem). The baseband subsystem may also include one or more processing cores, as well as a hardware accelerator (HAC) and cache.

[0083] Figure 1In the embodiment, RFFE devices, RFIC 1 (and optional RFIC 2) can together constitute the RF subsystem. The RF subsystem can be further divided into an RF receive path and an RF transmit path. The RF receive path can receive RF signals through an antenna, process the RF signals (such as amplification, filtering and down-conversion) to obtain baseband signals, and pass them to the baseband subsystem. The RF transmit path can receive baseband signals from the baseband subsystem, perform RF processing (such as up-conversion, amplification and filtering) on ​​the baseband signals to obtain RF signals, and finally radiate the RF signals into space through an antenna. Specifically, the RF subsystem may include electronic devices such as an antenna switch, an antenna tuner, a low noise amplifier (LNA), a power amplifier (PA), a mixer, a local oscillator (LO), and a filter, which can be integrated into one or more chips as needed. The antenna can sometimes also be considered as part of the RF subsystem.

[0084] The baseband subsystem can extract useful information or data bits from the baseband signal, or convert the information or data bits into a baseband signal to be transmitted. These information or data bits can be data representing user data such as voice, text, video, or control information. For example, the baseband subsystem can implement signal processing operations such as modulation and demodulation, encoding, and decoding. Different wireless access technologies, such as 5G NR and 4G LTE, often have different baseband signal processing operations. Therefore, in order to support the integration of multiple mobile communication modes, the baseband subsystem can include multiple processing cores or multiple HACs at the same time.

[0085] In addition, since the radio frequency signal is an analog signal, the signal processed by the baseband subsystem is mainly a digital signal, and an analog-to-digital converter is also required in the mobile terminal device. The analog-to-digital converter includes an analog-to-digital converter (ADC) that converts an analog signal into a digital signal, and a digital-to-analog converter (DAC) that converts a digital signal into an analog signal. In the embodiment of the present application, the analog-to-digital converter can be set in the baseband subsystem or in the radio frequency subsystem.

[0086] It should be understood that in the embodiments of the present application, the processing core may represent a processor, which may be a general-purpose processor or a processor designed for a specific field. For example, the processor may be a central processing unit (CPU) or a digital signal processor (DSP). The processor may also be a microcontroller (MCU), a graphics processor (GPU), an image signal processor (ISP), an audio signal processor (ASP), and a processor specially designed for artificial intelligence (AI) applications. AI processors include, but are not limited to, neural network processing units (NPUs), tensor processing units (TPUs), and processors referred to as AI engines.

[0087] Hardware accelerators can be used to implement some sub-functions with high processing overhead, such as data packet assembly and parsing, data packet encryption and decryption, etc. These sub-functions can also be implemented using general-purpose processors, but due to performance or cost considerations, it may be more appropriate to use hardware accelerators. Therefore, the type and number of hardware accelerators can be specifically selected based on demand. In a specific implementation, one or a combination of field programmable gate arrays (FPGA) and application specific integrated circuits (ASIC) can be used to implement it. Of course, one or more processing cores can also be used in the hardware accelerator.

[0088] Memories can be divided into volatile memory and non-volatile memory (NVM). Volatile memory refers to memory that loses the data stored inside when the power supply is interrupted. At present, volatile memory is mainly random access memory (RAM), including static RAM (SRAM) and dynamic RAM (DRAM). Non-volatile memory refers to memory that does not lose the data stored inside even if the power supply is interrupted. Common non-volatile memories include read-only memory (ROM), optical disks, magnetic disks, and various memories based on flash memory technology. Generally speaking, volatile memory can be used for memory, and non-volatile memory, such as magnetic disks or flash memory, can be used for large-capacity storage.

[0089] In an embodiment of the present application, the baseband subsystem and the radio frequency subsystem together constitute a communication subsystem, providing wireless communication functions for the mobile terminal device. Generally, the baseband subsystem is responsible for managing the software and hardware resources of the communication subsystem, and can configure the operating parameters of the radio frequency subsystem. One or more processing cores of the baseband subsystem can be integrated into one or more chips, which can be referred to as a baseband processing chip or a baseband chip. Similarly, RFIC can be referred to as a radio frequency processing chip or a radio frequency chip. In addition, with the evolution of technology, the functional division of the radio frequency subsystem and the baseband subsystem in the communication subsystem can also be adjusted. For example, the functions of part of the radio frequency subsystem are integrated into the baseband subsystem, or the functions of part of the baseband subsystem are integrated into the radio frequency subsystem. In practical applications, based on the needs of the application scenario, the mobile terminal device can adopt a combination of different numbers and types of processing cores.

[0090] In an embodiment of the present application, the RF subsystem may include an independent antenna, an independent RF front-end (RF frontend, RFFE) device, and an independent RF chip. RF chips are sometimes also referred to as receivers, transmitters, or transceivers. Antennas, RF front-end devices, and RF processing chips can all be manufactured and sold separately. Of course, the RF subsystem may also use different devices or different integration methods based on power consumption and performance requirements. For example, some devices belonging to the RF front end are integrated into the RF chip, and even the antenna and RF front-end devices are integrated into the RF chip. The RF chip may also be called an RF antenna module or antenna module.

[0091] Combination Figure 1 Understandably, Figure 1 For the mobile terminal device shown in the figure, the RF test is to test the RF indicators of its RF subsystem. RF indicators may include but are not limited to one or more of transmit power, error vector magnitude (EVM), frequency error (FE), receive sensitivity and packet loss rate. Among them, transmit power, EVM, and FE are usually regarded as RF transmit indicators, and receive sensitivity and packet loss rate are usually regarded as RF receive indicators.

[0092] Currently, the RF test system is used to perform RF test. Figure 2 and Figure 3 An RF test system used in RF testing is described by way of example.

[0093] For example, please refer to Figure 2 , Figure 2 The RF test system 10 includes a test fixture 100 and a test device 200 .

[0094] The test fixture 100 is used to fix the device under test 300 during the radio frequency test process to prevent the device under test 300 from loosening and affecting the radio frequency test results.

[0095] It should be noted that the device under test 300 refers to a device whose radio frequency indicators are tested, such as a circuit board of a wireless communication device such as a mobile phone, a tablet, a 4G / 5G router, an IoT gateway, etc. Figure 1 In order to implement radio frequency testing, a test terminal is currently provided on the device under test 300, for example, Figure 1 The circuit board of the mobile terminal device in the area corresponding to the radio frequency subsystem is usually provided with a test terminal. These test terminals are used as connection ports for radio frequency testing and are used to connect to the test device 200 to facilitate radio frequency testing.

[0096] It is worth noting that the device under test 300 is indicated in the test fixture 100 by a dotted line in the figure, indicating that the device under test 300 is fixed by the test fixture 100. It is understood that although the device under test 300 is shown in the figure, the device under test 300 may not be considered as a part of the RF test system 10.

[0097] The test device 200 is used to connect to the test terminal of the device under test 300 during the RF test process to facilitate the RF test. Figure 2 As shown, the test fixture 100 can also play a role of switching, and the test equipment 200 can be connected to the test end of the device under test 300 through the test fixture 100.

[0098] It can be understood that when the test equipment 200 and the test end of the device under test 300 are connected, a radio frequency test signal can be transmitted between the test equipment 200 and the test end of the device under test 300 to perform a radio frequency test.

[0099] The principle of RF testing is as follows: During the RF testing process, the test device 200 can disconnect the RF subsystem of the device under test 300 from the antenna (such as Figure 1 The RF transmission channel of the antennas ANT_1 to ANT_N, etc. shown in the figure is used to establish a RF transmission channel between the test device 200 and the RF subsystem of the device under test 300. In this way, the RF test signal can be transmitted between the device under test 300 and the test device 200 through the RF transmission channel, thereby simulating the real wireless communication process between the device under test 300 and other wireless communication devices. In the process of transmitting the RF test signal between the device under test 300 and the test device 200 through the RF transmission channel, the RF indicators required for the RF test of the device under test 300 can be obtained by collecting and analyzing the RF test signal, thereby realizing the RF test of the RF indicators.

[0100] For example, when measuring the RF emission index of the device under test 300, the device under test 300 sends a RF test signal to the test equipment 200 through the RF transmission channel, simulating the process of the device under test 300 sending a RF signal to other wireless communication devices. The test equipment 200 obtains the RF emission index of the device under test 300 by collecting and analyzing the received RF test signal.

[0101] For another example, when measuring the RF reception index of the device under test 300, the test device 200 sends a RF test signal to the device under test 300 through the RF transmission channel to simulate the process of the device under test 300 receiving RF signals sent by other wireless communication devices. The test device 200 obtains the RF reception index of the device under test 300 by collecting and analyzing the RF test signal received by the device under test 300.

