Multifunctional crystal diode test equipment

Abstract

The utility model discloses multifunctional crystal diode testing equipment, relates to the technical field of crystal diode testing, and solves the problems that when the testing equipment detects a crystal diode, the position of a clamping strip is fixed, and the clamping strip can only clamp the crystal diode when leads at the two ends of the crystal diode are bent, so that the testing efficiency is high. The device solves the problems that the lead wires at the two ends of the crystal diode are straight, so that the lead wires at the two ends of the crystal diode cannot be conveniently clamped and detected, and the use efficiency of the device is reduced, the device comprises a monitoring meter, a testing seat, a first clamping plate and a second clamping plate, the monitoring meter is linearly connected with the testing seat through a connecting wire, and a placement groove is formed in the testing seat. A sliding groove is formed in the bottom face of the containing groove, through the first clamping groove formed in the first clamping plate and the second clamping groove formed in the second clamping plate, bent and straight lead wires at the two ends of a crystal diode can be conveniently clamped, and the use efficiency of the device is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of crystal diode testing, and specifically relates to a multifunctional crystal diode testing device. Background Technique

[0002] A crystal diode is a semiconductor two-terminal device in solid-state electronic devices. Before use, it needs to be tested. The two ends of the crystal diode are placed in the clamping device of the testing equipment to facilitate the detection of its performance and prevent the crystal diode from being damaged during use. After retrieval, the patent with the publication number CN217689267U discloses a multifunctional crystal diode testing device, including a tester. It is characterized in that: a transfer box is fixedly installed at the front end of the tester, plugs are symmetrically installed inside both sides of the transfer box, a transfer block is electrically connected inside the plug, two elastic plates are symmetrically installed on the upper surface of the transfer block, and a clamping strip is fixedly arranged on the side where the two elastic plates are close to each other. By fixedly arranging a transfer box at the front end of the original portable tester, and having plugs for the other end of the test line to be plugged in at the upper end, and connecting the other end of the plug to the elastic plate at the same time, the clamping mechanism improves the stability and convenience of detection; by arranging two arc-shaped elastic pieces at the rear end of the tester, one arc-shaped elastic piece clamps the power cord, and the other clamps the test line, and a magnetic clamping structure is arranged between the two arc-shaped elastic pieces to ensure the stability of the wire harness after being stored and prevent it from falling. However, when the testing device detects a crystal diode, the position of the clamping strip is fixed, and it can only clamp the two ends of the crystal diode when the leads at both ends are bent. And the leads at both ends of the crystal diode can also be straight, so it is not convenient to clamp and detect it, reducing the use efficiency of the device. Content of the Utility Model

[0003] Aiming at the deficiencies of the prior art, the utility model provides a multifunctional crystal diode testing device, which solves the problem that when the testing device detects a crystal diode, the position of the clamping strip is fixed, and it can only clamp the two ends of the crystal diode when the leads at both ends are bent. And the leads at both ends of the crystal diode can also be straight, so it is not convenient to clamp and detect it, reducing the use efficiency of the device.

[0004] To achieve the above object, the utility model is realized by the following technical solutions: A multifunctional crystal diode testing device, including a monitoring meter, a testing seat, a first clamping plate and a second clamping plate. The monitoring meter and the testing seat are linearly connected through a connecting wire. A placement groove is arranged inside the testing seat, and a sliding groove is arranged inside the bottom surface of the placement groove. The first clamping plate and the second clamping plate are symmetrically arranged inside the placement groove respectively. The lower end of the second clamping plate is longer than the lower end of the first clamping plate, and the lower end of the second clamping plate is slidably connected inside the sliding groove. The sides of the second clamping plate and the first clamping plate are mutually attached, and first clamping grooves and second clamping grooves are arranged inside the mutually attached surfaces. And the adjacent first clamping grooves and second clamping grooves are mutually communicated. The first clamping grooves and the second clamping grooves are perpendicular to each other and mutually staggered. The second clamping plate is linearly connected with the monitoring meter.

