Universal testing machine with multiple testing channels

Abstract

The utility model provides a general testing machine with multiple testing channels, which comprises a signal processing board, a substrate and a replaceable testing group, the substrate is provided with a plurality of testing channels, signal switching modules in signal connection with the signal processing board are arranged on the testing channels, the replaceable testing group is detachably arranged on the testing channels, and the signal switching modules are connected with the signal processing board. The replaceable testing group is provided with a testing clamp and a connecting plate, the testing clamp is in signal connection with the connecting plate, and the connecting plate is used for being in contact with the signal switching module for electric conduction; according to the utility model, different test fixtures are replaced in a user-defined manner so as to adapt to iteratively updated products, so that the iteratively updated products can be adapted without redesigning and reproducing the whole test equipment, and the test cost is saved; the utility model belongs to the technical field of test equipment.

Description

Technical Field

[0001] The utility model belongs to the technical field of testing equipment, and in particular relates to a universal testing machine with multiple testing channels. Background Art

[0002] With the emergence of electronic and electrical products and fierce competition, the quality requirements for products are getting higher and higher. Therefore, in order to ensure the quality of products, they will undergo multiple rigorous tests before leaving the factory. When the product is tested, it is necessary to design special test equipment to complete the various functional tests of the product. Common test equipment is divided into two parts: test fixtures and test machines. When testing different products, it is generally necessary to design and manufacture test fixtures for the corresponding products. At the same time, when testing different functions of the product, it is also necessary to design and manufacture test machines for the corresponding test functions. Therefore, there are many types of test equipment and various styles of test machines. Due to the rapid iteration of modern consumer electronic products, the corresponding test machines also need to be iterated quickly, resulting in the elimination of a large number of tests, which in turn increases the cost of testing. Utility Model Content

[0003] The purpose of the utility model is to provide a universal test machine with multiple test channels, which can adapt to iteratively updated products by customizing the replacement of different test fixtures, thereby achieving the adaptation of iteratively updated products without the need to redesign and manufacture the entire test equipment, thereby saving testing costs.

[0004] The universal test machine with multiple test channels includes a signal processing board, a substrate and a replaceable test group. The substrate is provided with a plurality of test channels. A signal adapter module connected to the signal processing board signal is installed at the test channel position. The replaceable test group is detachably installed on the test channel. The replaceable test group is installed with a test fixture and a connecting plate. The test fixture is connected to the connecting plate signal, and the connecting plate is used to contact and conduct electricity with the signal adapter module.

[0005] According to the technical solution, the utility model can achieve the following beneficial effects:

[0006] 1. By installing a detachable and replaceable test group on the test channel, and the test fixture is installed on the replaceable test group, the universal test machine can realize customized replacement of different test fixtures to adapt to iteratively updated products, thereby realizing the application of iteratively updated products and another function of the applicable test product without redesigning and manufacturing the entire test equipment, so as to save test costs and facilitate maintenance of the universal test machine;

[0007] 2. By installing a signal adapter module on the test channel and installing a connection board for conducting electrical contact with the signal adapter module on the replaceable test group, the test fixture can be conveniently connected to the signal processing board for testing when the replaceable test group is installed. At the same time, when the replaceable test group is disassembled, the test fixture can be conveniently disconnected from the signal processing board.

[0008] 3. Since the substrate is provided with several test channels, it is possible to perform simultaneous tests on multiple products and to test different functions of the products.

[0009] In order to further optimize the above technical solution, it can be optionally combined with one or more of the following implementation methods without conflict.

[0010] In some embodiments, the signal transfer module is provided with a conductive contact, and the connection board is provided with a connection probe that contacts and energizes the conductive contact; according to the technical solution, the utility model further achieves the following beneficial effects:

[0011] 1. Since the theoretical life of the probe can be up to 200,000 times, the number of connections between the signal adapter module and the connection board can be up to 200,000 times, so that the life of the signal adapter module and the connection board is sufficient to meet the number of iterative replacements of the replaceable test group;

[0012] 2. Since the signal connection is achieved by connecting the probe to the conductive contact, the test fixture can be more conveniently connected to the signal processing board signal compared to the transmission plug-in and plug-out method.