[0102] In addition, before the RF index is tested, there is usually a RF calibration stage. RF calibration: By collecting and analyzing the RF test signal transmitted by the RF transmission channel, the line loss of the RF test signal during the transmission process is obtained; then, the RF test signal transmitted by the RF transmission channel is compensated based on the line loss, so that the RF emission index or RF index of the device under test 300 can meet expectations.

[0103] For example, please refer to Figure 3 , Figure 3A more detailed architecture diagram of a radio frequency test system 10 is provided in an embodiment of the present application. The device under test 300 shown in the figure schematically shows four test terminals, namely, test terminal P15, test terminal P25, test terminal P35, and test terminal P45. In other embodiments, the device under test 300 may have more or fewer test terminals, which is not limited in the embodiment of the present application.

[0104] exist Figure 3 In the illustrated embodiment, in order to transfer the test device 200 to the test device 200, the test fixture 100 has interfaces P14 to P44 for connecting the device under test 300, and interfaces P13 to P43 for connecting the test device 200 (specifically, the shielding box 250 of the test device 200). The interfaces P14 to P44 of the test fixture 100 and the interfaces P13 to P43 of the test fixture 100 are connected one by one to facilitate the transfer, which will be described in detail in the subsequent content and will not be elaborated here.

[0105] The RF test system has 10 pairs Figure 2 The test device 200 shown is refined. Specifically, Figure 2 The test equipment 200 shown may include an industrial computer 210, a tester 220, a programmable power supply 230, a radio frequency switch 240, and a shielding box 250. It is understood that Figure 3 Only some components of the test device 200 are schematically shown. In other embodiments of the present application, Figure 3 The test device 200 shown may include more or fewer components than those shown in the figure, or combine certain components, or separate certain components, or arrange the components differently, which is not specifically limited in the embodiment of the present application.

[0106] The functions of the components of the test device 200 and their connection relationships during the radio frequency test process are described below.

[0107] The industrial computer 210 is installed with test software related to radio frequency testing. By running the test software, the entire radio frequency testing process can be directed and controlled, thereby realizing radio frequency testing.

[0108] Exemplarily, the industrial computer 210 may be an electronic device with computing and processing capabilities, such as a computer, a tablet, or a supercomputer.

[0109] The industrial computer 210 is connected to the test terminal P35 of the device under test 300 so that the industrial computer 210 and the device under test 300 can communicate during the RF test process, thereby controlling the device under test 300 to generate a specific RF test signal to transmit to the tester 220, and controlling the device under test 300 to feedback RF reception indicators related to the RF test signal received from the tester 220.

[0110] The industrial computer 210 is also connected to the tester 220, so that the industrial computer 210 communicates with the tester 220 during the RF test process, thereby controlling the tester 220 to generate a specific RF test signal to transmit to the device under test 300, and controlling the tester 220 to feedback the RF index of the RF test signal received from the device under test 300. For example, the industrial computer 210 can be wirelessly connected to the tester 220 through a router, etc., or can be wired to the tester 220 through a cable.

[0111] It can be seen that the tester 220 has the functions of transmitting and analyzing radio frequency test signals. Based on this, the tester 220 is usually called a comprehensive tester, which may include a signal generator (vector signal generator, VSG) and a signal analyzer (vector signal analyzer, VSA).

[0112] The VSG can be used as a signal source to cooperate with the industrial computer 210 to generate a specific RF test signal to test the RF reception performance of the device under test 300, that is, to test the RF reception index of the device under test 300. For example, the VSG can generate RF test signals of various frequencies, powers, and modulation types according to the instructions of the industrial computer 210.

[0113] The VSA is used to analyze the received RF test signal and output various index parameters related to the RF test signal (i.e., the above-mentioned RF test data) to evaluate the quality of the RF test signal and to test the RF transmission performance of the device under test 300, i.e., to test the RF transmission index of the device under test 300. The VSA may include, but is not limited to, a spectrum analyzer (which can detect the frequency, amplitude, modulation and other characteristics of the signal).

[0114] In addition, the tester 220 is connected to the test terminal P15 and the test terminal P25 of the device under test 300 respectively, so that a radio frequency transmission channel can be established between the tester 220 and the test terminal P15 and the test terminal P25 of the device under test 300 respectively, so that the tester 220 and the device under test 300 can transmit radio frequency test signals to perform radio frequency testing.

[0115] Combination Figure 4 , Figure 4 A test flow chart of the RF emission indicators provided in the embodiment of the present application.

[0116] In the case of testing the RF emission index, the industrial computer 210 sends a corresponding RF test instruction to the device under test 300 according to the RF emission index to be tested, so as to control the device under test 300 to generate a corresponding RF test signal based on the RF test instruction, and send the RF test signal to the tester 220. After receiving the RF test signal transmitted by the device under test 300, the tester 220 analyzes the RF test signal and feeds back the RF test data obtained by the analysis to the industrial computer 210. It can be understood that the RF test data is the data required for obtaining the RF index obtained based on the RF test signal. Optionally, the RF test data can be the RF index itself. The industrial computer 210 obtains the RF emission index based on the RF test data fed back by the tester 220, thereby realizing the test of the RF emission index.

[0117] Combination Figure 5 , Figure 5 A test flow chart of the RF emission indicators provided in the embodiment of the present application.

[0118] In the case of testing the RF reception index, the industrial computer 210 controls the tester 220 to transmit the corresponding RF test instruction to the tester 220 according to the RF reception index to be tested, so as to control the tester 220 to generate the corresponding RF test signal based on the RF test instruction, and send the RF test signal to the device under test 300. After receiving the RF test signal sent by the tester 220, the device under test 300 analyzes the RF test signal and feeds back the RF test data obtained by the analysis to the industrial computer 210. The industrial computer 210 obtains the RF reception index based on the RF test data fed back by the device under test 300, thereby realizing the test of the RF reception index. Alternatively, in some other embodiments, the industrial computer 210 can collect the RF test signal received by the device under test 300, and then analyze it by itself or the tester 220 to obtain the RF reception index, which is not particularly limited in the embodiments of the present application.

[0119] Please continue to refer to Figure 3 , the program-controlled power supply 230 is connected to the test terminal P45 of the device under test 300, and is used to supply power to the device under test 300. It should be noted that the device under test 300 is in a powered-on state and fully started before the test can be started, so it is necessary to set a power supply to supply power to the device under test 300. In other embodiments, the program-controlled power supply 230 can also be replaced by other types of power supplies.

[0120] Alternatively, if Figure 3As shown, the RF test system 10 may further include an RF switch 240, connected between the tester 220 and the device under test 300, for switching and selecting the RF transmission channel between the tester 220 and the test terminal P15 and the test terminal P25 of the device under test 300. Exemplarily, the RF switch 240 may be a single-pole multi-throw switch.

[0121] It should be noted that the RF transmission channel for transmitting the RF test signal is the transmission path from the device under test 300 to the tester 220. It can be understood that the number of RF transmission channels depends on the number of test terminals in the device under test 300 that are used to transmit RF test signals rather than electrical signals that assist RF testing (such as current signals for power supply). In different devices under test 300, the number of test terminals used to transmit RF test signals is different. For example, Figure 3 The test end of the device under test 300 for transmitting the RF test signal has two test ends P15 and test end P25, and therefore has two RF transmission channels, namely, the test end P15 of the device under test 300—the interface P14 of the test fixture—the interface P13 of the test fixture—the interface P12 of the panel 251—the interface P11 of the panel 251—the RF switch 240—the tester 220; and, the test end P25 of the device under test 300—the interface P24 of the test fixture—the interface P23 of the test fixture—the interface P22 of the panel 251—the interface P21 of the panel 251—the RF switch 240—the tester 220.

[0122] In this case, the RF switch 240 can be a single-pole double-throw switch, whose input end is connected to the tester 220, and whose two output ends are respectively connected to the test end P15 and the test end P25 of the device under test 300 in a one-to-one correspondence. By selectively connecting one of the input ends of the RF switch 240 to one of the output ends of the RF switch 240, one of the two RF transmission channels is selected to communicate the RF test signal. Optionally, the RF switch 240 can be connected to the industrial computer 210, and is used to switch and select the RF transmission channel under the control of the industrial computer 210.

[0123] It can be understood that in other embodiments, the RF test system 10 may not include the RF switch 240 , and this embodiment of the present application does not limit this.

[0124] Alternatively, if Figure 3 As shown, the RF test system 10 may further include a shielding box 250. The test fixture 100 is used to fix the device under test 300 in the box of the shielding box 250. In this way, during the RF test process, the shielding box 250 can provide a relatively interference-free test environment for the device under test 300, reduce the interference of external electromagnetic waves entering the shielding box 250 on the RF test of the device under test 300, and thus improve the accuracy of the RF test results.