[0005] Preferably, a moving plate is slidably connected inside the placement groove. The side walls of the moving plate are all attached to the side walls of the first clamping plate. A T-shaped block is fixedly installed on the side wall of the first clamping plate. A T-shaped groove is arranged inside the side wall of the moving plate. The T-shaped block is slidably connected inside the T-shaped groove through the first clamping plate, so as to facilitate the position of the first clamping plate to be stable while being able to slide.

[0006] Preferably, limiting rods are symmetrically and fixedly installed on the side wall of the first clamping plate. The limiting rods are all slidably connected inside the second clamping plate and penetrate through the inside of the second clamping plate to the outside, so as to facilitate the position of the second clamping plate to be moved when the first clamping plate moves.

[0007] Preferably, moving grooves are arranged inside the side walls at both ends inside the placement groove. Sliding blocks are fixedly installed on the side walls at both ends of the moving plate. The sliding blocks are slidably connected inside the moving grooves through the moving plate. Slide rods are fixedly installed inside the moving grooves. Tension springs are fixedly installed between the sliding blocks and the front side wall of the placement groove. The tension springs are sleeved on the rod walls of the slide rods, so as to facilitate pulling the moving plate outwards when placing the leads at both ends of the crystal diode. After the placement is completed, the position of the moving plate can be conveniently reset through the tension springs.

[0008] Preferably, a pull rod is fixedly installed on the front side wall of the moving plate. The pull rod penetrates through the front side wall of the placement groove to the outside, so that the position of the moving plate can be conveniently moved by clamping the pull rod.

[0009] Preferably, the position of the limiting rod is below the first clamping groove, so as to prevent hindering the placed leads.

[0010] The utility model provides a multifunctional crystal diode testing device. It has the following beneficial effects:

[0011] 1. For this multifunctional crystal diode testing device, when using the multifunctional crystal diode testing device, through the first clamping groove and the second clamping groove arranged inside the first clamping plate and the second clamping plate, the leads at both ends of the bent and straight crystal diodes can be conveniently clamped, enhancing the usage efficiency of the device.

[0012] 2. For this multifunctional crystal diode testing device, when using the multifunctional crystal diode testing device, through the cooperation between the moving plate and the first clamping plate, while conveniently supporting the first clamping plate, the first clamping plate can also drive the second clamping plate to slide, facilitating the adjustment of the position between the two first clamping plates according to the length of the crystal diode, and making it convenient to clamp leads of different lengths. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a schematic diagram of the overall structure of the present utility model;

[0014] Figure 2 It is a side view of the present utility model;

[0015] Figure 3 It is a schematic diagram of the connection structure between the moving plate and the first clamping plate of the present utility model;

[0016] Figure 4 It is a schematic diagram of the structure of the first clamping plate and the second clamping plate of the present utility model;

[0017] Figure 5 For the present utility model Figure 2 Schematic diagram of the structure of part A in it.

[0018] In the figure, 1 - monitoring meter, 2 - test seat, 3 - placement groove, 4 - moving plate, 5 - pull rod, 6 - first clamping plate, 7 - second clamping plate, 8 - limiting rod, 9 - tension spring, 10 - sliding groove, 11 - moving groove, 12 - T-shaped groove, 13 - first clamping groove, 14 - second clamping groove, 15 - T-shaped block, 16 - sliding rod, 17 - slider. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0019] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present utility model.