[0013] In some embodiments, the connection plate is equipped with a probe pressing block for pressing the connection probe down onto the conductive contact; according to the technical solution, the connection plate is pressed down by the probe pressing block so that the connection probe can contact the conductive contact more stably.

[0014] In some embodiments, the substrate is installed with support columns and support blocks for lifting and positioning the replaceable test group; according to the technical solution, the utility model can further achieve the following beneficial effects:

[0015] 1. When the replaceable test group is installed on the test channel, the connection probe can accurately contact the conductive contact;

[0016] 2. By lifting up the replaceable test group, a space for movement is reserved for the connection plate during the contact process of the conductive contacts of the connection probe, thereby protecting the connection probe and the conductive contacts.

[0017] In some embodiments, the test fixture includes a PCB board and a carrier, the PCB board is installed on the replaceable test group and is connected to the connection board signal, the PCB board is provided with a contact portion for energizing the product, the carrier is installed on the PCB board, the carrier is provided with a product slot for placing the product, the contact portion is located in the product slot, the carrier shaft is connected to a cover plate for pressing down and fixing the product, and the cover plate is installed with a buckle for fixing to the carrier; according to the technical solution, the product can be directly electrically connected to the PCB board, thereby reducing the impedance and signal interference during product testing compared to the method of electrically connecting to the fixture through an adapter line, and at the same time, the structural distribution of the replaceable test group is made more streamlined and orderly.

[0018] In some embodiments, the support block is located below the PCB board; according to the technical solution, after the replaceable test group is installed in the test channel, the support block is used to support and reinforce the PCB board, thereby reducing damage to the PCB caused by the excessive weight of the test fixture and the product.

[0019] In some embodiments, the signal processing board is provided with a control unit, and the replaceable test group is installed with a functional test unit connected to the connection board signal; according to the technical solution, the test channel on the universal testing machine can be installed with a replaceable test group for testing different functions, thereby further improving the versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the specific implementation of the present invention, the following is a brief description of the drawings and reference numerals required to be used in the description of the specific implementation.

[0021] Figure 1 It is a structural schematic diagram of the utility model;

[0022] Figure 2 It is a schematic diagram of the position of the signal processing board of the utility model;

[0023] Figure 3 It is a structural schematic diagram of the substrate of the utility model;

[0024] Figure 4 It is a schematic diagram of the structure of the bottom of the replaceable test group of the utility model;

[0025] Figure 5 It is a cross-sectional schematic diagram of the test fixture of the utility model.

[0026] Reference numerals:

[0027] 1. Signal processing board; 2. Base plate; 21. Test channel; 22. Support column; 23. Support block; 3. Signal transfer module; 31. Conductive contact; 4. Replaceable test group; 5. Test fixture; 51. PCB board; 52. Carrier; 53. Contact part; 54. Product slot; 55. Cover plate; 56. Buckle; 6. Connecting plate; 61. Connecting probe; 62. Probe pressing block. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical solution and advantages of the utility model more clear, this specific implementation method further describes the utility model in detail with reference to the accompanying drawings.

[0029] like Figures 1 to 5 As shown, this specific embodiment provides a universal test machine with multiple test channels 21, which includes a signal processing board 1, a base plate 2 and a replaceable test group 4. The signal processing board 1 is provided with a control unit.

[0030] The substrate 2 is provided with a plurality of test channels 21 , support columns 22 are installed at the four corners of the test channels 21 , support blocks 23 and a signal adapter module 3 are installed in the test channels 21 , the test channels 21 are electrically connected to the signal processing board 1 , and the signal adapter module 3 is provided with conductive contacts 31 .

[0031] The replaceable test group 4 is detachably mounted on the test channel 21. The replaceable test group 4 can be selectively mounted on the test channel 21 by means of screws or buckles 56. When the replaceable test group 4 is mounted on the test channel 21, the support column 22 supports the four corners of the replaceable test group 4. The replaceable test group 4 is installed with a functional test unit, a connecting plate 6 and a test fixture 5. The connecting plate 6 is electrically connected to the functional test unit. The functional test unit is used to perform a certain functional test on the product in the test fixture 5 and send the test result to the signal processing board 1. The control unit is used to control the test unit to perform a test on the product in the test fixture 5. The connecting plate 6 is provided with a connecting probe 61 that contacts and energizes the conductive contact 31. The connecting plate 6 is provided with a probe pressing block 62 for pressing the connecting probe 61 down onto the conductive contact 31. The probe pressing block 62 can selectively use a structure such as a screw or buckle 56 to press the connecting probe 61 down.