[0125] When the device under test 300 is fixed in the shielding box 250, in order to ensure that the device under test 300 can communicate with the industrial computer 210 and the tester 220 ( Figure 3 220) and a program-controlled power supply 230, optionally, as Figure 3 As shown, the body of the shielding box 250 may include a panel 251 with an interface. The industrial computer 210, the RF switch 240, and the programmable power supply 230 located outside the shielding box 250 may be connected to the device under test 300 through the interface on the panel 251. It can be understood that the panel 251 may be one or more of the top wall, the bottom wall, and the side wall of the body of the shielding box 250.

[0126] The panel 251 has an outer surface and an inner surface relative to each other. The outer surface of the panel 251 refers to the surface facing the inside of the shielding box 250; the outer surface of the panel 251 refers to the surface facing the outside of the shielding box 250. The outer surface of the panel 251 has interfaces P11 to P41 for connecting the outer components of the shielding box 250 (such as the industrial computer 210, the radio frequency switch 240, and the programmable power supply 230), and the inner surface of the panel 251 has interfaces P12 to P42 for connecting the inner components of the shielding box 250 (such as the test fixture 100). The interfaces P11 to P41 on the outer surface of the panel 251 are respectively connected to the interfaces P12 to P42 on the inner surface of the panel 251 in a one-to-one correspondence to play a switching role.

[0127] The connection relationship between the components of the test equipment 200 and the test fixture 100 , and between the test fixture 100 and the device under test 300 during the radio frequency test process is exemplarily described below.

[0128] like Figure 3 As shown, the tester 220 is connected to the RF switch 240 via a coaxial cable or the like, and the RF switch 240 can be connected to the interface P11 and the interface P21 on the outer surface of the panel 251 via a coaxial cable or the like, and the interface P11 and the interface P21 on the outer surface of the panel 251 are respectively connected to the interface P13 and the interface P23 of the test fixture 100 via the interface P12 and the interface P22 on the inner surface of the panel 251, and the interface P13 and the interface P23 of the test fixture 100 are respectively connected to the test end P15 and the test end P25 of the device under test 300 via the interface P14 and the interface P24 of the test fixture 100, thereby realizing the connection between the tester 220 and the test end P15 and the test end P25 of the device under test 300 respectively.

[0129] The industrial computer 210 is connected to the interface P31 on the outer surface of the panel 251 through a cable such as a universal serial bus (USB), the interface P31 on the outer surface of the panel 251 is connected to the interface P33 of the test fixture 100 through the interface P32 on the inner surface of the panel 251, and the interface P33 of the test fixture 100 is connected to the test end P35 of the device under test 300 through the interface P34 of the test fixture 100, thereby realizing the connection between the industrial computer 210 and the test end P35 of the device under test 300.

[0130] The programmable power supply 230 is connected to the interface P41 on the outer surface of the panel 251 through a cable, the interface P41 on the outer surface of the panel 251 is connected to the interface P43 of the test fixture 100 through the interface P42 on the inner surface of the panel 251, and the interface P43 of the test fixture 100 is connected to the test end P45 of the device under test 300 through the interface P44 of the test fixture 100, thereby realizing the connection between the programmable power supply 230 and the test end P45 of the device under test 300.

[0131] In related technologies, such as Figure 6 As shown, Figure 6 It is a schematic diagram of assembling a device under test 300 , a test fixture 100 , and a shielding box 250 in the related art. Figure 6 The shielding box 250 is taken as an example to be described as a drawer-type shielding box 250 .

[0132] The drawer-type shielding box 250 has a removable drawer 252, and the drawer 252 has a bracket for carrying the test fixture 100. When a radio frequency test is required, the following assembly process is involved:

[0133] First, the drawer 252 of the shielding box 250 is pulled out, and the test fixture 100 is placed on the bracket of the drawer 252 and positioned by a plurality of fixings such as hexagonal screws. After positioning, the test fixture 100 is used to connect the interface (such as the interface of the shielding box 250) using a coaxial cable or other cable. Figure 3 Interfaces P13 to P43 shown in FIG. 1 and interfaces in the shielding box 250 (such as Figure 3 The interface P12 to the interface P42) shown is connected.

[0134] Next, the device under test 300 is placed in the test fixture 100 and fixed, and the test fixture 100 is used to connect the interface of the device under test 300 (such as Figure 3 The interfaces P14 to P44 shown in FIG. 1 and the test end of the device under test 300 (such as Figure 3 It is understood that in other embodiments, the test fixture 100 may have only one set of interfaces, such as only having Figure 3The interface P14 to the interface P44 shown are used to connect both the device under test 300 and the shielding box 250 , which is not limited in the embodiment of the present application.

[0135] Afterwards, the drawer 252 is pushed in the direction indicated by the arrow in the figure, and the test fixture 100 and the device under test 300 are pushed into the shielding box 250 together.

[0136] Finally, the test button is activated to power on the device under test 300 and perform a radio frequency test.

[0137] It is understandable that the test fixture 100 is diversified due to the different devices under test 300. For example, the number and position of the test terminals of the device under test 300 are different, and the number and position of the interfaces of the test fixture 100 connecting the device under test 300 are also different. For another example, the appearance of the device under test 300 is different, and the area where the test fixture 100 places the device under test 300 is different due to the shape of the device under test 300. Based on this, when replacing the device under test 300 for RF testing, it is necessary to replace the test fixture 100 together.

[0138] For example, please refer to Figure 7 , Figure 7 for Figure 6 The illustrated schematic diagram is a connection diagram of the panel 251, the test fixture 100, and the device under test 300 during the radio frequency test process.

[0139] Figure 7 The panel 251 shown may be Figure 6 The rear wall of the shielding box 250 opposite to the drawer 252, or the side walls on both sides. Due to the perspective, the interface P13 to the interface P43 on the lower surface of the test fixture 100 are not shown separately in the figure, and their positions correspond to the interface P13 to the interface P43 on the upper surface of the test fixture 100. The positions of the interface P13 to the interface P43 on the lower surface of the test fixture 100 can be adaptively referred to the positions of the interface P13 to the interface P43 on the upper surface of the test fixture 100.

[0140] It can be understood that, because the positions of the test terminals P15 to P45 of different devices under test 300 are different, the positions of the interfaces P14 to P44 and interfaces P13 to P43 of the test fixture 100 adapted to different devices under test 300 are also different.

[0141] That is to say, the position of the interface of the test fixture 100 is not fixed as the position of the test end of the device under test 300 changes, while the positions of the interfaces P12 to P42 of the panel 251 are usually fixed, which makes it possible for the interfaces (interfaces P13 to P43) of the test fixture 100 and the interfaces (interfaces P12 to P42) of the panel 251 to be connected only through cables such as coaxial cables. Of course, in other embodiments, there may be other factors that make it possible for the interfaces of the test fixture 100 and the interfaces of the panel 251 to be connected only through cables such as coaxial cables, for example, the interfaces of the test fixture 100 and the panel 251 that are connected to each other are on different planes.

[0142] In the related art, the test fixture 100 and the shielding box 250 are connected by cables. When replacing the test fixture 100, the cable needs to be disassembled and assembled. Since both ends of the cable are connected, a single cable needs to be disassembled and assembled at both ends, which is cumbersome. Especially when there are many cables, a large number of cables need to be disassembled and assembled, and the replacement cycle is long, which greatly reduces the efficiency of RF testing and the test utilization rate of various components of the test equipment, which is contrary to the current environment of reducing costs and increasing efficiency.

[0143] In addition, due to Figure 6 The test fixture 100 shown is positioned by hexagonal screws and the like. When replacing the test fixture 100, it involves the disassembly and assembly of fixing parts such as hexagonal screws, which also leads to a long replacement cycle, thereby affecting the test efficiency and the test utilization rate of each component of the test equipment.

[0144] In addition, after the test button is pressed to power on the device under test 300, the device under test 300 is started. After the device under test 300 is started, the device under test 300 needs to be calibrated for radio frequency to obtain the line loss compensation value of the radio frequency transmission channel before the test phase of the radio frequency index can be truly entered. Obviously, the preparation and radio frequency calibration of the device under test 300 will also prolong the product test time, thereby affecting the test efficiency and the test utilization rate of each component of the test equipment.

[0145] In order to improve the efficiency of radio frequency testing, the present application embodiment provides another test fixture 100. The test fixture 100 can be applied to Figure 2 and Figure 3 The RF test system 10 shown is used to fix the device under test 300 during the RF test process. Figure 3 The radio frequency test system 10 shown is taken as an example for description.