[0020] Embodiment 1

[0021] Please refer to Figures 1-5, an embodiment of the present utility model provides a multifunctional crystal diode testing device, including a monitoring meter 1, a testing seat 2, a first clamping plate 6 and a second clamping plate 7. The monitoring meter 1 and the testing seat 2 are linearly connected through a connecting wire. Inside the testing seat 2, there is a placement groove 3. Inside the bottom surface of the placement groove 3, there is a sliding groove 10. The first clamping plate 6 and the second clamping plate 7 are symmetrically arranged inside the placement groove 3 respectively. The lower end of the second clamping plate 7 is longer than the lower end of the first clamping plate 6, and the lower end of the second clamping plate 7 is slidably connected inside the sliding groove 10. The side of the second clamping plate 7 is in mutual contact with the side of the first clamping plate 6, and inside the mutually contacting surfaces, there are a first clamping groove 13 and a second clamping groove 14 respectively. And the adjacent first clamping groove 13 and the second clamping groove 14 are mutually connected. The first clamping groove 13 and the second clamping groove 14 are perpendicular to each other and intersect. The second clamping plate 7 is linearly connected with the monitoring meter 1. When testing a crystal diode, the leads at both ends of the crystal diode are respectively inserted into the inside of the second clamping groove 14, and it is clamped by the first clamping plate 6 and the second clamping plate 7. When testing, by observing the monitoring meter 1, it is possible to conveniently understand whether the state of the tested crystal diode is good. At the same time, for straight leads, they are placed inside the first clamping groove 13.

[0022] Embodiment 2

[0023] In this embodiment, as Figures 1-5 shown, a moving plate 4 is slidably connected inside the placement groove 3. The side walls of the moving plate 4 are in contact with the side walls of the first clamping plate 6. A T-shaped block 15 is fixedly installed on the side wall of the first clamping plate 6. Inside the side wall of the moving plate 4, there is a T-shaped groove 12. The T-shaped block 15 is slidably connected inside the T-shaped groove 12 through the first clamping plate 6. Symmetrically fixed on the side wall of the first clamping plate 6 are limiting rods 8. The limiting rods 8 are all slidably connected inside the second clamping plate 7 and penetrate through the inside of the second clamping plate 7 to its outside. The position of the limiting rods 8 is below the first clamping groove 13. When moving the positions of the first clamping plate 6 and the second clamping plate 7 at both ends according to the lengths of the leads at both ends of the crystal diode, by sliding the provided limiting rods 8 inside the second clamping plate 7, the positions of the first clamping plate 6 and the second clamping plate 7 can be made stable, preventing the first clamping plate 6 and the second clamping plate 7 from separating. Thus, when the first clamping plate 6 slides on the moving plate 4, the first clamping plate 6 can drive the first clamping plate 7 to slide, facilitating the adjustment of the position.

[0024] Embodiment 3

[0025] In this embodiment, as Figures 1-5As shown in the figure, moving grooves 11 are provided inside the two end side walls of the placement groove 3. Sliders 17 are fixedly installed on the two end side walls of the moving plate 4. The sliders 17 are slidably connected to the inside of the moving grooves 11 through the moving plate 4. Slide rods 16 are fixedly installed inside the moving grooves 11. Tension springs 9 are fixedly installed between the sliders 17 and the front side wall of the placement groove 3. The tension springs 9 are sleeved on the rod walls of the slide rods 16. A pull rod 5 is fixedly installed on the front side wall of the moving plate 4. The pull rod 5 penetrates through the front side wall of the placement groove 3 to the outside. When placing the leads at both ends of the crystal diode, pull the moving plate 4 outwards to separate the first clamping plate 6 from the second clamping plate 7, place the leads at both ends of the crystal diode, and after the placement is completed, release the moving plate 4. Under the action of the tension spring 9, the moving plate 4 is reset, which is convenient for clamping it through the first clamping plate 6 and the second clamping plate 7.

[0026] It should be noted that in this embodiment, when using the multifunctional crystal diode testing device, as Figures 1-5 shown in the figure, when testing the crystal diode, move the positions of the first clamping plate 6 and the second clamping plate 7 at both ends according to the lengths of the leads at both ends of the crystal diode. By sliding the provided limiting rod 8 inside the second clamping plate 7, the positions of the first clamping plate 6 and the second clamping plate 7 can be made stable, preventing the first clamping plate 6 from separating from the second clamping plate 7. Thus, when the first clamping plate 6 slides on the moving plate 4, the first clamping plate 6 can drive the first clamping plate 7 to slide, which is convenient for adjusting the position. After the positions of the first clamping plate 6 and the second clamping plate 7 are adjusted, place the leads at both ends of the crystal diode. Pull the moving plate 4 outwards to separate the first clamping plate 6 from the second clamping plate 7, place the leads at both ends of the crystal diode, and after the placement is completed, release the moving plate 4. Under the action of the tension spring 9, the moving plate 4 is reset, which is convenient for clamping it through the first clamping plate 6 and the second clamping plate 7. When conducting the test, by observing the monitoring table 1, it is possible to conveniently understand whether the state of the tested crystal diode is good. At the same time, for straight leads, they are placed inside the first clamping groove 13.