[0032] The test fixture 5 includes a PCB board 51 and a carrier 52. The PCB board 51 is installed on the replaceable test group 4 and is electrically connected to the connection board 6. The PCB board 51 is provided with a contact portion 53 for contacting and energizing the product. The carrier 52 is installed on the PCB board 51. The carrier 52 is provided with a product slot 54 for placing the product. The contact portion 53 is located in the product slot 54. The carrier 52 is connected to a cover plate 55 for pressing down and fixing the product. The cover plate 55 is provided with a buckle 56 for fixing to the carrier 52. When the replaceable test group 4 is installed on the test channel 21, the support block 23 is located below the PCB board 51 to support the PCB board 51.

[0033] The following is the instructions for use of the universal test machine described in this specific implementation:

[0034] After the product is upgraded or another function of the product needs to be tested, the original replaceable test group 4 on the test channel 21 is removed to make the current test channel 21 vacant, and then the replaceable test group 4 installed with the upgraded test fixture 5 or the test fixture 5 for testing another function is installed on the vacant test channel 21 to adapt to the upgraded product or test another function of the product;

[0035] After the replaceable test group 4 is installed on the test channel 21, the connection probe 61 contacts the conductive contact 31 and is energized, and the support block 23 supports the part of the replaceable test group 4 located below the PCB board 51;

[0036] When testing a product, the product is placed in the product slot 54. At this time, the product contacts the contact portion 53 on the PCB board 51 and is energized. Thereafter, the cover plate 55 is lowered to cover the product and is locked to the carrier 52 via the buckle 56. Thereafter, the test unit can perform power-on testing on the product.

Claims

1. A universal test machine with multiple test channels, comprising a signal processing board (1) and a base board (2), characterized in that: The invention also comprises a replaceable test group (4), wherein the base plate (2) is provided with a plurality of test channels (21), and a signal adapter module (3) connected to the signal of the signal processing board (1) is installed at the position of the test channel (21), and the replaceable test group (4) is detachably installed on the test channel (21), and the replaceable test group (4) is installed with a test fixture (5) and a connecting plate (6), and the test fixture (5) is connected to the connecting plate (6) by signal, and the connecting plate (6) is used to contact and conduct electricity with the signal adapter module (3).

2. The universal testing machine according to claim 1, characterized in that: The signal switching module (3) is provided with a conductive contact (31), and the connecting plate (6) is provided with a connecting probe (61) which is in electrical contact with the conductive contact (31).

3. The universal testing machine according to claim 2, characterized in that: The connection plate (6) is provided with a probe pressing block (62) for pressing the connection probe (61) down onto the conductive contact (31).

4. The universal testing machine according to claim 1, characterized in that: The base plate (2) is provided with a support column (22) and a support block (23) for lifting and positioning the replaceable test group (4).

5. The universal testing machine according to claim 4, characterized in that: The test fixture (5) comprises a PCB board (51) and a carrier (52); the PCB board (51) is mounted on the replaceable test group (4) and is signal-connected to the connection board (6); the PCB board (51) is provided with a contact portion (53) for contacting and energizing a product; the carrier (52) is mounted on the PCB board (51); the carrier (52) is provided with a product slot (54) for placing a product; the contact portion (53) is located in the product slot (54); the carrier (52) is axially connected to a cover plate (55) for pressing down and fixing the product; the cover plate (55) is provided with a buckle (56) for fixing to the carrier (52).

6. The universal testing machine according to claim 5, characterized in that: The support block (23) is located below the PCB board (51).

7. The universal testing machine according to any one of claims 1 to 6, characterized in that: The signal processing board (1) is provided with a control unit, and the replaceable test group (4) is installed with a functional test unit connected to the signal of the connection board (6).

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