[0146] Optionally, the device under test 300 may be a circuit board of a wireless communication device such as a mobile phone or a tablet, and may have a test terminal. For example, the test terminal may include a positive battery terminal, a negative battery terminal, a battery ID detection terminal, a ground terminal, a communication terminal, a power input terminal (for example, a power line Vbus of a communication serial bus), etc. In the RF testing industry, the test terminal of the device under test 300 is usually in the form of one or more of a RF (Radio Frequency, RF) socket, a tin plate, a copper plate, a probe, etc.

[0147] Combine the following Figures 8 to 10 The positional relationship among the panel 251 , the test fixture 100 , and the device under test 300 is shown to illustrate the structure and connection relationship of the test fixture 100 provided in the embodiment of the present application.

[0148] For example, please refer to Figure 8 and Fig.10 , Figure 8 and Fig.10 The figure shows the positional relationship of the panel 251 of the shielding box 250, the test fixture 100, and the device under test 300 during the RF test. In order to facilitate the display of the structure of the test fixture 100, the panel 251, the test fixture 100, and the device under test 300 are decomposed along the Z-axis direction in the figure, and the test ends that cannot be displayed on the lower surface are indicated by dotted lines; and in order to facilitate the understanding of the connection relationship between the test fixture 100 and the panel 251 and the device under test 300, the figure also indicates the test ends with a connection relationship by dotted lines with arrows.

[0149] The test fixture 100 includes a carrier plate 110. For the convenience of the following description, an XYZ coordinate system is established, and the length direction of the carrier plate 110 is defined as the X-axis direction, the width direction of the carrier plate 110 is defined as the Y-axis direction, and the thickness direction of the carrier plate 110 is defined as the Z-axis direction. It can be understood that the plane where the carrier plate 110 is located is the XY plane. It should be noted that the setting of the XYZ coordinate system can be flexibly set according to actual needs.

[0150] At least one first test terminal RF1 and at least one second test terminal RF2 are provided on the carrier 110. The first test terminal RF1 is used to connect with the third test terminal RF3 of the device under test 300 in a one-to-one correspondence, and the second test terminal RF2 is used to connect with the fourth test terminal RF4 on the panel 251 in a one-to-one correspondence. In the figure, the dotted lines with arrows indicate the two test terminals in a connection relationship.

[0151] Combination Figure 3 Understandably, Figure 8 and Fig.10 The panel 251 shown may be Figure 3Part or all of the shielding box 250 of the test device 200 shown, that is, the shielding box 250 of the test device 200 includes a panel 251, so the fourth test terminal RF4 on the panel 251 also belongs to the fourth test terminal RF4 of the test device.

[0152] It is understood that in other embodiments, the panel 251 may also have other implementations, for example, the panel 251 may be Figure 3 The present invention does not limit the part or all of the box of the tester 220 of the test device 200 shown, or a component that exists independently in the test device 200. The present invention takes the box of the shielding box 250 including the panel 251 as an example for description.

[0153] Combination Figure 3 It is understandable. Figure 3 The interface P12 to the interface P42 on the middle panel 251 for connecting with the test fixture 100 can be understood as the fourth test terminal RF4 on the panel 251 here; Figure 3 The test terminals P15 to P45 on the device under test 300 for connecting to the test fixture 100 can be understood as the third test terminal RF3 of the device under test 300; Figure 3 The interface P14 to the interface P44 of the test fixture 100 for connecting to the device under test 300 can be understood as the first test terminal RF1 on the carrier board 110 here; Figure 3 The interfaces P13 to P43 of the test fixture 100 for connecting to the panel 251 can be understood as the second test terminals RF2 on the carrier board 110 .

[0154] Figure 8 and Fig.10 The embodiment shown shows ten first test terminals RF1, ten second test terminals RF2, ten third test terminals RF3, and ten fourth test terminals RF4. It can be understood that the number of each test terminal is only a schematic representation. In other embodiments, the number of each test terminal can be more or less. For example, Figure 3Interfaces P12 to P42 on the panel 251 shown are equivalent to four fourth test terminals, interfaces P13 to P43 on the device under test 300 are equivalent to four third test terminals, interfaces P14 to P44 on the test fixture 100 are equivalent to four first test terminals, and interfaces P13 to P43 on the test fixture 100 are equivalent to four second test terminals. In addition, the number of first test terminals RF1, second test terminals RF2, third test terminals RF3, and fourth test terminals RF4 are not necessarily the same. For example, in a specific implementation process, in order to adapt to a test fixture 100 with a different number of second test terminals RF2, the number of fourth test terminals RF4 on the panel 251 can be greater than the number of second test terminals RF2, and the embodiment of the present application does not specifically limit this.

[0155] The first test terminal RF1 and the third test terminal RF3 are connected in one-to-one correspondence, the second test terminal RF2 and the fourth test terminal RF4 are connected in one-to-one correspondence, and at least part of the first test terminal RF1 and at least part of the second test terminal RF2 are connected in one-to-one correspondence.

[0156] It should be noted that the “one-to-one connection” here means that one test terminal is connected to another test terminal. For example, the one-to-one connection between two first test terminals RF1 and two second test terminals RF2 means that one of the first test terminals RF1 is connected to one of the second test terminals RF2, and the other first test terminal RF1 is connected to the other second test terminal RF2. The “at least part” here can be part or all of the two situations. For example, in Figure 8 and Fig.10 In the embodiment shown, all first test terminals RF1 and all second test terminals RF2 are connected one by one; for example, Fig.11 In the illustrated embodiment, the fifth test terminal RF5 in the first test terminal RF1 and the ninth test terminal RF9 in the second test terminal RF2 are not connected correspondingly.

[0157] At the fourth test terminal RF4 and Figure 3 In the case where the tester 220 is connected, the first test terminal RF1 and the third test terminal RF3 are connected, and the second test terminal RF2 and the fourth test terminal RF4 are connected, because at least part of the first test terminal RF1 and at least part of the second test terminal RF2 are connected one-to-one, the device under test 300 and Figure 3 At least one RF transmission channel for transmitting RF test signals is established between the tester 220 shown in the figure. The RF test signals can be transmitted between the device under test 300 and the device under test 300 through the RF transmission channel. Figure 3 The testers 220 are shown to transmit data to each other to facilitate radio frequency testing.

[0158] It should be noted that the fourth test terminal RF4 and Figure 3The specific implementation of the tester 220 connection shown can refer to Figure 3 The relevant instructions in are not repeated here.

[0159] Combination Figure 3 It can be understood from the content shown that the RF test signal is a RF signal for testing RF indicators sent by the device under test 300 to the tester 220 or by the tester 220 to the device under test 300 during the RF test. It can be seen that the RF test signal is an essential signal for implementing RF testing.

[0160] Based on this, Figure 8 and Fig.10 In the illustrated embodiment, a radio frequency transmission channel for transmitting radio frequency test signals is established between the device under test 300 and the tester by docking the first test terminal RF1 and the third test terminal RF3 in one-to-one correspondence, docking the second test terminal RF2 and the fourth test terminal RF4 in one-to-one correspondence, connecting the first test terminal RF1 and the second test terminal RF2 in one-to-one correspondence, and connecting the fourth test terminal RF4 to the tester, so as to facilitate the implementation of radio frequency testing. It can be understood that the "docking" and "connection" involved here are electrical connection methods that can provide electrical signal transmission for radio frequency test signal transmission.

[0161] It should be noted that, in addition to the property of electrical connection, "docking" also refers to a detachable electrical connection between two connecting bodies that are directly connected without an intermediate medium (such as a cable). For example, docking can be plug-in, abutment (i.e., a contact relationship formed by abutting together), etc.

[0162] Taking plugging as an example, plugging refers to connecting two or more connectors by inserting them to facilitate signal transmission such as data transmission or power supply.

[0163] For example, the first test terminal RF1 can be Fig. 9 The radio frequency base A2 (i.e., a structure with a hole) located at the bottom and the radio frequency probe A1 (a structure with a needle that can be inserted into the hole of the radio frequency base A2) located at the top, the third test terminal RF3 is Fig. 9 Another one of the radio frequency socket A2 and the radio frequency probe A1 shown; the first test terminal RF1 is used for plugging with the third test terminal RF2.

[0164] For example, the first test end RF1 is a radio frequency base A2, and the third test end RF3 is a radio frequency probe A1. The two are adapted in size so that the third test end RF2 can be connected along the Fig. 9 The first test terminal RF1 is inserted into the insertion direction indicated by the dotted arrow to form a plug-in connection.

[0165] For another example, the first test terminal RF1 is a radio frequency probe A1, and the third test terminal RF3 is a radio frequency socket A2, and the two are adapted in size so that the first test terminal RF1 can be inserted into the third test terminal RF2 to form a plug-in connection. It can be understood that the radio frequency socket A2 and the radio frequency probe A1 are not limited to Fig. 9 The structure shown.