[0027] The above shows and describes the basic principles, main features and advantages of the present invention. For those skilled in the art, it is obvious that the present invention is not limited to the details of the above exemplary embodiments, and can be implemented in other specific forms without departing from the spirit or basic features of the present invention. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-limiting. The scope of the present invention is defined by the appended claims rather than the above description. Therefore, it is intended to include all changes falling within the meaning and scope of the equivalent elements of the claims in the present invention. Any reference signs in the claims should not be regarded as limiting the claimed rights.

[0028] In addition, it should be understood that although this specification is described in terms of embodiments, not every embodiment contains only an independent technical solution. This narrative manner of the specification is only for clarity. Those skilled in the art should regard the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A multifunctional crystal diode testing device, characterized in that: The device comprises a monitoring meter (1), a test seat (2), a first clamping plate (6) and a second clamping plate (7); the monitoring meter (1) and the test seat (2) are linearly connected via a connecting line; a placement groove (3) is provided inside the test seat (2); a slide groove (10) is provided inside the bottom surface of the placement groove (3); the first clamping plate (6) and the second clamping plate (7) are symmetrically arranged inside the placement groove (3); the lower end of the second clamping plate (7) is longer than the lower end of the first clamping plate (6); and the second clamping plate (7) is symmetrically arranged inside the placement groove (3). The lower end of the clamping plate (7) is slidably connected to the inside of the slide groove (10), the second clamping plate (7) and the side of the first clamping plate (6) are mutually fitted, and the inside of the mutually fitted surfaces are both provided with a first clamping groove (13) and a second clamping groove (14), and the adjacent first clamping grooves (13) and second clamping grooves (14) are interconnected, the first clamping grooves (13) and the second clamping grooves (14) are perpendicular to each other and staggered, and the second clamping plate (7) is linearly connected to the monitoring meter (1).

2. A multifunctional crystal diode testing device according to claim 1, characterized in that: The placement groove (3) is slidably connected to a movable plate (4), the side walls of the movable plate (4) are in contact with the side walls of the first clamping plate (6), a T-shaped block (15) is fixedly mounted on the side walls of the first clamping plate (6), a T-shaped groove (12) is provided inside the side wall of the movable plate (4), and the T-shaped block (15) is slidably connected to the inside of the T-shaped groove (12) via the first clamping plate (6).

3. A multifunctional crystal diode testing device according to claim 2, characterized in that: Limit rods (8) are symmetrically fixedly mounted on the side walls of the first clamping plate (6), and the limit rods (8) are slidably connected to the inside of the second clamping plate (7) and penetrate through the inside of the second clamping plate (7) to the outside.

4. The multifunctional crystal diode testing device according to claim 2, characterized in that: Both end side walls of the placement groove (3) are provided with movable grooves (11), both end side walls of the movable plate (4) are fixedly mounted with sliders (17), the sliders (17) are slidably connected to the inside of the movable groove (11) through the movable plate (4), the inside of the movable groove (11) is fixedly mounted with slide bars (16), and between the slide bars (17) and the front end side walls of the placement groove (3) there are tension springs (9), the tension springs (9) are sleeved on the rod walls of the slide bars (16).

5. The multifunctional crystal diode testing device according to claim 4, characterized in that: A pull rod (5) is fixedly mounted on the front end side wall of the movable plate (4), and the pull rod (5) penetrates the front end side wall of the placement groove (3) to the outside.

6. The multifunctional crystal diode testing device according to claim 3, characterized in that: The position of the limiting rod (8) is below the first clamping groove (13).

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