[0166] In this example, the RF socket A2 and the RF probe A1 are plugged together to play a positioning role, which can reduce the impact of the lateral displacement (perpendicular to the insertion direction, the Z-axis direction in the figure is the insertion direction, and the X-axis direction and the Y-axis direction are lateral) of the test fixture 100 and the device under test 300 on the accuracy of the RF test results during the RF test process.

[0167] It can be understood that the specific implementation of the second test terminal RF2 and the fourth test terminal RF4 can refer to the specific implementation and implementation effect of the first test terminal RF1 and the third test terminal RF3, and will not be repeated here. In addition, compared with the solution of positioning the test fixture 100 by hexagonal screws in the related art, the positioning of the test fixture 100 is achieved by plugging the RF socket A2 and the RF probe A1. When replacing the test fixture 100, it does not involve the disassembly and assembly of additional positioning parts such as hexagonal screws, etc., which makes disassembly and assembly easier and the replacement cycle shorter, thereby improving the efficiency of RF testing.

[0168] Figure 8 and Fig.10 In the test fixture 100 shown, the positions of the first test terminal RF1 and the second test terminal RF2 on the carrier 110 can be adjusted by customizing the test fixture 100, so that the first test terminal RF1 on the carrier 110 is opposite to the third test terminal RF3 of the device under test 300, and the second test terminal RF2 on the carrier 110 is opposite to the fourth test terminal RF4 of the test device. In other words, the test fixture 100 is opposite to the positions where the device under test 300 and the test device 200 are connected. In the case where the test fixture 100 is opposite to the positions where the device under test 300 and the test device 200 are connected, the test fixture 100 supports connection by docking, so that there is no need to use cables for connection.

[0169] In a specific implementation process, the test fixture 100 , the device under test 300 , and each test terminal on the test equipment 200 may be customized so as to be connected in a docking manner.

[0170] Obviously, compared with the process of disassembling and assembling cables in the related art, especially when there are a large number of cables, this embodiment adopts a docking connection. When replacing the test fixture 100, by directly separating the device under test 300, the panel 251 and the carrier 110, multiple pairs of mutually docked test ends can be disassembled and assembled at the same time. The disassembly and assembly are simple, and the replacement cycle of the test fixture 100 is shortened, thereby improving the RF test efficiency and the test utilization rate of each component of the test equipment.

[0171] It should be noted that although Figure 8 and Fig.10 Only the carrier plate 110 of the test fixture 100 is shown in the figure, but in the specific implementation process, in addition to the carrier plate 110, the test fixture 100 may also have other components. For example, the test fixture 100 may also include a fixing component for fixing the device under test 300. The test fixture 100 specifically fixes the device under test 300 through the fixing component, such as a buckle, etc. Since the technical problem solved by the present application does not involve other components, they are not shown in the figure.

[0172] In some design methods of this application, please continue to refer to Figure 8 , for the case where the device under test 300 has a third test terminal RF3 on one side, Figure 8 A test fixture 100 having a carrier board 110 is provided, which is suitable for a device under test 300 having such a condition.

[0173] Specifically, if Figure 8 As shown, the test fixture 100 includes a carrier board 110. The first test terminal RF1 and the second test terminal RF2 are respectively disposed on a first surface (the upper surface of the carrier board 110 shown in the figure) and a second surface (the lower surface of the carrier board 110 shown in the figure) of the carrier board 110.

[0174] In order to achieve the connection between the first test terminal RF1 on the carrier 110 and the third test terminal RF3 of the device under test 300, and the connection between the second test terminal RF2 on the carrier 110 and the fourth test terminal RF4 on the panel 251, during the RF test process, the test fixture 100 is used to fix the device under test 300 to the side facing the upper surface of the carrier 110, and to make the lower surface of the carrier 110 face the panel 251. It can be understood that the panel 251 can be one of the side wall, top wall and bottom wall on the box body of the shielding box.

[0175] Thus, during the RF test process, the panel 251, the carrier 110, and the device under test 300 are stacked in sequence, for example, stacked in sequence along the Z-axis direction, the device under test 300 is stacked on the side facing the first test end RF1 on the carrier 110, and the panel 251 is stacked on the side facing the second test end RF2 on the carrier 110. It should be noted that the technical term "stacked" involved in the embodiments of the present application refers to the area where the orthographic projections of two stacked structures in the stacking direction (Z-axis direction in the figure) have an overlapping area.

[0176] In the case where the device under test 300 is stacked on the side of the carrier 110 where the first test terminal RF1 is located, and the panel 251 is stacked on the side of the carrier 110 where the second test terminal RF2 is located, when the test fixture 100 is used to fix the device under test 300 during the RF test process, the third test terminal RF3 of the device under test 300 is directed toward the upper surface of the carrier 110, and the fourth test terminal RF4 of the panel 251 is directed toward the lower surface of the carrier 110. This can make the third test terminal RF3 of the device under test 300 and the first test terminal RF1 on the carrier 110 face each other, and make the fourth test terminal RF4 on the panel 251 and the second test terminal RF2 on the carrier 110 face each other, thereby providing a basis for achieving relative and docking.

[0177] On this basis, the first test terminal RF1 can be used to connect with the third test terminal RF3 on the upper surface of the device under test 300 (that is, the surface of the device under test 300 facing the carrier 110); the second test terminal RF2 can be used to connect with the fourth test terminal RF4 on the upper surface of the panel 251 (that is, the surface of the panel 251 facing the carrier 110).

[0178] It can be understood that in the specific implementation process, the test fixture 100 is usually customized to adapt the device under test 300 and the panel 251. When the positions of the third test terminal RF3 of the device under test 300 and the fourth test terminal RF4 on the panel 251 are determined, the test fixture 100 can be customized so that the first test terminal RF1 on the upper surface of the carrier 110 can be opposite to the third test terminal RF3 on the device under test 300, and the second test terminal RF2 on the lower surface of the carrier 110 can be opposite to the fourth test terminal RF4 on the panel 251. In addition, each test terminal can also be customized into a structure that can achieve docking, such as the RF seat A2 or RF probe A1 mentioned above.

[0179] Figure 8 The test fixture 100 applicable to the device under test 300 having the third test terminal RF3 on one side is described. The test fixture 100 applicable to the device under test 300 having the third test terminal RF3 on multiple sides is described below.

[0180] In some other design modes of the present application, for the case where a device under test 300 has a third test terminal RF3 on multiple faces, for example, the device under test 300 is a cubic structure with multiple faces, and the third test terminal RF3 can be laid on multiple faces, a test fixture 100 with multiple carriers 110 is provided. In the test fixture 100, when radio frequency testing is required, the multiple carriers 110 are used to correspond to the multiple faces of the device under test 300 one by one. The meaning of one-to-one correspondence can be adaptively referred to the meaning of the aforementioned one-to-one corresponding connection. The first test terminal RF1 of the carrier 110 is used to connect with the third test terminal RF3 on the opposite face among the multiple faces of the device under test 300.

[0181] The following description will be made by taking an example that two opposite surfaces of the device under test 300 have the third test terminals RF3 .

[0182] For example, please refer to Fig.10 , Fig.10 In the embodiment shown, the third test terminal RF3 is disposed on the upper and lower surfaces of the device under test 300. Fig.10 The illustrated embodiment provides a test fixture 100 having two oppositely disposed carrier plates 110 , which is suitable for a device under test 300 having such a condition.

[0183] Specifically, if Fig.10 As shown, the test fixture 100 includes two oppositely disposed carrier plates 110. For ease of understanding and description, the two oppositely disposed carrier plates 110 are respectively referred to as a first carrier plate 111 and a second carrier plate 112 in this embodiment. The first test terminal RF1 on the first carrier plate 111 is used to connect with the third test terminal RF3 on the upper surface of the device under test 300, and the first test terminal RF1 on the second carrier plate 112 is used to connect with the third test terminal RF3 on the lower surface of the device under test 300.

[0184] Specifically, if Fig.10 As shown, when the test fixture 100 is used to fix the device under test 300 during the RF test process, the test fixture 100 is used to fix the device under test 300 between the first carrier plate 111 and the second carrier plate 112, so that the upper surface of the device under test 300 faces the first carrier plate 111, and the lower surface of the device under test 300 faces the second carrier plate 112. Fig.10 In the illustrated embodiment, the test fixture 100 can press the device under test 300 through the first carrier plate 111 and the second carrier plate 112 to fix the device under test 300 .

[0185] In this way, the second carrier 112, the device under test 300, and the first carrier 111 are stacked in sequence along the Z-axis direction, the first carrier 111 is stacked on the side of the upper surface of the device under test 300 toward which the third test end RF3 is facing, and the second carrier 112 is stacked on the side of the lower surface of the device under test 300 toward which the third test end RF3 is facing.

[0186] In order to achieve the docking between the first test terminal RF1 and the third test terminal RF3, the first test terminal RF1 on the first carrier board 111 is arranged on the lower surface of the first carrier board 111 (that is, the surface of the first carrier board 111 facing the second carrier board 112, that is, the surface facing the upper surface of the device under test), and faces the third test terminal RF3 on the upper surface of the device under test 300, so as to facilitate the docking with the third test terminal RF3 on the upper surface of the device under test 300 (that is, the surface of the device under test 300 facing the first carrier board 111, that is, the surface facing the lower surface of the device under test); the first test terminal RF1 of the second carrier board 112 is arranged on the upper surface of the second carrier board 112 (that is, the surface of the second carrier board 112 facing the first carrier board 111), and faces the third test terminal RF3 on the lower surface of the device under test 300, so as to facilitate the docking with the third test terminal RF3 on the lower surface of the device under test 300 (that is, the surface of the device under test 300 facing the second carrier board 112).

[0187] It can be understood that in the specific implementation process, when the position of the third test terminal RF3 of the device under test 300 is determined, the test fixture 100 can be customized so that the first test terminal RF1 on the lower surface of the first carrier 111 can be opposite to the third test terminal RF3 on the upper surface of the device under test 300, and the first test terminal RF1 on the upper surface of the second carrier 112 can be opposite to the third test terminal RF3 on the lower surface of the device under test 300. In addition, each test terminal can also be customized into a structure that can achieve docking, such as the RF seat A2 or RF probe A1 mentioned above.

[0188] In some embodiments of this application, please continue to refer to Fig.10 , in order to facilitate docking with the second test terminals RF2 on the two carrier boards 110, Fig.10 The embodiment shown has two oppositely disposed panels 251. For ease of understanding and description, the two oppositely disposed panels 251 are respectively referred to as a first panel 2511 and a second panel 2512 in this embodiment. It can be understood that the first panel 2511 and the second panel 2512 can be two opposite side walls on the box body of the shielding box, or opposite top and bottom walls. The fourth test terminal RF4 is provided on the surfaces of the first panel 2511 and the second panel 2512 facing each other.

[0189] The second test terminal RF2 on the first carrier 111 is used to connect with the fourth test terminal RF4 on the first panel 2511 , and the second test terminal RF2 on the second carrier 112 is used to connect with the fourth test terminal RF4 on the second panel 2512 .

[0190] Specifically, if Fig.10 As shown, when the test fixture 100 is used to fix the device under test 300 during the RF test, the first carrier plate 111 and the second carrier plate 112 of the test fixture 100 are located between the first panel 2511 and the second panel 2512. In this way, the second panel 2512, the second carrier plate 112, the device under test 300, the first carrier plate 111, and the first panel 2511 are stacked in sequence along the Z-axis direction, the first carrier plate 111 is stacked on the side of the lower surface of the first panel 2511 to which the fourth test end RF4 faces, and the second carrier plate 112 is stacked on the side of the upper surface of the second panel 2512 to which the fourth test end RF4 faces.

[0191] In order to achieve the docking of the second test terminal RF2 and the fourth test terminal RF4, the second test terminal RF2 on the first carrier 111 is arranged on the upper surface of the first carrier 111 (that is, the surface of the first carrier 111 facing away from the second carrier 112, that is, the surface facing the lower surface of the first panel 2511), and faces the fourth test terminal RF4 on the lower surface of the first panel 2511, so as to facilitate the docking with the fourth test terminal RF4 on the lower surface of the first panel 2511 (that is, the surface of the first panel 2511 facing the second panel 2512); the second test terminal RF2 on the second carrier 112 is arranged on the lower surface of the second carrier 112 (that is, the surface of the second carrier 112 facing away from the first carrier 111, that is, the surface facing the upper surface of the second panel 2512), and faces the fourth test terminal RF4 on the lower surface of the second panel 2512, so as to facilitate the docking with the fourth test terminal RF4 on the upper surface of the second panel 2512 (that is, the surface of the second panel 2512 facing the second panel 2512).

[0192] It can be understood that in the specific implementation process, the test fixture 100 can be customized so that the second test terminal RF2 on the upper surface of the first carrier 111 can be opposite to the fourth test terminal RF4 on the lower surface of the first panel 2511, and the first test terminal RF1 on the upper surface of the second carrier 112 can be opposite to the fourth test terminal RF4 on the upper surface of the second panel 2512. In addition, each test terminal can also be customized into a structure that can achieve docking, such as the RF seat A2 or RF probe A1 mentioned above.

[0193] In some other embodiments of the present application, Fig.10The embodiment shown may also have a panel 251. In this case, the second test terminal RF2 on one of the two carriers 110 may be connected to the second test terminal RF2 on the other carrier 110 by means of a cable or the like, and then the second test terminal RF2 on the other carrier 110 is docked with the panel 251, thereby achieving docking between the second test terminals RF2 on the two carriers 110 and the panel 251. Accordingly, the number of second test terminals RF2 on the other carrier 110 needs to be increased accordingly.

[0194] In order to further improve the efficiency of RF testing, the present application embodiment also provides Fig.11 and Fig.12 The test fixture 100 in the illustrated embodiment, Fig.11 and Fig.12 exist Figure 8 The description will be based on the test fixture 100 having a single carrier plate 110 as shown, and the differences will be described below with emphasis.

[0195] For example, please refer to Fig.11 , Fig.11 A schematic diagram of a power supply connection scheme of a power supply device 120 of a test fixture 100 provided in some embodiments of the present application.

[0196] Different from Figure 8 The test fixture 100 shown, Fig.11 The carrier board 110 of the test fixture 100 is also provided with a power supply device 120 for pre-supplying power to the device under test 300 so that the device under test 300 can be powered on and started in advance. Optionally, the power supply device 120 may include an electrical component that can store electricity, such as a battery or a capacitor.

[0197] Specifically, in the test fixture 100, at least one first test terminal RF1 includes a fifth test terminal RF5; at least one third test terminal RF3 includes a sixth test terminal RF6, the sixth test terminal RF6 is used to receive power input to supply power to the device under test 300, and the fifth test terminal RF5 is used to connect with the sixth test terminal RF6. The power supply device 120 is connected to the fifth test terminal RF5 by a cable or the like, and is used to supply power to the device under test 300 when the fifth test terminal RF5 and the sixth test terminal RF6 are connected.

[0198] In this embodiment, before the RF test, the device under test 300 can be assembled on the test fixture 100 so that the sixth test terminal RF6 of the device under test 300 and the fifth test terminal RF5 on the test fixture 100 can be connected, so that the power supply device 120 on the carrier 110 can supply power to the device under test 300 in advance. It can be understood that when the device under test 300 is powered, the device under test 300 can be powered on and started. Based on this, when performing RF testing on other devices under test 300, the test fixture 100 provided in this embodiment can support the advance power supply to the device under test 300 so that the device under test 300 is powered on and started in advance, thereby realizing parallel testing, saving the time required to wait for the device under test 300 to be powered on and started before each RF test, and thus improving the RF test efficiency and the test utilization rate of the test equipment.

[0199] It is understandable that the power supply device 120 has a charging requirement when there is no electricity. In order to meet the charging requirement of the power supply device 120, the present application provides the following two embodiments:

[0200] The first embodiment: Please continue to refer to Fig.11 , at least one second test terminal RF2 includes a ninth test terminal RF9, and at least one fourth test terminal RF4 includes a tenth test terminal RF10. The tenth test terminal RF10 is used to communicate with a power source (such as Figure 3 The ninth test terminal RF9 is connected to the tenth test terminal RF10.

[0201] The ninth test terminal RF9 is also connected to the power supply device 120 through a cable, etc., for charging the power supply device 120 from the power supply when the ninth test terminal RF9 and the tenth test terminal RF10 are connected. It can be seen that the fifth test terminal RF5 and the ninth test terminal RF9 are not directly connected, that is, Fig.11 In the illustrated embodiment, a portion of the first test terminal RF1 and a portion of the second test terminal RF2 are connected.

[0202] This embodiment supports charging the power supply device 120 during the RF test. Of course, the power supply device 120 can also be switched to the power supply device 120 by using the panel 251 when the test equipment is idle. Figure 3 The programmable power supply 230 is shown to be charged.

[0203] Second embodiment: Please refer to Fig.12 , Fig.12 Schematic diagram of power supply connection scheme of power supply device 120 of test fixture 100 provided in other embodiments of the present application.

[0204] The carrier board 110 may also be provided with a charging interface 130, which is used to connect to an external power source, such as connecting to an external power source through a power transmission line. The charging interface 130 is also connected to the power supply device 120, and is used to charge the power supply device 120 from the external power source when the charging interface 130 is connected to the external power source. This embodiment does not need to be connected to the power source for charging through the panel 251 of the test device, but can be connected to the external power source for charging through the charging interface 130, thereby improving the test utilization rate of each component of the test device.

[0205] Optionally, in other embodiments, the charging interface 130 may be a ninth test terminal RF9. Different from the first embodiment, the ninth test terminal RF9 is not used to connect with the tenth test terminal RF10, but is used to connect with an external power supply. In this way, this embodiment can make the disassembly and assembly process between the charging interface 130 and the external power supply more convenient while improving the test utilization rate of each component of the test equipment.

[0206] In the specific implementation process, the above two embodiments can be implemented one by one or at the same time, and the embodiments of the present application do not limit this. It can be understood that when the charging demand of the power supply device 120 is met, the device under test 300 can be kept powered off during the RF test process.

[0207] It should be noted that Fig.12 In the illustrated embodiment, in some embodiments, the test fixture 100 can also supply power to the device under test 300 through the power supply device 120 when no external power supply is connected, and switch to using the external power supply to supply power to the power supply device 120 to supply power to the device under test 300 when an external power supply is connected, so as to reserve the power supply device 120 to power on and start the device under test 300 of the same model in advance.

[0208] For example, please refer to Fig.13 , Fig.13 Schematic diagram of the connection relationship of the storage device 140 of the test fixture 100 provided in some embodiments of the present application. Fig.11 The description will be made based on the illustrated embodiment.

[0209] Fig.13 The carrier board 110 of the test fixture 100 shown in the figure is provided with a power supply device 120 and a storage device 140. The specific implementation of the power supply device 120 can refer to Fig.11 Here, the specific implementation of the memory device 140 is described in detail.

[0210] Optionally, the storage device 140 can be a cache memory (Cache), a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), a flash memory, or other electrical components with storage functions.

[0211] The storage device 140 is used to store line loss parameters corresponding to the test fixture 100 . The line loss parameters corresponding to the test fixture 100 are obtained in advance through radio frequency calibration and stored in the storage device 140 .

[0212] It should be noted that the line loss parameter is a parameter related to line loss. Line loss (short for line loss) is the energy loss caused by the signal obtained through RF calibration when it is transmitted on the RF transmission channel. The existence of line loss will make the RF performance not meet expectations, resulting in inaccurate test results obtained from RF testing.

[0213] Based on this, in order to improve the accuracy of the RF test results, it is necessary to perform RF calibration on the RF transmission channel before the RF test to obtain the line loss of the RF transmission channel. After obtaining the line loss of the RF transmission channel, the test equipment can obtain the line loss compensation value of the RF transmission channel based on the line loss of the RF transmission channel, so as to use the line loss compensation value of the RF transmission channel for compensation. The above-mentioned line loss parameter can be the line loss itself or the line loss compensation value.

[0214] Combination Figure 3 It can be understood that the line loss of the RF transmission channel refers to the line loss from the tester 220 to the device under test 300, which is composed of two parts: the line loss from the tester 220 to the panel 251 on the RF transmission channel and the line loss from the test fixture 100 to the device under test 300 on the RF transmission channel. In this embodiment, the line loss from the tester 220 to the panel 251 is referred to as the line loss corresponding to the test equipment, and the line loss from the test fixture 100 to the device under test 300 is referred to as the line loss corresponding to the test fixture 100. It can be understood that the line loss parameters corresponding to the test fixture 100 are the line loss parameters from the test fixture 100 to the device under test 300 on the RF transmission channel; the line loss parameters corresponding to the test equipment are the line loss parameters from the tester 220 to the panel 251 on the RF transmission channel.

[0215] Figure 6In the related art shown, the line loss of the RF transmission channel is obtained by online RF calibration. The so-called online RF calibration refers to the RF calibration performed during the RF test process, that is, after the device under test 300, the test fixture 100 and the shielding box 250 are assembled and the test button is activated, the RF calibration is performed on the device under test 300 after the device under test 300 is started.

[0216] Fig.13 In the illustrated embodiment, the setting of the storage device 140 enables the test fixture 100 provided in the embodiment to perform RF calibration on the line loss from the device under test 300 to the test fixture 100 on the RF transmission channel in advance before the RF test, and store the line loss parameters corresponding to the test fixture 100 obtained by the RF calibration in advance in the storage device 140. Based on this, there is no need to perform RF calibration online during RF testing. During RF testing, the test equipment can directly read the pre-stored line loss parameters from the storage device 140 through the seventh test terminal RF7 and the eighth test terminal RF8 connected to each other, to assist in generating RF test signals, thereby realizing parallel testing, saving RF calibration time, and thus improving RF testing efficiency and test utilization of test equipment. In addition, the storage of the line loss parameters corresponding to the test fixture 100 by the storage device 140 can also make the line loss parameters corresponding to the test fixture 100 traceable, so that they can be read again at a later time.

[0217] It can be understood that the generation of the RF test signal depends on the line loss of the RF transmission channel. The line loss of the RF transmission channel includes not only the line loss corresponding to the test fixture 100, but also the line loss corresponding to the test equipment. Based on this, the line loss corresponding to the test equipment can also be calibrated in advance to obtain the line loss parameters corresponding to the test equipment, and the line loss parameters corresponding to the test equipment can be stored for the test equipment to read to assist in generating the RF test signal. Among them, the line loss parameters corresponding to the test equipment can be stored in Figure 3 In the industrial computer 210 shown.

[0218] Specifically, the general process of the test device reading the line loss parameters corresponding to the test device and the line loss parameters corresponding to the test fixture 100 to assist in generating the RF test signal for RF testing is as follows:

[0219] Combination Figures 4 to 5, the line loss parameters corresponding to the test fixture 100 and the line loss parameters corresponding to the test equipment are read by the industrial computer 210 of the test equipment. After reading the line loss parameters corresponding to the test fixture 100 and the line loss parameters corresponding to the test equipment, the industrial computer 210 generates a corresponding RF test instruction based on the line loss parameters corresponding to the test fixture 100 and the line loss parameters corresponding to the test equipment, and sends it to the device under test 300 or the tester 220, so that the device under test 300 or the tester 220 generates a corresponding RF test signal based on the RF test instruction, thereby realizing compensation for the RF test signal.

[0220] It should be noted that the test equipment is a universal part and can be calibrated for radio frequency regularly; different devices under test 300 are adapted to different test fixtures 100, and different test fixtures 100 need to be calibrated for radio frequency using a power meter or the like separately.

[0221] In order to read the line loss parameters corresponding to the test fixture 100 stored in the storage device 140, please continue to refer to Fig.13 In the test fixture 100, at least one second test terminal RF2 further includes a seventh test terminal RF7, and at least one fourth test terminal RF2 further includes an eighth test terminal RF8. The seventh test terminal RF7 is used to connect with the eighth test terminal RF8.

[0222] The storage device 140 is connected to the seventh test terminal RF7 and is used for allowing the test equipment to read the line loss parameters corresponding to the test fixture 100 through the seventh test terminal RF7 and the eighth test terminal RF8 when the seventh test terminal RF7 and the eighth test terminal RF8 are connected.

[0223] In order to implement the writing of the line loss parameters corresponding to the test fixture 100, the embodiment of the present application provides the following two examples:

[0224] The first example: Please continue to refer to Fig.13 In the test fixture 100, the storage device 140 is connected to the seventh test terminal RF7, and is used for the test equipment to write the line loss parameters corresponding to the test fixture 100 into the storage device 140 when the seventh test terminal RF7 and the eighth test terminal RF8 are connected. This embodiment reuses the original components of the test equipment to write the line loss parameters corresponding to the test fixture 100, and can be performed when these components are not used.

[0225] The second example: the test fixture 100 also includes a communication interface (not shown in the figure), which is used to connect to a host computer, which is a computer that performs radio frequency calibration on the line loss corresponding to the test fixture 100 and obtains the line loss corresponding to the test fixture 100. The communication interface is also connected to the storage device 140, which is used to write the line loss parameters corresponding to the test fixture 100 to the storage device 140 by the host computer when the communication interface and the host computer are connected. This embodiment connects to an additional host computer through the communication interface to write the line loss parameters, does not occupy the test equipment, and can improve the test utilization rate of each component of the equipment test equipment.

[0226] Optionally, in other embodiments, the communication interface may be the seventh test terminal RF7. Different from the first example, the seventh test terminal RF7 is not used to connect to the eighth test terminal RF8, but is used to connect to the host computer. In this way, this embodiment can make the disassembly and assembly process between the communication interface and the host computer more convenient while improving the test utilization rate of each component of the test equipment.

[0227] During the specific implementation process, the above two examples can be implemented separately or simultaneously, and the embodiments of the present application do not limit this.

[0228] It should be noted that Fig.13 In the embodiment shown, since it is necessary to perform radio frequency calibration on the line loss corresponding to the test fixture 100 in advance and write the line loss parameters corresponding to the test fixture 100 obtained by radio frequency calibration into the storage device 140 in advance, Fig.13 The power supply device 120 shown can also be used to power on the device under test 300 in advance to perform radio frequency calibration and to write line loss parameters corresponding to the test fixture 100 into the storage device 140 .

[0229] In order to improve the circuit reliability during the RF test, in some embodiments of the present application, please refer to Fig.14 , Fig.14 A schematic diagram of the connection relationship of the protection plate of the test fixture provided in an embodiment of the present application. Fig.14 exist Figure 8 The description is based on the above, and other embodiments can be implemented adaptively with reference to the above.

[0230] The test fixture 100 may further include a protection board 150. A protection circuit (not shown in the figure) is disposed on the protection board 150. For example, the protection circuit may include one or more circuits of an electrical over stress (EOS) protection circuit, a voltage reduction circuit, and an electrostatic discharge circuit.

[0231] The second test terminal RF2 on the carrier board 110 is connected to the input terminal of the protection circuit of the protection board 150, and the first test terminal RF1 on the carrier board 110 is connected to the output terminal of the protection circuit of the protection board 150, that is, at least part of the second test terminal RF2 is connected to at least part of the first test terminal RF1 in a one-to-one correspondence through the protection circuit of the protection board 150. In this way, the voltage of the signal transmitted between the device under test 300 and the components of the test equipment is stable and safe when passing through the protection circuit of the protection board 150, thereby ensuring the circuit reliability.

[0232] For ease of understanding Figures 8 to 14 For specific implementation of the embodiment shown, please refer to Fig.15 , Fig.15 The schematic diagram of the assembly of the device under test 300, the test fixture 100 and the shielding box 250 provided in the embodiment of the present application. The interface on the outer surface of the panel 251 of the shielding box 250 in the figure can be connected to the Figure 3 The industrial computer 210, the tester 220, and the programmable power supply 230 are shown to be connected.

[0233] Fig.15 The embodiment shown involves the following assembly process:

[0234] First, the device under test 300 is pre-assembled on the test fixture 100 by clamping with a robot arm or the like, so that the third test end of the device under test 300 is connected to the first test end of the carrier board 110 included in the test fixture 100. In the case where the carrier board 110 has a power supply module, the device under test 300 can be powered on and started in advance with the power supply of the power supply module on the carrier board 110.

[0235] Next, the assembled test fixture 100 and the device under test 300 are transferred to the position to be tested by a transmission device such as a belt, and are grabbed and placed in the shielding box 250 by a mechanical arm, so that the carrier 110 included in the test fixture 100 and the panel 251 of the shielding box 250 are in a relative positional relationship as shown in the figure, and the second test end on the carrier 110 is butted with the fourth test end on the inner surface of the panel 251. In order to facilitate the clear display of the relative relationship between the second test end on the carrier 110 and the fourth test end on the inner surface of the panel 251 (the fourth test end on the inner surface of the panel 251 can be adaptively referred to the position of the interface on the outer surface of the panel 251), the figure does not show the butt connection between the two, and in the figure, only the device under test 300 and the carrier 110 of the test fixture 100 are shown in the shielding box 250.

[0236] Finally, activate the test button to perform RF testing.

[0237] Finally, it should be noted that in the description of this specification, specific features, structures, etc. can be combined in any one or more embodiments or examples in a suitable manner. In addition, the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application is described in detail with reference to the above embodiments, ordinary technicians in this field should understand that they can still modify the technical solutions recorded in the above embodiments, or replace some of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A test fixture, characterized in that: The test fixture comprises: A carrier board; the carrier board is provided with at least one first test end and at least one second test end; The first test end is used to connect with the third test end on the device under test in a one-to-one correspondence, and the second test end is used to connect with the fourth test end of the test equipment in a one-to-one correspondence. At least part of the first test end and at least part of the second test end are connected in a one-to-one correspondence to establish a radio frequency transmission channel between the device under test and the test equipment.

2. The test fixture according to claim 1, characterized in that: The test fixture comprises a carrier plate; the first test end and the second test end are respectively arranged on a first surface and a second surface opposite to the carrier plate; The test fixture is used to fix the device under test to the side of the carrier board to which the first surface is directed, and to make the second surface of the carrier board face the panel of the test equipment; The first test end is used to connect with the third test end on the surface of the device under test facing the carrier board; The second test end is used to dock with the fourth test end on the surface of the panel facing the carrier board.

3. The test fixture according to claim 1, characterized in that: The test fixture comprises a plurality of carrier plates which are used to face the plurality of surfaces of the device under test one by one; The first test end on the carrier board is used to connect with the third test end on the opposite surface of the multiple surfaces of the device under test.

4. The test fixture according to claim 3, characterized in that: The test fixture comprises two carrier plates; the two carrier plates are respectively a first carrier plate and a second carrier plate which are arranged opposite to each other; The surface of the first carrier plate facing the second carrier plate and the surface of the second carrier plate facing the first carrier plate are both provided with at least one first test end; The first test end on the first carrier is used to connect with the third test end on the surface of the device under test facing the first carrier; The first test end on the second carrier board is used to connect with the third test end on the surface of the device under test facing the second carrier board.

5. The test fixture according to claim 4, characterized in that: The testing device comprises two panels, the two panels are respectively a first panel and a second panel arranged opposite to each other, and the fourth testing end is arranged on a surface of the first panel facing the second panel and on a surface of the second panel facing the first panel; The second test end on the first carrier is arranged on a surface of the first carrier facing away from the second carrier, and is used for docking with the fourth test end on a surface of the first panel facing the second panel; The second test end on the second carrier is arranged on a surface of the second carrier facing away from the first carrier, and is used to dock with the fourth test end on a surface of the second panel facing the first panel.

6. The test fixture according to claim 2 or 5, characterized in that: The testing equipment comprises a shielding box and a tester, and the tester is located outside the shielding box; The test fixture is used to fix the device under test in the box; The fourth test end is arranged on the inner surface of the panel and is used to face the second test end; the fourth test end is also used to connect with the tester to establish the radio frequency transmission channel between the device under test and the tester.

7. The test fixture according to any one of claims 1 to 5, characterized in that: At least one of the first test ends includes a fifth test end; at least one of the third test ends includes a sixth test end; the fifth test end is used to connect with the sixth test end; The carrier board is also provided with a power supply device; the power supply device is connected to the fifth test terminal and is used to supply power to the device under test when the fifth test terminal is connected to the sixth test terminal.

8. The test fixture according to claim 7, characterized in that: At least one of the second test ends further includes a seventh test end, and at least one of the fourth test ends includes an eighth test end; the seventh test end is used to connect with the eighth test end; A storage device is also provided on the carrier board, and the storage device is used to store line loss parameters corresponding to the test fixture; the storage device is connected to the seventh test terminal, and is used for the test equipment to read the line loss parameters corresponding to the test fixture when the seventh test terminal and the eighth test terminal are connected, and the line loss parameters corresponding to the test fixture are used to assist in generating an RF test signal transmitted in the RF transmission channel for RF testing.

9. The test fixture according to claim 1, characterized in that: The docking is plug-in.

10. The test fixture according to claim 9, characterized in that: The first test end is one of a radio frequency socket and a radio frequency probe, and the third test end is the other of the radio frequency socket and the radio frequency probe.

11. The test fixture according to claim 9 or 10, characterized in that: The second test end is one of a radio frequency socket and a radio frequency probe, and the fourth test end is the other of the radio frequency socket and the radio frequency probe.

12. A radio frequency testing system, characterized in that: include: The test fixture according to any one of claims 1 to 11, used to fix the device under test during the radio frequency test; The test equipment comprises a fourth test terminal; the first test terminal on the carrier of the test fixture is used to dock with the third test terminal of the device under test, and the second test terminal on the carrier of the test fixture is used to dock with the fourth test terminal to establish a radio frequency transmission channel between the device under test and the test equipment.

13. The radio frequency testing system according to claim 12, characterized in that: The testing equipment comprises a shielding box and a tester; the body of the shielding box comprises a panel; The test fixture is used to fix the device under test in the box, and the tester is arranged outside the box; The fourth test end is arranged on the inner surface of the panel and is used to face the second test end; the fourth test end is also used to connect with the tester to establish a radio frequency transmission channel between the device under test and the tester.

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